Intel s Revolutionary 22 nm Transistor Technology



Similar documents
Implementation Of High-k/Metal Gates In High-Volume Manufacturing

STMicroelectronics. Deep Sub-Micron Processes 130nm, 65 nm, 40nm, 28nm CMOS, 28nm FDSOI. SOI Processes 130nm, 65nm. SiGe 130nm

Advanced VLSI Design CMOS Processing Technology

Lecture 15. Advanced Technology Platforms. Background and Trends State-of-the-Art CMOS Platforms

How To Scale At 14 Nanomnemester

DESIGN, FABRICATION AND ELETRICAL CHARACTERIZATION OF SOI FINFET TRANSISTORS

DESIGN CHALLENGES OF TECHNOLOGY SCALING

Lecture 030 DSM CMOS Technology (3/24/10) Page 030-1

Nanotechnologies for the Integrated Circuits

Intel Q3GM ES 32 nm CPU (from Core i5 660)

CONTENTS. Preface Energy bands of a crystal (intuitive approach)

Following a paper that I wrote in 1965 and a speech that I gave in

Flash Memories. João Pela (52270), João Santos (55295) December 22, 2008 IST

Highly Scalable NAND Flash Memory Cell Design Embracing Backside Charge Storage

Unternehmerseminar WS 2009 / 2010

Evaluating Embedded Non-Volatile Memory for 65nm and Beyond

EE-612: Nanoscale Transistors (Advanced VLSI Devices) Spring 2005

Comparison study of FinFETs: SOI vs. Bulk Performance, Manufacturing Variability and Cost

DEVELOPMENTS & TRENDS IN FEOL MATERIALS FOR ADVANCED SEMICONDUCTOR DEVICES Michael Corbett mcorbett@linx-consulting.com Semicon Taiwan2015

EDC Lesson 12: Transistor and FET Characteristics EDCLesson12- ", Raj Kamal, 1

Chapter 1 Introduction to The Semiconductor Industry 2005 VLSI TECH. 1

SLC vs. MLC: An Analysis of Flash Memory

Substrate maturity and readiness in large volume to support mass adoption of ULP FDSOI platforms. SOI Consortium Conference Tokyo 2016

Nanoelektronik: Von der Realität bis zur Utopie

Yaffs NAND Flash Failure Mitigation

Area 3: Analog and Digital Electronics. D.A. Johns

Introduction to CMOS VLSI Design

3D NAND Technology Implications to Enterprise Storage Applications

1.1 Silicon on Insulator a brief Introduction

New materials on horizon for advanced logic technology in mobile era

Here we introduced (1) basic circuit for logic and (2)recent nano-devices, and presented (3) some practical issues on nano-devices.

AN1837. Non-Volatile Memory Technology Overview By Stephen Ledford Non-Volatile Memory Technology Center Austin, Texas.

1.Introduction. Introduction. Most of slides come from Semiconductor Manufacturing Technology by Michael Quirk and Julian Serda.

ADVANCED WAFER PROCESSING WITH NEW MATERIALS. ASM International Analyst and Investor Technology Seminar Semicon West July 15, 2015

數 位 積 體 電 路 Digital Integrated Circuits

Agenda. Michele Taliercio, Il circuito Integrato, Novembre 2001

Intel Labs at ISSCC Copyright Intel Corporation 2012

Low-cost Printed Electronic Nose Gas Sensors for Distributed Environmental Monitoring

1. Memory technology & Hierarchy

ECE 410: VLSI Design Course Introduction

Samsung 2bit 3D V-NAND technology

Nanoscale Resolution Options for Optical Localization Techniques. C. Boit TU Berlin Chair of Semiconductor Devices

From sand to circuits How Intel makes integrated circuit chips. Sand with Intel Core 2 Duo processor.

McPAT: An Integrated Power, Area, and Timing Modeling Framework for Multicore and Manycore Architectures

The MOSFET Transistor

Integrated Circuits & Systems

Static-Noise-Margin Analysis of Conventional 6T SRAM Cell at 45nm Technology

Chapter 7-1. Definition of ALD

What is optical lithography? The optical system Production process Future and limits of optical lithography References. Optical lithography

VLSI Fabrication Process

These help quantify the quality of a design from different perspectives: Cost Functionality Robustness Performance Energy consumption

StarRC Custom: Next-Generation Modeling and Extraction Solution for Custom IC Designs

Intel Technology Journal

What is this course is about? Design of Digital Circuitsit. Digital Integrated Circuits. What is this course is about?

Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices

Use-it or Lose-it: Wearout and Lifetime in Future Chip-Multiprocessors

Samsung 3bit 3D V-NAND technology

Lecture 8 MOSFET(I) MOSFET I-V CHARACTERISTICS

Introduction to VLSI Fabrication Technologies. Emanuele Baravelli

路 論 Chapter 15 System-Level Physical Design

CO2005: Electronics I (FET) Electronics I, Neamen 3th Ed. 1

Stovepipes to Clouds. Rick Reid Principal Engineer SGI Federal by SGI Federal. Published by The Aerospace Corporation with permission.

Grad Student Presentation Topics PHGN/CHEN/MLGN 435/535: Interdisciplinary Silicon Processing Laboratory

Thin Is In, But Not Too Thin!

Signal Types and Terminations

Modeling the Characteristics of a High-k HfO 2 -Ta 2 O 5 Capacitor in Verilog-A

Winbond W971GG6JB-25 1 Gbit DDR2 SDRAM 65 nm CMOS DRAM Process

MRF175GU MRF175GV The RF MOSFET Line 200/150W, 500MHz, 28V

Chapter 9 Semiconductor Memories. Jin-Fu Li Department of Electrical Engineering National Central University Jungli, Taiwan

System on Chip Design. Michael Nydegger

Our Embedded Dream of the Invisible Future

Introduction to VLSI Programming. TU/e course 2IN30. Prof.dr.ir. Kees van Berkel Dr. Johan Lukkien [Dr.ir. Ad Peeters, Philips Nat.

Core Power Delivery Network Analysis of Core and Coreless Substrates in a Multilayer Organic Buildup Package

UTBB-FDSOI 28nm : RF Ultra Low Power technology for IoT

Winbond W2E512/W27E257 EEPROM

Semiconductor Memories

Power MOSFET Basics By Vrej Barkhordarian, International Rectifier, El Segundo, Ca.

SLC vs MLC NAND and The Impact of Technology Scaling. White paper CTWP010

Materials for Organic Electronic. Jeremy Burroughes FRS FREng

Riding silicon trends into our future

CHAPTER 10 Fundamentals of the Metal Oxide Semiconductor Field Effect Transistor

PHYSICS OF DEVICES ESONN 04. ARCES, University of Bologna. 8/19/2004 Enrico Sangiorgi. Enrico Sangiorgi. ARCES University of Bologna

Analyzing Electrical Effects of RTA-driven Local Anneal Temperature Variation

Digital Circuit Design

Introduction to Semiconductor Manufacturing Technology. Chapter 1, Introduction. Hong Xiao, Ph. D.

MEMS Processes from CMP

SLC vs MLC: Proper Flash Selection for SSDs in Industrial, Military and Avionic Applications. A TCS Space & Component Technology White Paper

An Analysis Of Flash And HDD Technology Trends

Micron MT29F2G08AAB 2 Gbit NAND Flash Memory Structural Analysis

Lecture 9 - MOSFET (I) MOSFET I-V Characteristics. October 6, 2005

Chapter 5 :: Memory and Logic Arrays

NAME AND SURNAME. TIME: 1 hour 30 minutes 1/6

Fabrication and Characterization of N- and P-Type a-si:h Thin Film Transistors

STP80NF55-08 STB80NF55-08 STB80NF N-CHANNEL 55V Ω - 80A D2PAK/I2PAK/TO-220 STripFET II POWER MOSFET

Lecture 9 - MOSFET (I) MOSFET I-V Characteristics. March 6, 2003

CS257 Introduction to Nanocomputing

Technology Developments Towars Silicon Photonics Integration

How To Make A Field Effect Transistor (Field Effect Transistor) From Silicon P Channel (Mos) To P Channel Power (Mos) (M2) (Mm2)

Field-Effect (FET) transistors

INTEL TECHNICAL DISCLOSURES AT ISSCC

Transcription:

Intel s Revolutionary 22 nm Transistor Technology Mark Bohr Intel Senior Fellow Kaizad Mistry 22 nm Program Manager May, 2011 1

Key Messages Intel is introducing revolutionary Tri-Gate transistors on its 22 nm logic technology Tri-Gate transistors provide an unprecedented combination of improved performance and energy efficiency 22 nm processors using Tri-Gate transistors, code-named Ivy Bridge, are now demonstrated working in systems Intel is on track for 22 nm production in 2H 11, maintaining a 2-year cadence for introducing new technology generations This technological breakthrough is the result of Intel s highly coordinated research-development-manufacturing pipeline Tri-Gate transistors are an important innovation needed to continue Moore s Law 2

Intel Technology Roadmap Process Name P1266 P1268 P1270 P1272 P1274 Lithography 45 nm 32 nm 22 nm 14 nm 10 nm 1 st Production 2007 2009 2011 2013 2015 Intel continues our cadence of introducing a new technology generation every two years 3

Traditional Planar Transistor Gate High-k Dielectric Source Drain Oxide Silicon Substrate Traditional 2-D planar transistors form a conducting channel in the silicon region under the gate electrode when in the on state 4

22 nm Tri-Gate Transistor Gate Drain Source Oxide Silicon Substrate 3-D Tri-Gate transistors form conducting channels on three sides of a vertical fin structure, providing fully depleted operation Transistors have now entered the third dimension! 5

22 nm Tri-Gate Transistor Gate Oxide Silicon Substrate Tri-Gate transistors can have multiple fins connected together to increase total drive strength for higher performance 6

22 nm Tri-Gate Transistor Gate Oxide Silicon Substrate Tri-Gate transistors can have multiple fins connected together to increase total drive strength for higher performance 7

22 nm Tri-Gate Transistor Gates Fins 8

32 nm Planar Transistors 22 nm Tri-Gate Transistors 9

Intel Transistor Leadership 2003 2005 2007 2009 2011 90 nm 65 nm 45 nm 32 nm 22 nm SiGe SiGe Invented SiGe Strained Silicon 2 nd Gen. SiGe Strained Silicon Invented Gate-Last High-k Metal Gate 2 nd Gen. Gate-Last High-k Metal Gate First to Implement Tri-Gate Strained Silicon High-k Metal Gate Tri-Gate 10

Std vs. Fully Depleted Transistors Bulk Transistor Gate Oxide Gate Inversion Layer Source Drain Depletion Region Silicon Substrate Silicon substrate voltage exerts some electrical influence on the inversion layer (where source-drain current flows) The influence of substrate voltage degrades electrical sub-threshold slope (transistor turn-off characteristics) NOT fully depleted 11

Std vs. Fully Depleted Transistors Partially Depleted SOI (PDSOI) Gate Floating Body Source Drain Oxide Silicon Substrate Floating body voltage exerts some electrical influence on the inversion layer, degrading sub-threshold slope NOT fully depleted Not used by Intel 12

Std vs. Fully Depleted Transistors Fully Depleted SOI (FDSOI) Gate Source Drain Extremely thin silicon layer Oxide Silicon Substrate Floating body eliminated and sub-threshold slope improved Requires expensive extremely-thin SOI wafer, which adds ~10% to total process cost Not used by Intel 13

Std vs. Fully Depleted Transistors Fully Depleted Tri-Gate Transistor Gate Oxide Silicon Fin Silicon Substrate Gate electrode controls silicon fin from three sides providing improved sub-threshold slope Inversion layer area increased for higher drive current Process cost adder is only 2-3% 14

Transistor Operation On Current Channel Current (normalized) Planar Threshold Voltage Off Current Gate Voltage (V) Operating Voltage Transistor current-voltage characteristics 15

Transistor Operation Channel Current (normalized) Planar Tri-Gate Reduced Leakage Gate Voltage (V) The fully depleted characteristics of Tri-Gate transistors provide a steeper sub-threshold slope that reduces leakage current 16

Transistor Operation Channel Current (normalized) Tri-Gate Tri-Gate Reduced Threshold Voltage Gate Voltage (V) Reduced Operating Voltage The steeper sub-threshold slope can also be used to target a lower threshold voltage, allowing the transistors to operate at lower voltage to reduce power and/or improve switching speed 17

Transistor Gate Delay Transistor Gate Delay (normalized) Slower 32 nm Planar Lower Voltage Operating Voltage (V) Transistor gate delay (switching speed) slows down as operating voltage is reduced 18

Transistor Gate Delay Transistor Gate Delay (normalized) 32 nm Planar 22 nm Planar Operating Voltage (V) 22 nm planar transistors could provide some performance improvement, but would still have poor gate delay at low voltage 19

Transistor Gate Delay Transistor Gate Delay (normalized) 37% Faster 32 nm Planar 22 nm Tri-Gate 18% Faster Operating Voltage (V) 22 nm Tri-Gate transistors provide improved performance at high voltage and an unprecedented performance gain at low voltage 20

Transistor Gate Delay Transistor Gate Delay (normalized) 32 nm Planar -0.2 V 22 nm Tri-Gate Operating Voltage (V) 22 nm Tri-Gate transistors can operate at lower voltage with good performance, reducing active power by >50% 21

Tri-Gate Transistor Benefits Dramatic performance gain at low operating voltage, better than Bulk, PDSOI or FDSOI 37% performance increase at low voltage >50% power reduction at constant performance Improved switching characteristics (On current vs. Off current) Higher drive current for a given transistor footprint Only 2-3% cost adder (vs. ~10% for FDSOI) Tri-Gate transistors are an important innovation needed to continue Moore s Law 22

22 nm Tri-Gate Circuits 364 Mbit array size >2.9 billion transistors 3 rd generation high-k + metal gate transistors Same transistor and interconnect features as on 22 nm CPUs 22 nm SRAM, Sept. 09 22 nm SRAMs using Tri-Gate transistors were first demonstrated in Sept. 09 Intel is now demonstrating the world s first 22 nm microprocessor (Ivy Bridge) and it uses revolutionary Tri-Gate transistors 23

22 nm Manufacturing Fabs D1C Oregon Fab 28 Israel D1D Oregon Fab 32 Arizona Fab 12 Arizona 24

90 nm 2003 On-Time 2 Year Cycles 65 nm 45 nm 32 nm 2005 2007 2009 22 nm 2011 Intel continues to successfully introduce leading edge process + products on a 2 year cadence 25

Intel s R-D-M Pipeline Research Development Pathfinding Manufacturing Copy Exactly! Bringing innovative technologies to high volume manufacturing is the result of a highly coordinated internal research-development-manufacturing pipeline 26

Key Messages Intel is introducing revolutionary Tri-Gate transistors on its 22 nm logic technology Tri-Gate transistors provide an unprecedented combination of improved performance and energy efficiency 22 nm processors using Tri-Gate transistors, code-named Ivy Bridge, are now demonstrated working in systems Intel is on track for 22 nm production in 2H 11, maintaining a 2-year cadence for introducing new technology generations This technological breakthrough is the result of Intel s highly coordinated research-development-manufacturing pipeline Tri-Gate transistors are an important innovation needed to continue Moore s Law 27