ESP-CV Custom Design Formal Equivalence Checking Based on Symbolic Simulation



Similar documents
Agenda. Michele Taliercio, Il circuito Integrato, Novembre 2001

StarRC Custom: Next-Generation Modeling and Extraction Solution for Custom IC Designs

Testing Low Power Designs with Power-Aware Test Manage Manufacturing Test Power Issues with DFTMAX and TetraMAX

Digital Design Verification

Introduction to Digital System Design

Lynx Design System Delivering Higher Productivity and Predictability in IC Design

Engineering Change Order (ECO) Support in Programmable Logic Design

Design Compiler Graphical Create a Better Starting Point for Faster Physical Implementation

Understanding DO-254 Compliance for the Verification of Airborne Digital Hardware

Chapter 13: Verification

AES1. Ultra-Compact Advanced Encryption Standard Core. General Description. Base Core Features. Symbol. Applications

Implementation Details

Hunting Asynchronous CDC Violations in the Wild

An Advanced Behavioral Buffer Model With Over-Clocking Solution. Yingxin Sun, Joy Li, Joshua Luo IBIS Summit Santa Clara, CA Jan.

What is a System on a Chip?

NTE2053 Integrated Circuit 8 Bit MPU Compatible A/D Converter

Figure 1 FPGA Growth and Usage Trends

ETEC 2301 Programmable Logic Devices. Chapter 10 Counters. Shawnee State University Department of Industrial and Engineering Technologies

9/14/ :38

EXPERIMENT 8. Flip-Flops and Sequential Circuits

7a. System-on-chip design and prototyping platforms

University of Texas at Dallas. Department of Electrical Engineering. EEDG Application Specific Integrated Circuit Design

design Synopsys and LANcity

CHAPTER 11: Flip Flops

Introduction to Functional Verification. Niels Burkhardt

BY STEVE BROWN, CADENCE DESIGN SYSTEMS AND MICHEL GENARD, VIRTUTECH

Modeling Sequential Elements with Verilog. Prof. Chien-Nan Liu TEL: ext: Sequential Circuit

ECE410 Design Project Spring 2008 Design and Characterization of a CMOS 8-bit Microprocessor Data Path

Digital Systems Design! Lecture 1 - Introduction!!

Modeling Registers and Counters

IBIS for SSO Analysis

Combinational Logic Design Process

System-on. on-chip Design Flow. Prof. Jouni Tomberg Tampere University of Technology Institute of Digital and Computer Systems.

Lecture 5: Gate Logic Logic Optimization

1. Memory technology & Hierarchy

Testing of Digital System-on- Chip (SoC)

Digital Electronics Detailed Outline

路 論 Chapter 15 System-Level Physical Design

WEEK 8.1 Registers and Counters. ECE124 Digital Circuits and Systems Page 1

Digital Systems Based on Principles and Applications of Electrical Engineering/Rizzoni (McGraw Hill

Testing & Verification of Digital Circuits ECE/CS 5745/6745. Hardware Verification using Symbolic Computation

ASYNCHRONOUS COUNTERS

The 104 Duke_ACC Machine

System on Chip Design. Michael Nydegger

1. True or False? A voltage level in the range 0 to 2 volts is interpreted as a binary 1.

LAB4: Audio Synthesizer

RAM & ROM Based Digital Design. ECE 152A Winter 2012

Objective. Testing Principle. Types of Testing. Characterization Test. Verification Testing. VLSI Design Verification and Testing.

How To Design A Chip Layout

Digital Circuit Design

Digitale Signalverarbeitung mit FPGA (DSF) Soft Core Prozessor NIOS II Stand Mai Jens Onno Krah

FPGA Prototyping Primer

Computer Systems Structure Main Memory Organization

Fault Modeling. Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults. Transistor faults Summary

Asynchronous counters, except for the first block, work independently from a system clock.

Using Altera MAX Series as Microcontroller I/O Expanders

A Verilog HDL Test Bench Primer Application Note

Modeling Latches and Flip-flops

81110A Pulse Pattern Generator Simulating Distorted Signals for Tolerance Testing

Digital Logic Design. Basics Combinational Circuits Sequential Circuits. Pu-Jen Cheng

Step Response of RC Circuits

ARM Webinar series. ARM Based SoC. Abey Thomas

Solutions for Mixed-Signal SoC Verification New techniques that are making advanced SoC verification possible

GETTING STARTED WITH PROGRAMMABLE LOGIC DEVICES, THE 16V8 AND 20V8

RAPID PROTOTYPING OF DIGITAL SYSTEMS Second Edition

Upon completion of unit 1.1, students will be able to

Experiment # 9. Clock generator circuits & Counters. Eng. Waleed Y. Mousa

Eingebettete Systeme. 4: Entwurfsmethodik, HW/SW Co-Design. Technische Informatik T T T

Virtuoso Analog Design Environment Family Advanced design simulation for fast and accurate verification

EEC 119B Spring 2014 Final Project: System-On-Chip Module

CHAPTER 3 Boolean Algebra and Digital Logic

Manchester Encoder-Decoder for Xilinx CPLDs

Designing a System-on-Chip (SoC) with an ARM Cortex -M Processor

Multiplexers Two Types + Verilog

VLSI Design Verification and Testing

Counters and Decoders

Sequential Circuit Design

Asynchronous IC Interconnect Network Design and Implementation Using a Standard ASIC Flow

Sequential Logic: Clocks, Registers, etc.

Example-driven Interconnect Synthesis for Heterogeneous Coarse-Grain Reconfigurable Logic

Quartus II Software Design Series : Foundation. Digitale Signalverarbeitung mit FPGA. Digitale Signalverarbeitung mit FPGA (DSF) Quartus II 1

Curriculum for a Master s Degree in ECE with focus on Mixed Signal SOC Design

Altera Error Message Register Unloader IP Core User Guide

DM74LS169A Synchronous 4-Bit Up/Down Binary Counter

VENDING MACHINE. ECE261 Project Proposal Presentaion. Members: ZHANG,Yulin CHEN, Zhe ZHANG,Yanni ZHANG,Yayuan

Assertion Synthesis Enabling Assertion-Based Verification For Simulation, Formal and Emulation Flows

Sentaurus Workbench Comprehensive Framework Environment

Contents. Overview Memory Compilers Selection Guide

A New Paradigm for Synchronous State Machine Design in Verilog

Designing an efficient Programmable Logic Controller using Programmable System On Chip

VHDL Test Bench Tutorial

Non-Contact Test Access for Surface Mount Technology IEEE

Chapter 5 :: Memory and Logic Arrays

Getting the Most Out of Synthesis

Introduction to VLSI Testing

ALS Configuration Management Plan. Nuclear Safety Related

IL2225 Physical Design

Digital Systems. Role of the Digital Engineer

Document Contents Introduction Layout Extraction with Parasitic Capacitances Timing Analysis DC Analysis

LAB #3 VHDL RECOGNITION AND GAL IC PROGRAMMING USING ALL-11 UNIVERSAL PROGRAMMER

Transcription:

Datasheet -CV Custom Design Formal Equivalence Checking Based on Symbolic Simulation Overview -CV is an equivalence checker for full custom designs. It enables efficient comparison of a reference design against other models or a transistor-level netlist. -CV provides fast and extensive coverage, enabling users to quickly find bugs and have the confidence that the reference design is functionally identical to other models or its transistor-level implementation. -CV improves overall verification productivity by simplifying the testing process. It directly verifies the netlist, eliminating the need to manually extract the transistor network into a gate-level representation. Verification Scope -CV verifies that two different design representations are functionally equivalent. These designs may be described as behavioral models, RTL, UDP s, gates, transistors, or netlist views (Figure ). Create model Design spec Implement circuit Behavioral Custom circuit Fills the Verification Gap wait fork if behavioral level description join Symbolic simulation Equivalence checking case Equivalence checking Symbolic simulation always repeat transistor level implementation Figure : Bridging the verification gap between and

Benefits Higher Quality -CV provides fast and complete coverage, enabling you to quickly find bugs and have the confidence that the reference model is functionally identical to the transistor model. Increased Productivity With -CV, you no longer have to derive directed and random tests or have a long delay in releasing models while you complete your verification suite. Easy to Use -CV directly verifies the netlist, eliminating the need to manually extract the transistor network into a gate-level representation. Memories are Changing Over 5 percent of the total silicon real estate in today s SOC is consumed by memories. And as designs move toward sub-nanometer process technology, functionalities such as redundancy, ECC, BIST, pipelining, etc. are being added to these designs, resulting in significantly higher functional complexity. With few standards and many degrees of freedom, functional verification of embedded memories has become a critical need in the SOC design verification process. A key requirement of a successful design is that the behavioral reference model used for SOC full chip simulation is functionally identical to the transistor-level netlist that represents the actual implementation. As the quantity and complexity of memory designs continues to increase, and the project schedules and available resources continues to shrink, designers are faced with the challenges of delivering high quality memories on-time and with limited resources. High Coverage Verification Traditional methods used to verify memories such as simulation or cell-based formal verification have their limitations. simulation provides circuit-level accuracy but its coverage is dependent on the vector set created by the engineers and the time available for running the simulation. Likewise, cellbased formal verification may provide complete coverage but cannot accurately represent the behavior of the transistorlevel netlist. -CV is based on a patented symbolic simulation technology that combines the power of formal methods with proven event-driven simulation technology. -CV leverages symbolic simulation to perform sequential equivalence checking, dramatically increasing the quality of functional verification (Figure 2). ((CS*RS)...CS2...CS CS RS...RS2...RS CLK ((CS*RS) CS*RS*CS2*RS2 ((CS*RS) *CS2...RS2...RS (((CS*RS) ) CS2 (CS*RS *CS2) (((CS*RS) *CS2) ((((CS*RS) ) RS2*((CS* RS*CS2) (((CS *RS) CS2) *RS2*CS2)) REG REG ((CS*RS) Resulting equations after two clock cycles CS*RS *CS2*RS2 Figure 2: Symbolic simulation propagation performs formal analysis on output equations to establish equivalence -CV 2

-CV simultaneously simulates two different design representations using symbolic inputs while observing the outputs of each representation to assure equivalent responses. Instead of applying all possible combinations of binary states, -CV applies a symbol that represents all possible input states. This results in coverage of 2 N possible states with only N number of symbols (Figure 3). -CV is capable of applying formal verification to the circuit-level designs, delivering an easy-to-use verification solution that is circuit-aware. Unlike other methods that require modeling of transistor-level designs to cell-based gate equivalent netlists, -CV directly verifies the functional equivalence of the -level netlist against a behavioral or RTL representation of the design. -CV greatly simplifies the inclusion of transistor parasitic effects in the functional model by automatically calculating the RC value based on transistor length, width, and process technology (Figure 4). Z=& Z=& Z=& Z=& 4 vectors vector s s2 Z=s&s2 Figure 3: Using symbols as inputs delivers high coverage Behavioral RTL Gate Switch Transistor Symbolic simulation delivers high coverage functional verification Event-driven (like traditional logic simulation) Uses symbols (variables) as inputs instead of just s and s Propagates equations instead of discrete events Formal analysis, equivalence checking using generated equations Behavioral RTL Gate Switch Transistor Figure 4: Direct verification of behavioral, RTL, gate and transistor-level design netlists Differentiating Features Power Integrity Verification The Power Integrity Verification flow detects common low-power design errors and power-down/sleep-mode failures. When errors are found, this flow also generates vectors for analysis and debug (Figure 5). Incorrect isolation Z Missing level shifter.7v.v.7v Power/ground shorts.7v.v Unbuffered Inputs Pad Sneak paths Figure 5: power-integrity verification -CV 3

Redundancy Verification Flow -CV uses formal techniques to quickly verify that the redundancy logic added to the memory array to replace defective cells and improve yields is performing correctly (Figure 6). Verdi Interface Using the Verdi 3 advanced debug platform environment already used by most RTL designers, -CV provides a graphical way to debug mismatches in transistorlevel design using Interactive Signal Tracing (IST). -CV also provides resistance, capacitance and delay information for events on schematic nets as well as traditional,, X and Z logic values. Using Verdi 3 dramatically reduces the overall verification debug time and improves productivity by providing a common debug platform for logic and circuit designers alike (Figure 7). Redundancy control signals Expected defect tolerance (n bits) (w/wo redundancy) Pass For all possible n-bit defects, some redundancy setting preserves equivalence (with bit-cell defect injection) (with redundancy) Fail Location of bit-cell defects that can t be compensated for Figure 6: Redundancy verification flow Device Model Simulation -CV Device Model Simulation allows you to perform verification for new device technologies, e.g. FinFET and FDSOI, as soon as your circuit simulator supports that technology. It supports multiple circuit simulators and transparently handles CMI and TMI encrypted models (Figure 8). Figure 7: Verdi 3 interface provides graphical debug environment User-specified inputs Device model library path Target device list Device length/width range Operating voltage Path to circuit simulator Device Model (EDM) output file name -CV Tcl script sets up and invokes circuit simulations, collects and packages results Runs for each device name/size Sizes substituted into template Simulation deck template device model library (user owned) device model library simulator Output files from.meas statements -CV esp _ shell> set _ process i f <EDM> esp _ shell> read _ verilog r <DESIGN.v> esp _ shell> read _ spice i <DESIGN.sp> esp _ shell> verify Figure 8: Generating device models from models -CV 4

-CV Additional Features Full (RTL, Structural and Behavioral) Language The tool supports all constructs from the language, including behavioral structures, such as fork, join, and task, etc. Timing Dependent Functionality It calculates transition time as a function of symbolic states and transistor widths and lengths, and therefore supports timing dependent functionality. Automated error validation It spawns simulation to validate verification differences and provides generated waveforms for debugging. Distributing Testbench Execution The tool supports simulation of testbenches in parallel using LSF and Oracle GRID (SGE), and therefore reducing time-to-results. Integrated Test Suite Management A designers productivity is improved by automating multiple test bench simulations and producing a merged coverage report. Interactive Signal Tracing (IST) IST provides unique features to help debug verification errors. By using a simple command-based interface or Verdi schematic display, a designer can back trace incorrect or suspicious values in the design. It also tracks internal signal transitions and reports calculated transistor strengths. Transistor Level Verification Transistors are natively supported by - CV and it does not depend upon gate extraction or pattern matching techniques. Asynchronous Timing It supports asynchronous clocks, pulsed logic and self-timed logic. No State Point Mapping It verifies functional equivalency of designs with different structures, without any dependency on isomorphic state mapping. High Capacity It has the ability to verify over one billion transistor designs on a single workstation. Typical Applications ``Compiled memories ``Custom memories (i.e. CAM, SRAM, ROM, etc.) ``Datapath blocks ``Programmable Logic (FPGA) ``Problematic / Dynamic circuits ``Standard cell and I/O libraries Conclusion With the increasing complexity and the importance of memories in modern ICs, there is a clear need for specialized tools and techniques for the design and verification of embedded memory blocks. -CV brings formal technology into the memory designer s hands and raises their confidence in the quality of the design while simplifying the testing process and increasing overall verification productivity. Synopsys, Inc. 69 East Middlefield Road Mountain View, CA 9443 www.synopsys.com 25 Synopsys, Inc. All rights reserved. Synopsys is a trademark of Synopsys, Inc. in the United States and other countries. A list of Synopsys trademarks is available at http://www.synopsys.com/copyright.html. All other names mentioned herein are trademarks or registered trademarks of their respective owners. 8/5.rd.CS6332.