Introduction to VLSI Testing
|
|
- Melina Morgan
- 7 years ago
- Views:
Transcription
1 Introduction to VLSI Testing 李 昆 忠 Kuen-Jong Lee Dept. of Electrical Engineering National Cheng-Kung University Tainan, Taiwan, R.O.C. Introduction to VLSI Testing.1
2 Problems to Think A 32 bit adder A 32 bit counter with RESET function A 1MB cache memory A transistor CPU Introduction to VLSI Testing.2
3 Introduction Fault modeling Fault simulation Test generation OUTLINE Automatic test pattern generation (ATPG) Design for testability Built-in self test Synthesis for testability An eample Introduction to VLSI Testing.3
4 Testing: To tell whether a system is good or bad Vdd /1 Related fields Verification: To verify the correctness of a design Diagnosis: To tell the faulty site Reliability: To tell whether a good system will work after some time. Introduction to VLSI Testing.4
5 Importance of testing N = # transistors in a chip p = prob. (a transistor is faulty) Pf = prob. (the chip is faulty) Pf = 1- (1- p) N If p = 10-6 N = 10 6 Pf = 63.2% Introduction to VLSI Testing.5
6 Difficulties in Testing Fault may occur anytime - Design - Process - Package - Field Fault may occur at any place Vdd Vss VLSI circuit are large - Most problems encountered in testing are NP-complete I/O access is limited Introduction to VLSI Testing.6
7 How to do testing from Designer s points of view Circuit modeling Fault modeling Logic simulation Fault simulation Test generation Design for test Built-in self test Modeling ATPG Testable design Synthesis for testability Introduction to VLSI Testing.7
8 Circuit Modeling Functional model--- logic function - f(1,2,...)=... - Truth table Behavioral model--- functional + timing - f(1,2,...)=..., Delay = 10 Structural model--- collection of interconnected components or elements A B E 1 0 G C D 1 0 F 0 Introduction to VLSI Testing.8
9 Levels of Description Circuit level C Switch level VDD VDD VDD C 4B C 3 C 1 C 2 E Gate level A E B G Higher/ System level C D F Introduction to VLSI Testing.9
10 Fault Modeling The effects of physical defects Most commonly used fault model: Single stuck-at fault A B C D E F G A s-a-1 A s-a-0 E s-a-1 E s-a-0 B s-a-1 B s-a-0 F s-a-1 F s-a-0 C s-a-1 C s-a-0 G s-a-1 G s-a-0 14 faults D s-a-1 D s-a-0 Other fault models: - Break faults, Bridging faults, Transistor stuck-open faults, Transistor stuck-on faults, Delay faults Introduction to VLSI Testing.10
11 Fault Coverage (FC) FC = # faults detected # faults in fault list Eample: a b c 10 6 stuck-at faults ( a 0,a 1,b 0,b 1,c 0,c 1 ) Test faults detected FC {(0,0)} {(0,1)} {(1,1)} {(0,0),(1,1)} {(1,0),(0,1),(1,1)} c 1 a 1,c 1 a 0,b 0,c 0 a 0,b 0,c 0,c 1 all 16.67% 33.33% 50.00% 66.67% % Introduction to VLSI Testing.11
12 Testing and Quality IC Fabrication Yield: Fraction of good parts Testing Rejects Shipped Parts Quality: Defective parts per million (DPM) Quality of shipped parts is a function of yield Y and the test (fault) coverage T Defect level (DL) : fraction of shipped parts that are defective Introduction to VLSI Testing.12
13 Yield (Y) 50% 75% 90% 95% 99% 90% 90% 90% 90% Defect Level, Yield and Fault Coverage DL= 1 - Y (1-T) Fault Coverage (T) 90% 90% 90% 90% 90% 90% 95% 99% 99.9% DL: defect level Y: yield T: fault coverage DPM (DL) 67,000 28,000 10,000 5,000 1,000 10,000 5,000 1, Introduction to VLSI Testing.13
14 Logic simulation To determine how a good circuit should work Given input vectors, determine the normal circuit response A I C A B D F B G C C C1 C C2 C E E F B R B I R I F C DE C JE D H E Introduction to VLSI Testing.14
15 Fault simulation To determine the behavior of faulty circuits A 1 E s.a.0 B 0 1/0 C 0 F D 0 1 1/0 G Given a test vector, determine all faults that are detected by this test vector. Eample: A B C Test vector (1 1) detects { a 0, b 0, c 1 } Introduction to VLSI Testing.15
16 Test generation Given a fault, identify a test to detect this fault Eample: A 0 D B F C E To detect D s-a-0, D must be set to 1. Thus A=B=1. To propagate fault effect to the primary output E must be 1. Thus C must be 0. Test vector: A=1, B=1, C=0 Introduction to VLSI Testing.16
17 Automatic Test Pattern Generation (ATPG) Given a circuit, identify a set of test vectors to detect all faults under consideration. Input circuit Form fault list More faults? Yes No Eit Fault dropping Select a fault Test generation Fault simulation Introduction to VLSI Testing.17
18 Difficulties in test generation 1. Reconvergent fanout A B s-a-1 D F C E Introduction to VLSI Testing.18
19 Difficulties in test generation (cont.) 2. Sequential test generation PIs Combinational part PIs Y Y J K CK clk Introduction to VLSI Testing.19
20 Testable Design Design for testability (DFT) ad hoc techniques Scan design Boundary Scan Built-In Self Test (BIST) Random number generator (RNG) Signature Analyzer (SA) Synthesis for Testability Introduction to VLSI Testing.20
21 Eample of ad hoc techniques Insert test point MUX T/N Introduction to VLSI Testing.21
22 Scan System Original design Modified design PI C PO PI C PO SO R T/N R' SI Introduction to VLSI Testing.22
23 Scan Cell Design DI D CK Q Q DI SI N/T (SE) MUX D CK Q Q,SO DI Q DI Q,SO Φ Φ SI Φ Φ T Φ + Φ T Introduction to VLSI Testing.23
24 Scan Register Combinational Circuits Q D Q D Q D Q D SO SI SI SI SI CLK SE Introduction to VLSI Testing.24
25 Boundary Scan I/O Pad Boundary scan cell Boundary scan path TRST* TDI Sout APPLICATION LOGIC TMS Misc. registers TCK TDO T A P M U X Instruction register Bypass register Sin BIST register Scan register TRST*:Test rest (Optional) TDI: Test data input TD0: Test data output TCK: Test clock TMS: Test mode select Introduction to VLSI Testing.25
26 Boundary Scan (Cont.) TRST* TRST* TDI Sout APPLICATION LOGIC TDI Sout APPLICATION LOGIC Misc. registers Misc. registers TMS TCK TDO T A P M U X Instruction register Bypass register Sin BIST register Scan register TMS TCK TDO T A P M U X Instruction register Bypass register Sin BIST register Scan register TRST* TRST* TDI Misc. registers Sout APPLICATION LOGIC TDI Misc. registers Sout APPLICATION LOGIC TMS TCK TDO T A P M U X Instruction register Bypass register Sin BIST register Scan register TMS TCK TDO T A P M U X Instruction register Bypass register Sin BIST register Scan register Introduction to VLSI Testing.26
27 Built-In-Self Test (BIST) Places the job of device testing inside the device itself Generates its own stimulus and analyzes its own response from system mu circuit under test to system pattern generator BIST Controller Response Analyzer good/fail biston bistdone Introduction to VLSI Testing.27
28 Built-In-Self Test (BIST) (Cont.) Two major tasks - Test pattern generation - Test result compaction Usually implemented by linear feedback shift register F/F F/F F/F Introduction to VLSI Testing.28
29 Random Number Generator (RNG) F/F F/F F/F F/F (repeat) 1. Generate pseudo random patterns 2. Period is 2 n -1 Introduction to VLSI Testing.29
30 Signature Analyzer (SA) Input sequence (8 bits) G ( ) = Z P ( ) = Time Input stream Register contents Output stream Initial state Remainder R() = Quotient 1+ 2 Introduction to VLSI Testing.30
31 Introduction to VLSI Testing.31 Signature Analyzer (SA) (Cont.) ) ( 1 ) ( ) ( ) ( G R Q P = = + 1 : ) ( P + 1 : ) ( 2 Q = Prob. of aliasing error = 1/2 n where n is # of FFs
32 Memory BIST Architecture with a Compressor Before After di addr wen Memory Module data sys_di sys_addr sys_wen clk hold_l rst_l test_h si se Memory Module data q so Introduction to VLSI Testing.32
33 Memory BIST Architecture with a Compressor (Cont.) sys_addr sys_d isys_wen rst_l clk hold_l test_h Algorithm-Based Pattern Generator di addr wen Memory Module compress_hclk rst si se data Compressor q so BIST Circuitry Introduction to VLSI Testing.33
34 sys_addr1 sys_addr2 sys_di2 sys_wen2 sys_addr3 sys_di3 sys_wen3 rst_ l clk hold_l test_h Three Memories and One Compressor Algorithm-Based Pattern Generator se si addr1 di2 addr2 wen2 di3 addr3 wen3 compress_h ROM4KX4 Module RAM8KX8 Module RAM8KX8 Module Compressor q so data data data BIST Circuitry Introduction to VLSI Testing.34
35 Synthesis for Testability Automatic v.s Semi-automatic Commercial products - Testability analysis tools - Full / partial scan insertion - BIST insertion - Boundary scan insertion Research - RTL synthesis - FSM synthesis - Gate level synthesis - Boolean equation synthesis Introduction to VLSI Testing.35
36 CPU Test Control Architecture Scan_i Scan_en Scan path Scan_o logic rst_l clk hold_l test_h Bist control Memory TDI bist decoder bist_se bist_si compressor scan decoder bist_so int_scan mbist decoder MUX TDO TCK TMS TAP Controller IR Introduction to VLSI Testing.36
37 Testable Design Flow Prepare Initial Design RTL Code Integrate all DFT Methodologies Verify Functionality Generate/Verify Test Patterns by FastScan Identify Blocks for BIST/Scan Insert/Verify Internal Scan Circuitry by DFTADvisor Insert/Verify BIST Circuitry by MBISTArchitect P/F Synthesis to Gate Level Modify/Verify Original Design Reserve Dummy Ports for Internal Scan Insert/Verify Boundary Scan Circuitry by BSDArchitect Introduction to VLSI Testing.37
38 Problems re-thinking A 32-bit adder --- ATPG A 32-bit counter --- Design for testability + ATPG A 1MB Cache memory --- BIST A transistor CPU --- All test techniques Introduction to VLSI Testing.38
39 Conclusions Two major fields in testing ATPG --- Fault simulation --- Test generation Testable design --- Design for testability --- Built-in self-test --- Synthesis for testability Introduction to VLSI Testing.39
Memory Testing. Memory testing.1
Memory Testing Introduction Memory Architecture & Fault Models Test Algorithms DC / AC / Dynamic Tests Built-in Self Testing Schemes Built-in Self Repair Schemes Memory testing.1 Memory Market Share in
More informationDesign Verification & Testing Design for Testability and Scan
Overview esign for testability (FT) makes it possible to: Assure the detection of all faults in a circuit Reduce the cost and time associated with test development Reduce the execution time of performing
More informationVLSI Design Verification and Testing
VLSI Design Verification and Testing Instructor Chintan Patel (Contact using email: cpatel2@cs.umbc.edu). Text Michael L. Bushnell and Vishwani D. Agrawal, Essentials of Electronic Testing, for Digital,
More informationTesting of Digital System-on- Chip (SoC)
Testing of Digital System-on- Chip (SoC) 1 Outline of the Talk Introduction to system-on-chip (SoC) design Approaches to SoC design SoC test requirements and challenges Core test wrapper P1500 core test
More informationDesign Verification and Test of Digital VLSI Circuits NPTEL Video Course. Module-VII Lecture-I Introduction to Digital VLSI Testing
Design Verification and Test of Digital VLSI Circuits NPTEL Video Course Module-VII Lecture-I Introduction to Digital VLSI Testing VLSI Design, Verification and Test Flow Customer's Requirements Specifications
More informationDigital Circuit Design
Test and Diagnosis of of ICs Fault coverage (%) 95 9 85 8 75 7 65 97.92 SSL 4,246 Shawn Blanton Professor Department of ECE Center for Silicon System Implementation CMU Laboratory for Integrated Systems
More informationFault Modeling. Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults. Transistor faults Summary
Fault Modeling Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence Fault dominance and checkpoint theorem Classes of stuck-at
More informationTesting Low Power Designs with Power-Aware Test Manage Manufacturing Test Power Issues with DFTMAX and TetraMAX
White Paper Testing Low Power Designs with Power-Aware Test Manage Manufacturing Test Power Issues with DFTMAX and TetraMAX April 2010 Cy Hay Product Manager, Synopsys Introduction The most important trend
More informationImplementation Details
LEON3-FT Processor System Scan-I/F FT FT Add-on Add-on 2 2 kbyte kbyte I- I- Cache Cache Scan Scan Test Test UART UART 0 0 UART UART 1 1 Serial 0 Serial 1 EJTAG LEON_3FT LEON_3FT Core Core 8 Reg. Windows
More informationWhat is a System on a Chip?
What is a System on a Chip? Integration of a complete system, that until recently consisted of multiple ICs, onto a single IC. CPU PCI DSP SRAM ROM MPEG SoC DRAM System Chips Why? Characteristics: Complex
More informationThe Boundary Scan Test (BST) technology
The Boundary Scan Test () technology J. M. Martins Ferreira FEUP / DEEC - Rua Dr. Roberto Frias 42-537 Porto - PORTUGAL Tel. 35 225 8 748 / Fax: 35 225 8 443 (jmf@fe.up.pt / http://www.fe.up.pt/~jmf) Objectives
More informationNon-Contact Test Access for Surface Mount Technology IEEE 1149.1-1990
Non-Contact Test Access for Surface Mount Technology IEEE 1149.1-1990 ABSTRACT Mechanical and chemical process challenges initially limited acceptance of surface mount technology (SMT). As those challenges
More informationIntroduction to Digital System Design
Introduction to Digital System Design Chapter 1 1 Outline 1. Why Digital? 2. Device Technologies 3. System Representation 4. Abstraction 5. Development Tasks 6. Development Flow Chapter 1 2 1. Why Digital
More informationAt-Speed Test Considering Deep Submicron Effects. D. M. H. Walker Dept. of Computer Science Texas A&M University walker@cs.tamu.
At-Speed Test Considering Deep Submicron Effects D. M. H. Walker Dept. of Computer Science Teas A&M University walker@cs.tamu.edu Integrated Circuit Testing IC Test What s Going On Test Generation Test
More informationDigital Design Verification
Digital Design Verification Course Instructor: Debdeep Mukhopadhyay Dept of Computer Sc. and Engg. Indian Institute of Technology Madras, Even Semester Course No: CS 676 1 Verification??? What is meant
More informationASYNCHRONOUS COUNTERS
LB no.. SYNCHONOUS COUNTES. Introduction Counters are sequential logic circuits that counts the pulses applied at their clock input. They usually have 4 bits, delivering at the outputs the corresponding
More informationEncounter DFT Architect
Full-chip, synthesis-based, power-aware test architecture development Cadence Encounter DFT Architect addresses and optimizes multiple design and manufacturing objectives such as timing, area, wiring,
More informationECE410 Design Project Spring 2008 Design and Characterization of a CMOS 8-bit Microprocessor Data Path
ECE410 Design Project Spring 2008 Design and Characterization of a CMOS 8-bit Microprocessor Data Path Project Summary This project involves the schematic and layout design of an 8-bit microprocessor data
More informationISSN: 2319-5967 ISO 9001:2008 Certified International Journal of Engineering Science and Innovative Technology (IJESIT) Volume 2, Issue 3, May 2013
Transistor Level Fault Finding in VLSI Circuits using Genetic Algorithm Lalit A. Patel, Sarman K. Hadia CSPIT, CHARUSAT, Changa., CSPIT, CHARUSAT, Changa Abstract This paper presents, genetic based algorithm
More informationTABLE OF CONTENTS. xiii List of Tables. xviii List of Design-for-Test Rules. xix Preface to the First Edition. xxi Preface to the Second Edition
TABLE OF CONTENTS List of Figures xiii List of Tables xviii List of Design-for-Test Rules xix Preface to the First Edition xxi Preface to the Second Edition xxiii Acknowledgement xxv 1 Boundary-Scan Basics
More informationObjective. Testing Principle. Types of Testing. Characterization Test. Verification Testing. VLSI Design Verification and Testing.
VLSI Design Verification and Testing Objective VLSI Testing Mohammad Tehranipoor Electrical and Computer Engineering University of Connecticut Need to understand Types of tests performed at different stages
More informationDigital Logic Design. Basics Combinational Circuits Sequential Circuits. Pu-Jen Cheng
Digital Logic Design Basics Combinational Circuits Sequential Circuits Pu-Jen Cheng Adapted from the slides prepared by S. Dandamudi for the book, Fundamentals of Computer Organization and Design. Introduction
More informationINTRODUCTION TO DIGITAL SYSTEMS. IMPLEMENTATION: MODULES (ICs) AND NETWORKS IMPLEMENTATION OF ALGORITHMS IN HARDWARE
INTRODUCTION TO DIGITAL SYSTEMS 1 DESCRIPTION AND DESIGN OF DIGITAL SYSTEMS FORMAL BASIS: SWITCHING ALGEBRA IMPLEMENTATION: MODULES (ICs) AND NETWORKS IMPLEMENTATION OF ALGORITHMS IN HARDWARE COURSE EMPHASIS:
More informationExample-driven Interconnect Synthesis for Heterogeneous Coarse-Grain Reconfigurable Logic
Example-driven Interconnect Synthesis for Heterogeneous Coarse-Grain Reconfigurable Logic Clifford Wolf, Johann Glaser, Florian Schupfer, Jan Haase, Christoph Grimm Computer Technology /99 Overview Ultra-Low-Power
More informationCombinational Logic Design Process
Combinational Logic Design Process Create truth table from specification Generate K-maps & obtain logic equations Draw logic diagram (sharing common gates) Simulate circuit for design verification Debug
More informationJTAG Applications. Product Life-Cycle Support. Software Debug. Integration & Test. Figure 1. Product Life Cycle Support
JTAG Applications While it is obvious that JTAG based testing can be used in the production phase of a product, new developments and applications of the IEEE-1149.1 standard have enabled the use of JTAG
More informationMOTION ESTIMATION TESTING USING AN ERROR DETECTION AND DATA RECOVERY ARCHITECTURE
MOTION ESTIMATION TESTING USING AN ERROR DETECTION AND DATA RECOVERY ARCHITECTURE MEENA NAGARAJU 1, DR.GIRI BABU KANDE 2 1 PG Student (M.Tech VLSI), Dept. Of ECE, Vasireddy Venkatadri Ins. Tech., Nambur,
More informationModule-I Lecture-I Introduction to Digital VLSI Design Flow
Design Verification and Test of Digital VLSI Circuits NPTEL Video Course Module-I Lecture-I Introduction to Digital VLSI Design Flow Introduction The functionality of electronics equipments and gadgets
More informationBoundary-Scan Tutorial
See the ASSET homepage on the World Wide Web at http://www.asset-intertech.com ASSET and the ASSET logo are registered trademarks of ASSET InterTech, Inc. Windows is a registered trademark of Microsoft
More informationTesting & Verification of Digital Circuits ECE/CS 5745/6745. Hardware Verification using Symbolic Computation
Testing & Verification of Digital Circuits ECE/CS 5745/6745 Hardware Verification using Symbolic Computation Instructor: Priyank Kalla (kalla@ece.utah.edu) 3 Credits Mon, Wed, 1:25-2:45pm, WEB L105 Office
More informationTHE ADVANTAGES OF COMBINING LOW PIN COUNT TEST WITH SCAN COMPRESSION OF VLSI TESTING
Zbornik radova 56. Konferencije za ETRAN, Zlatibor, 11-14. juna 2012. Proc. 56th ETRAN Conference, Zlatibor, June 11-14, 2012 THE ADVANTAGES OF COMBINING LOW PIN COUNT TEST WITH SCAN COMPRESSION OF VLSI
More informationESP-CV Custom Design Formal Equivalence Checking Based on Symbolic Simulation
Datasheet -CV Custom Design Formal Equivalence Checking Based on Symbolic Simulation Overview -CV is an equivalence checker for full custom designs. It enables efficient comparison of a reference design
More information1. True or False? A voltage level in the range 0 to 2 volts is interpreted as a binary 1.
File: chap04, Chapter 04 1. True or False? A voltage level in the range 0 to 2 volts is interpreted as a binary 1. 2. True or False? A gate is a device that accepts a single input signal and produces one
More informationMemory Elements. Combinational logic cannot remember
Memory Elements Combinational logic cannot remember Output logic values are function of inputs only Feedback is needed to be able to remember a logic value Memory elements are needed in most digital logic
More informationTopics of Chapter 5 Sequential Machines. Memory elements. Memory element terminology. Clock terminology
Topics of Chapter 5 Sequential Machines Memory elements Memory elements. Basics of sequential machines. Clocking issues. Two-phase clocking. Testing of combinational (Chapter 4) and sequential (Chapter
More informationEE 42/100 Lecture 24: Latches and Flip Flops. Rev B 4/21/2010 (2:04 PM) Prof. Ali M. Niknejad
A. M. Niknejad University of California, Berkeley EE 100 / 42 Lecture 24 p. 1/20 EE 42/100 Lecture 24: Latches and Flip Flops ELECTRONICS Rev B 4/21/2010 (2:04 PM) Prof. Ali M. Niknejad University of California,
More informationCHAPTER 11: Flip Flops
CHAPTER 11: Flip Flops In this chapter, you will be building the part of the circuit that controls the command sequencing. The required circuit must operate the counter and the memory chip. When the teach
More informationChung-Ho Chen Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan
A Hybrid Software-Based Self-Testing methodology for Embedded Processor Tai-Hua Lu Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan aaron@casmail.ee.ncku.edu.tw Chung-Ho
More informationSystems I: Computer Organization and Architecture
Systems I: Computer Organization and Architecture Lecture 9 - Register Transfer and Microoperations Microoperations Digital systems are modular in nature, with modules containing registers, decoders, arithmetic
More informationLatches, the D Flip-Flop & Counter Design. ECE 152A Winter 2012
Latches, the D Flip-Flop & Counter Design ECE 52A Winter 22 Reading Assignment Brown and Vranesic 7 Flip-Flops, Registers, Counters and a Simple Processor 7. Basic Latch 7.2 Gated SR Latch 7.2. Gated SR
More informationArbitrary Density Pattern (ADP) Based Reduction of Testing Time in Scan-BIST VLSI Circuits
Arbitrary Density Pattern (ADP) Based Reduction of Testing Time in Scan-BIST VLSI Circuits G. Naveen Balaji S. Vinoth Vijay Abstract Test power reduction done by Arbitrary Density Patterns (ADP) in which
More informationYaffs NAND Flash Failure Mitigation
Yaffs NAND Flash Failure Mitigation Charles Manning 2012-03-07 NAND flash is one of very few types of electronic device which are knowingly shipped with errors and are expected to generate further errors
More informationTesting and Programming PCBA s during Design and in Production
Testing and Programming PCBA s during Design and in Production Hogeschool van Arnhem en Nijmegen 6 June 23 Rob Staals JTAG Technologies robstaals@jtag.com Copyright 23, JTAG Technologies juni 3 The importance
More informationExperiment # 9. Clock generator circuits & Counters. Eng. Waleed Y. Mousa
Experiment # 9 Clock generator circuits & Counters Eng. Waleed Y. Mousa 1. Objectives: 1. Understanding the principles and construction of Clock generator. 2. To be familiar with clock pulse generation
More informationETEC 2301 Programmable Logic Devices. Chapter 10 Counters. Shawnee State University Department of Industrial and Engineering Technologies
ETEC 2301 Programmable Logic Devices Chapter 10 Counters Shawnee State University Department of Industrial and Engineering Technologies Copyright 2007 by Janna B. Gallaher Asynchronous Counter Operation
More informationDigitale Signalverarbeitung mit FPGA (DSF) Soft Core Prozessor NIOS II Stand Mai 2007. Jens Onno Krah
(DSF) Soft Core Prozessor NIOS II Stand Mai 2007 Jens Onno Krah Cologne University of Applied Sciences www.fh-koeln.de jens_onno.krah@fh-koeln.de NIOS II 1 1 What is Nios II? Altera s Second Generation
More informationModeling Sequential Elements with Verilog. Prof. Chien-Nan Liu TEL: 03-4227151 ext:34534 Email: jimmy@ee.ncu.edu.tw. Sequential Circuit
Modeling Sequential Elements with Verilog Prof. Chien-Nan Liu TEL: 03-4227151 ext:34534 Email: jimmy@ee.ncu.edu.tw 4-1 Sequential Circuit Outputs are functions of inputs and present states of storage elements
More informationREUSING AND RETARGETING ON-CHIP INSTRUMENT ACCESS PROCEDURES IN IEEE P1687
REUSING AND RETARGETING ON-CHIP INSTRUMENT ACCESS PROCEDURES IN IEEE P1687 Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson Linköping University Gunnar Carlsson Ericsson ABSTRACT Modern chips may contain
More informationProgramming A PLC. Standard Instructions
Programming A PLC STEP 7-Micro/WIN32 is the program software used with the S7-2 PLC to create the PLC operating program. STEP 7 consists of a number of instructions that must be arranged in a logical order
More informationNEW adder cells are useful for designing larger circuits despite increase in transistor count by four per cell.
CHAPTER 4 THE ADDER The adder is one of the most critical components of a processor, as it is used in the Arithmetic Logic Unit (ALU), in the floating-point unit and for address generation in case of cache
More informationBuilt-In Current Sensor for I DDQ Testing Embedded I DDQ Testing Architecture Based on IEEE 1149.1
SCOPE http://www.cs.uoi.gr VLSI Technology and Computer Architecture Lab Research and teaching in the area of architectures and design techniques for VLSI integrated circuits and systems. ACTIVITIES PERSONEL
More informationA STUDY OF INSTRUMENT REUSE AND RETARGETING IN P1687
A STUDY OF INSTRUMENT REUSE AND RETARGETING IN P1687 Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson Linköping University Gunnar Carlsson Ericsson ABSTRACT Modern chips may contain a large number
More informationHaving read this workbook you should be able to: recognise the arrangement of NAND gates used to form an S-R flip-flop.
Objectives Having read this workbook you should be able to: recognise the arrangement of NAND gates used to form an S-R flip-flop. describe how such a flip-flop can be SET and RESET. describe the disadvantage
More informationAutomotive Electronics Council Component Technical Committee
ATTACHMENT 7 FAULT SIMULATION AND FAULT GRADING Acknowledgment Any document involving a complex technology brings together experience and skills from many sources. The Automotive Electronics Council would
More information21555 Non-Transparent PCI-to- PCI Bridge
21555 Non-Transparent PCI-to- PCI Bridge Specification Update December 2002 Notice: The 21555 may contain design defects or errors known as errata. Characterized errata that may cause the 21555 s behavior
More informationMICROPROCESSOR AND MICROCOMPUTER BASICS
Introduction MICROPROCESSOR AND MICROCOMPUTER BASICS At present there are many types and sizes of computers available. These computers are designed and constructed based on digital and Integrated Circuit
More informationLet s put together a Manual Processor
Lecture 14 Let s put together a Manual Processor Hardware Lecture 14 Slide 1 The processor Inside every computer there is at least one processor which can take an instruction, some operands and produce
More informationMemory Basics. SRAM/DRAM Basics
Memory Basics RAM: Random Access Memory historically defined as memory array with individual bit access refers to memory with both Read and Write capabilities ROM: Read Only Memory no capabilities for
More informationLFSR BASED COUNTERS AVINASH AJANE, B.E. A technical report submitted to the Graduate School. in partial fulfillment of the requirements
LFSR BASED COUNTERS BY AVINASH AJANE, B.E A technical report submitted to the Graduate School in partial fulfillment of the requirements for the degree Master of Science in Electrical Engineering New Mexico
More informationTo design digital counter circuits using JK-Flip-Flop. To implement counter using 74LS193 IC.
8.1 Objectives To design digital counter circuits using JK-Flip-Flop. To implement counter using 74LS193 IC. 8.2 Introduction Circuits for counting events are frequently used in computers and other digital
More informationIntroduction ABOUT THIS CHAPTER CHAPTER
CHAPTER Introduction 1 Charles E. Stroud Auburn University, Auburn, Alabama Laung-Terng (L.-T.) Wang SynTest Technologies, Inc., Sunnyvale, California Yao-Wen Chang National Taiwan University, Taipei,
More informationWireless Approach for SIP and SOC Testing
Wireless Approach for SIP and SOC Testing Ziad Noun To cite this version: Ziad Noun. Wireless Approach for SIP and SOC Testing. Micro and nanotechnologies/microelectronics. Université Montpellier II -
More informationSerial port interface for microcontroller embedded into integrated power meter
Serial port interface for microcontroller embedded into integrated power meter Mr. Borisav Jovanović, Prof. dr. Predrag Petković, Prof. dr. Milunka Damnjanović, Faculty of Electronic Engineering Nis, Serbia
More informationDesign of a High Speed Communications Link Using Field Programmable Gate Arrays
Customer-Authored Application Note AC103 Design of a High Speed Communications Link Using Field Programmable Gate Arrays Amy Lovelace, Technical Staff Engineer Alcatel Network Systems Introduction A communication
More informationReusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687 Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson Linköping University Post Print N.B.: When citing this
More informationG. Squillero, M. Rebaudengo. Test Techniques for Systems-on-a-Chip
G. Squillero, M. Rebaudengo Test Techniques for Systems-on-a-Chip December 2005 Preface Fast innovation in VLSI technologies makes possible the integration a complete system into a single chip (System-on-Chip,
More informationIntroduction to CMOS VLSI Design (E158) Lecture 8: Clocking of VLSI Systems
Harris Introduction to CMOS VLSI Design (E158) Lecture 8: Clocking of VLSI Systems David Harris Harvey Mudd College David_Harris@hmc.edu Based on EE271 developed by Mark Horowitz, Stanford University MAH
More informationSet-Reset (SR) Latch
et-eset () Latch Asynchronous Level sensitive cross-coupled Nor gates active high inputs (only one can be active) + + Function 0 0 0 1 0 1 eset 1 0 1 0 et 1 1 0-? 0-? Indeterminate cross-coupled Nand gates
More informationMICROPROCESSOR. Exclusive for IACE Students www.iace.co.in iacehyd.blogspot.in Ph: 9700077455/422 Page 1
MICROPROCESSOR A microprocessor incorporates the functions of a computer s central processing unit (CPU) on a single Integrated (IC), or at most a few integrated circuit. It is a multipurpose, programmable
More informationChapter 5 :: Memory and Logic Arrays
Chapter 5 :: Memory and Logic Arrays Digital Design and Computer Architecture David Money Harris and Sarah L. Harris Copyright 2007 Elsevier 5- ROM Storage Copyright 2007 Elsevier 5- ROM Logic Data
More informationChapter 9 Semiconductor Memories. Jin-Fu Li Department of Electrical Engineering National Central University Jungli, Taiwan
Chapter 9 Semiconductor Memories Jin-Fu Li Department of Electrical Engineering National Central University Jungli, Taiwan Advanced Reliable Systems (ARES) Lab. Jin-Fu Li, EE, NCU 2 Outline Introduction
More informationSequential Circuit Design
Sequential Circuit Design Lan-Da Van ( 倫 ), Ph. D. Department of Computer Science National Chiao Tung University Taiwan, R.O.C. Fall, 2009 ldvan@cs.nctu.edu.tw http://www.cs.nctu.edu.tw/~ldvan/ Outlines
More informationIntroduction to Functional Verification. Niels Burkhardt
Introduction to Functional Verification Overview Verification issues Verification technologies Verification approaches Universal Verification Methodology Conclusion Functional Verification issues Hardware
More informationCHAPTER 3 Boolean Algebra and Digital Logic
CHAPTER 3 Boolean Algebra and Digital Logic 3.1 Introduction 121 3.2 Boolean Algebra 122 3.2.1 Boolean Expressions 123 3.2.2 Boolean Identities 124 3.2.3 Simplification of Boolean Expressions 126 3.2.4
More informationAims and Objectives. E 3.05 Digital System Design. Course Syllabus. Course Syllabus (1) Programmable Logic
Aims and Objectives E 3.05 Digital System Design Peter Cheung Department of Electrical & Electronic Engineering Imperial College London URL: www.ee.ic.ac.uk/pcheung/ E-mail: p.cheung@ic.ac.uk How to go
More informationSystem-on-Chip Designs Strategy for Success
Designs Strategy for Success W H I T E P A P E R-June 2001 Udaya Kamath Rajita Kaundin Conventionally, ASIC design involved development of medium complexity Integrated Circuits (of less than 500,000 gates).
More informationLayout of Multiple Cells
Layout of Multiple Cells Beyond the primitive tier primitives add instances of primitives add additional transistors if necessary add substrate/well contacts (plugs) add additional polygons where needed
More informationProgrammable Logic Devices: A Test Approach for the Input/Output Blocks and Pad-to-Pin Interconnections
Programmable Logic Devices: A Test Approach for the Input/Output Blocks and Pad-to-Pin Interconnections Manuel G. Gericota, Gustavo R. Alves Department of Electrical Engineering ISEP Rua Dr. António Bernardino
More informationChapter 7. Registers & Register Transfers. J.J. Shann. J. J. Shann
Chapter 7 Registers & Register Transfers J. J. Shann J.J. Shann Chapter Overview 7- Registers and Load Enable 7-2 Register Transfers 7-3 Register Transfer Operations 7-4 A Note for VHDL and Verilog Users
More informationNTE2053 Integrated Circuit 8 Bit MPU Compatible A/D Converter
NTE2053 Integrated Circuit 8 Bit MPU Compatible A/D Converter Description: The NTE2053 is a CMOS 8 bit successive approximation Analog to Digital converter in a 20 Lead DIP type package which uses a differential
More informationECE232: Hardware Organization and Design. Part 3: Verilog Tutorial. http://www.ecs.umass.edu/ece/ece232/ Basic Verilog
ECE232: Hardware Organization and Design Part 3: Verilog Tutorial http://www.ecs.umass.edu/ece/ece232/ Basic Verilog module ();
More informationArchitectures and Platforms
Hardware/Software Codesign Arch&Platf. - 1 Architectures and Platforms 1. Architecture Selection: The Basic Trade-Offs 2. General Purpose vs. Application-Specific Processors 3. Processor Specialisation
More informationGate Delay Model. Estimating Delays. Effort Delay. Gate Delay. Computing Logical Effort. Logical Effort
Estimating Delays Would be nice to have a back of the envelope method for sizing gates for speed Logical Effort Book by Sutherland, Sproull, Harris Chapter 1 is on our web page Also Chapter 4 in our textbook
More informationDESIGN OF AN ERROR DETECTION AND DATA RECOVERY ARCHITECTURE FOR MOTION ESTIMATION TESTING APPLICATIONS
DESIGN OF AN ERROR DETECTION AND DATA RECOVERY ARCHITECTURE FOR MOTION ESTIMATION TESTING APPLICATIONS V. SWARNA LATHA 1 & K. SRINIVASA RAO 2 1 VLSI System Design A.I.T.S, Rajampet Kadapa (Dt), A.P., India
More informationPower Reduction Techniques in the SoC Clock Network. Clock Power
Power Reduction Techniques in the SoC Network Low Power Design for SoCs ASIC Tutorial SoC.1 Power Why clock power is important/large» Generally the signal with the highest frequency» Typically drives a
More informationInstruction Set Architecture. Datapath & Control. Instruction. LC-3 Overview: Memory and Registers. CIT 595 Spring 2010
Instruction Set Architecture Micro-architecture Datapath & Control CIT 595 Spring 2010 ISA =Programmer-visible components & operations Memory organization Address space -- how may locations can be addressed?
More informationA New Multi-site Test for System-on-Chip Using Multi-site Star Test Architecture
A New Multi-site Test for System-on-Chip Using Multi-site Star Test Architecture Dongkwan Han, Yong Lee, and Sungho Kang As the system-on-chip (SoC) design becomes more complex, the test costs are increasing.
More informationUnited States Naval Academy Electrical and Computer Engineering Department. EC262 Exam 1
United States Naval Academy Electrical and Computer Engineering Department EC262 Exam 29 September 2. Do a page check now. You should have pages (cover & questions). 2. Read all problems in their entirety.
More informationDigital Systems Design! Lecture 1 - Introduction!!
ECE 3401! Digital Systems Design! Lecture 1 - Introduction!! Course Basics Classes: Tu/Th 11-12:15, ITE 127 Instructor Mohammad Tehranipoor Office hours: T 1-2pm, or upon appointments @ ITE 441 Email:
More informationVon der Hardware zur Software in FPGAs mit Embedded Prozessoren. Alexander Hahn Senior Field Application Engineer Lattice Semiconductor
Von der Hardware zur Software in FPGAs mit Embedded Prozessoren Alexander Hahn Senior Field Application Engineer Lattice Semiconductor AGENDA Overview Mico32 Embedded Processor Development Tool Chain HW/SW
More informationIL2225 Physical Design
IL2225 Physical Design Nasim Farahini farahini@kth.se Outline Physical Implementation Styles ASIC physical design Flow Floor and Power planning Placement Clock Tree Synthesis Routing Timing Analysis Verification
More informationModeling Latches and Flip-flops
Lab Workbook Introduction Sequential circuits are digital circuits in which the output depends not only on the present input (like combinatorial circuits), but also on the past sequence of inputs. In effect,
More informationThe components. E3: Digital electronics. Goals:
E3: Digital electronics Goals: Basic understanding of logic circuits. Become familiar with the most common digital components and their use. Equipment: 1 st. LED bridge 1 st. 7-segment display. 2 st. IC
More informationModule 2. Embedded Processors and Memory. Version 2 EE IIT, Kharagpur 1
Module 2 Embedded Processors and Memory Version 2 EE IIT, Kharagpur 1 Lesson 5 Memory-I Version 2 EE IIT, Kharagpur 2 Instructional Objectives After going through this lesson the student would Pre-Requisite
More informationProgramming NAND devices
Technical Guide Programming NAND devices Kelly Hirsch, Director of Advanced Technology, Data I/O Corporation Recent Design Trends In the past, embedded system designs have used NAND devices for storing
More informationComputer Systems Design and Architecture by V. Heuring and H. Jordan
1-1 Chapter 1 - The General Purpose Machine Computer Systems Design and Architecture Vincent P. Heuring and Harry F. Jordan Department of Electrical and Computer Engineering University of Colorado - Boulder
More informationRAM & ROM Based Digital Design. ECE 152A Winter 2012
RAM & ROM Based Digital Design ECE 152A Winter 212 Reading Assignment Brown and Vranesic 1 Digital System Design 1.1 Building Block Circuits 1.1.3 Static Random Access Memory (SRAM) 1.1.4 SRAM Blocks in
More informationSwitch Fabric Implementation Using Shared Memory
Order this document by /D Switch Fabric Implementation Using Shared Memory Prepared by: Lakshmi Mandyam and B. Kinney INTRODUCTION Whether it be for the World Wide Web or for an intra office network, today
More information7a. System-on-chip design and prototyping platforms
7a. System-on-chip design and prototyping platforms Labros Bisdounis, Ph.D. Department of Computer and Communication Engineering 1 What is System-on-Chip (SoC)? System-on-chip is an integrated circuit
More informationChapter 2 Logic Gates and Introduction to Computer Architecture
Chapter 2 Logic Gates and Introduction to Computer Architecture 2.1 Introduction The basic components of an Integrated Circuit (IC) is logic gates which made of transistors, in digital system there are
More information