DIGITAL ELECTRONICS FOR MANUFACTURING MAINTENANCE Course Syllabus

Transcription

1 6111 E. Skelly Drive P. O. Box Tulsa, OK DIGITAL ELECTRONICS FOR MANUFACTURING MAINTENANCE Course Syllabus Course Number: AMTC-0468 OHLAP Credit: No OCAS Code: None Course Length: 120 Hours Career Cluster: Manufacturing Career Pathway: Maintenance, Installation & Repair Career Major(s): Mechatronics Systems Technician Pre-requisite(s): Course Description: This course is an introductory digital electronics course. The student will analyze, construct, test, and interface fundamental digital circuits including logic gates, combinational logic circuits, flip-flops, counters, encoders and decoders, shift registers, arithmetic circuits, digital to analog conversions, and analog to digital conversions. The student will also demonstrate knowledge of numbering systems and integrated circuit specifications. Textbooks: TBA Course Objectives: A. Demonstrate Knowledge Digital Circuit Components 1. Define the term DIGITAL. 2. Describe the types of wave shapes used in digital electronics. 3. State the difference between positive and negative logic. 4. Describe basic digital gates and how they are used in digital electronics. 5. Describe the advantages and disadvantages of RTL, DTL, T.L., and ECL gates. 6. Observe the operation of various digital logic gates. 7. Define an integrated circuit. 8. Describe, in basic terms, how integrated circuits are manufactured. 9. Identify different types of integrated circuit packaging. 10. Describe the four classifications of integrated circuits. 11. Explain the purpose of integrated circuit Data Sheets. 12. Describe the types of test equipment used in digital electronics and identify the types of signals they measure. 13. Describe how to sue a logic probe. 14. Observe signals in a digital circuit using a millimeter, oscilloscope, and logic probe. 15. Define the functions of buffers and indenters. 16. Recognize the logic symbol for buffers and indenters. 17. Construct a truth table for buffers and indenters. 18. State the Boolean expression for buffers and indenters. 19. Measure input and output signals of a digital buffer and inverter. 20. Describe the four step troubleshooting procedure used in digital circuits. 21. Recognize an OPEN and a GROUND condition using a logic probe, millimeter, and oscilloscope. 22. Analyze simple digital circuits to determine whether or not they are defective. 23. Determine the faulted component in simple digital circuits. 24. Describe the purpose of the 555 Timer. Revised: 8/19/2014 Page 1 of 6

2 25. Describe the operation of the 555 Timer. 26. Observe the operation of the 555 timer. B. Troubleshoot Selected Faulted Digital Logic Gates. 1. Define the AND function. 2. Describe a discrete component AND gate. 3. Recognize the logic symbol for the AND gate. 4. Construct a truth table for the AND gate. 5. Describe AND gate timing diagrams. 6. State the Boolean expression for the AND gate. 7. Measure input and output signals of a digital logic AND gate. 8. Define the OR function. 9. Describe a discrete component OR gate. 10. Recognize the logic symbol for the OR gate. 11. Construct a truth table for the OR gate. 12. Describe OR gate timing diagrams. 13. State the Boolean expression for the ORE gate. 14. Measure input and output signals of a digital logic OR gate. 15. Define the AND function. 16. Describe a discrete component AND gate. 17. Recognize the logic symbol for the AND gate. 18. Construct a truth table for the AND gate. 19. Describe AND gate timing diagrams. 20. State the Boolean expression for the AND gate. 21. Measure input and output signals of a digital logic AND gate. 22. Define the NOR function. 23. Describe a discrete component NOR gate. 24. Recognize the logic symbol for the NOR gate. 25. Construct a truth table for the NOR gate. 26. Describe NOR gate timing diagrams. 27. State the Boolean expression for the Nor gate. 28. Measure input and output signals of a digital logic NOR gate. 29. Define the XOR function. 30. Describe a discrete component XOR gate. 31. Recognize the logic symbol for the XOR gate. 32. Construct a truth table for the XOR gate. 33. Describe XOR gate timing diagrams. 34. State the Boolean expression for the XOR gate. 35. Measure input and output signals of a digital logic XOR gate. 36. Troubleshoot a faulted digital logic AND gate. 37. Troubleshoot a faulted digital logic OR gate. 38. Troubleshoot a faulted digital logic AND gate. 39. Troubleshoot a faulted digital logic NOR gate. 40. Troubleshoot a faulted digital logic XOR gate. C. Troubleshoot Selected Conversion Circuit Gating Devices 1. Describe how Combinational Circuits are used. 2. Describe why the AND gate is a universal gate. 3. Recognize AND gate circuits configured for NOT, AND, OR, NOR, and XOR gates. 4. Define terms associated with numbering systems. 5. Determine the radix of the binary, octal, decimal and hexadecimal numbering systems. Revised: 8/19/2014 Page 2 of 6

3 6. Recognize the basic symbols associated with the binary, octal, decimal and hexadecimal, numbering systems. 7. Select numbers from the binary, octal, decimal and hexadecimal numbering systems. 8. Observe the operation of an IC Decoder in base 8, 10, and 16 numbering systems. 9. Convert base 10 numbers to binary numbers. 10. Convert binary numbers to base 10 numbers. 11. Convert base 10 numbers to binary coded decimal. 12. Convert binary coded decimal numbers to decimal. 13. Measure and verify the signals in a decimal to BCD encoder combinational circuit. 14. Describe the purpose of Binary to Seven Segment Conversion Circuits. 15. Describe the operation of Binary to Seven Segment Conversion Circuits. 16. Observe the operation of Binary to Seven Segment conversion Circuits. 17. State the purpose of magnitude comparators and the process of comparison. 18. Describe the operation of a digital 1 bit A-B comparator circuit. 19. Describe the operation of a 2 bit comparator circuit. 20. Describe the MSE bit A-B comparator IC. 21. Observe the normal operation of the bit A-B comparator. 22. Troubleshoot a faulted combinational circuit. 23. Troubleshoot a Base 10 to binary conversion circuit. 24. Troubleshoot a binary to 7 segment conversion circuit. 25. Troubleshoot a 4 bit comparator circuit. D. Troubleshoot Selected Faulted Flip-flop Devices 1. Define terms and characteristics associated with multivibrators and flip-flops. 2. Describe the Eccles-Jordan discrete component multivibrator. 3. Describe the major types of digital flip-flops. 4. Identify the logic box symbols for the five major types of digital flip-flops. 5. Define the operation of RS flip-flops. 6. Construct a truth table for RS flip-flops. 7. Describe RS flip-flop timing diagrams. 8. Describe RS flip-flop circuits constructed from transistors, NOR gates, and AND gates. 9. Measure input and output signals of a NOR gate RS flip-flop. 10. Define the operation of JK flip-flops. 11. Construct a truth table for JK flip-flops. 12. Describe JK flip-flop timing diagrams 13. Measure input and output signals of JK flip-flops. 14. Troubleshoot a faulted RS flip-flop. 15. Troubleshoot a faulted JK flip-flop. 16. Define the operation of a clocked RS flip-flop. 17. Construct a truth table for a clocked RS flip-flop. 18. Describe clocked RS flip-flop timing diagrams. 19. Describe clocked RS flip-flop circuits constructed from NOR gates and AND gates. 20. Measure input and output signals of a AND gate clocked RS flip-flop. 21. Troubleshoot a faulted digital AND gate clocked RS flip-flop. 22. Define the operation of a D Type flip-flop. 23. Construct a truth table for a D Type flip-flop. 24. Describe D type Flip-flop timing diagrams. 25. Measure input and output signals of a D type flip-flop. Revised: 8/19/2014 Page 3 of 6

4 26. Troubleshoot a faulted digital D Type Flip-flop. 27. Define the operation of a Master Slave flip-flop. 28. Construct a truth table for a Master Salve flip-flop. 29. Describe the Master Slave flip-flop timing diagrams. 30. Measure input and output signals of a Master Slave flip-flop. E. Locate Faults in Registers and Memories 1. Describe the purpose of registers. 2. Describe the operation of registers. 3. Describe the purpose of memory. 4. Describe the operation of memory. 5. Describe the purpose of a 4 bit storage register. 6. Describe the operation of a 4 bit storage register. 7. Observe the operation of a 4 bit storage register. 8. Locate faults in a 4 bit storage register circuit. 9. Describe the purpose of a 4 bit shift register 10. Describe the operation of a 4 bit shift register. 11. Observe the operation of a 4 bit shift register. 12. Locate faults in a 4 bit shift register. 13. Describe the purpose of the 8 bit shift register. 14. Describe the operation of the 8 bit shift register. 15. Observe the operation of the 8 bit shift register. 16. Locate faults in an 8 bit shift register. 17. Describe the purpose the 64 bit memory circuit. 18. Describe the operation of the 64 bit memory circuit. 19. Observe the operation the 64 bit memory circuit. 20. Locate faults in a 64 bit memory circuit. F. Troubleshoot Selected Faulted Counter Circuit 1. Define arithmetic counting circuits. 2. State the purpose of arithmetic counting circuits. 3. List types of arithmetic counting circuits. 4. Describe the purpose of ripple counters. 5. Describe the operation of ripple counters. 6. Observe the operation of ripple counters. 7. Describe the purpose of up counters. 8. Describe the operation of the up counters. 9. Observe the operation of the up counters. 10. Describe the purpose of 4 bit adders. 11. Describe the operation of 4 bit adders. 12. Observe the operation of 4 bit adders. 13. Troubleshoot a faulted ripple counter circuit. 14. Troubleshoot a faulted up counter circuit. 15. Troubleshoot a faulted 4 bit adder circuit. 16. Describe the purpose of down counters. 17. Describe the operation of down counters. 18. Observe the operation of down counters. 19. Locate faults in a down counter. 20. Describe the purpose of four bit subtractor circuits. 21. Describe the operation of four bit subtractor circuits. 22. Observe the operation of four bit subtractor circuits. 23. Locate faults within four bit subtractor circuits. Revised: 8/19/2014 Page 4 of 6

5 G. Locate Faults in Conversion Circuits 1. Describe the purpose of conversion and data circuits. 2. Describe the operation of conversion and data circuits. 3. Describe the operation of data selection circuits. 4. Observe the operation of data selection circuits. 5. Locate faults in a data selection circuit. 6. Describe the operation of data distribution circuits. 7. Observe the operation of data distribution circuits. 8. Locate faults in data distribution circuits. 9. Describe the purpose of D/A conversion circuits. 10. Describe the operation of D/A conversion circuits. 11. Observe the operation of D/A conversion circuits. 12. Locate faults of D/A conversion circuits. H: Demonstrate Knowledge of Microprocessors 1. Describe the history of microprocessors. 2. Define commonly used microprocessor terms. 3. Identify the operational sections of typical microprocessors. 4. Describe basic microprocessor operation. 5. Describe basic microprocessor system components. 6. Describe some of the different microprocessors in use today. 7. Describe the operation of the Nida Model 400 microprocessor system. 8. Describe the internal structure of the 8085 microprocessor. 9. Describe the timed operations of the 8085 microprocessor. TTC objectives Teaching Methods: The class will primarily be taught by the lecture and demonstration method and supported by various media materials to address various learning styles. There will be question and answer sessions over material covered in lecture and media presentations. Supervised lab time is provided for students to complete required projects. Grading Procedures: 1. Students are graded on theory and shop practice and performance. 2. Each course must be passed with seventy (70%) percent or better. 3. Grading scale: A=90-100%, B=80-89%, C=70-79%, D=60-69%, F=50-59%. Description of Classroom, Laboratories, and Equipment: nology Center campuses are owned and operated by nology Center School District No. 18. All programs provide students the opportunity to work with professionally certified instructors in modern, well-equipped facilities. Available Certifications/ College Credit The student may be eligible to take state, national or industry exam after completion of the program. College credit may be issued from Oklahoma State University-Okmulgee or Tulsa Community College. See program counselor for additional information. Revised: 8/19/2014 Page 5 of 6

6 College Credit Eligibility: The student must maintain a grade point average of 2.0 or better. Revised: 8/19/2014 Page 6 of 6