Special Topics in Nanotechnology:

Transcription

1 Special Topics in Nanotechnology: Advanced analytical methods in the Nano- and Biotechnology Surface and Interface analysis Nano Coatings Nano Products In the frame of mission oriented research DECHEMA 2006 Innovation-Center Engen Turmstrasse Engen Germany Tel Fax info@nanocraft.de web: Contact persons: Sabri Akari Dr. rer. nat. Harald Kühn Dipl.-Phys., Dipl.-Biol. Michael Korte Dipl.-Phys.

2 Topics About Nanoanalytical Methods Scanning Tunnelling Microscopy: Principle & Applications Atomic Force Microscopy: Principle & Applications Chemical Force Microscopy: Principle & Applications -

3 About The The was founded in 2001 as a Spin Off from Max-Planck-Institute of Colloids and Interfaces (MPI-KGF). Specialization: Nanotechnology We perform research and development projects in the region of Nano-, Bio- and Surface Technologies in cooperation with universities and industrial partners. A large number of first class companies from different industrial branches are already working with us and use the obtained information for their own development with high satisfaction. Scientific advisory board: Prof. Dr. Helmut Möhwald, Max-Planck-Institute of Colloids and Interfaces, Germany Prof. Dr. Paul Leiderer, University of Konstanz, Germany Prof. Dr. Helmut Auweter, BASF AG, Germany Dr. rer nat. Georg Rößling, Schering AG, Germany info@nanocraft.de -

4 Our Analytical Methods Our Nano analytical methods Scanning Probe Microscopy (AFM, STM, all Modes) XPS (Xray Photo-electron Spectroscopy) FTIR (Fourier Transformed Infra Red) TEM, Scanning Electron Microscopy Elipsometry ESCA (Electron Spectroscopy for Chemical Analysis) TOF SIMS Contact Angle Microscopy with its extensive Nano- Know- How offers you a park of advanced analytical tools with qualified scientific supervision in the frame of mission oriented research

5 Scanning Tunnelling Microscopy Principles & Applications

6 Scanning Tunneling Microscopy (STM) Nobel Price for physics 1986 d~1-10å G.Binnig, H.Rohrer: Scanning tunneling microscopy, IBM J. Res. Develop. Vol.30 No.4 (July 1986)

7 Scanning Tunneling Microscopy (STM) Applications Topographic surface analysis Only conductive materials can be investigated, topographical and electrical STM gives clearly atomic resolution For photo sensitive semiconductors the self developed Photo Assisted STM is a useful mode to see new surface properties Wolframdiselinid surface 0001, atomic resolution Si 7x nm Imaged with STM under standard conditions (p = kpa, T = 20 C)

8 Atomic Force Microscopy Principles & Applications

9 Conventional Atomic Force Microscopy (AFM) Principle of conventional AFM SEM of conventional AFM Tip 10 µm r» 7 nm SEM of special HiRes AFM Tip Whisker Probe r» 1 nm

10 Scanning Probe Microscopy Measurements in different media Analog and digital PFM is possible measurement in liquids Large sample dimensions are possible Scanning Tunnelling Microscopy Scanning Force Microscopy Tapping Mode Microscopy Chemical Force Microscopy Digital Pulsed Force Microscopy Force Spectroscopy Magnetic Force Microscopy Electric Force Microscopy Conductive AFM MultiMode - liquid cell

11 Atomic Force Microscopy Applications Topographic surface analysis All kind of solid surfaces (electric conductivity is not necessary) can be imaged and topographically analyzed with high resolution. Determination of Nanohardness using Nanoindentation AFM can be used under non-standard conditions. It can be applied in ultra-high vacuum, air, gases, or liquids and at a variety of temperatures. The Atomic Force Microscopy with its different measurement modes is most essential in a lot of research areas 1 µm

12 Laser Modification on Synthetic Materials 18µm 17 µm 47 µm d = h = 1µm d = h = 290nm d = h = 500nm h = 1,8µm profile 500 nm

13 Understanding the Lotuseffect,, Paint industry Superhydrophobia REM AFM AFM 300nm

14 Biological Application: Investigation of Living Bacterium Insitu investigation of cell division from Geobacter metallireducens in H 2 O. Imaging in Tapping Mode with sensitive AFM Tip Adhesion-/Stiffnesscontrast 1µm Topography 1µm time

15 Example Investigations: Using NANOFINDER Measuring of local changes of the same location before and after electric polishing, by using NANOFINDER Ra = Ra polishing The analyses shows a modified surface with lost peaks after polishing. The standard roughness values has not been changed. This clear interpretation can only be made with this technique.

16 Chemical Force Microscopy Principles & Applications

17 Chemical Force Microscopy: Contrast Mechanism The force is increased by the locally caused chemical reaction to the surface by a chemical component. JKR theory: Adhesion force F adh : Fadh = 3 πrw 2 12 Work of adhesion W 12 : W 12 = γ 23 + γ 13 γ 12 Contact area: R W as = π 2K 12