Scanning Probe Microscopy
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1 Ernst Meyer Hans Josef Hug Roland Bennewitz Scanning Probe Microscopy The Lab on a Tip With 117 Figures Mß Springer
2 Contents 1 Introduction to Scanning Probe Microscopy f f.1 Overview 2 f.2 Basic Concepts Local Probes Scanning and Control Vibrational Isolation Computer Control and Image Processing 12 2 Introduction to Scanning Tunneling Microscopy Tunneling: A Quantum-Mechanical Effect Tersoff-Hamann Model Instrumental Aspects Tunneling Tips Implementation in Different Environments Operation Modes Manipulation Modes Resolution Limits Imaging of Semiconductors Imaging of Metals Imaging of Layered Materials Imaging of Molecules Imaging of Insulators Theoretical Estimates of Resolution Limits Observation of Confined Electrons Scattering of Surface State Electrons at Steps Scattering of Surface State Electrons at Point Defects Electron Confinement to Nanoscale Boxes Summary of Dispersion Relations for Noble-Metal (111) Surfaces Spin-Polarized Tunneling Observation of the Kondo Effect and Quantum Mirage 44
3 VIII Contents 3 Force Microscopy Concept and Instrumental Aspects Deflection Sensors: Techniques to Measure Small Cantilever Deflections Spring Constants of Rectangular Cantilevers Cantilever and Tip Preparation Implementations of Force Microscopy Relevant Forces Short-Range Forces Van der Waals Forces Electrostatic Forces Magnetic Forces Capillary Forces Forces in Liquids Operation Modes in Force Microscopy Contact Force Microscopy Topographie Imaging Lateral Resolution and Contact Area Friction Force Microscopy Atomic Friction Processes Lateral Contact Stiffness Velocity Dependence of Atomic Friction Dynamic Force Microscopy Modelling Dynamic Force Microscopy High-Resolution Imaging Spectroscopic Measurements Kelvin Probe Microscopy Dissipation Force Microscopy Tapping Mode Force Microscopy Principles of Operation Phase Imaging Non-Linear Effects Further Modes of Force Microscopy Force Resolution and Thermal Noise 92 4 MFM and Related Techniques MFM Operation Modes Tip-Sample Distance Control Measurement of Magnetic Forces Contrast Formation Introduction Stray Fields of Simple Micromagnetic Structures 104
4 Contents IX Negligible Modifications Reversible Modifications Irreversible Modifications Separation of Topography and Magnetic Signal Magnetic Resonance Force Microscopy Other Members of the SPM Family Scanning Near-Field Optical Microscopy (SNOM) Scanning Near-Field Acoustic Microscopy (SNAM) Scanning Ion Conductance Microscopy (SICM) Photoemission Microscopy with Scanning Aperture (PEMSA) STM with Inverse Photoemission (STMiP) Laser Scanning Tunneling Microscopy (LSTM) Electrochemical Scanning Tunneling Microscopy (ECSTM) Scanning Thermal Microscopy (SThM) Scanning Noise Microscopy (SNM) Scanning Tunneling Potentiometry (SPotM) Scanning Capacitance Microscopy (SCM) Scanning Spreading Resistance Microscopy (SSRM) Scanning Tunneling Atom Probe (STAP) Artifacts in SPM Tip Artifact: Convolution with Tip Shape Influence of Local Inhomogeneities on Topography STM Topography SFM Topography Influence of Topography on Local Measurements STM-Induced Photon Emission Lateral Force Measurement Instrumental Artifacts Piezoelectric Hysteresis, Scanner Creep, Non-Linearities and Calibration Errors Tip Crashes, Feedback Oscillations, Noise, Thermal drift Interference Patterns with Beam Deflection SFM Prospects for SPM Parallel Operation of SFM Cantilever Arrays Novel Sensors Based on Cantilevers Gravimetrie Sensors Calorimeter Sensors Surface Stress Sensors Cantilever Array Sensors 177
5 X Contents 7.3 Molecular Electronics Laboratory on a Tip Local Modification Experiments 179 References 181 Index 207
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