SILA Sistema Integrato di Laboratori per l Ambiente. CENTRE FOR MICROSCOPY AND MICROANALYSIS Scientific coordinator: Prof.ssa Rosanna De Rosa
|
|
|
- Magdalene Knight
- 8 years ago
- Views:
Transcription
1 CENTRE FOR MICROSCOPY AND MICROANALYSIS Scientific coordinator: Prof.ssa Rosanna De Rosa 0
2 The Centre for Microscopy and Microanalysis (CM2) is an interdisciplinary service centre, a comprehensive suite of analytical instruments dedicated to the study of environmental, material and biomedical sciences, geology, chemistry, archaeology, agriculture, physics, and nanotechnology. The mission is to provide topquality and readily accessible microscopy services to staff and students of University of Calabria, and users of other national and international research centers. The Centre is equipped with an Electron Microprobe Analyzer (EMPA), a transmission electron microscope (TEM), a Confocal Laser Scanning Microscope and an Atomic Force Microscope (AFM). These instruments areintegrated with a pre-existing equipment consisting of a scanning electron microscope (SEM), two Plasma Mass Spectrometry, one of which is associated to a laser ablation system (ICP-MS-LA), a confocal Raman microscope and various other portable analytical tools. The centre organizes seminars courses and Master on Microscopy and its applications to various applied and basic research fields. 1
3 Electron Microprobe Analyzer (EPMA) Jeol JXA-8230 Description: JEOL JXA-8230 microprobe is equipped with 5 WDS spectrometers for quantitative chemical microanalyses of elements between Berillium and Uranium High resolution and accuracy quantitative chemical analyses of rocks, metals, stone materials, glass; mineropetrographic and metallographic investigations Microsonda JEOL JXA
4 Transmission Electron Microscope (TEM) Jeol JEM-1400 PLUS Description: The JEM-1400 Plus allows to perform high resolution and high contrast TEM/STEM investigations, diffraction, EDS analysis and 3D tomography. In the TEM lab, it is possible to prepare different kinds of specimens (both organic and inorganic), to cut ultra-thin sections of resin embedded materials through the ultramicrotome and to thin hard samples through the mechanical thinner (TXP) and the ion milling. TEM JEOL 1400 PLUs Morphological and ultrastructural analysis of organic and inorganic material, acquisition of morphological maps of chemical species, qualitative determination of the main crystalline phases, three-dimensional morphological and compositional reconstruction of various types of material. Mechanical thinner TXP Utramicrotome RMC 3
5 Dimension Icon - Atomic Force Microscope (AFM) Description: Dimension Icon - ScanAsyst Atomic Force Microscope (AFM) provides measures to nanoscale with low drift and low noise for artifact-free images. Characterization of nanomechanical properties on different materials, measurement of surface roughness, nanoscale electrical characterization, nanomanipulation. Dimension Icon - Atomic Force Microscope (AFM) 4
6 Confocal Spectral Microscope LEICATCS SP8 Description: Inverted confocal laser microscope, infinity corrected optical system, scan head with 4 spectral photomultiplier for reflected and transmitted light Three-dimensional and non-destructive analysis of subcellular structures and microstructure of samples, for biological and biomedical research and materials science. Confocal Spectral Microscope LEICATCS SP8 5
7 Microscope Leica DMRB Description The Leica Leica DMRB microscope provides analysis of cyto-histological samples by using fluorescente, bright, darkfield illumination and phase contrasts. Subcellular structure anlalysis Microscope Leica DM IL Description The Leica DM IL is the inverted contrasting microscope used for cell and tissue cultures, for liquids and sediments, using brilliant incident light fluorescence, optimized phase contrast. Services Observation and micro-manipulating of living cells in their ambience of culture. 6
8
9 SILA Sistema Integrato di Laboratori per l Ambiente CM 2 CENTRO MICROSCOPIA E MICROANALISI Via P. Bucci, 15/A Rende (CS) Tel cm2.labs@gmail.com CM2 CM2 0
Preface Light Microscopy X-ray Diffraction Methods
Preface xi 1 Light Microscopy 1 1.1 Optical Principles 1 1.1.1 Image Formation 1 1.1.2 Resolution 3 1.1.3 Depth of Field 5 1.1.4 Aberrations 6 1.2 Instrumentation 8 1.2.1 Illumination System 9 1.2.2 Objective
Microscopy: Principles and Advances
Microscopy: Principles and Advances Chandrashekhar V. Kulkarni University of Central Lancashire, Preston, United kingdom May, 2014 University of Ljubljana Academic Background 2005-2008: PhD-Chemical Biology
h e l p s y o u C O N T R O L
contamination analysis for compound semiconductors ANALYTICAL SERVICES B u r i e d d e f e c t s, E v a n s A n a l y t i c a l g r o u p h e l p s y o u C O N T R O L C O N T A M I N A T I O N Contamination
LabRAM HR. Research Raman Made Easy! Raman Spectroscopy Systems. Spectroscopy Suite. Powered by:
LabRAM HR Research Raman Made Easy! Raman Spectroscopy Systems Powered by: Spectroscopy Suite Cutting-Edge Applications with the LabRAM HR Deeply involved in Raman spectroscopy for decades, HORIBA Scientific
Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture
Nanoelectronics 09 Atsufumi Hirohata Department of Electronics 12:00 Wednesday, 4/February/2015 (P/L 006) Quick Review over the Last Lecture ( Field effect transistor (FET) ): ( Drain ) current increases
Chapter 4. Microscopy, Staining, and Classification. Lecture prepared by Mindy Miller-Kittrell North Carolina State University
Chapter 4 Microscopy, Staining, and Classification 2012 Pearson Education Inc. Lecture prepared by Mindy Miller-Kittrell North Carolina State University Microscopy and Staining 2012 Pearson Education Inc.
Scanning Electron Microscopy Services for Pharmaceutical Manufacturers
Scanning Electron Microscopy Services for Pharmaceutical Manufacturers Author: Gary Brake, Marketing Manager Date: August 1, 2013 Analytical Testing Laboratory www.atl.semtechsolutions.com Scanning Electron
LabRAM HR Evolution. Research Raman Made Easy!
LabRAM HR Evolution Research Raman Made Easy! Cutting-Edge Applications with the LabRAM HR LabRAM HR Deeply involved in Raman spectroscopy for decades, HORIBA Scientific has been providing an extensive
Raman spectroscopy Lecture
Raman spectroscopy Lecture Licentiate course in measurement science and technology Spring 2008 10.04.2008 Antti Kivioja Contents - Introduction - What is Raman spectroscopy? - The theory of Raman spectroscopy
Basic principles and mechanisms of NSOM; Different scanning modes and systems of NSOM; General applications and advantages of NSOM.
Lecture 16: Near-field Scanning Optical Microscopy (NSOM) Background of NSOM; Basic principles and mechanisms of NSOM; Basic components of a NSOM; Different scanning modes and systems of NSOM; General
Scanning Electron Microscopy: an overview on application and perspective
Scanning Electron Microscopy: an overview on application and perspective Elvio Carlino Center for Electron Microscopy - IOM-CNR Laboratorio Nazionale TASC - Trieste, Italy Location of the Center for Electron
Confocal Microscopy and Atomic Force Microscopy (AFM) A very brief primer...
Confocal Microscopy and Atomic Force Microscopy (AFM) of biofilms A very brief primer... Fundamentals of Confocal Microscopy Based on a conventional fluorescence microscope Fluorescent Microscope Confocal
Microscopy. MICROSCOPY Light Electron Tunnelling Atomic Force RESOLVE: => INCREASE CONTRAST BIODIVERSITY I BIOL1051 MAJOR FUNCTIONS OF MICROSCOPES
BIODIVERSITY I BIOL1051 Microscopy Professor Marc C. Lavoie marc.lavoie@cavehill.uwi.edu MAJOR FUNCTIONS OF MICROSCOPES MAGNIFY RESOLVE: => INCREASE CONTRAST Microscopy 1. Eyepieces 2. Diopter adjustment
In simple terms, microscopy provides magnified images of features that are beyond the
Measurements and Characterization Analytical Microscopy In simple terms, microscopy provides magnified images of features that are beyond the resolution of the human eye (approximately 100 µm). How the
FRAUNHOFER INSTITUTe For
FRAUNHOFER INSTITUTe For surface engineering and thin films MOCCA + PROCESS AUTOMATION & OPTICAL MONITORING MOCCA + Automate your thin film coating process In many thin film coating processes various factors
Lecture 20: Scanning Confocal Microscopy (SCM) Rationale for SCM. Principles and major components of SCM. Advantages and major applications of SCM.
Lecture 20: Scanning Confocal Microscopy (SCM) Rationale for SCM. Principles and major components of SCM. Advantages and major applications of SCM. Some limitations (disadvantages) of NSOM A trade-off
Supporting Information
Supporting Information Simple and Rapid Synthesis of Ultrathin Gold Nanowires, Their Self-Assembly and Application in Surface-Enhanced Raman Scattering Huajun Feng, a Yanmei Yang, a Yumeng You, b Gongping
bulk 5. Surface Analysis Why surface Analysis? Introduction Methods: XPS, AES, RBS
5. Surface Analysis Introduction Methods: XPS, AES, RBS Autumn 2011 Experimental Methods in Physics Marco Cantoni Why surface Analysis? Bulk: structural function Electrical/thermal conduction Volume increases
Fast Z-stacking 3D Microscopy Extended Depth of Field Autofocus Z Depth Measurement 3D Surface Analysis
Cam CANIMPEX CPX-SOLUTIONS 3D Digital Microscope Camera FAST PRECISE AFFORDABLE 3D CAMERA FOR MICROSCOPY Fast Z-stacking 3D Microscopy Extended Depth of Field Autofocus Z Depth Measurement 3D Surface Analysis
Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry A PRACTICAL HANDBOOK FOR DEPTH PROFILING AND BULK IMPURITY ANALYSIS R. G. Wilson Hughes Research Laboratories Malibu, California F. A. Stevie AT&T Bell Laboratories Allentown,
ATI Wah Chang Laboratory and Technical Services: Analytical Laboratory
ATI Wah Chang Laboratory and Technical Services: Analytical Laboratory TECHNICAL DATA SHEET INTRODUCTION For over 50 years, ATI Wah Chang s laboratory personnel have been producing high quality inorganic
Course Contents. MS Forensic Chemistry
Course Contents MS Forensic Chemistry Year 1 Semester - I Course Code Course Title Credit Hours FCHEM-7105 Introduction to Forensic Science 3 FCHEM-7106 Crime Scene Investigation 3 FCHEM-7107 Chemistry
CHEMICAL SCIENCES REQUIREMENTS [61-71 UNITS]
![CHEMICAL SCIENCES REQUIREMENTS [61-71 UNITS]](/thumbs/39/18644108.jpg "CHEMICAL SCIENCES REQUIREMENTS [61-71 UNITS]")
Chemical Sciences Major Chemistry is often known as the central science because of the key position it occupies in modern science and engineering. Most phenomena in the biological and Earth sciences can
Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe. Keywords: Carbon Nanotube, Scanning Probe Microscope
International Journal of Arts and Sciences 3(1): 18-26 (2009) CD-ROM. ISSN: 1944-6934 InternationalJournal.org Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe Bedri Onur Kucukyildirim,
Pulsed laser deposition of organic materials
Pulsed laser deposition of organic materials PhD theses Gabriella Kecskeméti Department of Optics and Quantum Electronics University of Szeged Supervisor: Dr. Béla Hopp senior research fellow Department
Introduction to Energy Dispersive X-ray Spectrometry (EDS)
Introduction to Energy Dispersive X-ray Spectrometry (EDS) 1. Introduction 1.1 Principles of the technique EDS makes use of the X-ray spectrum emitted by a solid sample bombarded with a focused beam of
Research on materials as a part of Polish research area
Krzysztof J. Kurzydlowski, Malgorzata Lewandowska Warsaw University of Technology Research on materials as a part of Polish research area History of materials science and engineering in Poland The 1920s
ALD Atomic Layer Deposition
Research - Services ALD Atomic Layer Deposition Atomic Layer Deposition is a deposition process for assembling of thin films on the nanometer scale. The self-limiting deposition of atomic monolayers occurs
Elemental Analyses by ICP-AES
Elemental Analyses by ICP-AES Henry Gong, Senior Analytical Chemist September 10, 2008 ICP-AES inductively coupled plasma atomic emission spectrophotometry Electrons of an atom absorb energy and jump to
APPLICATION OF X-RAY COMPUTED TOMOGRAPHY IN SILICON SOLAR CELLS
APPLICATION OF X-RAY COMPUTED TOMOGRAPHY IN SILICON SOLAR CELLS V.A. Popovich 1, W. Verwaal 2, M. Janssen 1, I. J. Bennett 3, I.M.Richardson 1, 1. Delft University of Technology, Department of Materials
Nanoscience Course Descriptions
Nanoscience Course Descriptions NANO*1000 Introduction to Nanoscience This course introduces students to the emerging field of nanoscience. Its representation in popular culture and journalism will be
Ion Beam Sputtering: Practical Applications to Electron Microscopy
Ion Beam Sputtering: Practical Applications to Electron Microscopy Applications Laboratory Report Introduction Electron microscope specimens, both scanning (SEM) and transmission (TEM), often require a
Subject Area(s) Biology. Associated Unit Engineering Nature: DNA Visualization and Manipulation. Associated Lesson Imaging the DNA Structure
Subject Area(s) Biology Associated Unit Engineering Nature: DNA Visualization and Manipulation Associated Lesson Imaging the DNA Structure Activity Title Inside the DNA Header Image 1 ADA Description:
Defect studies of optical materials using near-field scanning optical microscopy and spectroscopy
UCRL-ID-142178 Defect studies of optical materials using near-field scanning optical microscopy and spectroscopy M. Yan, J. McWhirter, T. Huser, W. Siekhaus January, 2001 U.S. Department of Energy Laboratory
Tandem Scanner. Leica TCS SP5 II: The Broadband Confocal High Speed and High Resolution All in One
Tandem Scanner Leica TCS SP5 II: The Broadband Confocal High Speed and High Resolution All in One Modern microscopy comes in two versions. On the one hand, the goal is to record brilliant images to clearly
EDS system. CRF Oxford Instruments INCA CRF EDAX Genesis EVEX- NanoAnalysis Table top system
EDS system Most common X-Ray measurement system in the SEM lab. Major elements (10 wt% or greater) identified in ~10 secs. Minor elements identifiable in ~100 secs. Rapid qualitative and accurate quantitative
Edited by. C'unter. and David S. Moore. Gauglitz. Handbook of Spectroscopy. Second, Enlarged Edition. Volume 4. WlLEY-VCH. VerlagCmbH & Co.
Edited by C'unter Gauglitz and David S. Moore Handbook of Spectroscopy Second, Enlarged Edition Volume 4 WlLEY-VCH VerlagCmbH & Co. KGaA IX Volume 4 Section XII Applications 6: Spectroscopy at Surfaces
Department of Geology
Department of Geology Faculty of Science Brandon University This document is meant as a planning guide only. Students are advised to consult with the Chair of the Department if they have specific questions
Principles of Microscopy and Confocal and Fluorescence Microscopy
Principles of Microscopy and Confocal and Fluorescence Microscopy Content This course in Light Microscopy follows the series of successful courses in Light Microscopy, Confocal and Fluorescence Microscopy
3D Raman Imaging Nearfield-Raman TERS. Solutions for High-Resolution Confocal Raman Microscopy. www.witec.de
3D Raman Imaging Nearfield-Raman TERS Solutions for High-Resolution Confocal Raman Microscopy www.witec.de 01 3D Confocal Raman Imaging Outstanding performance in speed, sensitivity, and resolution with
Keywords: Planar waveguides, sol-gel technology, transmission electron microscopy
Structural and optical characterisation of planar waveguides obtained via Sol-Gel F. Rey-García, C. Gómez-Reino, M.T. Flores-Arias, G.F. De La Fuente, W. Assenmacher, W. Mader ABSTRACT Planar waveguides
Basic Concepts of X-ray X Fluorescence by Miguel Santiago, Scientific Instrumentation Specialist
Basic Concepts of X-ray X Fluorescence by Miguel Santiago, Scientific Instrumentation Specialist University of Puerto Rico Mayagüez Campus Department of Geology X-ray / Microanalysis Laboratory F - 304
IUCLID 5 COMPOSITION AND ANALYSIS GUIDANCE DOCUMENT: IRON ORES, AGGLOMERATES [EINECS NUMBER 265 996 3, CAS NUMBER 65996 65 8] IRON ORE PELLETS
![IUCLID 5 COMPOSITION AND ANALYSIS GUIDANCE DOCUMENT: IRON ORES, AGGLOMERATES [EINECS NUMBER 265 996 3, CAS NUMBER 65996 65 8] IRON ORE PELLETS](/thumbs/40/20960122.jpg "IUCLID 5 COMPOSITION AND ANALYSIS GUIDANCE DOCUMENT: IRON ORES, AGGLOMERATES [EINECS NUMBER 265 996 3, CAS NUMBER 65996 65 8] IRON ORE PELLETS")
IUCLID 5 COMPOSITION AND ANALYSIS GUIDANCE DOCUMENT: IRON ORES, AGGLOMERATES [EINECS NUMBER 265 996 3, CAS NUMBER 65996 65 8] IRON ORE PELLETS INTRODUCTION Each REACH registrant is required to file its
Introduction to Fourier Transform Infrared Spectrometry
Introduction to Fourier Transform Infrared Spectrometry What is FT-IR? I N T R O D U C T I O N FT-IR stands for Fourier Transform InfraRed, the preferred method of infrared spectroscopy. In infrared spectroscopy,
Topics for dissertation thesis for the academic year 2015/2016 at the Faculty of Science UJEP.
Topics for dissertation thesis for the academic year 2015/2016 at the Faculty of Science UJEP. 1. Chemical modification of surfaces of variol type sof substrates, thein characterization and tests of their
Atomic Force Microscopy. Long Phan Nanotechnology Summer Series May 15, 2013
Atomic Force Microscopy Long Phan Nanotechnology Summer Series May 15, 2013 1 World s Smallest Movie 2 Outline What is AFM? How does AFM Work? 3 Modes: Contact mode Non contact mode Tapping mode Imaging
1. Photon Beam Damage and Charging at Solid Surfaces John H. Thomas III
1. Photon Beam Damage and Charging at Solid Surfaces John H. Thomas III 1. Introduction............................. 2. Electrostatic Charging of Samples in Photoemission Experiments............................
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Reflection Electron Microscopy and Spectroscopy for Surface Analysis by Zhong Lin Wang 1 Introduction In 1986, E. Ruska was awarded the Nobel Physics Prize for his pioneering work of building the world's
Calibration of AFM with virtual standards; robust, versatile and accurate. Richard Koops VSL Dutch Metrology Institute Delft
Calibration of AFM with virtual standards; robust, versatile and accurate Richard Koops VSL Dutch Metrology Institute Delft 19-11-2015 VSL Dutch Metrology Institute VSL is the national metrology institute
ATOMIC FORCEMICROSCOPYASTOOL INCELLBIOLOGICAL RESEARCH FORGROUNDBASEDANDIN-FLIGHTSTUDIES
ATOMIC FORCEMICROSCOPYASTOOL INCELLBIOLOGICAL RESEARCH FORGROUNDBASEDANDIN-FLIGHTSTUDIES J.J.W.A vanloon DutchExperimentSupportCenter(DESC),Dept.OralBiology,ACTA- VrijeUniversiteit,Amsterdam,TheNetherlands.
Zeiss Axioimager M2 microscope for stereoscopic analysis.
Zeiss Axioimager M2 microscope for stereoscopic analysis. This system is fully motorized and configured with bright field and multi-channel fluorescent. It works with Stereo Investigator, Neurolucida,
Near-field scanning optical microscopy (SNOM)
Adviser: dr. Maja Remškar Institut Jožef Stefan January 2010 1 2 3 4 5 6 Fluorescence Raman and surface enhanced Raman 7 Conventional optical microscopy-limited resolution Two broad classes of techniques
Defense Technical Information Center Compilation Part Notice
UNCLASSIFIED Defense Technical Information Center Compilation Part Notice ADP012914 TITLE: Atomic Force Microscopy Characterization of Nanostructured Materials Using Selective Chemical Etching DISTRIBUTION:
Potassium-Argon (K-Ar) Dating
Potassium-Argon (K-Ar) Dating K-Ar Dating In 10,000 K atoms: 9326 39 K 673 41 K 1 40 K Potassium Decay Potassium Decay Potassium Decay Argon About 1% of atmosphere is argon Three stable isotopes of argon
Lateral Resolution of EDX Analysis with Low Acceleration Voltage SEM
Original Paper Lateral Resolution of EDX Analysis with Low Acceleration Voltage SEM Satoshi Hashimoto 1, Tsuguo Sakurada 1, and Minoru Suzuki 2 1 JFE-Techno research corporation, 1-1 Minamiwatarida, Kawasaki,
Testing and characterization of anti-reflection coatings on glass
Testing and characterization of anti-reflection coatings on glass Diagnostic approaches at CSP M.Turek, M. Dyrba, S. Großer, V. Naumann, Ch. Hagendorf contact: marko.turek@csp.fraunhofer.de Tests and methods
5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy
5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy Resolution of optical microscope is limited by diffraction. Light going through an aperture makes diffraction
Detailed Alignment Procedure for the JEOL 2010F Transmission Electron Microscope
Detailed Alignment Procedure for the JEOL 2010F Transmission Electron Microscope by Wendy Sarney ARL-MR-603 December 2004 Approved for public release; distribution unlimited. NOTICES Disclaimers The findings
Diffraction Course Series 2015
Diffraction Course Series 2015 Mark Wainwright Analytical Centre Kensington Campus, Chemical Sciences Building F10, Room G37 The Mark Wainwright Analytical Centre is offering a new series of courses covering
LANDAU NETWORK - CENTRO VOLTA UNIVERSITA DEGLI STUDI DI MILANO DIPARTIMENTO DI BIOLOGIA
LANDAU NETWORK - CENTRO VOLTA UNIVERSITA DEGLI STUDI DI MILANO DIPARTIMENTO DI BIOLOGIA UNIVERSITA DEGLI STUDI DI MILANO BICOCCA DIPARTIMENTO DI SCIENZA DEI MATERIALI Project for the Internationalisation
LIFE SCIENCE I TECHNICAL BULLETIN ISSUE N 11 /JULY 2008
LIFE SCIENCE I TECHNICAL BULLETIN ISSUE N 11 /JULY 2008 PARTICLE CHARACTERISATION IN EXCIPIENTS, DRUG PRODUCTS AND DRUG SUBSTANCES AUTHOR: HILDEGARD BRÜMMER, PhD, CUSTOMER SERVICE MANAGER, SGS LIFE SCIENCE
BIOACTIVE COATINGS ON 316L STAINLESS STEEL IMPLANTS
Trends Biomater. Artif. Organs. Vol. 17(2) pp 43-47 (2004) http//www.sbaoi.org BIOACTIVE COATINGS ON 316L STAINLESS STEEL IMPLANTS N. Ramesh Babu*,+, Sushant Manwatkar*, K. Prasada Rao* and T. S. Sampath
SILA Sistema Integrato di Laboratori per l Ambiente LNM. NANOELECTRONICS AND MICROSYSTEMS LABORATORY Coordinator: Prof. Giuseppe Cocorullo
SILA Sistema Integrato di Laboratori per l Ambiente *+ LNM NANOELECTRONICS AND MICROSYSTEMS LABORATORY Coordinator: Prof. Giuseppe Cocorullo 0 The Nanoelectronics and Microsystems Laboratory (NML) was
Electron Microscopy SEM and TEM
Electron Microscopy SEM and TEM Content 1. Introduction: Motivation for electron microscopy 2. Interaction with matter 3. SEM: Scanning Electron Microscopy 3.1 Functional Principle 3.2 Examples 3.3 EDX
Lenses and Apertures of A TEM
Instructor: Dr. C.Wang EMA 6518 Course Presentation Lenses and Apertures of A TEM Group Member: Anup Kr. Keshri Srikanth Korla Sushma Amruthaluri Venkata Pasumarthi Xudong Chen Outline Electron Optics
Programme PhD / Master course Advanced Microscopy and Vital Imaging 2014. Time Item Location 09.00 09.15 Welcome and brief overview of the course
Programme PhD / Master course Advanced Microscopy and Vital Imaging 2014 Monday, June 2, 2014 09.00 09.15 Welcome and brief overview of the course 09.15 10.00 Basics of Microscopy 10.15 12.45 Practical
The Focused Ion Beam Scanning Electron Microscope: A tool for sample preparation, two and three dimensional imaging. Jacob R.
The Focused Ion Beam Scanning Electron Microscope: A tool for sample preparation, two and three dimensional imaging Jacob R. Bowen Contents Components of a FIB-SEM Ion interactions Deposition & patterns
Atomic Force Microscopy ISC-CNR
Atomic Force Microscopy ISC-CNR ICS-CNRCNR Bruno Tiribilli bruno.tiribilli@isc.cnr.it Imaging on Biological samples Thin section of tissue Protein aggregates Force measurement Cells elasticity Protein
Plastic Film Texture Measurement With 3D Profilometry
Plastic Film Texture Measurement With 3D Profilometry Prepared by Jorge Ramirez 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials.
CHAPTER 2 EXPERIMENTAL. g/mol, Sigma-Aldrich, Germany. 2.1.2 Magnesium acetate tetrahydrate (C 4 H 6 MgO. 4 4H 2 O), assay 99.0%,
CHAPTER 2 EXPERIMENTAL 2.1 Chemicals and Equipments 2.1.1 Zinc naphthenate (2(C 11 H 7 O 2 ). Zn), assay
The Basics of Scanning Electron Microscopy
The Basics of Scanning Electron Microscopy The small scanning electron microscope is easy to use because almost every variable is pre-set: the acceleration voltage is always 15kV, it has only a single
DEPARTMENT of CHEMISTRY AND BIOCHEMISTRY
DEPARTMENT of CHEMISTRY AND BIOCHEMISTRY ACADEMIC GUIDANCE 2013-2014 PROGRAMS B.S. in Chemistry B.A. in Chemistry B.S. in Biochemistry B.S. in Physical Sciences with specialization in Chemistry or Physics
Thermo Scientific ArrayScan XTI High Content Analysis Reader. revolutionizing cell biology with the power of high content
Thermo Scientific ArrayScan XTI High Content Analysis Reader revolutionizing cell biology with the power of high content learn more about your cells using high content technology Thermo Scientific High
Laser Based Micro and Nanoscale Manufacturing and Materials Processing
Laser Based Micro and Nanoscale Manufacturing and Materials Processing Faculty: Prof. Xianfan Xu Email: xxu@ecn.purdue.edu Phone: (765) 494-5639 http://widget.ecn.purdue.edu/~xxu Research Areas: Development
Technical Meeting on the Socio-Economic Benefits of Ion Beam Accelerators for Developing Member States
Technical Meeting on the Socio-Economic Benefits of Ion Beam Accelerators for Developing Member States Vienna, Austria 19 23 October 2015 Ref. No.: F1-TM-49620 Information Sheet A. Background Ion beam
Old Dominion University Chemistry & Biochemistry Dept. Graduate program
Old Dominion University Chemistry & Biochemistry Dept Graduate program Home to the Chemistry & Biochemistry Department, the four-story Alfriend Chemistry building, constructed in 1967, houses classrooms
Phase Characterization of TiO 2 Powder by XRD and TEM
Kasetsart J. (Nat. Sci.) 42 : 357-361 (28) Phase Characterization of TiO 2 Powder by XRD and TEM Kheamrutai Thamaphat 1 *, Pichet Limsuwan 1 and Boonlaer Ngotawornchai 2 ABSTRACT In this study, the commercial
Le nanotecnologie: dal Laboratorio al Mercato. Fabrizio Pirri Politecnico di Torino Istituto Italiano di Tecnologia
Le nanotecnologie: dal Laboratorio al Mercato Fabrizio Pirri Politecnico di Torino Istituto Italiano di Tecnologia Materials & Processes for micro nanotechnologies Laboratory http://www.polito.it/micronanotech
Optical Microscopy Quantifies Live Cells Without Labels
from photonics.com: 10/01/2012 http://www.photonics.com/article.aspx?aid=52128 Optical Microscopy Quantifies Live Cells Without Labels Valerie C. Coffey, Freelance Science Writer With increasing frequency,
In this column installment, we present results of tablet. Raman Microscopy for Detecting Counterfeit Drugs A Study of the Tablets Versus the Packaging
Electronically reprinted from June 214 Molecular Spectroscopy Workbench Raman Microscopy for Detecting Counterfeit Drugs A Study of the Tablets Versus the Packaging With the increasing proliferation of
PARTICLE SIZES EXPLAINED
PARTICLE SIZES EXPLAINED You will often see chemicals in fireworks and propellant formulas that look like these: Aluminum, atomized, 22 micron Aluminum, -325 mesh Aluminum, -325 mesh, spherical, 22 micron
Research Team name: UNINA Presenter name: Stefano GUIDO
Team Presentation Annual Workshop, COST Action MP1106 Dublin, September 13, 2012 Research Team name: UNINA Presenter name: Stefano GUIDO LABORATORY OF DIPARTIMENTO DI INGEGNERIA CHIMICA UNIVERSITA DI NAPOLI
Euro-BioImaging European Research Infrastructure for Imaging Technologies in Biological and Biomedical Sciences
Euro-BioImaging European Research Infrastructure for Imaging Technologies in Biological and Biomedical Sciences WP11 Data Storage and Analysis Task 11.1 Coordination Deliverable 11.3 Selected Standards
Raman and AFM characterization of carbon nanotube polymer composites Illia Dobryden
Raman and AFM characterization of carbon nanotube polymer composites Illia Dobryden This project is conducted in High Pressure Spectroscopy Laboratory (Materials Physics group) Supervisor: Professor Alexander
26/06/2011. Electron Microscopy: TEM, Immunogold Labeling, SEM, Correlative Microscopy
26/06/2011 Electron Microscopy: TEM, Immunogold Labeling, SEM, Correlative Microscopy Prof. Dr. Rainer Duden duden@bio.uni-luebeck.de 1 Resolution Comparison Light vs Electron Microscopy Microscope Resolution
Advanced Instrumentation Research Facility
Advanced Instrumentation Research Facility USER CHARGES (All s to be prepared by users at their end unless specified) Please consult concerned AIRF staff member(s) before bringing your s. w.e.f 01.01.2015
Waters Core Chromatography Training (2 Days)
2015 Page 2 Waters Core Chromatography Training (2 Days) The learning objective of this two day course is to teach the user core chromatography, system and software fundamentals in an outcomes based approach.
Fluorescence Microscopy for an NMR- Biosensor Project
Fluorescence Microscopy for an NMR- Biosensor Project Ole Hirsch Physikalisch-Technische Bundesanstalt Medical Optics Abbestr. -1, 10587 Berlin, Germany Overview NMR Sensor Project Dimensions in biological
ACADEMIA SINICA Taiwan International Graduate Program
ACADEMIA SINICA Taiwan International Graduate Program http://tigp.sinica.edu.tw Nano Science and Technology Program (NANO) Taiwan International Graduate Program (TIGP) Academia Sinica has established the
Scanning Electron Microscopy tools for material characterization
5th International Workshop on Mechanisms of Vacuum Arcs 02-04/09/2015 Scanning Electron Microscopy tools for material characterization Focus on EBSD for characterisation of dislocation structures Floriane
Application Note #503 Comparing 3D Optical Microscopy Techniques for Metrology Applications
Screw thread image generated by WLI Steep PSS angles WLI color imaging Application Note #503 Comparing 3D Optical Microscopy Techniques for Metrology Applications 3D optical microscopy is a mainstay metrology
Optics and Spectroscopy at Surfaces and Interfaces
Vladimir G. Bordo and Horst-Gunter Rubahn Optics and Spectroscopy at Surfaces and Interfaces WILEY- VCH WILEY-VCH Verlag GmbH & Co. KGaA Contents Preface IX 1 Introduction 1 2 Surfaces and Interfaces 5
Usage guidelines for the Advanced Light Microscopy Technology Platform (ALM) at the Max-Delbrück-Center, Berlin
Usage guidelines for the Advanced Light Microscopy Technology Platform (ALM) at the Max-Delbrück-Center, Berlin The following guidelines apply to all internal and external user of the ALM. The purpose
Graduate School of Science and Technology
Contents Master's Course 2 Three Common Courses 2 Materials and Life Science Course 2 Computer and Information Science Course 3 Electrical and Mechanical Engineering Course 3 Doctor's Course 5 Materials
Institute s brochure. Microstructure Analysis, Metallography and Mechanical Testing of Materials. Institute of Materials Research
Institute s brochure Microstructure Analysis, Metallography and Mechanical Testing of Materials Institute of Materials Research Micro structure Analysis and Metallography is one of the core teams of the
MICROSCOPY. To demonstrate skill in the proper utilization of a light microscope.
MICROSCOPY I. OBJECTIVES To demonstrate skill in the proper utilization of a light microscope. To demonstrate skill in the use of ocular and stage micrometers for measurements of cell size. To recognize
NATIONAL NETWORK OF ELECTRON MICROSCOPY RNME. NETWORK MANAGEMENT MODEL a ARTICULATION AND GENERAL OPERATION. (English translation draft)
NATIONAL NETWORK OF ELECTRON MICROSCOPY RNME NETWORK MANAGEMENT MODEL a ARTICULATION AND GENERAL OPERATION (English translation draft) 1. Introduction 2 2. Objectives 2 3. Constitution 2 4. Organization
Nano Optics: Overview of Research Activities. Sergey I. Bozhevolnyi SENSE, University of Southern Denmark, Odense, DENMARK
Nano Optics: Overview of Research Activities SENSE, University of Southern Denmark, Odense, DENMARK Optical characterization techniques: Leakage Radiation Microscopy Scanning Near-Field Optical Microscopy
University of Botswana
University of Botswana Country: Botswana Chance of Placement: ISEP-Exchange chance of placement for US students is generally Very Limited. ISEP-Exchange chance of placement for I-to-I students is generally
A pretty picture, or a measurement? Retinal Imaging
Big Data Challenges A pretty picture, or a measurement? Organelles Dynamics Cells Retinal Imaging Physiology Pathology Fundus Camera Optical coherence tomography Fluorescence Histology High Content Screening