How To Perform Raman Spectroscopy
|
|
- Gloria Phillips
- 3 years ago
- Views:
Transcription
1 Spettroscopia Raman in campo prossimo Salvatore Patanè (1) and Pietro G. Gucciardi (2) (1) Dip. di Fisica della Materia e Tecnologie Fisiche Avanzate, Università di Messina, Salita Sperone 31, Messina, Italy. (2) CNR Istituto per i Processi Chimico-Fisici, sez. Messina, Via La Farina 237, I Messina, Italy.
2 Outlook Raman Spectroscopy: probing the morphological and chemical properties. Near-Field Optics: from Micro- to Nano- Raman spectroscopy Aperture SNOM: Raman imaging with 100 nm resolution Apertureless SNOM: Raman imaging down to the 10 nm scale.
3 Raman Spectroscopy MONOCHROMATIC 99.99% RADIATION Two kinds of scattering encountered: TRANSPARENT DUST-FREE SOLID, LIQUID or GAS Rayleigh (1 in every 10,000) same frequency Raman (1 in every 10,000,000) different frequencies
4 Rayleigh Vs Stokes emission
5 Conservation rules Ω (cm-1 ) hω L = hω S + hω phonon hk L = hk S + hq phonon 300 Raman Brillouin q phonon 4π 500 nm π 0.5 nm
6 What can be measured Carbon SW Nanotubes on SIlicon Peaks energy: Chemical properties Raman Spectrum Si Energy of the RBM: Structural properties (diameter of the CNT) CNT The G band: Electronic and symmetry properties (HOPG, MWNT, metallic, semiconductor) The D and G bands: morphological properties (defect characterization)
7 Coherent Anti-Stokes Raman Spectroscopy -CARS is a third-order coherent nonlinear Raman spectroscopy technique. -CARS uses three incident fields: a pump field, a Stokes field, and a probe field. -If the pump-probe frequency difference matches a specific Raman-active vibrational mode, an anti-stokes Raman signal is resonantly generated. - CARS microscopy provides three-dimensional imaging capability at a submicron scale.
8 MicroRaman Spatial resolution is diffraction-limited to ~ 250 nm Raman spectra of a PS - PMMA/PEP blend Witec CRM
9 Nanotechnology In recent general usage, any technology related to features of nanometer scale: thin films, fine particles, chemical synthesis, advanced lithography, etc. A technology based on the ability to build and look at structures of complex, atomic specifications. The Foresight Institute
10 Scanning Near-Field Optical Microscopy SNOM is an optical microscopy technique. It provides nanometer scale ( nm) spatial resolution. The same contrast mechanisms of confocal microscopy are available: fluorescence, raman, elastic scattering, polarimetry.
11 Raman at the Nanometer scale Motivations: Chemical Imaging. Morphological Imaging. Nanometer scale spatial resolution Added value: simultaneous sample topography and elastic scattering images. Difficulties: Low efficiency of the Raman scattering. Low throughput of the SNOM Fiber probes. Very long acquisition times for Imaging purposes. High mechanical and thermal stability are required.
12 Aperture-SNOM setup The sample is illuminated by a nanoscopic light source located close to the surface (10 nm). The probe is raster scanned. The resolution is limited by the source diameter
13 Aperture-NanoRaman setup Works in reflection mode (any sample) Collection: Nikon 50X objective, NA 0.5, high WD. Notch Filter: Rejection Ratio ~ Spectrometer: Triax 190, single grating, 1200 lines/mm, 190 mm focal. Detector: PMT in photon counting regime, or ICCD. Gucciardi et al., PCCP 4, 2747 (2002)
14 Aperture SNOM- NanoRaman Jahncke et al., APL 67, 2483 (1995) Webster et al., APL 72, 1478 (1998) Dekert et al., Anal. Chem. 70, 2646 (1998) Sample: Rb-doped KTP Scan points: (step 100 nm) Acquisition time: ~ 10h Estimated resolution: 250 nm (the aperture) Sample: Scratch on silicon Scan points: Acquisition time: > 9h Estimated resolution: submicron Sample: Dye-labeled DNA Scan points: (step 100 nm) Acquisition time: > 6h Estimated resolution: 100 nm
15 NanoRaman on TCNQ TCNQ-based complexes are used as dopants in organic opto-electronics High Raman Efficiency. The organometallic salt complexes can be discriminated based on the Raman shift of the vibrational peaks. Imaging at a fixed energy provides chemical contrast
16 NanoRaman imaging of TCNQ Topography Raman 1445 cm -1 Gucciardi et al., J. Microsc. 209, 228 (2003)
17 Resolution assessment TOPOGRAPHY RAMAN 1445 cm -1 Scan width: µm 2 Raman imaging confirms the spectral information on the chemical nature of the bumps. Raman (cts/s) nm nm 146 nm Position (µ m) Gucciardi et al., Appl. Opt. 42, 2724 (2003)
18 Limitations of aperture-snom NanoRaman Low light throughput Low signal to noise ratio Limited amount of excitation power Needs very efficient samples for imaging in reasonable times.
19 Electromagnetic Field enhancement Energy density Vs Polarization Surface Charge Vs Polarization
20 Sensors: Tungsten Tips Tungsten tips are obtained by electrochemical etching of a 100- µm tungsten wire The tip shape strongly depends on: immersion depth, edge wire shape, wire diameter, electrolyte concentration, voltage applied Tips of apical radius ranging from 10 nm to 100 nm are commonly produced. Subsequently the tips can be coated with gold or silver by using metal evaporation techniques. To assure the coating homogeneity the tip is rotating during the deposition. A.J. Melmed, J. Vac. Sci. Tech.B. 9(2) p. 601 (1991).
21 Sensors: Gold Tips (collab. with Cambridge Univ.) Gold tips are produced by electrochemical etching in a HCl-Ethanol 50-50% solution, V DC = 2.4 V SEM Pictures B. Ren et al., Rev. Sci. Instrum. 75, 837 (2004)
22 Tip-enhanced Raman Spectroscopy (TERS) An STM tip is brought into tunneling position and forms an optical cavity with the surface. When the cavity is placed in the focus of a laser beam the e.m. field excites localized surface plasmons. Therefore the sample under the tip is illuminated by this enhanced and localized field that produces a TERS effect. TERS effect is observed for CN- species adsorbed on Au(111) surface using a gold tip and a 5mW HeNe laser source. Theoretical calculation claim the Raman signal to increases up to 12 orders of magnitude.. Experimental results show a Raman increasing ranging between 1.4 and 40! Pettinger B. et. al., Phys. Rev. Lett. 92 (9), (2004)
23 TERS II Malachite green isocthiocyanate, (MGITC) excited by a 632.8nm He-Ne laser line, shows an intrinic resonant Raman scattering. At the same time the fluorescence is almost completely quenched by the metal surface. The choice of the tip material plays a fondamental role in the exciting the localized surface plasmons. Acquisition time is usually a critical parameter. Long acquisition time and high laser power means bleaching of the matherials and usually lead in observe amorphous carbon Raman spectra.. Pettinger B. et. al., Phys. Rev. Lett. 92 (9), (2004)
24 Near Field Raman Microscopy of single walled Carbon Nanotubes This setup is based on an inverted microscope. The optical path is freezed and the transparent sample is scanned to image the Raman signal. Tips are produced by electrochemical etching. Sharpening is achieved by Focused Ion Beam milling (FIB) To obtain a strong field enhancement the electric field needs to be polarized along the tip axis. In this scheme the tip is displaced from the center of the beam in one of the two longitudinal field lobes of the strongly focussed gaussian beam. Silver tip obtained by means of a chemical etching and a FIB post processing. Hartschuh et al. Phys. Rev Lett. 90 (9) (2003)
25 NanoRaman on SWCNTs Imaging simultaneously the topography and the Raman signal of SWCNTs on glass substrate, it is observed that the optical resolution is better than the topographic ones. This is a clear near-field Raman origin. Hartschuh et al. Phys. Rev Lett. 90 (9) (2003) The presence of vertical and horizontal oriented nanotubes indicates the near field polarization is radially symmetric with respect to the tip axis. Some keywords: A smart light collection A sharp tip.
26 Micro- Vs Nano- Raman Imaging Raman scattering images of a single SWNT deposited on a glass coverslip. The contrast reflects the local intensity of the G G band (2640 cm - 1 ). Confocal SNOM Raman Spectra FWHM: 275 nm FWHM: 14 nm Anderson et al., JACS 127, 2533 (2005)
27 CARS The system is based on a standard AFM working in contact mode and employing a silicon cantilever tip coated with a silver film. The method was able to mage a DNA network of poly(da-dt)-poly(da-dt) with a lateral resolution well below the diffraction limit. The average powers of the w1 and w2 beams were 45 and 23 mw at the 800kHz repetition rate. Ichimura T et al. Phys. Rev. Lett, 92 (22), (2004)
28 Our Experimental setup The gold plated tungsten tip then glued to one arm of a tuning fork. The laser beam is focussed at the tip apex and the scattered light is collected by the same long working distance objective. Finally the light passes through a notch filter and coupled by means of an optical fiber to the spectrometer.
29 Interfacing with a commercial Raman spectrometer Collaboration with EDM, Cambridge University
30 Preliminary results on Field- Enhancement Normalized Raman Emission Far-Field Near-Field Raman shift (cm -1 ) Patanè et al., Riv. Nuovo Cimento 27, 1 (2004) ta-c:h thin film deposited on SIlicon
31 Conclusions and Outlook SNOM provides eyes for the nanoworld. NanoRaman imaging exploiting TERS is capable of resolutions in the 10 nm range. Coherent Anti-Stokes Raman scattering can be used for selective specimen recognition at the nanometer scale. We are working to develop new methods for better signal-to-background discrimination.
Near-field scanning optical microscopy (SNOM)
Adviser: dr. Maja Remškar Institut Jožef Stefan January 2010 1 2 3 4 5 6 Fluorescence Raman and surface enhanced Raman 7 Conventional optical microscopy-limited resolution Two broad classes of techniques
More informationNEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH STM AND AFM PROBES
Vol. 93 (1997) A CTA PHYSICA POLONICA A No. 2 Proceedings of the 1st International Symposium on Scanning Probe Spectroscopy and Related Methods, Poznań 1997 NEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY
More informationIt has long been a goal to achieve higher spatial resolution in optical imaging and
Nano-optical Imaging using Scattering Scanning Near-field Optical Microscopy Fehmi Yasin, Advisor: Dr. Markus Raschke, Post-doc: Dr. Gregory Andreev, Graduate Student: Benjamin Pollard Department of Physics,
More informationUsage of Carbon Nanotubes in Scanning Probe Microscopes as Probe. Keywords: Carbon Nanotube, Scanning Probe Microscope
International Journal of Arts and Sciences 3(1): 18-26 (2009) CD-ROM. ISSN: 1944-6934 InternationalJournal.org Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe Bedri Onur Kucukyildirim,
More informationNano-Spectroscopy. Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale
Nano-Spectroscopy Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale Since its introduction in the early 80 s, Scanning Probe Microscopy (SPM) has quickly made nanoscale imaging an affordable
More informationCREOL, College of Optics & Photonics, University of Central Florida
OSE6650 - Optical Properties of Nanostructured Materials Optical Properties of Nanostructured Materials Fall 2013 Class 3 slide 1 Challenge: excite and detect the near field Thus far: Nanostructured materials
More informationScanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale
Scanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale Outline Background Research Design Detection of Near-Field Signal Submonolayer Chemical Sensitivity Conclusions
More information5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy
5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy Resolution of optical microscope is limited by diffraction. Light going through an aperture makes diffraction
More informationRaman spectroscopy Lecture
Raman spectroscopy Lecture Licentiate course in measurement science and technology Spring 2008 10.04.2008 Antti Kivioja Contents - Introduction - What is Raman spectroscopy? - The theory of Raman spectroscopy
More informationBasic principles and mechanisms of NSOM; Different scanning modes and systems of NSOM; General applications and advantages of NSOM.
Lecture 16: Near-field Scanning Optical Microscopy (NSOM) Background of NSOM; Basic principles and mechanisms of NSOM; Basic components of a NSOM; Different scanning modes and systems of NSOM; General
More informationScanning Near Field Optical Microscopy: Principle, Instrumentation and Applications
Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications Saulius Marcinkevičius Optics, ICT, KTH 1 Outline Optical near field. Principle of scanning near field optical microscope
More informationRaman Spectroscopy Basics
Raman Spectroscopy Basics Introduction Raman spectroscopy is a spectroscopic technique based on inelastic scattering of monochromatic light, usually from a laser source. Inelastic scattering means that
More informationPreface Light Microscopy X-ray Diffraction Methods
Preface xi 1 Light Microscopy 1 1.1 Optical Principles 1 1.1.1 Image Formation 1 1.1.2 Resolution 3 1.1.3 Depth of Field 5 1.1.4 Aberrations 6 1.2 Instrumentation 8 1.2.1 Illumination System 9 1.2.2 Objective
More informationLabRAM HR. Research Raman Made Easy! Raman Spectroscopy Systems. Spectroscopy Suite. Powered by:
LabRAM HR Research Raman Made Easy! Raman Spectroscopy Systems Powered by: Spectroscopy Suite Cutting-Edge Applications with the LabRAM HR Deeply involved in Raman spectroscopy for decades, HORIBA Scientific
More information3D Raman Imaging Nearfield-Raman TERS. Solutions for High-Resolution Confocal Raman Microscopy. www.witec.de
3D Raman Imaging Nearfield-Raman TERS Solutions for High-Resolution Confocal Raman Microscopy www.witec.de 01 3D Confocal Raman Imaging Outstanding performance in speed, sensitivity, and resolution with
More informationFrom apertureless near-field optical microscopy to infrared near-field night vision
From apertureless near-field optical microscopy to infrared near-field night vision Yannick DE WILDE ESPCI Laboratoire d Optique Physique UPR A0005-CNRS, PARIS dewilde@optique.espci.fr From apertureless
More informationNano Optics: Overview of Research Activities. Sergey I. Bozhevolnyi SENSE, University of Southern Denmark, Odense, DENMARK
Nano Optics: Overview of Research Activities SENSE, University of Southern Denmark, Odense, DENMARK Optical characterization techniques: Leakage Radiation Microscopy Scanning Near-Field Optical Microscopy
More informationDOE Solar Energy Technologies Program Peer Review. Denver, Colorado April 17-19, 2007
DOE Solar Energy Technologies Program Peer Review Evaluation of Nanocrystalline Silicon Thin Film by Near-Field Scanning Optical Microscopy AAT-2-31605-05 Magnus Wagener and George Rozgonyi North Carolina
More informationNear-field optics and plasmonics
Near-field optics and plasmonics Manuel Rodrigues Gonçalves AFM topography 10 Pol. y / (µm) 8 6 4 2 0 0 2 4 6 x / (µm) 8 10 nm 60 80 100 120 140 Physik M. Sc. Master Advanced Materials Winter semester
More informationLecture 20: Scanning Confocal Microscopy (SCM) Rationale for SCM. Principles and major components of SCM. Advantages and major applications of SCM.
Lecture 20: Scanning Confocal Microscopy (SCM) Rationale for SCM. Principles and major components of SCM. Advantages and major applications of SCM. Some limitations (disadvantages) of NSOM A trade-off
More informationSTM and AFM Tutorial. Katie Mitchell January 20, 2010
STM and AFM Tutorial Katie Mitchell January 20, 2010 Overview Scanning Probe Microscopes Scanning Tunneling Microscopy (STM) Atomic Force Microscopy (AFM) Contact AFM Non-contact AFM RHK UHV350 AFM/STM
More informationPHYSICAL METHODS, INSTRUMENTS AND MEASUREMENTS Vol. IV Femtosecond Measurements Combined With Near-Field Optical Microscopy - Artyom A.
FEMTOSECOND MEASUREMENTS COMBINED WITH NEAR FIELD OPTICAL MICROSCOPY Artyom A. Astafiev, Semyonov Institute of Chemical Physics, Moscow, Russian Federation. Keywords: diffraction limit nearfield scanning
More informationLabRAM HR Evolution. Research Raman Made Easy!
LabRAM HR Evolution Research Raman Made Easy! Cutting-Edge Applications with the LabRAM HR LabRAM HR Deeply involved in Raman spectroscopy for decades, HORIBA Scientific has been providing an extensive
More informationReview of NSOM Microscopy for Materials
Review of NSOM Microscopy for Materials Yannick DE WILDE (dewilde@optique.espci.fr) ESPCI Laboratoire d Optique Physique UPR A0005-CNRS, PARIS, FRANCE Outline : Introduction : concept of near-field scanning
More informationRaman and AFM characterization of carbon nanotube polymer composites Illia Dobryden
Raman and AFM characterization of carbon nanotube polymer composites Illia Dobryden This project is conducted in High Pressure Spectroscopy Laboratory (Materials Physics group) Supervisor: Professor Alexander
More informationh e l p s y o u C O N T R O L
contamination analysis for compound semiconductors ANALYTICAL SERVICES B u r i e d d e f e c t s, E v a n s A n a l y t i c a l g r o u p h e l p s y o u C O N T R O L C O N T A M I N A T I O N Contamination
More informationMicroscopic Techniques
Microscopic Techniques Outline 1. Optical microscopy Conventional light microscopy, Fluorescence microscopy, confocal/multiphoton microscopy and Stimulated emission depletion microscopy 2. Scanning probe
More informationLaser-induced surface phonons and their excitation of nanostructures
CHINESE JOURNAL OF PHYSICS VOL. 49, NO. 1 FEBRUARY 2011 Laser-induced surface phonons and their excitation of nanostructures Markus Schmotz, 1, Dominik Gollmer, 1 Florian Habel, 1 Stephen Riedel, 1 and
More informationAdvanced Research Raman System Raman Spectroscopy Systems
T600 Advanced Research Raman System Raman Spectroscopy Systems T600 Advanced Research Raman System T600 Triple stage Raman Spectrometer: The only solution for unprecedented stability and performance! Robust
More informationSurface plasmon nanophotonics: optics below the diffraction limit
Surface plasmon nanophotonics: optics below the diffraction limit Albert Polman Center for nanophotonics FOM-Institute AMOLF, Amsterdam Jeroen Kalkman Hans Mertens Joan Penninkhof Rene de Waele Teun van
More informationElectron Microscopy 3. SEM. Image formation, detection, resolution, signal to noise ratio, interaction volume, contrasts
Electron Microscopy 3. SEM Image formation, detection, resolution, signal to noise ratio, interaction volume, contrasts 3-1 SEM is easy! Just focus and shoot "Photo"!!! Please comment this picture... Any
More informationUnderstanding Laser Beam Parameters Leads to Better System Performance and Can Save Money
Understanding Laser Beam Parameters Leads to Better System Performance and Can Save Money Lasers became the first choice of energy source for a steadily increasing number of applications in science, medicine
More informationStatus of the FERMI@Elettra Free Electron Laser
Status of the FERMI@Elettra Free Electron Laser E. Allaria on behalf of the FERMI team Work partially supported by the Italian Ministry of University and Research under grants FIRB-RBAP045JF2 and FIRB-RBAP06AWK3
More informationKeysight Technologies How to Choose your MAC Lever. Technical Overview
Keysight Technologies How to Choose your MAC Lever Technical Overview Introduction Atomic force microscopy (AFM) is a sub-nanometer scale imaging and measurement tool that can be used to determine a sample
More informationOutline. Self-assembled monolayer (SAM) formation and growth. Metal nanoparticles (NP) anchoring on SAM
From functional nanostructured surfaces to innovative optical biosensors Giacomo Dacarro Dipartimento di Fisica A.Volta Dipartimento di Chimica Generale Università degli Studi di Pavia Dalla scienza dei
More informationPump-probe experiments with ultra-short temporal resolution
Pump-probe experiments with ultra-short temporal resolution PhD candidate: Ferrante Carino Advisor:Tullio Scopigno Università di Roma ƒla Sapienza 22 February 2012 1 Pump-probe experiments: generalities
More informationLecture 4 Scanning Probe Microscopy (SPM)
Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric
More informationOn the way to a multi-task near field optical microscope: Simultaneous STM/SNOM and PSTM imaging
A Microsc. Microanal. Microstruct. 5 (1994) 399 AUGUST/OCTOBER/DECEMBER 1994, PAGE 399 Classification Physics Abstracts 42.30. d On the way to a multitask near field optical microscope: Simultaneous STM/SNOM
More informationView of ΣIGMA TM (Ref. 1)
Overview of the FESEM system 1. Electron optical column 2. Specimen chamber 3. EDS detector [Electron Dispersive Spectroscopy] 4. Monitors 5. BSD (Back scatter detector) 6. Personal Computer 7. ON/STANDBY/OFF
More informationNear-Field Scanning Optical Microscopy: a Brief Overview
Near-Field Scanning Optical Microscopy: a Brief Overview Serge HUANT Laboratoire de Spectrométrie Physique (SPECTRO) Université Joseph Fourier Grenoble et CNRS Thanks to my former & present collaborators
More informationA METHOD OF PRECISE CALIBRATION FOR PIEZOELECTRICAL ACTUATORS
Uludağ Üniversitesi Mühendislik-Mimarlık Fakültesi Dergisi, Cilt 9, Sayı, 24 A METHOD OF PRECISE CALIBRATION FOR PIEZOELECTRICAL ACTUATORS Timur CANEL * Yüksel BEKTÖRE ** Abstract: Piezoelectrical actuators
More informationNanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture
Nanoelectronics 09 Atsufumi Hirohata Department of Electronics 12:00 Wednesday, 4/February/2015 (P/L 006) Quick Review over the Last Lecture ( Field effect transistor (FET) ): ( Drain ) current increases
More informationLecture 6 Scanning Tunneling Microscopy (STM) General components of STM; Tunneling current; Feedback system; Tip --- the probe.
Lecture 6 Scanning Tunneling Microscopy (STM) General components of STM; Tunneling current; Feedback system; Tip --- the probe. Brief Overview of STM Inventors of STM The Nobel Prize in Physics 1986 Nobel
More informationScanning Probe Microscopy
Ernst Meyer Hans Josef Hug Roland Bennewitz Scanning Probe Microscopy The Lab on a Tip With 117 Figures Mß Springer Contents 1 Introduction to Scanning Probe Microscopy f f.1 Overview 2 f.2 Basic Concepts
More informationEdited by. C'unter. and David S. Moore. Gauglitz. Handbook of Spectroscopy. Second, Enlarged Edition. Volume 4. WlLEY-VCH. VerlagCmbH & Co.
Edited by C'unter Gauglitz and David S. Moore Handbook of Spectroscopy Second, Enlarged Edition Volume 4 WlLEY-VCH VerlagCmbH & Co. KGaA IX Volume 4 Section XII Applications 6: Spectroscopy at Surfaces
More informationUV/VIS/IR SPECTROSCOPY ANALYSIS OF NANOPARTICLES
UV/VIS/IR SPECTROSCOPY ANALYSIS OF NANOPARTICLES SEPTEMBER 2012, V 1.1 4878 RONSON CT STE K SAN DIEGO, CA 92111 858-565 - 4227 NANOCOMPOSIX.COM Note to the Reader: We at nanocomposix have published this
More informationNanometer-scale imaging and metrology, nano-fabrication with the Orion Helium Ion Microscope
andras@nist.gov Nanometer-scale imaging and metrology, nano-fabrication with the Orion Helium Ion Microscope Bin Ming, András E. Vladár and Michael T. Postek National Institute of Standards and Technology
More informationModification of Pd-H 2 and Pd-D 2 thin films processed by He-Ne laser
Modification of Pd-H 2 and Pd-D 2 thin films processed by He-Ne laser V.Nassisi #, G.Caretto #, A. Lorusso #, D.Manno %, L.Famà %, G.Buccolieri %, A.Buccolieri %, U.Mastromatteo* # Laboratory of Applied
More informationRaman Scattering Theory David W. Hahn Department of Mechanical and Aerospace Engineering University of Florida (dwhahn@ufl.edu)
Introduction Raman Scattering Theory David W. Hahn Department of Mechanical and Aerospace Engineering University of Florida (dwhahn@ufl.edu) The scattering of light may be thought of as the redirection
More informationChristine E. Hatch University of Nevada, Reno
Christine E. Hatch University of Nevada, Reno Roadmap What is DTS? How Does it Work? What Can DTS Measure? Applications What is Distributed Temperature Sensing (DTS)? Temperature measurement using only
More information1 Introduction. 1.1 Historical Perspective
j1 1 Introduction 1.1 Historical Perspective The invention of scanning probe microscopy is considered one of the major advances in materials science since 1950 [1, 2]. Scanning probe microscopy includes
More informationIon Beam Sputtering: Practical Applications to Electron Microscopy
Ion Beam Sputtering: Practical Applications to Electron Microscopy Applications Laboratory Report Introduction Electron microscope specimens, both scanning (SEM) and transmission (TEM), often require a
More informationCSCI 4974 / 6974 Hardware Reverse Engineering. Lecture 8: Microscopy and Imaging
CSCI 4974 / 6974 Hardware Reverse Engineering Lecture 8: Microscopy and Imaging Data Acquisition for RE Microscopy Imaging Registration and stitching Microscopy Optical Electron Scanning Transmission Scanning
More informationScanning probe microscopy AFM, STM. Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication
Scanning probe microscopy AFM, STM Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication Scanning Probe Microscopy 1986 Binning and Rohrer shared Nobel Prize in Physics for invention.stm
More informationApertureless Near-Field Optical Microscopy
VI Apertureless Near-Field Optical Microscopy In recent years, several types of apertureless near-field optical microscopes have been developed 1,2,3,4,5,6,7. In such instruments, light scattered from
More informationOptics and Spectroscopy at Surfaces and Interfaces
Vladimir G. Bordo and Horst-Gunter Rubahn Optics and Spectroscopy at Surfaces and Interfaces WILEY- VCH WILEY-VCH Verlag GmbH & Co. KGaA Contents Preface IX 1 Introduction 1 2 Surfaces and Interfaces 5
More informationMicroscopy. MICROSCOPY Light Electron Tunnelling Atomic Force RESOLVE: => INCREASE CONTRAST BIODIVERSITY I BIOL1051 MAJOR FUNCTIONS OF MICROSCOPES
BIODIVERSITY I BIOL1051 Microscopy Professor Marc C. Lavoie marc.lavoie@cavehill.uwi.edu MAJOR FUNCTIONS OF MICROSCOPES MAGNIFY RESOLVE: => INCREASE CONTRAST Microscopy 1. Eyepieces 2. Diopter adjustment
More informationMicroscopy: Principles and Advances
Microscopy: Principles and Advances Chandrashekhar V. Kulkarni University of Central Lancashire, Preston, United kingdom May, 2014 University of Ljubljana Academic Background 2005-2008: PhD-Chemical Biology
More informationRaman Spectroscopy. 1. Introduction. 2. More on Raman Scattering. " scattered. " incident
February 15, 2006 Advanced Physics Laboratory Raman Spectroscopy 1. Introduction When light is scattered from a molecule or crystal, most photons are elastically scattered. The scattered photons have the
More informationSingle Defect Center Scanning Near-Field Optical Microscopy on Graphene
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Single Defect Center Scanning Near-Field Optical Microscopy on Graphene J. Tisler, T. Oeckinghaus, R. Stöhr, R. Kolesov, F. Reinhard and J. Wrachtrup 3. Institute
More informationNear-field optical microscopy based on microfabricated probes
Journal of Microscopy, Vol. 202, Pt 1, April 2001, pp. 7±11. Received 28 August 2000; accepted 1 December 2000 Near-field optical microscopy based on microfabricated probes R. ECKERT* 1, J. M. FREYLAND*,
More informationLaser Based Micro and Nanoscale Manufacturing and Materials Processing
Laser Based Micro and Nanoscale Manufacturing and Materials Processing Faculty: Prof. Xianfan Xu Email: xxu@ecn.purdue.edu Phone: (765) 494-5639 http://widget.ecn.purdue.edu/~xxu Research Areas: Development
More informationLuminescence study of structural changes induced by laser cutting in diamond films
Luminescence study of structural changes induced by laser cutting in diamond films A. Cremades and J. Piqueras Departamento de Fisica de Materiales, Facultad de Fisicas, Universidad Complutense, 28040
More informationPolarization-modulation near-field optical microscope for quantitative local dichroism mapping
REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 73, NUMBER 5 MAY 2002 Polarization-modulation near-field optical microscope for quantitative local dichroism mapping L. Ramoino, a) M. Labardi, N. Maghelli, b) L.
More informationExperiment #5: Qualitative Absorption Spectroscopy
Experiment #5: Qualitative Absorption Spectroscopy One of the most important areas in the field of analytical chemistry is that of spectroscopy. In general terms, spectroscopy deals with the interactions
More informationDemonstration of sub-4 nm nanoimprint lithography using a template fabricated by helium ion beam lithography
Demonstration of sub-4 nm nanoimprint lithography using a template fabricated by helium ion beam lithography Wen-Di Li*, Wei Wu** and R. Stanley Williams Hewlett-Packard Labs *Current address: University
More informationScanning Electron Microscopy: an overview on application and perspective
Scanning Electron Microscopy: an overview on application and perspective Elvio Carlino Center for Electron Microscopy - IOM-CNR Laboratorio Nazionale TASC - Trieste, Italy Location of the Center for Electron
More informationMagnetic dynamics driven by spin current
Magnetic dynamics driven by spin current Sergej O. Demokritov University of Muenster, Germany Giant magnetoresistance Spin current Group of NonLinear Magnetic Dynamics Charge current vs spin current Electron:
More informationAtomic Force Microscopy. Long Phan Nanotechnology Summer Series May 15, 2013
Atomic Force Microscopy Long Phan Nanotechnology Summer Series May 15, 2013 1 World s Smallest Movie 2 Outline What is AFM? How does AFM Work? 3 Modes: Contact mode Non contact mode Tapping mode Imaging
More informationConfocal Microscopy and Atomic Force Microscopy (AFM) A very brief primer...
Confocal Microscopy and Atomic Force Microscopy (AFM) of biofilms A very brief primer... Fundamentals of Confocal Microscopy Based on a conventional fluorescence microscope Fluorescent Microscope Confocal
More information(Nano)materials characterization
(Nano)materials characterization MTX9100 Nanomaterials Lecture 8 OUTLINE 1 -What SEM and AFM are good for? - What is the Atomic Force Microscopes Contribution to Nanotechnology? - What is Spectroscopy?
More informationThe Basics of Scanning Electron Microscopy
The Basics of Scanning Electron Microscopy The small scanning electron microscope is easy to use because almost every variable is pre-set: the acceleration voltage is always 15kV, it has only a single
More information7/3/2014. Introduction to Atomic Force Microscope. Introduction to Scanning Force Microscope. Invention of Atomic Force Microscope (AFM)
Introduction to Atomic Force Microscope Introduction to Scanning Force Microscope Not that kind of atomic Tien Ming Chuang ( 莊 天 明 ) Institute of Physics, Academia Sinica Tien Ming Chuang ( 莊 天 明 ) Institute
More information7. advanced SEM. Latest generation of SEM SEM
7. advanced SEM SEM Low voltage SE imaging Condition of the surface, coatings, plasma cleaning Low voltage BSE imaging Polishing for BSE, EDX and EBSD, effect of ion beam etching/polishing 1 Latest generation
More informationFIBER LASER STRAIN SENSOR DEVICE
FIBER LASER STRAIN SENSOR DEVICE E. Maccioni (1,2), N. Beverini (1,2), M. Morganti (1,2) F. Stefani (2,3), R. Falciai (4), C. Trono (4) (1) Dipartimento di Fisica E. Fermi Pisa (2) INFN Sez. Pisa (3) Dipartimento
More informationLaboratorio Regionale LiCryL CNR-INFM
Laboratorio Regionale LiCryL CNR-INFM c/o Physics Department - University of Calabria, Ponte P. Bucci, Cubo 33B, 87036 Rende (CS) Italy UNIVERSITÀ DELLA CALABRIA Dipartimento di FISICA Researchers Dr.
More informationSILA Sistema Integrato di Laboratori per l Ambiente. CENTRE FOR MICROSCOPY AND MICROANALYSIS Scientific coordinator: Prof.ssa Rosanna De Rosa
CENTRE FOR MICROSCOPY AND MICROANALYSIS Scientific coordinator: Prof.ssa Rosanna De Rosa 0 The Centre for Microscopy and Microanalysis (CM2) is an interdisciplinary service centre, a comprehensive suite
More informationPassive Remote Sensing of Clouds from Airborne Platforms
Passive Remote Sensing of Clouds from Airborne Platforms Why airborne measurements? My instrument: the Solar Spectral Flux Radiometer (SSFR) Some spectrometry/radiometry basics How can we infer cloud properties
More informationSpin-flip excitation spectroscopy with STM excitation of allowed transition adds an inelastic contribution (group of Andreas Heinrich, IBM Almaden)
Magnetism at the atomic scale by Scanning Probe Techniques Kirsten von Bergmann Institute of Applied Physics Magnetism with SPM Spin-polarized scanning tunneling microscopy SP-STM density of states of
More informationPhase Characterization of TiO 2 Powder by XRD and TEM
Kasetsart J. (Nat. Sci.) 42 : 357-361 (28) Phase Characterization of TiO 2 Powder by XRD and TEM Kheamrutai Thamaphat 1 *, Pichet Limsuwan 1 and Boonlaer Ngotawornchai 2 ABSTRACT In this study, the commercial
More informationKatharina Lückerath (AG Dr. Martin Zörnig) adapted from Dr. Jörg Hildmann BD Biosciences,Customer Service
Introduction into Flow Cytometry Katharina Lückerath (AG Dr. Martin Zörnig) adapted from Dr. Jörg Hildmann BD Biosciences,Customer Service How does a FACS look like? FACSCalibur FACScan What is Flow Cytometry?
More informationDefect studies of optical materials using near-field scanning optical microscopy and spectroscopy
UCRL-ID-142178 Defect studies of optical materials using near-field scanning optical microscopy and spectroscopy M. Yan, J. McWhirter, T. Huser, W. Siekhaus January, 2001 U.S. Department of Energy Laboratory
More informationPhotoinduced volume change in chalcogenide glasses
Photoinduced volume change in chalcogenide glasses (Ph.D. thesis points) Rozália Lukács Budapest University of Technology and Economics Department of Theoretical Physics Supervisor: Dr. Sándor Kugler 2010
More informationUNIVERSITY OF SOUTHAMPTON. Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices.
UNIVERSITY OF SOUTHAMPTON Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices. Christopher Wyndham John Hillman Submitted for the degree of Doctor of Philosophy
More informationIntroduction to reflective aberration corrected holographic diffraction gratings
Introduction to reflective aberration corrected holographic diffraction gratings By Steve Slutter, Wu Jiang, and Olivier Nicolle The reflective diffraction grating is the heart of most spectroscopy systems
More informationSCANNING PROBE MICROSCOPY NANOS-E3 SCHOOL 29/09/2015 An introduction to surface microscopy probes
SCANNING PROBE MICROSCOPY NANOS-E3 SCHOOL 29/09/2015 An introduction to surface microscopy probes SPM is ubiquitous in modern research Physics Nanotechnology/chemistry Nature Nanotechnology 10, 156 160
More informationChemical vapor deposition of novel carbon materials
Thin Solid Films 368 (2000) 193±197 www.elsevier.com/locate/tsf Chemical vapor deposition of novel carbon materials L. Chow a, b, *, D. Zhou b, c, A. Hussain b, c, S. Kleckley a, K. Zollinger a, A. Schulte
More informationMass production, R&D Failure analysis. Fault site pin-pointing (EM, OBIRCH, FIB, etc. ) Bottleneck Physical science analysis (SEM, TEM, Auger, etc.
Failure Analysis System for Submicron Semiconductor Devices 68 Failure Analysis System for Submicron Semiconductor Devices Munetoshi Fukui Yasuhiro Mitsui, Ph. D. Yasuhiko Nara Fumiko Yano, Ph. D. Takashi
More informationScanning Surface Inspection System with Defect-review SEM and Analysis System Solutions
Scanning Surface Inspection System with -review SEM and Analysis System Solutions 78 Scanning Surface Inspection System with -review SEM and Analysis System Solutions Hideo Ota Masayuki Hachiya Yoji Ichiyasu
More informationPUMPED Nd:YAG LASER. Last Revision: August 21, 2007
PUMPED Nd:YAG LASER Last Revision: August 21, 2007 QUESTION TO BE INVESTIGATED: How can an efficient atomic transition laser be constructed and characterized? INTRODUCTION: This lab exercise will allow
More informationFast-scanning near-field scanning optical microscopy. using a high-frequency dithering probe
Fast-scanning near-field scanning optical microscopy using a high-frequency dithering probe Yongho Seo and Wonho Jhe * Center for Near-field Atom-photon Technology and School of Physics, Seoul National
More informationSensors & Instruments for station. returned samples. Chun Chia Tan
Sensors & Instruments for station based materials characterization of returned samples Chun Chia Tan 04/01/2009 Outline Introduction to materials characterization General overview of the equipment used
More informationMeasuring the Point Spread Function of a Fluorescence Microscope
Frederick National Laboratory Measuring the Point Spread Function of a Fluorescence Microscope Stephen J Lockett, PhD Principal Scientist, Optical Microscopy and Analysis Laboratory Frederick National
More informationOptical Microscopy Beyond the Diffraction Limit: Imaging Guided and Propagating Fields
Optical Microscopy Beyond the Diffraction Limit: Imaging Guided and Propagating Fields M. Selim Ünlü, Bennett B. Goldberg, and Stephen B. Ippolito Boston University Department of Electrical and Computer
More informationAxial Sensitivity Of A Cracked Probe Of A Scanning Near- Field Optical Microscope
Proceedings of the World Congress on New Technologies (NewTech 05) Barcelona, Spain July 5-7, 05 Paper No. 38 Axial Sensitivity Of A Cracked Probe Of A Scanning Near- Field Optical Microscope Yu-Ching
More informationLaboratory #3 Guide: Optical and Electrical Properties of Transparent Conductors -- September 23, 2014
Laboratory #3 Guide: Optical and Electrical Properties of Transparent Conductors -- September 23, 2014 Introduction Following our previous lab exercises, you now have the skills and understanding to control
More informationT.M.M. TEKNIKER MICROMACHINING
T.M.M. TEKNIKER MICROMACHINING Micro and Nanotechnology Dapartment FUNDACION TEKNIKER Avda. Otaola. 20 Tel. +34 943 206744 Fax. +34 943 202757 20600 Eibar http://www.tekniker.es TMM FACILITIES -Clean Room
More informationP R E A M B L E. Facilitated workshop problems for class discussion (1.5 hours)
INSURANCE SCAM OPTICS - LABORATORY INVESTIGATION P R E A M B L E The original form of the problem is an Experimental Group Research Project, undertaken by students organised into small groups working as
More informationLooking for the Origin of Power Laws in Electric Field Assisted Tunneling
Looking for the Origin of Power Laws in Electric Field Assisted Tunneling H. Cabrera, D.A. Zanin, L.G. De Pietro, A. Vindigni, U. Ramsperger and D. Pescia Laboratory for Solid State Physics, ETH Zurich
More information- particle with kinetic energy E strikes a barrier with height U 0 > E and width L. - classically the particle cannot overcome the barrier
Tunnel Effect: - particle with kinetic energy E strikes a barrier with height U 0 > E and width L - classically the particle cannot overcome the barrier - quantum mechanically the particle can penetrated
More information