Near-field optics and plasmonics

Size: px
Start display at page:

Download "Near-field optics and plasmonics"

Transcription

1 Near-field optics and plasmonics Manuel Rodrigues Gonçalves AFM topography 10 Pol. y / (µm) x / (µm) 8 10 nm Physik M. Sc. Master Advanced Materials Winter semester 2011/2012

2 From sub-wavelength optics to nano-optics Synge propose in 1928 (in a letter to Einstein) a method to resolve optically an object below the diffraction limit. E. H. Synge, "A suggested method for extending the microscopic resolution into the ultramicroscopic region", Phil. Mag. 6, 356 (1928). Ash and Nicholls have done the first measurements with lateral sub-wavelength resolution using microwaves. E.A. Ash and G. Nicholls, "Super-resolution Aperture Scanning Microscope", Nature 237, 510 (1972). Pohl, Denk and Lanz developed the first Scanning Near-Field Optical Microscope (SNOM or NSOM). D.W. Pohl, W. Denk, and M. Lanz,"Optical stethoscopy: Image recording with resolution λ/20", Appl. Phys. Lett. 44, 651 (1984). Nano-optics emerged as a new domain in optics encompassing Near-field optics, plasmonics, nano-emitters and non-classical light sources, sub-wavelength confinement of light.

3 Nano-optics Surface plasmon photonics Surface enhanced scattering (SERS, TERS) Light scattering Enhanced photovoltaics Extraordinary optical transmission Metamaterials Nano optics Scanning microscopy Quantum emitters Scanning Near field Optical Microscopy

4 Diffraction limit vs. SNOM resolution Abbe (Rayleigh) resolution d 1.22λ 2n sin(θ) D.W. Pohl, et al., "Optical stethoscopy: Image recording with resolution λ/20", Appl. Phys. Lett. 44, 651 (1984).

5 Nanofabricated structures: Far-field vs. near-field Confocal microscope (far-field) CONFOCAL REFL. 5 4 SNOM microscope (near-field) SNOM (light intensity) 5 4 y / (µm) x / (µm) a.u. y / (µm) x / (µm) counts

6 Plasmonics in the past: the Lycurgus cup The Lycurgus cup: Late Roman Empire. 4th century AD. (With permission of the British Museum).

7 From surface waves to plasmonics Wood discovers anomaly in the optical spectrum of metal diffraction gratings R. W. Wood, Phil. Mag. (Ser. 6), "On a remarkable case of uneven distribution of light in a diffraction grating spectrum", 4, 396 (1902). Mie publisches the teatrise on light scattering by small particles G. Mie Beiträge zur Optik trüber Medien, speziell kolloidaler Metallösungen, Ann. der Physik, Vierte Folge, 25, 377 (1908). Zenneck and Sommerfeld study the propagation of electromagnetic waves on surfaces J. Zenneck Über die Fortpflanzung ebener elektromagnetischer Wellen längs einer ebenen Leiterfläche und ihre Beziehung zur drahtlosen Telegraphie, Ann. der Physik, 328, 846 (1907). A. Sommerfeld Über die Ausbreitung der Wellen in der drahtlosen Telegraphie, Ann. der Physik, 333, 665 (1909).

8 From surface waves to plasmonics Ritchie relates losses in electron beam crossing thin metal foils with surface plasmons R. H. Ritchie "Plasma losses by fast electrons in thin films", Phys. Rev., 106, 874 (1957). Otto and Kretschmann and Raether present alternative systems for excitation of surface plasmons using light A. Otto, "Excitation of nonradiative surface plasma waves in silver by the method of frustrated total reflection", Z. für Phys., 216, 398 (1968). E. Kretschmann and H. Raether, "Radiative decay of non-radiative surface plasmons excited by light", Z. Naturforsch. A, 23A, 2135 (1968).

9 Modern applications of plasmonics Surface plasmon resonance based sensors Light confinement at nanostructures Light scattering mediated by surface plasmons Enhanced optical transmission on arrays of apertures High-Q systems and whispering gallery modes Surface enhanced Raman scattering

10 NFO and Plasmonics: Topics 1 Fundamental concepts of EM waves: scattering, propagation, focusing 2 Angular spectrum representation of EM waves 3 Near-fields and far-fields 4 Confocal microscopy and SNOM: methods, probes 5 Surface plasmon-polaritons (SPPs) 6 SPPs at small particles: Mie theory, scattering, field enhancements 7 Applications of near-field enhancements: surface enhanced Raman scattering (SERS), enhanced fluorescence, spontaneous emission enhancement 8 Simulation methods for nano-optics: DDA, FDTD, FEM, etc. 9 Plasmonic materials

11 Nnear-field optics and plasmonics: Lab experiments Fabrication of plasmonic nanostructures Confocal microscopy: reflection and transmission modes SNOM in illumination/transmission mode Angle-resolved spectroscopy Light scattering and surface-plasmon resonance Surface enhanced Raman scattering

12 Near-field optics and plasmonics: lectures Dr. Manuel Rodrigues Gonçalves Institute of Experimental Physics Room N25/ Tel.: Fax.:

5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy

5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy 5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy Resolution of optical microscope is limited by diffraction. Light going through an aperture makes diffraction

More information

Basic principles and mechanisms of NSOM; Different scanning modes and systems of NSOM; General applications and advantages of NSOM.

Basic principles and mechanisms of NSOM; Different scanning modes and systems of NSOM; General applications and advantages of NSOM. Lecture 16: Near-field Scanning Optical Microscopy (NSOM) Background of NSOM; Basic principles and mechanisms of NSOM; Basic components of a NSOM; Different scanning modes and systems of NSOM; General

More information

Near-field scanning optical microscopy (SNOM)

Near-field scanning optical microscopy (SNOM) Adviser: dr. Maja Remškar Institut Jožef Stefan January 2010 1 2 3 4 5 6 Fluorescence Raman and surface enhanced Raman 7 Conventional optical microscopy-limited resolution Two broad classes of techniques

More information

CREOL, College of Optics & Photonics, University of Central Florida

CREOL, College of Optics & Photonics, University of Central Florida OSE6650 - Optical Properties of Nanostructured Materials Optical Properties of Nanostructured Materials Fall 2013 Class 3 slide 1 Challenge: excite and detect the near field Thus far: Nanostructured materials

More information

Review of NSOM Microscopy for Materials

Review of NSOM Microscopy for Materials Review of NSOM Microscopy for Materials Yannick DE WILDE (dewilde@optique.espci.fr) ESPCI Laboratoire d Optique Physique UPR A0005-CNRS, PARIS, FRANCE Outline : Introduction : concept of near-field scanning

More information

From apertureless near-field optical microscopy to infrared near-field night vision

From apertureless near-field optical microscopy to infrared near-field night vision From apertureless near-field optical microscopy to infrared near-field night vision Yannick DE WILDE ESPCI Laboratoire d Optique Physique UPR A0005-CNRS, PARIS dewilde@optique.espci.fr From apertureless

More information

NEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH STM AND AFM PROBES

NEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH STM AND AFM PROBES Vol. 93 (1997) A CTA PHYSICA POLONICA A No. 2 Proceedings of the 1st International Symposium on Scanning Probe Spectroscopy and Related Methods, Poznań 1997 NEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY

More information

Nano Optics: Overview of Research Activities. Sergey I. Bozhevolnyi SENSE, University of Southern Denmark, Odense, DENMARK

Nano Optics: Overview of Research Activities. Sergey I. Bozhevolnyi SENSE, University of Southern Denmark, Odense, DENMARK Nano Optics: Overview of Research Activities SENSE, University of Southern Denmark, Odense, DENMARK Optical characterization techniques: Leakage Radiation Microscopy Scanning Near-Field Optical Microscopy

More information

Optical Microscopy Beyond the Diffraction Limit: Imaging Guided and Propagating Fields

Optical Microscopy Beyond the Diffraction Limit: Imaging Guided and Propagating Fields Optical Microscopy Beyond the Diffraction Limit: Imaging Guided and Propagating Fields M. Selim Ünlü, Bennett B. Goldberg, and Stephen B. Ippolito Boston University Department of Electrical and Computer

More information

Scanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale

Scanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale Scanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale Outline Background Research Design Detection of Near-Field Signal Submonolayer Chemical Sensitivity Conclusions

More information

SCANNING NEAR-FIELD OPTICAL MICROSCOPY

SCANNING NEAR-FIELD OPTICAL MICROSCOPY & Dušan Vobornik¹, Slavenka Vobornik²* SCANNING NEAR-FIELD OPTICAL MICROSCOPY ¹ NRC-SIMS, 100 Sussex Drive, Rm 2109, Ottawa, Ontario, K1A OR6, Canada 2 Department of Medical Physics and Biophysics, Faculty

More information

PHYSICAL METHODS, INSTRUMENTS AND MEASUREMENTS Vol. IV Femtosecond Measurements Combined With Near-Field Optical Microscopy - Artyom A.

PHYSICAL METHODS, INSTRUMENTS AND MEASUREMENTS Vol. IV Femtosecond Measurements Combined With Near-Field Optical Microscopy - Artyom A. FEMTOSECOND MEASUREMENTS COMBINED WITH NEAR FIELD OPTICAL MICROSCOPY Artyom A. Astafiev, Semyonov Institute of Chemical Physics, Moscow, Russian Federation. Keywords: diffraction limit nearfield scanning

More information

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Single Defect Center Scanning Near-Field Optical Microscopy on Graphene J. Tisler, T. Oeckinghaus, R. Stöhr, R. Kolesov, F. Reinhard and J. Wrachtrup 3. Institute

More information

Nearfield Glass Slip P probe Pro For Neuroly Imaging

Nearfield Glass Slip P probe Pro For Neuroly Imaging Near-field scanning optical microscopy using a super-resolution cover glass slip Yu-Hsuan Lin 1,2 and Din Ping Tsai 1,3,4,* 1 Instrument Technology Research Center, National Applied Research Laboratories,

More information

Nanoscience Course Descriptions

Nanoscience Course Descriptions Nanoscience Course Descriptions NANO*1000 Introduction to Nanoscience This course introduces students to the emerging field of nanoscience. Its representation in popular culture and journalism will be

More information

DOE Solar Energy Technologies Program Peer Review. Denver, Colorado April 17-19, 2007

DOE Solar Energy Technologies Program Peer Review. Denver, Colorado April 17-19, 2007 DOE Solar Energy Technologies Program Peer Review Evaluation of Nanocrystalline Silicon Thin Film by Near-Field Scanning Optical Microscopy AAT-2-31605-05 Magnus Wagener and George Rozgonyi North Carolina

More information

Surface plasmon nanophotonics: optics below the diffraction limit

Surface plasmon nanophotonics: optics below the diffraction limit Surface plasmon nanophotonics: optics below the diffraction limit Albert Polman Center for nanophotonics FOM-Institute AMOLF, Amsterdam Jeroen Kalkman Hans Mertens Joan Penninkhof Rene de Waele Teun van

More information

UNIVERSITY OF SOUTHAMPTON. Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices.

UNIVERSITY OF SOUTHAMPTON. Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices. UNIVERSITY OF SOUTHAMPTON Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices. Christopher Wyndham John Hillman Submitted for the degree of Doctor of Philosophy

More information

Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications

Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications Saulius Marcinkevičius Optics, ICT, KTH 1 Outline Optical near field. Principle of scanning near field optical microscope

More information

How To Perform Raman Spectroscopy

How To Perform Raman Spectroscopy Spettroscopia Raman in campo prossimo Salvatore Patanè (1) and Pietro G. Gucciardi (2) (1) Dip. di Fisica della Materia e Tecnologie Fisiche Avanzate, Università di Messina, Salita Sperone 31, 98166 Messina,

More information

Preface Light Microscopy X-ray Diffraction Methods

Preface Light Microscopy X-ray Diffraction Methods Preface xi 1 Light Microscopy 1 1.1 Optical Principles 1 1.1.1 Image Formation 1 1.1.2 Resolution 3 1.1.3 Depth of Field 5 1.1.4 Aberrations 6 1.2 Instrumentation 8 1.2.1 Illumination System 9 1.2.2 Objective

More information

Apertureless Near-Field Optical Microscopy

Apertureless Near-Field Optical Microscopy VI Apertureless Near-Field Optical Microscopy In recent years, several types of apertureless near-field optical microscopes have been developed 1,2,3,4,5,6,7. In such instruments, light scattered from

More information

Laser Based Micro and Nanoscale Manufacturing and Materials Processing

Laser Based Micro and Nanoscale Manufacturing and Materials Processing Laser Based Micro and Nanoscale Manufacturing and Materials Processing Faculty: Prof. Xianfan Xu Email: xxu@ecn.purdue.edu Phone: (765) 494-5639 http://widget.ecn.purdue.edu/~xxu Research Areas: Development

More information

Microscopy: Principles and Advances

Microscopy: Principles and Advances Microscopy: Principles and Advances Chandrashekhar V. Kulkarni University of Central Lancashire, Preston, United kingdom May, 2014 University of Ljubljana Academic Background 2005-2008: PhD-Chemical Biology

More information

Raman spectroscopy Lecture

Raman spectroscopy Lecture Raman spectroscopy Lecture Licentiate course in measurement science and technology Spring 2008 10.04.2008 Antti Kivioja Contents - Introduction - What is Raman spectroscopy? - The theory of Raman spectroscopy

More information

Near-field scanning optical microscopy (NSOM) is

Near-field scanning optical microscopy (NSOM) is Extending Near-Field Scanning Optical Microscopy for Biological Studies Olivia L. Mooren, Elizabeth S. Erickson, Nicholas E. Dickenson, and Robert C. Dunn* University of Kansas, Lawrence, KS Keywords:

More information

Axial Sensitivity Of A Cracked Probe Of A Scanning Near- Field Optical Microscope

Axial Sensitivity Of A Cracked Probe Of A Scanning Near- Field Optical Microscope Proceedings of the World Congress on New Technologies (NewTech 05) Barcelona, Spain July 5-7, 05 Paper No. 38 Axial Sensitivity Of A Cracked Probe Of A Scanning Near- Field Optical Microscope Yu-Ching

More information

Outline. Self-assembled monolayer (SAM) formation and growth. Metal nanoparticles (NP) anchoring on SAM

Outline. Self-assembled monolayer (SAM) formation and growth. Metal nanoparticles (NP) anchoring on SAM From functional nanostructured surfaces to innovative optical biosensors Giacomo Dacarro Dipartimento di Fisica A.Volta Dipartimento di Chimica Generale Università degli Studi di Pavia Dalla scienza dei

More information

Near-Field Scanning Optical Microscopy: a Brief Overview

Near-Field Scanning Optical Microscopy: a Brief Overview Near-Field Scanning Optical Microscopy: a Brief Overview Serge HUANT Laboratoire de Spectrométrie Physique (SPECTRO) Université Joseph Fourier Grenoble et CNRS Thanks to my former & present collaborators

More information

On the way to a multi-task near field optical microscope: Simultaneous STM/SNOM and PSTM imaging

On the way to a multi-task near field optical microscope: Simultaneous STM/SNOM and PSTM imaging A Microsc. Microanal. Microstruct. 5 (1994) 399 AUGUST/OCTOBER/DECEMBER 1994, PAGE 399 Classification Physics Abstracts 42.30. d On the way to a multitask near field optical microscope: Simultaneous STM/SNOM

More information

NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH POINTED PROBES

NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH POINTED PROBES Annu. Rev. Phys. Chem. 2006. 57:303 31 doi: 10.1146/annurev.physchem.56.092503.141236 Copyright c 2006 by Annual Reviews. All rights reserved First published online as a Review in Advance on December 16,

More information

Optics and Spectroscopy at Surfaces and Interfaces

Optics and Spectroscopy at Surfaces and Interfaces Vladimir G. Bordo and Horst-Gunter Rubahn Optics and Spectroscopy at Surfaces and Interfaces WILEY- VCH WILEY-VCH Verlag GmbH & Co. KGaA Contents Preface IX 1 Introduction 1 2 Surfaces and Interfaces 5

More information

3D Raman Imaging Nearfield-Raman TERS. Solutions for High-Resolution Confocal Raman Microscopy. www.witec.de

3D Raman Imaging Nearfield-Raman TERS. Solutions for High-Resolution Confocal Raman Microscopy. www.witec.de 3D Raman Imaging Nearfield-Raman TERS Solutions for High-Resolution Confocal Raman Microscopy www.witec.de 01 3D Confocal Raman Imaging Outstanding performance in speed, sensitivity, and resolution with

More information

Terahertz transmission properties of an individual slit in a thin metallic plate

Terahertz transmission properties of an individual slit in a thin metallic plate Terahertz transmission properties of an individual slit in a thin metallic plate J. W. Lee, 1 T. H. Park, 2 Peter Nordlander, 2 and Daniel M. Mittleman 1,* 1 Department of Electrical and Computer Engineering,

More information

E F G. Overview of the activities. SAPIE ZA Università di Roma - Laboratorio di Fotonica Molecolare

E F G. Overview of the activities. SAPIE ZA Università di Roma - Laboratorio di Fotonica Molecolare SAPIE ZA Università di Roma Dipartimento di Energetica Laboratorio di Fotonica Molecolare Francesco Michelotti E-Mail: francesco.michelotti@uniroma1.it Tel: +39 06-49.91.65.62 Workshop Future Trends in

More information

bulk 5. Surface Analysis Why surface Analysis? Introduction Methods: XPS, AES, RBS

bulk 5. Surface Analysis Why surface Analysis? Introduction Methods: XPS, AES, RBS 5. Surface Analysis Introduction Methods: XPS, AES, RBS Autumn 2011 Experimental Methods in Physics Marco Cantoni Why surface Analysis? Bulk: structural function Electrical/thermal conduction Volume increases

More information

Lecture 20: Scanning Confocal Microscopy (SCM) Rationale for SCM. Principles and major components of SCM. Advantages and major applications of SCM.

Lecture 20: Scanning Confocal Microscopy (SCM) Rationale for SCM. Principles and major components of SCM. Advantages and major applications of SCM. Lecture 20: Scanning Confocal Microscopy (SCM) Rationale for SCM. Principles and major components of SCM. Advantages and major applications of SCM. Some limitations (disadvantages) of NSOM A trade-off

More information

It has long been a goal to achieve higher spatial resolution in optical imaging and

It has long been a goal to achieve higher spatial resolution in optical imaging and Nano-optical Imaging using Scattering Scanning Near-field Optical Microscopy Fehmi Yasin, Advisor: Dr. Markus Raschke, Post-doc: Dr. Gregory Andreev, Graduate Student: Benjamin Pollard Department of Physics,

More information

New enhancement strategies for plasmon-enhanced fluorescence biosensors

New enhancement strategies for plasmon-enhanced fluorescence biosensors New enhancement strategies for plasmon-enhanced fluorescence biosensors Dissertation zur Erlangung des Grades Doktor der Naturwissenschaften am Fachbereich Biologie der Johannes Gutenberg-Universität in

More information

Near-field optical microscopy based on microfabricated probes

Near-field optical microscopy based on microfabricated probes Journal of Microscopy, Vol. 202, Pt 1, April 2001, pp. 7±11. Received 28 August 2000; accepted 1 December 2000 Near-field optical microscopy based on microfabricated probes R. ECKERT* 1, J. M. FREYLAND*,

More information

Applied Optics and Optical Materials at the Colorado School of Mines

Applied Optics and Optical Materials at the Colorado School of Mines Applied Optics and Optical Materials at the Colorado School of Mines CPIA Annual Meeting 14 November 2007 Charles Durfee Engineering Physics program Applied Optics and Optical Materials Colorado School

More information

Scanning Probe Microscopy

Scanning Probe Microscopy Ernst Meyer Hans Josef Hug Roland Bennewitz Scanning Probe Microscopy The Lab on a Tip With 117 Figures Mß Springer Contents 1 Introduction to Scanning Probe Microscopy f f.1 Overview 2 f.2 Basic Concepts

More information

Simple and scalable fabrication approaches of Nanophotonic structures for PV

Simple and scalable fabrication approaches of Nanophotonic structures for PV Simple and scalable fabrication approaches of Nanophotonic structures for PV Fabien Sorin Surface du Verre et Interfaces (SVI), UMR 125 CNRS/Saint-Gobain, 39, Quai Lucien Lefranc, 93303 Aubervilliers,

More information

Ultrahigh-efficiency solar cells based on nanophotonic design

Ultrahigh-efficiency solar cells based on nanophotonic design Ultrahigh-efficiency solar cells based on nanophotonic design Albert Polman Piero Spinelli Jorik van de Groep Claire van Lare Bonna Newman Erik Garnett Marc Verschuuren Ruud Schropp Wim Sinke Center for

More information

Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe. Keywords: Carbon Nanotube, Scanning Probe Microscope

Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe. Keywords: Carbon Nanotube, Scanning Probe Microscope International Journal of Arts and Sciences 3(1): 18-26 (2009) CD-ROM. ISSN: 1944-6934 InternationalJournal.org Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe Bedri Onur Kucukyildirim,

More information

Near-Field Scanning Optical Microscopy, a Siren Call to Biology

Near-Field Scanning Optical Microscopy, a Siren Call to Biology Traffic 2001; 2: 797 803 Copyright C Munksgaard 2001 Munksgaard International Publishers ISSN 1398-9219 Review Near-Field Scanning Optical Microscopy, a Siren Call to Biology Michael Edidin Department

More information

Confocal Microscopy and Atomic Force Microscopy (AFM) A very brief primer...

Confocal Microscopy and Atomic Force Microscopy (AFM) A very brief primer... Confocal Microscopy and Atomic Force Microscopy (AFM) of biofilms A very brief primer... Fundamentals of Confocal Microscopy Based on a conventional fluorescence microscope Fluorescent Microscope Confocal

More information

Cloud Computing Simulation Tools for Nanophotonics at nanohub.org

Cloud Computing Simulation Tools for Nanophotonics at nanohub.org Cloud Computing Simulation Tools for Nanophotonics at nanohub.org L. J. Prokopeva, 1 U. Guler, 1 X. Ni, 1 J. Fang, 1 R. Chandrasekar, 1 V. P. Drachev, 1 V. Shalaev, 1 Z. Liu, 1,4 N. Arnold, 2 T. Klar,

More information

Silvia Vignolini Curriculum Vitæ

Silvia Vignolini Curriculum Vitæ Silvia Vignolini Curriculum Vitæ Personal Data Name: Silvia Vignolini Date of birth: January 14, 1981 Place of birth: Contacts: Firenze, ITALY Home address: Via G. Braga 212, 59021 Vaiano, Prato (IT) Working

More information

Scanning near-field optical microscopy with white-light illumination: nanoscale imaging and spectroscopy of resonant systems.

Scanning near-field optical microscopy with white-light illumination: nanoscale imaging and spectroscopy of resonant systems. urrent Microscopy ontributions to dvances in Science and Technology (. Méndez-Vilas, Ed.) Scanning near-field optical microscopy with white-light illumination: nanoscale imaging and spectroscopy of resonant

More information

7 Plasmonics. 7.1 Introduction

7 Plasmonics. 7.1 Introduction 7 Plasmonics Highlights of this chapter: In this chapter we introduce the concept of surface plasmon polaritons (SPP). We discuss various types of SPP and explain excitation methods. Finally, different

More information

Progress In Electromagnetics Research, Vol. 138, 647 660, 2013

Progress In Electromagnetics Research, Vol. 138, 647 660, 2013 Progress In Electromagnetics Research, Vol. 138, 647 660, 2013 FAR-FIELD TUNABLE NANO-FOCUSING BASED ON METALLIC SLITS SURROUNDED WITH NONLINEAR- VARIANT WIDTHS AND LINEAR-VARIANT DEPTHS OF CIRCULAR DIELECTRIC

More information

Lecture 4 Scanning Probe Microscopy (SPM)

Lecture 4 Scanning Probe Microscopy (SPM) Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric

More information

Spin-flip excitation spectroscopy with STM excitation of allowed transition adds an inelastic contribution (group of Andreas Heinrich, IBM Almaden)

Spin-flip excitation spectroscopy with STM excitation of allowed transition adds an inelastic contribution (group of Andreas Heinrich, IBM Almaden) Magnetism at the atomic scale by Scanning Probe Techniques Kirsten von Bergmann Institute of Applied Physics Magnetism with SPM Spin-polarized scanning tunneling microscopy SP-STM density of states of

More information

- particle with kinetic energy E strikes a barrier with height U 0 > E and width L. - classically the particle cannot overcome the barrier

- particle with kinetic energy E strikes a barrier with height U 0 > E and width L. - classically the particle cannot overcome the barrier Tunnel Effect: - particle with kinetic energy E strikes a barrier with height U 0 > E and width L - classically the particle cannot overcome the barrier - quantum mechanically the particle can penetrated

More information

How To Enhance Evanescent Waves With Surface Plasmon

How To Enhance Evanescent Waves With Surface Plasmon Appl. Phys. A 80, 1315 1325 2005) DOI: 10.1007/s00339-004-3160-6 Applied Physics A Materials Science & Processing n. fang Experimental study of transmission z. liu t.-j. yen enhancement of evanescent waves

More information

Differential Near-Field Scanning Optical Microscopy

Differential Near-Field Scanning Optical Microscopy Differential Near-Field Scanning Optical Microscopy NANO LETTERS 2006 Vol. 6, No. 11 2609-2616 Aydogan Ozcan,*, Ertugrul Cubukcu,, Alberto Bilenca,, Kenneth B. Crozier, Brett E. Bouma, Federico Capasso,

More information

Laser-induced surface phonons and their excitation of nanostructures

Laser-induced surface phonons and their excitation of nanostructures CHINESE JOURNAL OF PHYSICS VOL. 49, NO. 1 FEBRUARY 2011 Laser-induced surface phonons and their excitation of nanostructures Markus Schmotz, 1, Dominik Gollmer, 1 Florian Habel, 1 Stephen Riedel, 1 and

More information

SPM 150 Aarhus with KolibriSensor

SPM 150 Aarhus with KolibriSensor Customied Systems and Solutions Nanostructures and Thin Film Deposition Surface Analysis and Preparation Components Surface Science Applications SPM 150 Aarhus with KolibriSensor Atomic resolution NC-AFM

More information

T E S I S QUE COMO REQUISITO PARCIAL PARA OBTENER EL GRADO DE DOCTOR EN INGENIERÍA FÍSICA INDUSTRIAL

T E S I S QUE COMO REQUISITO PARCIAL PARA OBTENER EL GRADO DE DOCTOR EN INGENIERÍA FÍSICA INDUSTRIAL UNIVERSIDAD AUTÓNOMA DE NUEVO LEÓN FACULTAD DE CIENCIAS FÍSICO-MATEMÁTICAS DISEÑO Y CARACTERIZACIÓN DE DISPOSITIVOS PLASMÓNICOS T E S I S QUE COMO REQUISITO PARCIAL PARA OBTENER EL GRADO DE DOCTOR EN INGENIERÍA

More information

BROADBAND PHOTOCURRENT ENHANCEMENT IN LONGWAVE INFRARED QUANTUM DOT PHOTODETECTORS BY SUB-WAVELENGTH SURFACE GRATINGS

BROADBAND PHOTOCURRENT ENHANCEMENT IN LONGWAVE INFRARED QUANTUM DOT PHOTODETECTORS BY SUB-WAVELENGTH SURFACE GRATINGS Optics and Photonics Letters Vol. 6, No. 1 (2013) 1350002 (6 pages) c World Scientific Publishing Company DOI: 10.1142/S1793528813500020 BROADBAND PHOTOCURRENT ENHANCEMENT IN LONGWAVE INFRARED QUANTUM

More information

The plasmoelectric effect: optically induced electrochemical potentials in resonant metallic structures

The plasmoelectric effect: optically induced electrochemical potentials in resonant metallic structures The plasmoelectric effect: optically induced electrochemical potentials in resonant metallic structures Matthew T. Sheldon and Harry A. Atwater Thomas J. Watson Laboratories of Applied Physics, California

More information

Edited by. C'unter. and David S. Moore. Gauglitz. Handbook of Spectroscopy. Second, Enlarged Edition. Volume 4. WlLEY-VCH. VerlagCmbH & Co.

Edited by. C'unter. and David S. Moore. Gauglitz. Handbook of Spectroscopy. Second, Enlarged Edition. Volume 4. WlLEY-VCH. VerlagCmbH & Co. Edited by C'unter Gauglitz and David S. Moore Handbook of Spectroscopy Second, Enlarged Edition Volume 4 WlLEY-VCH VerlagCmbH & Co. KGaA IX Volume 4 Section XII Applications 6: Spectroscopy at Surfaces

More information

CSCI 4974 / 6974 Hardware Reverse Engineering. Lecture 8: Microscopy and Imaging

CSCI 4974 / 6974 Hardware Reverse Engineering. Lecture 8: Microscopy and Imaging CSCI 4974 / 6974 Hardware Reverse Engineering Lecture 8: Microscopy and Imaging Data Acquisition for RE Microscopy Imaging Registration and stitching Microscopy Optical Electron Scanning Transmission Scanning

More information

Scanning near-field optical microscopy: from single-tip to dual-tip operation. Angela E. Klein

Scanning near-field optical microscopy: from single-tip to dual-tip operation. Angela E. Klein Scanning near-field optical microscopy: from single-tip to dual-tip operation Angela E. Klein Jena 2014 Scanning near-field optical microscopy: from single-tip to dual-tip operation Dissertation zur Erlangung

More information

Far-field mapping of the longitudinal magnetic and electric optical fields

Far-field mapping of the longitudinal magnetic and electric optical fields Far-field mapping of the longitudinal magnetic and electric optical fields Clément Ecoffey, Thierry Grosjean To cite this version: Clément Ecoffey, Thierry Grosjean. Far-field mapping of the longitudinal

More information

Electromagnetic Radiation (EMR) and Remote Sensing

Electromagnetic Radiation (EMR) and Remote Sensing Electromagnetic Radiation (EMR) and Remote Sensing 1 Atmosphere Anything missing in between? Electromagnetic Radiation (EMR) is radiated by atomic particles at the source (the Sun), propagates through

More information

Comparative scanning near-field optical microscopy studies of plasmonic nanoparticle concepts

Comparative scanning near-field optical microscopy studies of plasmonic nanoparticle concepts Comparative scanning near-field optical microscopy studies of plasmonic nanoparticle concepts Patrick Andrae* a, Paul Fumagalli b, Martina Schmid a,b a Helmholtz Zentrum Berlin, Nanooptical concepts for

More information

(Nano)materials characterization

(Nano)materials characterization (Nano)materials characterization MTX9100 Nanomaterials Lecture 8 OUTLINE 1 -What SEM and AFM are good for? - What is the Atomic Force Microscopes Contribution to Nanotechnology? - What is Spectroscopy?

More information

Near field optical microscopy: a brief review

Near field optical microscopy: a brief review Int. J. Nanotechnology, Vol. x, No. x, xxxx 1 Near field optical microscopy: a brief review A. L. Lereu* 1, A. Passian 2,3, and Ph. Dumas 1 1 CINaM CNRS Campus de Luminy, 13288 Marseille, France 2 Oak

More information

Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture

Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture Nanoelectronics 09 Atsufumi Hirohata Department of Electronics 12:00 Wednesday, 4/February/2015 (P/L 006) Quick Review over the Last Lecture ( Field effect transistor (FET) ): ( Drain ) current increases

More information

h e l p s y o u C O N T R O L

h e l p s y o u C O N T R O L contamination analysis for compound semiconductors ANALYTICAL SERVICES B u r i e d d e f e c t s, E v a n s A n a l y t i c a l g r o u p h e l p s y o u C O N T R O L C O N T A M I N A T I O N Contamination

More information

Hard Condensed Matter WZI

Hard Condensed Matter WZI Hard Condensed Matter WZI Tom Gregorkiewicz University of Amsterdam VU-LaserLab Dec 10, 2015 Hard Condensed Matter Cluster Quantum Matter Optoelectronic Materials Quantum Matter Amsterdam Mark Golden Anne

More information

Tecniche a scansione di sonda per nanoscopia e nanomanipolazione 3: SNOM e litografie

Tecniche a scansione di sonda per nanoscopia e nanomanipolazione 3: SNOM e litografie LS Scienza dei Materiali - a.a. 2009/10 Fisica delle Nanotecnologie part 5.3 Version 7b, Dec 2009 Francesco Fuso, tel 0502214305, 0502214293 - fuso@df.unipi.it http://www.df.unipi.it/~fuso/dida Tecniche

More information

Scanning probe microscopy AFM, STM. Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication

Scanning probe microscopy AFM, STM. Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication Scanning probe microscopy AFM, STM Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication Scanning Probe Microscopy 1986 Binning and Rohrer shared Nobel Prize in Physics for invention.stm

More information

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Reflection Electron Microscopy and Spectroscopy for Surface Analysis Reflection Electron Microscopy and Spectroscopy for Surface Analysis by Zhong Lin Wang 1 Introduction In 1986, E. Ruska was awarded the Nobel Physics Prize for his pioneering work of building the world's

More information

Atomic Force Microscopy Observation and Characterization of a CD Stamper, Lycopodium Spores, and Step-Height Standard Diffraction Grating

Atomic Force Microscopy Observation and Characterization of a CD Stamper, Lycopodium Spores, and Step-Height Standard Diffraction Grating Atomic Force Microscopy Observation and Characterization of a CD Stamper, Lycopodium Spores, and Step-Height Standard Diffraction Grating Michael McMearty and Frit Miot Special Thanks to Brendan Cross

More information

Nano-Spectroscopy. Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale

Nano-Spectroscopy. Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale Nano-Spectroscopy Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale Since its introduction in the early 80 s, Scanning Probe Microscopy (SPM) has quickly made nanoscale imaging an affordable

More information

Overview. What is EMR? Electromagnetic Radiation (EMR) LA502 Special Studies Remote Sensing

Overview. What is EMR? Electromagnetic Radiation (EMR) LA502 Special Studies Remote Sensing LA502 Special Studies Remote Sensing Electromagnetic Radiation (EMR) Dr. Ragab Khalil Department of Landscape Architecture Faculty of Environmental Design King AbdulAziz University Room 103 Overview What

More information

Polarization Dependence in X-ray Spectroscopy and Scattering. S P Collins et al Diamond Light Source UK

Polarization Dependence in X-ray Spectroscopy and Scattering. S P Collins et al Diamond Light Source UK Polarization Dependence in X-ray Spectroscopy and Scattering S P Collins et al Diamond Light Source UK Overview of talk 1. Experimental techniques at Diamond: why we care about x-ray polarization 2. How

More information

Raman Spectroscopy Basics

Raman Spectroscopy Basics Raman Spectroscopy Basics Introduction Raman spectroscopy is a spectroscopic technique based on inelastic scattering of monochromatic light, usually from a laser source. Inelastic scattering means that

More information

Apertureless scanning near-field optical microscopy: a comparison between homodyne and heterodyne approaches

Apertureless scanning near-field optical microscopy: a comparison between homodyne and heterodyne approaches Gomez et al. Vol. 23, No. 5/ May 2006/J. Opt. Soc. Am. B 823 Apertureless scanning near-field optical microscopy: a comparison between homodyne and heterodyne approaches Lewis Gomez Chemistry Division

More information

Understanding Laser Beam Parameters Leads to Better System Performance and Can Save Money

Understanding Laser Beam Parameters Leads to Better System Performance and Can Save Money Understanding Laser Beam Parameters Leads to Better System Performance and Can Save Money Lasers became the first choice of energy source for a steadily increasing number of applications in science, medicine

More information

Lecture forum InnovationPoint

Lecture forum InnovationPoint InnovationPoint Opto-Mechanical Design Software Applications and Features, an Overview... Christoph GERHARD Product Manager Business Unit Catalog LINOS Photonics GmbH & Co. KG Christoph GERHARD, Product

More information

Fluorescence Microscopy for an NMR- Biosensor Project

Fluorescence Microscopy for an NMR- Biosensor Project Fluorescence Microscopy for an NMR- Biosensor Project Ole Hirsch Physikalisch-Technische Bundesanstalt Medical Optics Abbestr. -1, 10587 Berlin, Germany Overview NMR Sensor Project Dimensions in biological

More information

Modern Classical Optics

Modern Classical Optics Modern Classical Optics GEOFFREY BROOKER Department of Physics University of Oxford OXPORD UNIVERSITY PRESS Contents 1 Electromagnetism and basic optics 1 1.1 Introduction 1 1.2 The Maxwell equations 1

More information

Scanning near-field optical microscopy on dense random assemblies of metal nanoparticles

Scanning near-field optical microscopy on dense random assemblies of metal nanoparticles Home Search Collections Journals About Contact us My IOPscience Scanning near-field optical microscopy on dense random assemblies of metal nanoparticles This content has been downloaded from IOPscience.

More information

Lecture 6 Scanning Tunneling Microscopy (STM) General components of STM; Tunneling current; Feedback system; Tip --- the probe.

Lecture 6 Scanning Tunneling Microscopy (STM) General components of STM; Tunneling current; Feedback system; Tip --- the probe. Lecture 6 Scanning Tunneling Microscopy (STM) General components of STM; Tunneling current; Feedback system; Tip --- the probe. Brief Overview of STM Inventors of STM The Nobel Prize in Physics 1986 Nobel

More information

X-Rays and Magnetism From Fundamentals to Nanoscale Dynamics

X-Rays and Magnetism From Fundamentals to Nanoscale Dynamics X-Rays and Magnetism From Fundamentals to Nanoscale Dynamics Joachim Stöhr Stanford Synchrotron Radiation Laboratory X-rays have come a long way 1895 1993 10 cm 10 µm 100 nm Collaborators: SSRL Stanford:

More information

Microscopic Techniques

Microscopic Techniques Microscopic Techniques Outline 1. Optical microscopy Conventional light microscopy, Fluorescence microscopy, confocal/multiphoton microscopy and Stimulated emission depletion microscopy 2. Scanning probe

More information

Raman Spectroscopy on Single-Molecule Junctions

Raman Spectroscopy on Single-Molecule Junctions PHYSIK-DEPARTMENT Raman Spectroscopy on Single-Molecule Junctions Doktorarbeit von Hai Bi TECHNISCHE UNIVERSITÄT MÜNCHEN i TECHNISCHE UNIVERSITÄT MÜNCHEN Physik Department E20 Molekulare Nanowissenschaften

More information

Light extraction via leaky modes in organic light emitting devices

Light extraction via leaky modes in organic light emitting devices Optics Communications 266 (2006) 191 197 www.elsevier.com/locate/optcom Light extraction via leaky modes in organic light emitting devices Nils A. Reinke, Claudia Ackermann, Wolfgang Brütting * Experimental

More information

Scanning Electron Microscopy: an overview on application and perspective

Scanning Electron Microscopy: an overview on application and perspective Scanning Electron Microscopy: an overview on application and perspective Elvio Carlino Center for Electron Microscopy - IOM-CNR Laboratorio Nazionale TASC - Trieste, Italy Location of the Center for Electron

More information

Analysis of Electromagnetic Propulsion on a Two-Electric-Dipole System

Analysis of Electromagnetic Propulsion on a Two-Electric-Dipole System Electronics and Communications in Japan, Part 2, Vol. 83, No. 4, 2000 Translated from Denshi Joho Tsushin Gakkai Ronbunshi, Vol. J82-C-I, No. 6, June 1999, pp. 310 317 Analysis of Electromagnetic Propulsion

More information

Diffraction and Young s Single Slit Experiment

Diffraction and Young s Single Slit Experiment Diffraction and Young s Single Slit Experiment Developers AB Overby Objectives Preparation Background The objectives of this experiment are to observe Fraunhofer, or far-field, diffraction through a single

More information

SIGNAL ANALYSIS OF APERTURELESS SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH SUPER- LENS

SIGNAL ANALYSIS OF APERTURELESS SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH SUPER- LENS Progress In Electromagnetics Research, Vol. 109, 83 106, 2010 SIGNAL ANALYSIS OF APERTURELESS SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH SUPER- LENS C.-H. Chuang and Y.-L. Lo Department of Mechanical

More information

Arrangement of Electrons in Atoms

Arrangement of Electrons in Atoms CHAPTER 4 PRE-TEST Arrangement of Electrons in Atoms In the space provided, write the letter of the term that best completes each sentence or best answers each question. 1. Which of the following orbital

More information

UNIT I: INTRFERENCE & DIFFRACTION Div. B Div. D Div. F INTRFERENCE

UNIT I: INTRFERENCE & DIFFRACTION Div. B Div. D Div. F INTRFERENCE 107002: EngineeringPhysics Teaching Scheme: Lectures: 4 Hrs/week Practicals-2 Hrs./week T.W.-25 marks Examination Scheme: Paper-50 marks (2 hrs) Online -50marks Prerequisite: Basics till 12 th Standard

More information

Nanometer-scale imaging and metrology, nano-fabrication with the Orion Helium Ion Microscope

Nanometer-scale imaging and metrology, nano-fabrication with the Orion Helium Ion Microscope andras@nist.gov Nanometer-scale imaging and metrology, nano-fabrication with the Orion Helium Ion Microscope Bin Ming, András E. Vladár and Michael T. Postek National Institute of Standards and Technology

More information

Pump-probe experiments with ultra-short temporal resolution

Pump-probe experiments with ultra-short temporal resolution Pump-probe experiments with ultra-short temporal resolution PhD candidate: Ferrante Carino Advisor:Tullio Scopigno Università di Roma ƒla Sapienza 22 February 2012 1 Pump-probe experiments: generalities

More information