Atomic Force Microscopy. Long Phan Nanotechnology Summer Series May 15, 2013

Size: px
Start display at page:

Download "Atomic Force Microscopy. Long Phan Nanotechnology Summer Series May 15, 2013"

Transcription

1 Atomic Force Microscopy Long Phan Nanotechnology Summer Series May 15,

2 World s Smallest Movie 2

3 Outline What is AFM? How does AFM Work? 3 Modes: Contact mode Non contact mode Tapping mode Imaging Advantages of AFM hnp:// info.com/files/graphene/images/atomic force microscope on graphene.jpg 3

4 History The first Atomic Force Microscope (AFM) was developed by G. Binnig, Ch. Gerber, and C. Quate in 1985 Glued a [ny shard of diamond onto one end of a [ny strip of gold foil Small hook at end of the [p pressed against sample surface hnps://en.wikipedia.org/wiki/file:atomic_force_microscope_science_museum_london.jpg hnp://img.direc[ndustry.com/images_di/photo g/atomic force microscope afm jpg 4

5 What Can We Look At? AFM is currently the most widely used scanning probe microscopy technique Materials inves[gated: thin and thick film coa[ngs, ceramics, composites, glasses, synthe[c and biological membranes, metals, polymers, and semiconductors hnp://butler.cc.tut.fi/~foster/images/afmman.png hnp:// 5

6 Applica[ons To produce a topographical image of a surface with atomic resolu[on Determine roughness of a sample s surface Measure trenches to determine film thickness Image non conduc[ng surfaces Study the dynamic behavior of living and fixed cells hnp://phys.org/news/ world atomic microscope chemical bonds.html hnp:// 6

7 AFM Essen[al Elements 1. Laser deflected off can[lever 2. Mirror reflects laser beam to photodetector 3. Photodetector dual element photodiode that measures differences in light intensity and converts to voltage 4. Amplifier 5. Register 6. Sample 7. Probe [p that scans sample made of Si 8. Can:lever moves as scanned over sample and deflects laser beam hnp://stm2.nrl.navy.mil/how afm/how afm.html#imaging%20modes hnp:// probe series_tn_624_detail.jpg 7

8 AFM Principles Leonard Jones Poten[al Separa[on distance hnp://engr.iupui.edu/bme/bbml/figures/vdwpecurve.jpg 8

9 AFM Principles During scan, features affect laser deflec[on off can[lever Laser detector reads deflec[on and either: Translates deflec[on into topography map Moves stage to maintain zero laser deflec[on and translates stage movement to topography. hnp:// 9

10 3 Modes of AFM Contact Mode High resolu[on Damage to sample Non Contact Mode Lower resolu[on No damage to sample Tapping/IntermiNent Mode Intermediate resolu[on Minimal damage to sample 10

11 Contact Mode Measures repulsion between [p and sample Commonly, force of [p against sample remains constant Feedback regula[on keeps can[lever deflec[on at zero Voltage required indicates height of sample Problems: Will damage soqer surfaces 11

12 Non Contact Mode Tip doesn t touch sample Measures Van der Waals forces between [p and sample to acquire topography data Doesn t degrade or interfere with sample bener for soq samples Problems: Can t use with samples in fluid 12

13 Tapping/IntermiNent Mode Tip ver[cally oscillates between contac[ng sample surface and liqing off at kHz. Oscilla[on amplitude reduced as probe nears surface Advantages: overcomes problems associated with fric[on, adhesion, electrosta[c forces hnp://cdn.intechopen.com/pdfs/30111/intech Tapping_mode_afm_imaging_for_func[onalized_surfaces.pdf 13

14 Genera[ng an Image Scanning Tip Raster Mo[on The [p rasters back and forth in a straight line across the sample (think old typewriter or CRT) In the typical imaging mode, the [p sample force is held constant by adjus[ng the ver[cal posi[on of the [p (feedback). A topographic image is built up by the computer by recording the ver[cal posi[on as the [p is rastered across the sample. borstel.de/biophysik/ de/methods/afm.html 14

15 Effect of Tip Resolu[on Radius of [p limits the accuracy of analysis/ resolu[on Wider probe radii lead to feature inaccuracies and rounding of steps hnp://jnm.snmjournals.org/content/48/7/1039/f1.large.jpg 15

16 Effect of Tip Resolu[on hnp:// 16

17 Imaging Materials 17

18 Imaging Materials Thakurdesai, M.; et. al. Vacuum 2008, 82, hnp://ej.iop.org/images/ /22/4/045012/Full/jmm399735f1_online.jpg 18

19 Imaging Materials Biro, L.; Lambin, P. New J. Phys., 2013, 15,

20 Imaging Biological Samples Single stranded G4 DNA hnp:// 20

21 Other Capabili[es Electrosta[c Force Microscopy (EFM) Dis[nguishing differences in sample composi[on (crystal orienta[on, chemical composi[on) Measuring conduc[vity (CAFM) Micro/nanoindenta[on Piezoresponse Force Microscopy (PFM) Magne[c Force Microscopy (MFM) 21

22 Electrosta[c Force Microscopy (EFM) Non contact mode Constant height or constant deflec[on Track changes in [p oscilla[ons due to electrosta[c force gradients between [p and sample (at large separa[on). hnp:// 22

23 23 hnp:// Electrosta[c Force Microscopy EFM test sample png

24 hnp:// Electrosta[c Force Microscopy EFM test sample png 24 hnp://

25 hnp:// Electrosta[c Force Microscopy EFM test sample png 25 hnp://

26 More EFM Images Carbon Nanotube Ferrite (bright) and Austenite (dark) hnp:// 26

27 AFM Phase Mapping In Tapping / IntermiNent mode, changes in material lead to changes in phase angle of [p oscilla[on hnp:// 27

28 Phase Images hnp:// 28

29 Conduc[ve AFM Operates in Contact mode to map varia[on in electrical conduc[vity of sample Also able to collect current voltage (IV) spectra at specific points on sample hnp:// 29

30 CAFM Images GaAs Quantum Dots DVD Recording hnp:// 30

31 Micro / Nanoindenta[on Test mechanical proper[es of materials: Hardness (max load divided by indent area) Young s Modulus (elas[city) hnp:// hnp:// 31

32 Load Displacement Young s Modulus 32

33 Piezoresponse Force Microscopy Measures the mechanical response when an electrical voltage is applied to the sample surface with a conduc[ve [p hnp:// 33

34 PFM Images 34

35 Magne[c Force Microscopy (MFM) As the [p moves over an magne[c field gradient, it is either pulled toward or repulsed away from the sample. 35

36 MFM Images 36

37 Advantages of AFM AFM vs. STM (scanning tunneling microscope): Images both conductors and insulators AFM vs. SEM (scanning electron microscope): Greater topographic contrast AFM vs. TEM (transmission electron microscope): No expensive and [me intensive sample prep 37

38 Summary AFM images surface topography 3 Modes Contact IntermiNent / Tapping Non Contact Many different imaging abili[es! EFM, Phase, CAFM, Indenta[on, PFM, MFM 38

1 Introduction. 1.1 Historical Perspective

1 Introduction. 1.1 Historical Perspective j1 1 Introduction 1.1 Historical Perspective The invention of scanning probe microscopy is considered one of the major advances in materials science since 1950 [1, 2]. Scanning probe microscopy includes

More information

7/3/2014. Introduction to Atomic Force Microscope. Introduction to Scanning Force Microscope. Invention of Atomic Force Microscope (AFM)

7/3/2014. Introduction to Atomic Force Microscope. Introduction to Scanning Force Microscope. Invention of Atomic Force Microscope (AFM) Introduction to Atomic Force Microscope Introduction to Scanning Force Microscope Not that kind of atomic Tien Ming Chuang ( 莊 天 明 ) Institute of Physics, Academia Sinica Tien Ming Chuang ( 莊 天 明 ) Institute

More information

Piezoelectric Scanners

Piezoelectric Scanners Piezoelectric Scanners Piezoelectric materials are ceramics that change dimensions in response to an applied voltage and conversely, they develop an electrical potential in response to mechanical pressure.

More information

Tecniche a scansione di sonda per nanoscopia e nanomanipolazione 2: AFM e derivati

Tecniche a scansione di sonda per nanoscopia e nanomanipolazione 2: AFM e derivati LS Scienza dei Materiali - a.a. 2008/09 Fisica delle Nanotecnologie part 5.2 Version 7, Nov 2008 Francesco Fuso, tel 0502214305, 0502214293 - fuso@df.unipi.it http://www.df.unipi.it/~fuso/dida Tecniche

More information

Lecture 6 Scanning Tunneling Microscopy (STM) General components of STM; Tunneling current; Feedback system; Tip --- the probe.

Lecture 6 Scanning Tunneling Microscopy (STM) General components of STM; Tunneling current; Feedback system; Tip --- the probe. Lecture 6 Scanning Tunneling Microscopy (STM) General components of STM; Tunneling current; Feedback system; Tip --- the probe. Brief Overview of STM Inventors of STM The Nobel Prize in Physics 1986 Nobel

More information

Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture

Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture Nanoelectronics 09 Atsufumi Hirohata Department of Electronics 12:00 Wednesday, 4/February/2015 (P/L 006) Quick Review over the Last Lecture ( Field effect transistor (FET) ): ( Drain ) current increases

More information

Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe. Keywords: Carbon Nanotube, Scanning Probe Microscope

Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe. Keywords: Carbon Nanotube, Scanning Probe Microscope International Journal of Arts and Sciences 3(1): 18-26 (2009) CD-ROM. ISSN: 1944-6934 InternationalJournal.org Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe Bedri Onur Kucukyildirim,

More information

ATOMIC FORCE MICROSCOPY

ATOMIC FORCE MICROSCOPY ATOMIC FORCE MICROSCOPY Introduction The atomic force microscope, or AFM, is a member of the family of instruments known as scanning probe microscopes. The AFM operates under a completely different principle

More information

Lecture 4 Scanning Probe Microscopy (SPM)

Lecture 4 Scanning Probe Microscopy (SPM) Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric

More information

Microscopy. MICROSCOPY Light Electron Tunnelling Atomic Force RESOLVE: => INCREASE CONTRAST BIODIVERSITY I BIOL1051 MAJOR FUNCTIONS OF MICROSCOPES

Microscopy. MICROSCOPY Light Electron Tunnelling Atomic Force RESOLVE: => INCREASE CONTRAST BIODIVERSITY I BIOL1051 MAJOR FUNCTIONS OF MICROSCOPES BIODIVERSITY I BIOL1051 Microscopy Professor Marc C. Lavoie marc.lavoie@cavehill.uwi.edu MAJOR FUNCTIONS OF MICROSCOPES MAGNIFY RESOLVE: => INCREASE CONTRAST Microscopy 1. Eyepieces 2. Diopter adjustment

More information

Atomic Force Microscopy. July, 2011 R. C. Decker and S. Qazi

Atomic Force Microscopy. July, 2011 R. C. Decker and S. Qazi Atomic Force Microscopy July, 2011 R. C. Decker and S. Qazi Learning through Visualization Visualization of physical phenomena can confirm hypothesis Observation provides opportunities for study without

More information

STM and AFM Tutorial. Katie Mitchell January 20, 2010

STM and AFM Tutorial. Katie Mitchell January 20, 2010 STM and AFM Tutorial Katie Mitchell January 20, 2010 Overview Scanning Probe Microscopes Scanning Tunneling Microscopy (STM) Atomic Force Microscopy (AFM) Contact AFM Non-contact AFM RHK UHV350 AFM/STM

More information

Basic principles and mechanisms of NSOM; Different scanning modes and systems of NSOM; General applications and advantages of NSOM.

Basic principles and mechanisms of NSOM; Different scanning modes and systems of NSOM; General applications and advantages of NSOM. Lecture 16: Near-field Scanning Optical Microscopy (NSOM) Background of NSOM; Basic principles and mechanisms of NSOM; Basic components of a NSOM; Different scanning modes and systems of NSOM; General

More information

It has long been a goal to achieve higher spatial resolution in optical imaging and

It has long been a goal to achieve higher spatial resolution in optical imaging and Nano-optical Imaging using Scattering Scanning Near-field Optical Microscopy Fehmi Yasin, Advisor: Dr. Markus Raschke, Post-doc: Dr. Gregory Andreev, Graduate Student: Benjamin Pollard Department of Physics,

More information

Scanning Probe Microscopy

Scanning Probe Microscopy Ernst Meyer Hans Josef Hug Roland Bennewitz Scanning Probe Microscopy The Lab on a Tip With 117 Figures Mß Springer Contents 1 Introduction to Scanning Probe Microscopy f f.1 Overview 2 f.2 Basic Concepts

More information

Microscopie à force atomique: Le mode noncontact

Microscopie à force atomique: Le mode noncontact Microscopie à force atomique: Le mode noncontact Clemens Barth barth@crmcn.univ-mrs.fr CRMCN-CNRS, Campus de Lumny, Case 913, 13288 Marseille Cedex09, France La Londe les Maures (France) -- 20-21/03/2007

More information

- particle with kinetic energy E strikes a barrier with height U 0 > E and width L. - classically the particle cannot overcome the barrier

- particle with kinetic energy E strikes a barrier with height U 0 > E and width L. - classically the particle cannot overcome the barrier Tunnel Effect: - particle with kinetic energy E strikes a barrier with height U 0 > E and width L - classically the particle cannot overcome the barrier - quantum mechanically the particle can penetrated

More information

Counting and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM)

Counting and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Counting and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor of Environmental Engineering Department of Civil and Environmental

More information

Atomic Force Microscope

Atomic Force Microscope Atomic Force Microscope (Veeco Nanoman) User Manual Basic Operation 4 th Edition Aug 2012 NR System Startup If the system is currently ON To start the NanoScope software, double-click the NanoScope startup

More information

Atomic Force Microscope and Magnetic Force Microscope Background Information

Atomic Force Microscope and Magnetic Force Microscope Background Information Atomic Force Microscope and Magnetic Force Microscope Background Information Lego Building Instructions There are several places to find the building instructions for building the Lego models of atomic

More information

CSCI 4974 / 6974 Hardware Reverse Engineering. Lecture 8: Microscopy and Imaging

CSCI 4974 / 6974 Hardware Reverse Engineering. Lecture 8: Microscopy and Imaging CSCI 4974 / 6974 Hardware Reverse Engineering Lecture 8: Microscopy and Imaging Data Acquisition for RE Microscopy Imaging Registration and stitching Microscopy Optical Electron Scanning Transmission Scanning

More information

Nano-Microscopy: Lecture 1. Pavel Zinin HIGP, University of Hawaii, Honolulu, USA

Nano-Microscopy: Lecture 1. Pavel Zinin HIGP, University of Hawaii, Honolulu, USA GG 711: Advanced Techniques in Geophysics and Materials Science Nano-Microscopy: Lecture 1 Scanning Tunneling and Atomic Force Microscopies Principles Pavel Zinin HIGP, University of Hawaii, Honolulu,

More information

h e l p s y o u C O N T R O L

h e l p s y o u C O N T R O L contamination analysis for compound semiconductors ANALYTICAL SERVICES B u r i e d d e f e c t s, E v a n s A n a l y t i c a l g r o u p h e l p s y o u C O N T R O L C O N T A M I N A T I O N Contamination

More information

(Nano)materials characterization

(Nano)materials characterization (Nano)materials characterization MTX9100 Nanomaterials Lecture 8 OUTLINE 1 -What SEM and AFM are good for? - What is the Atomic Force Microscopes Contribution to Nanotechnology? - What is Spectroscopy?

More information

Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications

Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications Saulius Marcinkevičius Optics, ICT, KTH 1 Outline Optical near field. Principle of scanning near field optical microscope

More information

Sensors & Instruments for station. returned samples. Chun Chia Tan

Sensors & Instruments for station. returned samples. Chun Chia Tan Sensors & Instruments for station based materials characterization of returned samples Chun Chia Tan 04/01/2009 Outline Introduction to materials characterization General overview of the equipment used

More information

Atomic Force Microscope Physics Assignment

Atomic Force Microscope Physics Assignment Atomic Force Microscope Physics Assignment Group Members: İbrahim Mert DARICI Syed Arslan Afzal HASHMI Ali ZAREI Sudhakar Murthy MOLLI Materials Processing 2006 PHYSICS ASSIGNMENT 1 Content 1 Introduction...

More information

ATOMIC FORCEMICROSCOPYASTOOL INCELLBIOLOGICAL RESEARCH FORGROUNDBASEDANDIN-FLIGHTSTUDIES

ATOMIC FORCEMICROSCOPYASTOOL INCELLBIOLOGICAL RESEARCH FORGROUNDBASEDANDIN-FLIGHTSTUDIES ATOMIC FORCEMICROSCOPYASTOOL INCELLBIOLOGICAL RESEARCH FORGROUNDBASEDANDIN-FLIGHTSTUDIES J.J.W.A vanloon DutchExperimentSupportCenter(DESC),Dept.OralBiology,ACTA- VrijeUniversiteit,Amsterdam,TheNetherlands.

More information

CREOL, College of Optics & Photonics, University of Central Florida

CREOL, College of Optics & Photonics, University of Central Florida OSE6650 - Optical Properties of Nanostructured Materials Optical Properties of Nanostructured Materials Fall 2013 Class 3 slide 1 Challenge: excite and detect the near field Thus far: Nanostructured materials

More information

Near-field scanning optical microscopy (SNOM)

Near-field scanning optical microscopy (SNOM) Adviser: dr. Maja Remškar Institut Jožef Stefan January 2010 1 2 3 4 5 6 Fluorescence Raman and surface enhanced Raman 7 Conventional optical microscopy-limited resolution Two broad classes of techniques

More information

Tecniche a scansione di sonda per nanoscopia e nanomanipolazione: STM, AFM e derivati

Tecniche a scansione di sonda per nanoscopia e nanomanipolazione: STM, AFM e derivati LS Scienza dei Materiali - a.a. 2006/07 Fisica delle Nanotecnologie part 5.1 Version 5a, Nov 2006 Francesco Fuso, tel 0502214305, 0502214293 - fuso@df.unipi.it http://www.df.unipi.it/~fuso/dida Tecniche

More information

Atomic Force Microscopy Observation and Characterization of a CD Stamper, Lycopodium Spores, and Step-Height Standard Diffraction Grating

Atomic Force Microscopy Observation and Characterization of a CD Stamper, Lycopodium Spores, and Step-Height Standard Diffraction Grating Atomic Force Microscopy Observation and Characterization of a CD Stamper, Lycopodium Spores, and Step-Height Standard Diffraction Grating Michael McMearty and Frit Miot Special Thanks to Brendan Cross

More information

Use the BET (after Brunauer, Emmett and Teller) equation is used to give specific surface area from the adsorption

Use the BET (after Brunauer, Emmett and Teller) equation is used to give specific surface area from the adsorption Number of moles of N 2 in 0.129dm 3 = 0.129/22.4 = 5.76 X 10-3 moles of N 2 gas Module 8 : Surface Chemistry Objectives Lecture 37 : Surface Characterization Techniques After studying this lecture, you

More information

How To Image A Magnetic Microscope

How To Image A Magnetic Microscope Agustina Asenjo Dpto. Propiedades Opticas, Magnéticas y de Transporte Instituto de Ciencia de Materiales de Madrid- CSIC Introducción: Esquema MFM frente a otras técnicas de observación de dominios. Fundamentos

More information

5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy

5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy 5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy Resolution of optical microscope is limited by diffraction. Light going through an aperture makes diffraction

More information

NEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH STM AND AFM PROBES

NEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH STM AND AFM PROBES Vol. 93 (1997) A CTA PHYSICA POLONICA A No. 2 Proceedings of the 1st International Symposium on Scanning Probe Spectroscopy and Related Methods, Poznań 1997 NEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY

More information

The Basics of Scanning Electron Microscopy

The Basics of Scanning Electron Microscopy The Basics of Scanning Electron Microscopy The small scanning electron microscope is easy to use because almost every variable is pre-set: the acceleration voltage is always 15kV, it has only a single

More information

Keysight Technologies How to Choose your MAC Lever. Technical Overview

Keysight Technologies How to Choose your MAC Lever. Technical Overview Keysight Technologies How to Choose your MAC Lever Technical Overview Introduction Atomic force microscopy (AFM) is a sub-nanometer scale imaging and measurement tool that can be used to determine a sample

More information

Physics 441/2: Transmission Electron Microscope

Physics 441/2: Transmission Electron Microscope Physics 441/2: Transmission Electron Microscope Introduction In this experiment we will explore the use of transmission electron microscopy (TEM) to take us into the world of ultrasmall structures. This

More information

Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry Secondary Ion Mass Spectrometry A PRACTICAL HANDBOOK FOR DEPTH PROFILING AND BULK IMPURITY ANALYSIS R. G. Wilson Hughes Research Laboratories Malibu, California F. A. Stevie AT&T Bell Laboratories Allentown,

More information

Nano-Spectroscopy. Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale

Nano-Spectroscopy. Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale Nano-Spectroscopy Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale Since its introduction in the early 80 s, Scanning Probe Microscopy (SPM) has quickly made nanoscale imaging an affordable

More information

Surface Profilometry as a tool to Measure Thin Film Stress, A Practical Approach. Gianni Franceschinis, RIT MicroE Graduate Student

Surface Profilometry as a tool to Measure Thin Film Stress, A Practical Approach. Gianni Franceschinis, RIT MicroE Graduate Student 1 Surface Profilometry as a tool to Measure Thin Film Stress, A Practical Approach. Gianni Franceschinis, RIT MicroE Graduate Student Abstract-- As the film decreases in thickness the requirements of more

More information

Scanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale

Scanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale Scanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale Outline Background Research Design Detection of Near-Field Signal Submonolayer Chemical Sensitivity Conclusions

More information

USING CDs AND DVDs AS DIFFRACTION GRATINGS

USING CDs AND DVDs AS DIFFRACTION GRATINGS USING CDs AND DVDs AS DIFFRACTION GRATINGS Rama Balachandran Riverwood High School Atlanta, GA Karen Porter-Davis Chamblee Charter High School Chamblee, GA Copyright Georgia Institute of Technology 2009

More information

BNG 331 Cell-Tissue Material Interactions. Biomaterial Surfaces

BNG 331 Cell-Tissue Material Interactions. Biomaterial Surfaces BNG 331 Cell-Tissue Material Interactions Biomaterial Surfaces Course update Updated syllabus Homework 4 due today LBL 5 Friday Schedule for today: Chapter 8 Biomaterial surface characterization Surface

More information

UNIVERSITY OF SOUTHAMPTON. Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices.

UNIVERSITY OF SOUTHAMPTON. Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices. UNIVERSITY OF SOUTHAMPTON Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices. Christopher Wyndham John Hillman Submitted for the degree of Doctor of Philosophy

More information

Multi-mode Atomic Force Microscope (with High Voltage Piezo Force Microscope and +/- 8000 Oe Variable Field module.)

Multi-mode Atomic Force Microscope (with High Voltage Piezo Force Microscope and +/- 8000 Oe Variable Field module.) Multi-mode Atomic Force Microscope (with High Voltage Piezo Force Microscope and +/- 8000 Oe Variable Field module.) Main specifications of the proposed instrument: 1 Instrument Resolution: 1.1 The instrument

More information

Laboratorio Regionale LiCryL CNR-INFM

Laboratorio Regionale LiCryL CNR-INFM Laboratorio Regionale LiCryL CNR-INFM c/o Physics Department - University of Calabria, Ponte P. Bucci, Cubo 33B, 87036 Rende (CS) Italy UNIVERSITÀ DELLA CALABRIA Dipartimento di FISICA Researchers Dr.

More information

Technology White Papers nr. 13 Paul Holister Cristina Román Vas Tim Harper

Technology White Papers nr. 13 Paul Holister Cristina Román Vas Tim Harper QUANTUM DOTS Technology White Papers nr. 13 Paul Holister Cristina Román Vas Tim Harper QUANTUM DOTS Technology White Papers nr. 13 Release Date: Published by Científica Científica, Ltd. www.cientifica.com

More information

Characterizing Quantum Dots and Color Centers in Nanodiamonds as Single Emitters

Characterizing Quantum Dots and Color Centers in Nanodiamonds as Single Emitters University of Rochester OPT253 Lab 3-4 Report Characterizing Quantum Dots and Color Centers in Nanodiamonds as Single Emitters Author: Nicholas Cothard Peter Heuer Professor: Dr. Svetlana Lukishova November

More information

Electron Microscopy 3. SEM. Image formation, detection, resolution, signal to noise ratio, interaction volume, contrasts

Electron Microscopy 3. SEM. Image formation, detection, resolution, signal to noise ratio, interaction volume, contrasts Electron Microscopy 3. SEM Image formation, detection, resolution, signal to noise ratio, interaction volume, contrasts 3-1 SEM is easy! Just focus and shoot "Photo"!!! Please comment this picture... Any

More information

ATOMIC FORCE MICROSOPY ON SEMICONDUCTOR QUANTUM-DOT STRUCTURES FOR USE WITH QUANTUM INFORMATION PROCESSING

ATOMIC FORCE MICROSOPY ON SEMICONDUCTOR QUANTUM-DOT STRUCTURES FOR USE WITH QUANTUM INFORMATION PROCESSING ATOMIC FORCE MICROSOPY ON SEMICONDUCTOR QUANTUM-DOT STRUCTURES FOR USE WITH QUANTUM INFORMATION PROCESSING Stanton P. Harwood University of Oklahoma, Norman SPUR 2005 We explore the foundation of an exciting

More information

Fast-scanning near-field scanning optical microscopy. using a high-frequency dithering probe

Fast-scanning near-field scanning optical microscopy. using a high-frequency dithering probe Fast-scanning near-field scanning optical microscopy using a high-frequency dithering probe Yongho Seo and Wonho Jhe * Center for Near-field Atom-photon Technology and School of Physics, Seoul National

More information

Mechanical and electrical investigations of thin polymer films by variabletemperature force microscopy

Mechanical and electrical investigations of thin polymer films by variabletemperature force microscopy Mechanical and electrical investigations of thin polymer films by variabletemperature force microscopy Dissertation zur Erlangung des Doktorgrades Dr. rer. nat. der Fakultät für Naturwissenschaften der

More information

FRT - setting the standard

FRT - setting the standard FRT - setting the standard Surface Analysis Metrology Instruments Process Control Chromatic white light sensor Weißlicht Specs: Linse blauer Fokus roter Fokus max height range 300 µm 600 µm 3 mm 10 mm

More information

Characterization of surfaces by AFM topographical, mechanical and chemical properties

Characterization of surfaces by AFM topographical, mechanical and chemical properties Characterization of surfaces by AFM topographical, mechanical and chemical properties Jouko Peltonen Department of physical chemistry Åbo Akademi University Atomic Force Microscopy (AFM) Contact mode AFM

More information

Calibration of AFM with virtual standards; robust, versatile and accurate. Richard Koops VSL Dutch Metrology Institute Delft

Calibration of AFM with virtual standards; robust, versatile and accurate. Richard Koops VSL Dutch Metrology Institute Delft Calibration of AFM with virtual standards; robust, versatile and accurate Richard Koops VSL Dutch Metrology Institute Delft 19-11-2015 VSL Dutch Metrology Institute VSL is the national metrology institute

More information

ME 472 Engineering Metrology

ME 472 Engineering Metrology ME 472 Engineering Metrology and Quality Control Chp 6 - Advanced Measurement Systems Mechanical Engineering University of Gaziantep Dr. A. Tolga Bozdana Assistant Professor Coordinate Measuring Machines

More information

High flexibility of DNA on short length scales probed by atomic force microscopy

High flexibility of DNA on short length scales probed by atomic force microscopy High flexibility of DNA on short length scales probed by atomic force microscopy Wiggins P. A. et al. Nature Nanotechnology (2006) presented by Anja Schwäger 23.01.2008 Outline Theory/Background Elasticity

More information

DOE Solar Energy Technologies Program Peer Review. Denver, Colorado April 17-19, 2007

DOE Solar Energy Technologies Program Peer Review. Denver, Colorado April 17-19, 2007 DOE Solar Energy Technologies Program Peer Review Evaluation of Nanocrystalline Silicon Thin Film by Near-Field Scanning Optical Microscopy AAT-2-31605-05 Magnus Wagener and George Rozgonyi North Carolina

More information

SPM 150 Aarhus with KolibriSensor

SPM 150 Aarhus with KolibriSensor Customied Systems and Solutions Nanostructures and Thin Film Deposition Surface Analysis and Preparation Components Surface Science Applications SPM 150 Aarhus with KolibriSensor Atomic resolution NC-AFM

More information

Microscope Lab Introduction to the Microscope Lab Activity

Microscope Lab Introduction to the Microscope Lab Activity Microscope Lab Introduction to the Microscope Lab Activity Wendy Kim 3B 24 Sep 2010 http://www.mainsgate.com/spacebio/modules/gs_resource/ CellDivisionMetaphase.jpeg 1 Introduction Microscope is a tool

More information

Preface Light Microscopy X-ray Diffraction Methods

Preface Light Microscopy X-ray Diffraction Methods Preface xi 1 Light Microscopy 1 1.1 Optical Principles 1 1.1.1 Image Formation 1 1.1.2 Resolution 3 1.1.3 Depth of Field 5 1.1.4 Aberrations 6 1.2 Instrumentation 8 1.2.1 Illumination System 9 1.2.2 Objective

More information

P R E A M B L E. Facilitated workshop problems for class discussion (1.5 hours)

P R E A M B L E. Facilitated workshop problems for class discussion (1.5 hours) INSURANCE SCAM OPTICS - LABORATORY INVESTIGATION P R E A M B L E The original form of the problem is an Experimental Group Research Project, undertaken by students organised into small groups working as

More information

AFM (Atomic Force Microscope) Instructions

AFM (Atomic Force Microscope) Instructions AFM (Atomic Force Microscope) Instructions Contact Mode AFM Advantages: High scan speeds (throughput) Contact mode AFM is the only AFM technique, which can obtain "atomic resolution" images. Rough samples

More information

Microscopic Techniques

Microscopic Techniques Microscopic Techniques Outline 1. Optical microscopy Conventional light microscopy, Fluorescence microscopy, confocal/multiphoton microscopy and Stimulated emission depletion microscopy 2. Scanning probe

More information

Chapter 4. Microscopy, Staining, and Classification. Lecture prepared by Mindy Miller-Kittrell North Carolina State University

Chapter 4. Microscopy, Staining, and Classification. Lecture prepared by Mindy Miller-Kittrell North Carolina State University Chapter 4 Microscopy, Staining, and Classification 2012 Pearson Education Inc. Lecture prepared by Mindy Miller-Kittrell North Carolina State University Microscopy and Staining 2012 Pearson Education Inc.

More information

Microscopie à champs proche: et application

Microscopie à champs proche: et application Microscopie à champs proche: Théorie et application STM, effet tunnel et applications AFM, interactions et applications im2np, Giens 2010 Optical microscopy: resolution limit resolution limit: d min =

More information

Spin-flip excitation spectroscopy with STM excitation of allowed transition adds an inelastic contribution (group of Andreas Heinrich, IBM Almaden)

Spin-flip excitation spectroscopy with STM excitation of allowed transition adds an inelastic contribution (group of Andreas Heinrich, IBM Almaden) Magnetism at the atomic scale by Scanning Probe Techniques Kirsten von Bergmann Institute of Applied Physics Magnetism with SPM Spin-polarized scanning tunneling microscopy SP-STM density of states of

More information

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Reflection Electron Microscopy and Spectroscopy for Surface Analysis Reflection Electron Microscopy and Spectroscopy for Surface Analysis by Zhong Lin Wang 1 Introduction In 1986, E. Ruska was awarded the Nobel Physics Prize for his pioneering work of building the world's

More information

Modification of Graphene Films by Laser-Generated High Energy Particles

Modification of Graphene Films by Laser-Generated High Energy Particles Modification of Graphene Films by Laser-Generated High Energy Particles Elena Stolyarova (Polyakova), Ph.D. ATF Program Advisory and ATF Users Meeting April 2-3, 2009, Berkner Hall, Room B, BNL Department

More information

Pulsed laser deposition of organic materials

Pulsed laser deposition of organic materials Pulsed laser deposition of organic materials PhD theses Gabriella Kecskeméti Department of Optics and Quantum Electronics University of Szeged Supervisor: Dr. Béla Hopp senior research fellow Department

More information

Scanning probe microscopy AFM, STM. Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication

Scanning probe microscopy AFM, STM. Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication Scanning probe microscopy AFM, STM Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication Scanning Probe Microscopy 1986 Binning and Rohrer shared Nobel Prize in Physics for invention.stm

More information

Ion Beam Sputtering: Practical Applications to Electron Microscopy

Ion Beam Sputtering: Practical Applications to Electron Microscopy Ion Beam Sputtering: Practical Applications to Electron Microscopy Applications Laboratory Report Introduction Electron microscope specimens, both scanning (SEM) and transmission (TEM), often require a

More information

Microscopy: Principles and Advances

Microscopy: Principles and Advances Microscopy: Principles and Advances Chandrashekhar V. Kulkarni University of Central Lancashire, Preston, United kingdom May, 2014 University of Ljubljana Academic Background 2005-2008: PhD-Chemical Biology

More information

Electron Microscopy SEM and TEM

Electron Microscopy SEM and TEM Electron Microscopy SEM and TEM Content 1. Introduction: Motivation for electron microscopy 2. Interaction with matter 3. SEM: Scanning Electron Microscopy 3.1 Functional Principle 3.2 Examples 3.3 EDX

More information

1. Photon Beam Damage and Charging at Solid Surfaces John H. Thomas III

1. Photon Beam Damage and Charging at Solid Surfaces John H. Thomas III 1. Photon Beam Damage and Charging at Solid Surfaces John H. Thomas III 1. Introduction............................. 2. Electrostatic Charging of Samples in Photoemission Experiments............................

More information

SILA Sistema Integrato di Laboratori per l Ambiente. CENTRE FOR MICROSCOPY AND MICROANALYSIS Scientific coordinator: Prof.ssa Rosanna De Rosa

SILA Sistema Integrato di Laboratori per l Ambiente. CENTRE FOR MICROSCOPY AND MICROANALYSIS Scientific coordinator: Prof.ssa Rosanna De Rosa CENTRE FOR MICROSCOPY AND MICROANALYSIS Scientific coordinator: Prof.ssa Rosanna De Rosa 0 The Centre for Microscopy and Microanalysis (CM2) is an interdisciplinary service centre, a comprehensive suite

More information

A METHOD OF PRECISE CALIBRATION FOR PIEZOELECTRICAL ACTUATORS

A METHOD OF PRECISE CALIBRATION FOR PIEZOELECTRICAL ACTUATORS Uludağ Üniversitesi Mühendislik-Mimarlık Fakültesi Dergisi, Cilt 9, Sayı, 24 A METHOD OF PRECISE CALIBRATION FOR PIEZOELECTRICAL ACTUATORS Timur CANEL * Yüksel BEKTÖRE ** Abstract: Piezoelectrical actuators

More information

Surface Analysis with STM and AFM

Surface Analysis with STM and AFM Sergei N. Magonov, Myung-Hwan Whangbo Surface Analysis with STM and AFM Experimental and Theoretical Aspects of Image Analysis VCH Weinheim New York Basel Cambridge Tokyo Preface V 1 Introduction 1 1.1

More information

Modern Construction Materials Prof. Ravindra Gettu Department of Civil Engineering Indian Institute of Technology, Madras

Modern Construction Materials Prof. Ravindra Gettu Department of Civil Engineering Indian Institute of Technology, Madras Modern Construction Materials Prof. Ravindra Gettu Department of Civil Engineering Indian Institute of Technology, Madras Module - 2 Lecture - 2 Part 2 of 2 Review of Atomic Bonding II We will continue

More information

CS257 Introduction to Nanocomputing

CS257 Introduction to Nanocomputing CS257 Introduction to Nanocomputing Overview of Crossbar-Based Computing John E Savage Overview Intro to NW growth methods Chemical vapor deposition and fluidic assembly Nano imprinting Nano stamping Four

More information

SCANNING PROBE MICROSCOPY NANOS-E3 SCHOOL 29/09/2015 An introduction to surface microscopy probes

SCANNING PROBE MICROSCOPY NANOS-E3 SCHOOL 29/09/2015 An introduction to surface microscopy probes SCANNING PROBE MICROSCOPY NANOS-E3 SCHOOL 29/09/2015 An introduction to surface microscopy probes SPM is ubiquitous in modern research Physics Nanotechnology/chemistry Nature Nanotechnology 10, 156 160

More information

X-ray diffraction techniques for thin films

X-ray diffraction techniques for thin films X-ray diffraction techniques for thin films Rigaku Corporation Application Laboratory Takayuki Konya 1 Today s contents (PM) Introduction X-ray diffraction method Out-of-Plane In-Plane Pole figure Reciprocal

More information

BIOACTIVE COATINGS ON 316L STAINLESS STEEL IMPLANTS

BIOACTIVE COATINGS ON 316L STAINLESS STEEL IMPLANTS Trends Biomater. Artif. Organs. Vol. 17(2) pp 43-47 (2004) http//www.sbaoi.org BIOACTIVE COATINGS ON 316L STAINLESS STEEL IMPLANTS N. Ramesh Babu*,+, Sushant Manwatkar*, K. Prasada Rao* and T. S. Sampath

More information

Mass production, R&D Failure analysis. Fault site pin-pointing (EM, OBIRCH, FIB, etc. ) Bottleneck Physical science analysis (SEM, TEM, Auger, etc.

Mass production, R&D Failure analysis. Fault site pin-pointing (EM, OBIRCH, FIB, etc. ) Bottleneck Physical science analysis (SEM, TEM, Auger, etc. Failure Analysis System for Submicron Semiconductor Devices 68 Failure Analysis System for Submicron Semiconductor Devices Munetoshi Fukui Yasuhiro Mitsui, Ph. D. Yasuhiko Nara Fumiko Yano, Ph. D. Takashi

More information

Atomic Force Microscopy ISC-CNR

Atomic Force Microscopy ISC-CNR Atomic Force Microscopy ISC-CNR ICS-CNRCNR Bruno Tiribilli bruno.tiribilli@isc.cnr.it Imaging on Biological samples Thin section of tissue Protein aggregates Force measurement Cells elasticity Protein

More information

Fiber Optics: Engineering from Global to Nanometer Dimensions

Fiber Optics: Engineering from Global to Nanometer Dimensions Fiber Optics: Engineering from Global to Nanometer Dimensions Prof. Craig Armiento Fall 2003 1 Optical Fiber Communications What is it? Transmission of information using light over an optical fiber Why

More information

History of the Atom & Atomic Theory

History of the Atom & Atomic Theory Chapter 5 History of the Atom & Atomic Theory You re invited to a Thinking Inside the Box Conference Each group should nominate a: o Leader o Writer o Presenter You have 5 minutes to come up with observations

More information

INTRODUCTION TO SCANNING TUNNELING MICROSCOPY

INTRODUCTION TO SCANNING TUNNELING MICROSCOPY INTRODUCTION TO SCANNING TUNNELING MICROSCOPY SECOND EDITION C. JULIAN CHEN Department of Applied Physics and Applied Mathematics, Columbia University, New York OXJORD UNIVERSITY PRESS Contents Preface

More information

MISCIBILITY AND INTERACTIONS IN CHITOSAN AND POLYACRYLAMIDE MIXTURES

MISCIBILITY AND INTERACTIONS IN CHITOSAN AND POLYACRYLAMIDE MIXTURES MISCIBILITY AND INTERACTIONS IN CHITOSAN AND POLYACRYLAMIDE MIXTURES Katarzyna Lewandowska Faculty of Chemistry Nicolaus Copernicus University, ul. Gagarina 7, 87-100 Toruń, Poland e-mail: reol@chem.umk.pl

More information

How To Perform Raman Spectroscopy

How To Perform Raman Spectroscopy Spettroscopia Raman in campo prossimo Salvatore Patanè (1) and Pietro G. Gucciardi (2) (1) Dip. di Fisica della Materia e Tecnologie Fisiche Avanzate, Università di Messina, Salita Sperone 31, 98166 Messina,

More information

The microscope is an important tool.

The microscope is an important tool. KEY CONCEPT Microscopes allow us to see inside the cell. BEFORE, you learned Some organisms are unicellular and some are multicellular A microscope is necessary to study most cells The cell theory describes

More information

WORK DONE BY A CONSTANT FORCE

WORK DONE BY A CONSTANT FORCE WORK DONE BY A CONSTANT FORCE The definition of work, W, when a constant force (F) is in the direction of displacement (d) is W = Fd SI unit is the Newton-meter (Nm) = Joule, J If you exert a force of

More information

Surface Treatment of Titanium

Surface Treatment of Titanium Surface Treatment of Titanium Christiane Jung KKS Ultraschall AG, Steinen SZ The Tribology of Precision Swiss Tribology Meeting SBB Centre Löwenberg in Murten, Switzerland 16. November 2007 1 Outline:

More information

CHAPTER 3: DIGITAL IMAGING IN DIAGNOSTIC RADIOLOGY. 3.1 Basic Concepts of Digital Imaging

CHAPTER 3: DIGITAL IMAGING IN DIAGNOSTIC RADIOLOGY. 3.1 Basic Concepts of Digital Imaging Physics of Medical X-Ray Imaging (1) Chapter 3 CHAPTER 3: DIGITAL IMAGING IN DIAGNOSTIC RADIOLOGY 3.1 Basic Concepts of Digital Imaging Unlike conventional radiography that generates images on film through

More information

Volumes. Goal: Drive optical to high volumes and low costs

Volumes. Goal: Drive optical to high volumes and low costs First Electrically Pumped Hybrid Silicon Laser Sept 18 th 2006 The information in this presentation is under embargo until 9/18/06 10:00 AM PST 1 Agenda Dr. Mario Paniccia Director, Photonics Technology

More information

Review of Scientific Paper Contact Electrification Using Force Microcopy

Review of Scientific Paper Contact Electrification Using Force Microcopy Volume 1 Number 1 1 Review of Scientific Paper Contact Electrification Using Force Microcopy Joel-Anthony Gray, B.S.E.E. Nanoscience Minor - University of Texas at Dallas. Abstract Charge exchange is a

More information

Looking for the Origin of Power Laws in Electric Field Assisted Tunneling

Looking for the Origin of Power Laws in Electric Field Assisted Tunneling Looking for the Origin of Power Laws in Electric Field Assisted Tunneling H. Cabrera, D.A. Zanin, L.G. De Pietro, A. Vindigni, U. Ramsperger and D. Pescia Laboratory for Solid State Physics, ETH Zurich

More information

Laboratory #3 Guide: Optical and Electrical Properties of Transparent Conductors -- September 23, 2014

Laboratory #3 Guide: Optical and Electrical Properties of Transparent Conductors -- September 23, 2014 Laboratory #3 Guide: Optical and Electrical Properties of Transparent Conductors -- September 23, 2014 Introduction Following our previous lab exercises, you now have the skills and understanding to control

More information