SZNUP2201MR6T1G SZNUP2201MR6. Transient Voltage Suppressors. ESD Protection Diodes with Low Clamping Voltage



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NUP0MR, SZNUP0MR Transient Voltage Suppressors ESD Protection Diodes with Low Clamping Voltage The NUP0MR transient voltage suppressor is designed to protect high speed data lines from ESD, EFT, and lightning. Features Low Clamping Voltage Stand Off Voltage: 5 V Low Leakage Protection for the Following IEC Standards: IEC 000 Level ESD Protection UL Flammability Rating of 9 V 0 SZ Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC Q0 Qualified and PPAP Capable These Devices are Pb Free and are RoHS Compliant Typical Applications High Speed Communication Line Protection USB. and.0 Power and Data Line Protection Digital Video Interface (DVI) Monitors and Flat Panel Displays MAXIMUM RATINGS (T J = 5 C unless otherwise noted) Rating Symbol Value Unit Peak Power Dissipation 8 x 0 S @ T A = 5 C (Note ) P pk 500 W Operating Junction Temperature Range T J 0 to +5 C Storage Temperature Range T stg 55 to +50 C Lead Solder Temperature Maximum (0 Seconds) Human Body Model (HBM) Machine Model (MM) IEC 000 Air (ESD) IEC 000 Contact (ESD) T L 35 C ESD 000 00 0000 0000 IEC 000 (5/50 ns) EFT 0 A Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.. Non repetitive current pulse per Figure 5 (Pin 5 to Pin ) See Application Note AND8308/D for further description of survivability specs. V TSOP LOW CAPACITANCE DIODE TVS ARRAY 500 WATTS PEAK POWER VOLTS ORDERING INFORMATION Device Package Shipping NUP0MRTG PIN CONFIGURATION AND SCHEMATIC I/O V N N/C 3 SZNUP0MRTG TSOP CASE 38G TSOP (Pb Free) TSOP (Pb Free) I/O 5 V P MARKING DIAGRAM M N/C = Specific Device Code M = Date Code = Pb Free Package (Note: Microdot may be in either location) 3000 / Tape & Reel 3000 / Tape & Reel For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD80/D. Semiconductor Components Industries, LLC, 03 February, 03 Rev. Publication Order Number: NUP0MR/D

NUP0MR, SZNUP0MR ELECTRICAL CHARACTERISTICS (T A = 5 C unless otherwise noted) Symbol I PP Parameter Maximum Reverse Peak Pulse Current I F I V C Clamping Voltage @ I PP V RWM I R Working Peak Reverse Voltage Maximum Reverse Leakage Current @ V RWM V RWM V C V BR I R I T V F V V BR Breakdown Voltage @ I T I T Test Current I F Forward Current I PP V F Forward Voltage @ I F P pk Peak Power Dissipation C Capacitance @ V R = 0 and f =.0 MHz *See Application Note AND8308/D for detailed explanations of datasheet parameters. Uni Directional TVS ELECTRICAL CHARACTERISTICS (T J =5 C unless otherwise specified) Parameter Symbol Conditions Min Typ Max Unit Reverse Working Voltage V RWM (Note ) 5.0 V Breakdown Voltage V BR I T = ma, (Note 3).0 V Reverse Leakage Current I R V RWM = 5 V 5.0 A Clamping Voltage V C I PP = 5 A (Note ).5 V Clamping Voltage V C I PP = 8 A (Note ) 0 V Maximum Peak Pulse Current I PP 8x0 s Waveform (Note ) 5 A Junction Capacitance C J V R = 0 V, f= MHz between I/O Pins and GND 3.0 5.0 pf Junction Capacitance C J V R = 0 V, f= MHz between I/O Pins.5 3.0 pf Clamping Voltage V C Per IEC 000 (Note ) Figure and V. TVS devices are normally selected according to the working peak reverse voltage (V RWM ), which should be equal or greater than the DC or continuous peak operating voltage level. 3. V BR is measured at pulse test current I T.. Non repetitive current pulse per Figure 5 (Pin 5 to Pin ) 5. Surge current waveform per Figure 5.. For test procedure see Figures 3 and and Application Note AND8307/D. Figure. ESD Clamping Voltage Screenshot Positive 8 kv Contact per IEC000 Figure. ESD Clamping Voltage Screenshot Negative 8 kv Contact per IEC000

NUP0MR, SZNUP0MR IEC 000 Spec. Level Test Voltage (kv) First Peak Current (A) Current at 30 ns (A) Current at 0 ns (A) 7.5 5 8 3.5 8 30 8 IEC000 Waveform I peak 00% 90% I @ 30 ns I @ 0 ns 0% t P = 0.7 ns to ns ESD Gun TVS Figure 3. IEC000 Spec Oscilloscope 50 Cable 50 The following is taken from Application Note AND8308/D Interpretation of Datasheet Parameters for ESD Devices. ESD Voltage Clamping For sensitive circuit elements it is important to limit the voltage that an IC will be exposed to during an ESD event to as low a voltage as possible. The ESD clamping voltage is the voltage drop across the ESD protection diode during an ESD event per the IEC000 waveform. Since the IEC000 was written as a pass/fail spec for larger % OF PEAK PULSE CURRENT 00 90 80 70 0 50 0 30 0 Figure. Diagram of ESD Test Setup t r t P PEAK VALUE I RSM @ 8 s 0 0 0 0 0 0 80 t, TIME ( s) Figure 5. 8 X 0 s Pulse Waveform systems such as cell phones or laptop computers it is not clearly defined in the spec how to specify a clamping voltage at the device level. ON Semiconductor has developed a way to examine the entire voltage waveform across the ESD protection diode over the time domain of an ESD pulse in the form of an oscilloscope screenshot, which can be found on the datasheets for all ESD protection diodes. For more information on how ON Semiconductor creates these screenshots and how to interpret them please refer to AND8307/D. PULSE WIDTH (t P ) IS DEFINED AS THAT POINT WHERE THE PEAK CURRENT DECAY = 8 s HALF VALUE I RSM / @ 0 s 3

NUP0MR, SZNUP0MR TYPICAL PERFORMANCE CURVES (T J = 5 C unless otherwise noted) PEAK POWER DISSIPATION (%) 00 90 80 70 0 50 0 30 0 0 0 0 5 50 75 00 5 50 75 00 T A, AMBIENT TEMPERATURE ( C) Figure. Pulse Derating Curve 5.0 0 JUNCTION CAPACITANCE (pf).5.0 3.5 3.0.5.0.5.0 0.5 I/O Ground I/O lines CLAMPING VOLTAGE (V) 8 0 8 0.0 0 3 5 V BR, REVERSE VOLTAGE (V) Figure 7. Junction Capacitance vs Reverse Voltage 0 0 0 0 30 0 50 PEAK PULSE CURRENT (A) Figure 8. Clamping Voltage vs. Peak Pulse Current (8 x 0 s Waveform)

NUP0MR, SZNUP0MR APPLICATIONS INFORMATION The NUP0MR is a low capacitance TVS diode array designed to protect sensitive electronics such as communications systems, computers, and computer peripherals against damage due to ESD events or transient overvoltage conditions. Because of its low capacitance, it can be used on high speed I/O data lines. The integrated design of the NUP0MR offers surge rated, low capacitance steering diodes and a TVS diode integrated in a single package (TSOP ). If a transient condition occurs, the steering diodes will drive the transient to the positive rail of the power supply or to ground. The TVS device protects the power line against overvoltage conditions to avoid damage to the power supply and any downstream components. NUP0MR Configuration Options The NUP0MR is able to protect two data lines against transient overvoltage conditions by driving them to a fixed reference point for clamping purposes. The steering diodes will be forward biased whenever the voltage on the protected line exceeds the reference voltage (Vf or + Vf). The diodes will force the transient current to bypass the sensitive circuit. Data lines are connected at pins and. The negative reference is connected at pin. This pin must be connected directly to ground by using a ground plane to minimize the PCB s ground inductance. It is very important to reduce the PCB trace lengths as much as possible to minimize parasitic inductance. Option Protection of two data lines and the power supply using as reference. Option Protection of two data lines with bias and power supply isolation resistor. I/O I/O 3 0 k The NUP0MR can be isolated from the power supply by connecting a series resistor between pin 5 and. A 0 k resistor is recommended for this application. This will maintain bias on the internal TVS and steering diodes, reducing their capacitance. Option 3 Protection of two data lines using the internal TVS diode as reference. I/O I/O 3 5 5 NC I/O I/O 5 In applications lacking a positive supply reference or those cases in which a fully isolated power supply is required, the internal TVS can be used as the reference. For these applications, pin 5 is not connected. In this configuration, the steering diodes will conduct whenever the voltage on the protected line exceeds the working voltage of the TVS plus one diode drop (Vc = Vf + V TVS ). 3 For this configuration, connect pin 5 directly to the positive supply rail ( ), the data lines are referenced to the supply voltage. The internal TVS diode prevents overvoltage on the supply rail. Biasing of the steering diodes reduces their capacitance. ESD Protection of Power Supply Lines When using diodes for data line protection, referencing to a supply rail provides advantages. Biasing the diodes reduces their capacitance and minimizes signal distortion. Implementing this topology with discrete devices does have disadvantages. This configuration is shown below: 5

NUP0MR, SZNUP0MR Power Supply Protected Device Data Line D D I ESDneg VF + I ESDneg VF Looking at the figure above, it can be seen that when a positive ESD condition occurs, diode D will be forward biased while diode D will be forward biased when a negative ESD condition occurs. For slower transient conditions, this system may be approximated as follows: For positive pulse conditions: Vc = + Vf D For negative pulse conditions: Vc = Vf D ESD events can have rise times on the order of some number of nanoseconds. Under these conditions, the effect of parasitic inductance must be considered. A pictorial representation of this is shown below. Power Supply Protected Device Data Line D D I ESDneg V C = + Vf + (L diesd/dt) I ESDneg V C = Vf (L diesd/dt) An approximation of the clamping voltage for these fast transients would be: For positive pulse conditions: Vc = + Vf + (L diesd/dt) For negative pulse conditions: Vc = Vf (L diesd/dt) As shown in the formulas, the clamping voltage (Vc) not only depends on the Vf of the steering diodes but also on the L diesd/dt factor. A relatively small trace inductance can result in hundreds of volts appearing on the supply rail. This endangers both the power supply and anything attached to that rail. This highlights the importance of good board layout. Taking care to minimize the effects of parasitic inductance will provide significant benefits in transient immunity. Even with good board layout, some disadvantages are still present when discrete diodes are used to suppress ESD events across datalines and the supply rail. Discrete diodes with good transient power capability will have larger die and therefore higher capacitance. This capacitance becomes problematic as transmission frequencies increase. Reducing capacitance generally requires reducing die size. These small die will have higher forward voltage characteristics at typical ESD transient current levels. This voltage combined with the smaller die can result in device failure. The ON Semiconductor NUP0MR was developed to overcome the disadvantages encountered when using discrete diodes for ESD protection. This device integrates a TVS diode within a network of steering diodes. D D D3 D Figure 9. NUP0MR Equivalent Circuit During an ESD condition, the ESD current will be driven to ground through the TVS diode as shown below. Power Supply Protected Device Data Line 0 D D The resulting clamping voltage on the protected IC will be: Vc = VF + VTVS. The clamping voltage of the TVS diode is provided in Figure 8 and depends on the magnitude of the ESD current. The steering diodes are fast switching devices with unique forward voltage and low capacitance characteristics.

NUP0MR, SZNUP0MR TYPICAL APPLICATIONS UPSTREAM USB PORT D+ D GND USB Controller C T C T R T R T NUP0MR D+ D GND DOWNSTREAM USB PORT NUP0MR C T C T R T R T D+ D GND DOWNSTREAM USB PORT Figure 0. ESD Protection for USB Port 7

NUP0MR, SZNUP0MR PACKAGE DIMENSIONS TSOP CASE 38G 0 ISSUE V H E D 5 3 E NOTES:. DIMENSIONING AND TOLERANCING PER ANSI Y.5M, 98.. CONTROLLING DIMENSION: MILLIMETER. 3. MAXIMUM LEAD THICKNESS INCLUDES LEAD FINISH THICKNESS. MINIMUM LEAD THICKNESS IS THE MINIMUM THICKNESS OF BASE MATERIAL.. DIMENSIONS A AND B DO NOT INCLUDE MOLD FLASH, PROTRUSIONS, OR GATE BURRS. 0.05 (0.00) e A b A L c MILLIMETERS INCHES DIM MIN NOM MAX MIN NOM MAX A 0.90.00.0 0.035 0.039 0.03 A 0.0 0.0 0.0 0.00 0.00 0.00 b 0.5 0.38 0.50 0.00 0.0 0.00 c 0.0 0.8 0. 0.00 0.007 0.00 D.90 3.00 3.0 0. 0.8 0. E.30.50.70 0.05 0.059 0.07 e 0.85 0.95.05 0.03 0.037 0.0 L 0.0 0.0 0.0 0.008 0.0 0.0 H E.50.75 3.00 0.099 0.08 0.8 0 0 0 0 SOLDERING FOOTPRINT*. 0.09.9 0.075 0.95 0.037 0.95 0.037 0.7 0.08.0 0.039 SCALE 0: mm inches *For additional information on our Pb Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of SCILLC s product/patent coverage may be accessed at www.onsemi.com/site/pdf/patent Marking.pdf. SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Typical parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including Typicals must be validated for each customer application by customer s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 53, Denver, Colorado 807 USA Phone: 303 75 75 or 800 3 380 Toll Free USA/Canada Fax: 303 75 7 or 800 3 387 Toll Free USA/Canada Email: orderlit@onsemi.com N. American Technical Support: 800 8 9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 33 790 90 Japan Customer Focus Center Phone: 8 3 587 050 8 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative NUP0MR/D