DDR3 SDRAM SODIMM MT8JTF12864HZ 1GB MT8JTF25664HZ 2GB MT8JTF51264HZ 4GB. Features. 1GB, 2GB, 4GB (x64, SR) 204-Pin DDR3 SODIMM.

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DDR3 SDRAM SODIMM MT8JTF12864HZ 1GB MT8JTF25664HZ 2GB MT8JTF51264HZ 4GB 1GB, 2GB, 4GB (x64, SR) 204-Pin DDR3 SODIMM Features Features DDR3 functionality and operations supported as defined in the component data sheet 204-pin, small-outline dual in-line memory module (SODIMM) Fast data transfer rates: PC3-14900, PC3-12800, PC3-10600, PC3-8500, or PC3-6400 1GB (128 Meg x 64), 2GB (256 Meg x 64), 4GB (512 Meg x64) V DD = 1.5V ±0.075V V DDSPD = 3.0 3.6V Nominal and dynamic on-die termination (ODT) for data, strobe, and mask signals Single rank Serial presence-detect (SPD) EEPROM 8 internal device banks Fixed burst chop (BC) of 4 and burst length (BL) of 8 via the mode register set (MRS) Selectable BC4 or BL8 on-the-fly (OTF) Gold edge contacts Halogen-free Fly-by topology Terminated control, command, and address bus Figure 1: 204-Pin SODIMM (MO-268 R/C B) Module Height: 30mm (1.181 in) Options Marking Operating temperature 1 Commercial (0 C T A +70 C) None Industrial ( 40 C T A +85 C) I Package 204-pin DIMM (halogen-free) Z Frequency/CAS latency 1.07ns @ CL = 13 (DDR3-1866) -1G9 1.25ns @ CL = 11 (DDR3-1600) -1G6 1.5ns @ CL = 9 (DDR3-1333) -1G4 1.87ns @ CL = 7 (DDR3-1066) -1G1 Note: 1. Contact Micron for industrial temperature module offerings. Table 1: Key Timing Parameters Speed Grade Industry Nomenclature CL = 13 CL = 11 Data Rate (MT/s) CL = 10 CL = 9 CL = 8 CL = 7 CL = 6 CL = 5-1G9 PC3-14900 1866 1333 1066 800 13.91 13.91 47.91-1G6 PC3-12800 1600 1333 1333 1066 1066 800 667 13.125 13.125 48.125-1G4 PC3-10600 1333 1333 1066 1066 800 667 13.125 13.125 49.125-1G1 PC3-8500 1066 1066 800 667 13.125 13.125 50.625-1G0 PC3-8500 1066 800 667 15 15 52.5-80B PC3-6400 800 667 15 15 52.5 t RCD (ns) t RP (ns) t RC (ns) 1 Products and specifications discussed herein are subject to change by Micron without notice.

Features Table 2: Addressing Parameter 1GB 2GB 4GB Refresh count 8K 8K 8K Row address 16K A[13:0] 32K A[14:0] 64K A[15:0] Device bank address 8 BA[2:0] 8 BA[2:0] 8 BA[2:0] Device configuration 1Gb (128 Meg x 8) 2Gb (256 Meg x 8) 4Gb (512 Meg x 8) Column address 1K A[9:0] 1K A[9:0] 1K A[9:0] Module rank address 1 S0# 1 S0# 1 S0# Table 3: Part Numbers and Timing Parameters 1GB Modules Base device: MT41J128M8, 1 1Gb DDR3 SDRAM Part Number 2 Module Density Configuration Module Bandwidth Memory Clock/ Data Rate Clock Cycles (CL- t RCD- t RP) MT8JTF12864H(I)Z-1G6 1GB 128 Meg x 64 12.8 GB/s 1.25ns/1600 MT/s 11-11-11 MT8JTF12864H(I)Z-1G4 1GB 128 Meg x 64 10.6 GB/s 1.5ns/1333 MT/s 9-9-9 MT8JTF12864H(I)Z-1G1 1GB 128 Meg x 64 8.5 GB/s 1.87ns/1066 MT/s 7-7-7 Table 4: Part Numbers and Timing Parameters 2GB Modules Base device: MT41J256M8, 1 2Gb DDR3 SDRAM Part Number 2 Module Density Configuration Module Bandwidth Memory Clock/ Data Rate Clock Cycles (CL- t RCD- t RP) MT8JTF25664H(I)Z-1G9 2GB 256 Meg x 64 14.9 GB/s 1.07ns/1866 MT/s 13-13-13 MT8JTF25664H(I)Z-1G6 2GB 256 Meg x 64 12.8 GB/s 1.25ns/1600 MT/s 11-11-11 MT8JTF25664H(I)Z-1G4 2GB 256 Meg x 64 10.6 GB/s 1.5ns/1333 MT/s 9-9-9 MT8JTF25664H(I)Z-1G1 2GB 256 Meg x 64 8.5 GB/s 1.87ns/1066 MT/s 7-7-7 Table 5: Part Numbers and Timing Parameters 4GB Modules Base device: MT41J512M8, 1 4Gb DDR3 SDRAM Part Number 2 Module Density Configuration Module Bandwidth Memory Clock/ Data Rate Clock Cycles (CL- t RCD- t RP) MT8JTF51264H(I)Z-1G6 4GB 512 Meg x 64 12.8 GB/s 1.25ns/1600 MT/s 11-11-11 MT8JTF51264H(I)Z-1G4 4GB 512 Meg x 64 10.6 GB/s 1.5ns/1333 MT/s 9-9-9 MT8JTF51264H(I)Z-1G1 4GB 512 Meg x 64 8.5 GB/s 1.87ns/1066 MT/s 7-7-7 Notes: 1. The data sheet for the base device can be found on Micron s Web site. 2. All part numbers end with a two-place code (not shown) that designates component and PCB revisions. Consult factory for current revision codes. Example: MT8JTF25664HZ-1G4M1. 2

Pin Assignments Pin Assignments Table 6: Pin Assignments 204-Pin DDR3 SODIMM Front 204-Pin DDR3 SODIMM Back Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol 1 V REF 53 19 105 V DD 157 42 2 54 106 V DD 158 46 3 55 107 A10 159 43 4 4 56 28 108 BA1 160 47 5 0 57 24 109 BA0 161 6 5 58 29 110 RAS# 162 7 1 59 25 111 V DD 163 48 8 60 112 V DD 164 52 9 61 113 WE# 165 49 10 S0# 62 3# 114 S0# 166 53 11 DM0 63 DM3 115 CAS# 167 12 S0 64 3 116 ODT0 168 13 65 117 V DD 169 S6# 14 66 118 V DD 170 DM6 15 2 67 26 119 A13 171 S6 16 6 68 30 120 NC 172 17 3 69 27 121 NC 173 18 7 70 31 122 NC 174 54 19 71 123 V DD 175 50 20 72 124 V DD 176 55 21 8 73 CKE0 125 NC 177 51 22 12 74 NC 126 V REFCA 178 23 9 75 V DD 127 179 24 13 76 V DD 128 180 60 25 77 NC 129 32 181 56 26 78 A15 130 36 182 61 27 S1# 79 BA2 131 33 183 57 28 DM1 80 A14 132 37 184 29 S1 81 V DD 133 185 30 RESET# 82 V DD 134 186 S7# 31 83 A12 135 S4# 187 DM7 32 84 A11 136 DM4 188 S7 33 10 85 A9 137 S4 189 34 14 86 A7 138 190 35 11 87 V DD 139 191 58 36 15 88 V DD 140 38 192 62 37 89 A8 141 34 193 59 38 90 A6 142 39 194 63 39 16 91 A5 143 35 195 40 20 92 A4 144 196 41 17 93 V DD 145 197 SA0 42 21 94 V DD 146 44 198 NF 43 95 A3 147 40 199 V DDSPD 44 96 A2 148 45 200 SDA 45 S2# 97 A1 149 41 201 SA1 46 DM2 98 A0 150 202 SCL 47 S2 99 V DD 151 203 V TT 48 100 V DD 152 S5# 204 V TT 49 101 CK0 153 DM5 50 22 102 CK1 154 S5 51 18 103 CK0# 155 52 23 104 CK1# 156 3

Pin Descriptions Table 7: Pin Descriptions Symbol Type Description The pin description table below is a comprehensive list of all possible pins for all DDR3 modules. All pins listed may not be supported on this module. See Pin Assignments for information specific to this module. Ax Input Address inputs: Provide the row address for ACTIVE commands, and the column address and auto precharge bit (A10) for READ/WRITE commands, to select one location out of the memory array in the respective bank. A10 sampled during a PRECHARGE command determines whether the PRECHARGE applies to one bank (A10 LOW, bank selected by BAx) or all banks (A10 HIGH). The address inputs also provide the op-code during a LOAD MODE command. See the Pin Assignments Table for density-specific addressing information. BAx Input Bank address inputs: Define the device bank to which an ACTIVE, READ, WRITE, or PRECHARGE command is being applied. BA define which mode register (MR0, MR1, MR2, or MR3) is loaded during the LOAD MODE command. CKx, CKx# Input Clock: Differential clock inputs. All control, command, and address input signals are sampled on the crossing of the positive edge of CK and the negative edge of CK#. CKEx Input Clock enable: Enables (registered HIGH) and disables (registered LOW) internal circuitry and clocks on the DRAM. DMx Input Data mask (x8 devices only): DM is an input mask signal for write data. Input data is masked when DM is sampled HIGH, along with that input data, during a write access. Although DM pins are input-only, DM loading is designed to match that of the and S pins. ODTx Input On-die termination: Enables (registered HIGH) and disables (registered LOW) termination resistance internal to the DDR3 SDRAM. When enabled in normal operation, ODT is only applied to the following pins:, S, S#, DM, and CB. The ODT input will be ignored if disabled via the LOAD MODE command. Par_In Input Parity input: Parity bit for Ax, RAS#, CAS#, and WE#. RAS#, CAS#, WE# Input Command inputs: RAS#, CAS#, and WE# (along with S#) define the command being entered. RESET# Input (LVCMOS) Reset: RESET# is an active LOW asychronous input that is connected to each DRAM and the registering clock driver. After RESET# goes HIGH, the DRAM must be reinitialized as though a normal power-up was executed. Sx# Input Chip select: Enables (registered LOW) and disables (registered HIGH) the command decoder. SAx Input Serial address inputs: Used to configure the temperature sensor/spd EEPROM address range on the I 2 C bus. SCL Input Serial clock for temperature sensor/spd EEPROM: Used to synchronize communication to and from the temperature sensor/spd EEPROM on the I 2 C bus. CBx I/O Check bits: Used for system error detection and correction. x I/O Data input/output: Bidirectional data bus. Sx, Sx# I/O 1GB, 2GB, 4GB (x64, SR) 204-Pin DDR3 SODIMM Pin Descriptions Data strobe: Differential data strobes. Output with read data; edge-aligned with read data; input with write data; center-aligned with write data. 4

Pin Descriptions Table 7: Pin Descriptions (Continued) Symbol Type Description SDA I/O Serial data: Used to transfer addresses and data into and out of the temperature sensor/spd EEPROM on the I 2 C bus. TSx, TSx# Err_Out# EVENT# Output Output (open drain) Output (open drain) Redundant data strobe (x8 devices only): TS is enabled/disabled via the LOAD MODE command to the extended mode register (EMR). When TS is enabled, DM is disabled and TS and TS# provide termination resistance; otherwise, TS# are no function. Parity error output: Parity error found on the command and address bus. Temperature event:the EVENT# pin is asserted by the temperature sensor when critical temperature thresholds have been exceeded. V DD Supply Power supply: 1.5V ±0.075V. The component V DD and V D are connected to the module V DD. V DDSPD Supply Temperature sensor/spd EEPROM power supply: 3.0 3.6V. V REFCA Supply Reference voltage: Control, command, and address V DD /2. V REF Supply Reference voltage:, DM V DD /2. Supply Ground. V TT Supply Termination voltage: Used for control, command, and address V DD /2. NC No connect: These pins are not connected on the module. NF No function: These pins are connected within the module, but provide no functionality. 5

Map Map Table 8: Component-to-Module Map Component Reference Number Component Module Module Pin Number Component Reference Number Component Module Module Pin Number U1 0 2 15 U2 0 22 50 1 1 7 1 17 41 2 6 16 2 18 51 3 5 6 3 21 42 4 7 18 4 23 52 5 0 5 5 16 39 6 3 17 6 19 53 7 4 4 7 20 40 U3 0 34 141 U4 0 50 175 1 36 130 1 53 166 2 38 140 2 54 174 3 33 131 3 49 165 4 35 143 4 55 176 5 32 129 5 48 163 6 39 142 6 51 177 7 37 132 7 52 164 U6 0 61 182 U7 0 45 148 1 62 192 1 42 157 2 57 183 2 44 146 3 58 191 3 46 158 4 60 180 4 40 147 5 59 193 5 47 160 6 56 181 6 41 149 7 63 194 7 43 159 U8 0 29 58 U9 0 9 23 1 26 67 1 10 33 2 25 59 2 13 24 3 31 70 3 11 35 4 24 57 4 12 22 5 30 68 5 15 36 6 28 56 6 8 21 7 27 69 7 14 34 6

Functional Block Diagram Functional Block Diagram Figure 2: Functional Block Diagram S0# S0# S0 DM0 S1# S1 DM1 S2# S2 DM2 S3# S3 DM3 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 ZQ ZQ ZQ ZQ DM CS# S S# U1 DM CS# S S# U9 DM CS# S S# U2 DM CS# S S# U8 S4# S4 DM4 S5# S5 DM5 S6# S6 DM6 S7# S7 DM7 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 DM CS# S S# U3 ZQ DM CS# S S# U7 ZQ DM CS# S S# U4 ZQ DM CS# S S# U6 ZQ SCL BA[2:0] A[15/14/13:0] RAS# CAS# WE# CKE0 ODT0 RESET# V REFCA CK0 CK0# CK1 CK1# U5 SPD EEPROM WP A0 A1 A2 SA0 SA1 SDA BA[2:0]: DDR3 SDRAM A[15/14/13:0]: DDR3 SDRAM RAS#: DDR3 SDRAM CAS#: DDR3 SDRAM WE#: DDR3 SDRAM CKE0: DDR3 SDRAM ODT0: DDR3 SDRAM RESET#: DDR3 SDRAM DDR3 SDRAM x 8 Clock, control, command, and address line terminations: CKE0, A[15/14/13:0], RAS#, CAS#, WE#, S0#, ODT0, BA[2:0] V DDSPD V DD V TT V REF CK CK# DDR3 SDRAM DDR3 SDRAM V TT SPD EEPROM DDR3 SDRAM DDR3 SDRAM DDR3 SDRAM DDR3 SDRAM DDR3 SDRAM V DD Note: 1. The ZQ ball on each DDR3 component is connected to an external 240Ω ±1% resistor that is tied to ground. It is used for the calibration of the component s ODT and output driver. 7

General Description 1GB, 2GB, 4GB (x64, SR) 204-Pin DDR3 SODIMM General Description DDR3 SDRAM modules are high-speed, CMOS dynamic random access memory modules that use internally configured 8-bank DDR3 SDRAM devices. DDR3 SDRAM modules use DDR architecture to achieve high-speed operation. DDR3 architecture is essentially a 8n-prefetch architecture with an interface designed to transfer two data words per clock cycle at the I/O pins. A single read or write access for the DDR3 SDRAM module effectively consists of a single 8n-bit-wide, one-clock-cycle data transfer at the internal DRAM core and eight corresponding n-bit-wide, one-half-clock-cycle data transfers at the I/O pins. DDR3 modules use two sets of differential signals: S, S# to capture data and CK and CK# to capture commands, addresses, and control signals. Differential clocks and data strobes ensure exceptional noise immunity for these signals and provide precise crossing points to capture input signals. Fly-By Topology DDR3 modules use faster clock speeds than earlier DDR technologies, making signal quality more important than ever. For improved signal quality, the clock, control, command, and address buses have been routed in a fly-by topology, where each clock, control, command, and address pin on each DRAM is connected to a single trace and terminated (rather than a tree structure, where the termination is off the module near the connector). Inherent to fly-by topology, the timing skew between the clock and S signals can be easily accounted for by using the write-leveling feature of DDR3. Temperature Sensor with Serial Presence-Detect EEPROM Thermal Sensor Operations The temperature from the integrated thermal sensor is monitored and converts into a digital word via the I 2 C bus. System designers can use the user-programmable registers to create a custom temperature-sensing solution based on system requirements. Programming and configuration details comply with JEDEC standard No. 21-C page 4.7-1, "Definition of the TSE2002av, Serial Presence Detect with Temperature Sensor." Serial Presence-Detect EEPROM Operation DDR3 SDRAM modules incorporate serial presence-detect. The SPD data is stored in a 256-byte EEPROM. The first 128 bytes are programmed by Micron to comply with JE- DEC standard JC-45, "Appendix X: Serial Presence Detect (SPD) for DDR3 SDRAM Modules." These bytes identify module-specific timing parameters, configuration information, and physical attributes. The remaining 128 bytes of storage are available for use by the customer. System READ/WRITE operations between the master (system logic) and the slave EEPROM device occur via a standard I 2 C bus using the DIMM s SCL (clock) SDA (data), and SA (address) pins. Write protect (WP) is connected to, permanently disabling hardware write protection. For further information refer to Micron technical note TN-04-42, "Memory Module Serial Presence-Detect." 8

Electrical Specifications Table 9: Absolute Maximum Ratings 1GB, 2GB, 4GB (x64, SR) 204-Pin DDR3 SODIMM Electrical Specifications Stresses greater than those listed may cause permanent damage to the module. This is a stress rating only, and functional operation of the module at these or any other conditions outside those indicated in each device's data sheet is not implied. Exposure to absolute maximum rating conditions for extended periods may adversely affect reliability. Symbol Parameter Min Max Units V DD V DD supply voltage relative to 0.4 1.975 V V IN, V OUT Voltage on any pin relative to 0.4 1.975 V Table 10: Operating Conditions Symbol Parameter Min Nom Max Units Notes V DD V DD supply voltage 1.425 1.5 1.575 V I VTT Termination reference current from V TT 600 600 ma V TT Termination reference voltage (DC) command/address bus I I I OZ I VREF T A T C Input leakage current; Any input 0V V IN V DD ; V REF input 0V V IN 0.95V (All other pins not under test = 0V) Output leakage current; 0V V OUT V DD ; and ODT are disabled; ODT is HIGH Address inputs, RAS#, CAS#, WE#, S#, CKE, ODT, BA, CK, CK# 0.49 V DD - 20mV 0.5 V DD 0.51 V DD + 20mV V 1 16 0 16 µa DM 2 0 2, S, S# V REF supply leakage current; V REF = V DD /2 or V REFCA = V DD /2 (All other pins not under test = 0V) Module ambient operating temperature DDR3 SDRAM component case operating temperature 5 0 5 µa 8 0 8 µa Commercial 0 70 C 2, 3 Industrial 40 85 C Commercial 0 95 C 2, 3, 4 Industrial 40 95 C Notes: 1. V TT termination voltage in excess of the stated limit will adversely affect the command and address signals voltage margin and will reduce timing margins. 2. T A and T C are simultaneous requirements. 3. For further information, refer to technical note TN-00-08: Thermal Applications, available on Micron s Web site. 4. The refresh rate is required to double when 85 C < T C 95 C. 9

DRAM Operating Conditions DRAM Operating Conditions Recommended AC operating conditions are given in the DDR3 component data sheets. Component specifications are available on Micron s Web site. Module speed grades correlate with component speed grades, as shown below. Table 11: Module and Component Speed Grades DDR3 components may exceed the listed module speed grades; module may not be available in all listed speed grades Module Speed Grade Component Speed Grade -1G9-107 -1G6-125 -1G4-15E -1G1-187E -1G0-187 -80C -25E -80B -25 Design Considerations Simulations Micron memory modules are designed to optimize signal integrity through carefully designed terminations, controlled board impedances, routing topologies, trace length matching, and decoupling. However, good signal integrity starts at the system level. Micron encourages designers to simulate the signal characteristics of the system's memory bus to ensure adequate signal integrity of the entire memory system. Power Operating voltages are specified at the DRAM, not at the edge connector of the module. Designers must account for any system voltage drops at anticipated power levels to ensure the required supply voltage is maintained. 10

I DD Specifications I DD Specifications Table 12: DDR3 I DD Specifications and Conditions 1GB (Die Revision G) Values are for the MT41J128M8 DDR3 SDRAM only and are computed from values specified in the 1Gb (128 Meg x 8) component data sheet Parameter Symbol 1600 1333 1066 Units Operating current 0: One bank ACTIVATE-to-PRECHARGE Operating current 1: One bank ACTIVATE-to-READ-to-PRECHARGE I DD0 560 520 480 ma I DD1 720 680 640 ma Precharge power-down current: Slow exit I DD2P0 96 96 96 ma Precharge power-down current: Fast exit I DD2P1 240 240 200 ma Precharge quiet standby current I DD2Q 320 280 280 ma Precharge standby current I DD2N 360 320 280 ma Precharge standby ODT current I DD2NT 440 400 360 ma Active power-down current I DD3P 380 240 240 ma Active standby current I DD3N 360 320 320 ma Burst read operating current I DD4R 1120 1000 880 ma Burst write operating current I DD4W 1160 1000 880 ma Refresh current I DD5 1360 1320 1280 ma Self refresh temperature current: MAX T C = 85 C I DD6 64 64 64 ma Self refresh temperature current (SRT-enabled): MAX T C = 95 C I DD6ET 80 80 80 ma All banks interleaved read current I DD7 1960 1880 1560 ma Reset current I DD8 112 112 112 ma 11

I DD Specifications Table 13: DDR3 I DD Specifications and Conditions 2GB (Die Revision H) Values are for the MT41J256M8 DDR3 SDRAM only and are computed from values specified in the 2Gb (256 Meg x 8) component data sheet Parameter Symbol 1866 1600 1333 1066 Units Operating current 0: One bank ACTIVATE-to-PRECHARGE Operating current 1: One bank ACTIVATE-to-READ-to-PRECHARGE I DD0 704 640 600 560 ma I DD1 864 800 760 720 ma Precharge power-down current: Slow exit I DD2P0 112 96 96 96 ma Precharge power-down current: Fast exit I DD2P1 384 320 280 240 ma Precharge quiet standby current I DD2Q 424 360 320 280 ma Precharge standby current I DD2N 440 376 336 296 ma Precharge standby ODT current I DD2NT 504 440 400 360 ma Active power-down current I DD3P 464 400 360 320 ma Active standby current I DD3N 504 440 400 360 ma Burst read operating current I DD4R 1440 1280 1160 1040 ma Burst write operating current I DD4W 1140 1280 1160 1040 ma Refresh current I DD5 1640 1560 1520 1480 ma Self refresh temperature current: MAX T C = 85 C I DD6 96 96 96 96 ma Self refresh temperature current (SRT-enabled): MAX T C = 95 C I DD6ET 120 120 120 120 ma All banks interleaved read current I DD7 2240 2080 1960 1840 ma Reset current I DD8 128 112 112 112 ma 12

I DD Specifications Table 14: DDR3 I DD Specifications and Conditions 2GB (Die Revision M) Values are for the MT41J256M8 DDR3 SDRAM only and are computed from values specified in the 2Gb (256 Meg x 8) component data sheet Parameter Symbol 1866 1600 1333 1066 Units Operating current 0: One bank ACTIVATE-to-PRECHARGE Operating current 1: One bank ACTIVATE-to-READ-to-PRECHARGE I DD0 600 560 520 480 ma I DD1 680 640 600 560 ma Precharge power-down current: Slow exit I DD2P0 96 96 96 96 ma Precharge power-down current: Fast exit I DD2P1 336 296 256 216 ma Precharge quiet standby current I DD2Q 360 230 280 240 ma Precharge standby current I DD2N 284 344 304 264 ma Precharge standby ODT current I DD2NT 400 360 320 280 ma Active power-down current I DD3P 440 400 360 320 ma Active standby current I DD3N 480 440 400 360 ma Burst read operating current I DD4R 1368 1248 1128 1040 ma Burst write operating current I DD4W 1280 1160 1040 920 ma Refresh current I DD5 1600 1560 1520 1480 ma Self refresh temperature current: MAX T C = 85 C I DD6 96 96 96 96 ma Self refresh temperature current (SRT-enabled): MAX T C = 95 C I DD6ET 120 120 120 120 ma All banks interleaved read current I DD7 2040 1920 1800 1680 ma Reset current I DD8 112 112 112 112 ma 13

I DD Specifications Table 15: DDR3 I DD Specifications and Conditions 4GB (Die Revision D) Values are for the MT41J512M8 DDR3 SDRAM only and are computed from values specified in the 4Gb (512 Meg x 8) component data sheet Parameter Symbol 1600 1333 1066 Units Operating current 0: One bank ACTIVATE-to-PRECHARGE Operating current 1: One bank ACTIVATE-to-READ-to-PRECHARGE I DD0 600 520 480 ma I DD1 696 656 616 ma Precharge power-down current: Slow exit I DD2P0 160 160 160 ma Precharge power-down current: Fast exit I DD2P1 296 256 240 ma Precharge quiet standby current I DD2Q 376 336 312 ma Precharge standby current I DD2N 400 360 320 ma Precharge standby ODT current I DD2NT 400 360 320 ma Active power-down current I DD3P 480 440 400 ma Active standby current I DD3N 456 416 376 ma Burst read operating current I DD4R 1496 1336 1176 ma Burst write operating current I DD4W 1320 1160 1000 ma Refresh current I DD5 1760 1680 1640 ma Self refresh temperature current: MAX T C = 85 C I DD6 176 176 176 ma Self refresh temperature current (SRT-enabled): MAX T C = 95 C I DD6ET 224 224 224 ma All banks interleaved read current I DD7 2320 2000 1680 ma Reset current I DD8 176 176 176 ma 14

Temperature Sensor with Serial Presence-Detect EEPROM Serial Presence-Detect 1GB, 2GB, 4GB (x64, SR) 204-Pin DDR3 SODIMM Temperature Sensor with Serial Presence-Detect EEPROM The temperature sensor continuously monitors the module's temperature and can be read back at any time over the I 2 C bus shared with the SPD EEPROM. Refer to JEDEC standard No. 21-C page 4.7-1, "Definition of the TSE2002av, Serial Presence Detect with Temperature Sensor." For the latest SPD data, refer to Micron's SPD page: www.micron.com/spd. Table 16: Temperature Sensor with SPD EEPROM Operating Conditions Parameter/Condition Symbol Min Max Units Supply voltage V DDSPD 3.0 3.6 V Supply current: V DD = 3.3V I DD 2.0 ma Input high voltage: Logic 1; SCL, SDA V IH 1.45 V DDSPD + 1 V Input low voltage: Logic 0; SCL, SDA V IL 0.55 V Output low voltage: I OUT = 2.1mA V OL 0.4 V Input current I IN 5.0 5.0 µa Temperature sensing range 40 125 C Temperature sensor accuracy (class B) 1.0 1.0 C Table 17: Temperature Sensor and EEPROM Serial Interface Timing Parameter/Condition Symbol Min Max Units Time bus must be free before a new transition can start t BUF 4.7 µs SDA fall time t F 20 300 ns SDA rise time t R 1000 ns Data hold time t HD:DAT 200 900 ns Start condition hold time t H:STA 4.0 µs Clock HIGH period t HIGH 4.0 50 µs Clock LOW period t LOW 4.7 µs SCL clock frequency t SCL 10 100 khz Data setup time t SU:DAT 250 ns Start condition setup time t SU:STA 4.7 µs Stop condition setup time t SU:STO 4.0 µs 15

Temperature Sensor with Serial Presence-Detect EEPROM EVENT# Pin The temperature sensor also adds the EVENT# pin (open-drain). Not used by the SPD EEPROM, EVENT# is a temperature sensor output used to flag critical events that can be set up in the sensor s configuration register. EVENT# has three defined modes of operation: interrupt mode, compare mode, and critical temperature mode. Event thresholds are programmed in the 0x01 register using a hysteresis. The alarm window provides a comparison window, with upper and lower limits set in the alarm upper boundary register and the alarm lower boundary register, respectively. When the alarm window is enabled, EVENT# will trigger whenever the temperature is outside the MIN or MAX values set by the user. The interrupt mode enables software to reset EVENT# after a critical temperature threshold has been detected. Threshold points are set in the configuration register by the user. This mode triggers the critical temperature limit and both the MIN and MAX of the temperature window. The compare mode is similar to the interrupt mode, except EVENT# cannot be reset by the user and returns to the logic HIGH state only when the temperature falls below the programmed thresholds. Critical temperature mode triggers EVENT# only when the temperature has exceeded the programmed critical trip point. When the critical trip point has been reached, the temperature sensor goes into comparator mode, and the critical EVENT# cannot be cleared through software. 16

Module Dimensions Module Dimensions Figure 3: 204-Pin DDR3 SODIMM Front view 67.75 (2.667) 67.45 (2.656) 3.8 (0.150) MAX 2.0 (0.079) R (2X) 1.8 (0.071) (2X) U1 U2 U5 U3 U4 20.0 (0.787) 30.15 (1.187) 29.85 (1.175) 6.0 (0.236) 2.0 (0.079) 45 4X PIN 1 1.0 (0.039) 63.6 (2.504) Back view 0.45 (0.018) 0.6 (0.024) PIN 203 1.10 (0.043) 0.90 (0.035) U6 U7 U8 U9 2.55 (0.10) Notes: PIN 204 3.0 (0.12) PIN 2 39.0 (1.535) 21.0 (0.827) 24.8 (0.976) 4.0 (0.157) 1. All dimensions are in millimeters (inches); MAX/MIN or typical () where noted. 2. The dimensional diagram is for reference only. 8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900 www.micron.com/productsupport Customer Comment Line: 800-932-4992 Micron and the Micron logo are trademarks of Micron Technology, Inc. All other trademarks are the property of their respective owners. This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein. Although considered final, these specifications are subject to change, as further product development and data characterization sometimes occur. 17