EE-4232 Review of BJTs, JFETs and MOSFETs
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1 EE-4232 Review of BJTs, JFETs and MOSFETs 0
2 A simplified structure of the npn transistor. 1
3 A simplified structure of the pnp transistor. 2
4 Current flow in an npn transistor biased to operate in the active mode, (Reverse current components due to drift of thermally generated minority carriers are not shown.) 3
5 Current flow in an pnp transistor biased to operate in the active mode. 4
6 The i C -v CB characteristics for an npn transistor in the active mode. 5
7 (a) Conceptual circuit for measuring the i C -v CE characteristics of the BJT. (b) The i C -v CE characteristics of a practical BJT. 6
8 (a) Conceptual circuit to illustrate the operation of the transistor of an amplifier. (b) The circuit of (a) with the signal source v be eliminated for dc (bias) analysis. 7
9 Linear operation of the transistor under the small-signal condition: A small signal v be with a triangular waveform is superimpose din the dc voltage V BE. It gives rise to a collector signal current i c, also of triangular waveform, superimposed on the dc current I C.I c = g m v be, where g m is the slope of the i c -v BE curve at the bias point Q. 8
10 Two slightly different versions of the simplified hybrid-π model for the small-signal operation of the BJT. The equivalent circuit in (a) represents the BJT as a voltagecontrolled current source ( a transconductance amplifier) and that in (b) represents the BJT as a current-controlled current source (a current amplifier). 9
11 Two slightly different versions of what is known as the T model of the BJT. The circuit in (a) is a voltage-controlled current source representation and that in (b) is a currentcontrolled current source representation. These models explicitly show the emitter resistance r e rather than the base resistance r Π featured in the hybrid-π model. 10
12 Junction Field-Effect Transistors i D n-jfet I DSS v GS =0 v GS =-1 Pinch-off v DG > -V p v GS =V p -V p v DS i D p-jfet I DSS v SG =0 Pinch-off v GD > V p v SG =-1 v SG =-V p V p v SD
13 Junction Field-Effect Transistors Triod (VCR) Region i D = I DSS 2 1 v GS v DS V p V p v DS V p r DS v DS = = vds = small i D 2I DSS V 1 p v GS V p 1 Boundary v DG = V p i D = I v DS DSS V p Pinch-Off Region v GS i D = I DSS V p
14 MOSFETs 11
15 Physical structure of the enhancement-type NMOS transistor: (a) perspective view; (b) cross section. Typically L = 1 to 10 µm, W = 2 to 500 µm, and the thickness of the oxide layer is in the range of 0.02 to 0.1 µm. 12
16 The enhancement-type NMOS transistor with a positive voltage applied to the gate. An n channel is induced at the top of the substrate beneath the gate. 13
17 The drain current i D versus the drain-to-source voltage v DS for an enhancement-type NMOS transistor operated with v GS > V t. 14
18 Cross section of a CMOS integrated circuit. Note that the PMOS transistor is formed in a separate n-type region, known as an n well. Another arrangement is also possible in which an n-type body is used and the n device is formed in a p well. 15
19 (a) An n-channel enhancement-type MOSFET with v GS and v DS applied and with the normal directions of current flow indicated. (b) The i D - v DS characteristics for a device with V t = 1 V and k n (W/L) = 0.5 ma/v 2. 16
20 The i D - v GS characteristic for an enhancement-type NMOS transistor in saturation (V t = 1 V and k n (W/L) = 0.5 ma/v 2 ). 17
21 Large-signal equivalent circuit model of the n-channel MOSFET in saturation, incorporating the output resistance r o. The output resistance models the linear dependence of i D on v DS and is given by r o V A/ I D. 18
22 Conceptual circuit utilized to study the operation of the MOSFET as an amplifier. 19
23 Small-signal operation of the enhancement MOSFET amplifier. 20
24 Small-signal models for the MOSFET: (a) neglecting the dependence of i D on v DS in saturation (channel-length modulation effect); and (b) including the effect of channellength modulation modeled by output resistance r o = V A / I D. 21
25 (a) The CMOS inverter. (b) Simplified circuit schematic for the inverter. 22
26 Dynamic operation of a capacitively loaded CMOS inverter: (a) circuit; (b) input and output waveforms. 23
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