Diffraction Course Series 2015

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Branden Snow
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1 Diffraction Course Series 2015 Mark Wainwright Analytical Centre Kensington Campus, Chemical Sciences Building F10, Room G37 The Mark Wainwright Analytical Centre is offering a new series of courses covering aspects of diffraction for UNSW and ADFA researchers. The table below lists the course modules and speakers for our 2015 series. Module one comprises basic principles of diffraction and crystallography tools, while the remaining modules focus on specialised areas of diffraction: electron back scattered diffraction (EBSD), single crystal X-ray, and electron diffraction in TEM. Honours, graduate, postgraduate and postdoctoral researchers new to diffraction techniques are encouraged to attend Module 1, and to choose one or more of the specialised modules based on their field of research. A summary of the individual modules is described in the following pages. A course fee of $50.00 will be charged for each module, and classes are limited to 20 per module. Please register for each module separately online with the link prior to the registration deadline provided below. Date Module Teachers 04 May :00pm 11 May May May :00am- Module 1: An introduction to diffraction, crystallography, and diffraction instrumentation. ebooking.aspx?e=dvc_module1_2015 Module 2: Electron Backscatter Diffraction (EBSD). ebooking.aspx?e=dvc_module2_2015 Module 3: Single crystal x-ray diffraction ebooking.aspx?e=dvc_module3_2015 Module 4: Diffraction techniques with Transmission Electron Microscopy (TEM) ebooking.aspx?e=dvc_module4_2015 Registration Deadline Zakaria Quadir 1 Mohan Bhadbhade April 2015 Christopher Marjo Zakaria Quadir 4 May 2015 Mohan Bhadbhade 11 May 2015 Zakaria Quadir 18 May Electron Microscope Unit, Mark Wainwright Analytical Centre, UNSW Australia 2. Solid State and Elemental Analysis Unit, Mark Wainwright Analytical Centre, UNSW Australia These short modules also complement Dr Yu Wang s popular Quantitative X-ray Diffraction course that will be conducted in July Please contact yu.wang@unsw.edu.au for more information on this course.

$Module one comprises basic principles of diffraction and crystallography tools, while the remaining modules focus on specialised areas of diffraction: electron back scattered diffraction (EBSD),$

2 MODULE 1: INTRODUCTION TO DIFFRACTION, CRYSTALLOGRAPHY AND DIFFRACTION INSTRUMENTATION Date: 9:30am to 12:30 Monday 4th May 2015 This module aims to provide an easy introduction to diffraction, using simple examples and a visual approach to understand the implications of the Bragg equation. These concepts are then developed into geometry of diffraction, crystallography and symmetry. Common examples of instrumentation are described, with reference to future modules and to equipment available to UNSW and ADFA researchers. By the end of this module the participant should understand: 1. Crystalline State and Diffraction phenomenon 2. The Bragg condition for diffraction to occur: peak intensity and position 3. Crystal Systems, Unit cell and Bravais Lattices 4. Symmetry: Point groups and Space groups 5. Miller indices, reciprocal lattice and zone axis 6. Instrumentation utilising diffraction: the single crystal X-ray diffractometer, the X-ray powder diffractometer, the electron microscope, neutron and synchrotron sources. ebooking.aspx?e=dvc_module1_2015

$By the end of this module the participant should understand: 1. Crystalline State and Diffraction phenomenon 2. The Bragg condition for diffraction to occur: peak intensity and position 3.$

3 MODULE 2: ELECTRON BACKSCATTER DIFFRACTION (EBSD) Date: 9:30am to 12:30 Monday 11 May 2015 This module deals with the principles of the EBSD technique and its sample preparation, data acquisition and analysis methods. This module is suitable for both new and experienced researchers using EBSD and covers advanced parameter settings found in the most recent data acquisitions/analysis software, as well as emerging complementary techniques like 3D EBSD and transmission Kikuchi diffraction (TKD). This course will enable the participants understanding the scopes and limitations of this technique for a given research concern and adopting the right sample preparation methods, data acquisition approaches, and data analysis protocols. An accessible approach is used to explain software features such as orientation mapping, and crystallographic data presentation with pole figures (PF), inverse pole figure (IPF) and orientation distribution functions (ODF). The course is designed in accordance with the ongoing research projects in Materials science, Photovoltaic and Mechanical Engineering departments at UNSW. Some recent case studies will also be presented. Researchers are encouraged to bring their own project aspects for discussion with the group. The course is intended to cover the following topics: 1. EBSD principles. 2. Sample preparation requirements and methods (methods available in UNSW will be emphasized). 3. Data acquisition principles and methods. 4. Methods of representing crystallographic data in orientation mapping, PF, IPF and ODF. 5. Advanced EBSD techniques (3D EBSD, TKD, etc). ebooking.aspx?e=dvc_module2_2015

$complementary techniques like 3D EBSD and transmission Kikuchi diffraction (TKD).$

4 MODULE 3: SINGLE CRYSTAL X-RAY DIFFRACTION ANALYSIS Date: 9:30am to 12:30 Monday 18 May 2015 This module is designed to deliver the principles and practice of Single Crystal X-ray Diffraction (SCD) analysis. The half-day interactive course is intended for new and experienced researchers, whether they plan to use the technique themselves or utilise it for their research. Basic principles of SCD that yields three-dimensional structure of a molecule at atomic resolution, whether a small organic or a large complex in a ribosomal particle, will be discussed. The increasing power of the technique with the development of brighter radiation sources and new structure solution software will be reviewed. The course will enable participants to understand the magic behind the structure determination process and encourage them to take the full advantage of the facilities available at MWAC as well as at Australian Synchrotron. The module will cover the following aspects of SCD, but there will be opportunities for discussion on other areas of SCD during the module: 1. Principles of structure determination by X-ray Single Crystal Method. 2. The technique in practice: for small and large molecules. 3. Instrumentation and facilities available at MWAC for data acquisition. 4. Structure solution methods: latest powerful software available at UNSW. 5. Structure refinement, accuracy and data deposition 6. Advanced experiments and techniques available. ebooking.aspx?e=dvc_module3_2015

Basic principles of SCD that yields three-dimensional structure of a molecule at atomic resolution, whether a small organic or a large complex in a ribosomal particle, will be discussed.

5 MODULE 4: DIFFRACTION TECHNIQUES WITH TRANSMISSION ELECTRON MICROSCOPY (TEM) Date: 9:30am to 12:30 Monday 25 May 2015 In this module the most common TEM diffraction methods will be explained with simple physical models. These techniques include selected area diffraction (SAD), convergent beam electron diffraction (CBED), two beam-weak beam, dark field (DF)-bright field (BF) techniques and their peripheral methods. This module will take a practical and nonmathematical approach for explaining HOW TO obtain diffraction data and HOW TO conduct diffraction pattern analysis. In designing this module emphasis is given to the TEM enquiries that were received by UNSW-ADFA researchers in recent years, from Materials Science, Photovoltaics, Mechanical, Electrical, Civil and Chemical Engineering, Chemistry and Physics, and these enquires can all be addressed on TEMs available at UNS. The course will enable participants understanding the physical relationship between a diffraction pattern and the sample crystallography, adopting the right method among the available range of techniques for addressing a given research concern, choosing TEM parameters, and will provide awareness of the common errors and limitations of a given technique. Diffraction methods associated with high resolution (HR) TEM will also be discussed. The course will cover the following topics; however participants are encouraged to bring their own project aspects and conduct discussion in an interactive manner. 1. Electron beam lattice interactions and diffraction principles. 2. Basics of SAD and CBED technique, pattern analysis and applications. 3. Imaging in DF, BF, Two Beam and Weak Beam conditions. 4. Diffraction techniques: nano particle and defect analysis (dislocations, twins, etc). 5. Diffraction analysis in high resolution (HR) TEM. ebooking.aspx?e=dvc_module4_2015

$These techniques include selected area diffraction (SAD), convergent beam electron diffraction (CBED), two beam-weak beam, dark field (DF)-bright field (BF) techniques and their peripheral methods.$

X-Ray Diffraction HOW IT WORKS WHAT IT CAN AND WHAT IT CANNOT TELL US. Hanno zur Loye

$X-Ray Diffraction HOW IT WORKS WHAT IT CAN AND WHAT IT CANNOT TELL US. Hanno zur Loye$ X-Ray Diffraction HOW IT WORKS WHAT IT CAN AND WHAT IT CANNOT TELL US Hanno zur Loye X-rays are electromagnetic radiation of wavelength about 1 Å (10-10 m), which is about the same size as an atom. The