±15kV ESD-Protected, Quad, Low-Power RS-232 Line Receiver MAX1489E

Transcription

1 ; Rev 0; 8/95 ±15k ES-rotected, Quad, General escription The 1489E quad, low-power line receiver is designed for EIA/TIA-232, EIA/TIA-562, and CCITT.28 communications in harsh environments. Each receiver input is protected against ±15k electrostatic discharge (ES) shocks. These inputs have a ±25 range and feature hysteresis and time-domain filtering. The outputs are TTL and CMOS compatible. The 1489E has a 120kbps guaranteed data rate. Supply current is typically 350µA. The 1489E is pin compatible with the MC1489, MC14C89, SN75189, SN75C189, S1489, and S14C89. It is available in 14-pin plastic I and SO packages. Applications C Motherboards Modems Interfacing ata Terminal Equipment (TE) with ata Circuit-Terminating Equipment (CE) Equipment Meeting IEC (formerly IEC801-2) or ±15k ES rotection Features Enhanced ES rotection: ±15k Human Body Model ±8k IEC , Contact ischarge ±15k IEC , Air-Gap ischarge Latchup Free uring an ES Event Low 350µA Supply Current Input Hysteresis and Time-omain Filtering Eliminate the Need for External Filtering Stable Input Thresholds in Compatible with MC1489, MC14C89, SN75189, SN75C189, S1489, and S14C89 Ordering Information ART TEM. RANGE IN-ACKAGE 1489EC 1489ECS 1489EC/ 0 C to +70 C 0 C to +70 C 0 C to +70 C 14 lastic I 14 SO ice* 1489EE -40 C to +85 C 14 lastic I 1489EES -40 C to +85 C 14 SO * ice are specified at T A = +25 C. 1489E Typical Operating Circuit in Configuration E E TO IEW TTL/CMOS LOGIC INTERCONNECTING CABLE TTL/CMOS LOGIC INUT A OUTUT A E CC INUT INUT B 4 11 OUTUT 5 10 INUT C E E OUTUT B 6 9 SIGNAL GROUN GN 7 8 OUTUT C C MOTHERBOAR (TE) MOEM (CE) I/SO Maxim Integrated roducts 1 Call toll free for free samples or literature.

2 ±15k ES-rotected, Quad, 1489E ABSOLUTE IMUM RATINGS Supply oltage ( CC )...+7 Input oltage ( IN )...±30 Output Short-Circuit Current (Shorted to GN or CC ) (Note 1)...Self Limiting Continuous ower issipation (T A = +70 C) lastic I (derate 10.00mW/ C above +70 C)...800mW SO (derate 8.7mW/ C above +70 C)...695mW Operating Temperature Ranges 1489EC_...0 C to +70 C 1489EE_ C to +85 C Storage Temperature Range C to +160 C Lead Temperature (soldering, 10sec) C Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ELECTRICAL CHARACTERISTICS ( CC = 5 ±10%, T A = T to T, unless otherwise noted. Typical values are at CC = 5, T A = +25 C.) ARAMETER C CHARACTERISTICS Output oltage High Output oltage Low Output Short-Circuit Current (Note 1) Supply Current Input oltage Range Input oltage High Input oltage Low Input Hysteresis Input Resistance TIG CHARACTERISTICS SYMBOL OH OL I OS I CC IN IH IL HYST R IN CONITIONS I OUT = -3.2mA IN 0.4 I OUT = -20µA IN 2.4, I OUT = 3.2mA Shorted to GN Shorted to CC TY UNITS ma µa kω Output ropagation elay, Low to High t LH Figure µs Output ropagation elay, High to Low t HL Figure µs Output ropagation elay Skew, I t LH - t HL I Output Transition Time Input Noise Rejection Guaranteed ata Rate ES CHARACTERISTICS ES rotection t SKEW t TR t N R Figure 1 70 OUT = 10% to 90% ulse amplitude = 5 (Note 2) Human Body Model ±15 IEC (Contact ischarge) ±8 IEC (Air-Gap ischarge) ±15 ns ns µs kbps k Note 1: Only one output may be shorted at a time. Note 2: See Noise ulse Rejection graph in Typical Operating Characteristics section. 2

3 ±15k ES-rotected, Quad, Typical Operating Characteristics ( CC = 5, T A = +25 C, unless otherwise noted.) ROAGATION ELAY (µs) ROAGATION ELAY vs. TEMERATURE t HL t LH TEMERATURE ( C) 1489E-01 ROAGATION ELAY SKEW (ns) ROAGATION ELAY SKEW vs. TEMERATURE CC = 5.25 CC = 5 CC = TEMERATURE ( C) 1489E-02 INUT ULSE AMLITUE (p-p) NOISE ULSE REJECTION IN = ( IL + IH) ± ULSE AM, 2 2 f = 300kHz INUT ULSE WITH (µs) 1489E E in escription IN 1, 4, 10, 13 2, 5, 9, 12 NAME INUT_ Receiver Inputs FUNCTION No Connect not internally connected S.G t HL 90% t LH OH 3, 6, 8, 11 OUTUT_ Receiver Outputs OUT 50% 50% 7 GN Ground 10% 14 CC Supply oltage t TR t TR OL CC SIGNAL GENERATOR (S.G.) 50pF OUT NOTE: S.G. SET TO f = 20kHz; UTY CYCLE = 50%; t R, t F < 5.0ns Figure 1. Timing iagram 3

4 ±15k ES-rotected, Quad, 1489E HIGH- OLTAGE C SOURCE R C 1M CHARGE-CURRENT LIMIT RESISTOR Cs 100pF R 1500Ω ISCHARGE RESISTANCE STORAGE CAACITOR EICE UNER TEST AMERES I 100% 90% 36.8% 10% 0 0 t RL Ir TIME t L CURRENT WAEFORM EAK-TO-EAK RINGING (NOT RAWN TO SCALE) Figure 2a. Human Body ES Test Model Figure 2b. Human Body Model Current Waveform etailed escription ±15k ES rotection As with all Maxim devices, ES protection structures are incorporated on all pins to protect against electrostatic discharges encountered during handling and assembly. The 1489E receiver inputs have extra protection against static electricity found in normal operation. Maxim s engineers developed state-of-theart structures to protect these pins against ES of ±15k without damage. After an ES event, the 1489E keeps working without latchup. ES protection can be tested in various ways; the receiver inputs are characterized for protection to the following: 1) ±15k using the Human Body Model 2) ±8k using the Contact ischarge method specified in IEC (formerly IEC801-2) 3) ±15k using the Air-Gap ischarge method specified in IEC (formerly IEC801-2). ES Test Conditions Contact Maxim for a reliability report that documents test setup, methodology, and results. Human Body Model Figure 2a shows the Human Body Model, and Figure 2b shows the current waveform it generates when discharged into a low impedance. This model consists of a 100pF capacitor charged to the ES voltage of interest, which is then discharged into the test device through a 1.5kΩ resistor. IEC The IEC standard covers ES testing and performance of finished equipment; it does not specifically refer to integrated circuits. The 1489E helps you design equipment that meets Level 4 (the highest level) of IEC , without additional ES protection components. The major difference between tests done using the Human Body Model and IEC is higher peak current in IEC Because series resistance is lower in the IEC ES test model (Figure 3a), the ES withstand voltage measured to this standard is generally lower than that measured using the Human Body Model. Figure 3b shows the current waveform for the ±8k IEC Level 4 ES Contact ischarge test. The Air-Gap test involves approaching the device with a charged probe. The Contact ischarge method connects the probe to the device before the probe is energized. 4

5 ±15k ES-rotected, Quad, HIGH- OLTAGE C SOURCE R C 50M to 100M CHARGE-CURRENT LIMIT RESISTOR Cs 150pF R 330Ω ISCHARGE RESISTANCE STORAGE CAACITOR EICE UNER TEST IEAK I 100% 90% 10% t r = 0.7ns to 1ns 30ns 60ns t 1489E Figure 3a. IEC ES Test Model Figure 3b. IEC ES Generator Current Waveform Machine Model The Machine Model for ES testing uses a 200pF storage capacitor and zero-discharge resistance. Its objective is to mimic the stress caused by contact that occurs with handling and assembly during manufacturing. Of course, all pins (not just RS-232 inputs and outputs) require this protection during manufacturing. Therefore, the Machine Model is less relevant to the I/O ports than the Human Body Model and IEC Applications Information Use proper layout to ensure other devices on your board are not damaged in an ES strike. Currents as high as 60A can instantaneously pass through the ground pin, so it is important to minimize the groundlead return path to the power supply. A separate return path to the power supply is recommended. Trace widths should be greater than 40 mils. CC must be bypassed with 0.1µF capacitors as close to the part as possible to ensure maximum ES protection. 5

6 ±15k ES-rotected, Quad, 1489E Chip Topography CC INUT A INUT OUTUT A OUTUT INUT B INUT C 0.096" (2.438mm) OUTUT B OUTUT C GN 0.071" (1.803mm) TRANSISTOR COUNT: 144 SUBSTRATE CONNECTE TO GN 6

7 1489E ±15k ES-rotected, Quad, 7 ackage Information IM A A1 A2 A3 B B1 C 1 E E1 e ea eb L INCHES MILLIMETERS lastic I LASTIC UAL-IN-LINE ACKAGE (0.300 in.) IM KG. N INCHES MILLIMETERS INS C A A2 E1 E ea eb A3 B1 B 0-15 A1 L 1 e A

8 ±15k ES-rotected, Quad, 1489E ackage Information (continued) e B A1 A 0.101mm 0.004in. C L 0-8 IM A A1 B C E e H L INCHES MILLIMETERS E H Narrow SO SMALL-OUTLINE ACKAGE (0.150 in.) IM INS INCHES MILLIMETERS A Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are implied. Maxim reserves the right to change the circuitry and specifications without notice at any time. 8 Maxim Integrated roducts, 120 San Gabriel rive, Sunnyvale, CA (408) Maxim Integrated roducts rinted USA is a registered trademark of Maxim Integrated roducts.