Advanced Process Technoogy Utra Low OnResistance Dynamic dv/dt Rating 75 C Operating Temperature Fast Switching Fuy Avaanche Rated Description Advanced HEXFET Power MOSFETs from Internationa Rectifier utiize advanced processing techniques to achieve extremey ow onresistance per siicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are we known for, provides the designer with an extremey efficient and reiabe device for use in a wide variety of appications. The TO220 package is universay preferred for a commerciaindustria appications at power dissipation eves to approximatey 50 watts. The ow therma resistance and ow package cost of the TO220 contribute to its wide acceptance throughout the industry. G IRL2203N HEXFET Power MOSFET D S TO220AB PD 9366 V DSS = 30V R DS(on) = 7.0mΩ I D = 6A Absoute Maximum Ratings Parameter Max. Units I D @ T C = 25 C Continuous Drain Current, @ 0V 6 I D @ T C = C Continuous Drain Current, @ 0V 82 A I DM Pused Drain Current 400 P D @T C = 25 C Power Dissipation 80 W Linear Derating Factor.2 W/ C GatetoSource Votage ± 6 V I AR Avaanche Current 60 A E AR Repetitive Avaanche Energy 8 mj dv/dt Peak Diode Recovery dv/dt ƒ 5.0 V/ns T J Operating Junction and 55 to 75 T STG Therma Resistance Storage Temperature Range Sodering Temperature, for 0 seconds 300 (.6mm from case ) Mounting torque, 632 or M3 srew 0 bf in (.N m) Parameter Typ. Max. Units R θjc JunctiontoCase 0.85 R θcs CasetoSink, Fat, Greased Surface 0.50 C/W R θja JunctiontoAmbient 62 www.irf.com C 3/6/0
Eectrica Characteristics @ T J = 25 C (uness otherwise specified) Parameter Min. Typ. Max. Units Conditions V (BR)DSS DraintoSource Breakdown Votage 30 V = 0V, I D = 250µA V (BR)DSS / T J Breakdown Votage Temp. Coefficient 0.029 V/ C Reference to 25 C, I D = ma R DS(on) Static DraintoSource OnResistance 7.0 = 0V, I D = 60A mω 0 = 4.5V, I D = 48A (th) Gate Threshod Votage.0 V V DS =, I D = 250µA g fs Forward Transconductance 73 S V DS = 25V, I D = 60A I DSS DraintoSource Leakage Current 25 V µa DS = 30V, = 0V 250 V DS = 24V, = 0V, T J = 25 C I GSS GatetoSource Forward Leakage = 6V na GatetoSource Reverse Leakage = 6V Q g Tota Gate Charge 60 I D = 60A Q gs GatetoSource Charge 4 nc V DS = 24V Q gd GatetoDrain ("Mier") Charge 33 = 4.5V, See Fig. 6 and 3 t d(on) TurnOn Deay Time V DD = 5V t r Rise Time 60 I D = 60A t d(off) TurnOff Deay Time 23 R G =.8Ω t f Fa Time 66 = 4.5V, See Fig. 0 Between ead, L D Interna Drain Inductance 4.5 6mm (0.25in.) nh G from package L S Interna Source Inductance 7.5 and center of die contact C iss Input Capacitance 3290 = 0V C oss Output Capacitance 270 V DS = 25V C rss Reverse Transfer Capacitance 70 pf ƒ =.0MHz, See Fig. 5 E AS Singe Puse Avaanche Energy 320 290 mj I AS = 60A, L = 0.6mH D S SourceDrain Ratings and Characteristics Parameter Min. Typ. Max. Units Conditions D I S Continuous Source Current MOSFET symbo 6 (Body Diode) showing the A G I SM Pused Source Current integra reverse 400 (Body Diode) pn junction diode. S V SD Diode Forward Votage.2 V T J = 25 C, I S = 60A, = 0V t rr Reverse Recovery Time 56 84 ns T J = 25 C, I F = 60A Q rr Reverse Recovery Charge 0 70 nc di/dt = A/µs t on Forward TurnOn Time Intrinsic turnon time is negigibe (turnon is dominated by L S L D ) Notes: Repetitive rating; puse width imited by ƒ I SD 60A, di/dt 0A/µs, V DD V (BR)DSS, max. junction temperature. ( See fig. ) T J 75 C Starting T J = 25 C, L = 0.6mH Puse width 400µs; duty cyce 2%. R G = 25Ω, I AS = 60A, =0V (See Figure 2) This is a typica vaue at device destruction and represents operation outside rated imits. This is a cacuated vaue imited to T J = 75 C. Cacuated continuous current based on maximum aowabe junction temperature. Package imitation current is 75A. 2 www.irf.com
I D, DraintoSource Current (A) 0 0 VGS TOP 5V 0V 4.5V 3.7V 3.5V 3.3V 3.0V BOTTOM 2.7V 2.7V I D, DraintoSource Current (A) 0 0 VGS TOP 5V 0V 4.5V 3.7V 3.5V 3.3V 3.0V BOTTOM 2.7V 2.7V 20µs PULSE WIDTH T J = 25 C 0. 0 V DS, DraintoSource Votage (V) 20µs PULSE WIDTH T J = 75 C 0. 0 V DS, DraintoSource Votage (V) Fig. Typica Output Characteristics Fig 2. Typica Output Characteristics I D, DraintoSource Current (A) 0 T J = 25 C T = 75 J C V DS= 5V 20µs PULSE WIDTH 0 2.0 3.0 4.0 5.0 6.0 7.0, GatetoSource Votage (V) R DS(on), DraintoSource On Resistance (Normaized) 2.5 I D = A 2.0.5.0 0.5 = 0V 0.0 60 40 20 0 20 40 60 80 20 40 60 80 T J, Junction Temperature ( C) Fig 3. Typica Transfer Characteristics Fig 4. Normaized OnResistance Vs. Temperature www.irf.com 3
I D, DraintoSource Current (A) IRL2203N C, Capacitance (pf) 6000 VGS = 0V, f = MHz Ciss = Cgs Cgd, C ds SHORTED C = 5000 rss Cgd Coss = Cds Cgd 4000 C iss 3000 2000 C oss 0 C rss 0 0 V DS, DraintoSource Votage (V), GatetoSource Votage (V) 5 2 9 6 3 I = D 60A V DS = 24V V DS = 5V FOR TEST CIRCUIT SEE FIGURE 3 0 0 20 40 60 80 Q G, Tota Gate Charge (nc) Fig 5. Typica Capacitance Vs. DraintoSource Votage Fig 6. Typica Gate Charge Vs. GatetoSource Votage I SD, Reverse Drain Current (A) 0 0 T J = 75 C T J = 25 C = 0 V 0. 0.0 0.4 0.8.2.6 2.0 2.4 V SD,SourcetoDrain Votage (V) 00 0 0 Tc = 25 C Tj = 75 C Singe Puse OPERATION IN THIS AREA LIMITED BY R DS (on) µsec msec 0msec 0 V DS, DraintoSource Votage (V) Fig 7. Typica SourceDrain Diode Forward Votage Fig 8. Maximum Safe Operating Area 4 www.irf.com
20 LIMITED BY PACKAGE V DS R D I D, Drain Current (A) 80 60 40 20 0 25 50 75 25 50 75 T, Case Temperature ( C C) Fig 9. Maximum Drain Current Vs. Case Temperature V DS 90% R G Puse Width µs Duty Factor 0. % D.U.T. Fig 0a. Switching Time Test Circuit 0% t d(on) t r t d(off) t f Fig 0b. Switching Time Waveforms V DD Therma Response (Z thjc ) 0. D = 0.50 0.20 0.0 0.05 0.02 0.0 SINGLE PULSE (THERMAL RESPONSE) Notes:. Duty factor D = t / t 2 2. Peak T J = P DM x Z thjc TC 0.0 0.0000 0.000 0.00 0.0 0. t, Rectanguar Puse Duration (sec) PDM t t2 Fig. Maximum Effective Transient Therma Impedance, JunctiontoCase www.irf.com 5
R G V DS 20V tp L D.U.T IAS 0.0Ω Fig 2a. Uncamped Inductive Test Circuit tp 5V DRIVER V DD A V (BR)DSS E AS, Singe Puse Avaanche Energy (mj) 600 500 400 300 200 TOP BOTTOM I D 24A 42A 60A 0 25 50 75 25 50 75 Starting T, Junction Temperature ( J C) Fig 2c. Maximum Avaanche Energy Vs. Drain Current I AS Fig 2b. Uncamped Inductive Waveforms Current Reguator Same Type as D.U.T. 50KΩ Q G 2V.2µF.3µF Q GS Q GD D.U.T. V DS V G 3mA Charge Fig 3a. Basic Gate Charge Waveform I G I D Current Samping Resistors Fig 3b. Gate Charge Test Circuit 6 www.irf.com
Peak Diode Recovery dv/dt Test Circuit D.U.T* ƒ Circuit Layout Considerations Low Stray Inductance Ground Pane Low Leakage Inductance Current Transformer R G dv/dt controed by R G I SD controed by Duty Factor "D" D.U.T. Device Under Test V DD * Reverse Poarity of D.U.T for PChanne Driver Gate Drive Period P.W. D = P.W. Period [ =0V ] *** D.U.T. I SD Waveform Reverse Recovery Current ReAppied Votage Body Diode Forward Current di/dt D.U.T. V DS Waveform Diode Recovery dv/dt Inductor Curent Body Diode Rippe 5% Forward Drop [ V DD ] [ ] I SD *** = 5.0V for Logic Leve and 3V Drive Devices Fig 4. For Nchanne HEXFET power MOSFETs www.irf.com 7
Package Outine TO220AB Dimensions are shown in miimeters (inches) 2.87 (.3) 2.62 (.03) 0.54 (.45) 0.29 (.405) 3.78 (.49) 3.54 (.39) A 4.69 (.85) 4.20 (.65) B.32 (.052).22 (.048) 5.24 (.600) 4.84 (.584) 4 6.47 (.255) 6.0 (.240) 2 3.5 (.045) M IN LEAD ASSIGNMENTS GATE 2 DRAIN 3 SOU RC E 4 DRAIN 4.09 (.555) 3.47 (.530) 4.06 (.60) 3.55 (.40) 3X.40 (.055).5 (.045) 2.54 (.) 2X NOTES: 3X 0.93 (.037) 0.69 (.027) 0.36 (.04) M B A M 0.55 (.022) 3X 0.46 (.08) 2.92 (.5) 2.64 (.04) D IM E N S IO N IN G & TO L E R A N C ING P E R A N S I Y 4.5M, 9 82. 3 O U T LIN E C O N F O R M S TO JE D E C O U T LIN E TO 2 20 A B. 2 CONTROLLING DIMENSION : INCH 4 HEATSINK & LEAD MEASUREMENTS DO NOT INCLUDE BURRS. Part Marking Information TO220AB EXAMPLE : THIS IS AN IRF00 W ITH ASSEMBLY LOT CODE 9BM INTERNATIONAL RECTIFIER LOGO ASSEMBLY LOT CO DE IRF00 9246 9B M PART NUMBER DATE CODE (YYWW) YY = YEAR WW = WEEK A Data and specifications subject to change without notice. This product has been designed and quaified for the industria market. Quaification Standards can be found on IR s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., E Segundo, Caifornia 90245, USA Te: (30) 252705 TAC Fax: (30) 2527903 Visit us at www.irf.com for saes contact information. 3/0 8 www.irf.com
Note: For the most current drawings pease refer to the IR website at: http://www.irf.com/package/