ESD7484. 4-Line Ultra-Large Bandwidth ESD Protection



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4-Line Ultra-Large Bandwidth ESD Protection Functional Description The ESD7484 chip is a monolithic, application specific discrete device dedicated to ESD protection of the HDMI connection. It also offers the same high level of protection for IEEE 194a and IEEE 194b/c, USB.0, Ethernet links, and video lines. Its ultra high cutoff frequency (5. GHz) secures a high level of signal integrity. The device topology provides this integrity without compromising the complete protection of ICs against the most stringent ESD strikes. Features Wideband Performance Flow Through Layout Low Profile with Small Footprint: 1.6 mm x 1.1 mm Package 0.4 mm Pitch WLCSP Package IEC61000 4 Level 4 (At External Pins) ± 15 kv (Air Discharge) ± 15 kv (Contact Discharge) These Devices are Pb Free, Halogen Free and are RoHS II Compliant WLCSP10 CASE 567DE MARKING DIAGRAM 84 YW 84 = Specific Device Code Y = Year W = Work Week = Pb Free Package ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 6 of this data sheet. Applications Mobile Phones and Communications Systems HDMI Ports at 1.65 Gb/s and up to. Gb/s Video Out Protection 1 A D OUT _1+ D IN _1+ B GND External (Connector) C D D OUT _1 D OUT _+ D IN _1 D IN _+ Internal (ASIC) E GND F D OUT _ D IN _ Figure 1. Pin Configuration (Bump View) Semiconductor Components Industries, LLC, 011 October, 011 Rev. 0 1 Publication Order Number: ESD7484/D

ABSOLUTE MAXIMUM RATINGS Symbol Parameter Value Unit V PP ESD IEC61000 4, level 4 air discharge (external pins) ESD IEC61000 4, level 4 contact discharge (external pins) ±15 ±15 kv P PP Peak Pulse Power Dissipation (8/0 s) 70 W T J Maximum Junction Temperature 15 C T stg Storage Temperature Range 55 to +150 C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. ELECTRICAL CHARACTERISTICS (Note 1) Symbol Test Condition Min Typ Max Unit V BR Breakdown Voltage (Ir = 1 ma) 6 9 V I RM Leakage Current @ V rm (V rm = V per line) 100 na C line V line = 0 V, V osc = 0 mv, F = 1 MHz, Capacitor between I/O and GND 1.6 1.75 pf V line = 0 V, V osc = 0 mv, F = 1 MHz, Capacitor between I/O 0.8 C I/O I/O V line = 0 V, V osc = 0 mv, F = 1 MHz, Capacitance Variation between I/O 0.006 pf 1. All parameters specified at T A = 5 C unless otherwise noted.. Standard IEC 61000 4 with C Discharge = 150 pf, R Discharge = 0.

TYPICAL CHARACTERISTICS Figure. HDMI1.4 Test Conditions.4 Gb/s Datarate; Clears HDMI Source Mask Figure. S1 Plot Figure 4. Crosstalk Measurements Figure 5. ESD Clamping Voltage Screenshot Positive 8 kv Contact per IEC61000 4 Figure 6. ESD Clamping Voltage Screenshot Negative 8 kv Contact per IEC61000 4

IEC61000 4 Spec. Level Test Voltage (kv) First Peak Current (A) Current at 0 ns (A) Current at 60 ns (A) 1 7.5 4 4 15 8 4 6.5 1 6 4 8 0 16 8 IEC61000 4 Waveform I peak 100% 90% I @ 0 ns I @ 60 ns 10% t P = 0.7 ns to 1 ns ESD Gun TVS Figure 7. IEC61000 4 Spec Oscilloscope 50 Cable 50 Figure 8. Diagram of ESD Clamping Voltage Test Setup The following is taken from Application Note AND808/D Interpretation of Datasheet Parameters for ESD Devices. ESD Voltage Clamping For sensitive circuit elements it is important to limit the voltage that an IC will be exposed to during an ESD event to as low a voltage as possible. The ESD clamping voltage is the voltage drop across the ESD protection diode during an ESD event per the IEC61000 4 waveform. Since the IEC61000 4 was written as a pass/fail spec for larger systems such as cell phones or laptop computers it is not clearly defined in the spec how to specify a clamping voltage at the device level. ON Semiconductor has developed a way to examine the entire voltage waveform across the ESD protection diode over the time domain of an ESD pulse in the form of an oscilloscope screenshot, which can be found on the datasheets for all ESD protection diodes. For more information on how ON Semiconductor creates these screenshots and how to interpret them please refer to AND807/D. % OF PEAK PULSE CURRENT 100 90 80 70 60 50 40 0 0 10 t r t P PEAK VALUE I RSM @ 8 s PULSE WIDTH (t P ) IS DEFINED AS THAT POINT WHERE THE PEAK CURRENT DECAY = 8 s HALF VALUE I RSM / @ 0 s 0 0 0 40 60 80 t, TIME ( s) Figure 9. 8 x 0 s Pulse Waveform 4

Figure 10. Positive TLP I V Curve Transmission Line Pulse (TLP) Measurement Transmission Line Pulse (TLP) provides current versus voltage (I V) curves in which each data point is obtained from a 100 ns long rectangular pulse from a charged transmission line. A simplified schematic of a typical TLP system is shown in Figure 1. TLP I V curves of ESD protection devices accurately demonstrate the product s ESD capability because the 10s of amps current levels and under 100 ns time scale match those of an ESD event. This is illustrated in Figure 1 where an 8 kv IEC61000 4 current waveform is compared with TLP current pulses at 8 A and 16 A. A TLP I V curve shows the voltage at which the device turns on as well as how well the device clamps voltage over a range of current levels. A typical TLP I V curve for the ESD78 is shown in Figures 10 and 11. 50 Coax Cable L Figure 11. Negative TLP I V Curve 10 M V C S Attenuator V M Oscilloscope DUT Figure 1. Simplified Schematic of a Typical TLP System I M 50 Coax Cable Figure 1. Comparison Between 8 kv IEC61000 4 and 8 A and 16 A TLP Waveforms 5

TYPICAL APPLICATION SCHEMATIC ESD7484 ESD7484 HDMI Type C Connector Data Shield Data + 1 A A1 C C1 B D D1 F F1 E A A1 C C1 B D D1 F F1 E Data + Data Data Data1 Shield 4 Data1 + 5 Data1 + Data1 6 Data1 Data0 Shield 7 Data0 + 8 Data0 + Data0 9 Data0 CLK Shield 10 CLK + 11 CLK + CLK 1 CLK DDC GROUND 1 CEC 14 CEC SCL 15 SCL SDA 16 SDA Reserved 17 +5 Power +5 Power 18 HPD HPD 19 A1 C B A A 5V HPD SDA SCL CEC 1.75K C1 5V 1.75K B, C 100K 7K B1 VDD_CEC ESD584 Figure 14. Typical Application Schematic ORDERING INFORMATION Part Number Chip Size (mm) Pocket Size (mm) B 0 X A 0 X K 0 P 0 P 1 Package Shipping ESD7484 1.6 x 1.1 x 0.615 1.80 x 1.7 x 0.7 4 mm 4 mm WLCSP10 (Pb Free) 5000 / Tape & Reel For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. 6

PACKAGE DIMENSIONS WLCSP10, 1.60x1.10 CASE 567DE 01 ISSUE O PIN A1 REFERENCE X X È D TOP VIEW A A B E NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.. CONTROLLING DIMENSION: MILLIMETERS.. COPLANARITY APPLIES TO SPHERICAL CROWNS OF SOLDER BALLS. MILLIMETERS DIM MIN MAX A 0.57 0.6 A1 0.17 0.4 A 0.41 REF b 0.4 0.9 D 1.60 BSC E 1.10 BSC ed 0.400 BSC ee 0.47 BSC NOTE 10X A1 b A B 0.0 C 1 ed SIDE VIEW ed/ A C ee SEATING PLANE 0.5 PITCH RECOMMENDED SOLDERING FOOTPRINT* 0.40 PITCH 0.0 PITCH PACKAGE OUTLINE A1 10X 0.5 DIMENSIONS: MILLIMETERS ABC DEF BOTTOM VIEW *For additional information on our Pb Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Typical parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including Typicals must be validated for each customer application by customer s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 516, Denver, Colorado 8017 USA Phone: 0 675 175 or 800 44 860 Toll Free USA/Canada Fax: 0 675 176 or 800 44 867 Toll Free USA/Canada Email: orderlit@onsemi.com N. American Technical Support: 800 8 9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 41 790 910 Japan Customer Focus Center Phone: 81 577 850 7 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative ESD7484/D