1st International Workshop on Nano-scale Spectroscopy and its Applications to Semiconductor Research. Program
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1 1st International Workshop on Nano-scale Spectroscopy and its Applications to Semiconductor Research Program Sunday, 10 December :00-20:00 Welcome reception at the ICTP Monday, 11 December :45-9:00 Opening remarks by the workshop chairman G. Salviati Session Synchrotron radiation techniques I, chair: Y. Watanabe 9:00-9:45 T. Kinoshita, University of Tokyo: WHAT CAN WE DO BY PHOTOELECTRON SPECTROMOCROSCOPY? 9:45-10:10 S. Di Fonzo, Sincrotrone Trieste: NON-DESTRUCTIVE DETERMINATION OF LOCAL STRAIN UNDER BURIED INTERFACES WITH 100-NANOMETER SPATIAL RESOLUTION 10:10-10:35 K. C. Prince, Sincrotrone Trieste: Surface chemistry of lead sulphide 10:35-11:30 coffee break Session Synchrotron radiation techniques II, chair: N. Ueno 11:30-11:55 M. Kiskinova, Sincrotrone Trieste: Scanning Photoemission Microscopy: recent developments and applications 11:55-12:20 R. J. Phaneuf, University of Maryland: Spatially Resolved Spectra and Energetically Resolved Photoelectron Images
2 of Reactive Surface Phases and PN-Junctions 12:20-12:45 R. Larciprete, Sincrotrone Trieste: VISIBLE AND UV PULSED LASER PROCESSING OF THE Ti/Si(001) INTERFACE STUDIED BY XPS MICROSCOPY WITH SYNCHROTRON RADIATION 12:45-13:10 E. Di Fabrizio, INFM-TASC: Zone Plate for x-ray applications 13:10-14:30 lunch break Session Synchrotron radiation techniques III, chair: M. Kiskinova 14:30-15:15 N. Ueno, Chiba University: Imaging of organic thin films using electron emission microscope 15:15-15:40 M. Cinchetti, Johannes Gutenberg Universität Mainz: The Effect of Surface Defects on the Efficiency of GaAsP Photoemitters for Polarised Electron Sources 15:40-16:05 M. Mynar, Delong Instruments: X-ray photoemission and low energy electron microscope 16:05-16:30 B. Kaulich, ESRF: X-RAY MICROSCOPY AND SPECTROMICROSCOPY TECHNIQUES USING MULTI KEV PHOTONS 16:30-17:00 coffee break Session Synchrotron radiation techniques IV, chair:t. Kinoshita 17:00-17:45 S. Heun, Sincrotrone Trieste: PHOTOELECTRON SPECTROSCOPY FROM INDIVIDUAL HETEROEPITAXIAL NANOCRYSTALS ON GaAs(001) 17:45-18:10 M. Bertolo, Sincrotrone Trieste: Cross-sectional photoemission microscopy of semiconductor heterostructures
3 Tuesday, 12 December 2000 Session Synchrotron radiation techniques V, chair: S. Heun 9:00-9:45 Y. Watanabe, NTT Basic Research Laboratories: Synchrotron radiation photoelectron spectroscopy of nanostructures 9:45-10:10 A. Barinov, Sincrotrone Trieste: Formation stages and thermal stability of metal/n-gan interface 10:10-10:35 C. Teichert, Montanuniversität Leoben: Self-organized semiconductor nanostructures and their applications 10:35-11:30 coffee break Session Scanning probe techniques I, chair: S. Ushioda 11:30-12:15 R. Cingolani, Universita' di Lecce: Wavefunction mapping in single quantum dots 12:15-12:40 J. Wiebe, Hamburg University: An Ultra High Vacuum-300 mk-scanning Tunneling Microscope for Local Measurements of the Density of States on InAs(110) 12:40-13:05 F. Rosei, Università di Roma Tor Vergata: Growth and characterization of Ge/Si(111) quantum dots by Scanning Tunneling Microscopy 13:05-15:00 lunch break 15:00-18:00 Excursion to Sincrotrone Trieste Wednesday, 13 December 2000 Session Scanning probe techniques II, chair: M. Sakurai 9:00-9:45 S. Ushioda, Tohoku University: Probing of electronic transitions with atomic scale spatial resolution 9:45-10:10 T. K. Johal, Universita di Lecce:
4 IMAGING OF QUANTUM DOT STATES BY SCANNING TUNNELING SPECTROSCOPY 10:10-10:35 K. Kanisawa, NTT Basic Research Laboratories: IMAGING OF ZERO-DIMENSIONAL STATES IN SEMICONDUCTOR NANOSTRUCTURES USING SCANNING TUNNELING MICROSCOPY 10:35-11:00 B. Ressel, Sincrotrone Trieste: ELECTRONIC STRUCTURE OF THE Pb/Si(111) MOSAIC PHASE 11:00-11:30 coffee break Session Scanning probe techniques III, chair: M. Colocci 11:30-12:15 M. Sakurai, RIKEN: STM-INDUCED LIGHT EMISSION FROM NANOSTRUCTURES ON A SI(001)-(2X1)-D SURFACE 12:15-12:40 L. Ottaviano, INFM Unità dell'aquila: On the spatially resolved electronic structure of polycristalline WO3 films investigated with Scanning Tunneling Spectroscopy 12:40-13:05 J. P. Singh, Nuclear science Centre New Delhi: Electronic excitations induced enhancement in metallicity on HOPG and Si surfaces: in-situ STM/STS studies 13:05-14:30 lunch break Session Scanning probe techniques IV, chair: K. Yagi 14:30-15:15 S.-W. Hla, Freie Universität Berlin: Single Molecule Engineering with a Scanning Tunneling Microscope 15:15-15:40 H. Iwasaki, Osaka University: STM Nanolithography on SiO2/Si 15:40-16:05 N. Jug, Institute Josef Stefan Ljubljana: Surface structure of some transition-metal trichalchogenides
5 16:05-16:50 A. Armigliato, CNR-Istituto LAMEL Bologna: STRAIN ANALYSIS IN SUBMICRON ELECTRON DEVICES BY CONVERGENT BEAM ELECTRON DIFFRACTION 16:50-17:00 coffee break Session Scanning probe techniques V, chair: S.-W. Hla 17:00-17:45 M. Colocci, INFM Firenze: New trends in the optical investigation of semiconductor heterostructures at the nanoscale 17:45-18:10 A. Crottini, Swiss Federal Institute of Technology Lausanne: A novel tip-surface distance control for low temperature scanning near-field photoluminescence spectroscopy 18:10-18:35 L. Sirigu, Swiss Federal Institute of Technology-EPFL Lausanne: OPTICAL PROPERTIES OF V-GROOVE QUANTUM WIRE LASERS AND LED 20:00-23:00 Social dinner Thursday, 14 December 2000 Session Electron microscopy techniques I, chair: G. Salviati 9:00-9:45 N. Yamamoto, Tokyo Institute of Technology: TEM-Cathodoluminescence Study of Microstructures and Defects in Semiconductor Epilayers 9:45-10:10 M. Ivanda, Rudjer Boskovic Institute Zagreb: COMPARISON OF HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY AND LOW FREQUENCY RAMAN SCATTERING IN DETERMINATION OF PARTICLES SIZE DISTRIBUTION OF NANOSIZED TiO2 10:10-10:35 A. Patnaik, Indian Institute of Technology Madras: STRUCTURE AND CHARGE TRANSPORT IN N+ BEAM INDUCED pi- BONDED NANOCRYSTALLINE CLUSTERS IN POLY PHENYLENE OXIDE
6 10:35-11:00 J. Swiatowska-Mrowiecka, University of Mining and Metallurgy: INFLUENCE OF THE CRYSTALLOGRAFIC ORIENTATION ON THE MECHANISM OF ZINC DISSOLUTION IN ORGANIC SOLVENTS 11:00-11:30 coffee break Session Electron microscopy techniques II, chair: N. Yamamoto 11:30-12:15 K. Yagi, Tokyo Institute of Technology: Surface Imaging with use of an Energy Filter 12:15-12:40 V.Grillo, Universitaet Erlangen-Nuernberg: COMPOSITIONAL FLUCTUATIONS AND LUMINESCENCE PROPERTIES OF InGaN QUANTUM WELLS GROWN ON GaN AND SAPPHIRE SUBSTRATES: A COMPARISON 12:40-13:05 M. Starowicz, University of Mining and Metallurgy, Krakow: ELECTROCHEMICAL DEPOSITION OF SI(IV) COMPOUNDS ON THE METAL SURFACE FROM ANHYDROUS ORGANIC SOLVENTS 13:05-14:30 lunch break Session Electron microscopy techniques III, chair: T. Sekiguchi 14:30-15:15 G. Salviati, MASPEC-CNR Institute Parma: Cathodoluminescence submicrometric depth profiling of optical emissions in semiconducting heterostructures and devices 15:15-15:40 O. Martinez, Dpto. Física de la Materia Condensada. E.T.S.I.I. Valladolid: MICROCHARACTERIZATION OF CONFORMAL GaAs AND AlGaAs ON Si LAYERS BY SPATIALLY RESOLVED OPTICAL TECHNIQUES 15:40-16:25 T. Sekiguchi, National Research Institute for Metals Tsukuba: Low-energy Cathodoluminescence Study of Semiconductor Nanostructures and Nanoparticles 16:25-16:40 Concluding remarks by the workshop vice-chairman N. Yamamoto Friday, 15 December 2000
7 8:00-22:00 Excursion to CNR-MASPEC in Parma
List of Contributors. A. Armigliato CNR Istituto LAMEL, via P. Gobetti 101, 40129 Bologna, Italy armiglia@lamel.bo.cnr.it
Preface This book contains the invited and contributed papers presented at the International Workshop on Nanoscale Spectroscopy and Its Applications to Semiconductor Research which was held in Trieste,
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