Keysight Technologies Materials Measurement: Dielectric Materials. Application Brief

Transcription

1 Keysight Technologies Mateials Measuement: Dielectic Mateials Application Bief

2 2 Keysight Mateials Measuement: Dielectic Mateials - Application Bief Oveview Inceasing capability and pefomance of electonic equipment ae suppoted by the development of new devices, which in tun is enabled by pogess in mateial science and pocess technologies. Solution The paallel plate method uses two electodes between which the mateial unde test is sandwiched. The impedance of the mateial is measued and conveted to the complex pemittivity using the size of the mateial and the electodes. Dielectic mateials play a key ole in electonic cicuits such as capacitos o insulatos. Chaacteization of these mateials in the ealy stage of development is essential to pedict the pefomance of the final devices. The electical popeties of a dielectic mateial ae chaacteized by its complex pemittivity. The eal pat of pemittivity, also called dielectic constant, epesents the mateial s ability to stoe enegy when an extenal electic field is applied. Mateials with a highe dielectic constant can stoe moe enegy in a small volume, while those with a lowe value ae pefeed fo signal tansmission whee minimum popagation delay is citical. The imaginay pat of pemittivity epesents the loss dissipated in the mateial. Loss of mateial can lead to exta powe consumption. It is possible to achieve vaious dielectic constants by contolling the mico stuctue of ceamics o nano composition of mateials. Impedance analyzes can be used with dielectic mateial test fixtues to povide a pecise, epeatable, cost-effective and easyto-opeate measuement system ove wide fequency ange. ε * =ε' ε j " Figue 1. aallel plate method C t C t ε ' = = 2 ε A ε π (d / 2) ε " =ε ' tanδ whee ε* : complex pemittivity ε : pemittivity of fee space C : measued capacitance tan δ : measued loss tangent A : Aea of electode d: diamete of electode t: thickness of sample mateial oblem Thee ae vaious ways of measuing dielectic constant, howeve it equies specialized knowledge of electomagnetic field theoy. The Keysight 16451B dielectic mateial test fixtue povides pecise measuements up to 3 MHz when combined with the Keysight E499A impedance analyze. The 16451B, compliant to the ASTM D15 standad, has thee electodes, two of which fom a capacito and the emaining one povides a guad electode. A pat of the electical field between the two electodes flows outside of the dielectic mateial, which causes slightly lage capacitance, i.e. finge capacitance. The guad electode popely absobs the cuent flowing though the finge capacitance and povides accuate measuements. The paallel plate capacitance method is geneally used in low-fequency, which measues the capacitance of the mateial sandwiched between the two electodes. Its pinciple is staightfowad, but pecise measuements ae difficult due to the measuement eos, especially fo low loss mateials. The complex pemittivity is not a constant ove a wide fequency ange and must be evaluated at the fequency whee the mateial is used, howeve, at highe fequencies, eos due to the measuement system become significant. Figue 2. Effect of guad electode

3 3 Keysight Mateials Measuement: Dielectic Mateials - Application Bief In pepaation of the mateial, the flatness of the mateial suface is impotant to eliminate the ai gap between the electode and the mateial. To avoid the poblem caused by the suface oughness, the following two methods can be used. One is to apply thin film electodes on the suface of the dielectic mateial. Anothe method is the non-contacting electode method, which deives the complex pemittivity by compaing the two capacitances with and without the mateial between the electodes. The 16451B suppots both of these methods. View applications note EN fo moe details. Using this method, only eal chaacteistic can be achieved with Keysight s Impedance analyze solution, it povides 1) excellent phase accuacy enabling tanδ down to.6 and 2) takes into account of finge effect of the test fixtues to extact tue chaacteistics of MUT The guad technique is effective at low fequencies, but at highe fequencies, the guad electode gives an unfavoable effect to the electomagnetic field. The Keysight 16453A dielectic mateial fixtue s state-of-the-at design with compact electodes can extend the fequency ange. The softwae eliminates the finge capacitance when used with the Keysight E4991B impedance/ mateial analyze. Figue 4. Measuement esult example Fo the evaluation of tempeatue chaacteistics of dielectic mateials, a tempeatue chambe and heat esistant cables ae equied. Keysight supplies a pogam fo chambe contol and data analysis along with the heat esistant cable kit as an option fo the E4991B. Conclusion Figue 3. Stuctue of the 16453A In both systems, esidual eo due to the fixtue and the analyze can be emoved by open/shot/load compensation. The Keysight impedance analyze has the compensation function as a standad featue, which enables accuate measuements ove a wide fequency ange. These systems povide an accuate and efficient way to evaluate the dielectic popety of the mateial without knowledge of electomagnetic theoy o calibation techniques. All the calibation, coection and calculations ae done by the analyze and the esults ae diectly obtained. The gaph below shows a pemittivity example of diffeent dielectic mateials measued using the E499A with the 16451B and the E4991B with the 16453A fixtue. Advances in mateial science and pocess technologies have allowed fo new devices though the development of new mateials. Measuement systems with accuacy and stability ae desied fo time and cost effective evaluation. The aallel plate capacitance method is a standad technique fo the evaluation of dielectic mateial. Finge capacitance is a majo souce of eos and can be eliminated by using the appopiate fixtue and/o softwae coection, which enables simple and epeatable measuements ove a wide fequency ange. Keysight Technologies povides impedance analyzes, fixtues, calibation technique, softwae fo data analysis, and tempeatue chaacteistic evaluation. Fo moe infomation, application notes and papes ae available unde efeences.

4 4 Keysight Mateials Measuement: Dielectic Mateials - Application Bief Refeences 1. Teiikangas, Meja, Jai Juuti, and Heli Jantunen. ORGANIC- INORGANIC RF COMOSITES WITH ENHANCED ERMITTIVITY BY NANOARTICLE ADDITIONS. ogess In Electomagnetics Reseach 115 (211). 2. Liu, Xiaoxu, et al. Electical and mechanical popety study on thee-component polyimide nanocomposite films with titanium dioxide and montmoillonite. Thin Solid Films 544 (213): Web Resouces Visit ou websites fo additional poduct infomation. Mateials Test Equipment: Impedance Analyzes and LCR Metes: 3. Liu, Xiaoxu, et al. The popety and micostuctue study of polyimide/nano-tio< sub> 2</sub> hybid films with sandwich stuctues. Thin Solid Films 544 (213): Kim, Jin-Bong, Jin-Wo Yi, and Jung-Eun Nam. Dielectic polyme matix composite films of CNT coated with anatase TiO< sub> 2</sub>. Thin Solid Films (211): Sood, Bhanu, et al. Compaison of inted Cicuit Boad opety Vaiations in Response to Simulated Lead-Fee Soldeing. Electonics ackaging Manufactuing, IEEE Tansactions on 33.2 (21): ASTM, Test methods fo A-C loss chaacteistics and pemittivity (dielectic constant) of solid electical insulating mateials, ASTM Standad D 15, Ameican Society fo Testing and Mateials 7. The Institute fo Inteconnecting and ackaging Electonic Cicuits, Sandes Road, Nothbook, IL 662, ICTM-65 Test Methods Manual, McDonald, K. F., and K. Slenes. Advanced Capacito Development fo Maxed Modulatos. ulsed owe Confeence, 25 IEEE. IEEE, O Conno, K. A., J. Smith, and R. D. Cuy. Dielectic chaacteization of polyme-ceamic nanocomposites. ulsed owe Confeence, 29. C 9. IEEE. IEEE, Solutions fo Measuing emittivity and emeability with LCR Metes and Impedance Analyzes, Application Note Liteatue numbe EN 11. Basics of Measuing the Dielectic opeties of Mateials, Application note, Liteatue numbe EN

5 5 Keysight Mateials Measuement: Dielectic Mateials - Application Bief mykeysight A pesonalized view into the infomation most elevant to you. AdvancedTCA Extensions fo Instumentation and Test (AXIe) is an open standad that extends the AdvancedTCA fo geneal pupose and semiconducto test. Keysight is a founding membe of the AXIe consotium. LAN extensions fo Instuments puts the powe of Ethenet and the Web inside you test systems. Keysight is a founding membe of the LXI consotium. CI extensions fo Instumentation (XI) modula instumentation delives a ugged, C-based high-pefomance measuement and automation system. Thee-Yea Waanty Keysight s commitment to supeio poduct quality and lowe total cost of owneship. The only test and measuement company with thee-yea waanty standad on all instuments, woldwide. Keysight Assuance lans Up to five yeas of potection and no budgetay supises to ensue you instuments ae opeating to specification so you can ely on accuate measuements. Keysight Electonic Measuement Goup DEKRA Cetified ISO 91:28 Quality Management System Keysight Channel atnes Get the best of both wolds: Keysight s measuement expetise and poduct beadth, combined with channel patne convenience. Fo moe infomation on Keysight Technologies poducts, applications o sevices, please contact you local Keysight office. The complete list is available at: Ameicas Canada (877) Bazil Mexico United States (8) Asia acific Austalia China Hong Kong India Japan 12 (421) 345 Koea Malaysia Singapoe Taiwan Othe A Counties (65) Euope & Middle East Austia Belgium Finland Fance Gemany Ieland Isael Italy Luxemboug Nethelands Russia Spain Sweden Switzeland Opt. 1 (DE) Opt. 2 (FR) Opt. 3 (IT) United Kingdom Fo othe unlisted counties: (B ) This infomation is subject to change without notice. Keysight Technologies, 214 ublished in USA, July 17, EN