Commercial & Industrial Qualification Results
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1 Commercial & Industrial Qualification Objective: PF0100 ASEKr Cu Wire Qualification (P1.1) for Commercial & Industrial Tiers Report Type: Technology: SMOS10W Package Description: QFN 56L 8X8 0.5P (Cu Wire) Mask set#: N47F Revision #: 1.1 CAB #: M FSL Qual Quartz Tracking #: Rel. Engr. Approval Signature: Tom Kazor Fab site: ATMC Assembly site: ASE-Kr Final Test site: FSL-TJN-Test Rel Test site: ARAL Design Engr: Scott Bader Product Engr: Muhammed Zubair Prod. Pkg. Engr: Garry Ge Rel. Engr: Tom Kazor Target Dates Test Start: 7June2013 Test Finish: 27Aug2013 CAB Approval Signature: Yanil Cruz Date: 29Aug2013 Die Size (in mm) W x L x T x x 0.28 Part Operating Temp. Range: Consumer Tier -40C to +85C Freescale Contact: Tom Kazor Phone Number: Customer Approval N/A Signature: Date: PRE-STRESS REQUIREMENTS FSL PC A113 J-STD-020 Preconditioning (PC) MSL 3 at 260 C, +5/-0 C after PC. TEST at RH All surface mount devices as required per individual stress. PC is performed as part of the individual stress tests. PCS A113 Preconditioned Spares TEST at RH of 5 C qual template rev. 01Apr2010
2 ACCELERATED ENVIRONMENTAL STRESS TESTS Report Type: HAST A101 Highly Accelerated test (HAST): PC before HAST required. after PC, and after HAST HAST = 130 C/85%RH. 48 hrs Commercial 96 hrs Industrial TEST at RH Ele.: UHST HAST A101 A118 Highly Unbiased Accelerated HAST (UHST): TEST RH; PC before UHST required. Ele.: after PC, and after UHST UHST = 130 C/85%RH. 48 hrs Commercial 96 hrs Industrial TC A104 Temperature Cycle (TC): PC before TC required. after PC, and after TC TC = -40 C to 125 C. 500 cycles Commercial 850 cycles Industrial ; WBP =/> 3 grams Ele.: Ele.: Ele.: Ele.: Ele.: Ele.: Ele.: HTSL A103 High Temperature Storage Life (HTSL): HTSL = 150 C. 504 hrs Commercial 1008 hrs Industrial Hrs: 1008 hrs: Generic die data from 2 of 5 C qual template rev. 01Apr2010
3 Report Type: ACCELERATED LIFETIME SIMULATION TESTS HTOL A108 High Temperature Operating Life (HTOL): HTOL = 110C Ta / 125C max Tj. 504 hrs Commercial 1008 hrs Industrial ELFR A108 Early Life Failure Rate ELFR): ELFR = 110C Ta/ 125C max Tj for 48 hrs Required; C hrs: 504hrs: 504hrs: /531 0/617 0/703 Generic die data from PACKAGE ASSEMBLY INTEGRITY TESTS WBP MilStd883 MilStd Wire Bond Pull (WBP): Cond. C or D Cpk = or > bonds from minimum 5 units 3 15 Pass Pass Pass Data from the AssemblyCZ WBS B116 Wire Bond Shear (WBS) Cpk = or > bonds from minimum 5 units 3 15 Pass Pass Pass Data from the AssemblyCZ 3 of 5 C qual template rev. 01Apr2010
4 Report Type: HBM A114 ElectroStatic Discharge/ Human Body Model Classification (HBM): 500/1000/1500/2000/2500V MM A115 ElectroStatic Discharge/ Machine Model Classification (MM): 50/100/150/200/250 Volts CDM C101 ElectroStatic Discharge/ Charged Device Model Classification (CDM): 150/200/500/750/1000 Volts 2KV min. 200V min. Corner pins =/> 750V; All other pins =/> 500V ELECTRICAL VERIFICATION TESTS KAAXDA D15519W7 Lot B KABXDB B18290W4 KADXBD D15507W V: Pass Generic die data from V: Pass Generic die data from V: Pass Generic die data from LU JESD78 Latch-up (LU): Test per JEDEC JESD78 >100mA + Inom (Commercial) >200ma + Inom (Industrial) Ta= +85C Vsupply: 3.6 V ma: Pass 100ma: Pass 100ma: Pass Generic die data from ED Freescale 48A spec Electrical Characterization (EC) / Distribution C Cpk = or > See Justifications See Justifications See Justifications Generic die data from General Notes: 1- Optional Spare Units: 'xx+3' indicates an additional 3 units have been added to the sample size to be used ONLY in the event of lost or mechanically damaged units so as to have the required number of samples at test completion; these '' shall not be used to replace failing units; ALL failures found in the total sample size shall be recorded and acted upon accordingly. 2- Generic Data: Document source of all generic data in the Generic Data List below. 3- CSAM SS=16 units for each stress test for each when required. Generic Data List: s shall include (as applicable) Part Number, PPAP#, QUARTZ#, and date data generated. Generic data can not be older than 2 years and must not have ANY valid rejects. BOM/Construction Details must be available for all devices used as generic data in order to show applicability to the part being qualified. ELFR: Generic die data from the MMPF0100NPEP P1.1 qualification ;14Sept of 5 C qual template rev. 01Apr2010
5 Report Type: Revision History Table: Rev 0.1: Initial draft release Rev 1.0: CAB approved results 5 of 5 C qual template rev. 01Apr2010
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