From apertureless near-field optical microscopy to infrared near-field night vision
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1 From apertureless near-field optical microscopy to infrared near-field night vision Yannick DE WILDE ESPCI Laboratoire d Optique Physique UPR A0005-CNRS, PARIS [email protected]
2 From apertureless near-field optical microscopy to infrared near-field night vision Collaborators : Experimentation : Theory & Modelisation : Samples preparation : F. Formanek P-A. Lemoine J.-J. Greffet R. Carminati K. Joulain (ENSMA) B. Gralak (I. Fresnel) Y. Chen (LPN-Marcoussis) D. Courjon C. Bainier (LOPMD)
3 Apertureless SNOM : Principle ω Lock-in detection Detector Illumination Modulation ω E det = E tip (ω) + E+ spec. E spec. + E+ bkg. E bkg. Piezo ( XY ) Vertical oscillation of the tip - To extract E tip (ω) from the background - Surface topography ( AFM, «tapping» mode )
4 Apertureless SNOM based on a quartz tuning fork Tip : MEB image PZT plate (excitation) 1 µm 0.4mm Vertical oscillation "Tapping mode" Tip (tungsten) A- B+ } Electrode B Electrode A Oscillation amplitude Quartz tuning fork z-feedback Topography
5 Apertureless SNOM based on a quartz tuning fork Y. De Wilde, F. Formanek, L. Aigouy, Rev. Sci. Instrum. 74, 3889 (2003) Scan range (XY) : 34 µm x 34 µm Vertical range (Z) : 17 µm AFM resolution : - vertical ~ 1 nm - lateral ~ nm
6 Apertureless SNOM with visible or infrared laser illumination : experimental set-up
7 Apertureless SNOM with visible or infrared laser illumination : experimental results SUBWAVELENGTH HOLES (φ=200nm) : INFRARED imaging Microscopie électronique (C. Bainier et D. Courjon) Formanek, De Wilde, Aigouy, J. Appl. Phys. 93, 9548 (2003) AFM AFM (topography) GDR Optique de champ proche Appl. Optics 42, 691 (2003) Optique 1.18 µm 1.21 µm AFM (Profile) Optical resolution ~ nm ~ λ/200 SNOM (3µmx3µm) Infrared illumination λ=10,6 µm
8 Near-field optics without external illumination Detector Sub-λ probe External source New concept : A regular SNOM requires 3 basic ingredients : Source-Probe-Detector Screen with subwavelength hole Original idea Synge, Phylos. Mag. 6, 356 (1928) SNOM WITHOUT EXTERNAL SOURCE SUBMITTED FOR PUBLICATION Aperture SNOM Pohl,, Appl. Phys. Lett 44, 651 (1984) Scattering tip (apertureless) SNOM Zenhausern, Appl. Phys. Lett. 65, 1623 (1994)
9 Surface waves in silicon carbide (SiC) SiC + grating T=500 C J.-J. Greffet et al., Nature 416, 61 (2002) SiC SiC = polar material which supports surface waves known as surface phononpolaritons => Evanescent waves thermally stimulated Diffraction SiC Coherent thermal emission
10 Surface waves in silicon carbide (SiC) SiC Enhanced electromagnetic energy density in near-field zone Energy density Energy density Energy density 2πc ω pk = µm Good first candidate! Shchegrov, Joulain, Carminati, Greffet, PRL. 85, 1548 (2000)
11 Probing the local electromagnetic density of states (EM-LDOS) EM -LDOS : ρ(r,ω)dr : Probability to find a photon ħω in r in a small volume dr. Local density of electromagnetic energy : 1 U (r, ω) = ρ(r, ω) hω exp / 1 ( hω kt ) EM-LDOS Energy of 1 photon N. Photons / state Vacuum : ρ(r,ω) = 2 ω π c 2 3 Homogeneous, isotropic But : Spatial variations of ρ(r,ω) are expected near an interface (evanescent modes, plasmons, phonon-polaritons, ) or in photonic structures.
12 Probing the local electromagnetic density of states (EM-LDOS) Laser Fibre étirée Optical fiber Corral structure Echantillon Sample Détection sur 4π Detection (4π) C. Chicanne, T. David, R. Quidant, J. C. Weeber, Y. Lacroute, E. Bourillot, A. Dereux, G. Colas des Francs and C. Girard, Phys. Rev. Lett. 88, (2002)
13 Probing the local electromagnetic density of states (EM-LDOS) Detector Tip At T 0, all available states are occupied, according to Bose-Einstein statistics Sample (T 0) A point-like SNOM probes the EM-LDOS Joulain, Carminati, Mulet, Greffet, PRB 68, (2003)
14 Conclusions : SNOM which operates with visible or infrared laser illumination SNOM without laser : - Detects the infrared near-field thermal radiation «Near-field infrared night-vision camera» - Observation of near-field coherence effects on gold patterns on SiC - Probes the EM-LDOS => Behaves as an «infrared STM» (IRSTM)
Review of NSOM Microscopy for Materials
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