Test Report : MS-1461

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1 Test Report Product Name Model No. : Notebook PC : MS-1461 Marketing Name : X410 Applicant : Micro-Star Int L Co., Ltd. Address : No. 69, Li-De St., Chung-Ho City, Taipei Hsien, Taiwan Date of Receipt : 2009/06/01 Issued Date : 2009/06/18 Report No. : 096S040-IT-CE-P07V04 Report Version. : V1.0 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

2 Test Report Certification Issued Date : 2009/06/18 Report No. : 096S040-IT-CE-P07V04 Product Name : Notebook PC Applicant : Micro-Star Int L Co., Ltd. Address : No. 69, Li-De St., Chung-Ho City, Taipei Hsien, Taiwan Manufacturer : MSI ELECTRONICS (KUNGSHAN) CO., LTD. Model No. : MS-1461 Marketing Name : X410 Rated Voltage : AC 230 V / 50 Hz EUT Voltage : AC V / Hz Trade Name : msi Applicable Standard : EN 55022: 2006+A1: 2007 Class B EN : 2006 EN : 1995+A1: 2001+A2: 2005 EN 55024: 1998+A1: 2001+A2: 2003 Test Result : Complied Performed Location : Suzhou EMC laboratory No.99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone.,Suzhou, China TEL: / FAX: Documented By : ( Any Liu ) Reviewed By : ( Coffon Ye ) Approved By : ( Gene Chang ) Page: 2 of 132

3 Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited by the following accreditation Bodies in compliance with ISO 17025, EN and Guide 25: Taiwan R.O.C. : BSMI, DGT, CNLA Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL: / FAX: service@quietek.com LinKou Testing Laboratory : No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : / FAX : service@quietek.com Suzhou Testing Laboratory : No.99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., SuZhou, China TEL : / FAX : service@quietek.com Page: 3 of 132

4 TABLE OF CONTENTS Description Page 1. General Information EUT Description Mode of Operation Tested System Details Configuration of Tested System EUT Exercise Software Technical Test Summary of Test Result List of Test Equipment Measurement Uncertainty Test Environment Conducted Emission (Main Ports) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Emissions (Telecommunication Ports) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Harmonic Current Emission Test Specification...74 Page: 4 of 132

5 6.2. Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Fluctuation and Flicker Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrostatic Discharge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrical Fast Transient/Burst Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Page: 5 of 132

6 11. Surge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Power Frequency Magnetic Field Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Voltage Dips and Interruption Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Attachment EUT Photograph Page: 6 of 132

7 1. General Information 1.1. EUT Description Product Name Notebook PC Trade Name msi Model No. MS-1461 Marketing Name X410 Note: The EUT includes two models. MS-1461 is Model Number and X410 is Marketing Name. Page: 7 of 132

8 Keypart List Item/manufactory Model Remark Motherboard MSI MS CPU AMD LCD AMGMV40OAX4DX SMG210UOAX3DV 1.6GHz, BGA-812pin 1.5GHz, BGA-812pin CHI MEI N140B6-L02 14 inch, WXGA, 1366x768,GLARE, LED SAMSUNG LTN140AT01-G01 14 inch, WXGA, 1366x768,GLARE, LED AUO B140XW01 V0 14 inch, WXGA, 1366x768,GLARE, LED HDD WD Fujitsu Toshiba Memory WD2500BEVT WD3200BEVT WD5000BEVT MHZ2160BH MJA2250BH MJA2320BH MJA2500BH MK1655GSX MK2555GSX MK3255GSX MK5055GSX SYS HDD, SATA, 2.5 inch, 250GB, 5400RPM, SYS HDD, SATA, 2.5 inch, 320GB, 5400RPM SYS HDD, SATA, 2.5 inch, 500GB, 5400RPM SYS HDD, SATA, 2.5 inch, 160GB, 5400RPM SYS HDD, SATA, 2.5 inch, 250GB, 5400RPM SYS HDD, SATA, 2.5 inch, 320GB, 5400RPM SYS HDD, SATA, 2.5 inch, 500GB, 5400RPM SYS HDD, SATA, 2.5 inch, 160GB, 5400RPM SYS HDD, SATA, 2.5 inch, 250GB, 5400RPM SYS HDD, SATA, 2.5 inch, 320GB, 5400RPM SYS HDD, SATA, 2.5 inch, 500GB, 5400RPM Transcend TS256MSQ64V8U DDR2 SDRAM, 2GB, 400(800) MHz SAMSUNG M470T5663QZ3-CF7 DDR2 SDRAM, 2GB, 400(800) MHz HYNIX HYMP125S64CP8-S6 DDR2 SDRAM, 2GB, 400(800) MHz SAMSUNG M470T5663EH3-CF7, DDR2 SDRAM, 2GB, 400(800) MHz Samsung M470T2864QZ3-CF7 DDR2 SDRAM, 1GB, 400(800) MHz HYNIX HYMP112S64CP6-S6 DDR2 SDRAM, 1GB, 400(800) MHz SAMSUNG M470T2864EH3-CF7, DDR2 SDRAM, 1GB, 400(800) MHz WLAN Ralink RT3090 Wireless b/g/n 1T1R mini-card Realtek RTL8192E Wireless b/g/n 1T2R mini-card Battery SIMPLO BTY-S V, 2150mAh Page: 8 of 132

9 Adapter LI SHIN DELTA Keyboard Sunrex Bluetooth MSI Touch pad SENTELIC SYNAPTICS Camera 0225A2040 ADP-40MH BD VJ3522BJLV1 VJ3522AJLV1 VJ3522BKLA1 VJ3522AKLA1 VJ3522BKLB1 VJ3522AKLB1 MS-6837D TPA2D2IC99RA1 TM61PDZG300 Input: V, 50-60Hz, 1.7A Output: 20V, 2.0A Input: V, 50-60Hz, 1.2A Output: 20V, 2.0A 91KEY,Japanese, WHITE 91KEY,Japanese, BLACK 87KEY,US, WHITE 87KEY,US, BLACK 87KEY,UK, WHITE 87KEY,UK, BLACK BISON BN82M6S8-000 CMOS CAMERA MODULE/1.3M AzureWave AM-1S004 CMOS CAMERA MODULE/1.3M Page: 9 of 132

10 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1: LCD + VGA Mode 2: LCD + HDMI Mode 3: LCD + VGA Mode 4: LCD + HDMI Mode 5: LCD + VGA Mode 6: LCD + HDMI Mode 7: LCD + VGA Mode 8: LCD + HDMI Mode 9: LCD + VGA Mode 10: LCD + HDMI Mode 11: LCD + VGA Mode 12: LCD + HDMI Final Test Mode Mode 1: LCD + VGA EMI Mode 2: LCD + HDMI Mode 1: LCD + VGA EMS Mode 2: LCD + HDMI Page: 10 of 132

11 Mode 1 Mode 2 M/B MS MS CPU SMG210UOAX3DV AMGMV40OAX4DX Battery BTY-S31 BTY-S31 HDD MK5055GSX MJA2320BH Adapter 0225A A2040 LCD B140XW01 V0 N140B6-L02 DDR TS256MSQ64V8U M470T5663QZ3-CF7 Camera BN82M6S8-000 BN82M6S8-000 Bluetooth MS-6837D MS-6837D WLAN RTL8192E RT3090 Mode 3 Mode 4 M/B MS MS CPU AMGMV40OAX4DX SMG210UOAX3DV Battery BTY-S31 BTY-S31 HDD WD2500BEVT WD5000BEVT Adapter ADP-40MH BD ADP-40MH BD LCD LTN140AT01-G01 B140XW01 V0 DDR GU332G0ALEPR8H2F6F1 HYMP125S64CP8-S6 Camera BN82M6S8-000 AM-1S004 Bluetooth MS-6837D MS-6837D WLAN RT3090 RTL8192E Mode 5 Mode 6 M/B MS MS CPU AMGMV40OAX4DX AMGMV40OAX4DX Battery BTY-S31 BTY-S31 HDD WD3200BEVT MHZ2160BH Adapter ADP-40MH BD 0225A2040 LCD N140B6-L02 LTN140AT01-G01 DDR M470T5663EH3-CF7 M470T2864QZ3-CF7 Camera BN82M6S8-000 BN82M6S8-000 Bluetooth MS-6837D MS-6837D WLAN RT3090 RT3090 Page: 11 of 132

12 Mode 7 Mode 8 M/B MS MS CPU SMG210UOAX3DV AMGMV40OAX4DX Battery BTY-S31 BTY-S31 HDD MJA2250BH MJA2500BH Adapter 0225A A2040 LCD B140XW01 V0 N140B6-L02 DDR GU331G0ALEPR612F6F1 HYMP112S64CP6-S6 Camera BN82M6S8-000 BN82M6S8-000 Bluetooth AM-1S004 MS-6837D WLAN RTL8192E RT3090 Mode 9 Mode 10 M/B MS MS CPU AMGMV40OAX4DX SMG210UOAX3DV Battery BTY-S31 BTY-S31 HDD MK3255GSX MK1655GSX Adapter ADP-40MH BD ADP-40MH BD LCD LTN140AT01-G01 B140XW01 V0 DDR M470T2864EH3-CF7 M470T2864QZ3-CF7 Camera BN82M6S8-000 AM-1S004 Bluetooth MS-6837D MS-6837D WLAN RT3090 RTL8192E Mode 11 Mode 12 M/B MS MS CPU AMGMV40OAX4DX AMGMV40OAX4DX Battery BTY-S31 BTY-S31 HDD MK2555GSX MJA2320BH Adapter ADP-40MH BD 0225A2040 LCD N140B6-L02 N140B6-L02 DDR HYMP125S64CP8-S6 M470T5663QZ3-CF7 Camera BN82M6S8-000 AM-1S004 Bluetooth MS-6837D MS-6837D WLAN RT3090 RT3090 Page: 12 of 132

13 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 CRT 21 IBM 6652-U3N 1 Non-Shielded, 1.8m 2 LCD Monitor DELL 3008WFPT P08B Non-Shielded, 1.8m 3 ipod Apple A1199 YM715J43VQ5 Power by PC 4 USB Mouse DELL MO56UOA F1B03EZZ Power by PC 5 Microphone & Earphone SOMIC SM-510 N/A N/A 6 SD Card Kingston 1GB N/A N/A 7 MacBook Apple MB061CH W8732B4TZ5V Power by adapter Page: 13 of 132

14 1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description A VGA Cable Shielded, 1.8m, with two ferrite cores Bonded B HDMI Cable Shielded, 1.8m C USB Cable Shielded, 1.0m D USB Mouse Cable Shielded, 1.8m E Earphone & Microphone Cable Non-Shielded, 2.1m F LAN Cable Non-Shielded, >10m Page: 14 of 132

15 1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown above. 2 Turn on the power of all equipment. 3 Execute the HDD running Program using BurnIn Test v5.1 software. 4 Run EMC test program using BurnIn Test v5.1 software and send H pattern to the monitor. 5 EUT will send and receive data through LAN using Ping function. 6 Communicate with another notebook by WLAN and Bluetooth. 7 Open the camera and play music using media player program. Page: 15 of 132

16 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Test Item Normative References Test Performed Deviation Conducted Emission EN 55022: 2006+A1: 2007 Class B Yes No (Mains Ports) Conducted Emission EN 55022: 2006+A1: 2007 Class B Yes No (Telecommunication Ports) Radiated Emission EN 55022: 2006+A1: 2007 Class B Yes No Harmonic Current Emission EN : 2006 Yes No Voltage Fluctuation and Flicker EN : 1995+A1: 2001+A2: 2005 Yes No Immunity Performed Test Item Normative References Test Performed Deviation Electrostatic Discharge IEC : 2001 Yes No Radiated Susceptibility IEC : 2006 Yes No Electrical Fast Transient/Burst IEC : 2004 Yes No Surge IEC : 2005 Yes No Conducted Susceptibility IEC : 2006 Yes No Power Frequency Magnetic Field IEC : 2001 Yes No Voltage Dips and Interruption IEC : 2004 Yes No Page: 16 of 132

17 2.2. List of Test Equipment Conducted Emission / SR-1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCI /04/23 Two-Line V-Network R&S ENV /06/11 Two-Line V-Network R&S ENV /04/23 Balanced Telecom ISN Fischer FCC-TLISN-T /02/03 Balanced Telecom ISN Fischer FCC-TLISN-T /02/03 Balanced Telecom ISN Fischer FCC-TLISN-T /02/03 Current Probe R&S EZ /04/18 50ohm Coaxial Switch Anritsu MP59B /11/24 50ohm Termination SHX TF /09/28 50ohm Termination SHX TF /09/28 50ohm Termination SHX TF /09/28 Coaxial Cable Luthi RG223 SR1-C2 2009/05/25 Temperature/Humidity Meter zhicheng ZC1-2 SR1-TH 2009/03/31 Radiated Emission / AC-1 Instrument Manufacturer Type No. Serial No Cal. Date Spectrum Analyzer Agilent E4403B MY N/A Spectrum Analyzer Agilent E4403B MY N/A EMI Test Receiver R&S ESCI /11/15 Preamplifier Quietek AP-025C CHM /11/24 Preamplifier Quietek AP-025C CHM /11/24 Bilog Type Antenna Schaffner CBL6112B /11/24 Bilog Type Antenna Schaffner CBL6112B /11/24 50ohm Coaxial Switch Anritsu MP59B /11/24 50ohm Coaxial Switch Anritsu MP59B /11/24 50ohm Coaxial Switch Anritsu MP59B /11/24 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC1-L 2009/05/25 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC1-R 2009/05/25 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC1-C 2009/05/25 Temperature/Humidity Meter zhicheng ZC1-2 AC1-TH 2009/03/31 Radiated Emission / AC-2 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCI /04/23 Bilog Antenna Teseq GmbH CBL6112D /02/25 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC2-C 2009/05/25 Temperature/Humidity Meter zhicheng ZC1-2 AC1-TH 2009/03/31 Radiated Emission / AC-3 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCI /11/15 Bilog Antenna Teseq GmbH CBL6112D /02/25 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC3-C 2009/05/25 Temperature/Humidity Meter zhicheng ZC1-2 AC3-TH 2009/03/31 Harmonic Current Emission / SR-1 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source California 5001iX /11/18 Power Analyzer California PACS /11/18 Temperature/Humidity Meter zhicheng ZC1-2 SR1-TH 2009/03/31 Page: 17 of 132

18 Voltage Fluctuation and Flicker / SR-1 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source California 5001iX /11/18 Power Analyzer California PACS /11/18 Temperature/Humidity Meter zhicheng ZC1-2 SR1-TH 2009/03/31 Electrostatic Discharge / SR-3 Instrument Manufacturer Type No. Serial No Cal. Date ESD Simulator KeyTek MZ-15/EC /05/05 ESD Simulator EM TEST dito V /08/08 Barometer Fengyun DYM /12/07 Temperature/Humidity Meter zhicheng ZC1-2 SR3-TH 2009/03/31 Radiated Susceptibility / AC-4 Instrument Manufacturer Type No. Serial No Cal. Date Signal Generator R&S SML /10/21 Power Meter Boonton 4231A /10/21 Power Sensor Boonton EMC /10/21 RF Switch Network Schaffner RFS N N/A Power Amplifier Schaffner CBA N/A Power Amplifier Schaffner CBA9413B N/A Directional Coupler A&R DC7144A N/A Directional Coupler Schaffner CHA 9652B 0121 N/A Electric Field Probe Type 8.3 narda 2244/90.21 AZ /06/11 Electromagnetic Radiation Meter narda 2244/70 AW /06/11 Bilog Type Antenna Schaffner CBL6141A 4278 N/A Horn Antenna A&R AT4002A N/A Temperature/Humidity Meter zhicheng ZC1-2 AC4-TH 2009/03/31 Electrical Fast Transient/Burst / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro /04/23 CCL KeyTek CCL /04/23 Temperature/Humidity Meter zhicheng ZC1-2 SR3-TH 2009/03/31 Surge / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro /04/23 Coupler/Decoupler Telecom KeyTek line CM-TELCD N/A Coupler/Decoupler Signal line KeyTek CM-I/OCD N/A Temperature/Humidity Meter zhicheng ZC1-2 QT-TH /03/31 Page: 18 of 132

19 Conducted Susceptibility / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date RF-Generator Schaffner NSG /11/12 Attenuator Schaffner INA /11/12 CDN Schaffner CDN M /11/12 CDN Teseq GmbH CDN M /09/03 CDN Schaffner CDN T /11/12 CDN Teseq GmbH CDN T /09/03 EM Clamp Schaffner KEMZ /11/12 50ohm Termination SHX TF /09/28 50ohm Termination SHX TF /09/28 50ohm Termination SHX TF /09/28 Temperature/Humidity Meter zhicheng ZC1-2 SR2-TH 2009/03/31 Power Frequency Magnetic Field / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro /04/23 CM-HCOIL H-Field Loop KeyTek F /9/10-L-1M /04/23 Clamp Meter Fluke /03/31 Temperature/Humidity Meter zhicheng ZC1-2 SR2-TH 2009/03/31 Voltage Dips and Interruption / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro /04/23 Temperature/Humidity Meter zhicheng ZC1-2 SR2-TH 2009/03/31 Page: 19 of 132

20 2.3. Measurement Uncertainty Conducted Emission (Mains Ports) The measurement uncertainty is evaluated as ± 2.26 db. Conducted Emission (Telecommunication Ports) The measurement uncertainty is evaluated as ± 2.26 db. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 db. Harmonic Current Emission The measurement uncertainty is evaluated as ± 1.2 %. Voltage Fluctuations and Flicker The measurement uncertainty is evaluated as ± 1.5 %. Electrostatic Discharge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Radiated Susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 db. Electrical Fast Transient/Burst As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant FT/Burst standards. The immunity test signal from the FT/Burst system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage. Frequency and timing as being 1.63%, and 2.76%. Surge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of Page: 20 of 132

21 voltage and timing as being 1.63 % and 2.76%. Conducted Susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 db and 2.78 db. Power Frequency Magnetic Field As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %. Voltage Dips and Interruption As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 21 of 132

22 2.4. Test Environment Performed Item Items Required Actual Temperature ( C) Conducted Emission (Mains Ports) Humidity (%RH) Barometric pressure (kpa) Temperature ( C) Conducted Emission (Telecommunication Humidity (%RH) Ports) Barometric pressure (kpa) Temperature ( C) Radiated Emission Humidity (%RH) Barometric pressure (kpa) Temperature ( C) Harmonic Current Emission Humidity (%RH) Barometric pressure (kpa) Temperature ( C) Voltage Fluctuation and Flicker Humidity (%RH) Barometric pressure (kpa) Temperature ( C) Electrostatic Discharge Humidity (%RH) Barometric pressure (kpa) Temperature ( C) Radiated Susceptibility Humidity (%RH) Barometric pressure (kpa) Temperature ( C) Electrical Fast Transient/Burst Humidity (%RH) Barometric pressure (kpa) Temperature ( C) Surge Humidity (%RH) Barometric pressure (kpa) Temperature ( C) Conducted Susceptibility Humidity (%RH) Barometric pressure (kpa) Temperature ( C) Power Frequency Magnetic Field Humidity (%RH) Barometric pressure (kpa) Temperature ( C) Voltage Dips and Interruption Humidity (%RH) Barometric pressure (kpa) Page: 22 of 132

23 3. Conducted Emission (Main Ports) 3.1. Test Specification According to EMC Standard: EN Class B 3.2. Test Setup 3.3. Limit Limits for Class A Equipment Frequency (MHz) QP AV Note: The lower limit shall apply at the transition frequencies. Page: 23 of 132

24 Limits for Class B Equipment Frequency (MHz) QP AV Note 1: The lower limit shall apply at the transition frequencies. Note 2: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz to 0.5 MHz Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz Deviation from Test Standard No deviation. Page: 24 of 132

25 3.6. Test Result Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-04:44 Disturbance Test) Limit : EN55022_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line1 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Page: 25 of 132

26 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-04:45 Disturbance Test) Limit : EN55022_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line1 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 26 of 132

27 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-04:45 Disturbance Test) Limit : EN55022_B_00M_AV Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line1 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 27 of 132

28 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-04:47 Disturbance Test) Limit : EN55022_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line2 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Page: 28 of 132

29 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-04:49 Disturbance Test) Limit : EN55022_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line2 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 29 of 132

30 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-04:49 Disturbance Test) Limit : EN55022_B_00M_AV Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line2 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 30 of 132

31 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:51 Disturbance Test) Limit : EN55022_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line1 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Page: 31 of 132

32 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:53 Disturbance Test) Limit : EN55022_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line1 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 132

33 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:53 Disturbance Test) Limit : EN55022_B_00M_AV Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line1 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 33 of 132

34 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:55 Disturbance Test) Limit : EN55022_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line2 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Page: 34 of 132

35 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:57 Disturbance Test) Limit : EN55022_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line2 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 35 of 132

36 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:57 Disturbance Test) Limit : EN55022_B_00M_AV Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : ENV216_100014( MHz) - Line2 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 36 of 132

37 3.7. Test Photograph Test Mode: Mode 1: LCD + VGA Description: Front View of Conducted Emission Test Setup for Main Test Mode: Mode 1: LCD + VGA Description: Back View of Conducted Emission Test Setup for Main Page: 37 of 132

38 Test Mode: Mode 2: LCD + HDMI Description: Front View of Conducted Emission Test Setup for Main Test Mode: Mode 2: LCD + HDMI Description: Back View of Conducted Emission Test Setup for Main Page: 38 of 132

39 4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard: EN Class B 4.2. Test Setup 4.3. Limit Limits for Class A Equipment Frequency (MHz) QP Voltage AV QP (dbua) Current AV (dbua) Note: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz to 0.50 MHz. Page: 39 of 132

40 Limits for Class B Equipment Frequency (MHz) QP Voltage AV QP (dbua) Current AV (dbua) Note: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz to 0.50 MHz Test Procedure The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz Deviation from Test Standard No deviation. Page: 40 of 132

41 4.6. Test Result Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:32 Disturbance Test) Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) LAN 10Mbps Page: 41 of 132

42 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:34 Disturbance Test) Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) LAN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 42 of 132

43 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:34 Disturbance Test) Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) LAN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 43 of 132

44 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:37 Disturbance Test) Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) LAN 100Mbps Page: 44 of 132

45 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:39 Disturbance Test) Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) LAN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 45 of 132

46 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-05:39 Disturbance Test) Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) LAN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 46 of 132

47 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-06:07 Disturbance Test) Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) - LAN 10Mbps Page: 47 of 132

48 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-06:09 Disturbance Test) Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) - LAN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 48 of 132

49 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-06:09 Disturbance Test) Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) - LAN 10Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE 2 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 49 of 132

50 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-06:12 Disturbance Test) Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) - LAN 100Mbps Page: 50 of 132

51 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-06:14 Disturbance Test) Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) - LAN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 51 of 132

52 Engineer : Peter Site : SR-1 (Conducted Emission and Power Time : 2009/06/03-06:14 Disturbance Test) Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : FCC-TLISN-T4_20353( MHz) - Line1 Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) - LAN 100Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) AVERAGE AVERAGE AVERAGE 4 * AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 52 of 132

53 4.7. Test Photograph Test Mode: Mode 1: LCD + VGA Description: Front View of Conducted Emission Test Setup for LAN Test Mode: Mode 1: LCD + VGA Description: Back View of Conducted Emission Test Setup for LAN Page: 53 of 132

54 Test Mode: Mode 2: LCD + HDMI Description: Front View of Conducted Emission Test Setup for LAN Test Mode: Mode 2: LCD + HDMI Description: Back View of Conducted Emission Test Setup for LAN Page: 54 of 132

55 5. Radiated Emission 5.1. Test Specification According to EMC Standard: EN Class B 5.2. Test Setup Below 1GHz Test Setup: Above 1GHz Test Setup: Page: 55 of 132

56 5.3. Limit Frequency (MHz) Limits for Class A Equipment Distance (m) QP (dbuv/m) Limits for Class A Equipment Frequency (GHz) Distance (m) Average (dbuv/m) Peak (dbuv/m) Note 1: The lower limit shall apply at the transition frequency. Note 2: Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Limits for Class B Equipment Frequency (MHz) Distance (m) QP (dbuv/m) Limits for Class B Equipment Frequency (GHz) Distance (m) Average (dbuv/m) Peak (dbuv/m) Note 1: The lower limit shall apply at the transition frequency. Note 2: Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Page: 56 of 132

57 5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters for below 1GHz and 3 meters for above 1GHz. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. The bandwidth below 1GHz setting on the field strength meter is 120 khz and above 1GHz is 1MHz. Conditional testing procedure: The highest internal source of an EUT is defined as the highest frequency generated or used within the EUT or on which the EUT operates or tunes. Highest frequency generated or used in the Upper frequency of measurement range device or on which the device operates or tunes (MHz) (MHz) < Above th harmonic of the highest frequency or 6 GHz, whichever is less 5.5. Deviation from Test Standard No deviation. Page: 57 of 132

58 5.6. Test Result Engineer : Seven Site : AC-1 (10m Semi-Anechoic Chamber) Time : 2009/06/03-20:04 Limit : EN55022_B_10M_QP Margin : 6 EUT : Notebook PC Power : AC 230V/50Hz Probe : CBL6112B_2931( MHz) - HORIZONTAL Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type Ant Pos Table Pos (MHz) (db) (dbuv/m) (db) (dbuv/m) (cm) (deg) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK * QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 58 of 132

59 Engineer : Seven Site : AC-1 (10m Semi-Anechoic Chamber) Time : 2009/06/03-20:04 Limit : EN55022_B_10M_QP Margin : 6 EUT : Notebook PC Power : AC 230V/50Hz Probe : CBL6112B_2933( MHz) - VERTICAL Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type Ant Pos Table Pos (MHz) (db) (dbuv/m) (db) (dbuv/m) (cm) (deg) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK * QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 59 of 132

60 Engineer : Seven Site : AC-5 (3m Semi-Anechoic Chamber) Time : 2009/06/03-21:31 Limit : EN55022_B_(Above_1G)_03M_PK Margin : 0 EUT : Notebook PC Power : AC 230V/50Hz Probe : 9120D_499(1-18GHz) - HORIZONTAL Note : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type Ant Pos Table Pos (MHz) (db) (dbuv/m) (db) (dbuv/m) (cm) (deg) 1 * PEAK PEAK PEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor. 4. The average measurement was not performed when the peak measured data under the limit of average detection. If the readings given are average, peak measurement should also be supplied. Page: 60 of 132

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