Declaration of Conformity.

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1 Declaration of Conformity. Type of equipment: Brand Name /Trade Mark: Type designation /model: Applicant: PTZ CAMERA SAMSUNG SCP2371HP SAMSUNG TECHWIN CO., LTD. In accordance with the following Directives: 2004/108/EC The Electromagnetic Compatibility Directive Including amendments by the CE Marking Directive 93/68/EEC The following harmonized European standards or technical specifications have been applied: EN 55022:2010 EN :2011 EN :2008 EN :2009 EN :2006+A2:2010 EN :2004+A1:2010 EN :2006 EN :2009 EN :2004 Limits and methods of measurement of radio disturbance characteristics of information technology equipment Product family standard: Immunity requirements for components of fire, intruder and social alarm systems Limitation of voltage changes, voltage fluctuations and flicker in public lowvoltage supply systems, for equipment with rated current <=16 A per phase and not subject to conditional connection Electrostatic discharge immunity test Radiated, radiofrequency, electromagnetic field immunity test Electrical fast transient/burst immunity test Surge immunity test Immunity to conducted disturbances, induced by radiofrequency fields Voltage dips, short interruptions and voltage variations immunity tests The CE Marking on the products and/or their packaging signifies that SAMSUNG TECHWIN CO., LTD. holds the reference technical file available to the European Union authorities. Place and date of issue: #42 SeongjuDong, ChangwonShi, KyungsangnamDo,Korea / December 04, 2012 Authorized Signatory: Name : Jei Soon, Kang Title : Principal Research Engineer Signature :

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3 Page: 2 of 50 Contents 1. Applicant information Laboratory information Test system configuration Operation environment Measurement Uncertainty Description of E.U.T General information Product description Auxiliary equipments Test configuration Operating conditions Summary of test results Summary of EMI emission test results Summary of immunity test results Performance criteria Test results Radiated Emission Flicker Electrostatic Discharge Radio Frequency Electromagnetic Fields Electric Fast Transient/BURST Surge Conducted Immunity Dips and Interruptions E.U.T. photographs... 41

4 Page: 3 of Applicant information Applicant: SAMSUNG TECHWIN CO., LTD. Address: #42 SeongjuDong, ChangwonShi, KyungsangnamDo, Korea Telephone: Fax: Contact name: Kang Jei Soon Manufacturer#1: SAMSUNG TECHWIN CO., LTD. Address: #42 SeongjuDong, ChangwonShi, KyungsangnamDo, Korea Telephone: Fax: Contact name: Kang Jei Soon Manufacturer#2: Address: TIANJIN SAMSUNG TECHWIN OPTOELECTRONIC CO., LTD No.11 Weiliu Road. MicroElectronic Industrial Park Jingang Road Tianjin , China

5 Page: 4 of Laboratory information Address EMC compliance Ltd Sindong, Yeongtonggu, Suwoncity, Gyeonggido, , Korea Telephone Number: Facsimile Number: FCC CAB.: KR0040 VCCI Registration No. : R3327, G198, C3706, T1849 Industry Canada Registration No. : 8035A KOLAS NO.: 231 SITE MAP Suwon city EMC compliance

6 Page: 5 of Test system configuration 3.1 Operation environment Temperature Humidity Pressure Chamber(10 m) : 23 C 32 % R.H. Shielded room(esd) : 24 C 42 % R.H kpa Test site These testing items were performed following locations; Test item Test site Conducted Emission Shielded Room Radiated Emission 10 m Chamber Harmonics current Immunity area Voltage fluctuations and flickers Immunity area Electrostatic discharge Shielded Room Radiated RF immunity Fully anechoic chamber (3 m) Electric Fast Transient/BURST Shielded Room Surge Shielded Room Conducted RF immunity Shielded Room Voltage dip/interruption Shielded Room Mains supply voltage variations Shielded Room

7 Page: 6 of Measurement Uncertainty All measurements involve certain levels of uncertainties, especially in field of EMC. The factors contributing to uncertainties are test receiver, cable loss, antenna factor calibration, Antenna directivity, antenna factor variation with height, antenna phase center variation, antenna frequency interpolation, measurement distance variation, site imperfection, mismatch, and system repeatability. Based on CISPR 1642, the measurement uncertainty level with a 95 % confidence level was applied. Conducted emission measurement (C.L: Approx 95 %, k = 2) Shielded Room (CE#1) Shielded Room (CE#2) Shielded Room (CE#3) 9 khz ~ 150 khz: ± 3.82 db 150 khz ~ 30 MHz: ± 3.43 db 9 khz ~ 150 khz: ± 3.82 db 150 khz ~ 30 MHz: ± 3.43 db 9 khz ~ 150 khz: ± 4.00 db 150 khz ~ 30 MHz: ± 3.63 db Radiated Emission measurement (C.L: Approx 95 %, k = 2) 10 m Chamber (#F4) 10 m Chamber (#F2) 30 MHz ~ 300 MHz 300 MHz ~ MHz 3 m: db, 4.58 db 10 m: db, 4.56 db 3 m: db, 4.85 db 10 m: db, 4.72 db 1 GHz ~ 6 GHz 3 m: db, 6.20 db 30 MHz ~ 300 MHz 300 MHz ~ MHz 3 m: db, 4.88 db 10 m: db, 4.86 db 3 m: db, 4.99 db 10 m: db, 4.87 db 1 GHz ~ 6 GHz 3 m: db, 6.20 db Radio Frequency Electromagnetic Fields (C.L: Approx 95 %, k = 2) ± 1.82 db Disturbance power Electromagnetic Fields (C.L: Approx 95 %, k = 2) ± 3.73 db

8 Page: 7 of Description of E.U.T. 4.1 General information

9 Page: 8 of 50

10 Page: 9 of Product description Type of product Model name (Basic) PTZ CAMERA SCP2371HP Model name (Variant) Difference Trade name SCP2271HP * magnifications of zoom SCP2371HP: 37X SCP2271HP: 27X Serial no Testing voltage Product rating Internal clock frequency Note Engineering Sample AC 24 V AC 24 V Above 108 MHz * AC/AC adaptor was not provided by the manufacturer. 4.3 Auxiliary equipments Type Model / Part # Serial number Manufacturer Monitor SMT2231P YDQ03VDBB02500H SAMSUNG Controller SCC1000 C28667WZ107714Y SAMSUNG JIG AC/AC Adaptor (AC 24 V) STA220 Dream Electronics

11 Page: 10 of Test configuration Note * 1 Start End Cable Length Name I/O port Name I/O port Spec. (m) Power AC/AC Adaptor Power 1.6 NonShield Cable 2 EUT GND GND GND 2.5 NonShield 3 (PTZ Alarm JIG Alarm 3.0 NonShield Outdoor 4 CAMERA) Video Out Monitor Video In 3.0 Shield Outdoor 5 RS485 Controller RS NonShield Outdoor 4.5 Operating conditions The EUT was configured as normal intended use. Test mode 1 Normal operating Camera monitoring mode Controller operating mode (Used RS485) JIG operating mode (Used Alarm)

12 Page: 11 of Summary of test results 5.1 Summary of EMI emission test results Applied Test items Test method Result Conducted Emission EN 55022:2010 N/A Radiated Emission EN 55022:2010 Harmonics current EN :2006+A2:2009 N/A Voltage fluctuations and flickers EN : Summary of immunity test results Applied Test items Test method Result *EN :2011 Electrostatic discharge EN :2009 Radiated RF immunity EN :2006+A2:2010 Electric Fast Transient/BURST EN :2004+A1:2010 Surge EN :2006 Conducted RF immunity EN :2009 Voltage dip/interruption EN :2004 Mains supply voltage variations EN :2011 N/A

13 Page: 12 of Performance criteria The variety and the diversity of the apparatus within the scope of this document makes it difficult to define precise criteria for the evaluation of the immunity test results. If as a result of the application of the tests defined in this standard, the apparatus becomes dangerous or unsafe then the apparatus shall be deemed to have failed the test. A functional description and a definition of performance by the manufacture and noted in the test report, based on the following criteria: Electrostatic discharge There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing which could be interpreted by associated equipment as a change, Radiated electromagnetic fields There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing which could be interpreted by associated equipment as a change, and no such Flickering of indicators occurs at a field strength of 3 V/m. For components of CCTV systems, where the picture is allowed at 10 V/m, providing. (a) there is no permanent damage or change to EUT (e.g. no corruption of memory or changes to programmable setting etc.) (b) at 3 V/m, any deterioration of the picture is so minor that the system could still be used; and (c) there is no observable deterioration of the picture at 1 V/m. Fast transient burst / slow high energy voltage surge There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing That there is no residual is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as

14 Page: 13 of 50 Conducted RF immunity There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing That there is no residual is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change, and no such flickering of indicators oeuvres at U = 130 dbμv. For component of CCTV systems, where the status is monitored by observing the TV picture, then deterioration of the picture is allowed at U = 140 dbμv, providing: (a) there is no permanent damage or change to the EUT (e.g. no corruption of memory or changes to programmable settings etc.) (b) at U = 130 dbμv, any deterioration of the picture is so minor that the system could still be used; and (c) there in no observable deterioration of the picture at U = 120 dbμv. Voltage dip/interruption / Voltage variation There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.

15 Page: 14 of Test results 6.1 Radiated Emission Test specification EN 55022:2010, Class A Testing voltage AC 24 V Test facility 10 m Chamber (#F2) Test distance 10 m, 3 m Date Temperature ( C) 23 C Humidity (% R.H.) 32 % R.H. Remarks Limits of radiated emission measurement Limits below 1 GHz Frequency [MHz] Class A 10 m Class B 10 m 30 ~ ~ Limits above 1 GHz Class 3 m Class 3 m Frequency Average limit Peak limit Average limit Peak limit [GHz] (db(μv/m)) (db(μv/m)) (db(μv/m)) (db(μv/m)) 1 ~ ~ Note The lower limit applies at the transition frequency Measurement procedure The test was done at a 10 m chamber with a quasipeak detector. EUT was placed on a nonmetallic table height of 0.8 m above the reference ground plane. Cables were folded back and forth forming a bundle 0.3 m to 0.4 m long and were hanged at a 0.4 m height to the ground plane. Cables connected to EUT were fixed to cause maximum emission. Test was made with the antenna positioned in both the horizontal and vertical planes of polarization. The measurement antenna was varied in height above the conducting ground plane to obtain the maximum signal strength.

16 Page: 15 of Used equipments Equipment Model no. Serial no. Makers Next Cal. Date Used Test Receiver ESCI R&S BiLog Antenna VULB SCHWARZBECK Amplifier 310N SONOMA INSTRUMENT db Attenuator 8491A HP Antenna Mast MA4000EP 303 Innco Systems Turn Table DT2000S1t 079 Innco Systems Horn ANT ETS Amplifier 8449B 3008A02343 AGILENT Spectrum Analyzer FSP R&S Sample calculation The field strength is calculated adding the antenna Factor, cable loss and, Antenna pad adding, subtracting the amplifier gain from the measured reading. The sample calculation is as follow: Result = M.R + C.F(A.F + C.L +3 db Att A.G) M.R = Meter Reading C.F = Correction Factor A.F = Antenna Factor C.L = Cable Loss A.G= Amplifier Gain 3 db Att = 3 db Attenuator If M.R is 30 db, A.F 12 db, C.L 5 db, 3 db, A.G 35 db The result is = 15 db(μv/m)

17 Page: 16 of Photographs of test setup * 30 MHz ~ 1 GHz

18 Page: 17 of 50 * 1 GHz ~ 6 GHz

19 Page: 18 of Radiated emission measurement result * Graph and Data * 30 ~ 1 (SCP2371HP) EMC Compliance Ltd. 10m Chamber <<Radiated Emission>> Model : Serial : Operator : AC Power : 24V Temp,Humidity: [db(uv/m)] 60 Standard Remark1 Remark2 Remark3 Remark4 : CISPR Pub.22 Class A 10m : : : : <CISPR 22 Class A> Limit(QP) <89_CE_10M> Spectrum(H,PK) Spectrum(V,PK) Suspected Item(H) Suspected Item(V) Final Item(H,QP) Final Item(V,QP) 50 Level Frequency 1000 [MHz] Final Result No Frequency (P) Reading c.f Result Limit QP QP QP [MHz] [db(uv)] [db(1/m)] [db(uv/m)] [db(uv/m)] V V V V V V V H Margin Height QP [db] [cm] Angle [deg]

20 Page: 19 of 50 * 1 ~ 6 (SCP2371HP) EMC Compliance Ltd. 10m Chamber <<Radiated Emission>> Model : Serial : Operator : AC Power : 24V Temp,Humidity: [db(uv/m)] 90 Standard Remark1 Remark2 Remark3 Remark4 : CISPR Pub.22 Class A GHz 3m : : : : <CISPR 22 A GHz 3m> Limit(AV) Limit(PK) <89_SVSWR_CE> Spectrum(H,PK) Spectrum(V,PK) Suspected Item(H) Suspected Item(V) Final Item(H,AV) Final Item(H,PK) Final Item(V,AV) Final Item(V,PK) Level Frequency [MHz] Final Result No. Frequency (P) Reading Reading c.f Result Result Limit Limit AV PK AV PK AV PK [MHz] [db(uv)] [db(uv)] [db(1/m)] [db(uv/m)] [db(uv/m)] [db(uv/m)] [db(uv/m)] V H V H H Margin AV [db] Margin Height PK [db] [cm] Angle [deg]

21 Page: 20 of Flicker Test specification EN :2008 Testing voltage Test facility 230 V, 50 Hz (From AC/AC Adaptor) Immunity area Date Temperature( C) 24 C Humidity (% R.H.) 29 % R.H. Pressure (kpa) kpa Remarks Measurement procedure EUT was connected to the power analyzer system. Measurement was performed to obtain the desired flicker parameters. The measuring time depends on which parameters are to be measured. P lt P st = 2 h = 10 min Controls and automatic programs shall be set to produce the most unfavorable sequence of voltage changes, using only those combinations of controls and programs are mentioned by the manufacturer in the instruction manual Used equipments Equipment Model no. Serial no. Makers Harmonics/Flicker meter 5001xCTS Next Cal. date C.I Used

22 Page: 21 of Photographs of test setup

23 Page: 22 of Measurement result

24 Page: 23 of Electrostatic Discharge Test specification EN :2009 Contact: ± 6 Air: ± 2, ± 4, ± 8 HCP: ± 2, ± 4, ± 6 VCP: ± 2, ± 4, ± 6 Test level 330 Ω / 150 Discharge impedance Number of discharge (Each polarity) Interval between discharges Contact: 10 Air: 10 HCP / VCP: 10 1s Testing voltage AC 24 V Test facility Shielded room Date Temperature( C) 24 C Remarks There was no change of operation status during above testing. Humidity (% R.H.) 42 % R.H. Pressure ( ) Measurement procedure A ground reference plane was located on the floor, and connected to earth via a low Impedance connection. The return cable of the ESD generator was connected to the reference plane. In case of floor standing equipment, EUT was placed on the reference plane on 0.1 m of insulating Support. In case of table top equipment, EUT was placed on a wooden table 0.8 m above the reference grounded floor. A horizontal coupling plane (HCP) was placed on the table, and Connected to the reference plane via a 470 resistor located in each end (0.5 insulating support between EUT and HCP). In both cases a vertical coupling plane(vcp) OF 0.5 X 0.5 m was located 0.1 m from the EUT s sides. The VCP was connected to the reference plane in the same matter as the HCP Used equipments Equipment Model No. Serial No. Makers Next Cal. Date ESD Tester NSG TESEQ HCP VCP Used

25 Page: 24 of Photographs of test setup

26 Page: 25 of Measurement result Electrostatic Discharge (Test Point) Air discharge Contact discharge

27 Page: 26 of 50 HCP/VCP discharge Location(EUT) HCP (All 4 sides) VCP (All 4 sides) Applied level (±) ± 2, ± 4, ± 6 Result Contact discharge Location(EUT) C1 Screw C2 Video Out Port Applied level (±) ±6 ±6 Result Air discharge Location(EUT) A1 Enclosure(Case) Applied level (±) ± 2, ± 4, ± 8 Result

28 Page: 27 of Radio Frequency Electromagnetic Fields Test specification EN :2006+A2:2010 Tested frequency 80 ~ 1, 1 ~ 2, 2 ~ 2.7 Test level & Modulation 1 V/m, 3 V/m, 10 V/m, 80 % Amplitude Modulation (1 ) 1 V/m, 3 V/m, 10 V/m, Pulse Modulation (1 (0.5s ON: 0.5s OFF)) Frequency Step log 1 % step Dwell time 3s Distance 3 m from EUT to tip of antenna Testing Voltage AC 24 V Test facility Fully anechoic chamber (3 m) Date Temperature( C) 23 C Remarks There was no change of operation status during above testing. Humidity (% R.H.) 31 % R.H. Pressure ( ) Measurement procedure The test was performed at 3 m full anechoic chamber. For floor standing equipment, the EUT was standing on the floor. For tabletop equipment, the EUT was located on a wooden table 0.8 m above the floor. The EUT was tested all sides, horizontal and vertical polarization.

29 Page: 28 of Used equipments Equipment Model no. Serial no. Makers Next Cal. date Power meter PM AR Power sensor PH AR Power sensor PH AR Directional coupler DC AR Directional coupler DC7144M AR Signal generator E4421B GB AGILENT Amplifier BBA R&S Amplifier 60S1G3M AR Broadband Ant. LPDA Fiber Optic Modem HI4413P ETS ETSLINDGREM Antenna master ETS Used Photographs of test setup

30 Page: 29 of Measurement result Location(EUT) Front side Rear side Left side Right side Antenna polarization Horizontal Vertical Horizontal Vertical Horizontal Vertical Horizontal Vertical Result

31 Page: 30 of Electric Fast Transient/BURST Test specification EN :2004+A1:2010 Coupling AC 24 V Signal/Control: Clamp Telecommunication: Clamp Test level AC 24 V: ± 1 Peak Signal/Control: ± 1 Peak Telecommunication: ± 1 Peak Repetition frequency 100, Tr/Th = 5 / 50 Coupling time 60 s Testing Voltage AC 24 V Test facility Shielded room Date Temperature( C) 23 C Remarks There was no change of operation status during above testing. Humidity (% R.H.) 28 % R.H. Pressure ( ) Measurement procedure A ground reference plane was located on the floor. EFT generator was connected to reference ground plane via low impedance connection. For floor standing equipment, EUT was placed on a 0.1 m wooden table. For tabletop equipment, EUT was placed on a 0.1 m above the ground reference plane. Test generator and coupling/decoupling network was placed on, and bounded to, the ground reference plane. When using the coupling clamp, the minimum distance between the coupling plates and all other conductive surfaces, except the ground reference plane beneath the coupling clamp, Shall be 0.5 m Used equipments Equipment Model No. Serial No. Makers Next Cal. date Generator UCS 500 M EM TEST Capacitive Coupling Clamp EM TEST Used

32 Page: 31 of Photographs of test setup

33 Page: 32 of Measurement result * AC Line EFT coupling point (+) () Result AC 24 V +1 1 EFT coupling point (+) () Result Video Out +1 1 RS Alarm +1 1 EFT coupling point (+) () Result * Signal / Control * Telecommunication

34 Page: 33 of Surge Test specification EN :2006 Coupling AC 24 V: CDN Signal/Control: CDN Test level AC 24 V: ± 0.5, ± 1 Signal/Control: ± 0.5, ± 1 Coupling Impedance Differential mode: Ω Common mode: 10 Ω + 9 Direct Surge pulse shape Tr/Th = 1.2 / 50 Number of surge 5 Coupling time 1 min Testing Voltage AC 24 V Test facility Shielded room Date Temperature( C) 23 C Remarks There was no change of operation status during above testing. Humidity (% R.H.) 28 % R.H. Pressure ( ) Measurement procedure A ground reference plane was located on the floor. SURGE generator was connected to reference ground plane via low impedance connection. For floor standing equipment & table top equipment, EUT was placed on a wooden table Used equipments Equipment Model No. Serial No. Makers Next Cal. date Generator UCS 500 M EM TEST CDN CNV 508 N1 V EM TEST Used

35 Page: 34 of Photographs of test setup

36 Page: 35 of Measurement result * AC Line Coupling point (+) () Result AC 24 V + 0.5, , 1 Coupling point (+) () Result Video Out RS485 Alarm + 0.5, , , , 1 0.5, 1 0.5, 1 * Signal / Control

37 Page: 36 of Conducted Immunity Test specification EN :2009 Tested frequency 0.15 ~ 100 Test level & Modulation 1 V, 3 V, 10 V, 80 % Amplitude Modulation (1 ) 1 V, 3 V, 10 V, Pulse Modulation (1 (0.5s ON: 0.5s OFF)) Frequency Step log 1 % step Coupling method AC 24 V: CDN(M2) Signal/Control: CDN(S1/75), Clamp Telecommunication: Clamp Testing Voltage AC 24 V Test facility Shielded room Date Temperature( C) 24 C Remarks There was no change of operation status during above testing. Humidity (% R.H) 43 % R.H Pressure( ) Measurement procedure A ground reference plane was located on the floor. The test was performed on a ground reference plane on a 0.1 m wooden table. This test were Performed using CDN for mains, clamp for signal and injection probe. The frequency range was swept from 0.15 to 100. This frequency range was Modulated with 1 sine wave at 80 %. The signal generators provided the modulated frequency at a 1 % step size. The power and all network cable, I/O cables longer than 3 m length were tested.

38 Page: 37 of Used equipments Equipment Model no. Serial no. Makers Next Cal. date CS generator NSG Schaffner CDN M Schaffner CDN CDN M2/M3N EM TEST Attenuator INA Schaffner EM Clamp KEMZ Schaffner CDN CDN S1/ EM TEST Current probe MD720 W /M6/ 0068 Schaffner Used Photographs of test setup

39 Page: 38 of Measurement result * AC Line Coupling point Coupling method Result AC 24 V CDN(M2) Coupling point Coupling method Result Video Out CDN(S1/75) RS485 Clamp Alarm Clamp Coupling point Coupling method Result * Signal / Control * Telecommunication

40 Page: 39 of Dips and Interruptions Test specification EN :2004 Number of dips 3T Duration 10 s Phase Zero crossing (0 ) Testing Voltage 230 V, 50 (From AC/AC Adaptor) Test facility Shielded room Test Date Temperature ( C) 23 C Remarks Humidity (% R.H) 28 % R.H Pressure ( ) Measurement procedure The dips/interruption test is only applicable to AC mains. The dips/interruptions were applied at zero crossing Used equipments Equipment Model no. Serial no. Makers Next Cal. date Generator UCS 500 M EM TEST Used

41 Page: 40 of Photographs of test setup Measurement result * 230 V, 50 (From AC/AC Adaptor) Test Level (%UT) Dip/Int. (%UT) Duration /Period Phase ( ) Count number Result 80 % 20% 250 Period(1) 0 3T 70 % 30 % 25Period 0 3T 40 % 60 % 10 Period 0 3T 0% 100 % 250 Period(2) 0 3T Note* Comment: There was no change of operation status during above testing. (250 Period (1), 25 Period, 10 Period) The power of EUT is off during the test. After the test, EUT is getting back to normal operation. (250 Period (2)) Note*: It fully recorded using ancillary Power source equipment to content with Manufacturer`s set up manual.

42 Page: 41 of E.U.T. photographs Front View Rear View

43 Page: 42 of 50 Left View Right View

44 Page: 43 of 50 Top View Bottom View

45 Page: 44 of 50 Inside

46 Page: 45 of 50 Main Board

47 Page: 46 of 50 Terminal Board

48 Page: 47 of 50 CCD Board

49 Page: 48 of 50 CCD Main Board

50 Page: 49 of 50 SUB Board

51 Page: 50 of 50 Power Board

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