Key features and examples of DLTS software 1.1 Software basics 1.2 Software examples 1.3 Database 1.4 Plot programs 1.5 Cryo system 2.1.1 Dlts software structure 2.1.2 Preperation measurements 2.1.3 Static measurements 2.1.4 Transient measurements 2.1.5 Tempscan program module 2.1.6 Isothermal program module
2.2.1 Direct analysis by DLTFS (DLT Fourier Spectroscopy) 2.2.2 Tempscan maximum analysis 2.2.3 Period width scan resp. frequency scan 2.2.4 HERA of coefficients by deconvolution 2.2.5 HERA (High Energy Resolution Analysis) transient evaluation 2.3.1 Quasi logarithmic time axis 2.3.2 Oversampling of period width scan 2.3.3 Some specials
1.1 Software basics Modular software (Base, Dlts, Hall program modules) Software for Windows 9X, NT, 2000, XP, Vista, 7 Entire hardware is software controlled High flexibility and easy use Routine and enhanced software Input/function restriction by selection of a user class Init files, different configurations, hot start Update from PhysTech homepage Demo programs at PhysTech homepage User interfaces by ASCII files or DLL (Dynamic link library)
1.2 Software examples Input of sample ID and contact number for database and automatic file names Saving of all measure data in binary or ASCII files Print out of relevant plots and results on one paper sheet Input of material parameters, definition of new materials Automatic and manual measurements Monitoring of commands and report files for diagnose Simulation of measurements available (training, demo) Personal style of software available (size, buttons, font...) WebView for watching measurement via internet/intranet
1.3 Database Database files: File database as a report of measured files Evaluation database for results, saving by user Standard DBase IV User database, format select by user DLL interface for saving in a customer database Library (only Dlts) Export of DBase IV databases to ASCII, HTML, Paradox, Access, Excel, SQL-Server and user defined by ADO Program module for view, search and sort SQL commands available
1.4 Plot programs Standard plot program: size, symbols, colors, axis, zoom... Application plot program: combined plots, many curves/layers Edit plot program: edit data Presentation plot program: manual many curves/layers, text,... Export to BMP, PCX, GIF, JPEG, WMF, EMF, HPGL, PLT, EPS, DXF, CSV, ASCII, XLS Evaluation (if available) by manual or auto linear regression Interpolation and smoothing by Splines, Gauss, polynom... List of data in a data sheet Print out on half (top/bottom), one or more paper sheets
1.5 Cryo system Support of many cryo systems resp. temperature controllers All cryo system parameters in special ASCII init file Simple makro language for adaptation of controller commands User defined DLL possible Ramp modes: Boxcar ramp, computer controlled Linear ramp, computer controlled Linear ramp by temperature controller, if available All ramp params (waiting time, delta T...) user defined Temperature depending PID params, if PID available Functions for adaptation and check
2.1.1 Dlts software structure Main modules (similiar structure): Static measurements Transient Isothermal Tempscan Base tools (calibration) Check measure (preparations) Plot, Database, Library,...
2.1.2 Preparation measurements Input of sample params (material, type, area, ID...) Search of the polarity Check of contact Searching of minimum ranges Capacitance compensation Reverse I/V curve for check of leaking current C/V curve and calculation of shallow concentration Ns Preparation measurements from all program modules
2.1.3 Static measurements Measurement of C/V HF- and pulse-curves --> Ns Measurement of I/V curves --> n-factor of diode Measurement of FET UDS (drain source voltage), UGS (gate source voltage) and param curves Calculation of depth profile Ns(x) All measurements as function of temperature possible, for example Ns(T) Richardson plot for calculation of barrier height TSC and TSCAP (measurement without pulse versus temp) MIS evaluations
2.1.4 Transient measurements Measurement up to 4096 transient points by ADC Fourier transform of transient --> Fourier coefficients bn (sin) and an (cos) Using coefficients of low order (digital filter) --> good SNR Good SNR by variable anti-aliasing filter and averaging Automatic C/I-range, amplification and C-compensation Measurement of C (capacitance), V (voltage, CC-Dlts), I (current), Q (charge) Pulse modes: electrical, double, fast pulse, optical, combination optical/electrical Measurement during and after pulse possible Fix/variable period width, linear/logarithmic/quasilog time axis
2.1.5 Tempscan program module Up to 20 files during 1 tempscan possible All files in 1 temperature cycle or in different cycles Variation of: Tw (period width = measure time per transient), UR (reverse bias), UP (pulse voltage), tp (pulse width), pulse modes, DS/Aux voltage, 2. pulse, wave length Automatic variation of period width possible Automatic/manual variation/search of temperature steps or predefined temps possible Manual input of params or by predefined init files for easier use Saving of some or all transient points Measurement of C/V, I/V, TSC/TSCAP curves available Option multi sample interface
2.1.6 Isothermal program module Measurement at fix temperature and variation of one parameter: Tw, UR, UP, UR/UP, tp (lin and log), UAux, UDS, wave length, UserX Plot coefficient versus this parameter Measurement of period width (frequency) scan ITS parameter variation: period width scan files with variation of T (temperature), UR, UP, tp,... Arrhenius plot of period width scans Application measurements for easier use of inputs Calculation of depth profiles and field-dependence of tau Indirect capture evaluation by tp-variation (b1 % tp) for determination of capture cross section
2.2.1 Direct analysis by DLTFS Tau calculated directly from the transient by Fourier transform Examination of results by calculation of several ways Constant and computer controlled variable period width Many Arrhenius points, large range tau(a1,b1) = 199.987 ms Amplitude = 1.000 pf tau(a2,b2) = 199.979 ms NT = 9.09E+13 cm -3 tau(b1,b2) = 200.004 ms NTs = 1.72E+14 cm -3 tau(a1,a2) = 200.019 ms Energy = 0.627 ev tau(tw/4) = 199.743 ms tau,ts/tw = 0.20,1.53 tau(tw'/2) = 199.999 ms ExpClass = 1.00 tau(a0,b1) = 199.685 ms TauClass = 75 T [K] 220 180 160 140 Transient [pf] 0.8 ln(tau*v th *N C ) 62 E C -E T [ev] sigma [cm 2 ] N T [cm -3 ] Correl 0.350 1.00E-14 9.16E+13 1.00000 0.4 58 54 0.0 0.4 0.8 Time [s] 5.0 6.0 7.0 1000/T [1/K]
2.2.2 Tempscan maximum evaluation 28 Fourier coefficients resp. correlation functions per period width (file): sin, cos, boxcar, double-rectangular, Dlts... Coefficients with better energy resolution or SNR Until 3 user defined correlation functions by ASCII file or DLL Recalculation (tempfit) and smoothing of coefficients possible Coef. [ff] 200 100 0 Name = @A_005.T1F :b 1 :a ID = Demo 1 rcid = 1A51 Date = 09.07.2008 Type = n-si Area = 8.00E-03 cm 2 N S = 2.00E+15 cm -3 t 0 = 2.80 ms T W = 204.80 ms t P = 100.00 us U R = -5.00 V U P = 0.00 V 120 160 200 240 T [K]
2.2.3 Period width scan resp. frequency scan Period with scan --> (numerical) normalized tau scan Tau calculated from the maximum position All coefficients as in tempscan and ICTS signal available Automatic variation of temperature available --> Arrhenius a 1 [ff] 30 20 10 0 10-3 10-2 10-1 10 0 10 1 10 2 Period width [s]
2.2.4 HERA (High Energy Resolution Analysis) of coefficients by deconvolution Deconvolution of coefficient at period width scan Deconvolution of tempscan Energy [ev] norm. a 1 [pf] 1.2 0.8 0.4 :DeconvFit tau1=1.00e-01 tau2=3.98e-01 Amp1=9.92E-01 Amp2=1.00E+00 yerr=1.03e-04 0.30 0.35 0.40 ID = Demo Date = 14.07.2008 Type = n-si Area = 8.00E-03 cm 2 N S = 2.00E+15 cm -3 Temp = 161.00 K t P = 100.00 us U R = -5.00 V U P = 0.00 V C R = 43.61 pf I R = -0.00 A 0.0 10-3 10-2 10-1 10 0 10 1 tau [s]
2.2.5 HERA transient evaluation Multi exponential fit: DISCRETE by Provencher Laplace transfrom: CONTIN, FTIKREG Combination with DLTFS for amplitude and NT Transient [pf] 2.0 No tau [s] Amp [pf] 1 1.02E-01 1.03E+00 2 2.53E-01 9.73E-01 1.0 0.0 10-2 10-1 10 0 10 1 eff. time [s] ln(tau*v th *N C ) 66 62 T [K] 220 180 160 140 Level E C -E T [ev] sigma [cm 2 ] N T [cm -3 ] Correl 1 0.354 1.24E-14 5.20E+13 0.99992 2 0.380 9.94E-15 5.00E+13 0.99999 distribution 0.8 tau1=1.02e-1 tau2=2.53e-1 0.6 0.4 0.2 58 54 0.0 10-3 10-2 10-1 10 0 10 1 10 2 tau [s] 5.0 6.0 7.0 1000/T [1/K]
2.3.1 Quasi logarithmic time axis Log. time axis by meas. 65000 sample points and interpolation, bad SNR because high filter frequency and no averaging Quasi log. time axis by combination of 3 or many transients with different Tw (tempscan or isothermal program), for every transient optimal analog filter frequency and averaging Transient [pf] 4.0 0.0 No tau [s] Amp [pf] Cl 1 8.85E-02 1.26E+00 49 2 3.00E-01 7.39E+00 72-4.0 10-3 10-2 10-1 10 0 eff. time [s]
2.3.2 Oversampling at period width scan Transient oversampling measurements until 65000 points, building of transients from these points by digital filtering Many b1/tw points by building many transients from 1 measure Good SNR because averaging at small period widths Reduction of ITS measurement time down to 10 % b 1 [ff] 80 : measured : constructed 60 40 20 0 10-3 10-2 10-1 10 0 10 1 10 2 Period width [s]
2.3.3 Some specials Evaluations for exp., lin. and log. transient Three terminal FET current transient measurement Surface states Nss(E) calculation for MIS samples Zerbst plot at MIS for life time evaluation Temperature depepending Zerbst plots --> Arrhenius Measurements at 2 params (UR, UP, tp) and making difference, for example DDLTS Level seperation by measurements with 2 pulse widths (small and big capture cross section) Database library for discrete levels, predefined values by literature, expansible by user