X-ray diffraction in polymer science 1) Identification of semicrystalline polymers and Recognition of crystalline phases (polymorphism) of polymers 2)Polymers are never 100% crystalline. XRD is a primary technique to determine the degree of crystallinity in polymers. 3) Microstructure: Crystallite size in polymers is usually on the nanoscale in the thickness direction. The size of crystallites can be determined using variants of the Scherrer equation. 4) Orientation: Polymers, due to their long chain structure, are highly susceptible to orientation. XRD is a primary tool for the determination of crystalline orientation through the Hermans orientation function.
1) Identification of semicrystalline polymers Positions and Intensities of the peaks are used for identifying the material. The diffraction of unoriented samples in reflection I Unoriented PE 110 2θ = 21.4 PE polyethylene The diffraction of unoriented samples in transmission by using a flat film is characterized by concentric circles called Debye Scherrer Rings 200 2θ = 23.9 5 10 15 20 25 30 35 40 2θ (deg) R hkl = D tan2θ hkl 110 (2θ=21.4 ) 200 (2θ=23.9 ) Unoriented PE
X ray diffraction of semicrystalline and amorphous polymer I 300 110 (11.8 ) (6.2 ) 310 220 211 (20.3 ) s-ps syndiotattic polystyrene I amorphous s-ps syndiotactic polystyrene 210 400 5 10 15 20 25 30 35 40 2θ (deg) 5 10 15 20 25 30 35 40 2θ (deg)
1) Identification of crystalline phases of polymers Position and Relative intensities are the fingerprint of crystalline phases of polymer 211 110 220 300 310 410 400 210 200 030 121 031 131 510 600 s-ps 002 α α a b Intensity 200 020 210 010 220 _ 101 111 020 210 111 410 _ 410 _ 301 321 040 420 231 401 041 331 _ 421 _ 411 132 γ δ _ 210 _ 010 210 020 210 111 _ 121 230 321 211 301 121 _ 421 _ 411 102 _ 112 302 _ 322 220 030 212 _ 302 322 230 040 δ δ DCE 5 10 15 20 25 30 35 40 2θ (deg)
Identification of crystalline phases of polymers also if they are present in mixture. β s-ps (110) I i-pb Intensity e β β t = 5 min max T = 320 C max I (211) I (220) I (300) I Forma I d β α α β T = 310 C max Forma I + II c b a α+β α β α β α β α T = 300 C max T = 290 C max T = 280 C max (200) II (220) II (311) II Forma I + II Forma II 0 5 10 15 20 25 30 35 40 2ϑ (deg) 5 10 15 20 25 30 2θ (deg)
X ray diffraction of semicrystalline polymer and inorganic compound Polymer inorganic compound I 300 110 (11.8 ) (6.2 ) 310 220 211 (20.3 ) s-ps syndiotattic polystyrene I KBr 210 400 5 10 15 20 25 30 35 40 2θ (deg) 5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 2 θ (deg)
30000 What about this spectra? 25000 9.5 20000 28.6 Intensity (a.u.) 15000 10000 17 5000 0 14.1 19 18.6 21.6 25.6 38.5 48.7 59.3 5 10 15 20 25 30 35 40 45 50 55 60 2θ( )
Diffrazione dei raggi X del campione prima TGA polimero Diffrazione dei raggi X del campione dopo TGA Carica inorganica
The peak positions, intensities, widths and shapes provide important information about the structure of the material amorphous / crystalline (polymer, inorganic/organic compound) crystalline phases
2)XRD a primary technique to determine the degree of crystallinity in polymers. The determination of the degree of crystallinity implies use of a two-phase model, i.e. the sample is composed of crystals and amorphous and no regions of semi-crystalline organization. I = I crystallin + I e amorphous degree of crystallinity : x c I x I = c I + crystalline crystalline I amorphous 5 10 15 20 25 30 35 2θ
2) XRD : determination of degree of crystallinity in polymers. The diffraction profile is divided in 2 parts: peaks are related to diffraction of crystallites, broad alone is related to scattering of amorphous phase. The assumption is that the areas are proportional to the scattering intensities of crystalline and amorphous phases I a PE I c I b I a = diffracted intensity of amorphous phase I b = diffracted intensity of background I c = diffracted intensity of crystalline phase x Acr = c A + KA cr am K is a constant related to the different scattering factors of crystalline and amorphous phases. For relative measures K = 1.
3) Microstructure: Crystallite size in polymers The half-width of peaks is related to crystallite dimensions. Half-width large correspond to smaller crystallites Intensity Contribution to broadening can be due to lattice distortion, structural disorder as well as instrumental effects. 5 10 15 20 25 30 2θ (deg) Half-width narrow correspond to bigger crystallites Intensity 5 10 15 20 25 30 2θ (deg)
Intensity 3) Microstructure: Crystallite size in polymers I max I max /2 B B = half-width of peaks B = 2θ = 2θ 2 2θ 1 β = B b b = broadening instrumental β= broadening due to crystallites dimensions 2θ 2θ 1 2θ 2 Crystallite size in polymers : 2θ (deg) b can be measured by the half-width of a peak of crystalline compounds low molecular weight. L hkl λ = K Scherrer s Equation β cosθ L hkl = crystallite dimensions (in Å) along the direction perpendicular to the crystallographic plane hkl. β = half-width of peak related to the crystallographic plane hkl (rad). K = constant (usually K = 0.89) θ = diffraction angle of the hkl reflection. λ = wavelength used ( λ Cukα = 1.5418 Å.)
4)Orientation: Polymers, due to their long chain structure,are highly susceptible to orientation Fiber axes Draw direction X-ray c fiber
X-ray diffraction of oriented polymer: fiber pattern y meridian 360x cos2θ = cos cos tan 2πR -1 y R Second layer l=2 (hk2) First layer l=1 (hk1) equatorl=0 (hk0) x c = lλ -1 sen( tan ( y/ R)) i-pp fiber c = periodicity along the chain axes λ = wavelength used (CuK α = 1.5418 Å) l = layer x, y = distance of reflections from the center along equatorial and meridian lines R = chamber radius
X-ray diffraction of fibers annealed at different T Distance from layers correspond to c axes Helical conformation c=7.8 Å Trans-planar conformation c=5.1å
Oriented spp fiber stretched at different ε First layer l=1 (hk1) equator l=0 (hk0) ε = 50 % ε = 100 % ε = 200 % ε=100(lf-li)/li Lf = final length Li = initial length ε = 500 %
The degree of orientation can be determined from the intensity distribution of the corresponding diffraction on the Debye ring by using the Hermans Orientation Function 1 2 ( 3 1) f φ = cos φ 2 φ a,z Z = draw axes c φ c,z φ b,z Azimutal scan: measuring the intensity at 2θ constant, by varying the χ angle. Average cosine squared value of φ angle a b χ 2 If the radiation is perpendicular to the fiber axes χ I ( χ) < cos 2 χ hkl cos 2 >= φ hkl π / 2 0 = cos π / 2 0 2 χ hkl senχ 2 cos χdχ I( χ) senχdχ Orientation with respect to draw direction parameter parallel random perpendicular <cos 2 φ> f 1 1 1/3 0 0-1/2 If χ = 0 for meridian reflection (00l) <cos 2 φ 00l > = 1 e f c = 1 The fiber is perfected oriented: f c = 1
Types of Orientation in polymers Types of ORIENTATION GEOMETRY (Heffelfinger & Burton) 1 PREFERRED ORIENTATION Crystallographic elements Reference elements 1 Random - - - 2 Axial 3 Planar 4 Planar-axial 5 Uniplanar 6 Uniplanaraxial Crystallographic Axes parallel to reference axes Crystallographic Axes on a reference plane Crystallographic plane Parallel to a reference axes Crystallographic plane Parallel to a a reference plane Crystallographic Axes parallel to reference axes and a Crystallographic plane Parallel to a a reference plane c c draw axes film plane (100) draw axes (100) film plane c (100) draw axes film plane C. J. Heffelfinger, R. L. Burton J. Polym. Sci. 47, 289 (1960).
Uniplanar orientation: sps film 211 110 220 β 110 020 Intensity 200 010 220 300 310 410 400 β 210 110 120 200 020 210 _ 210 _ 010 210 040 130 220 _ 111 _ 111 150 060 101 111 230 321 510 041 131 600 140 240 170 030 031 121 410 131 040 _ 420 231 410 401 020 210 111 020 111 _ 321 041 331 _ 411 _ 411 030 132 _ 322 302 α '' β '' γ δ 002 002 DCE clathrate 040 E D C B A Intensity 020 200 210 010 010 110 020 300 β 040 130 410 β 400 030 020 150 060 101 111 020 111 211 040 410 600 240 170 _ 230 030 α E β D γ C δ B DCE clathrate 040 A 5 10 15 20 25 30 35 40 2θ (deg) Figure 1 5 10 15 20 25 30 35 40 2θ (deg) Figure 2
Types of Orientation in polymers Through direction End direction MD TD Edge direction through Uniplanar orientation : (010) end 010 edge Rizzo, Lamberti, Albunia, Ruiz de Ballesteros, Guerra Macromol. 2002, 35, 5854 Albunia, Rizzo, Guerra Chem. Mat. 2009, 21,3370
Along the chain projections of packing of δ forms of s-ps showing (010) planes parallel to the film surface Film surface 010 planes 8.70Å (010) planes correspond to rows of parallel helices with minimum interchain distances (8.70Å) and maximum interplanar distances (10.56Å)
s-ps co-crystals L R a/2 0.87 nm a c b a c L R R L De Rosa, C.; Rizzo, P.; Ruiz de Ballesteros, O.; Petraccone, V.; Guerra G. Polymer, 1999, 40, 2103. Chatani, Y.; Shimane, Y.; Inagaki, T.; Ijitsu, T.; Yukinari, T.; Shikuma, H. Polymer, 1993, 34, 1620.
Unique feature of s-ps: three uniplanar orientations b a c L R L R Bp < 110 C Rizzo, Della Guardia, Guerra Macromolecules 2004, 37, 8043 Solvent induced crystallization on amorphous film Bp > 140 C Rizzo, Spatola, Del Mauro, Guerra Macromolecules 2005, 38, 10089 a // c // a // c a c // Film thickness THF, CHCl 3 Rizzo, Lamberti, Albunia, Ruiz, Guerra Macromolecules 2002, 35, 5854 p-xylene, dichloroethane Rizzo, Costabile, Guerra Macromolecules 2004, 37, 3071 Solution casting; Spin-coating Albunia, Rizzo, Tarallo, Petraccone, Guerra Macromolecules 2008, 41, 8632
sps Films: Orientation Upon Biaxial Balanced Drawing (sps)syndiotactic polystyrene E biaxial D 2 stretch E I E 2.5x2.5 D 1 a // c // E L M R Film surface c a a // c // Planes 010 planes 8.70Å a// c// planes correspond to rows of parallel helices with minimum interchain distances (8.70Å) and maximum interplanar distances (10.56Å) Paola Rizzo*, Alexandra R. Albunia Macromolecular Chemistry and Physics 2011, 212,1419-26
Uniplanar orientation E biaxial D 2 stretch E I E 2.5x2.5 D 1 E L M R (PET) polyethylene terephthalate (100) uniplanar orientation (a=4.56å b=5.94å c=10.75å α=98.5 β=118 γ=112 ) triclinic lattice Bin, Y.; Oishi,K.; Yoshida, K.; Nakashima T.; Matsuo, M.; J. Polymer, 2004, 36,394-402
Uniplanar orientation (i-pp) polypropylene E biaxial D 2 stretch E I E 2.5x2.5 D 1 L M R A crystalline plane preferentially parallel to the film plane Primary slip-plane: - containing the chain axis - and having the highest density E Paola Rizzo, Vincenzo Venditto, Gaetano Guerra, Antonio Vecchione Macromolecular Symposia 2002, 185, 53-63.
E biaxial D 2 stretch E I E 2.5x2.5 D 1 Uniplanar orientation A MD E L M R (i-pp) polypropylene B TD ND MD C MD TD Paola Rizzo, Vincenzo Venditto, Gaetano Guerra, Antonio Vecchione Macromolecular Symposia 2002, 185, 53-63.
In the Schulz reflection method the goniometer is set at the Bragg angle corresponding to the crystallographic planes of interest. A special specimen holder tilted the sample with the horizontal axis (y rotation axis), while rotating it in its own plane about an axis normal to its surface (j rotation axis). The y rotation can be varied from 0 to 90, whereas the j rotation can be varied from 0 to 360. The pole figures are plotted on a polar stereographic projection using linear intensity scale.
E biaxial D 2 stretch E I E 2.5x2.5 D 1 E L M R Uniplanar orientation (i-pp) polypropylene Iso-intensity lines indicate the relative intensity of the pole related to the maximum diffracted intensity (assumed equal to 10). The presence on the diffraction rings of the pole figures of the (110) and (130) reflection of intensity maxima along MD indicates some preferential c-axis orientation along TD. It is worth noting that this minor axial orientation, which is related to a not perfect balancing of draw ratios between the two drawing directions. Paola Rizzo, Vincenzo Venditto, Gaetano Guerra, Antonio Vecchione Macromolecular Symposia 2002, 185, 53-63.
ipp:uniplanar-axial orientation A MD B TD MD C ND MD TD Paola Rizzo, Vincenzo Venditto, Gaetano Guerra, Antonio Vecchione Macromolecular Symposia 2002, 185, 53-63.
ipp:uniplanar-axial orientation The pole figure of the (040) reflection shows a strong maximum in ND. Correspondingly, the (110) and (130) pole figures show rings at latitude 72 and 46, respectively. These rings present more intense maxima along MD and less intense maxima along TD, indicate the occurrence of a bimodal axial orientation, with prevailing orientation along TD. Crystallites presenting (110) planes parallel to the film surface, associated with a c-axis orientation along TD, can account for the two weak reflections at latitude of 72 along MD, which are present on the (040) pole figure Paola Rizzo, Vincenzo Venditto, Gaetano Guerra, Antonio Vecchione Macromolecular Symposia 2002, 185, 53-63.
ipp:uniplanar-axial orientation The bimodal axial orientation, associated with a major uniplanar orientation relative to the (0k0) planes and minor uniplanar orientations relative to the (110) and (130) planes, can rationalize all the diffraction peaks which occur in photographic patterns, like those shown previously Paola Rizzo, Vincenzo Venditto, Gaetano Guerra, Antonio Vecchione Macromolecular Symposia 2002, 185, 53-63.
Blown film of PE (PE) polyethylene a-axis (200) is preferentially oriented along the MD It is evident that the a-axis (200) is preferentially oriented along the MD, because poles with highest intensity are concentrated at the north and south ends of the (200) pole figure. In the (020) pole figure, poles with the highest intensity are concentrated in the center, and spread along the TD. This suggests that b-axis is oriented in the ND-TD plane. Chen, H. Y.; Bishop, M. T.; Landes, B. G.; Chum, S. P.; J. App. Polym. Sci., 2006, 101, 898-907
sps:uniplanar-axial orientation
sps:uniplanar-axial orientation a c ax a // c ax c ax
sps: uniplanar-axial orientation