Breakthrough Performance in Mobile Phone Testing Fast and Accurate Measurements Full Flexibility with Powerful Control



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Transcription:

Breakthrogh Performance in Mobile Phone Testing Fast and Accrate Measrements Fll Flexibility with Powerfl Control

The New Platform for Testing Digital Commnications Breakthroghs in speed of test: Transmitter qality and receiver BER simltaneosly measred drastically redces test time by p to 50%. Using Freqency Hopping saves test time. Uniqely avoids normal channel assignment, redcing test time by eliminating extra signaling. Fast Board Level Test: The Fast Peak Power meter detects, measres and stores brsts 20 times per second. The reslts can then be transferred together in one block, speeding the power alignment. Breakthroghs in Accracy: Highest performance in power measrements with precision of ±0.6 db absolte, ±0.03 db repeatability, sets new standards. Fll 70 db dynamic range with single RF connector ensres overall specification compliance. Breakthroghs in Control: Internal BASIC commands provide flly atomatic test from scripts. Internal editor allows easy program generation and debgging. Controller fnction can drive GPIB power spplies or other eqipment. Indstry standard SCPI commands simplify integration into existing prodction test systems The internal hard disc provides program and reslts storage, and the PCMCIA ports are indstry standard interfaces. avetek s new 4400 series of mobile phone testers provide mltiband and mlti-format testing. Performance barriers have been broken with the highest speed measrement techniqes and accrate RF modles, bilt pon the latest high technology modlar platform. For manfactring applications the flexibility and niqe controllability make it the ideal test instrment for: Board level alignment Fnctional/operational test Final check Qality control checks Investment Secred with Modlar Design The first format spported is GSM at 900, 1800 and 1900 MHz. The modlar system makes the 4400 a secre long-term investment. New formats planned inclding cdmaone, and as radio technologies matre for IMT 2000/ UMTS, new protocols and interfaces can easily be inclded. New techniqes drastically redce test time No strap-on nits or complicated connection procedres are reqired, new modles simply slide in and software pgrades are easily loaded via the floppy disc drive. The Best in High-Speed Measrement The 4400M employs innovative techniqes to redce test bottlenecks in manfactring. Parallel Testing TX and RX Halve Test Time Simltaneos measrements of the receiver sensitivity (BER) and the transmitter signal qality (Power/ Time Template, phase/freqency error and ACPM), redces test time dramatically, withot redcing qality. Hopping Increases Test Efficiency Using the freqency hopping capability inherent in GSM phones additionally redces the mobile test time. Instead of separate tests for RX and TX being carried ot seqentially on several channels across the bands, the 4400M checks the mobile phone in hopping mode and assigns the test reslts p to 5 individal freqencies. No signaling time is lost switching between channels. High accracy provides an extended tolerance range Easy operation de to simple MMI- Interface and clearly layed ot screen Fast Peak Power Measrements for Board Level Testing This niqe Fast Peak Power Meter provides precise alignment vales for the power staircase, saving time at board level test. ith the 4400M every brst is recognized, the level measred at 20 times per second and the reslts are stored together with the frame nmber. The collected data can be transferred back to the system controller in one block, redcing the alignment time. Precise RF measrement The 4400M sets new standards in mobile phone testing by providing an otstanding level accracy of ±0.6 db absolte accracy and ±0.03 db repeatability. The power otpt and therefore the consmption of the mobile is optimized, so the battery talk time increases. Fll Versatility The fll 70 db dynamic range is available from the low VSR precision connector withot the need for ncalibrated axiliary ports for lower power levels. All analyzer settings are decopled from the generator settings so that signal analysis withot the normally fixed 45 MHz offset is possible. Sprios signals, noise floor levels, 900 MHz band harmonics and other ot of band signals can be measred. Easy Calibration Individally calibrated modles, traceable to national standards, can be easily exchanged providing a continosly calibrated system when installed in a test rack.

Flexible Use with Universal Operation Fast, Flexible and Precise Measrements Using indstry standard SCPI integrating new test cases Versatility and accracy also commands, the 4400 can be integrating new mobiles. make the 4400M a natral choice Average, max, min. operated by remote control. In The ergonomic design provides a for Research and Development and crrent vales On-line help is master mode an internal GPIB comfortable environment for Teams involved in chip sets or simplify alignment context sensitive controller fnction allows IEEE- manal operation, allowing fll complete phones. against specifications and tracks with driven power spplies or other concentration for faster reslts. Easy transfer of software versions eqipment to be integrated into Family Incldes Service Versions RAPID! programs the test program. PC Performance Inside The 4400 series incldes both Connection directly to a standard manfactring and service versions, Atomatic Test Rotines VGA monitor, PC keyboard or with the 4400S targeted at high- Easily Generated mose, improves the comfort of level service and after-sales market To simplify control, atomated test working. The indstry standard for component repair and complete procedres RAPID!* programs can PCMCIA ports allow connection to realignment applications. be created with the bilt-in editor LANs or other applications. avetek s family of precision and stored on the avetek 4400M The 1.4 GB hard disc stores instrments covers the complete hard disc. These scripts can be setps, reslts and RAPID! range for GSM test from Go/NoGo initiated via the GPIB. Reslts are programs and a 3.5 inch floppy disc throgh service and manfactring collected in one block and drive allows data exchange. p to R&D reqirements. transferred in the same format. This redces traffic on the GPIB Use Everywhere in Prodction and allows the test system The 4400M can be sed every- controller to independently carry where on the prodction line, ot other tasks sch as keyboard from board level test throgh and display checks. fnctional test p to the final check. ith its simple, Direct Control Using Colorfl Screen ergonomic operation, it can Manal control is still critical for also be sed for qality control Examine detailed many applications sch as: and repair. Hopping test measrements against controlling and modifying test across 5 channels standard or ser- Power measrements to rotines verifying test reslts to locate High precision measrements with traceable reslts. redces signaling time defined templates sing zoom ±0.6 db accracy allow wider prodction tolerances errors * RAPID! Rn Application Programs with Integrated Development!

Key Fnctions RX Sensitivity Measrements Information Screen Brst Measrement Timing advance error can be sing channel change signaling. Bit Error Rate (BER) Mobile parameters, are comprehen- The GSM brst is measred against measred and reaction speed for Two independent hop sets save Comprehensive range of measre- sively shown, inclding spport for the ETSI standard or ser-defined mobile realignment can be checked. time in mlti-band phone tests. ments are provided on speech bits A5 cyphering, dal-band, SMS and Power/Time Template as an over- (this capability is available for all type Ia, Ib, II, CRC. Additionally Power class. view or zoom,«. Spectrm De to Modlation and the measrements shown with «). the 4400M prodces BER on data with coding at different bad rates, 9600, 4800, 2400 bps. Reported vales of FULL and niqely SUB vales, inclding neighboring cell, are provided to A ser-defined mask can be generated with a bit by bit digital read ot sing markers «to check Switching Transients This critical set of tests are displayed «as a table or graphically, Versatile Signal Generator The mobile is kept on TCH and Zoom into rising, falling or flat sections of brst gain a complete pictre of mobile overshoot or ot-of-slot problems. for all channels in the reqired area the independent analyzer provides Comprehensive Brst Mode Residal Bit Error Rate measrements. Up to 8 ser defined corner ±1.8 MHz from carrier against the fll measrement to avoid special Generates signals on BCCH, FCCH RBERs Ä are provided on type Ib, II points «may also be sed on the ETSI or ser definable templates. test modes in the mobile. modlated with defined or random bits, and the Frame Erasre Rate TX Qality Measrements brst for tolerance tests as a pre- Fll range 120 to 10 dbm data; with or withot modlation; (FER). Phase errors are available sing warning dring manfactre. High Signaling Flexibility available avoiding ncalibrated with or withot training seqences two markers, movable by single bit, Both Late or Early Assignment with axiliary connectors. for debg, board test and I/Q New Fast BER,«on a graphical display to give a clear the time slot, selected from 2 to 6 modlator alignment. Brst by brst reslts are also pictre of modlator performance allowing mobiles which may have available for mobiles which can over the brst. Uniqely displayed problems with a specific time slot to ide Range Analyzer enable new (p to 5 times faster) are max, min., average and crrent be evalated. Channel selection is Continosly available > 70 db type C loop. vales for level, phase and according to GSM 900, GSM 1800 brst range provides complete freqency errors. This aids alignment and the max vales can help identify intermittent and ot of tolerance Flexible parameter settings for optimal adjstment in individal environments and GSM 1900. Signaling is provided for MS level, and the new BSP mlti-frame to check the alignment at high speed with otstanding power accracy ±0.6 db and measrement repeatability mobiles. sleep mode and hence of ±0.03 db. Increased flexibility from mltiple BER measrements Separating freqency alignment from phase error problems de to modlator misalignment is easier with Phase Error Diagram,«, peak The Fast Peak Power «mode allows p to 20 readings per second to be measred and allocated to specific brsts. By ranging down, a battery saving capability. Hopping over Precise and easily adjstable markers allow a qick and accrate measrement in every graphic display The 4400M displays this measrement with actal, average, minimm and maximm vales. «In hopping mode (see above) the reslts of these measrements are available for each channel as well as an average vale of p to 5 channels. and rms phase vales shown. complete power staircase can be measred in approximately 15 sec. 5 Channels The mobile can be checked at different power levels across the freqency band chosen withot Nmerical and graphically displayed reslts provide fast overview and precise details

fi Smmary Technical Data For details please refer to Technical Data Sheets. Basic RF Performance Freqency range Freqency resoltion Freqency error 800 to 1000 MHz, 1700 to 2000 MHz 1 Hz 0.05 ppm 0.5 ppm / year Protocol GSM 900, 1800, 1900 corresponding to ETSI GSM 04.08 VSR 1.1 : 1 *, 1.2 : 1 RX Measrements (RF Generator) Level range Level accracy Level resoltion BER range BER, RBER FBER Phase error 120 to 10 dbm ±1.0 db ( 110 to 10 dbm) 0.01 db 1000 to 10 6 Bits 10 to 10 5 Frames 100 to 10 6 Brsts < 2.5 rms, < 7.5 peak Yor nearest representative: avetek is a registered trademark of avetek Corporation. Sbject to alterations. IIS201B091998E avetek GmbH 1998 TX Measrements (RF Analyzer) Level range 10 to +36 dbm Level accracy ±0.6 db * Repetition accracy Relative to peak level Level resoltion Brst dynamic Phase error accracy General Data H x x T eight Power spply Power consmption ±0.03 db ±0.2 db at ±3 dbc ±0.5 db at 10 dbc ±2 db at 40 dbc ±5 db at 70 dbc 0.01 db > 70 db < 0.8 rms, < 2.4 peak from 1 to 15 rms 180 x 360 x 330 mm 10.5 kg 94 to 132 VAC 187 to 264 VAC 160 Operating temperatre +5 C p to +45 C * on RX Measrements < 32 dbm and TX Measrements > 10 dbm All technical data is still preliminary. orldwide Sales Offices Astria avetek Ges.m.b.H. Pharos Has Nordbahnstrasse 36/TOP 1.4 1020 Vienna, Astria Tel: (43) 1-214-5110 Fax: (43) 1-214-5109 China avetek Corporation Room 2701, CITIC Bilding No. 19 Jiangomenwai Dajie Beijing 100004, PR China Tel: (86) 10-6592-8044 Fax: (86) 10-6500-8199 France avetek S.A. 12 Bolevard des Iles Immeble Seine St-Germain, Bât. B 92441 Issy-les-Molineax Cédex, France Tel: (33) 1-4190-6666 Fax: (33) 1-4190-6650 Germany avetek GmbH Gtenbergstrasse 2-4 85737 Ismaning, Germany Tel: (49) 89-99641-0 Fax: (49) 89-99641-160 Hong Kong avetek Hong Kong Ltd. 3A, HKPC Bilding 78 Tat Chee Avene Kowloon, Hong Kong Tel: (852) 2788-6221 Fax: (852) 2788-6220 Japan Yokogawa avetek Corporation 4F, Promity Fchinobe Bilding 9-15, Kanmadai 1-chome Sagamihara-shi, Kanagawa-ken 229-0033, Japan Tel: (81) 427-57-3444 Fax: (81) 427-57-5722 Singapore avetek Asia-Pacific Pte. Ltd. 51 Goldhill Plaza #14-04/05 Singapore 308900 Tel: (65) 356-2522 Fax: (65) 356-2553 The Americas avetek Corporation 5808 Chrchman Bypass Indianapolis, IN 46203, USA Tel: (1) 317-788-9351 Fax: (1) 317-614-8307 United Kingdom avetek Ltd. Hrricane ay Norwich, Norfolk NR6 6JB, UK Tel: (44) 1603-256-700 Fax: (44) 1603-256-688 Internet: www.wavetek.com