CCD and CMOS Image Sensor Technologies. Image Sensors

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CCD and CMOS Image Sensor Technologies Image Sensors There are Two Main types of Image Sensors are available today: CCD and CMOS Both were originally developed in the late 1960 s and 1970 s

Defining Some Concepts Quantum Efficiency QE = Electrical Energy / Radiant Energy Fill Factor FF = Active Area in Pixel / Total Pixel Area Microlenses improve the effective fill factor 2 or 3 times Imager Types CCD = Charge Coupled Device CMOS = Complementry Metal Oxide Semi-Conductor, often called Active Pixel Sensing, or APS CCD = specialized production plant and process CMOS = standard silicon production line

Imager Types CCD = Longer mass production period means more mature technology and better quality CMOS = technology to produce high image quality has proven more difficult and specialized to obtain than expected CMOS APS Vs. CCD CCD requires specialized expensive processes; not easily integrated with CMOS has high Quantum Efficiency, high fill factor and low noise lacks random access and fast readouts needs multiple voltages on chip for efficient charge transfer APS is lower voltage and lower-power achieves random access and faster readout can yield low noise with peripheral circuitry compatible with CMOS process

Image Sensors Through the 80 s 90 s and until today CCD s became dominant primarily because they gave far superior images with the fabrication technology available. Not until the late 1990 s could designers begin to make a case for CMOS to even be considered as a viable alternative. Primarily the renewed interest came from expectations of lower power requirements for CMOS. CMOS Designers however had to overcome the many inherent image quality deficiencies of CMOS particularly high noise, poor low sensitivity and poor dynamic range. Difference between Mechanisms of CCD and CMOS Image Sensors CCD Image Sensor Charge Transfer Charge-to-voltage Conversion /Amplification Vertical and Horizontal CCD Amplifier behind Horizontal CCD Light-to-charge Conversion Charge Accumulation Photo Sensor (Light-sensitive Region) of a Pixel Charge-to-voltage Conversion /Amplification Amplifier within Pixel Voltage Transfer Signal Wire (Micro Wire) CMOS Image Sensor

Basic Mechanism of CCD Image Sensors CCD wells Buried channel stops to define columns Array of insulated electrodes to define pixels Additional array of electrodes to shift a line at a time

Pixel (a) CCD Image Sensor Light Photo Sensor (b) (Light-sensitive Region) Charge (Electrons) Vertical CCD (c) Output Amplifier (x) Horizontal CCD (d) Light Photo Sensor Gate Opens Charge (Electrons) Gate Charge Transfer from Photo Sensor to Vertical CCD Like Water Draining from a Dam Charge (Electrons) Vertical CCD

Charge Transfer by CCD in a Bucket-brigade Fashion CCD CCD CCD CCD Charge Charge Charge Charge Charge Transfer by CCD in a Bucket-brigade Fashion

Amplifier of CCD Image Sensor Voltage Generated on Surface of FD Output Amplifier Output Gate Gate Horizontal CCD Gate Gate Micro Wire Charge Floating Diffusion (FD) CCDs 3 Phase Serial Register 1 2 3 1 2 3 1 2 3 1 2 3 Output

Basic CCD camera Advantages: Low noise; High full-well capacity; 100% fill factor; High uniformity; Mature technology; Disadvantages: Slow readout; Pixel blooming; Specialised fabrication; Low functionality; 17 Basic Mechanism of CMOS Image Sensors

CMOS Image Sensor Pixel (a) Amplifier (y) Photo Sensor (b) (Light-sensitive Region) Light Signal ON ON Charge ON Pixel-select Switch (e) Pixel Row (j) Column Signal Wire (f) (Micro Wire) Column-select Switch (g) Output Column Circuit (h) ON Row Signal Wire (i) (Micro Wire) Voltage Generated on Surface of Photo Sensor Like the Rising Water Level of a Bucket Fig. A When Charge is NOT Accumulated in Photo Sensor Fig. B When Charge is Accumulated in Photo Sensor Surface Voltage to Amplifier Surface Voltage to Amplifier Surface Voltage Light Surface Voltage 0 V 0 V Voltage Voltage Charg e High Photo Sensor High Photo Sensor

Basic CMOS camera Advantages: High Speed readout; Random access; On-chip intelligence; Low power consumption; Disadvantages: High read-out noise; Reduced dynamic range; Reduced uniformity; Reduced fill-factor; High cost; 22 Typical camera module for the Micron MT9M111 Fixed-focus. No optical zoom. 0.27 inches deep. 0.37 inch x 0.37 inch square Source: www.asia-optical.com.tw

Micron MT9M111* - 1.3 MPixel CMOS Imager 1280 x 1024 pixels. Pixel size: 3.6 μm x 3.6 μm Each pixel is R, G, or B. So, 2/3 of RGB image data is interpolated. 0.25 inches * Photo a close relative (MT9M011)

This is how photo cells work... hν A mainstay of 100-in-1 experimenter kits Surface open to light. Schematic symbol Semiconductor A photosensitive resistor. The semiconductor CdS is often used, as its band gap falls in blue-green, and thus blocks infrared w/o a filter. For ICs, photodiodes a better match hν Metal shield oxide oxide n+ Readout circuits go here hν p- region Metal shield p- Depletion region Optically-generated electrons near depletion region swept to the right. depl etion regio n Optically-generated holes near depletion region swept to the left. hν n+ region e l e c t r o n e n e r g y

Photodiode I-V curves... + I V - I = Io (e V/Vo - 1) - Iph Vo : 25-60 mv Io : 1-20 fa Dark current When no photons are present. Quadrant for photosensing. Quadrant for solar cells. Spectral response (0.35μm n-well CMOS) Data shown is for a standard 0.35µ CMOS logic process. Quantum efficiency can be improved by modifying the process. 42% of photons that fall on the photodiode are converted to electrons ( quantum efficiency ) Source: A 640 512 CMOS Image Sensor with Ultrawide Dynamic Range Floating-Point Pixel-Level ADC, David X. D. Yang, Abbas El Gamal, Boyd Fowler, and Hui Tian, JSSC, Dec 1999.

Readout Circuits A Simple Photodiode APS Cell Described by Noble in 1968 Three transistors per pixel High quantum efficiency (no overlying polysilicon) APS Design E. R. Fossum, CMOS image sensors: Electronic camera-on-a-chip, in IEEE IEDM Tech. Dig., 1995.

Pixel Circuits Passive Pixel Sensor. 3- and 4-T active pixel sensor. Three-Transistor Active Pixel Cell Step 1: Fill Cd, and sense column current. Reset Row Sel Vdd Vdd Vdd Qf Cd Vdd Cd I(Qf) Edge circuitry samples current I(Qf) for later use. Parasitic photodiode capacitance. Column Sense

Opening the electronic shutter... Step 2: Electronic shutter is open, photodiode empties Cd. Reset Row Sel Gnd Gnd Qd(t) Qf - Qd(t) Cd Cd Too much Qd(t), and we empty bucket before shutter closes. Not enough Qd(t), and we capture temporal noise. Limits dynamic range and signalto-noise. Column Sense Close shutter, read pixel value... Step 3: Sense how empty Cd has become. Reset Row Sel Gnd Vdd Qf - Qd(t) Cd Vdd Cd I(Qf - Qd(t)) Use I(Qf) from start of the cycle to reduce ktc (reset) noise. Column Sense Correlated double sampling Temporal noise affects Qf value.

Non-Idealities and Performance Measures Three important aspects of image sensor performance are: SNR (signal to noise ratio): higher than 40 db required DR (dynamic range): range of illumination that can be detected by the image sensor. Standard CMOS Image sensors have a DR of 40-60 db, While human eye exceeds 90 db. Spatial Resolution: determined by the Nyquist sampling theorem. Color Si photodiodes see gray scale...

Color filters deposited on pixel array RGB Bayer Why? Source: Eric Fossum, IEEE Micro, and Micron Data Sheets Human cone array, imaged through the eye. Source: Hofer et al, J. Neuroscience, 25(42):9669-9679

Recall: Photodiode design... Photons that reflect off metal shielding are lost. oxide Readout circuits go here Photodiode area Fill factor = Pixel area As process shrinks, readout circuits shrink and diode grows. So, fill factor increases and fewer photons lost. hν hν hν n+ p- oxide Compound eyes of an insect - microlenses Source: www.bioschool.co.uk, BBC

Source: http://micro.magnet.fsu.edu/ APS Analog ADC s 10/16/08 43

Source: Fraunhofer ISIT

Sensor Architecture SoC interface to the outside world Simple Power Hookup Serial port to control the camera. 8-bit Dout Port 54 MHz Clk 1280 x 1024 @ 15 fps 640 x 512 @ 30 fps YCrCb 4:2:2

Functional Block Diagram Sensor Array Details Black pixels have photodiodes covered by metal.

Spectral response... Note IR response. This is why camera module needs an IR filter.