ECN Engineering & Services Tools and Machinery List

ECN Engineering & Services Tools and Machinery List

Tools and machinery list Manufacturing Brand/description Type Dimensions work piece [mm] CNC Turning Boehringer DUS 560 ti-2000 ø 520 x 2000 Montforts KNC-5 ø 450 x 1500 Montforts RNC-3 ø 180 x 500 Schaublin 125 CCN ø 200 x 450 Hwachon Hi Eco10 ø 200 x 500 CNC Milling Mikron VCE 1600 4-axis 1625 x 812 x 762 Mikron UCP 710 5-axis 710 x 650 x 500 x 360º (-30º +120º) Mikron VCP 600 600 x 400 x 350 Fehlmann PicoMax 54 3-axis 500 x 260 x 490 Cincinnati Milacron 760 x 510 x 500 Wire Cut Electro Discharge Machining Charmiles Robofil 310 250 x 400 x 400 Sodick AQ 750 LH 750 x 600 x 600 Sodick AQ 300 L 300 x 200 x 200 Die-sinking Electro Discharge Machining Agie Agietron Innovation II 350 x 250 x 350 Grinding Studer S20-2 400 mm b.c.* and 100 mm c.h.** Studer S30 700 mm b.c. and 125 mm c.h. Jung JF520 MS NC 600 x 200 x 240 Jung JA600 CNC-E 600 x 250 x 240 Jung JP800 CNC A 800 x 500 x 500 max. 700 kg Moor jig grinder 450 CPR - CNC 458 x 280 x 350 mm Laser machining Baasel BLS610 (3x) YAG-marking/engraving laser 150 x 150, 200 x 200, 300 x 300 Lasag KLS 246-102 YAG-cutting laser 1064nm 600 x 400 x 300 (040+046) Lasag SLS 200C60 YAG-welding laser 1064nm, fiber 400 µm 600 x 400 x 300 Lasag SLS C16-046 YAG-welding laser 1064nm, fiber 100 µm 600 x 400 x 300 Rofin 20 E Diode pumped, 355nm 200x200 Quantronix Lamppumped and Q-switched 200x200 Geometrical control Mitutoyo Bright Strato 3D Measuring machine 1600 x 1000 x 600mm E=1,7+3L/1000 µm Talyrond 100 Roundness tester Mahr Perthometerconcept Contour meter Perthen PRK Pertometerconcept Rodenstock RM600-3D Roughness meter Optical roughness and contour meter * b.c. = between centers ** c.h. = center height

Brand/description Type Dimensions work piece [mm] Mitutoyo Laserscan micrometer ULM 01-600 C Universal length measuring machine 600mm Mitutoyo Measuring microscope QV202 ApexPro 3 200 x 200 x 150 Hewlett Packet Laser interferometer Pelt&Hooykaas Surface plate granite/00 2500 x 1250 Mahr Digimar DX1 Height gauge 600mm Zeiss Measuring microscope Heat treatments Vacuum or controlled atmosphere Hethrington oven Engineering Brand/description Type Application CoCreate One Space Modeler (7x) 3D CAD Database Management Model Manager PDM System ANSYS ANSYS Mechanical FEM AutoDesk Acad (5x) Vacuum: down to 10-5 bars Controlled atmosphere: Nitrogen, Hydrogen, Helium, Argon, Argon/ Hydrogen. Temperature: up to 1600 C (short time) Cold wall oven, suitable for hardening air hardening materials AutoDesk Acad P&ID (3x) MathSoft MathCad Modelling Norbert Schmitz SF Pressure Drop CODECALC PED Calculation ASME VIII MECID Eurofiler CE Process Systems Engineering Brand/description Type Application MathWorks Matlab, Simulink, Control System, Real Time Workshop, Simulink control, Stateflow, SF coder,xpc, xpc embedded, Matlab Optimization, Matlab PDE, Matlab Statistics System modelling general Aspen Tech Comsol In-house Aspen Plus, Aspen Dynamics, Aspen Custom Modeller, Aspen Icarus Multiphysics (voorheen Femlab), incl. Chemical Engineering Module, Control Script Cost-engineering models Materials Characterisation and Consultancy Brand/description Type Application Microscopy Field Emission Gun-Scanning Electron Microscope (FEG SEM) Simulation chemical engineering CFD, FEM, Reactor modelling JEOL 6330F Magnification up to x250.000 Lateral resolution (practical): 5nm High signal/noise ratio at 0.5keV, low electrical conductive materials can be analysed without pre-coating

Brand/description Type Application Element analyses by Energy Dispersive X-ray analyses Atomic Force Microscopy (AFM) Noran Vantage Nanoscope III Quantative Element analyses with an accuracy of ±0.5wt% starting at sodium (Na) Qualitative Element analyses down to Boor (B) Automated analyses and particle recognition Particles to be analysed can be down to 1µm 3 in size Full contact mode Horizontal and Lateral resolution down to 2nm Optical macroscope Wild M3Z Magnification up to X64 Optical microscope Leica MeF-4 Magnification up to X1500 Bright field Dark field Nomarski interference contrast Polarised light Image analyses and storage SIS Image storage Image analyses Coupled to optical macroscope and microscope Mechanical testing Tensile testing Comprision Instron 4501-series 9 Instron 4502-series 9 Instron 4505-series 9 Up to 100kN load Three and four point bending Room temperature (access to test load up to 2500kN) Rotating fatigue Wöhler machine Room temperature fatigue testing on standard test pieces. Testing of materials and coatings Hardness measurements Frank-Finotest 38542 Leica-Durimet Residual stress measurements Hole Drilling Macro-Vickers, up to 30kg load Brinell, 1mm ball up to 30kg Micro-Vickers, down to 0.05g Knoop hardness Brand/description Type Dimensions workpiece [mm] Preparation facilities Grinding Struers Knuth rotor 2 SiC grinding paper grit P150-P4000 Polishing Struers-Pedemax-2 6 samples at a time, maximum, different sizes possible Struers-PdM-Force 6 samples, standard size up to 25mm diameter Struers-Rotopol 3 + Rotoforce-4 6 samples, standard size up to 25mm diameter Embedding Struers embedding press 25mm samples Struers embedding press 12,5mm samples UV-hardening-Kulzer variable sample size Cold embedding masses Variable sample size, 24h curing at roomtemperature Cutting Struers Discotom-2 For cutting metallic, ceramic and plastic samples Struers Accutom 5 Precision cutting, µm precision

Brand/description Type Application Non-destructive analyses Non-destructive determination of E-module Determination of ferrite content Grindo Sonic Fischer Ferritescope-EN8D2-FE Fischer Ferritescope-MP3-GAB1.3 FED Homogeneous metalic and ceramic materials Room temperature Ferrite content up to 100% ferrite Can be modified for layer thickness measurements Materials Testing Brand/description Application Measurement ICP-AES (Spectro, Vista) Q Solid fuels, ash, sludge, biomass, water samples, eluates Al As B Ba Ca Cd Co Cr Cu Fe K Li Mg Mn Mo Na Ni P Pb S Sb Se Si Sn Sr Ti V Zn ICP-AES, (Spectro, Vista) Q Waste water Al As B Ba Ca Cd Co Cr Cu Fe K Li Mg Mn Mo Na Ni P Pb S Sb Se Si Sn Sr Ti V Zn ICP-AES, (Spectro, Vista) Q Catalysts, fuel cel components, solar cel On request products, nuclear products Hydride AFS Q Solid fuels, ash, sludge, biomass, water As Se Sb CV-AFS Q samples, eluates Hg Proximate Solid fossil fuels, solid biofuels, solid recovered Ash, moisture, volatile Caloric value Q fuels, sludges, biomass UHV LHV Biomass content by 14 C SRF, waste products, liquid fuels % Biogenic method Titrimetry Q Rainwater Alkalinity Membrane diffusion Rain water samples, eluates Ammonia Kjeldahl N Fotometry Q (Dr. Lange) Water samples, eluates, samples from COD Ionchromatography (Dionex, Metrohm) gasifiers Cl NO 3 SO 4 Br Q Flow Injection Analysis Element analyser (Interscience) Q Titrimetry (Metrohm) Fossil fuels, biofuels, solid recovered fuelsorganic compounds Fuel cell components, catalysts, nuclear products F, CN C H N O High precision element determination EOX analyser, coulometry Q Waste water Non-volatile halogen compounds Coulometry Q Solid fuels Halogen content (Cl Br I) TOC analyser (Shimadzu) Waste water Organic and inorganic carbon HPLC (DAD FLD) (Agilent) Air, soil, water 16 PAH EPA GC-FID (GC-MS) (Shimadzu, Interscience) Q Tar extracts 16 PAH EPA and 19 other common tar compounds Micro-GC NDIR spectroscopy Chemolumniscence Physical characterisation Partical size analyses Partical size analyses Autosizer + multipurpose tritator Pore size analyses Mercury method Syngas, biogas, emission, proces gas Malvern Instruments Mastersizer 2000 Malvern Instruments Nanosizer ZEN 3600 Micrometeritics-Autopore II Up to 150µm H 2 N 2 O 2 CO CO 2 CH 4 H 2 S COS CO CO 2 CH 4 N 2 O NOx Particle sizes 20nm to 2mm Static light scattering Q. = ISO 17025 approved

Brand/description Application Measurement Pore size analyses-gas Coulter Omnisorb Down to 0.3nm absorption Determination of specific surface area Dilatometry (thermal expension coefficient determination) Simultaneous Thermal Analyses (STA Differential Scanning Calorimetry (DSC) + Automatic Sample Changer BET-Sorbty 1750 Coulter Omnisorb Netzsch-DIL402 C/4/G Temperature: up to 1650 C Atmospheres: standard: air, helium, Ar/5%H 2, oxygen. Other atmospheres on request. Rate Controlled Sintering software Accuracy: 1.25nm over 25mm measuring length Netzsch STA 409 PC LUXX Netzsch DSC 204 F1 Phoenix Software & Electrical Engineering Brand/description Type Application Compilers Microsoft Visual Studio 2008,.NET C# DTA/TG (Differential Thermal Analyses/Thermographimetry) up to 1550 C Atmospheres: standard: air, helium, Ar/5%H 2, oxygen, former gasses DSC (Differential Scanning Calorimetry) Temp range: -180 C to 700 C Heating/Cooling rates: 0.001 to 100 K/min Microsoft Microsoft Borland Visual Studio 2008, C Windows CE V5.0, C++ Delphi GNU gcc 3.3.5 Libraries ComponentOne ComponentOne Studio ASP.NET Charts/graphs Microsoft WCF WPF Web development Apache Apache 2.0/54 PHP TYPO3 TYPO3 Content Management System 3.8.0 Databases Microsoft SQL-server MySQL AB MySQL PostgreSQL PostgreSQL Proces control development Exeda Wizcon SCADA Process control National Instruments 1) Labview 2) Compact Rio Data-acquisition & control Beckhoff TwinCat SoftPLC Process control Embedded system tools Echelon Nodebuilder C/Neuron C MicroChip PIC processors C Keil GMBH Intel 8051-series C Microsoft Embedded XP C, C#, ASP.NET

Brand/description Type Application Microsoft Platform Builder Windows CE Altera FPGA s VHDL/schematic design Modelling MathWorks Matlab, Simulink Aspen Embedded codex Embedded systems Documentation Adobe Adobe Photoshop + Premiere Acrobat GNU gimp 2.2.6 L A T E X 2å Power Quality Measurement Wideband Current Probes + Amplifier 3x Differential Probes Image manipulation Desktop publishing Harmonic analyser PM 300 Voltech Residual mains / grid utility Power monitor Nanovip Distribution stations & cabinets 400.750VAC @ 200.1000A. Power and Energy datalogger MFT 300 Distribution cabinets Up to 12 fields yielding 400.750VAC @ 100A. Memory oscilloscoop Tektronix TDS 3014 Tektronix 2221A Tektronix 2225 Instrumentation Calibration of field instruments Trending & signal monitoring Insulation testing Inspection & test of electric equipment acc. to NEN 3140 Tektronix AM503B Tektronix A6302 Tektronix A6303 Tektronix P5200 Burster signal conversion generator/ calibrator Digistant 4421 Knick Voltage source 14621 Knick Voltage reference 273591 Hydra datalogger 2620A Hewlett Packard 34970A Datalogger & Software PAD tester Nieaff Smitt DC Bushbars Power convertors Rectifiers Power transformers Grid coupled 3-phase measurements Transducers: flow, pressure, force, temperature, humidity, conductivity, volts, amps, power etc. Transducer outputs Electric tools: household & industrial according to NEN-EN 3140 Earth & circuit tester Combitester Gossen M5020 Grid utility & experimental applications Power performance tests Power source/sinking Digatron EVT 350-300 DUT 0-300V @ 350A bidirectional Power source/sinking Digatron EVT 410-540 DUT 10-540V @ 400A bidirectional Power supply Delta SMD 30-100 DUT 0-30V @ 100A unidirectional Power supply Delta SMD 30-10 DUT 0-30V @ 10A unidirectional Power supply Delta SMD 70-20 DUT 0-70V @ 20A unidirectional Power supply Delta SMD 120-4x25 (1)master @ (3)slaves DUT 0-120V @ 100A unidirectional Power supply Delta E300-0.1-L DUT 0-300V @ 0,1A unidirectional Computer & Communication Testing CPU and periferie testing Logic analyser Computer equipment

Brand/description Type Application Testing physical link layer Data analyser Communications, protocol Serial data Hardware Sweep generator Hewlett Packard 2849-G07566 Laboratory test: EUT & DUT Scope Hewlett Packard 54645D Idem Tektronix TDS3032 Digital Multimeter Fluke 87 III, Keithley 0626177, 2000, 2700, Idem 7700 Frequency counter Hewlett Packard 3416A, 53131A (1Ghz) Arbritary Waveform Generator Hewlett Packard 33120A Calibrator Burster Digistant 4420 Currentprobe Data Aquisition/Switch Electronic load Chauvin Arnoug E3n Tektronix A6302, A6303 Agilent/HP 34970A Hocherl & Hackl PL306, PL306A Climate Chamber Clive Hurley CH 500.40 Espec PL3-KPH Espec TSD-100 LISN Netsimulator Binder MK720 Thurlby Thandar 1phase 16 amp Schwarzbeck, NSLK 8128 Spitzenberger & Spies 1 phase 5000W Power analyzer Norma D6000 Norma D6100 Yokogawa PZ4000 Yokogawa WT110 Voltech PM300 Power supply Delta SM 300-10D, SM 120-25 D, SM 15-200 D, SM 7020-D, 1200 S 48 Agilent/HP 6642A, E4350A, E4350B, Kepco BOP 36-6M, BOP 100-4M -40 C to 180 C, 20% - 98% RH, 1687 ltr -40 C to 150 C, 20% - 98% RH, 408 ltr -65 C to 0 C and 60 C to 200 C, no RH, 100 ltr, 30 kg -40 C to 180 C, no RH, 700 ltr EMC Line impedance Three phase, Harm analysis Three phase Three phase, Harm analysis Single phase Three phase Current, SAS and bipolair EMC Teseq NSG 3040 EMC Test system Teseq NSG 437 ESD Simulator EMTEST VCS500 Surge generator Advantest R3261A Spectrum analyser 9kHz to 2.6GHz Advantest TR 17207 Search coil FCC F-33-2 RF current probe 1kHZ to 250 MHz Schaffner CDN 8014 Capacitive Coupling Clamp Energieonderzoek Centrum Nederland Engineering & Services Postbus 1, 1755 ZG Petten Tel.: 0224-564661 Fax: 0224-568407 www.ecn.nl/es www.ecn.nl/serviceloket es@ecn.nl b-06-032