Environmental Protection Agency Pt. 60, App. B, Spec. 1

Transcription

1 Evirometal Protectio Agecy Pt. 60, App. B, Spec. APPENDIX B TO PART 60 PERFORMANCE SPECIFICATIONS Performace Specificatio Specificatios ad test procedures for cotiuous opacity moitorig systems i statioary sources Performace Specificatio 2 Specificatios ad Test Procedures for SO 2 ad NO X Cotiuous Emissio Moitorig Systems i Statioary Sources Performace Specificatio 3 Specificatios ad Test Procedures for O 2 ad CO 2 Cotiuous Emissio Moitorig Systems i Statioary Sources Performace Specificatio 4 Specificatios ad Test Procedures for Carbo Mooxide Cotiuous Emissio Moitorig Systems i Statioary Sources Performace Specificatio 4A Specificatios ad Test Procedures for Carbo Mooxide Cotiuous Emissio Moitorig Systems i Statioary Sources Performace Specificatio 4B Specificatios ad Test Procedures for Carbo Mooxide ad Oxyge Cotiuous Moitorig Systems i Statioary Sources Performace Specificatio 5 Specificatios ad Test Procedures for TRS Cotiuous Emissio Moitorig Systems i Statioary Sources Performace Specificatio 6 Specificatios ad Test Procedures for Cotiuous Emissio Rate Moitorig Systems i Statioary Sources Performace Specificatio 7 Specificatios ad Test Procedures for Hydroge Sulfide Cotiuous Emissio Moitorig Systems i Statioary Sources Performace Specificatio 8 Performace Specificatios for Volatile Orgaic Compoud Cotiuous Emissio Moitorig Systems i Statioary Sources Performace Specificatio 8A Specificatios ad Test Procedures for Total Hydrocarbo Cotiuous Moitorig Systems i Statioary Sources Performace Specificatio 9 Specificatios ad Test Procedures for Gas Chromatographic Cotiuous Emissio Moitorig Systems i Statioary Sources Performace Specificatio 2A Specificatios ad Text Procedures for Total Vapor Phase Mercury Cotiuous Emissio Moitorig Systems i Statioary Sources Performace Specificatio 5 Performace Specificatio for Extractive FTIR Cotiuous Emissios Moitor Systems i Statioary Sources PERFORMANCE SPECIFICATION SPECIFICA- TIONS AND TEST PROCEDURES FOR CONTIN- UOUS OPACITY MONITORING SYSTEMS IN STA- TIONARY SOURCES.0 What Is the Purpose ad Applicability of Performace Specificatio? Performace Specificatio (PS ) provides () requiremets for the desig, performace, ad istallatio of a cotiuous opacity moitorig system (COMS) ad (2) data computatio procedures for evaluatig the acceptability of a COMS. It specifies activities for two groups () the ower or operator ad (2) the opacity moitor maufacturer.. Measuremet Parameter. PS covers the istrumetal measuremet of opacity caused by atteuatio of projected light due to absorptio ad scatter of the light by particulate matter i the effluet gas stream..2 What COMS must comply with PS? If you are a ower or operator of a facility with a COMS as a result of this Part, the PS applies to your COMS if oe of the followig is true: () Your facility has a ew COMS istalled after February 6, 200; or (2) Your COMS is replaced, relocated, or substatially refurbished (i the opiio of the regulatory authority) after February 6, 200; or (3) Your COMS was istalled before February 6, 200 ad is specifically required by regulatory actio other tha the promulgatio of PS to be recertified. If you are a opacity moitor maufacturer, the paragraph 8.2 applies to you..3 Does PS apply to a facility with a applicable opacity limit less tha 0 percet? If you are a ower or operator of a facility with a COMS as a result of this Part ad the applicable opacity limit is less tha 0 percet, the PS applies to your COMS as described i sectio.2; takig ito accout (through statistical procedures or otherwise) the ucertaities associated with opacity measuremets, ad followig the coditios for atteuators selectio for low opacity applicatios as outlied i Sectio 8.(3)(ii). At your optio, you, the source ower or operator, may select to establish a reduced full scale rage of o less tha 50 percet opacity istead of the 80 percet as prescribed i sectio 3.5, if the applicable opacity limit for your facility is less tha 0 percet. The EPA recogizes that reducig the rage of the aalyzer to 50 percet does ot ecessarily result i ay measurable improvemet i measuremet accuracy at opacity levels less tha 0 percet; however, it may allow improved chart recorder iterpretatio..4 What data ucertaity issues apply to COMS data? The measuremet ucertaities 627 VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm Fmt 800 Sfmt 8002 Y:\SGML\20847.XXX 20847

2 Pt. 60, App. B, Spec. associated with COMS data result from several desig ad performace factors icludig limitatios o the availability of calibratio atteuators for opacities less tha about 6 percet (3 percet for sigle-pass istrumets), calibratio error toleraces, zero ad upscale drift toleraces, ad allowace for dust compesatio that are sigificat relative to low opacity levels. The full scale requiremets of this PS may also cotribute to measuremet ucertaity for opacity measuremets where the applicable limits are below 0 percet opacity. 2.0 What Are the Basic Requiremets of PS? PS requires () opacity moitor maufacturers comply with a comprehesive series of desig ad performace specificatios ad test procedures to certify opacity moitorig equipmet before shipmet to the ed user, (2) the ower or operator to follow istallatio guidelies, ad (3) the ower or operator to coduct a set of field performace tests that cofirm the acceptability of the COMS after it is istalled. 2. ASTM D is the referece for desig specificatios, maufacturer s performace specificatios, ad test procedures. The opacity moitor maufacturer must periodically select ad test a opacity moitor, that is represetative of a group of moitors produced durig a specified period or lot, for coformace with the desig specificatios i ASTM D The opacity moitor maufacturer must test each opacity moitor for coformace with the maufacturer s performace specificatios i ASTM D Sectio 8.(2) provides guidace for locatig a opacity moitor i vertical ad horizotal ducts. You are ecouraged to seek approval for the opacity moitor locatio from the appropriate regulatory authority prior to istallatio. 2.3 After the COMS is istalled ad calibrated, the ower or operator must test the COMS for coformace with the field performace specificatios i PS. 3.0 What Special Defiitios Apply to PS? 3. All defiitios ad discussios from sectio 3 of ASTM D are applicable to PS. 3.2 Cetroid Area. A cocetric area that is geometrically similar to the stack or duct cross-sectio ad is o greater tha percet of the stack or duct cross-sectioal area. 3.3 Data Recorder. That portio of the istalled COMS that provides a permaet record of the opacity moitor output i terms of opacity. The data recorder may iclude automatic data reductio capabilities. 3.4 Exteral Audit Device. The iheret desig, equipmet, or accommodatio of the opacity moitor allowig the idepedet 40 CFR Ch. I (7 06 Editio) assessmet of the COMS s calibratio ad operatio. 3.5 Full Scale. The maximum data display output of the COMS. For purposes of recordkeepig ad reportig, full scale will be greater tha 80 percet opacity. 3.6 Operatioal Test Period. A period of time (68 hours) durig which the COMS is expected to operate withi the established performace specificatios without ay uscheduled maiteace, repair, or adjustmet. 3.7 Primary Atteuators. Those devices (glass or grid filter that reduce the trasmissio of light) calibrated accordig to procedures i sectio Secodary Atteuators. Those devices (glass or grid filter that reduce the trasmissio of light) calibrated agaist primary atteuators accordig to procedures i sectio System Respose Time. The amout of time the COMS takes to display 95 percet of a step chage i opacity o the COMS data recorder. 4.0 Iterfereces. Water Droplets 5.0 What Do I Need To Kow To Esure the Safety of Persos Usig PS? The procedures required uder PS may ivolve hazardous materials, operatios, ad equipmet. PS does ot purport to address all of the safety problems associated with these procedures. Before performig these procedures, you must establish appropriate safety ad health practices, ad you must determie the applicable regulatory limitatios. You should cosult the COMS user s maual for specific precautios to take. 6.0 What Equipmet ad Supplies Do I Need? 6. Cotiuous Opacity Moitorig System. You, as ower or operator, are resposible for purchasig a opacity moitor that meets the specificatios of ASTM D , icludig a suitable data recorder or automated data acquisitio hadlig system. Example data recorders iclude a aalog strip chart recorder or more appropriately a electroic data acquisitio ad reportig system with a iput sigal rage compatible with the aalyzer output. 6.2 Calibratio Atteuators. You, as ower or operator, are resposible for purchasig a miimum of three calibratio atteuators that meet the requiremets of PS. Calibratio atteuators are optical filters with eutral spectral characteristics. Calibratio atteuators must meet the requiremets i sectio 7 ad must be of sufficiet size to atteuate the etire light beam received by the detector of the COMS. For trasmissometers operatig over a arrow badwidth (e.g., laser), a calibratio atteuator s value is determied for the actual operatig wavelegths of the trasmissometer. 628 VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm Fmt 800 Sfmt 8002 Y:\SGML\20847.XXX 20847

3 Evirometal Protectio Agecy Pt. 60, App. B, Spec. Some filters may ot be uiform across the face. If errors result i the daily calibratio drift or calibratio error test, you may wat to examie the across-face uiformity of the filter. 6.3 Calibratio Spectrophotometer. Whoever calibrates the atteuators must have a spectrophotometer that meets the followig miimum desig specificatios: Parameter Specificatio Wavelegth rage m. Detector agle of view <0. Accuracy... <0.5% trasmittace, NIST traceable calibratio. 7.0 What Reagets ad Stadards Do I Need? You will eed to use atteuators (i.e., eutral desity filters) to check the daily calibratio drift ad calibratio error of a COMS. Atteuators are desigated as either primary or secodary based o how they are calibrated. 7. Atteuators are desigated primary i oe of two ways: () They are calibrated by NIST; or (2) They are calibrated o a 6-moth frequecy through the assigmet of a lumious trasmittace value i the followig maer: (i) Use a spectrophotometer meetig the specificatios of sectio 6.3 to calibrate the required filters. Verify the spectrophotometer calibratio through use of a NIST 930D Stadard Referece Material (SRM). A SRM 930D cosists of three eutral desity glass filters ad a blak, each mouted i a cuvette. The wavelegths ad temperature to be used i the calibratio are listed o the NIST certificate that accompaies the reported values. Determie ad record a trasmittace of the SRM values at the NIST wavelegths (three filters at five wavelegths each for a total of 5 determiatios). Calculate a percet differece betwee the NIST certified values ad the spectrophotometer respose. At least 2 of the 5 differeces (i percet) must be withi ±0.5 percet of the NIST SRM values. No differece ca be greater tha ±.0 percet. Recalibrate the SRM or service the spectrophotometer if the calibratio results fail the criteria. (ii) Sca the filter to be tested ad the NIST blak from wavelegth 380 to 780 m, ad record the spectrophotometer percet trasmittace resposes at 0 m itervals. Test i this sequece: blak filter, tested filter, tested filter rotated 90 degrees i the plae of the filter, blak filter. Calculate the average trasmittace at each 0 m iterval. If ay pair of the tested filter trasmittace values (for the same filter ad wavelegth) differ by more tha ±0.25 percet, resca the tested filter. If the filter fails to achieve this tolerace, do ot use the filter i the calibratio tests of the COMS. (iii) Correct the tested filter trasmittace values by dividig the average tested filter trasmittace by the average blak filter trasmittace at each 0 m iterval. (iv) Calculate the weighted (to the respose of the huma eye), tested filter trasmittace by multiplyig the trasmittace value by the correspodig respose factor show i table, to obtai the Source C Huma Eye Respose. (v) Recalibrate the primary atteuators semi-aually if they are used for the required calibratio error test. Recalibrate the primary atteuators aually if they are used oly for calibratio of secodary atteuators. 7.2 Atteuators are desigated secodary if the filter calibratio is doe usig a laboratory-based trasmissometer. Coduct the secodary atteuator calibratio usig a laboratory-based trasmissometer calibrated as follows: (i) Use at least three primary filters of omial lumious trasmittace 50, 70 ad 90 percet, calibrated as specified i sectio 7.(2)(i), to calibrate the laboratory-based trasmissometer. Determie ad record the slope of the calibratio lie usig liear regressio through zero opacity. The slope of the calibratio lie must be betwee 0.99 ad.0, ad the laboratory-based trasmissometer readig for each primary filter must ot deviate by more tha ±2 percet from the liear regressio lie. If the calibratio of the laboratory-based trasmissometer yields a slope or idividual readigs outside the specified rages, secodary filter calibratios caot be performed. Determie the source of the variatios (either trasmissometer performace or chages i the primary filters) ad repeat the trasmissometer calibratio before proceedig with the atteuator calibratio. (ii) Immediately followig the laboratorybased trasmissometer calibratio, isert the secodary atteuators ad determie ad record the percet effective opacity value per secodary atteuator from the calibratio curve (liear regressio lie). (iii) Recalibrate the secodary atteuators semi-aually if they are used for the required calibratio error test. 8.0 What Performace Procedures Are Required To Comply With PS? Procedures to verify the performace of the COMS are divided ito those completed by the ower or operator ad those completed by the opacity moitor maufacturer. 8. What procedures must I follow as the Ower or Operator? () You must purchase a opacity moitor that complies with ASTM D ad obtai a certificate of coformace from the opacity moitor maufacturer. 629 VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm Fmt 800 Sfmt 8002 Y:\SGML\20847.XXX 20847

4 Pt. 60, App. B, Spec. (2) You must istall the opacity moitor at a locatio where the opacity measuremets are represetative of the total emissios from the affected facility. You must meet this requiremet by choosig a measuremet locatio ad a light beam path as follows: (i) Measuremet Locatio. Select a measuremet locatio that is () at least 4 duct diameters dowstream from all particulate cotrol equipmet or flow disturbace, (2) at 40 CFR Ch. I (7 06 Editio) least 2 duct diameters upstream of a flow disturbace, (3) where codesed water vapor is ot preset, ad (4) accessible i order to permit maiteace. (ii) Light Beam Path. Select a light beam path that passes through the cetroidal area of the stack or duct. Also, you must follow these additioal requiremets or modificatios for these measuremet locatios: If your measuremet locatio is i a:. Straight vertical sectio of stack or duct. 2. Straight vertical sectio of stack or duct. 3. Straight vertical sectio of stack or duct. 4. Horizotal sectio of stack or duct. 5. Horizotal sectio of duct. Ad is: Less tha 4 equivalet diameters dowstream from a bed. Less tha 4 equivalet diameters upstream from a bed. Less tha 4 equivalet diameters dowstream ad is also less tha diameter upstream from a bed. At least 4 equivalet diameters dowstream from a vertical bed. Less tha 4 equivalet diameters dowstream from a vertical bed. The use a light beam path that is: I the plae defied by the upstream bed (see figure ). I the plae defied by the dowstream bed (see figure 2). I the plae defied by the upstream bed (see figure 3). I the horizotal plae that is betwee 3 ad 2 the distace up the vertical axis from the bottom of the duct (see figure 4). I the horizotal plae that is betwee 2 ad 2 3 the distace up the vertical axis from the bottom of the duct for upward flow i the vertical sectio, ad is betwee 3 ad 2 the distace up the vertical axis from the bottom of the duct for dowward flow (figure 5). (iii) Alterative Locatios ad Light Beam Paths. You may select locatios ad light beam paths, other tha those cited above, if you demostrate, to the satisfactio of the Admiistrator or delegated aget, that the average opacity measured at the alterative locatio or path is equivalet to the opacity as measured at a locatio meetig the criteria of sectios 8.(2)(i) ad 8.(2)(ii). The opacity at the alterative locatio is cosidered equivalet if () the average opacity value measured at the alterative locatio is withi ±0 percet of the average opacity value measured at the locatio meetig the istallatio criteria, ad (2) the differece betwee ay two average opacity values is less tha 2 percet opacity (absolute). You use the followig procedure to coduct this demostratio: simultaeously measure the opacities at the two locatios or paths for a miimum period of time (e.g., 80-miutes) coverig the rage of ormal operatig coditios ad compare the results. The opacities of the two locatios or paths may be measured at differet times, but must represet the same process operatig coditios. You may use alterative procedures for determiig acceptable locatios if those procedures are approved by the Admiistrator. (3) Field Audit Performace Tests. After you istall the COMS, you must perform the followig procedures ad tests o the COMS. (i) Optical Aligmet Assessmet. Verify ad record that all aligmet idicator devices show proper aligmet. A clear idicatio of aligmet is oe that is objectively apparet relative to referece marks or coditios. (ii) Calibratio Error Check. Coduct a three-poit calibratio error test usig three calibratio atteuators that produce outlet pathlegth corrected, sigle-pass opacity values show i ASTM D , sectio 7.5. If your applicable limit is less tha 0 percet opacity, use atteuators as described i ASTM D , sectio 7.5 for applicable stadards of 0 to 9 percet opacity. Cofirm the exteral audit device produces the proper zero value o the COMS data recorder. Separately, isert each calibratio atteuators (low, mid, ad high-level) ito the exteral audit device. While isertig each atteuator, () esure that the etire light beam passes through the atteuator, (2) miimize iterferece from reflected light, ad (3) leave the atteuator i place for at least two times the shortest recordig iterval o the COMS data recorder. Make a total of five ocosecutive readigs for each atteuator. At the ed of the test, correlate each atteuator isertio to the correspodig value from the data recorder. Subtract the sigle-pass calibratio atteuator values corrected to the stack exit coditios from the COMS resposes. Calculate the arithmetic mea differece, stadard deviatio, ad cofidece coefficiet of the five measuremets value usig equatios 3, 4, ad 5. Calculate the calibratio error as the sum of the absolute value of the mea 630 VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm Fmt 800 Sfmt 8002 Y:\SGML\20847.XXX 20847

5 Evirometal Protectio Agecy Pt. 60, App. B, Spec. differece ad the 95 percet cofidece coefficiet for each of the three test atteuators usig equatio 6. Report the calibratio error test results for each of the three atteuators. (iii) System Respose Time Check. Usig a high-level calibratio atteuator, alterately isert the filter five times ad remove it from the exteral audit device. For each filter isertio ad removal, measure the amout of time required for the COMS to display 95 percet of the step chage i opacity o the COMS data recorder. For the upscale respose time, measure the time from isertio to display of 95 percet of the fial, steady upscale readig. For the dowscale respose time, measure the time from removal to display 5 percet of the iitial upscale readig. Calculate the mea of the five upscale respose time measuremets ad the mea of the five dowscale respose time measuremets. Report both the upscale ad dowscale respose times. (iv) Averagig Period Calculatio ad Recordig Check. After the calibratio error check, coduct a check of the averagig period calculatio (e.g., 6-miute itegrated average). Cosecutively isert each of the calibratio error check atteuators (low, mid, ad high-level) ito the exteral audit device for a period of two times the averagig period plus miute (e.g., 3 miutes for a 6-miute averagig period). Compare the path legth corrected opacity value of each atteuator to the valid average value calculated by the COMS data recordig device for that atteuator. (4) Operatioal Test Period. Before coductig the operatioal testig, you must have successfully completed the field audit tests described i sectios 8.(3)(i) through 8.(3)(iv). The, you operate the COMS for a iitial 68-hour test period while the source is operatig uder ormal operatig coditios. If ormal operatios cotai routie source shutdows, iclude the source s dow periods i the 68-hour operatioal test period. However, you must esure that the followig miimum source operatig time is icluded i the operatioal test period: () For a batch operatio, the operatioal test period must iclude at least oe full cycle of batch operatio durig the 68-hour period uless the batch operatio is loger tha 68 hours or (2) for cotiuous operatig processes, the uit must be operatig for at least 50 percet of the 68-hour period. Except durig times of istrumet zero ad upscale calibratio drift checks, you must aalyze the effluet gas for opacity ad produce a permaet record of the COMS output. Durig this period, you may ot perform uscheduled maiteace, repair, or adjustmet to the COMS. Automatic zero ad calibratio adjustmets (i.e., itrisic adjustmets), made by the COMS without operator itervetio or iitiatio, are allowable at ay time. At the ed of the operatioal test period, verify ad record that the COMS optical aligmet is still correct. If the test period is iterrupted because of COMS failure, record the time whe the failure occurred. After the failure is corrected, you restart the 68-hour period ad tests from the begiig (0-hour). Durig the operatioal test period, perform the followig test procedures: (i) Zero Calibratio Drift Test. At the outset of the 68-hour operatioal test period ad at each 24-hour iterval, the automatic calibratio check system must iitiate the simulated zero device to allow the zero drift to be determied. Record the COMS respose to the simulated zero device. After each 24- hour period, subtract the COMS zero readig from the omial value of the simulated zero device to calculate the 24-hour zero drift (ZD). At the ed of the 68-hour period, calculate the arithmetic mea, stadard deviatio, ad cofidece coefficiet of the 24- hour ZDs usig equatios 3, 4, ad 5. Calculate the sum of the absolute value of the mea ad the absolute value of the cofidece coefficiet usig equatio 6, ad report this value as the 24-hour ZD error. (ii) Upscale Calibratio Drift Test. At each 24-hour iterval after the simulated zero device value has bee checked, check ad record the COMS respose to the upscale calibratio device. After each 24-hour period, subtract the COMS upscale readig from the omial value of the upscale calibratio device to calculate the 24-hour calibratio drift (CD). At the ed of the 68-hour period, calculate the arithmetic mea, stadard deviatio, ad cofidece coefficiet of the 24- hour CD usig equatios 3, 4, ad 5. Calculate the sum of the absolute value of the mea ad the absolute value of the cofidece coefficiet usig equatio 6, ad report this value as the 24-hour CD error. (5) Retestig. If the COMS fails to meet the specificatios for the tests coducted uder the operatioal test period, make the ecessary correctios ad restart the operatioal test period. Depedig o the opiio of the eforcig agecy, you may have to repeat some or all of the field audit tests. 8.2 What are the resposibilities of the Opacity Moitor Maufacturer? You, the maufacturer, must carry out the followig activities: () Coduct the verificatio procedures for desig specificatios i sectio 6 of ASTM D (2) Coduct the verificatio procedures for performace specificatios i sectio 7 of ASTM D (3) Provide to the ower or operator, a report of the opacity moitor s coformace to the desig ad performace specificatios required i sectios 6 ad 7 of ASTM D i accordace with the reportig requiremets of sectio 9 i ASTM D VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm 0064 Fmt 800 Sfmt 8002 Y:\SGML\20847.XXX 20847

6 Pt. 60, App. B, Spec. 40 CFR Ch. I (7 06 Editio) 9.0 What quality cotrol measures are required by PS? Opacity moitor maufacturers must iitiate a quality program followig the requiremets of ASTM D , sectio 8. The quality program must iclude () a quality system ad (2) a corrective actio program. 0.0 Calibratio ad Stadardizatio [Reserved].0 Aalytical Procedure [Reserved] 2.0 What Calculatios Are Needed for PS? 2. Desired Atteuator Values. Calculate the desired atteuator value corrected to the emissio outlet pathlegth as follows: OP L2 L 2 = ( OP) Eq. - OP =Nomial opacity value of required low-, mid-, or high-rage calibratio atteuators. i= x = Arithmetic mea = Number of data poits x i 2.4 Stadard Deviatio. Calculate the stadard deviatio as follows: S d = x i i= x 2 i i= 632 OP 2=Desired atteuator opacity value from ASTM D , sectio 7.5 at the opacity limit required by the applicable subpart. L =Moitorig pathlegth. L 2=Emissio outlet pathlegth. 2.2 Lumious Trasmittace Value of a Filter. Calculate the lumious trasmittace of a filter as follows: LT i= 800m Ti i m = = , 000 Eq. -2 LT=Lumious trasmittace T i=weighted tested filter trasmittace. 2.3 Arithmetic Mea. Calculate the arithmetic mea of a data set as follows: x = i= = Algebraic sum of the idividual measuremets, 2 x i. Eq. -4 S d=stadard deviatio of a data set. 2.5 Cofidece Coefficiet. Calculate the 2.5 percet error cofidece coefficiet (oetailed) as follows: CC t S d = Eq. -5 CC=Cofidece coefficiet t 0.975=t value (see table 2). x i Eq Calibratio Error. Calculate the error (calibratio error, zero drift error, ad calibratio drift error) as follows: Er = x + CC Eq. -6 Er=Error. 2.7 Coversio of Opacity Values for Moitor Pathlegth to Emissio Outlet Pathlegth. Whe the moitor pathlegth is differet from the emissio outlet pathlegth, use either of the followig equatios to covert from oe basis to the other (this coversio may be automatically calculated by the moitorig system): L 2 log ( Op2 )= log ( Op) Eq. -7 L OD 2 L 2 = OD Eq. -8 L VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm Fmt 800 Sfmt 8003 Y:\SGML\20847.XXX ER0AU00.008</MATH> ER0AU00.009</MATH> ER0AU00.00</MATH> ER0AU00.0</MATH> ER0AU00.02</MATH> ER0AU00.03</MATH> ER0AU00.04</MATH> ER0AU00.05</MATH> ER0AU00.06</MATH>

7 Evirometal Protectio Agecy Pt. 60, App. B, Spec. Op =Opacity of the effluet based upo L. Op 2=Opacity of the effluet based upo L 2. L =Moitor pathlegth. L 2=Emissio outlet pathlegth. OD =Optical desity of the effluet based upo L. OD 2=Optical desity of the effluet based upo L Mea Respose Wavelegth. Calculate the mea of the effective spectral respose curve from the idividual resposes at the specified wavelegth values as follows: L i = = Lg i g i Eq. -9 i i= L=mea of the effective spectral respose curve L i=the specified wavelegth at which the respose g i is calculated at 20 m itervals. g i=the idividual respose value at L i. 3.0 What Specificatios Does a COMS Have To Meet for Certificatio? A COMS must meet the followig desig, maufacturer s performace, ad field audit performace specificatios: 3. Desig Specificatios. The opacity moitorig equipmet must comply with the desig specificatios of ASTM D Maufacturer s Performace Specificatios. The opacity moitor must comply with the maufacturer s performace specificatios of ASTM D Field Audit Performace Specificatios. The istalled COMS must comply with the followig performace specificatios: () Optical Aligmet. Objectively idicate proper aligmet relative to referece marks (e.g., bull s-eye) or coditios. (2) Calibratio Error. The calibratio error must be 3 percet opacity for each of the three calibratio atteuators. (3) System Respose Time. The COMS upscale ad dowscale respose times must be 0 secods as measured at the COMS data recorder. (4) Averagig Period Calculatio ad Recordig. The COMS data recorder must average ad record each calibratio atteuator value to withi ±2 percet opacity of the certified value of the atteuator. (5) Operatioal Test Period. The COMS must be able to measure ad record opacity ad to perform daily calibratio drift assessmets for 68 hours without uscheduled maiteace, repair, or adjustmet. (6) Zero ad Upscale Calibratio Drift Error. The COMS zero ad upscale calibratio drift error must ot exceed 2 percet opacity over a 24 hour period. 4.0 Pollutio Prevetio [Reserved] 5.0 Waste Maagemet [Reserved] 6.0 Which refereces are relevat to this method?. Experimetal Statistics. Departmet of Commerce. Natioal Bureau of Stadards Hadbook 9. Paragraph p. 2. Performace Specificatios for Statioary Source Moitorig Systems for Gases ad Visible Emissios, EPA 650/ , Jauary 974, U. S. Evirometal Protectio Agecy, Research Triagle Park, NC. 3. Kootz, E.C., Walto, J. Quality Assurace Programs for Visible Emissio Evaluatios. Teessee Divisio of Air Pollutio Cotrol. Nashville, TN. 78th Meetig of the Air Pollutio Cotrol Associatio. Detroit, MI. Jue 6 2, Evaluatio of Opacity CEMS Reliability ad Quality Assurace Procedures. Volume. U. S. Evirometal Protectio Agecy. Research Triagle Park, NC. EPA 340/ a. 5. Nimeroff, I. Colorimetry Precisio Measuremet ad Calibratio. NBS Special Publicatio 300. Volume 9. Jue Techical Assistace Documet: Performace Audit Procedures for Opacity Moitors. U. S. Evirometal Protectio Agecy. Research Triagle Park, NC. EPA 600/ April Techical Assistace Documet: Performace Audit Procedures for Opacity Moitors. U. S. Evirometal Protectio Agecy. Research Triagle Park, NC. EPA 450/ April ASTM D : Stadard Practice for Opacity Moitor Maufacturers to Certify Coformace with Desig ad Performace Specificatios. America Society for Testig ad Materials (ASTM). April What tables ad diagrams are relevat to this method? 7. Referece Tables. TABLE SOURCE C, HUMAN EYE RESPONSE FACTOR Wavelegth aometers Weightig factor a Wavelegth aometers Weightig factor a VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm Fmt 800 Sfmt 8002 Y:\SGML\20847.XXX ER0AU00.07</MATH>

8 Pt. 60, App. B, Spec. 40 CFR Ch. I (7 06 Editio) TABLE SOURCE C, HUMAN EYE RESPONSE FACTOR Cotiued Wavelegth aometers Weightig factor a Wavelegth aometers Weightig factor a Total of weightig factors=00,000. TABLE 2 T VALUES a t a t a t a The values i this table are already corrected for - degrees of freedom. Use equal to the umber of idividual values. 7.2 Diagrams. 634 VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm Fmt 800 Sfmt 8002 Y:\SGML\20847.XXX 20847

9 Evirometal Protectio Agecy Pt. 60, App. B, Spec. 635 VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm Fmt 800 Sfmt 8006 Y:\SGML\20847.XXX ER0AU00.08</GPH>

10 Pt. 60, App. B, Spec. 40 CFR Ch. I (7 06 Editio) 636 VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm Fmt 800 Sfmt 8006 Y:\SGML\20847.XXX ER0AU00.09</GPH>

11 Evirometal Protectio Agecy Pt. 60, App. B, Spec. 637 VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm Fmt 800 Sfmt 8006 Y:\SGML\20847.XXX ER0AU00.020</GPH>

12 Pt. 60, App. B, Spec. 40 CFR Ch. I (7 06 Editio) 638 VerDate Aug<3> :25 Aug 02, 2006 Jkt PO Frm Fmt 800 Sfmt 8006 Y:\SGML\20847.XXX ER0AU00.02</GPH>