Advanced Program
SUNDAY, 27 th MARCH 09:30-10:00: 10:00-13:00: Tutorial 1: Presenter: 13:00-14:30: 14:30-17:30: Tutorial 2: Presenters: Registration Educational Program Design for Yield & Reliability Yervant Zorian, Synopsys, USA Lunch break Educational Program The Art and Science of Delay Testing: Theory and Practice Suriyaprakash Natarajan, Strategic CAD Laboratories at Intel Corporation, USA Arani Sinha, Advanced Micro Devices, USA MONDAY, 28 th MARCH 08:00-09:00: 09:00-09:20: 09:20-10:00: 10:00-10:20: 10:20-12:15: Organizer: Invited Talk: Registration Opening Session Keynote Address Coffee-break Special Session 1: Low-Power and Thermal-Aware Design and Test Enrico MACII, Politecnico di Torino, Italy Letícia Maria BOLZANI POEHLS, PUCRS, Brazil 3D Thermal-Aware Floorplanner for Many-Core Single-Chip Systems David CUESTA*, Jose RISCO-MARTIN*, Jose AYALA*(Speaker), David ATIENZA** * Universidad Complutense de Madrid, Spain ** EPFL, Switzerland
MONDAY, 28 th MARCH Low-Power and Thermal-Aware Design and Test: Behavioral-Level Thermal- and Aging-Estimation Flow Sven ROSINGER*, Malte METZDORF*, Domenik HELMS*, Wolfgang H. NEBEL** * OFFIS - Institute for Information Technology Oldenburg, Germany ** University of Oldenburg Oldenburg, Germany A New Built-In Current Sensor Scheme to Detect Dynamic Faults in Nano-Scale SRAMs Felipe LAVRATTI*, Andrea CALIMERA**, Letícia Maria BOLZANI POEHLS*, Fabian VARGAS*, Enrico MACII** * PUCRS, Brazil ** Politecnico di Torino András TIMAR, Marta RENCZ Budapest University of Technology and Economics NBTI-Aware Data Allocation Strategies for Scrathpad Based Embedded Systems Cesare FERRI*, Dimitra PAPAGIANNOPOULOU*, Andrea CALIMERA**, Ruth BAHAR* * Brown University, USA ** Politecnico di Torino, Italy 12:15-14:00: 14:00-16:15: Organizer: Invited Talk: Lunch break Special Session 2: Analog and Mixed-Signal Test and Diagnosis Florence AZAIS, LIRMM, France Signature Based Test, Validation and Tuning of Mixed-Signal/RF Systems Abhijit CHATERJEE School of Electrical and Engineering - Georgia Tech, USA Pablo PETRASHIN*, Carlos DUALIBE** * Universidad Católica de Córdoba (UCC) ** Faculté Polytechnique - Université de Mons (UMons), Belgium
MONDAY, 28 th MARCH Test and Calibration of MEMS Convective Accelerometers with a Fully Electrical Setup Ahmed REKIK*,**, Florence AZAIS*, Norbert DUMAS*, Frédérick MAILLY*, Pascal NOUET* * LIRMM - CNRS/Univ. Montpellier 2, France ** ENIS - University of Sfax, Tunisia Testing Linear and Non-Linear Analog Circuits Using Moment Generating Functions Suraj SINDIA*, Vishwani AGRAWAL*, Virendra SINGH** * Auburn University, USA ** Indian Institute of Science, India Adaptive Alternate Analog Test Haralampos STRATIGOPOULOS TIMA Laboratory/CNRS, France Investigating the Effects of Transient Faults in Programmable Capacitor Arrays Tiago R. BALEN*, Guilherme S. CARDOSO*, Odair L. GONÇALEZ**, Marcelo S. LUBASZEWSKI* * Universidade Federal do Rio Grande do Sul Porto Alegre, RS, Brazil ** Instituto de Estudos Avançados (IEAv) São José dos Campos, SP, Brazil 16:15-16:35: 16:35-17:35: Coffee-break Session 1: Built-In Self-Test Nicola NICOLICI, McMaster University, Canada Vladimir PASCA, Lorena ANGHEL, Mounir BENABDENBI TIMA Laboratory, France On-line BIST for Performance Failure Prediction under Aging Effects in Automotive Safety-Critical Applications Ricardo OLIVEIRA*, **, Jorge SEMIAO*, ***, Isabel TEIXEIRA*, **, MARCELINO BICHO DOS SANTOS*, **, Paulo TEIXEIRA*, ** * INESC-ID, Lisboa, Portugal ** Instituto Superior Técnico, UTL, Lisboa, Portugal *** Universidade do Algarve, Faro, Portugal
MONDAY, 28 th MARCH On the Functional Test of MESI Controllers Edgar Ernesto SANCHEZ SANCHEZ**, ***, E. SANCHEZ*, M. SONZA REORDA*, A. TONDA*, J. VELASCO MEDINA** * Politecnico di Torino, Torino, Italy ** Universidad del Valle, Cali, Colombia *** Universidad Pedagógica y Tecnológica de Colombia, Sogamoso, Colombia 17:35-18:55: Session 2: Design & Synthesis for Testability, Automatic Test Generation Francisco RUSSI, Synopsys, USA Martin CHLOUPEK, Ondrej NOVAK Czech University, Prague, Czech Republic Programmable Sensor for On-Line Checking of Signal Integrity in FPGA-Based Systems Subject to Aging Effects Maria VALDES*, Judit FREIJEDO*, Maria MOURE*, JUAN J. RODRIGUEZ-ANDINA*, Jorge SEMIAO**, Fabian VARGAS***, Isabel Cacho TEIXEIRA****, João Paulo TEIXEIRA **** * University of Vigo, Vigo, Spain ** Instituto Superior Engenharia - Universidade do Algarve *** PUCRS, Brazil **** IST/TUL, INESC-ID, Portugal Test Power Reduction via Deterministic Alignment of Stimulus and Response Bits Eman ALQURAISHI*, Sobeeh ALMUKHAIZIM*, Ozgur SINANOGLU** * Kuwait University, Kuwait ** New York University, Abu Dhabi Functional Test Generation for the Replacement Mechanisms of Embedded Cache Memories Edgar Ernesto SANCHEZ SANCHEZ*, Wilson PEREZ HOLGIN**, Matteo SONZA REORDA*, Alberto TONDA*, Jaime VELASCO-MEDINA** * Politecnico Di Torino, Torino, Italy ** Univ. del Valle, Colombia
TUESDAY, 29 th MARCH 08:15-09:15: Session 3: Industrial Experience, Process Control and Measurements César DUEÑAS,, Brazil Testing in an Agile Product Development Environment: An Industry Experience Report Andreia DOS SANTOS Instituto Nokia de Tecnologia, Manaus, Brazil Sebastian SIEGL*, Kai-Steffen HIELSCHER*, Reinhard GERMAN*, Christian BERGER** * Universität Erlangen-Nürnberg, Erlangen, Germany ** Automotive Safety Technologies GmbH, Germany Modular and Adaptative test-bed for Infrared Photodetectors Lester FARIA, Newton GOMES, Luis Felipe NOHRA, Fabio ALVES Instituto Tecnológico de Aeronáutica (ITA), São José dos Campos, Brazil 09:15-10:15: Session 4: Process Variation, Fault Modeling and Analysis Vincent POUGET, IMS/CNRS, France Resistive Bridge Defect Detectability Considering Process Variation and Technology Scaling Hector VILLACORTA*, Victor Hugo CHAMPAC*, Sebastian BOTA**, Jaume SEGURA** * INAOE, Mexico ** Universitat de les Illes Balears, Spain Modeling the Effect of Process Variations on the Timing Response of Nanometer Digital Circuits Judit FREIJEDO*, Jorge SEMIAO**, Juan J. RODRIGUEZ-ANDINA*, Fabian VARGAS***, Isabel TEIXEIRA****, Paulo TEIXEIRA**** * University of Vigo, Vigo, Spain ** Universidade do Algarve, Portugal *** PUCRS, Brazil **** IST / INESC-ID, Portugal
TUESDAY, 29 th MARCH Error-Resilient Design of Branch Predictors for Effective Yield Improvement Sobeeh ALMUKHAIZIM*, Ozgur SINANOGLU** * Kuwait University, Kuwait ** New York University, Abu Dhabi 10:15-10:35: 10:35-13:10: Organizer: Invited Talk: Coffee-break Special Session 3: Design of ICs for Electromagnetic Robustness Sonia BEN DHIA, INSA / Toulouse, France VLSI Internal Testing: a Solution to Survive CAD Less Situation for High-Reliability Devices Philippe PERDU CNES Toulouse, France Prediction of Long-Term Immunity of Integrated Circuits Alexandre BOYER, Sonia BEN DHIA, Binhong LI, Bertrand VRIGNON INSA, Toulouse, France IC Immunity Modeling Process Validation Using On-Chip Measurements Sonia BEN DHIA*, Alexandre BOYER*, Bertrand VRIGNON*, Mikael DEOBARRO** * INSA, Toulouse, France ** Semiconductor Inc, France Shielding Effectiveness Analysis for the Automotive Industry and the Application of Composite Materials Lucas TRAVASSOS, Yan MEDEIROS, Josiane DANTAS VIANA, Zora IONARA GAMA DOS SANTOS SENAI CIMATEC, Salvador, Bahia First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors Sylvie JARRIX, Laurent DUSSEAU, Nathalie CHATRY, Christian CHATRY, Patrick HOFFMANN, Adrien DORIDANT Université Montpellier 2, France
TUESDAY, 29 th MARCH Impact of RF-Based Fault Injection in Pierce Type Crystal Oscillators under EMC Standard Tests in Microcontrollers Ricardo MALTIONE, Alfredo OLMOS, Andre BOAS, Eduardo DA SILVA, Jose SILVA * Semiconductor Inc, Campinas, Brazil ** CTI, Campinas, Brazil Interference Juliano BENFICA*, Letícia Maria BOLZANI POEHLS*, Fabian VARGAS*, José LIPOVETZKY**, Ariel LUTENBERG**, Sebastián E. GARCÍA**, Edmundo GATTI***, Fernando HERNANDEZ**** * PUCRS, Brazil ** University of Buenos Aires UBA, Buenos Aires, Argentina *** Instituto Nacional de Tecnología Industrial INTI, Buenos Aires, Argentina **** Universidad ORT, Montevideo, Uruguay 13:10-14:30: 14:30-16:45: Organizers: Invited Talk: Lunch break Special Session 4: Radiation Effects on ICs Fréderic SAIGNÉ / Frédéric WROBEL, Univ. of Montpellier II, France Radiation Effects at Ground Level Antoine TOUBOUL Université Montpellier 2, France Analysis of SEU parameters for the study of SRAM cells reliability under radiation Karine CASTELLANI-COULIÉ, Jean Michel PORTAL, Gilles MICOLAU, Hassen AZIZA IM2NP/UMR CNRS 6242 - Université Aix-Marseille, France IMT Technopôle de Château Gombert, Marseille, France Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench Luigi DILILLO, Paolo RECH, Jean-Marc GALLIERE, Patrick GIRARD, Frédéric WROBEL, Frédéric SAIGNE LIRMM, Université Montpellier 2, France
TUESDAY, 29 th MARCH Jimmy TARRILLO, Eduardo CHIELLE, Raul CHIPANA, Fernanda de LIMA KASTENSMIDT Instituto de Informática Universidade Federal do Rio Grande do Sul (UFRGS), Brazil Robustness with respect to SEUs of a self-converging algorithm Raoul VELAZCO, Gilles FOUCARD, Fabrice PANCHER, Wassim MANSOUR, Greicy MARQUÉS- COSTA, Devan SOHIER, Alain BUI TIMA Laboratory UJF - INPG, France G. MICOLAU, H. AZIZA, K. CASTELLANI-COULIÉ, J-M. PORTAL Université Aix-Marseille 16:45 17:05: 17:05-17:40: Tutorial: 17:40-19:00: Coffee-break Embedded Tutorial 1 Ignacio ARRUENGO, Instituto Nacional de Técnica Aeroespacial INTA, Spain Session 5: Fault-Tolerance in HW/SW Carlos LISBOA, UFRGS, Brazil Adaptive Approach to Tolerate Multiple Faulty Links in Network-on-Chip Anelise KOLOGESKI, Caroline CONCATTO, Luigi CARRO, Fernanda de LIMA KASTENSMIDT Instituto de Informática Universidade Federal do Rio Grande do Sul (UFRGS), Brazil Reliability Enhancement via Sleep Transistors Frank SILL TORRES*, Claas CORNELIUS**, Dirk TIMMERMANN** * Federal University of Minas Gerais, Belo Horizonte, Brazil ** University of Rostock, Germany
TUESDAY, 29 th MARCH A Fault Tolerant Service Discovery Protocol for Emergency Search and Rescue Missions Janine KNIESS*,**, Orlando LOQUES**, Celio ALBUQUERQUE** * Santa Catarina State University (UDESC), Joinville, Brazil ** Fluminense Federal University (UFF), Rio de Janeiro, Brazil Rodrigo POSSAMAI BASTOS, Giorgio DI NATALE, Marie-Lise FLOTTES, Bruno ROUZEYRE LIRMM - Université Montpellier II, Montpellier, France WEDNESDAY, 30 th MARCH 08:15-08:50: Tutorial: 08:50-09:50: Embedded Tutorial 2 Advanced Test Methods for SRAMs Alberto Bosio*, Luigi Dilillo*, Patrick Girard, S. Pravossoudovitch, A. Virazel LIRMM - Université Mont * presenters Session 6: Fault Injection and Simulation Raoul VELAZCO, TIMA Laboratory, France Methodology and Platform for Fault Co-Emulation Jorge CORSO*, Francisco RAMIREZ** * Brazil ** Universidade de Sao Paulo, Brazil Communication Fault Injection for Multi-Protocol Java Applications Testing Cristina MENEGOTTO, Taisy WEBER Instituto de Informática, Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
WEDNESDAY, 30 th MARCH Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness under SEEs: A Case Study Marta PORTELA-GARCIA*, Almudena LINDOSO*, Luis ENTRENA*, Mario GARCIA VALDERAS*, Celia LOPEZ-ONGIL*, Bernardo PIANTA**, Letícia BOLZANI POEHLS**, Fabian VARGAS** * Carlos III University of Madrid, Spain ** PUCRS, Brazil 9:50-10:10: 10:10 10:45: 10:45-12:20: Organizer: Invited Talk: Coffee-break Embedded Tutorial 3 Software-Based Self-Test of Embedded Microprocessors Paolo Bernardi*, Michelangelo Grosso, Ernesto Sánchez Dipartimento di Automatica e Informatica, Politecnico di Torino, Italy * presenter Special Session 5: Design and Test of Reliable Software for Embedded Systems Cristine GUSMÃO, UFPE, Brazil Comparing Different Test Structures in a Company Cidinha GOUVEIA GOTEST Consultoria e Treinamento em Tecnologia LTDA, Brazil An Approach for Clustering Test Data Alexandre LENZ, Aurora POZO, Silvia VERGILIO Federal University of Parana (UFPR), Brazil Evaluating Test Reuse of a Software Product Line Strategies Wesley ASSUNÇÃO, Daniela TRINDADE, Thelma COLANZI, Silvia VERGILIO Federal University of Parana (UFPR), Brazil Jose Rodrigo AZAMBUJA, Angelo LAPOLLI, Mauricio SCARPATO, Fernanda de LIMA KASTENSMIDT Instituto de Informática Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
12:20-13:50: WEDNESDAY, 30 th MARCH Lunch break 13:50-16:05: Organizer: Invited Talk: Speakers: Elmar Uwe Kurt MELCHER, UFCG, Brazil Claudionor N. Coelho Jr.*, Antonio Otavio Fernandes** * VP of Engineering, Jasper Design Automation / UFMG ** Science Department / UFMG Mikhail CHUPILKO, Alexander KAMKIN Institute for System Programming of RAS, Moscow, Russia Samuel PAGLIARINI, Paulo HAACKE, Fernanda de LIMA KASTENSMIDT Instituto de Informática Universidade Federal do Rio Grande do Sul (UFRGS), Brazil Formally Verifying an RTOS Scheduling Monitor IP Core in Embedded Systems Carlos CASTRO MARQUEZ*, Jiang Chau WANG*, Marius STRUM*, Fabian VARGAS** * School of Engineering University of Sao Paulo, Brazil ** PUCRS, Brazil Djones LETTNIN, WOLFGANG ROSENSTIEL University of Tübingen, Tübingen Germany Jorge TONFAT, Gustavo NEUBERGER, Ricardo REIS Instituto de Informática Universidade Federal do Rio Grande do Sul (UFRGS), Brazil 16:05-16:15: Coffee-break
16:15-17:25: WEDNESDAY, 30 th MARCH Session 7: HDL-Based IC Design and Fault Modeling Mutation Analysis for SystemC Designs at TLM Valerio GUARNIERI*, Nicola BOMBIERI*, Graziano PRAVADELLI*, Franco FUMMI*, Hanno HANTSON**, Jaan RAIK**, Maksim JENIHHIN**, Raimund UBAR** * Department of Science - University of Verona, Verona, Italy ** Department of Engineering - Tallinn University of Technology, Tallinn, Estonia SystemC-AMS High-Level Modeling of Linear Analog Blocks with Power Consumption Information Laurent BOUSQUET, Fabio CENNI, Emmanuel SIMEU TIMA-Laboratory, Grenoble, France A cache based algorithm to predict HDL modules faults Jose Augusto NACIF*,**, Thiago S. F. SILVA*, Luiz Filipe M. VIEIRA*, Alex Borges VIEIRA***, Antônio O. FERNANDES*, Claudionor N. COELHO Jr.* *Universidade Federal de Minas Gerais, Belo Horizonte, Brazil **Universidade Federal de Viçosa, Florestal, Brazil ***Universidade Federal de Juiz de Fora, Juiz de Fora, Brazil 17:25-17:40: Closing Remarks