Linear Parameter Measurement (LPM)



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(LPM) Module of the R&D SYSTEM FEATURES Identifies linear transducer model Measures suspension creep LS-fitting in impedance LS-fitting in displacement (optional) Single-step measurement with laser sensor Two-step measurement with additional mass or test enclosure Logarithmically spaced multi-tone excitation Measurements at low and high amplitudes Monitors ratio signal to noise + distortion (SNR+D) and noise floor Automatic validity check [Ohm] 15,0 12,5 10,0 7,5 5,0 High reliability and reproducibility Fast measurements Magnitude of electric impedance Z(f) 10 0 10 1 10 2 10 3 This module identifies the electrical and mechanical parameters of electro-dynamical transducers by measuring the voltage and current at the speaker terminals. Using an optional laser displacement sensor the identification dispenses with a second measurement and avoids problems due to leakage of the test enclosure and mass attachment. This kind of measurement also identifies the parameters of the suspension creep giving more accuracy of the loudspeaker model at low frequencies. The measurement indicates insufficient signal to noise ratio and malfunction operation due to nonlinear effects of the driver or amplifier limiting. Article Number: 1000-400 CONTENTS: Linear Modeling of the Transducer... 2 Measurement Technique... 3 Ensuring Validity of the Results... 4 Import Parameter... 5 Measurement Results... 5 Klippel GmbH Mendelssohnallee 30 01309 Dresden, Germany www.klippel.de info@klippel.de updated August 13, 2012 TEL: +49-351-251 35 35 FAX: +49-351-251 34 31

Linear Modeling of the Transducer Principle The transducers considered here have a moving-coil assembly performing an electrodynamical conversion of the electrical quantities (current and voltage) into mechanical quantities (velocity and force) and vice versa. Equivalent Circuit I R e L e L 2 v C ms (f) M ms R ms U R 2 Bl V Bl Bl I The lumped-parameter model shown above is valid at low frequencies where the geometrical dimensions of the transducer are small in comparison to the wave length. In this case the mechanical system may be represented by a moving mass M ms, a compliance C ms (f) and a mechanical resistance R ms. The force factor Bl couples the mechanical with the electrical side of the transducer. The electrical impedance is modeled by the electrical resistance R e and additional elements L e, L 2 and R 2 that describe the para-inductance and losses due to eddy currents. It is also assumed that the amplitude of all state variables is sufficiently low to neglect parameter variations caused by thermal and nonlinear mechanisms. Suspension Creep After applying a constant force to a loudspeaker suspensions the voice coil displacement slowly varies and will find the equilibrium after a few seconds (creep). This effect also affects the dynamic behavior and is visible in the transfer function H x (f) between voltage U(f) and displacement X(f) as shown below. Magnitude of Transfer Function x(f)/u(f) [mm/v] 0,8 0,7 0,6 0,5 0,4 0,3 0,2 0,1 0,0 measured estimated without creep 10 1 10 2 10 3 10 4 Below the resonance frequency f S there is a significant difference between the magnitude of the measured response of H x (f) and the predicted response using the traditional model. To consider the creep effect the constant parameter compliance C ms is replaced by the dynamic transfer function [1]: ( f ) C ms 1 log C ms 10 where C ms is the linear compliance and f s is the driver resonance frequency. There is a straight forward interpretation of the creep factor. The quantity 100% indicates the decrease of the compliance C ms in percentages at low frequencies. For a frequency one decade below the resonance frequency f s the compliance C ms is decreased by 100%. [1] Knudsen, M. H. and Jensen, J. G. Low-frequency loudspeaker models that include suspension creep. J. Audio Eng. Soc., Vol. 41, No. 1 / 2, 1993 f f s Operating condition The can be applied to drivers operated in free air or mounted in a sealed enclosure. An additional mass may be applied to the moving assembly of the transducer. R&D SYSTEM page 2

Measurement Technique Principle Signal source amplifier U(t) current sensor transducer System Identification Laser I(t) x(t) The parameters of the linear transducer model are identified by measuring the electrical voltage U(t) and current I(t) at the transducer terminals. The linear parameters are identified by fitting the model to the measured impedance curve over the full frequency range. states parameters Minimal setup Excitation Signal Acquisition Spectral Analysis - Distortion Analyzer - Power amplifier - Amplifier and speaker cable - Computer connected via USB The stimulus used during the measurement is a sparse multi-tone complex spaced logarithmically on frequency. This signal is optimal for the parameter identification at small amplitudes because the transducer is only excited at frequencies of interest. The user may specify the amplitude and the frequency range covered by the tones and their distance (relative resolution). The user may specify either the voltage at the output connector OUT 1 or the voltage at the terminals of the speaker connected to output SPEAKER 1 (SPEAKER 2). In the later case the amplifier gain is determined at 750 Hz without load prior to the main measurement and the excitation level is adjusted accordingly. Also the amplifier low frequency roll off is determined and compensated for the two lowest frequency lines. The state variables are acquired at sample rates up to 48 khz. Optionally, averaging of the periodically measured time signals improves the signal to noise ratio. All of the measured time signals are subject of a FFT analysis. The resulting spectra show not only the fundamental response to the sparse multi-tone signal but also the distortion generated by the transducer or amplifier and residual measurement noise. Electric Current I(f) -25 Signal [db] Iref = 1 A -50-75 Distortion Parameter Estimation -100-125 Noise Floor 10 1 10 2 10 3 All points of the measured impedance response are used for the identification of the electrical parameters, the resonance frequency and for the loss factors of the mechanical system. The estimated response (bold line) based on the identified model is displayed together with the measured response (thin line) to show the quality of the fitting. Magnitude of electric impedance Z(f) 80 70 [Ohm] 60 50 40 30 20 10 10 1 Frequency [Hz] 10 2 10 3 R&D SYSTEM page 3

Using Added Mass or Test Enclosure Optional Laser Sensor The module supports the traditional two step techniques for the estimation of the mechanical parameters. They require a second (perturbed) measurement where the transducer is either mounted in a test enclosure or an additional mass is attached to it. Both perturbation techniques are time consuming and the accuracy of the results may be deteriorated by leakage of the enclosure and problems due to the attachment of the mass. There are also transducers where neither of the techniques can be applied. An inexpensive laser sensor based on optical triangulation (see Displacement Meter of the R&D System) may be used to measure voice coil displacement simultaneously. The measured transfer function H x (f) between terminal voltage U(f) and displacement x(t) is used to estimate the mechanical parameters. Considering the creep effect at low frequencies gives a good agreement between measured response (thin curve) and the modeled response (bold line). Magnitude of transfer function Hx(f)=x(f)/U(f) Acoustical Environment Sound Pressure Response [mm/v] 0,9 0,8 0,7 0,6 0,5 0,4 0,3 0,2 0,1 0,0 10 1 10 2 Frequency [Hz] 10 3 10 4 The influence of the room acoustics on the driver parameters may be neglected for a normal room size (volume > 30 m 3 ) and a distance of at least 1 m to the walls. Optionally a microphone may be connected to the Distortion Analyzer 1 and the radiated sound pressure signal may be measured simultaneously. The sparse multi-tone complex allows to measure the speaker distortion on-line. This way a unique fingerprint of the speaker is obtained. Furthermore the driver nonlinearities can be identified directly Spectrum p(f) of microphone signal -50 Signal p(f) -75-100 Distortion [dbu] Uref 1V -125-150 Noise Floor -175 10 1 10 2 10 3 In the example above the speaker produces substantial distortion which exceed 10 % at all frequencies. This kind of distortion are produced by motor nonlinearities whereas stiffness distortion are restricted to low frequencies and inductance and Doppler distortion increase by 6 db toward higher frequencies. Ensuring Validity of the Results Principle Amplifier Check The multi-tone complex used as excitation stimulus makes it possible to measure the fundamental components, signal distortion and the noise level simultaneously. This information is the basis for detecting a malfunction operation on-line and to give warnings if amplifier and transducer are not connected properly. Spectrum U(f) of voltage at speaker terminals [dbu] U ref = 1 V -25-50 -75-100 -125 Noise Floor Signal U(f) Noise + Distortions -150 10 1 Frequency [Hz] 10 2 10 3 A low signal to noise ratio of the voltage signal at the terminals indicates that the gain of the amplifier is too low. A humming component (50 / 60 Hz) due to a ground loop can also be found easily. R&D SYSTEM page 4

Small Signal Domain The signal to distortion ratio shows a malfunction operation of the amplifier (such as limiting). In the example below the distortion generated by the power amplifier are 50 db below the fundamental components and 25 db above noise floor. If the signal to noise ratio in the measured current signal is too small then the number of averaging has to be increased. If the signal to distortion ratio in the measured current signal is too small then the driver behaves nonlinear and the linear model becomes invalid. Import Parameter Parameter Symbol Min Typ Max Unit Transducer Parameters Effective area of the driver diaphragm. S d 0.01 10000 cm 2 Voice coil resistance at DC (optional) R e 0.1 Ω Force factor (optional) Bl 0.01 N/A Moving mass (optional) M ms 0.1 g Identification Method using laser displacement meter, additional mass or using test enclosure optionally a shunt can be used to improve the signal to noise ratio for drivers with a low Q ts Additional mass M add 1 g Volume of sealed enclosure V box 0.5 dm³ (l) Shunt resistance R shunt 0 15 Ohm Stimulus Highest frequency f max 2 18 khz Reference frequency f ref 0.19 25 Hz Relative frequency resolution f/f ref 1/99 1/24 1 octave Voltage at speaker terminals (power amplifier output voltage) Voltage at OUT 1 (power amplifier input voltage) Measurement 0-200 0-200 0.3-8.24 0.02-31.8 200 48.2 6.5 19.1 Sensor terminal Speaker 1 or Speaker 2 Number of averaging 1 16 128 V rms dbu V rms dbu Measurement Results Parameter Symbol Unit DC resistance of driver voice coil R e Ω Lumped elements of para-inductance L e mh R 2 Ω L 2 mh Electrical resistance due to mechanical losses R es Ω Electrical capacitance representing moving mass C mes µf Electric inductance representing driver compliance L ces mh Real part of voice coil impedance at f s {Z L (f s )} Ω Mechanical mass of driver diaphragm assembly including air load and voice coil M ms g Mechanical resistance due to mechanical losses R ms kg/s Mechanical compliance of driver suspension C ms mm/n Creep factor Mechanical stiffness of driver suspension K ms N/mm R&D SYSTEM page 5

Force factor at the rest position (Bl product) Bl N/A Derived Parameters Resonance frequency of driver f s Hz Total Q-factor of driver considering R e and R ms only Q ts Electrical Q-factor of driver in free air considering R e only Q es Electrical Q-factor considering {Z L (f s )} Total Q-factor considering all losses ( R e, R ms, {Z L (f s )} ) Mechanical Q-factor of driver in free air considering R ms only Q ms Reference efficiency of electro-acoustical conversion (2-radiation load) 0 % Characteristic sound pressure level L m db Equivalent air volume of suspension V as dm³ (l) Resonance frequency of driver in enclosure f ct Hz Electrical Q-factor of driver in enclosure considering R e only Q ect Resonance frequency of driver with additional mass f m Hz Time Signals Waveform of voltage at transducer terminals U(t) V Waveform of current at transducer terminals I(t) A Waveform of sound pressure p(t) Pa Waveform of displacement X(t) mm Spectra Voltage spectrum U(f) dbu Current spectrum I(f) db Sound pressure spectrum p(f) dbu Displacement spectrum X(f) mm Measured (laser/microphone) and fitted sound pressure level at 1W / 1m SPL db Transfer Functions Magnitude of measured and fitted electrical impedance Z(f) Z(f)= U(f)/I(f) Ω Phase of measured and fitted electrical impedance Z(f) Z(f)= U(f)/I(f) rad Magnitude of measured and estimated displacement transfer function H x (f)=x(f)/u(f) mm/v States and Measurement Variables Peak to peak value of voltage at terminals U pp V DC part of voltage signal U dc V AC part of voltage signal U ac V Digital headroom of voltage signal U head db Ratio of signal to noise + distortion in voltage signal U SNR+D db Frequency of noise maximum in voltage signal f u,noise Hz Peak to peak value of current at terminals I pp A DC part of current signal I dc A AC part of current signal I ac A Digital headroom of current signal I head db Ratio of signal to noise + distortion in current signal I SNR+D db Frequency of noise maximum in current signal f i,noise Hz Peak to peak value of displacement signal X pp mm DC part of displacement signal X dc mm AC part of displacement signal X ac mm Digital headroom of displacement signal X head db Frequency of highest valid line in displacement signal f x,cutoff Hz Peak to peak value of microphone signal p pp V DC part of microphone signal p dc V AC part of microphone signal p ac V Digital headroom of microphone signal p head db Ratio of signal to noise + distortion in microphone signal p SNR+D db Frequency of noise maximum in microphone signal f p,noise Hz Q eps Q tp R&D SYSTEM page 6

Find explanations for symbols at http://www.klippel.de/know-how/literature.html Klippel GmbH Mendelssohnallee 30 01309 Dresden, Germany www.klippel.de info@klippel.de updated August 13, 2012 TEL: +49-351-251 35 35 FAX: +49-351-251 34 31 R&D SYSTEM page 7