Raport nr : 062/2004

Transcription

1 Raport nr : 062/2004 RAPORT Type of test object Rodzaj badanego obiektu Trademark Oznaczenie fabryczne Model/type reference Oznaczenie typu Manufacturer &]\WQLN#]HZQ*WU]Q\ Bibi R32 Bibi R32 rev. A Producent 0LFUR0DGH#*DáND#L#'UR*G*#sp.j Date of test Data badania Date of issue Data wydania raportu specification Podstawa wykonania badania EN ; EN /3/5/4/6/11; EN55022 PN-EN ; PN-EN /3/4/5/6/11; PN-EN55022 TEST SUMARY WYNIK BADANIA...: The tested product complies with the requirements. #%DGDQH#XU]%G]HQLH#VSHáQLD#Z\PDJDQLD YES TAK NO (see description p.) NIE (opis na str.) The report consists of 15 pages Raport zawiera 15 stron This report should not be reproduced partially without a written approval of the Satel Sp. z o. o. 5DSRUW#QLH#PR*H#E\ü#SRZLHODQ\#Z#VNUyFLH#OXE#ZH#IUDJPHQWDFK#EH]#SLVHPQHM#]JRG\ Satel Sp. z o.o. Approved by: Zatwierdzony przez Head of ing Laboratory Kierownika laboratorium: 0LFKDá#Konarski, MSEE Signature Podpis: Date Data: te: These test results refer to the tested object. Uwagi: 6WZLHUG]D# VL*/# *H# SU]HGVWDZLRQH# Z\QLNL EDGD4# GRW\F]%# W\ONR# SU]HGPLRWyZ poddanych badaniu. The customer is allowed to use the following statement: This test has been carried out in Manufacturer lab of Satel Sp. z o.o. Poland =OHFHQLRGDZFD#PR*H#SRVáXJLZDü#VL*#QDVW*SXM%F%#IRUPXá%: ³%DGDQLH# ]RVWDáR# Z\NRQDQH# Z# =DNáDGRZ\P# /DERUDWRULXP Satel Sp. z o. o.

2 Dot.: Bibi R32 rev. A Strona / Page 2 STANDARDS EN :1996 EN :1995 /A2:2001 EN :1996 /A1:1998+A2:2001 EN :1999 /A2: 2001 EN :1995 /A1:2001 EN :1996 /A1:2001 EN :1994 EN 55022:1998 /A1:2002 Alarm systems Part 4. Electromagnetic compatibility Product family standard: Immunity requirements for components of fire, intruder and social alarm systems. ing and measurement techniques Section 2: Electrostatic discharge immunity test. Basic EMC Publication. ing and measurement techniques Section 3: Radiated, radio frequency electromagnetic field immunity test. Basic EMC Publication. ing and measurement techniques Section 4: Electrical fast transient/burst immunity test. Basic EMC Publication. ing and measurement techniques Section 5: Surge immunity test Basic EMC Publication. ing and measurement techniques Section 6: Immunity to conducted disturbances inducted by radio frequency fields. Basic EMC Publication. ing and measurement techniques Section 11: Voltage dips, short interruptions and voltage variations immunity test. Basic EMC Publication. Information technology equipment. Radio disturbances characteristic Limits and methods of measurement. NORMY PN-EN :2002 PN-EN :1999 /A2:2002 PN-EN :2002 PN-EN :1999 /A2:2002 PN-EN :1998 /A1:2002 PN-EN : 1996 /A1:2001 PN-EN :1997 PN-EN 55022:2000 /A1:2002.RPSDW\ELOQR>ü#HOHNWURPDJQHW\F]QD##1RUPD#GOD#JUXS#Z\UREyZ :\PDJDQLD#GRW\F]%FH#RGSRUQR>FL##XU]%G]H4#V\VWHPyZ DODUPRZ\FK/#SR*DURZ\FK#ZáDPDQLRZ\FK#L#RVRELVW\FK.RPSDW\ELOQR>ü#HOHNWURPDJQHW\F]QD#+(0&,#0HWRG\#EDGD4#L SRPLDUyZ1#%DGDQLH#RGSRUQR>FL#QD#Z\áDGRZDQLD#HOHNWURVWDW\F]QH1.RPSDW\ELOQR>ü#HOHNWURPDJQHW\F]QD#0HWRG\#EDGD4#L#SRPLDUyZ1 %DGDQLH#RGSRUQR>FL#QD##SROH#HOHNWURPDJQHW\F]QH#R#F]*VWRWOLZR>FL radiowej..rpsdw\eloqr>ü#hohnwurpdjqhw\f]qd#+(0&,#0hwrg\#edgd4#l SRPLDUyZ1#%DGDQLH#RGSRUQR>FL#QD##V]\ENLH#VWDQ\#SU]HM>FLRZH#2 ZL%]NL#]DEXU]H4#HOHNWU\F]Q\FK1.RPSDW\ELOQR>ü#HOHNWURPDJQHW\F]QD#+(0&,#0HWRG\#EDGD4#L SRPLDUyZ1#%DGDQLH#RGSRUQR>FL#QD#XGDU\1.RPSDW\ELOQR>ü#HOHNWURPDJQHW\F]QD#+(0&,#0HWRG\#EDGD4#L SRPLDUyZ1#2GSRUQR>ü#QD#]DEXU]HQLD#SU]HZRG]RQH#LQGXNRZDQH SU]H]#SROD#R#F]*VWRWOLZR>FL#UDGLRZHM1.RPSDW\ELOQR>ü#HOHNWURPDJQHW\F]QD#+(0&,#0HWRG\#EDGD4#L SRPLDUyZ1#%DGDQLH#RGSRUQR>FL#QD#]DSDG\#QDSL*FLD/#NUyWNLH SU]HUZ\#L#]PLDQ\#QDSL*FLD1.RPSDW\ELOQR>ü#HOHNWURPDJQHW\F]QD1#'RSXV]F]DOQH#SR]LRP\#L PHWRG\#SRPLDUX#]DNáyFH4#UDGLRHOHNWU\F]Q\FK#Z\WZDU]DQ\FK#SU]H] XU]%G]HQLD#LQIRUPDW\F]QH

3 Dot.: Bibi R32 rev. A Strona / Page 3 programme and results Program badania i wynik Nr 1 Immunity for electrostatic discharge 2GSRUQR>ü#QD#Z\áDGRZDQLD#HOHNWURVWDW\F]QH 2 RF electromagnetic field immunity test 2GSRUQR>ü#QD#SROH#HOHNWURPDJQHW\F]QH#R#F]*VWRWOLZR>FL radiowej 3 Fast burst immunity test 2GSRUQR>ü#QD#V]\ENLH#ZL%]NL#LPSXOVyZ 4 Surge immunity test 2GSRUQR>ü#QD#XGDU\ 5 Immunity to conducted disturbances inducted by radio frequency fields 2GSRUQR>ü#QD#]DEXU]HQLD#SU]HZRG]RQH#LQGXNRZDQH#SU]H] SROD#R#F]*VWRWOLZR>FL#UDGLRZHM 6 Conducted disturbances emission measurement 3RPLDU\#QDSL*FLD#]DEXU]H4 7 Radiated disturbances emission measurement 3RPLDU\#]DEXU]H4#SURPLHQLRZDQ\FK 8 Mains voltage fluctuation 2GSRUQR>ü#QD#ZDKDQLD#QDSL*FLD Result carried out by %DGDQLH#SU]HSURZDG]Dá= carried out by %DGDQLH#SU]HSURZDG]Dá= carried out by %DGDQLH#SU]HSURZDG]Dá= 6WDQLVáDZ#*DOOD/#06(( 0LFKDá#Konarski, MSEE 0LFKDá#Polewski, MSEE Signature Podpis: Signature Podpis: Signature Podpis: Date Data: Date Data: Date Data:

4 Dot.: Bibi R32 rev. A Strona / Page 4 Performance criteria (for immunity tests only).u\whuld#rfhq\#z\qlnyz#edgd4#+w\onr#god#edgd4#rgsruqr>fl, Criteria Kryterium A B C Descriptions Opis During the test, the apparatus should operate as intended by the manufacturer according to manual. performance loss below the limits specified in manual (or exceeding specified acceptable performance loss) is allowed during the test. Indicators blinking is allowed, while other erratic behaviour such as outputs triggering or loss of stored data is not allowed. 8U]%G]HQLH# SUDFXMH# QRUPDOQLH# Z# JUDQLFDFK# SU]HZLG]LDQ\FK# LQVWUXNFM% SRGF]DV# EDGDQLD1# 1LH# QDVW*SXMH# SRJRUV]HQLH# VWDQX# SUDF\# OXE# ]PLDQD FKDUDNWHU\VW\N# SUDF\# +OXE# XWUDWD# IXQNFMRQDOQR>FL,# SRQL*HM# ZDUWR>FL RNUH>ORQ\FK# Z# LQVWUXNFMDFK1# 3RGF]DV# EDGDQLD# GRSXV]F]D# VL*# PLJRWDQLH ZVND(QLNyZ/#LQQH#]PLDQ\#SRZRGXM%FH#]PLDQ\#QD#Z\M>FLDFK# OXE# ]PLDQ\ GDQ\FK#QLH#V%#GRSXV]F]DOQH1 After the test, the apparatus should operate as intended by the manufacturer according to manual. performance loss below the limits specified in manual (or exceeding specified acceptable performance loss) is allowed during the test. During the test, performance degradation is allowed except not self recovered state change or loss of stored data. 8U]%G]HQLH# SUDFXMH# QRUPDOQLH# Z# JUDQLFDFK# SU]HZLG]LDQ\FK# Z\PDJD4# SR EDGDQLX1# 1LH# QDVW*SXMH# SRJRUV]HQLH# VWDQX# SUDF\# OXE# ]PLDQD FKDUDNWHU\VW\N# SUDF\# +OXE# XWUDWD# IXQNFMRQDOQR>FL,# SRQL*HM# ZDUWR>FL RNUH>ORQ\FK# SU]H]# SURGXFHQWD1# 3RGF]DV# EDGDQLD# V%# GR]ZRORQH#]PLDQ\# Z IXQNFMRQRZDQLX1# +1LH# GR]ZRORQH# V%# ]PLDQ\# VWDQX# SUDF\# RUD]# ]PLDQ\# Z danych) Temporary or permanent loss of functionality is allowed assuming that these functions can be self-recovered or manually recovered by the operator following instructions given in the manual. &]DVRZH#WUZDáH#]PLDQ\#Z#IXQNFMRQRZDQLX#V%#GR]ZRORQH#MH*HOL#PRJ%#E\ü SU]\ZUyFRQH#SU]H]#GRZROQ%#RSHUDFM*#/#OXE#LQQ%#SU]HZLG]LDQ%#Z#LQVWUXNFML REVáXJL

5 Dot.: Bibi R32 rev. A Strona / Page 5 Identification Manufacturer, country Producent, kraj pochodzenia 0LFUR0DGH#*DáND#L#'UR*G*#sp.j ul. Wieniawskiego 16 67#±#<53#3LáD Poland Identyfikacja Model/type reference Oznaczenie typu: Bibi R32 rev. A minal ratings Dane znamionowe: :HUVMD#Sá\W\#JáyZQHM= Identyfikatory: System odczytu: =DVL*J#RGF]\WX#NDUW= Sygnalizacja odczytu: 3Rá%F]HQLH= 'áxjr>ü#srá%f]hqld= 1DSL*FLH#]DVLODQLD: 3REyU#SU%GX= Wymiary: Temperatura pracy: R32 rev. A transpondery Unique 125 khz, ASK, Manchester min. 5 cm GLRG\#/('#.#EU]*F]\N interfrejs RS232 (9600 bps) do 20 m 12V DC 100mA 95 x 48 x 13 mm C System state during immunity and emission test: 6WDQ#SUDF\#SRGF]DV#EDGD4#RGSRUQR>FL#L#HPLVML= %DGDQ\#XNáDG#VNáDGDá#VL*#]#F]\WQLND565#+RELHNW#EDGDQ\#,#SRGá%F]RQHJR#GR#= 1. Kontrolera ELEL#.45 #SRá%F]RQHJR#]D#SRPRF%##L]RORZDQHM#SU]HM>FLyZNL NRQWUROHU#±#NRPSXWHU#Z\NRQDQHM#QD#ED]LH#XNáDGX#NRQWUROHUD#.45##]DSHZQLDM%FHM ZVSyáSUDFH#LQWHUIHMVyZ#56565#±#567;8 3RGF]DV# EDGD4# GR# RELHNWX# EDGDQHJR# E\á# SRGá%F]RQ\# NRQWUROHU#.45# ZVSyáSUDFXM%F\# ] NRPSXWHUHP#QDG]RUXM%F\P#MHJR#SUDF*#]D#SRPRF%#SURJUDPX#%ELEL%/# NWyU\#QD#ELH*%FR#]ELHUDá RUD]# UHMHVWURZDá# GDQH# ]# RELHNWX# EDGDQHJR1# =PLDQD# VWDQX# RELHNWX# EDGDQHJR# +F]\WQLND# 565, PRJáD# E\ü# ]DUHMHVWURZDQD/# SURJUDP# QDG]RUXM%FR# 0# NRQWUROXM%F\# XPR*OLZLD# NRQWURO*# VWDQX XU]%G]HQLD# SRGF]DV# WHVWyZ1# 5HMHVWUDFMH# GDQ\FK# SU]HV\áDQ\FK# GR# NRQWUROHUD/# RGF]\WDQ\FK przez czytnik, kart oraz sygnalizacje zmian w konfiguracji systemu, utracenie / odzyskanie komunikacji czytnika z kontrolerem.

6 Dot.: Bibi R32 rev. A Strona / Page 6 specification EN Immunity for electrostatic discharge 2GSRUQR>ü#QD#Z\áDGRZDQLD#HOHNWURVWDW\F]QH The test were performed przeprowadzono: Performance criteria:.u\whulxp#su]\m*fld=##a, B, C Sprawdzenie Contact discharge :\ádgrzdqlh#vw\nrzh Air discharge :\ádgrzdqlh#srzlhwu]qh Indirect discharge :\ádgrzdqlh#sr>uhgqlh points, description Punkty sprawdzenia,opis a) Obudowa Discharge count /LF]ED#Z\áDGRZD4 20 Discharge count /LF]ED#Z\áDGRZD4 20 Discharge count /LF]ED#Z\áDGRZD4 20 Results b) Results c) Results d) Results e) Results f) Results g) Results h) Results The verification of functionality after the test 6SUDZG]HQLH#G]LDáDQLD#SR#EDGDQLDFK On the floor 1D#SRGáRG]H Polarity Polaryzacja Polarity Polaryzacja Polarity Polaryzacja Level Poziom Level Poziom Level Poziom On the table Na stole After the test no degradation of unit performance nor malfunction / damage was noticed. 3R#EDGDQLDFK#QLH#VWZLHUG]RQR#*DGQHJR#XV]NRG]HQLD/#DQL#ZDGOLZHJR#G]LDáDQLD/#DQL#]PLDQ\#VWDQX#Z#Z\QLNX QDUD*DQLD B 4kV 8 kv 4 kv results sprawdzenia:

7 Dot.: Bibi R32 rev. A Strona / Page 7 specification EN RF electromagnetic field immunity test 2GSRUQR>ü#QD#SROH#HOHNWURPDJQHW\F]QH#R#F]*VWRWOLZR>FL#UDGLRZHM Performance criteria:.u\whulxp#su]\m*fld=##a, B, C Sprawdzenie Frequency range ( MHz) =DNUHV#F]*VWRWOLZR>FL#+;3#±#4333#>0+]@, level 1 / 3 / 10 / X [V/m] Poziom sprawdzenia 1 / 3 / 10 / X [V/m] Modulation Modulacja AM 80% 1 [khz] Pulse modulation Impulsowa 100% 1 [Hz] Other: Inna: 200Hz (50%AM) Impulsowa 2,5ms on/2,5 off on 900±5MHz Clock frequency &]*VWRWOLZR>ü#]HJDUD The verification of functionality under the test 6SUDZG]HQLH#G]LDáDQLD#L#REVHUZDFMH#SRGF]DV#EDGDQLD [MHz] 10 [V/m] Under the test no degradation of unit performance nor malfunction / damage was noticed. :#F]DVLH#EDGDQLD#QLH#VWZLHUG]RQR#*DGQHJR#XV]NRG]HQLD/#DQL#ZDGOLZHJR#G]LDáDQLD/#DQL#]PLDQ\#VWDQX#Z#Z\QLNX QDUD*DQLD1 A results sprawdzenia:

8 Dot.: Bibi R32 rev. A Strona / Page 8 specification EN Fast burst immunity test 2GSRUQR>ü#QD#V]\ENLH#ZL%]NL#LPSXOVyZ The test were performed przeprowadzono: Performance criteria:.u\whulxp#su]\m*fld=#a, B, C Sprawdzenie Mains input Obwody zasilania level 0,5 / 1 / 2 / 4 / X [kv] Poziom sprawdzenia 0,5 / 1 / 2 / 4 / X [kv] Repetition frequency 2,5 / 5 [khz] &]*VWRWOLZR>ü#SRZWDU]DQLD#2,5 / 5 [khz] Duration per application 1 / 2 / X [min] &]DV#WUZDQLD#QDUD*HQLD##4#2#2 / X [min] Data, Dc input / output terminals Obwody transmisji danych zasilania DC level 0,5 / 1 / 2 / 4 / X[kV] Poziom sprawdzenia 0,5 / 1 / 2 / 4 / X [kv] Repetition frequency 2,5 / 5 [khz] &]*VWRWOLZR>ü#SRZWDU]DQLD#2,5 / 5 [khz] Duration per application 1 / 2 / X [min] &]DV#WUZDQLD#QDUD*HQLD##4#2#2 / X [min] CDN Clamp Klamra On the floor 1D#SRGáRG]H 1, 2 [kv] 5 [khz] 1 [min] 1, 2 [kv] 5 [khz] 1 [min] On the table Na stole B The verification of functionality after the test 6SUDZG]HQLH#G]LDáDQLD#SR#EDGDQLDFK After the test no degradation of unit performance nor malfunction / damage was noticed. 3R#EDGDQLDFK#QLH#VWZLHUG]RQR#*DGQHJR#XV]NRG]HQLD/#DQL#ZDGOLZHJR#G]LDáDQLD/#DQL#]PLDQ\#VWDQX#Z#Z\QLNX QDUD*DQLD results sprawdzenia:

9 Dot.: Bibi R32 rev. A Strona / Page 9 Surge immunity test 2GSRUQR>ü#QD#XGDU\ specification EN The test were performed przeprowadzono: Performance criteria:.u\whulxp#su]\m*fld=##a, B, C Sprawdzenie Mains input Phase Phase (L-N) Obwody zasilania Faza Faza (L-N) Phase Ground (L-PE) Faza Ochronny (L-PE) Line +/- Ground Linia +/- Ochronny Coupling 18 [µf] 6SU]**HQLH 18 [µf] Coupling 9 [µf] 10 [Ω] 6SU]**HQLH 9 [µf] 10 [Ω] Coupling 40 [Ω] 6SU]**HQLH#73#>Ω] On the floor 1D#SRGáRG]H / / / level 0,5 / 1 / 2 / 4 [kv] for ( ) coupling Poziom sprawdzenia 0,5 / 1 / 2 / 4#>N9@#GOD#VSU]**HQLD#+Ä. 0Ä0, 1 [kv] level 0,5 / 1 / 2 / 4 [kv] for L PE coupling Poziom sprawdzenia 0,5 / 1 / 2 / 4#>N9@#@#GOD#VSU]**HQLD#/03( [kv] Data input / output terminals and telephone line Coupling 0,5 [µf] 40 [Ω] Obwody transmisji danych / telefoniczne 6SU]**HQLH 0,5 [µf] 40[Ω] level 0,5 / 1 / 2 [kv] Poziom sprawdzenia 0,5 / 1 / 2 [kv] 8GDU\#SRGDZDQR#]JRGQLH#]#( #SRPL*G]\#OLQLD#+HNUDQRZDQD,#±#]LHPLD The verification of functionality after the test 6SUDZG]HQLH#G]LDáDQLD#SR#EDGDQLDFK / 1 [kv] On the table Na stole After the test no degradation of unit performance nor malfunction / damage was noticed. 3R#EDGDQLDFK#QLH#VWZLHUG]RQR#*DGQHJR#XV]NRG]HQLD/#DQL#ZDGOLZHJR#G]LDáDQLD/#DQL#]PLDQ\#VWDQX#Z#Z\QLNX QDUD*DQLD B results sprawdzenia:

10 Dot.: Bibi R32 rev. A Strona / Page 10 specification EN Immunity to conducted disturbances inducted by radio frequency fields 2GSRUQR>ü#QD#]DEXU]HQLD#SU]HZRG]RQH#LQGXNRZDQH#SU]H]#SROD#R F]*VWRWOLZR>FL#UDGLRZHM Performance criteria:.u\whulxp#su]\m*fld=##a, B, C Sprawdzenie Frequency range (150 [khz] 80 [MHz], or 150 [khz] 100 (230) [MHz]) =DNUHV#F]*VWRWOLZR>FL#+483#>N+]@#±#;3#>0+]@#OXE#150 [khz] 100 (230)[MHz]) level 1 / 3 / 10 / X [V] Poziom sprawdzenia 1 / 3 / 10 / X [V] Modulation Modulacja AM 80% 1 [khz] Other Inna Clock frequency &]*VWRWOLZR>FL#]HJDUD The verification of functionality under the test 6SUDZG]HQLH#G]LDáDQLD#L#REVHUZDFMH#SRGF]DV#EDGDQLD Pulse modulation Impulsowa 100% 1 [Hz] [MHz] 10 [V] / / A Under the test no degradation of unit performance nor malfunction / damage was noticed. :#F]DVLH#EDGDQLD#QLH#VWZLHUG]RQR#*DGQHJR#XV]NRG]HQLD/#DQL#ZDGOLZHJR#G]LDáDQLD/#DQL#]PLDQ\#VWDQX#Z#Z\QLNX QDUD*DQLD1 results sprawdzenia:

11 Dot.: Bibi R32 rev. A Strona / Page 11 specification EN Conducted disturbances emission measurement 3RPLDU\#QDSL*FLD#]DEXU]H4 results i pomiarów: + - Lp. Frequency &]*VWRWOLZR>ü Measurements Pomiar: [dbµv] Limit Limit [dbµv/m] Lp. Frequency &]*VWRWOLZR>ü Measurements Pomiar: QP [dbµv] Limit Limit [dbµv] [MHz] QP AV QP AV [MHz] QP AV QP AV , , , , , , ,00 3RGF]DV#SRPLDUyZ#HPLVML#SU]HZRG]RQHM#NRQWUROHU#.45/#PLDá#]DVLODQLH#SRGDQH#]#LQQHJR (UyGáD1 results sprawdzenia:

12 Dot.: Bibi R32 rev. A Strona / Page 12 specification EN Radiated disturbances emission measurement 3RPLDU\#HPLWRZDQ\FK#]DEXU]H4#UDGLRZ\FK results (max for horizontal and vertical polarisation) i pomiarów(max dla polaryzacji poziomej i pionowej):. Lp. Frequency &]*VWRWOLZR>ü [MHz] Measurements Pomiar: Peak [dbµv/m] Measurements Pomiar: QP (CISPR) [dbµv/m] Measurements Pomiar: AV (CISPR) [dbµv/m] Limit Limit [dbµv/m] 1 32,95 7,26 13,13 0,21 30, ,45 9,25 10,18-2,46 30, ,75 8,19 13,33 0,75 30, ,00 12,22 11,13-1,42 30, ,15 11,70 11,86 10,22 30, ,20 19,92 11,41 10,00 30, ,35 7,66 8,52 30,9 30, ,40 13,56 14,72 12,78 30, ,45 13,43 13,44 12,14 30, ,55 10,26 8,96 6,31 30,00 results sprawdzenia:

13 Dot.: Bibi R32 rev. A Strona / Page 13 specification EN Mains voltage fluctuation 2GSRUQR>ü#QD#ZDKDQLD#QDSL*FLD The test were performed przeprowadzono: Sprawdzenie level Poziom sprawdzenia Level Poziom On the floor 1D#SRGáRG]H Performances criteria.u\whulxp#su]\m*fld U max (13,2V) Un+10% A U min (10,20 V) Un-15% A The verification of functionality after the test 6SUDZG]HQLH#G]LDáDQLD#SR#EDGDQLDFK On the table Na stole Under the test no degradation of unit performance nor malfunction / damage was noticed. :#F]DVLH#EDGDQLD#QLH#VWZLHUG]RQR#*DGQHJR#XV]NRG]HQLD/#DQL#ZDGOLZHJR#G]LDáDQLD/#DQL#]PLDQ\#VWDQX#Z#Z\QLNX QDUD*DQLD1 results sprawdzenia:

14 Dot.: Bibi R32 rev. A Strona / Page 14 Used instruments 8*\WH#XU]%G]HQLD. Nr SC equipment 8U]%G]HQLD#badawcze Instruments 8U]%G]HQLH Generator Generator 1,2000 Surge generator Generator udarów 5453 Antenna Antena - Probe Sondy Spectrum Analyser Analizator widma LISN 6LHü#V]WXF]QD Generator Generator Amplifier Wzmacniacz 1014 Amplifier Wzmacniacz Power Meter Miernik mocy CDN 6LHü#VSU]*JDM%FD I/O board Karta Attenuator 6dB 7áXPLN#9G% Directional coupler 6SU]*JDF] Attenuation clamp.odpud#wáxpl%fd Coupling clamp.odpud#vsu]*jdm%fd 2244/90.20 Field meter E Miernik pola E GTEM chamber Manufacturer Producent Model Typ BEST PUT SIGMA GU 10/700-4 UPA6190B HAMEG HZ 530 Advantest ROHDE&SCHWARZ ROHDE&SCHWARZ ROHDE&SCHWARZ R3130 ESH3-Z5 SML1 CBA9413B CBA9425 NRVS CDN M016 I/O KARTA ATN6075 DCP0100 KEMA801 KEMZ801 EMC-20 GTEM LT 950 Komora GTEM 336 EMI receiver SCR 3502 Odbiornik selektywny 58 Autotransformator WIELKOPOLANKA TaR-2.5 DM Power Quality analyser $QDOL]DWRU#MDNR>FL#HQHUJLL 2A0397 IR probe Sonda IR Spring hammer 0áRWHN#XGDURZ\ Generator DC Generator DC 1905 CDN 6LHü#VSU]*JDM%FD CDN 6LHü#VSU]*JDM%FD CDN 6LHü#VSU]*JDM%FD FLUKE FLUKE FLUKE 43B FLUKE 43B PTL Dr. Grabenhorst F SPS Electronic I3304 CDN/ISN CDN 118 CDN 117

15 Dot.: Bibi R32 rev. A Strona / Page 15 Photo. 1 The tested devices under ESD test =GM*FLH#QU#4#%DGDQH#XU]%G]HQLH#SRGF]DV#EDGD4#(6'