USB 3.0 Overview and Physical Layer testing requirements
|
|
|
- Avis Lloyd
- 9 years ago
- Views:
Transcription
1 USB 3.0 Overview and Physical Layer testing requirements Industry update and Testing Challenges Update Jim Choate Agilent Technologies Page 1
2 Agenda Introduction Agilent Digital Standards USBIF Compliance Program Status USB Specification Updates Physical Layer Testing ECN changes to Physical Layer Testing Physical Layer Compliance Test Pitfalls Precision Probe and Cable Summary Questions 2 Page 2
3 Agilent Digital Standards Program Our solutions are driven and supported by Agilent experts involved in international standards committees: Joint Electronic Devices Engineering Council (JEDEC) PCI Special Interest Group (PCI-SIG ) Video Electronics Standards Association (VESA) Serial ATA International Organization (SATA-IO) USB-Implementers Forum (USB-IF) Mobile Industry Processor Interface (MIPI) Alliance And many others We re active in standards meetings, workshops, plugfests, and seminars. We get involved so you benefit with the right solutions when you need them SuperSpeed USB Page 3
4 We understand your future requirements, because we help shape them Rick Eads PCI-Sig Board Member Brian Fetz DisplayPort Phy CTS Editor VESA Board Member Jim Choate USB-IF Compliance Committee USB 3.0 Electrical Test Spec WG Min-Jie Chong SATA 6G / PHY / LOGO Contributor SATA-IO Gold Suite Lead Perry Keller JEDEC Board Member The Agilent Infiniium Scopes team maintains engagement in the top high tech standards organizations
5 USB Implementers Forum, inc (USB-IF) owner responsible USBIF Board Members Intel, NEC, HP, Microsoft, ST-Ericsson, LSI Marketing WG OTG WG Device WG CabCon WG Compliance Review Board Compliance Committee Test Spec WG influences USB Test Specs Agilent Active Membership owner USB2/USB 3 Tools and Test Procedures influences Training and equipment Test House Approval Interop. Workshop Testing 5
6 Worldwide Shipment of USB-enabled Devices USB is the most successful interface in the history of PC Device charging over USB has become a major consumer feature USB installed base is 10+ billion units and growing at 3+ billion units a year Adoption is virtually 100% in PC and peripheral categories Units in Thousands USB-enabled Device Shipments and Forecast: ,000,000 4,500,000 77M 436M 902M 4,000,000 3,500,000 3,000,000 2,500,000 2,000,000 1,500,000 1,000, , USB Low or Full Speed USB High Speed USB SuperSpeed Source: In-Stat, May
7 USB-IF Specification updates and additions HSIC a low power USB chip to chip solution designed for mobile applications SSIC USB 3.0 performance extension for chip to chip solution designed for mobile applications (download with USB 3.0 spec). Uses M-PHY for physical layer. USB 3.0 SuperSpeed above Link Layer USB Power Delivery Spec an expansion of USB power delivery to allow more flexible power delivery up to 100W. Power direction is no longer fixed. All USB-IF specifications are available at
8 Key Features of the USB Power Delivery Spec 8
9 10Gbps SuperSpeed overview Specification near version 0.7. Industry review scheduled for Feb 7 th, 2013 Key characteristics of the higher-rate SuperSpeed USB solution include: 10 Gbps USB data rate Compatibility with existing cables and connectors 128b/130b (TBD) data encoding for more efficient data transfer leading to higher throughput and improved I/O power efficiency Compatible with existing USB 3.0 software stacks and device class protocols Compatible with both existing 5 Gbps and new 10 Gbps USB 3.0 hubs and devices, as well as USB 2.0 products
10 10Gbps SuperSpeed considerations Re-driver design considerations must be designed with re-drivers accounted for in specification budgets. Speed negotiation handshake Channel definitions. 10Gbps SuperSpeed USB Industry Review Conference register by Feb 1 st. Conference will review rev 0.7 draft specification Go to For updates and information. 10
11 USBIF USB 3.0 Certification Test Requirements Electrical Test Equipment and USBIF test software Protocol Test Equipment and USBIF test software 11
12 What does USB Certification mean (Access for USBIF Members Only) Products listed on the Integrators list (member optional) Certification also allows member company to use the official USBIF logo(s) on their product and marketing materials. Tests run at USB-IF Compliance Test Workshop Testing with approved Independent Test Labs Testing at USB-IF Platform Interoperability Lab (PIL only for hosts/hubs) 12
13 Agilent USB Workshop Testing solutions USB 3.0 Electrical Gold Suite Protocol Testing Tx Testing DSA91304A/X Oscilloscopes RX Testing N4903B J-BERT N4916A/B D-box Test and debug Interop issues, Backward compatibility, software and firmware USB 2.0 Electrical Gold Suite Tx Testing DSA9254A RX Testing 81134A or 81130A ENA TDR Cable Testing ENA 5071C with option TDR Informational Cable Testing Connector Testing Device, hub and host testing 13 Page 13
14 USB2.0 Basics General Universal Serial Bus (USB) 2.0: All USB specifications are owned by the USB-IF (Implementers Forum, Inc.) USB2.0 is an EXTENSION of USB1.1 USB-IF states USB2.0 is the CURRENT ver. of the USB. USB1.1 is available for historical reference only. USB 2.0 Has 3 Transfer Speeds Low Speed (LS) = 1.5Mbps Full Speed (FS) = 12Mbps Hi-Speed (HS) = 480Mbps USB 3.0 Has 1 Transfer Speed Superspeed (SS) = 5Gbps USB2.0 HS USB1.1 LS/FS USB 3.0 5G SS 10G SS+ 14
15 USB2.0 Basics - Architecture USB Architecture Down stream Host / System Hub Up stream Differential Signal Max USB cable length of 5m Up to 5 Hubs Data from PC to the device is called Downstream Data from device to PC is called Upstream 15 Devices USB Cable + Shield D+ VBUS D- Ground
16 USB2.0 Basics - Signal Rates & Levels Low Speed Full Speed Hi-Speed Sig Rate 1.5Mbps 12Mbps 480Mbps Sig Level 3.3V 3.3V 400mV Rise and Fall Times 75ns < Tr <300ns 4ns < Tr < 20ns Tr > 500ps* *High Speed USB edge rate compliance measurement method and pass/fail criteria have been changed. This will be explained in the compliance requirements section.
17 Host test requirements 17
18 Which Host Eye is Correct? 18
19 New USBIF Required USB2 SQ Test Fixtures Note: USBIF fixture does not have switching relay + Gives host SQ more margin - Cannot make any other meaurements with this fixture - Embedded hosts need to enumerate VID/PID EH compliance fixture to go into test packet mode 19
20 What is different for USB 3.0 USB 2.0 High Speed 480Mbps NRZI, Half Duplex 4 signals Dp, Dm, VCC, GND Cable Lmax= 5meter I configlp/fp = 100mA/500mA I suspend = 2.5mA No SSC TX SQ at Near End No Host RX testing USB 3.0 SuperSpeed 5 Gbps 8B/10B PRBS, Full Simplex 8 signals 4 USB2, 4 SS Signals Cable L max = 3 meters I configlp/fp = 150mA/900mA I suspend = 2.5mA SSC TX at End of Channel (Far end) RX Jitter tolerance TX Half Duplex TX RX Full Simplex TX RX RX TX RX 20
21 Biggest Challenges for USB 3.0 Testing Receiver testing Getting DUTs into loopback Margins are tight EMI interference issues have been reported with WiFi. ECNs 21
22 U7243A USB 3.0 TX Compliance Application Agilent s U7243A TX compliance test application TX tests: LFPS (Near end) SSC (Near end) TX (Far End: TP1) Eye Pattern Tj, Rj, Dj Amplitude Embedded channel automatically tested using Agilent U7243A compliance software 22
23 Transmitter test requirements (TX Far End) 23
24 Tx testing emulated through s-parameters Embed Channel File DEVICE_3MCABLE.s4p Validation with InfiniiSim of DSA91304A 24
25 TX Testing Requirements: Polling.LFPS to compliance mode PING LFPS Toggles CMM CP0 Dj CP1 Rj 25
26 Toggling USB 3.0 TX test modes Connect Aux Out to DUT SSRX+ to toggle test modes 26
27 Transmitter testing uses embedded compliance channel 27
28 Compliance Channels Compliance Channels are used to test TX and RX for worst case channel conditions Back panel USB route solution Channel loss will dominate Host 11 of trace Device 5 of trace 3 meter USB 3.0 cable Short Channel Compliance Channel will be Part of compliance requirements later this year. Short Channel = no cable and short PCB traces 28
29 SuperSpeed Host Receiver Test Calibration and compliance channel Device 5 of trace 3 meter USB 3.0 cable Host Channel setup
30 SuperSpeed Device Receiver Test Calibration and compliance channel Host 11 of trace 3 meter USB 3.0 cable Device Channel setup
31 New channel definitions being defined Compliance Channels used need to change for products that use micro connectors/cables. Device and host channel portion stays the same Micro spec only allows 2 meter USB 3.0 cable today Micro spec ECN is reducing that to 1 meter maximum in ECN under review. 31
32 Fixtures and cables available from the USBIF at:
33 New build of USB-IF Fixture kit now available Old Fixture New Fixture New fixtures include improved SMA connectors 33
34 USB 3.0 SuperSpeed Receiver Test Setup for Devices with J-BERT B SER Counter Connect the equipment as shown below - Use DC blocking capacitors in the connection from the J-BERT/De-Box output to the test fixture input - For host testing: Additional cabling and a BIAS tee are required - All necessary connections are displayed in the N5990A software, too N4903B Device Test Fixture 1 USB N4916B Device Test 11742A Fixture 2 Blocking Caps 11 use upper Port 3m USB3 cable 5V DUT Short USB3 cable
35 USB 3 Loopback Training
36 USB 3 Loopback Training
37 Typical SuperSpeed Link Turn-on Sequence
38 USB 3 Reciever Test Automation using N5990A automation sw
39 SuperSpeed Receiver Tests Rx Compliance and Jitter Tolerance Testing
40 SuperSpeed Receiver Test Calibration and compliance channels
41 Engineering Change Notices (ECNs) 41
42 ECN 009 USB 3 (Standard-B Connector Near End Crosstalk) If a Standard-B or Powered-B connector fails to meet the -32 db requirement in frequency domain shown in Figure 5-24 (b), but is able to meet the -27dB requirement shown in Figure 5-24(a), the measurement of DDNEXT in time domain will be required. 42
43 ECN 009 USB 3 (Standard-B Connector Near End Crosstalk) Measurement of DDNEXT Measurement of DDNEXT in time domain. 43
44 What is the Short Channel Definition & Why? USB 3.0 Flash drives are the best example where short channels are the norm For discrete hosts the xhci controllers are frequently place very near the USB 3.0 connectors with very short PCB traces In this use case the loss of the channel is very small and it is critical that RX equalizers have sufficient dynamic range to operate in a low loss channel environment 44
45 USB3.0 Reference Equalizer ECN Current testing reference equalizer is for a long channel 3m cable plus long host PCB trace (~18-20dB differential insertion loss). proper equalizer behavior is critical for interoperability in a short channel (no cable and short host PCB, ~3-5dB differential insertion loss) ECN defines a second reference equalizer transfer function that is optimized for the short channel 45
46 Physical Layer Compliance Pitfalls Transmitter SSC quality Loopback issues Dut needs custom sequence DUT drops out easily Calibration issues Inconsistent Poor Sj/Rj mod Automation of Cal Failing de-emphasis Great impact on TJ and Eye Jitter tolerance failures 10Mhz, 20Mhz, 33Mhz Compliant SJ Poor/wrong SJ Compliant SSC Profile Intentional SSC Stress Non-deterministic noisy SSC Compliant De-emphasis Non-compliant Overshoot 46
47 PrecisionProbe and Cable (N2809A) Characterize and correct any input path to your oscilloscope input using only your oscilloscope
48 The Importance of a Flat Frequency Response Why do we care about a flat frequency response? - The flatter the response the more accurately the scope will depict the signal - Measurements become more repeatable - ISI modeled closer to the reality Frequency response of the X-Series 48
49 Eye margin improvement using precision cable 23.8% Increase in eye height 49
50 The Solution: PrecisionProbe PrecisionProbe Quickly and Easily: - Characterizes and corrects the frequency response (Vout/Vin) of phase of any probe and probe head combination - Characterizes and corrects for insertion loss caused by cables and fixtures - Characterizes and corrects for insertion loss caused by switches for probes and cables. - For a typical 10-12Ghz cable USB3 eye margin can improve 10-20mV 50
51 USB 3.0 Protocol Decode: on the scope 51
52 NEW: Agilent N8900A InfiniiView Oscilloscope Analysis Software View, analyze, share and document from your PC Free up your scope to actually make measurements Operates just like the scope Undock to better view result windows with multiple monitors 52
53 Agilent High Speed Inter-Chip test solutions HSIC is a supplement to the USB 2.0 specification developed primarily by chip vendors to provide simpler and lower power interface between a USB host and device Specification is included with USB 2.0 specification located here: Agilent U7248A HSIC compliance test software Used in conjunction with Agilent s U5464A/B USB protocol triggering and decode software, developers have a complete set of tools to validate/debug HSIC solutions. 53
54 SW USB 3.0 Total Solution Transmitter Test N8805A USB3.0 Protocol decode & triggering SW U7243A USB Compliance Test Software Interconnect Test Receiver Test N5990A Automatic SW for USB compliance Protocol Test (link/transaction layers) U4612A Jammer HW DSOX90000A Infiniium real time scope or DSO91304A Infiniium real time scope E5071C Option TDR ENA Network Analyzer N4903B J-BERT High-Perf Serial BERT with U4611A/B USB 3\2\1.1 Analyzer Signal Conditioning De-emph N4916A or N4916B or N4903B-002 U7242A Test Fixture Fixture DUT U7242A USB 3.0 Test Fixture Tx Bit-USB- CBL-0001 from BitifEye Cable USB3ET from USB-IF Tx Rx Tx Rx Tx Rx 54
55 Conquering USB 3.0 Physical Layer Test Challenges USB 3.0 Protocol Development Don Schoenecker Agilent Technologies
56 Agenda Analyzing USB 2.0 and 3.0 MS Traffic Communication layers (power management) LTSSM Link Management Transaction layer Active Testing Questions 56
57 Capturing USB data traffic Simultaneous 2.0 and 3.0 traffic Ethernet or PCIe control USB / 12 / 480 Mbps Single HDX differential link Polling Token, Data, Handshake USB Gbps 2 unidirectional links Device notification Data, Handshake USB test DUT USB 2.0/3.0 host ports 57
58 Capturing USB 3.0 and 2.0 Simultaneously Transaction View Data capture of 2.0 and 3.0 mass store operations USB protocol transactions are very different Transaction are the same 58
59 SuperSpeed Bus Communications Layers and Power Management Elements
60 Timing events for link states
61 8b/10b Decode and display
62 LTSSM
63 Example Trace - POLLING.LFPS X O = 952ns tburst time for Polling.LFPS
64 Example Trace U1 Entry/Exit U2 Inactivity Timer is set to 256us. So Link silently entered into U2 after spending 256us in U1. X-O = ~392us total time in Elec Idle
65 Synchronizing the USB analysis traces from Protocol to Electrical Diagnostic requires synchronization of protocol events to a physical trace on an Oscilloscope Uses a physical connection between the two pieces of equipment SMA cable going from the trigger out on the Agilent USB analyzer to the trigger in on the Agilent scope. The scope should be setup to trigger on an high to low alternating signal. Trig IN / Trig OUT for use with other Agilent equipment 65
66 Active Testing Test environment Control Three Methods Golden Device Generator Active Insertion - Jammer Command A Command B What are the benefits of Active Insertion Testing? (Jammer) Common Use operation - Error Injection Scenario Testing Protocol problem Problem replication SCSI command modification 66
67 Agilent U4612A USB 3.0 Jammer Quickly and easily create test scripts to simulate real error conditions. Programmatic control of error conditions. Can be used to create a variety of errors PHY errors (Disparity, 8b/10b, align) CRC-5/16/32 errors Corrupted ordered sets, LMPs, etc. LGOOD_n / LCRD_a out of order Link connect / disconnect Power up / down (bus powered devices only) Missing or corrupt frames BOT (Bulk Only Transport) or UAS (USB Attached SCSI) Sense IU / Response IU errors Standalone unit (does not require U4611A/B analyzer)
68 Simple test Verifying Proper handling of errors Physical tests USB DUT 10b errors Command B Testing of Protocol Operations Invalid Link commands (Link command words are not equal) Command is ignored Send two LMP packets with Header Sequence Numbers that are not sequential Link goes into recovery Agilent U4611A USB 2.0/3.0 Analyzer Agilent U4612A USB 3.0 Jammer Wrong LCRD_X Sequence Test Link Recovery Command A USB Host Golden Device
69 Jammer Example tests Physical Layer stress testing - Insert 8b/10b error in data packet - 10b code error in packet framing Link Command testing - Incorrect buffer sequence numbering - Link command response timeout Application Level testing - Force bypass of disk cache with SCSI command (FUA bit set) - Insert bad data block in disk write 69
70 SW USB 3.0 Total Solution Transmitter Test N8805A USB3.0 Protocol decode & triggering SW U7243A USB Compliance Test Software Interconnect Test Receiver Test N5990A Automatic SW for USB compliance Protocol Test (link/transaction layers) U4612A Jammer HW DSOX90000A Infiniium real time scope or DSO91304A Infiniium real time scope E5071C Option TDR ENA Network Analyzer N4903B J-BERT High-Perf Serial BERT with U4611A/B USB 3\2\1.1 Analyzer Signal Conditioning De-emph N4916A or N4916B or N4903B-002 U7242A Test Fixture Fixture DUT U7242A USB 3.0 Test Fixture Tx Bit-USB- CBL-0001 from BitifEye Cable USB3ET from USB-IF Tx Rx Tx Rx Tx Rx 70
71 2012 was the breakout year of USB 3.0! In 2012, 8 companies had certified USB 3.0 host controllers, a prerequisite to USB 3.0 connectivity AMD ASMedia Etron Fresco Logic Intel Renesas TI VIA Labs Intel launched Ivy Bridge which includes support for USB 3.0, in New Panther Point chipset designed for Ivy Bridge adds native USB 3.0 support Microsoft Windows 8 supports USB
72 Things to Remember if you forget all else Microsoft Windows 8 includes native support for USB 3.0 hosts, hubs and devices Agilent s USB 3.0 TX and RX test solutions are the worldwide market leader for USB 3.0 product development and validation USB 3.0 Receiver testing is the most challenging part of PHY layer testing Agilent provides the industries highest performance USB protocol analyzer and jammer Agilent USB solutions adopted by test labs world wide Confidence in our solution comes from our leadership and participation in standards bodies as well as our deep technical expertise Agilent has the tools and expertise to help you conquer USB 3.0 Physical Layer Test Challenges 72
73 Additional Links and References *All trademarks are the properties of their respective holders. Agilent Oscilloscope information (TX testing solutions) Agilent Oscilloscope application software Agilent N4903B Jbert (Rx testing solutions) Agilent N8900A InfiniiView Oscilloscope Analysis Software Agilent N2809A PrecisionProbe oscilloscope probing software 73
Electrical Compliance Test Specification SuperSpeed Universal Serial Bus
Electrical Compliance Test Specification SuperSpeed Universal Serial Bus Date: September 14, 2009 Revision: 0.9 Preface 6/3/2009 Scope of this Revision The 0.7 revision of the specification describes the
High-Definition Multimedia Interface (HDMI) Source/Sink Impedance Compliance Test Test Solution Overview Using the E5071C ENA Option TDR
High-Definition Multimedia Interface (HDMI) Source/Sink Impedance Compliance Test Using the E5071C ENA Option TDR Keysight Technologies Component Test Division Revision 01.10 2015/03/12 (YS) Reference
Electrical Compliance Test Specification SuperSpeed Universal Serial Bus
Electrical Compliance Test Specification SuperSpeed Universal Serial Bus Date: March 10, 2015 Revision: 1.0a SuperSpeed Electrical Compliance i Copyright 2015, USB Implementers Forum, Inc. All rights reserved.
Successfully negotiating the PCI EXPRESS 2.0 Super Highway Towards Full Compliance
Successfully negotiating the PCI EXPRESS 2.0 Super Highway Towards Full Compliance Page 1 Agenda Introduction PCIe 2.0 changes from 1.0a/1.1 Spec 5GT/s Challenges Error Correction Techniques Test tool
SuperSpeed USB Host: Jeff Ravencraft, USB-IF president and chairman
SuperSpeed USB Host: Jeff Ravencraft, USB-IF president and chairman Agenda Introduction & technology overview Jeff Ravencraft Microsoft Corporation Fred Bhesania NEC Electronics Corporation Yoshiyuki Tomoda
PCI-SIG ENGINEERING CHANGE NOTICE
PCI-SIG ENGINEERING CHANGE NOTICE TITLE: Separate Refclk Independent SSC Architecture (SRIS) DATE: Updated 10 January 013 AFFECTED DOCUMENT: PCI Express Base Spec. Rev. 3.0 SPONSOR: Intel, HP, AMD Part
Explore Efficient Test Approaches for PCIe at 16GT/s Kalev Sepp Principal Engineer Tektronix, Inc
Explore Efficient Test Approaches for PCIe at 16GT/s Kalev Sepp Principal Engineer Tektronix, Inc Copyright 2015, PCI-SIG, All Rights Reserved 1 Disclaimer Presentation Disclaimer: All opinions, judgments,
Perry Keller. Mobile Forum 2013
UFS Characterization and Compliance Testing Perry Keller Compliance and Enablement Chairman UFS Assn. Board of Directors Digital Applications and Standards Lead Agilent Technologies Mobile Forum 2013 3
Embedded Host High Speed Electrical Test Procedure
Embedded Host High Speed Electrical Test Procedure Revision 0.99 January 2014 1 P a g e Table of content 1. Reference... 3 2. Background... 3 3. Test Mode Support... 4 3.1 Setup... 4 3.2 USB High Speed
USB 3.1 Channel Loss Budgets
USB 3.1 Channel Loss Budgets Page 1 1 Introduction 1.1 Background This document describes the loss budgets for USB 3.1 interconnect channels. As the basis for the electrical compliance channels, loss budgets
Appendix A. by Gordon Getty, Agilent Technologies
Appendix A Test, Debug and Verification of PCI Express Designs by Gordon Getty, Agilent Technologies Scope The need for greater I/O bandwidth in the computer industry has caused designers to shift from
SuperSpeed USB Update
SuperSpeed USB Update Mobile World Congress 2014 Brad Saunders, USB-IF Chairman of the Board Agenda SuperSpeed USB Key Messages USB New Developments Overview SuperSpeed USB Inter-Chip Summary USB Implementers
Pericom PCI Express 1.0 & PCI Express 2.0 Advanced Clock Solutions
Pericom PCI Express 1.0 & PCI Express 2.0 Advanced Clock Solutions PCI Express Bus In Today s Market PCI Express, or PCIe, is a relatively new serial pointto-point bus in PCs. It was introduced as an AGP
Agilent Technologies N5393B PCI Express 2.0 (Gen2) Electrical Performance Validation and Compliance Software for Infiniium Oscilloscopes
Agilent Technologies N5393B PCI Express 2.0 (Gen2) Electrical Performance Validation and Compliance Software for Infiniium Oscilloscopes Data Sheet Table of Contents Features......................... 3
Jitter in PCIe application on embedded boards with PLL Zero delay Clock buffer
Jitter in PCIe application on embedded boards with PLL Zero delay Clock buffer Hermann Ruckerbauer EKH - EyeKnowHow 94469 Deggendorf, Germany [email protected] Agenda 1) PCI-Express Clocking
The easy way! Mark Maszak. Jane Lawrence Program Manager Microsoft. Microsoft
Windows Logo for USB The easy way! Jane Lawrence Program Manager Microsoft Mark Maszak Test Engineer Microsoft Agenda WLK & USB 3.0 Requirements Overview Design Guidelines System: Companion controllers
U7248A High Speed Inter-Chip (HSIC) Electrical Test Software Infiniium Oscilloscopes
U7248A High Speed Inter-Chip (HSIC) Electrical Test Software Infiniium Oscilloscopes Data Sheet This application is available in the following license variations Order N7248A for user-installed license
Eye Doctor II Advanced Signal Integrity Tools
Eye Doctor II Advanced Signal Integrity Tools EYE DOCTOR II ADVANCED SIGNAL INTEGRITY TOOLS Key Features Eye Doctor II provides the channel emulation and de-embedding tools Adds precision to signal integrity
Universal Serial Bus Implementers Forum EHCI and xhci High-speed Electrical Test Tool Setup Instruction
Universal Serial Bus Implementers Forum EHCI and xhci High-speed Electrical Test Tool Setup Instruction Revision 0.41 December 9, 2011 1 Revision History Rev Date Author(s) Comments 0.1 June 7, 2010 Martin
UMBC. ISA is the oldest of all these and today s computers still have a ISA bus interface. in form of an ISA slot (connection) on the main board.
Bus Interfaces Different types of buses: ISA (Industry Standard Architecture) EISA (Extended ISA) VESA (Video Electronics Standards Association, VL Bus) PCI (Periheral Component Interconnect) USB (Universal
High-Speed Electrical Testing - Host
High-Speed Electrical Testing - Host Universal Serial Bus Measurement Package www.tektronix.com 2015-05-05 REVISION RECORD SHEET Versio Completion Initiator Page n Date s 1.0 7-16-2014 S. Harrison 35 First
Welcome to Pericom s PCIe and USB3 ReDriver/Repeater Product Training Module.
Welcome to Pericom s PCIe and USB3 ReDriver/Repeater Product Training Module. 1 Pericom has been a leader in providing Signal Integrity Solutions since 2005, with over 60 million units shipped Platforms
Universal Flash Storage: Mobilize Your Data
White Paper Universal Flash Storage: Mobilize Your Data Executive Summary The explosive growth in portable devices over the past decade continues to challenge manufacturers wishing to add memory to their
Selecting the Optimum PCI Express Clock Source
Selecting the Optimum PCI Express Clock Source PCI Express () is a serial point-to-point interconnect standard developed by the Component Interconnect Special Interest Group (PCI-SIG). lthough originally
USBSQ USB 2.0 Signal Quality Analysis Application. Electrical Testing Notes
USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes Notices Keysight Technologies, Inc. 2003-2016 No part of this manual may be reproduced in any form or by any means (including
Introduction to USB 3.0
By Donovan (Don) Anderson, Vice President, MindShare, Inc. This paper is a brief review of the USB 3.0 implementation, focusing on USB 2.0 backward compatibility and on the major features associated with
PHY Interface For the PCI Express, SATA, and USB 3.0 Architectures Version 4.0
PHY Interface For the PCI Express, SATA, and USB 3.0 Architectures Version 4.0 2007-2011 Intel Corporation All rights reserved. Intellectual Property Disclaimer THIS SPECIFICATION IS PROVIDED AS IS WITH
Field Calibration Software
SIGNAL HOUND Field Calibration Software User s Manual Version 1.1.0 7/8/2016 This information is being released into the public domain in accordance with the Export Administration Regulations 15 CFR 734
PCI Express Transmitter Electrical Validation and Compliance Testing with Agilent Infiniium Oscilloscopes
PCI Express Transmitter Electrical Validation and Compliance Testing with Agilent Infiniium Oscilloscopes Application Note 1496 Who should read this application note? This application note is intended
Revision 1.10 April 7, 2015 Method of Implementation (MOI) for 100BASE-TX Ethernet Cable Tests Using Keysight E5071C ENA Option TDR
Revision 1.10 April 7, 2015 Method of Implementation (MOI) for 100BASE-TX Ethernet Cable Tests Using Keysight E5071C ENA Option TDR 1 Table of Contents 1. Revision History... 3 2. Purpose... 3 3. References...
81110A Pulse Pattern Generator Simulating Distorted Signals for Tolerance Testing
81110A Pulse Pattern Generator Simulating Distorted Signals for Tolerance Testing Application Note Introduction Industry sectors including computer and components, aerospace defense and education all require
Application Note. PCIEC-85 PCI Express Jumper. High Speed Designs in PCI Express Applications Generation 3-8.0 GT/s
PCIEC-85 PCI Express Jumper High Speed Designs in PCI Express Applications Generation 3-8.0 GT/s Copyrights and Trademarks Copyright 2015, Inc. COPYRIGHTS, TRADEMARKS, and PATENTS Final Inch is a trademark
User Guide 980 HDMI Protocol Analyzer
User Guide 980 HDMI Protocol Analyzer Gen 3 System Rev: C6 Page 1 February 7, 2013 Table of Contents 1 About the 980 HDMI Protocol Analyzer 5 1.1 What makes the 980 HDMI Protocol Analyzer Unique? 5 1.2
USB 3.0 Hub + Gigabit Ethernet. Docking Station
USB 3.0 Hub + Gigabit Ethernet Docking Station User Manual Ver. 1.00 All brand names and trademarks are properties of their respective owners. Contents: Chapter 1: Introduction... 3 1.1 Product Introduction...
Computer buses and interfaces
FYS3240 PC-based instrumentation and microcontrollers Computer buses and interfaces Spring 2011 Lecture #5 Bekkeng 15.1.2011 The most common data acquisition buses available today Internal computer buses
USB 3.0 4-Port PCI Express Card
USB 3.0 4-Port PCI Express Card User Manual Ver. 2.00 All brand names and trademarks are properties of their respective owners. Contents: Chapter 1: Introduction... 3 1.1 Product Introduction... 3 1.2
PCI Express Basics Ravi Budruk Senior Staff Engineer and Partner MindShare, Inc.
PCI Express Basics Ravi Budruk Senior Staff Engineer and Partner MindShare, Inc. Copyright 2007, PCI-SIG, All Rights Reserved 1 PCI Express Introduction PCI Express architecture is a high performance,
PCI Express IO Virtualization Overview
Ron Emerick, Oracle Corporation Author: Ron Emerick, Oracle Corporation SNIA Legal Notice The material contained in this tutorial is copyrighted by the SNIA unless otherwise noted. Member companies and
High-Speed SERDES Interfaces In High Value FPGAs
High-Speed SERDES Interfaces In High Value FPGAs February 2009 Lattice Semiconductor 5555 Northeast Moore Ct. Hillsboro, Oregon 97124 USA Telephone: (503) 268-8000 www.latticesemi.com 1 High-Speed SERDES
SuperSpeed USB 3.0: Ubiquitous Interconnect for Next Generation Consumer Applications
Arasan Chip Systems Inc. White Paper SuperSpeed USB 3.0: Ubiquitous Interconnect for Next Generation Consumer Applications By Somnath Viswanath Product Marketing Manager June, 2009 Overview The Universal
PCI Express Protocol Solutions
PCI Express Protocol Solutions for Testing and Compliance Summit T3-16 Analyzer Summit Z3-16 Exerciser SummitT3 T3-8 8Analyzer Summit T28 Analyzer Protocol Test Card Teledyne LeCroy, a worldwide leader
ZigBee Technology Overview
ZigBee Technology Overview Presented by Silicon Laboratories Shaoxian Luo 1 EM351 & EM357 introduction EM358x Family introduction 2 EM351 & EM357 3 Ember ZigBee Platform Complete, ready for certification
USB-IF Product Order Form
USB-IF Product Order Form Please use the following information to select the test hardware from the USB-IF estore. Low-speed Functional Compliance Test Device The LS Functional Compliance Test Device is
PCI Express: The Evolution to 8.0 GT/s. Navraj Nandra, Director of Marketing Mixed-Signal and Analog IP, Synopsys
PCI Express: The Evolution to 8.0 GT/s Navraj Nandra, Director of Marketing Mixed-Signal and Analog IP, Synopsys PCIe Enterprise Computing Market Transition From Gen2 to Gen3 Total PCIe instances. 2009
Ethernet. Ethernet Frame Structure. Ethernet Frame Structure (more) Ethernet: uses CSMA/CD
Ethernet dominant LAN technology: cheap -- $20 for 100Mbs! first widely used LAN technology Simpler, cheaper than token rings and ATM Kept up with speed race: 10, 100, 1000 Mbps Metcalfe s Etheret sketch
USB 3.0 INTERNAL CONNECTOR AND CABLE SPECIFICATION
USB 3.0 INTERNAL CONNECTOR AND CABLE SPECIFICATION Revision 1.0 August 20, 2010 2007-2010 Intel Corporation All rights reserved. Legal Disclaimers THIS SPECIFICATION IS PROVIDED AS IS WITH NO WARRANTIES
Intel architecture. Platform Basics. White Paper Todd Langley Systems Engineer/ Architect Intel Corporation. September 2010
White Paper Todd Langley Systems Engineer/ Architect Intel Corporation Intel architecture Platform Basics September 2010 324377 Executive Summary Creating an Intel architecture design encompasses some
USER GUIDE EDBG. Description
USER GUIDE EDBG Description The Atmel Embedded Debugger (EDBG) is an onboard debugger for integration into development kits with Atmel MCUs. In addition to programming and debugging support through Atmel
DDR Memory Overview, Development Cycle, and Challenges
DDR Memory Overview, Development Cycle, and Challenges Tutorial DDR Overview Memory is everywhere not just in servers, workstations and desktops, but also embedded in consumer electronics, automobiles
Example: Multiple OFDM Downstream Channels and Examining Backwards Compatibility. Mark Laubach, Avi Kliger Broadcom
Example: Multiple OFDM Downstream Channels and Examining Backwards Compatibility Mark Laubach, Avi Kliger Broadcom 1 Big Fat Downstream Pipe MULTIPLE DOWNSTREAM OFDM CHANNELS 2 Intent of this Presentation
USB 3.0 to SATA 3.5" Enclosure Installation Guide
USB 3.0 to SATA 3.5" Enclosure Installation Guide Introduction The USB 3.0 to SATA 3.5" Enclosure is designed to support USB equipped computers. This enclosure provides large capacity mobile storage using
Agilent Technologies N5990A Test Automation Software Platform. Getting Started Guide
Agilent Technologies N5990A Test Automation Software Platform Getting Started Guide Notices Agilent Technologies, Inc. 2008 No part of this manual may be reproduced in any form or by any means (including
USB 3.1 Type-C and USB PD connectors
USB 3.1 Type-C and USB PD connectors Presentation Introduction Purpose USB Type-C connectors Supplement to the USB 3.1 and Power Delivery specification Define USB 3.1Type-C receptacle, plug and cable assembly
AN4494 Application note
Application note Bringing up the BlueNRG and BlueNRG-MS devices Introduction The BlueNRG, BlueNRG-MS devices are high performance, ultra-low power wireless network processors which support, respectively,
Keysight Technologies Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-Performance Serial BERT.
Keysight Technologies Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-Performance Serial BERT Application Note Introduction J-BERT N4903B highperformance serial BERT with
IEEE p1394c: 1394 with 1000BASE-T PHY Technology. Kevin Brown [email protected]
IEEE p1394c: 1394 with 1000BASE-T PHY Technology Kevin Brown [email protected] IEEE Working Group 1394c Charter Bob Davis, Chair of the Microcomputer Standards Committee of the IEEE approved the formation
Agilent MATLAB Data Analysis Software Packages for Agilent Oscilloscopes
Agilent MATLAB Data Analysis Software Packages for Agilent Oscilloscopes Data Sheet Enhance your InfiniiVision or Infiniium oscilloscope with the analysis power of MATLAB software Develop custom analysis
Atmel AVR1017: XMEGA - USB Hardware Design Recommendations. 8-bit Atmel Microcontrollers. Application Note. Features.
Atmel AVR1017: XMEGA - USB Hardware Design Recommendations Features USB 2.0 compliance - Signal integrity - Power consumption - Back driver voltage - Inrush current EMC/EMI considerations Layout considerations
Keysight E2688A, N5384A High-Speed Serial Data Analysis and Clock Recovery Software
Keysight E2688A, N5384A High-Speed Serial Data Analysis and Clock Recovery Software For Infiniium Oscilloscopes Data Sheet 02 Keysight E2688A, N5384A High-Speed Serial Data Analysis and Clock Recovery
Managing Connector and Cable Assembly Performance for USB SuperSpeed
Whitepaper Managing Connector and Cable Assembly Performance for USB SuperSpeed Revision 1.0 February 1, 2013 Abstract USB 3.0 connector and cable assembly performance can have a significant impact on
How to build a high speed PCI Express bus expansion system using the Max Express product family 1
Applications The Anatomy of Max Express Cable Expansion How to build a high speed PCI Express bus expansion system using the Max Express product family 1 By: Jim Ison Product Marketing Manager One Stop
SuperSpeed USB Developers Conference. San Jose, California November 17-18, 2008
SuperSpeed USB Developers Conference San Jose, California November 17-18, 2008 SuperSpeed USB Keynote Jeff Ravencraft USB-IF - President & Chairman USB 3.0 Promoter Group - Chairman INFINITE POSSIBILITIES!
SuperSpeed USB 7-Port Hub Quick Installation Guide
SuperSpeed USB 7-Port Hub Quick Installation Guide Introducing the SuperSpeed USB 7-Port Hub The SuperSpeed USB 7-Port Hub is designed to support USB 3.0 & USB 2.0 equipped PC computers. This SuperSpeed
PB product brief. Using USB 3.0 for Storage Media Applications
PB product brief Using for Storage Media Applications PB product brief Introduction0 Spurred by the increasing resolution and storage capabilities of consumer electronic devices, along with the wider availability
Transmitter Interface Program
Transmitter Interface Program Operational Manual Version 3.0.4 1 Overview The transmitter interface software allows you to adjust configuration settings of your Max solid state transmitters. The following
Modbus and ION Technology
70072-0104-14 TECHNICAL 06/2009 Modbus and ION Technology Modicon Modbus is a communications protocol widely used in process control industries such as manufacturing. PowerLogic ION meters are compatible
USB 3.0 4-Port PCI Express Card
USB 3.0 4-Port PCI Express Card User Manual Model: UGT-PC341 All brand names and trademarks are properties of their respective owners www.vantecusa.com Contents: Chapter 1: Introduction... 3 1.1 Product
Designing the NEWCARD Connector Interface to Extend PCI Express Serial Architecture to the PC Card Modular Form Factor
Designing the NEWCARD Connector Interface to Extend PCI Express Serial Architecture to the PC Card Modular Form Factor Abstract This paper provides information about the NEWCARD connector and board design
Serial ATA International Organization
Serial ATA International Organization 20 January 2011 Version: 1.1 Revision 1.4 20 January 2011 Serial ATA Interoperability Program Revision 1.4 Agilent Technologies, Inc. Method of Implementation (MOI)
Secu6 Technology Co., Ltd. Industrial Mini-ITX Intel QM77 Ivy Bridge Mobile Motherboard Support 3 rd Generation Core i7 / i5 / i3 Mobile Processor
ITX-QM77 Industrial Mini-ITX Intel QM77 Ivy Bridge Mobile Motherboard Support 3 rd Generation Core i7 / i5 / i3 Mobile Processor Datasheet 2012.09.19» Intel Ivy Bridge (IVB) 3rd Generation Core i3 / i5
Interfacing Intel 8255x Fast Ethernet Controllers without Magnetics. Application Note (AP-438)
Interfacing Intel 8255x Fast Ethernet Controllers without Magnetics Application Note (AP-438) Revision 1.0 November 2005 Revision History Revision Revision Date Description 1.1 Nov 2005 Initial Release
USB-IF Product Order Form
USB-IF Product Order Form Please use the following information to select the test hardware from the USB-IF estore. USB 3.1 (10 GT/s) Type-C Electrical Test Fixture Kit The USB 3.1 USB (10 GT/s) Type-C
IDE/ATA Interface. Objectives. IDE Interface. IDE Interface
Objectives IDE/ATA Interface In this part, you will -Learn about each of the ATA standards -Identify the ATA connector and cable -Learn how to set jumpers for master, slave and cable select configurations
Real-time Operating Systems Lecture 27.1
Real-time Operating Systems Lecture 27.1 14.7. Universal Serial Bus () General References http://www.usb.org. http://www.beyondlogic.org/usbnutshell/ References http://www.ftdichip.com/documents/programguides/d2xxpg34.pdf
Oscilloscope Bandwidth Requirements for Emerging Serial Data Interfaces
Oscilloscope Bandwidth Requirements for Emerging Serial Data Interfaces Page 1 What best determines bandwidth requirements? 5 th harmonic? Or spectral content of the signal, which is related to rise time?
Automotive Ethernet Compliance Testing
Automotive Ethernet Compliance Testing Dr. Ernst Flemming Product Manager Rohde & Schwarz GmbH & Co. KG Munich, Germany The company group at a glance ı History Established 1933 in Munich, Germany ı Type
Von der Hardware zur Software in FPGAs mit Embedded Prozessoren. Alexander Hahn Senior Field Application Engineer Lattice Semiconductor
Von der Hardware zur Software in FPGAs mit Embedded Prozessoren Alexander Hahn Senior Field Application Engineer Lattice Semiconductor AGENDA Overview Mico32 Embedded Processor Development Tool Chain HW/SW
PEX 8748, PCI Express Gen 3 Switch, 48 Lanes, 12 Ports
, PCI Express Gen 3 Switch, 48 Lanes, 12 Ports Highlights General Features o 48-lane, 12-port PCIe Gen 3 switch - Integrate d 8.0 GT/s SerDes o 27 x 27mm 2, 676-pin BGA package o Typical Power: 8.0 Watts
8B/10B Coding 64B/66B Coding
8B/10B Coding 64B/66B Coding 1. Transmission Systems 2. 8B/10B Coding 3. 64B/66B Coding 4. CIP Demonstrator Test Setup PeterJ Slide 1 Transmission system General Data Clock D C Flip Flop Q @ 1 Gbps = 1
SAN Conceptual and Design Basics
TECHNICAL NOTE VMware Infrastructure 3 SAN Conceptual and Design Basics VMware ESX Server can be used in conjunction with a SAN (storage area network), a specialized high speed network that connects computer
Chapter 7 Low-Speed Wireless Local Area Networks
Wireless# Guide to Wireless Communications 7-1 Chapter 7 Low-Speed Wireless Local Area Networks At a Glance Instructor s Manual Table of Contents Overview Objectives s Quick Quizzes Class Discussion Topics
A+ Guide to Managing and Maintaining Your PC, 7e. Chapter 1 Introducing Hardware
A+ Guide to Managing and Maintaining Your PC, 7e Chapter 1 Introducing Hardware Objectives Learn that a computer requires both hardware and software to work Learn about the many different hardware components
Design and Verification of Nine port Network Router
Design and Verification of Nine port Network Router G. Sri Lakshmi 1, A Ganga Mani 2 1 Assistant Professor, Department of Electronics and Communication Engineering, Pragathi Engineering College, Andhra
USB 3.0 4-Port Hub Quick Installation Guide
Introduction USB 3.0 4-Port Hub Quick Installation Guide The SuperSpeed USB 3.0 4-Port Hub is designed to support USB 3.0 equipped PC computers and expands USB 3.0 connectivity to your computer. Key Features
User s Manual. Powerline 200M Ethernet Bridge
User s Manual Powerline 200M Ethernet Bridge Index 1. Powerline Networking Installation...2 1.1 Simple step to install Powerline Networking...2 1.2 Application Block Diagram...3 1.3 Benefits...5 1.4 Features...5
TI GPS PPS Timing Application Note
Application Note Version 0.6 January 2012 1 Contents Table of Contents 1 INTRODUCTION... 3 2 1PPS CHARACTERISTICS... 3 3 TEST SETUP... 4 4 PPS TEST RESULTS... 6 Figures Figure 1 - Simplified GPS Receiver
Recommendations for TDR configuration for channel characterization by S-parameters. Pavel Zivny IEEE 802.3 100GCU Singapore, 2011/03 V1.
Recommendations for TDR configuration for channel characterization by S-parameters Pavel Zivny IEEE 802.3 100GCU Singapore, 2011/03 V1.0 Agenda TDR/TDT measurement setup TDR/TDT measurement flow DUT electrical
Using High Availability Technologies Lesson 12
Using High Availability Technologies Lesson 12 Skills Matrix Technology Skill Objective Domain Objective # Using Virtualization Configure Windows Server Hyper-V and virtual machines 1.3 What Is High Availability?
N5416A and N5417A USB Compliance Test Software for Infiniium Oscilloscopes
N546A and N547A USB Compliance Test Software for Infiniium Oscilloscopes Data Sheet The N546A USB compliance test software for Infiniium oscilloscopes gives you a fast and reliable way to verify USB electrical
Serial Communications
April 2014 7 Serial Communications Objectives - To be familiar with the USART (RS-232) protocol. - To be able to transfer data from PIC-PC, PC-PIC and PIC-PIC. - To test serial communications with virtual
CAN & LIN Development Tool CLDT1004 HS CAN
HW Features : 1 x High Speed CAN Bus up to 1 Mbit/s 4 x digital Signal Output / Trigger Output easy synchronization between CAN Messages and physical HW Outputs SW Features : Can Bus Analyzing Tool Can
Computer Systems Structure Input/Output
Computer Systems Structure Input/Output Peripherals Computer Central Processing Unit Main Memory Computer Systems Interconnection Communication lines Input Output Ward 1 Ward 2 Examples of I/O Devices
Redundancy in enterprise storage networks using dual-domain SAS configurations
Redundancy in enterprise storage networks using dual-domain SAS configurations technology brief Abstract... 2 Introduction... 2 Why dual-domain SAS is important... 2 Single SAS domain... 3 Dual-domain
Intel Server Board S3420GPV
Server WHQL Testing Services Enterprise Platforms and Services Division Intel Server Board S3420GPV Rev 1.0 Server Test Submission (STS) Report For the Microsoft Windows Logo Program (WLP) Dec. 30 th,
Design Considerations for DVT and Manufacturing Test of Wireless Devices
WHITEPAPER Design Considerations for DVT and Manufacturing Test of Wireless Devices 2015 LitePoint, A Teradyne Company. All rights reserved. Introduction Wireless devices are being deployed for a wide
Industrial Multi-port Serial Cards
SUNIX I.N.C. Success Stories Industrial Multi-port Cards Multi-port Cards Introduction & Features Universal PCI Cards - Lite Interface Cards RS-232/422/485 Interface Cards PCI Express Cards - Lite Interface
SyncLink GT2/GT4 Serial Adapter
SyncLink GT2/GT4 Serial Adapter Hardware User s Manual MicroGate Systems, Ltd http://www.microgate.com MicroGate and SyncLink are registered trademarks of MicroGate Systems, Ltd. Copyright 2008 2012 MicroGate
USB 2.0/3.0 Droop/Drop Test Fixture
Operations Manual USB-IF USB 2.0/3.0 Droop/Drop Test Fixture USB 2.0/3.0 Droop/Drop Test Fixture June 15, 2012 Revision 1.1 PACKAGE CONTENTS The USB-IF 2.0/3.0 Droop/Drop Test Fixture should come with
ebus Player Quick Start Guide
ebus Player Quick Start Guide This guide provides you with the information you need to efficiently set up and start using the ebus Player software application to control your GigE Vision or USB3 Vision
