USBLC6-2. Very low capacitance ESD protection. Features. Applications. Description. Benefits. Complies with the following standards:



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Very low capacitance ESD protection Features 2 data-line protection Protects V BUS Very low capacitance: 3.5 pf max. Very low leakage current: 150 na max. SOT-666 and SOT23-6L packages RoHS compliant Benefits Very low capacitance between lines to for optimized data integrity and speed Low PCB space consumption: 2.9 mm 2 max for SOT-666 and 9 mm² max for SOT23-6L Enhanced ESD protection: IEC 61000-4-2 level 4 compliance guaranteed at device level, hence greater immunity at system level ESD protection of V BUS High reliability offered by monolithic integration Low leakage current for longer operation of battery powered devices Fast response time Consistent D+ / D- signal balance: Very low capacitance matching tolerance I/O to = 0.015 pf Compliant with USB 2.0 requirements Complies with the following standards: IEC 61000-4-2 level 4: 15 kv (air scharge) 8 kv (contact scharge) Figure 1. Applications SOT23-6L USBLC6-2SC6 Functional agram (top view) I/O1 I/O2 USB 2.0 ports up to 480 Mb/s (high speed) Compatible with USB 1.1 low and full speed Ethernet port: 10/100 Mb/s SIM card protection Video line protection Portable electronics Description 1 6 2 5 3 4 SOT-666 USBLC6-2P6 The USBLC6-2SC6 and USBLC6-2P6 are monolithic application specific devices decated to ESD protection of high speed interfaces, such as USB 2.0, Ethernet links and video lines. The very low line capacitance secures a high level of signal integrity without compromising in protecting sensitive chips against the most stringently characterized ESD strikes. I/O1 V BUS I/O2 October 2011 Doc ID 11265 Rev 5 1/14 www.st.com 14

Characteristics USBLC6-2 1 Characteristics Table 1. Absolute ratings Symbol Parameter Value Unit V PP Peak pulse voltage IEC 61000-4-2 air scharge IEC 61000-4-2 contact scharge MIL STD883G-Method 3015-7 T stg Storage temperature range -55 to +150 C T j Operating junction temperature range -40 to +125 C T L Lead solder temperature (10 seconds duration) 260 C 15 15 25 kv Table 2. Electrical characteristics (T amb = 25 C) Symbol Parameter Test contions Value Min. Typ. Max. Unit I RM Leakage current V RM = 5.25 V 10 150 na Breakdown voltage between V BR I V BUS and R = 1 ma 6 V V F Forward voltage I F = 10 ma 1.1 V V CL C i/o- Clamping voltage Capacitance between I/O and I PP = 1 A, 8/20 µs Any I/O pin to I PP = 5 A, 8/20 µs Any I/O pin to V R = 1.65 V 2.5 3.5 ΔC i/o- 0.015 C i/o-i/o Capacitance between I/O V R = 1.65 V 1.2 1.7 ΔC i/o-i/o 0.04 12 V 17 V pf pf 2/14 Doc ID 11265 Rev 5

Characteristics Figure 2. C(pF) 3.0 2.5 2.0 1.5 1.0 0.5 0.0 Capacitance versus voltage (typical values) C O=I/O- C j=i/o-i/o Data line voltage (V) F=1MHz V OSC=30mVRMS T j=25 C 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 Figure 3. C(pF) 2.8 2.6 2.4 2.2 2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0 Line capacitance versus frequency (typical values) F(MHz) V OSC=30mVRMS T j=25 C V LINE=0V to 3.3V 1 10 100 1000 Figure 4. Relative variation of leakage current versus junction temperature (typical values) Figure 5. Frequency response I RM[Tj] / I RM[Tj=25 C] 100 V BUS=5V 0.00 S21(dB) -5.00 10-10.00-15.00 1 T ( C) j 25 50 75 100 125-20.00 F(Hz) 100.0k 1.0M 10.0M 100.0M 1.0G Doc ID 11265 Rev 5 3/14

Technical information USBLC6-2 2 Technical information 2.1 Surge protection The USBLC6-2 is particularly optimized to perform surge protection based on the rail to rail topology. The clamping voltage V CL can be calculated as follow: V CL + = V TRANSIL + V F for positive surges V CL - = - V F for negative surges with: V F = V T + R d.i p (V F forward drop voltage) / (V T forward drop threshold voltage) and V TRANSIL = V BR + R d_transil.i P Calculation example Note: We assume that the value of the dynamic resistance of the clamping ode is typically: R d = 0.5 Ω and V T = 1.1 V We assume that the value of the dynamic resistance of the transil ode is typically: R d_transil = 0.5 Ω and V BR = 6.1 V For an IEC 61000-4-2 surge Level 4 (Contact Discharge: V g = 8 kv, R g = 330 Ω), V BUS = +5 V, and if in first approximation, we assume that: I p = V g / R g = 24 A. So, we find: V CL + = +31.2 V V CL - = -13 V The calculations do not take into account phenomena due to parasitic inductances. 2.2 Surge protection application example If we consider that the connections from the pin V BUS to V CC, from I/O to data line and from to PCB plane are done by tracks of 10 mm long and 0.5 mm large, we assume that the parasitic inductances L VBUS, L I/O and L of these tracks are about 6 nh. So when an IEC 61000-4-2 surge occurs on data line, due to the rise time of this spike (t r =1ns), the voltage V CL has an extra value equal to L I/O.dl/dt + L.dI/dt. The di/dt is calculated as: di/dt = I p /t r = 24 A/ns The overvoltage due to the parasitic inductances is: L I/O.dl/dt = L.dI/dt = 6 nh x 24 A/ns = 144 V By taking into account the effect of these parasitic inductances due to unsuitable layout, the clamping voltage will be: V CL + = +31.2 + 144 + 144 = 319.2 V V CL - = -13.1-144 - 144 = -301.1 V 4/14 Doc ID 11265 Rev 5

Technical information We can significantly reduce this phenomena with simple layout optimization. It is for this reason that some recommendations have to be followed (see 2.3: How to ensure good ESD protection). Figure 6. ESD behavior: parasitic phenomena due to unsuitable layout ESD surge on data line VCL+ V BUS Data line dt LVBUS VCC pin + L dt dt Positive Surge VF I/O pin VTRANSIL V TRANSIL +VF VCL t L pin L dt t r = 1 ns t r = 1 ns t -VF V + =V +V + L + L CL TRANSIL F I/O dt dt surge > 0 V = -V - L CL- F I/O - L dt dt surge > 0 VTRANSIL = VBR + Rd.Ip - - L dt dt Negative Surge VCL- 2.3 How to ensure good ESD protection While the USBLC6-2 provides high immunity to ESD surge, efficient protection depends on the layout of the board. In the same way, with the rail to rail topology, the track from data lines to I/O pins, from V CC to V BUS pin and from plane to pin must be as short as possible to avoid overvoltages due to parasitic phenomena (see Figure 6. and Figure 7. for layout consideration) Figure 7. ESD behavior: layout optimization Figure 8. ESD behavior: measurement contions 1 6 ESD SURGE 2 5 3 4 Unsuitable layout 1 6 TEST BOARD IN OUT USBLC6-2SC6 +5 V 2 5 3 4 Optimized layout Doc ID 11265 Rev 5 5/14

Technical information USBLC6-2 Figure 9. ESD response to IEC 61000-4-2 (+15 kv air scharge) Figure 10. ESD response to IEC 61000-4-2 (-15 kv air scharge) Vin Vin Vout Vout Important: A good precaution to take is to put the protection device as close as possible to the sturbance source (generally the connector). 2.4 Crosstalk behavior 2.4.1 Crosstalk phenomenon Figure 11. Crosstalk phenomenon R G1 Line 1 V G1 R G2 Line 2 R L1 α1v G1 + β12v G2 V G2 R L2 α V G2 + β V G1 2 21 DRIVE RECEIVE The crosstalk phenomenon is due to the coupling between 2 lines. The coupling factor (β12 or β21) increases when the gap across lines decreases, particularly in silicon ce. In the above example the expected signal on load R L2 is α 2 V G2, in fact the real voltage at this point has got an extra value β 21 V G1. This part of the V G1 signal represents the effect of the crosstalk phenomenon of the line 1 on the line 2. This phenomenon has to be taken into account when the drivers impose fast gital data or high frequency analog signals in the sturbing line. The perturbed line will be more affected if it works with low voltage signal or high load impedance (few kω). 6/14 Doc ID 11265 Rev 5

Technical information Figure 12. Analog crosstalk measurements NETWORK ANALYSER PORT 1 TEST BOARD USBLC6-2SC6 Vbus NETWORK ANALYSER PORT 2 Figure 12. shows the measurement circuit for the analog application. In usual frequency range of analog signals (up to 240 MHz) the effect on sturbed line is less than -55 db (see Figure 13.). Figure 13. Analog crosstalk results 0.00 db - 30.00-60.00-90.00 F (Hz) - 120.00 100.0k 1.0M 10.0M 100.0M 1.0G As the USBLC6-2 is designed to protect high speed data lines, it must ensure a good transmission of operating signals. The frequency response (Figure 5.) gives attenuation information and shows that the USBLC6-2 is well suitable for data line transmission up to 480 Mbit/s while it works as a filter for undesirable signals like GSM (900 MHz) frequencies, for instance. Doc ID 11265 Rev 5 7/14

Technical information USBLC6-2 2.5 Application examples Figure 14. USB 2.0 port application agram using USBLC6-2 DEVICE- UPSTREAM TRANSCEIVER SW2 + 3.3V RPU SW1 USB connector + 5V Protecting Bus Switch HUB- DOWNSTREAM TRANSCEIVER VBUS VBUS VBUS RX LS/FS + RX LS/FS + RX HS RX HS + TX HS + D+ TX HS + RX LS/FS - RX LS/FS - RX HS - RX HS - TX HS - D- TX HS - TX LS/FS + TX LS/FS + USBLC6-2SC6 TX LS/FS - TX LS/FS - RPD RPD DEVICE- UPSTREAM TRANSCEIVER SW2 + 3.3V RPU SW1 USB connector VBUS RX LS/FS + RX HS TX HS + RX LS/FS - RX HS - TX HS - VBUS D+ D- RX LS/FS + RX HS + TX HS + RX LS/FS - RX HS - TX HS - TX LS/FS + TX LS/FS - USBLC6-2P6 USBLC6-4SC6 TX LS/FS + TX LS/FS - RPD RPD Mode Low Speed LS Full Speed FS High Speed HS SW1 Open Closed Closed then open SW2 Closed Open Open Figure 15. T1/E1/Ethernet protection Tx +VCC 100nF USBLC6-2SC6 SMP75-8 DATA TRANSCEIVER Rx +VCC 100nF USBLC6-2SC6 SMP75-8 8/14 Doc ID 11265 Rev 5

Technical information 2.6 PSpice model Figure 16. shows the PSpice model of one USBLC6-2 cell. In this model, the odes are defined by the PSpice parameters given in Figure 17. Figure 16. PSpice model D+in RI/O RI/O D+out MODEL = Dlow MODEL = Dhigh L R MODEL = Dzener RI/O VBUS MODEL = Dlow MODEL = Dhigh D-in RI/O RI/O D-out Note: This simulation model is available only for an ambient temperature of 27 C. Figure 17. PSpice parameters Figure 18. USBLC6-2 PCB layout considerations Dlow Dhigh Dzener 750p BV 50 50 7.3 CJ0 0.9p 2.0p 40p IBV 1m 1m 1m M 0.3333 0.3333 0.3333 0.2 0.52 0.84 RI/O L R 110m 550p 60m D+in D-in 1 D+out V BUS C BUS = 100nF VJ 0.6 0.6 0.6 TT 0.1u 0.1u 0.1u USBLC6-2 D-out Doc ID 11265 Rev 5 9/14

Ordering information scheme USBLC6-2 3 Ordering information scheme Figure 19. Ordering information scheme USB LC 6-2 xxx Product Designation Low capacitance Breakdown Voltage 6 = 6 Volts Number of lines protected 2 = 2 lines Packages SC6 = SOT23-6L P6 = SOT-666 10/14 Doc ID 11265 Rev 5

Package information 4 Package information Epoxy meets UL94, V0 Lead-free packages In order to meet environmental requirements, ST offers these devices in fferent grades of ECOPACK packages, depenng on their level of environmental compliance. ECOPACK specifications, grade definitions and product status are available at: www.st.com. ECOPACK is an ST trademark. Table 3. SOT-666 mensions b1 Dimensions L1 Ref. Millimeters Inches Min. Typ. Max. Min. Typ. Max. L3 A 0.45 0.60 0.018 0.024 b A3 0.08 0.18 0.003 0.007 D E1 b 0.17 0.34 0.007 0.013 b1 0.19 0.27 0.34 0.007 0.011 0.013 A E L2 A3 D 1.50 1.70 0.059 0.067 E 1.50 1.70 0.059 0.067 E1 1.10 1.30 0.043 0.051 e 0.50 0.020 L1 0.19 0.007 e L2 0.10 0.30 0.004 0.012 L3 0.10 0.004 Figure 20. SOT-666 footprint mensions in mm Figure 21. SOT-666 marking 0.50 0.62 2.60 F 0.99 0.30 Doc ID 11265 Rev 5 11/14

Package information USBLC6-2 Table 4. SOT23-6L mensions Dimensions Ref. Millimeters Inches Min. Typ. Max. Min. Typ. Max. c q H E L A1 A A 0.90 1.45 0.035 0.057 A1 0 0.10 0 0.004 A2 0.90 1.30 0.035 0.051 b 0.35 0.50 0.014 0.020 b e D c 0.09 0.20 0.004 0.008 D 2.80 3.05 0.11 0.118 e E 1.50 1.75 0.059 0.069 e 0.95 0.037 A2 H 2.60 3.00 0.102 0.118 L 0.10 0.60 0.004 0.024 θ 0 10 0 10 Figure 22. SOT23-6L footprint mensions in mm Figure 23. SOT23-6L marking 0.60 3.50 2.30 0.95 1.20 1.10 UL26 12/14 Doc ID 11265 Rev 5

Ordering information 5 Ordering information Table 5. Ordering information Order code Marking Package Weight Base qty Delivery mode USBLC6-2SC6 UL26 SOT23-6L 16.7 mg 3000 Tape and reel USBLC6-2P6 F SOT-666 2.9 mg 3000 Tape and reel 6 Revision history Table 6. Document revision history Date Revision Changes 14-Mar-2005 1 First issue. 07-Jun-2005 2 Format change to figure 3; no content changed. 20-Mar-2008 3 Added marking illustrations - Figures 21 and 23. Added ECOPACK statement. Updated operating junction temperature range in absolute ratings, page 2. Technical information section updated. Reformatted to current standards. 27-Jun-2011 4 24-Oct-2011 5 Updated legal statement. Updated leakage current for V RM = 5.25 V as specified in USB standard. Updated marking illustrations Figure 21 and Figure 23. Doc ID 11265 Rev 5 13/14

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