Introduction to Phenom

Transcription

1 Introduction to Phenom

2 Phenomproducts Sample holders G2 Pure ProSuite applications G2 Pro prox

3 PhenomSpecifications G2Pure G2 Pro prox Light optical: 20x, B/W 17 touch screen Electron optics: x Resolution: 30nm Upgradeable to G2 or ProSuite The Phenom G2 pure is the most economic and efficient solution for highresolution imaging. Light Optical: x, color 19 touch screen Electron optics: x Resolution: 25nm Pro Suite compatible The Phenom G2 pro is the most powerful desktop SEM with integrated application solutions. Light Optical: x, color 19 touch screen Electron optics: x Resolution: 25nm Integrated EDS detector ProSuitewith Element Identification software included The Phenom prox is the most powerful desktop SEM imaging and analysis solution.

4 Phenomdesktop SEM High-resolution and high-quality imaging Unrivaled speed from sample loading to (SEM-) image Easy intuitive user interface Compact desktop design bench space saver

5 Features image quality Image Quality Resolution down to 25nm Magnification up to x Large DOF depth of focus

6 Features ease of use Intuitive user interface Touch screen display Minimal training required to operate the Phenom Phenom SEM accessible to large group of users

7 Phenomdesktop SEM Designed for high quality imaging on a large variety of conductive and non conductive samples

8 Sample overview What type of samples can be imaged with Phenom Relative dry samples Conductive and non conductive Max. sample size 25mm for 3D type of structures or 32mm diameter for embedded samples, 30mm height Wet or highly out gassing samples Freezing technique Max. 12mm diameter

9 Sample preparation Stubs Sample is clamped or glued onto an aluminium pin type stub Any 3D type of sample can be mounted Step 2 Step 3 Pin stubs Double sided adhesives Step 2 Conductive Carbon paint

10 Sample holders Standard Sample Holder Standard available holder (included with Phenom) Designed for high resolution imaging Can accommodate 3D type samples (max. size: 25mm diameter; 30mm height). Wide range of samples (materials) can be imaged using this holder. Standard pin stub sample holder

11 Sample holders - Metallurgical Mount Sample Holder Metallurgical or resin mount samples (cross section views) Metallurgical mount sample holder Designed to accommodate metallurgical/metallographic type of samples (samples which are embedded in a resin). Max. size: 32mm diameter; 30mm height.

12 How does it work -Sample loading Safe sample loading First optical image 5 seconds after loading First electron image after 25 seconds

13 User interface, main functions - optical Main viewing window for live and stored images Contains images stored on USB memory stick or the network For setting microscope variables Optical image overview for easy navigation in opticaland electron imaging mode

14 User interface, main functions electron optical Main viewing window for live and stored images Contains images stored on USB memory stick or the network For setting microscope variables Optical image overview for easy navigation in opticaland electron imaging mode Electron image at lowest magnification for easy navigation

15 Charge Reduction Sample Holder Benefit Extends the imaging capabilities on non conductive samples Charge free images at a much higher magnification compared with the standard holder. The need for sputter coating is reduced dramatically resulting in faster sample preparation. Non conductive samples can be imaged in their natural state providing valuable back scatter material contrast information. Metallurgical mount charge reduction sample holder Pin stub charge reduction sample holder

16 Charge Reduction Sample Holder -performance 1000x 2500x 4000x Images from a hair using the standard sample holder 1000x 2500x Images from a hair using the charge reduction sample holder 4000x 7500x

17 Charge Reduction Sample Holder Defect in glass. Magn. =2500x Rubber band. Magn. =2500x

18 Manual Tilt and Rotation Sample Holder The Manual Tilt and Rotation (Microtool holder) sample holder can accommodate any axial shaped micro manufacturing parts such as; drills, end mills, needles, fibers, (fuel)injectors, pencils etc. Specification Sample diameter : axial shaped parts ranging from 1 to 10 mm Length : maximum 100mm Tilt : between -5 and +40 Rotation : +/- 35 Key benefits Easy and fast clamping Tilting and rotation allow for easy sample positioning The Phenom is the only desktop electron microscope that is able to load and image these type of samples in their original state.

19 Manual Tilt & Rotation Sample Holder Defect on a micro drill at low- and higher magnification.

20 Temperature controlled sample holder Imaging a wet or highly out gassing sample with a scanning electron microscope (SEM) is difficult and requires advanced system settings or special sample preparation. Environmental SEM (ESEM) Cooling (Freezing)

21 TCSH specifications Specification Temprature range -25 C to +50 C Control keypad with display of target and actual temperature Sample vacuum level Charge reduction mode Benefits Imaging of moistures and wet samples in their natural state, preserving the structure and texture of the sample observed in the microscope (minimize dry out). Imaging of beam or temperature sensitive samples without damaging the sample.

22 Imaging of wet samples Imaging wet and moisturous samples by freezing it to -25 C, preserving the original structure of the sample Cucumber at -25 C Mold (cheese) at -25 C

23 Imaging beam sensitive samples Food ingredient without TCSH Food ingredient with TCSH Without cooling the sample will start to melt from 1500 x magnification onwards. Cristals will desolve, and the original structure of the sample is lost With cooling the sample can be imaged at higher magnification. The cristal structure of the sample can be well observed

24 Motorized Tilt & Rotation Sample Holder

25 Why tilt and rotation It is often very difficult to predict how to load a sample as the small features cannot be seen when preparing or mounting the sample inside the holder. For every sample with surface structure it is not possible to image all areas. Benefit Tilt Imaging 3D structures Holes Multi layers Edges Benefit Rotation Aligning features to X- or Y-axis Possible to image every side of a feature

26 MTRSH specifications Tilt range -10 to + 45 (step size 0.2 ) Rotation Continuous 360 (step size 0.2 ) Max. sample diameter Max. sample height Vacuum level 12 mm 5 mm Similar to standard sample holder

27 Imagine the Phenomin your lab User benefits Light Microscopist Extend current capability with greater magnification, resolution, and depth of focus without additional training or infrastructure. Electron image users No need to outsource SEM work resulting in fast and more accurate sample feedback Electron Microscopist Reduce workload on high-end SEM by offloading routine work.

28 Imagine the Phenomin your lab Fast time to image Easy to operate High quality imaging Worldwide support

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