ABB Multiwave TM process photometers. ABB Analytical - PUV3402, PIR3502 and PFO3372 process photometers Applications, technology and data



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ABB Multiwave TM process photometers ABB Analytical - PUV3402, PIR3502 and PFO3372 process photometers Applications, technology and data

Process photometers PUV3402 and PIR3502 Principle of operation The PUV3402 and PIR3502 process photometers optical path consists of an IR or UV source, a brushless chopper motor, a multichannel filter wheel, lenses, cell with windows, and a solid state IR or UV detector. (See Optical Schematic). The brushless chopper motor rotates the multichannel filter wheel reference and measure filters, alternately and continuously, into and out of the optical path. The lenses, L1 through L4, focus and collimate the source radiation through the sample cell path to the detector. On a multichannel photometer, a reference wavelength is chosen where the stream components have little or no absorbance. The measure wavelength or wavelengths are chosen where the measured components have absorbance. The microprocessor will then use matrix algebra and apply the proper response factor to each filter to eliminate interferences on the desired component and convert the absorbance to a component concentration. Advantages of the design The PUV3402 and PIR3502 process photometers use a fixed wavelength filter, single beam, multichannel principle. This design concept offers several advantages: Produces a simple mechanical design that promotes easier service and maintenance. Compensates for obstruction of cell windows. Compensates for source and detector aging. Permits the sample cell to be isolated from the electronics. Enable multicomponent analysis. As illustrated by the optical schematic, the simple mechanical design has a single optical path, from the source directly to the detector. The source energy is focused and collimated straight to the detector. It does not require optical mirrors or internal reflections. Optical schematic 2 ABB Multiwave TM process photometers ABB brochure

This enables hardware components to be configured for self-alignment, making all components in the system easy to remove and replace. It also ensures a more reliable and stable long term performance. The cell windows can be obscured by up to 50% without affecting measurement accuracy, because the single cell, multichannel design measures the ratio of the transmitted energy between the reference and measure wavelengths. Problems normally associated with dual chamber detectors and cells such as gas leaks, optical alignments, vibrations, pitting and corrosion of cell walls, are eliminated by the single beam multichannel design. Also, aging problems typically associated with two sources or two detectors are eliminated. Again, this design concept enhances long term stability and reliability. The ABB process photometer s single source, single detector design also enables the use of an isolated sample cell. An isolated sample cell has many advantages for on-line process measurements. Contact between flammable or corrosive streams and system electronics is prevented. Access to sample lines is made easier, and cell removal is simplified. Finally, this multichannel evolution of the fixed filter photometer allows measurements in streams where there are several interfering compounds; and it has the ability to measure multiple components in many applications. General applications ABB PUV3402 and PIR3502 process photometers provide on-line measurements of gas or liquid components, in simple or complex process streams for: Process Efficiency Catalyst Protection Product Quality Environmental Concerns Safety Process Control ABB process photometers provide reliable performance in the petrochemical, chemical, refining, gas processing and product pipeline industries. Multiwave TM process photometer, left side: detector, right side: source ABB brochure ABB Multiwave TM process photometers 3

Ranges and regions Spectral range and regions Spectral range: Gas and Liquids with absorbance in the 0.2 to 15 micrometer region of the electromagnetic spectrum. Spectral regions: Ultraviolet and Visible Near Infrared (Overtone Region) Fundamental Infrared (Rotation-Vibration) Fingerprint Region 200 to 800 nm 800-2500 nm 2.5 to 15 um 8.0 to 15 um The fingerprint region from 8 15 um is very useful because there is a high level of specificity in this region. Temperature and pressure ranges Temperature ranges: Ambient 32 to 113 F (0 45 C) Sample Cell Operating Temperature 32 to 392 F (0 200 C) Pressure Range: Sample Cell 5 to 500 PSIG (0.3 34) BAR standard* *Higher pressures available upon request consult manufacturer. ABB process photometer field-proven applications The following chart is a partial listing of field-proven applications. These applications are grouped by process. Measured components and key benefits are indexed for each application. 4 ABB Multiwave TM process photometers ABB brochure

Field-proven PUV3402 and PIR3502 applications Process Measurement Benefits Acid Gas Scrubbers Sodium Hydroxide 0 15 % Improved scrubber efficiency and reduced cost Acetic Acid CO 80 100% in Reactor Feed Maximize process yield Water 0 20% in Reactor Outlet Distillation tower control Water 0 10% in Drying Column Inlet 2 nd half of distillation tower control and determining expected life of drying column Water 0 1500 ppm in Drying Column Outlet Drying column efficiency *Methyl Iodide 0 1000 ppm Scrubber efficiency and safety Ammonia CO 0 500ppm Catalyst protection CH 4 0 0.5% Safety NH 3 0 100% Safety Area Monitoring Ethyl Benzene 0 200 ppm, Safety, leak detection Styrene 0 100 ppm, Isooctane 0 2500 ppm, Divinylbenzene 0 300 ppm Crude Unit ASTM color 0 8 Product quality Ethylene Acetylene 0 2% Hydrogenation reactor inlet continuous control Acetylene 0 0.5% Hydrogenation reactor mid-bed continuous control Ethylene Dichloride CO 0 10%, CO 2 0 5%, Process efficiency and safety and Ethylene 0 5% *Chlorine 0 2000 ppm in EDC with Sparger System Process efficiency Ethylene Glycol *Percent Transmittance at 4 discrete On-line quality control of ethylene glycol purity UV wavelengths Maleic Anhydride CO 0 2.5%, CO 2 0 2.5%, Butane Reactor outlet process efficiency 0 0.5%, and Maleic Anhydride 0 2% Butane 0 2% and Water Vapor 0 5% Reactor inlet LEL control Phosgene CO 0 10% Process control *Chlorine 0 200 ppm Process control Phosgene 0 100 ppm Safety Product Pipeline CO 2 0 1000 ppm Prevent freezing of natural gas lines Sulfur Recovery H 2 S 0 100%, CO2 0 100%, Acid gas feed Water 0 30%, THC 0 10% Forward control H 2 S 0 100%, NH3 0 50%, Sour gas feed Water 0 30%, THC 0 10% Forward control Vinyl Chloride Water 0 50 ppm in EDC Catalyst protection, corrosion protection of reactors Vinyl chloride 0 200 ppm, 0 2% in HCl Condenser efficiency * = UV Application ABB brochure ABB Multiwave TM process photometers 5

Field-proven multicomponent applications Multicomponent measurements 0 1.2% toluene; 0 2% tetrahydrofuran and 0 100% LEL of gas mix (3 components) 0 20% CO; 0 20% CO 2 ; and 0 5% CH 4 (3 components) 0 55% propane and 0 20% propylene (2 components) 0 1000 ppm CH 4 and 0 250 ppm ethane in ethylene @ 100 psig (2 components) 0 100 ppm CO and 0 100 ppm CO 2 in H 2 @ 200 psig (2 components) 0 200 ppm fluorobenzene; 0 200 ppm chlorine; and 0 200 ppm SO 2 in carbon bed vent gas (3 components) 0 5% CO 2 ; 0 5% CO; 0 1% toluene and 0 1% benzene in air oxidation vent (4 components) 0 50 ppm acrylonitrile and 0 50 ppm styrene in air (2 components) 0 50 ppm ethylene oxide and 0 50 ppm propylene oxide in air (2 components) 0 70% methyl chloride and 30 55% methylene chloride (2 components) 0 5000 ppm SO 2 ; 0 2000 ppm NO; 0 2000 ppm NO 2 and 0 2000 ppm NOx (4 components) 0 5000 ppm ethane; 0 5000 ppm ethylene and 0 80% methane (3 components) 0 40% CO 2 ; 0 40% CO and 0 25% water vapor in air (3 components) 0 80% ethylene and 0 15% CO 2 in mixed HC stream as a vapor (2 components) 0 100% CO; 0 60% ethylene; 0 20% CO 2 ; and 0 5% ethyl chloride @ 70 psig (4 components) 0 1000 ppm water and 0 5% DMSO in monochlorobenzene (2 components) 0 100% ethylene; 0 10% EDC; 0 50% HCl; and 0 20% ethyl chloride (4 components) 0 20% propadiene; 0 40% methyl acetylene and 0 60% MAPD (3 components) Water measurements 0 2% water in phenol 0 500 ppm water in monochlorobenzene 0 50 ppm water in ethylene dichloride 0 250 ppm water in chlorine @ 75psig (vapor) 0 0.5% water in ethylene diamine 0 100 ppm water in vinylidene chloride 0 500 ppm water in propylene glycol 0 200 ppm water in methyl ethyl ketone (MEK) 0 500 ppm water in dimethylacetamide 0 200 ppm water in allyl chloride 0 0.5% water in acetone 0 1500 ppm water in methanol 0 100 ppm water in benzene 0 300 ppm water in toluene diamine 0 1000 ppm water in MEK & alcohols 6 ABB Multiwave TM process photometers ABB brochure

Field-proven applications Various single component measurements 1,3 butadiene 0 50%; in isobutene 1,3 butadiene 0 70% acetic acid 0 2%; in acetic anhydride acetylene 0 1%; in methane; ethane and ethylene acetylene 0 1.5% ammonia 0 250 ppm; in air cis-2-butene 0 10%; in butadiene CO 2 0 1%; in CH 4 and C 2 H 6 CO 2 0 1%; in ethane CO 2 0 5000 ppm; in ethane CO 2 0 5000 ppm; in propane cyclohexane 0 30%; in cyclohexanol cyclohexanone 0 500 ppm; in cyclohexane ethane 0 10%; in methane and propane ethylene 0 2%; in ethane H 2 S 0 15%; in sour fuel gas hexamethylene imine 0 400 ppm hydrogen cyanide 0 1% MEOH 0 20%; in MTBE/TAME methane 0 6%; in H 2 and water vapor methanol 0 40%; in MTBE methyl bromide 0 100 ppm in air propane 0 6%; in propylene propylene 80 100% total hydrocarbons 0 10%; in propylene total hydrocarbons 0 300 ppm; as butene-1 vinyl acetate 0 10%; in ethylene vinyl acetate 0 20%; in ethylene UV field-proven applications APHA color 0 50 ASTM color 0 8 ASTM units benzene 0 100 ppm; in water Bisphenol A 0 25 ppm and 0-100 ppm; in water chlorine 0 30%; in propane chlorine 0 10%; in NaOH+H 2 0 chlorine 0 2%; in HCl chlorine 0 200 ppm; SO 2 0 200 ppm; in vent gas (2 components) chlorine 0 30%; in propylene dimethyl aniline 0 2000 ppm; in N 2 saturated with water DMAC 0 1000 ppm; in water H 2 S 0 10%; in H 2 H 2 S 0 4%; in N 2 Saybolt color -30 to +15 SO 2 0 500 ppm SO 2 0 5000 ppm; in stack gas styrene 0 20 ppm; butadiene in water total aminobenzenes as aniline 0 50 ppm total phenols as 2-chlorophenol 0 25 ppm; in 33% HCl in H 2 0 ABB brochure ABB Multiwave TM process photometers 7

Partial list of IR and UV absorbing compounds The following lists are provided as a general reference for determining potential IR and UV applications.other considerations will be the remaining stream matrix, stream temperature, stream pressure, and stream phase. The sample must be homogeneous, single phase in order to apply the method. Please provide the needed information on your application to our customer service group so that application engineers can determine the feasibility of your application. Partial list of IR absorbing compounds (potential measurements) Butadiene (1,3) Hydrogen cyanide Butane (n) Hydrogen sulfide Carbon dioxide Isobutane Carbon monoxide Methane Carbon tetrachloride Methyl alcohol Chloroform Methyl azide Cyanogen Methyl chloride Cyclopropane Methyl mercaptan Diazomethane Nitric Acid Dichloroethane Nitric oxide (1,1 and 1,2) Nitroethane Dichloromethane Nitrogen dioxide Dimethyl amine Nitrogen pentoxide Dimethyl ether Nitromethane Dimethyl hydrazine Nitropropane (1&2) Ethane Nitrosyl chloride Ethyl alcohol Nitrous Oxide Ethyl chloride Phosgene Freon-13B Propane Freon-14 Propylene Freon-C-318 Trimethylhydrazine Hydrazine Trimethylamine Hydrogen bromide Vinyl chloride Hydrogen chloride Water Partial list of UV absorbing compounds (potential measurements) Acetic acid Hydrogen sulfide Acetone Iodine Ammonia Mercury Aniline Methyl mercaptan Anthracene Naphthalene Benzene Nickel carbonyl Bromine Nitrobenzene Carbon disulfide Ozone Carbon tetrachloride Perchloroethane Chlorine Phenol Chlorine dioxide Phosgene Chlorophenol (o,m,p) Pyridine Dioxane Sodium sulfide Ethylbenzene Styrene Ferric chloride Sulfur Fluorine Sulfur dioxide Furfural Toluene Hydrogen peroxide Xylene (o, m, p) 8 ABB Multiwave TM process photometers ABB brochure

Enhanced applications capability To enhance the application capability of the Multiwave Photometer, six options are available. Optical span filter The optical span filter for the Multiwave Photometer provides the operator with an alternate means of checking the analyzer performance. It is most often used when the process makes it difficult to readily acquire a calibration standard, and when normal calibration methods would be difficult to accomplish or unsafe. Temperature and pressure compensation gas samples Temperature Compensation is available on analyzers that do not have cell heat. It is intended to be used for vapor applications.there are two types of temperature compensation available: Gas Law Compensation Temperature compensation is based upon the Ideal Gas Law and requires no calibration or set up. An example of where Gas Law Compensation may be useful is for streams at ambient temperature. Empirical Compensation Temperature compensation is based on experimental data. It requires calibration in the factory lab. Pressure compensation Pressure compensation is used on vapor applications only. It is recommended on suppressed range applications such as 90 100% chlorine. Two types of pressure compensation are available: Optical span filter Gas Law Compensation Pressure compensation is based on the Ideal Gas Law and requires no calibration. It is used in selected applications where the gas sample does not have a fine line spectrum. Some common compounds with fine line spectra are carbon monoxide, carbon dioxide, methane, and ammonia. Empirical Compensation Pressure compensation is based on experimental data. It requires calibration in the factory lab. This type of compensation is recommended on suppressed ranges and on applications susceptible to pressure broadening effects ABB brochure ABB MultiwaveTM process photometers 9

PFO3372 fiber optic process photometer This option involves remote sample interfacing with the Multiwave Photometer. The Fiber Optic Waveguide eliminates the need to transport sample to the analyzer. With this option, the light is transmitted via one waveguide to the sample. Then, a second waveguide returns the sample modified light from the sample cell to the detector. Fiber Optics is an effective option in applications where... the sample stream is highly toxic highly corrosive products are analyzed streams are at high temperature streams are at high pressure the sample is at high vacuum the sample needs to remain sanitary a fast response time is required all of the above, or any combination of the above conditions apply Moisture applications such as water in acids, water in methanol, water in hydrocarbons, or hydrocarbons in water are good candidates for the fiber optic option. Applications that require a fast response time, such as monitoring the Lower Explosive Limit (LEL) for hydrocarbons in air, should also be considered. NOTE: Current applications of fiber optics are limited to the UV/Visible (250-800 nm) and NIR (800-2100 nm). 10 ABB Multiwave TM process photometers ABB brochure

VN2300 communications board The ABB Process Photometer features a VN2300 (formerly VIstaNET) Communications Board option. The VN2300 Remote User Interface (RUI) presents the user with a graphical interface for operation and configuration at a remote PC. The following operations are available via the RUI at the remote PC: Remote Maintenance via modem Direct calculation of Matrix coefficients Direct calculation of Linearity coefficients Reports, Tables and Applications Data Sheets can be printed and reviewed Ambient air applications The PIR3502 photometer interfaced with a multi-reflective long path gas cell can be used in ambient air monitoring applications. Multiple stream Sample Handling Systems combined with the ABB Process Photometer have been used to measure up to 20 points for the detection of toxic gases. 0 50 ppm Acrylonitrile and 0 50 ppm Stryrene 0 25 ppm Ethylene Oxide and 0 25 ppm Propylene Oxide 0 50 ppm Phosgene 0 25 ppm Carbon Tetrachloride and 0 25 ppm Chloroform 0 100 ppm Divinylbenzene and 0 100 ppm Ethylbenzene 0-200 ppm ABB brochure ABB Multiwave TM process photometers 11

Contact us ABB Inc. 843 N. Jefferson Street Lewisburg, WV 24901 USA Phone: 1 304 647 4358 Fax: 1 304 645 4236 E-Mail: analyzeit@us.abb.com www.abb.com/analytical Note: We reserve the right to make technical changes or modify the contents of this document without prior notice. With regard to purchase orders, the agreed particulars shall prevail. ABB does not accept any responsibility whatsoever for potential errors or possible lack of information in this document. We reserve all rights in this document and in the subject matter and illustrations contained therein. Any reproduction, disclosure to third parties or utilization of its contents - in whole or in part - is forbidden without prior written consent of ABB. 9AKK105408A5673 Copyright 2012 ABB. All rights reserved.