Review of NSOM Microscopy for Materials



Similar documents
From apertureless near-field optical microscopy to infrared near-field night vision

5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy

NEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH STM AND AFM PROBES

Near-field scanning optical microscopy (SNOM)

Scanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale

DOE Solar Energy Technologies Program Peer Review. Denver, Colorado April 17-19, 2007

Near-field optics and plasmonics

Apertureless Near-Field Optical Microscopy

Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications

It has long been a goal to achieve higher spatial resolution in optical imaging and

Basic principles and mechanisms of NSOM; Different scanning modes and systems of NSOM; General applications and advantages of NSOM.

Nano Optics: Overview of Research Activities. Sergey I. Bozhevolnyi SENSE, University of Southern Denmark, Odense, DENMARK

CREOL, College of Optics & Photonics, University of Central Florida

Nano-Spectroscopy. Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale

Preface Light Microscopy X-ray Diffraction Methods

Raman spectroscopy Lecture

PHYSICAL METHODS, INSTRUMENTS AND MEASUREMENTS Vol. IV Femtosecond Measurements Combined With Near-Field Optical Microscopy - Artyom A.

Optical Microscopy Beyond the Diffraction Limit: Imaging Guided and Propagating Fields

Near-Field Scanning Optical Microscopy: a Brief Overview

5.33 Lecture Notes: Introduction to Spectroscopy

Raman Spectroscopy. 1. Introduction. 2. More on Raman Scattering. " scattered. " incident

NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH POINTED PROBES

Raman Spectroscopy Basics

Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe. Keywords: Carbon Nanotube, Scanning Probe Microscope

Raman Scattering Theory David W. Hahn Department of Mechanical and Aerospace Engineering University of Florida

Lecture 20: Scanning Confocal Microscopy (SCM) Rationale for SCM. Principles and major components of SCM. Advantages and major applications of SCM.

Microscopy: Principles and Advances

Group Theory and Chemistry

Electromagnetic Radiation (EMR) and Remote Sensing

Solar Energy. Outline. Solar radiation. What is light?-- Electromagnetic Radiation. Light - Electromagnetic wave spectrum. Electromagnetic Radiation

LabRAM HR. Research Raman Made Easy! Raman Spectroscopy Systems. Spectroscopy Suite. Powered by:

Infrared Spectroscopy: Theory

Laser Based Micro and Nanoscale Manufacturing and Materials Processing

Lecture 4 Scanning Probe Microscopy (SPM)

Blackbody radiation derivation of Planck s radiation low

(Nano)materials characterization

3D Raman Imaging Nearfield-Raman TERS. Solutions for High-Resolution Confocal Raman Microscopy.

Surface plasmon nanophotonics: optics below the diffraction limit

Physics 441/2: Transmission Electron Microscope

Take away concepts. What is Energy? Solar Energy. EM Radiation. Properties of waves. Solar Radiation Emission and Absorption

LabRAM HR Evolution. Research Raman Made Easy!

Broadband THz Generation from Photoconductive Antenna

Scanning Probe Microscopy

UNIVERSITY OF SOUTHAMPTON. Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices.

Scanning probe microscopy AFM, STM. Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication

1. Basics of LASER Physics

Section 6 Raman Scattering (lecture 10)

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

STM and AFM Tutorial. Katie Mitchell January 20, 2010

- particle with kinetic energy E strikes a barrier with height U 0 > E and width L. - classically the particle cannot overcome the barrier

F en = mω 0 2 x. We should regard this as a model of the response of an atom, rather than a classical model of the atom itself.

Nanoscale Resolution Options for Optical Localization Techniques. C. Boit TU Berlin Chair of Semiconductor Devices

Optical Communications

Lecture 1: Basic Concepts on Absorption and Fluorescence

Laser-induced surface phonons and their excitation of nanostructures

Luminescence study of structural changes induced by laser cutting in diamond films

Applied Optics and Optical Materials at the Colorado School of Mines

where h = J s

Chapter 4. Microscopy, Staining, and Classification. Lecture prepared by Mindy Miller-Kittrell North Carolina State University

Spectroscopy and Regions of the Spectrum

Apertureless scanning near-field optical microscopy: a comparison between homodyne and heterodyne approaches

High-Concentration Submicron Particle Size Distribution by Dynamic Light Scattering

Synthetic Sensing: Proximity / Distance Sensors

Pump-probe experiments with ultra-short temporal resolution

Development of Optical Wave Microphone Measuring Sound Waves with No Diaphragm

Blackbody Radiation References INTRODUCTION

Acousto-optic modulator

Nanoscience Course Descriptions

Overview. What is EMR? Electromagnetic Radiation (EMR) LA502 Special Studies Remote Sensing

Microscopie à force atomique: Le mode noncontact

Ultrahigh-efficiency solar cells based on nanophotonic design

Components for Infrared Spectroscopy. Dispersive IR Spectroscopy

7/3/2014. Introduction to Atomic Force Microscope. Introduction to Scanning Force Microscope. Invention of Atomic Force Microscope (AFM)

Molecular Spectroscopy

Defect studies of optical materials using near-field scanning optical microscopy and spectroscopy

MISCIBILITY AND INTERACTIONS IN CHITOSAN AND POLYACRYLAMIDE MIXTURES

Size effects. Lecture 6 OUTLINE

Limiting factors in fiber optic transmissions

Supporting Information

Edited by. C'unter. and David S. Moore. Gauglitz. Handbook of Spectroscopy. Second, Enlarged Edition. Volume 4. WlLEY-VCH. VerlagCmbH & Co.

Fiber Optics: Fiber Basics

- thus, the total number of atoms per second that absorb a photon is

Applications of confocal fluorescence microscopy in biological sciences

Blackbody radiation. Main Laws. Brightness temperature. 1. Concepts of a blackbody and thermodynamical equilibrium.

Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture

Cracks detection by a moving photothermal probe

Transcription:

Review of NSOM Microscopy for Materials Yannick DE WILDE (dewilde@optique.espci.fr) ESPCI Laboratoire d Optique Physique UPR A0005-CNRS, PARIS, FRANCE

Outline : Introduction : concept of near-field scanning optical microscopy (NSOM) A. Aperture NSOM B. Scattering type NSOM C.Thermal Radiation Scanning Tunnelling Microscope D.NSOM with active fluorescent nano object

Far-field optical microscopy Resolution limit : Image plane Airy spot Object plane Rayleigh criterion : Ducourteux, thèse - ESPCI Numerical aperture : NA=n sinθ Example : λ~0.5 µm (visible) r = 0.6 λ nsin θ ref : http://www.olympusmicro.com/ n = 1 sin θ = 0.95 r 320 nm

Far-field optical microscopy Resolution limit : Image plane Airy spot Object plane Rayleigh criterion : Ducourteux, thèse - ESPCI Numerical aperture : NA=n sinθ Example : λ~0.5 µm (visible) r = 0.6 λ nsin θ n = 1 sin θ = 0.95 r 320 nm

Near-field :definition Source 10 nm k=(ω/c)n z x E ( ) = Ê( ) i k x+ k y+ k z x, y, z k, k ;0 e x y z dk dk x y x y Spatial Fourier transform 2 2 2 ( ) k = k k k with Im{k z } 0 z x y Plane waves : i kxx+ k y y ikz 2 2 2 e kx + k y k e, Low spatial frequencies Evanescent waves : i kxx+ k y y kzz 2 2 2 e kx + k y > k e, High spatial frequencies Distance is a low-pass filter!

Near-field scanning optical microscopy NSOM : principle

Near-field scanning optical microscopy NSOM : principle Piezoelectric scanning unit

A. Aperture NSOM Synge s idea (1928) to illuminate the sample through a subwavelength hole Synge, Phylos. Mag. 6, 356 (1928)

A. Aperture NSOM Practical realization : D. W. Pohl (1984) - Appl. Phys. Lett. 44, 651 (1984) Subwavelength hole on an AFM scanning unit J. A. Veerman, et al. Appl. Phys. Lett. 72, 3115 (1998).

A. Aperture NSOM Different operating modes

Single fluorescent molecules : A. Aperture NSOM Applications : luminescence z y x J.A. Veerman, et al., J. Microsc. 194, 477 (1999) Analyzer Detector Organic molecule : DiIC18 Molecule dipole // z Image : 1.2 x1.2 µm Field distribution around fiber tip aperture (incident polarization // x) Possibility to know dipole orientation from image symmetry. Les nouvelles microscopies Belin (2006)- images L. Aigouy

A. Aperture NSOM Applications : luminescence Luminescence in quantum heterostructures : Global luminescence spectrum Local spectra Energy resolved imaging V. Emiliani, et al., Phys. Rev. B 64, 155316 (2001).

B. Scattering type NSOM s-nsom : Principle Light scattering by subwavelength objects : Classical (far field) microscopy image Each nano particle = dipole Dipole moment Scattering cross section p = ε mαe0 4 k Cscat ( ω) = α 6π 2 Image size: 35 µm x 35 µm Scattered intensity I C E scat 2 0 Gold beads (φ ~ 50 nm ) Visible illumination ( λ ~ 500 nm )

B. Scattering type NSOM s-nsom : Principle Controlled displacement of a single subwavelength scatterer Idea : In practice : Recording of scattered signal vs. AFM tip position Near-field optical image with resolution ~ φ

Vertical tip modulation B. Scattering type NSOM ω s-nsom : Principle ω - To extract E tip (ω) from the background - Surface topography ( AFM, «tapping» mode )

B. Scattering type NSOM Example of s-nsom design Two modes : Visible : λ=655 nm Infrared : λ=10.6 µm Y. De Wilde, F. Formanek, L. Aigouy, Rev. Sci. Instrum. 74, 3889 (2003)

s-nsom with visible or infrared laser illumination : experimental results SUBWAVELENGTH HOLES (φ=200nm) : INFRARED imaging Microscopie électronique (C. Bainier et D. Courjon) Formanek, De Wilde, Aigouy, J. Appl. Phys. 93, 9548 (2003) AFM AFM (topography) GDR Optique de champ proche Appl. Optics 42, 691 (2003) s-nsom 1.18 µm 1.21 µm AFM (Profile) Optical resolution ~ 30-50 nm ~ λ/200 SNOM (3µmx3µm) Infrared illumination λ=10,6 µm

s-nsom:relation to materials dielectric functions The optical signal is due to scattering of the coupled probe dipole image dipole system Probe dipole E 0 p = α E 0 Tip r t ε t d Scattering cross section 4 k Cscat ( ω) = α 6π E = E 0 + E image eff 2 Effective polarizability α eff ( 1+ β ) α = αβ 1 16 π d 3 Image dipole p =βp ε s Sphere dipole α = 4π r ε 3 t 1 t εt + 2 Image dipole β = ε s 1 ε + 1 s E dipole = p 2π r 3 B. Knoll and F. Keilmann, Opt. Comm. 182, 321 (2000).

Relation to materials properties ( IR, λ ~ 10µm ) Doping in Si SiC Au SiC R. Hillenbrand et al., Nature 418, 159 (2002) Phonon-polariton resonance in α eff Nanolett. 6, 774 (2006). A. Huber, et al., A. Lahrech, et al., Appl. Phys. Lett. 71, 575 (1997). Amorphous vs. crystalline SiC N. Ocelic and R. Hillenbrand Nature Mater. 3, 606 (2004). Crystal structure R. Hillenbrand, et al. Collaboration with Infineon (J. Wittborn) (Presented at NFO9 - to be published)

s-nsom : Nano Raman spectroscopy Typical molecule : Incident radiation ν Scattered radiation C scat ~10-30 cm 2 Solution : local field enhancement ν 0 h(ν 0 -ν) Material identification via the energy of molecular vibrations Lightning rod effect SERS Ducourtieux et al., Phys. Rev. B 64, 165403 (2001). TERS Anderson et al., Materials Today (2005).

s-nsom : Nano Raman spectroscopy TERS on Carbon nanotubes Nano Raman Imaging N. Anderson J. Opt. A: Pure Appl. Opt. 8, S227 (2006). TERS on strained silicon H. Qian, et al., Phys. Stat. Sol. (b) 243, 3146 (2006). N. Hayazawa, et al., SPIE Newsroom 10.1117/2.1200611.0426

Quantum cascade lasers s-nsom-imaging working semiconducting devices InGaAs/AlInAs, GaAs/AlGaAs, InAs/AlSb λ: mid-ir (λ 3-24 µm) & THz (λ 60-200 µm) TEM image ur E k r ~20 µm mm 55 nm SEM Active area 15 µm R. Colombelli (Institut Electronique Fondamentale, Orsay,FR) V. Moreau - M. Bahriz (PhD students) L. Wilson, A. Krysa (University of Sheffield,UK) Y. De Wilde (ESPCI, Paris,FR) P.-A. Lemoine (PhD student)

Quantum cascade lasers Air confinement structure s-nsom-imaging working semiconducting devices Wavelength (µm) 7.8 7.75 7.7 7.65 7.6 7.55 (b) (c) 300K Power(a.u.) λ = 7.78 µ m n eff = 3.4 (a) 1280 1300 1320 Wave number (cm -1 ) Laser cavity modes λ δy = = 1. 14 µ m 2n eff

Quantum cascade lasers Air confinement structure s-nsom-imaging working semiconducting devices Laser cavity modes δ y 1.2 µ m V. Moreau, P.-A. Lemoine, et al., Appl. Phys. Lett. (2007)

Quantum cascade lasers Air confinement structure s-nsom-imaging working semiconducting devices Calculation Experiment V. Moreau, P.-A. Lemoine, et al., Appl. Phys. Lett. (2007)

C. Thermal radiation scanning tunnelling microscope TRSTM

Infrared night vision camera Far-field thermal infrared microscope www.infrared1.com http://cis.jhu.edu Resolution ~ 5 µm Gray body : Spectrum ( λ, ) = Σ ( λ ) ( λ, ) G T B T Detection of thermal radiation emitted by the object itself m

Far-field thermal infrared microscope Image of a point : 550 nm (green) 4 µm (Infrared) Two points 600 nm apart : Resolution limit ~ λ/2

Near-field detection of thermal radiation : TRSTM (Thermal Radiation STM) PRINCIPLE Vertical oscillation Detector Tip Ω Sample Ω Hot plate (sample holder) tip (W) Apertureless SNOM without any external source. Scattering of near-field thermal radiation at the surface at T 0.

Energy selection : TRSTM images with filter at λ = 10.9 µm A B C SiC Au TRSTM A B Topography (AFM) T=170 C C De Wilde, Formanek, Carminati, Gralak, Lemoine, Mulet, Joulain, Chen, Greffet, Nature 444, 740 (2006). Fringes coherence in near-field thermal radiation

Energy selection : TRSTM images with filter at λ = 10.9 µm A B C Prospect for metrology : TRSTM The spectrum of TRSTM signal is specific to each material. Topography (AFM) To use the TRSTM as a local temperature sensor De Wilde, Formanek, Carminati, Gralak, Lemoine, Mulet, Joulain, Chen, Greffet, Nature 444, 740 (2006).

D. Active fluorescent probes L. Aigouy, et al. Appl. Phys. Lett. 87, 184105 (2005). Principle : to use a fluorescent nano object at the extremity of an AFM tip as a local temperature sensor

D. Active fluorescent probes L. Aigouy, et al. Appl. Phys. Lett. 87, 184105 (2005). Principle : to use a fluorescent nano object at the extremity of an AFM tip as a local temperature sensor

Conclusions : NSOM microscopy is an active field of research to achieve optical material characterization Most far-field methods are nowadays accessible in the near-field: luminescence, Raman scattering, Infrared imaging, thermal emission A large variety of NSOM types have been developed : Aperture-probe, scattering type-nsom, TRSTM,active probes. Current trend : To use new concepts such as optical nano antenna to improve the NSOM efficiency. T.H. Taminiau, et al., Nanolett. 7,.28 (2007). J. N. Farahani, et al., Phys. Rev. Lett. 95, 017402 (2005)