AGH - ZEISS Workshop on Focused Ion Beam techniques. Kraków,

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1 AGH - ZEISS Workshop on Focused Ion Beam techniques Kraków, AGH University of Science and Technology Faculty of Metal Engineering and Industrial Computer Science Al. Mickiewicza 30, Kraków, Poland

2 Focused Ion Beam (FIB) is a relatively new technique in Central and Eastern Europe. Therefore AGH and ZEISS are organizing the Workshop presenting FIB background and applications combined with demos on NEON 40EsB CrossBeam workstation, dedicated especially to researchers from those countries. Participation of attendees from Central and Eastern Europe (so-called new EC countries ) is sponsored by the ESTEEM project (Enabling Science and Technology through European Electron Microscopy). The major aim of this project is the dissemination of knowledge throughout the European microscopy community. Location The Workshop will take place in Kraków ( at the AGH University of Science and Technology, Al. Mickiewicza 30, Kraków, building A2, ground floor, (Dept. of Physical and Powder Metallurgy, Faculty of Metals Engineering and Industrial Computer Science). Lunches will be served at the Krakus restaurant: 15 Reymonta St. (ul. Reymonta 15) 5 minutes on foot from the AGH-UST. Language The language of the Workshop is English. Workshop fee There is no Workshop fee, however the organizers do not cover accommodation and travel costs. For members of the ESTEEM project, accommodation from 8 to in the AGH guest-house or in Antica hotel is free of charge. Workshop proceedings Registered participants will receive the Proceedings (copy of the slides presented by invited speakers) by registration. Organizing Committee Aleksandra Czyrska-Filemonowicz (Chairperson) Maciej Zietara (Secretary), Grzegorz Cempura, Beata Dubiel, Adam Gruszczynski, Grzegorz Michta, Tomasz Moskalewicz Contact Maciej Zietara, MSc AGH University of Science and Technology Faculty of Metals Engineering and Industrial Computer Science Al. Mickiewicza 30 (building A2), Kraków, Poland tel.: ; fax: [email protected]

3 Final Programme venue: AGH-UST Krakow, building A2, ground floor date: Tuesday ( ) : Registration : Opening : Dr Heinz-Josef Penkalla (Forschungszentrum Jülich) FIB - a modern tool for material analysis : Dr Carsten Waltenberg (ZEISS) CrossBeam technology: an overview : coffee break : Dr Fabian Perez-Willard (ZEISS) Applications of CrossBeam : Dr Heiner Jaksch (ZEISS) Low loss BSE Imaging : Dr Stefan Zaefferer (Max-Planck-Institut für Eisenforschung Düsseldorf) 3D orientation microscopy by EBSD-FIB tomography: what can be done, what can't? : lunch : FIB demonstration (Group 1 and Group 2) Workshop dinner Wednesday ( ) : FIB demonstration (Group 3 and Group 4) Lunch

4 Group 1: FIB demo on Tuesday, Andrzejczuk Mariusz 2. Arabaż Sebastian 3. Bator-Brobierz Agnieszka 4. Duygulu Ozgur 5. Labisz Krzysztof 6. Pawlyta Mirosława 7. Płociński Tomasz 8. Rodak Kinga 9. Ulfat Intikhab 10. Wieciński Piotr Group 2: FIB demo on Tuesday, Staff and PhD students of the Institute of Metallurgy and Materials Science of PAS 1. Bernat Katarzyna 2. Bijak Marcin 3. Faryna Marek 4. Grzonka Justyna 5. Janus Anna Maria 6. Kornewa Anna 7. Major Łukasz 8. Major Roman 9. Pomorska Małgorzata 10. Sypień Anna 11. Wojewoda-Budka Joanna Groups 3 and 4: FIB demo on Wednesday, : Staff from the Research Institute for Technical Physics and Materials Science, Budapest - Staff and PhD students of the AGH University of Science and Technology

5 The Workshop is kindly sponsored by Carl Zeiss NTS GmbH ( and by the European Commission within ESTEEM ( ) project