ni.com/sts NI Semiconductor Test Systems

ni.com/sts NI Semiconductor Test Systems

Lower the Cost of Test With Semiconductor Test Systems The Semiconductor Test System (STS) series features fully production-ready test systems that use NI technology in a form factor suitable for a semiconductor production test environment. The STS combines the NI PXI platform, TestStand test management software, and LabVIEW graphical programming inside a fully enclosed test head. Its tester in a head design houses all the key components of a production tester including system controllers; DC, AC, and RF instrumentation; device under test (DUT) interfacing; and device handler/prober docking mechanics. This compact design eliminates the extra floor space, power, and maintenance required by traditional ATE testers that unnecessarily increase the cost of test. Additionally, with the open, modular STS design, you can take advantage of the latest industry-standard PXI modules for more instrumentation and computing power. STS T1 System Accommodates one 18-slot PXI chassis internally. STS T2 System Accommodates up to two 18-slot PXI chassis internally. STS T4 System Accommodates up to four 18-slot PXI chassis internally. The STS series consists of three test system sizes T1, T2, and T4 that accommodate one, two, and four 18-slot PXI chassis (4U, 19 in. rack space), respectively. All test systems support common interfacing infrastructure, so you can scale up to meet exact pin-count and site-count requirements in production as well as scale down for characterization. This ability to scale with common hardware and software infrastructure helps you not only optimize system costs but also simplify data correlation from production to characterization, which accelerates your time to market.

Inside the NI Semiconductor Test System NI PXI Platform Semiconductor Test System Software PXI Chassis and Controller PXI Instrumentation Production Test Cell Features Test Management Software: TestStand System Enclosure Standard Docking and Interfacing Code Module Development: LabVIEW Benefits of a PXI-Based Approach for RF and Mixed-Signal Test The STS is built on the industry-standard PXI hardware platform. Adopted across multiple industries, PXI is an open platform governed by the PXI Systems Alliance with more than 1,500 products from over 60 vendors. PXI chassis provide a high-speed, high-bandwidth PCI Express bus for data sharing and integrated timing and synchronization. PXI also offers a framework for using commercial off-the-shelf (COTS) technologies such as the latest multicore processors and FPGAs. To take advantage of the latest commercial computing power while meeting the long-term life-cycle requirements of industrial environments, the processors for PXI controllers are selected from Intel s embedded roadmap, which features controllers designed for long-term industrial use. For instrumentation, the STS takes full advantage of NI s cutting-edge PXI instruments for DC (IV), AC, and RF, along with common system resources such as digital pin electronics and power supplies. For world-class software capability, the STS harnesses the power of LabVIEW and TestStand. Though based on the broadly used NI PXI platform, the STS is designed to meet the specific needs of the semiconductor production test environment. The tester in a head design provides a compact, zero-footprint system enclosure with manipulator integration for docking to handlers or probers. The STS incorporates system cabling, a spring probe interface, a standard device interface board infrastructure with a common device interface board design, and system utilities such as system status monitoring and system calibration. With these features, the STS comes ready to integrate into a semiconductor production test cell.

Semiconductor Test System Traditional ATE systems require major costly retooling efforts as generations of test systems become obsolete or unable to meet new test requirements, but the nature of the open PXI architecture of the STS helps us retain our original investment and build upon it rather than throw it away. Glen Peer, Director of Test, Integrated Device Technology All the systems share common, interchangeable device interface boards, which offer scalability to various pin-count and site-count requirements. Overall, the STS is designed to provide cost-optimized, high-performance test solutions for RF and mixed-signal test of RF/analog-centric devices such as RF power amplifiers, microelectromechanical system (MEMS) accelerometers, and power management ICs. With an open, modular design, the STS offers you a framework to evolve test capabilities and meet next-generation test requirements. This means you can upgrade or augment key components with the latest PXI instrumentation, the newest PXI controllers featuring the best COTS computing technology, or even standard 19 in. rack equipment for system augmentation. This protects your investment in the test system over multiple technology generations and gives you the ability to cost-effectively adapt to changing requirements.

Powerful Software Tools to Develop, Debug, and Deploy Test Programs The STS includes TestStand with added features for semiconductor test management, LabVIEW for code module development, and built-in system utilities for system calibration, diagnostics, resource monitoring, and control. With the STS operator interface, you can easily select, run, and view key test program data all on one powerful interface. TestStand At the center of the STS is TestStand ready-to-run test management software, which is designed to help you quickly develop and deploy test programs. With TestStand, you can develop test sequences that integrate code modules written in multiple programming languages. Users can easily customize execution flow, reporting, database logging, and connectivity to other enterprise systems. Key features include: Test Sequence Editor with multisite support Operator interface DUT binning Handler/prober integration Flexible debugging tools Standard Test Data Format (STDF) with database connectivity Pin and channel mapping for DUT-centric test programming Integration with third-party instrumentation LabVIEW Through an intuitive graphical development environment, LabVIEW simplifies hardware integration and reduces development time by eliminating the complexity of traditional code design. With ready-to-run examples, built-in templates and sample projects, and ready-to-use engineering IP, LabVIEW helps you quickly develop code modules according to the test plans of a given semiconductor device.

Tx Cutting-Edge Instrumentation for RF and Mixed-Signal Semiconductor Test The core STS measurement engine is built on cutting-edge NI PXI instruments, ranging from the industry s first vector signal transceiver to source measure units with revolutionary NI SourceAdapt technology. The overall capability of the STS improves with every new PXI module released by NI or other members of the PXISA. RF Instrumentation NI s world-class RF instrumentation includes vector signal analyzers, signal generators, power meters, vector network analyzers, and vector signal transceivers (VSTs). The 26.5 GHz vector signal analyzer provides a unique combination of bestin-class measurement performance, speed, and flexibility with industry-leading dynamic range and a bandwidth of 765 MHz. Port Modules NI STS With RF Subsystem RF Subsystem The STS is available with RF port expansion modules for multiport RF test. The core of this subsystem is the VST which provides up to 200 MHz of real-time bandwidth for RF signal generation and analysis in a compact 3-slot PXI module. Rx VST You can configure multiple VSTs with RF port expansion modules, and the entire subsystem is fully enclosed inside the STS. With the RF subsystem, the STS delivers a complete production test platform for a broad range of RFICs, including the ubiquitous RF front-end ICs, and emerging devices like the RF MEMS. Up to 48 bidirectional RF ports S-parameter and wideband measurement capability Automatic RF vector calibration Reliable solid-state design DC Instrumentation With the compact, high-precision, and high-speed NI source measure units (SMUs) featuring SourceAdapt technology, you can optimize SMU response even in the presence of capacitive loads. NI SMUs provide powerful DC or voltage-current (VI) test capability with up to 100 fa current measurement resolution for both wafer and package device test. AC Instrumentation NI s broad range of oscilloscopes/digitizers with up to 24 bits or 12.5 GS/s and arbitrary waveform generators with up to 145 MHz analog bandwidth offer AC instrumentation capabilities for devices such as data converters and MEMS accelerometers. Digital, Device Power, and General-Purpose Instrumentation The NI PXI platform features a range of core instrumentation such as digital instruments with per-pin parametric measurement capability, high-speed serial protocols up to 12.5 Gb/s, up to 60 W general-purpose power supplies, and 7½-digit high-performance multimeters for various digital and mixed-signal test requirements.

Enabling Success Every Step of the Way Take advantage of product services, training and certification programs, and professional services that meet your needs during each phase of the application life cycle from planning and development through deployment and ongoing maintenance anywhere throughout the world. Training and Certification Developer training provides the most effective way to increase your productivity and efficiently develop robust, maintainable applications. Operator training helps you develop a skilled workforce of in-house experts. Multiple Training Formats Online Training Customized Training Paths Professional Certifications Product Services Leverage benefits that span across a broad services portfolio to meet the full spectrum of STS application needs. These services are delivered through a comprehensive, tiered program to provide you with flexible choices. Standard Service Program (SSP) Premium Service Program (PSP) PremiumPlus Service Program (PPSP) This coverage helps reduce costs and development time: Technical Support Access to Online Training Software Updates/Upgrades Hardware Maintenance System Assembly For critical application needs that demand a faster response, access SSP entitlements plus offerings such as the following: Extended Hours Technical Support Expanded Online Training Access Advanced Replacement for Hardware and Systems License Management When you require flexible service capabilities, NI offers highly customizable service options for large organizations or deployments: Custom Support Options Unlimited NI Software Access On-Site Calibration Sparing and Repair Management Long-Term Application Support Professional Services The experienced team of NI engineering professionals and Alliance Partners is ready to tackle any challenge you face to ensure your success. Prototyping and Feasibility Analysis Interface Solutions Engineering Consulting and Development Assistance US Corporate Headquarters 11500 N Mopac Expwy Austin, TX 78759-3504 T: 512 683 0100 F: 512 683 9300 info@ni.com International Branch Offices ni.com/global 2014 National Instruments. All rights reserved. LabVIEW, National Instruments, NI, ni.com, NI TestStand, and SourceAdapt are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies. A National Instruments Alliance Partner is a business entity independent from National Instruments and has no agency, partnership, or joint-venture relationship with National Instruments. 351262A-01 16839