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www.keithley.com 1 st Edition Understanding New Developments in Data Acquisition, Measurement, and Control A Practical Guide to High Performance Test and Measurement

To get a free electronic version of this book, visit Keithley s Knowledge Center web page. a greater measure of confidence

Understanding New Developments in Data Acquisition, Measurement, and Control A Practical Guide to High Performance Test and Measurement 1st Edition A G R E A T E R M E A S U R E O F C O N F I D E N C E

Section 1 Data Acquisition and Measurement Overview 1.1 Definition...1-2 1.2 Data Acquisition and Control Hardware...1-3 Section 2 Computer Buses, Protocols, and Hardware 2.1 Computer Hardware Overview...2-2 2.2 Processors....2-2 2.3 Bus Architecture... 2-4 2.4 Industrial Computer Expansion.... 2-8 2.5 Connectivity/Data Communications...2-16 2.6 Networked Instrument Basics.... 2-26 Section 3 Software Overview 3.1 Introduction...3-2 3.2 Development Environments...3-2 3.3 Source Code and Source Code Management....3-7 3.4 Reusable Components...3-7 3.5 System Architecture...3-11 3.6 General Program Design...3-13 3.7 Making Measurements...3-15 Section 4 Basic Component Theory 4.1 Introduction... 4-2 4.2 Passive Components... 4-2 4.3 Op Amp Theory...4-11 4.4 Filters...4-19 4.5 Digital I/O...4-20 Section 5 Basic Analog and Digital I/O 5.1 A/D Conversion... 5-2 5.2 D/A Conversion...5-11 5.3 Interfacing Digital I/O to Applications....5-12 5.4 Isolation....5-17 5.5 Ground Loops....5-19 Section 6 Temperature Measurement 6.1 Temperature... 6-2 6.2 Thermocouples... 6-2 iii

6.3 Resistive Temperature Detectors...6-12 6.4 Thermistors....6-19 6.5 Semiconductor Linear Temperature Sensors.... 6-21 6.6 Thermal Shunting....6-22 Section 7 Strain Measurement 7.1 Strain...7-2 7.2 Poisson s Strain....7-2 7.3 Strain Gauges...7-2 7.4 Gauge Factor.... 7-6 7.5 Sources of Error... 7-6 7.6 Operation...7-7 7.7 Strain Gauge Signal Conditioning...7-10 7.8 Shunt Calibration...7-11 7.9 Load Cells, Pressure Sensors, and Flow Sensors...7-11 7.10 Acceleration, Shock, and Vibration...7-12 Section 8 Related Topics of Interest 8.1 Current Measurements... 8-2 8.2 Connection Theory...8-4 Section 9 Application Examples 9.1 Introduction... 9-2 9.2 OEM/Factory Automation and Data Acquisition... 9-2 9.3 Magnetic Field Monitoring in a Synchrotron Facility... 9-5 9.4 Tensile Test Stand Application.... 9-9 9.5 Burn-In and Stress Testing of Electronic Devices... 9-10 9.6 Performance Characterization of Shock Absorbers.... 9-12 9.7 Instrument-Grade, Low Cost Analog Output Control...9-13 Appendix A Selector Guides for Plug-In Boards, USB Modules, PXI Systems, and External Data Acquisition Instruments Appendix B Glossary... B-1 Appendix C Safety Considerations...C-1 iv

Understanding New Developments in Data Acquisition, Measurement, and Control Section 1 Data Acquisition and Measurement Overview

1 Data Acquisition and Measurement Overview 1.1 Definition Although concepts like data acquisition, test, and measurement can be surprisingly difficult to define completely, most computer users, engineers, and scientists agree there are several common elements in systems used today for these functions: A personal computer (PC) is used to program and control the test and measurement equipment, and to store or manipulate data subsequently. The term PC is used in a general sense to include any computer running any operating system and software that supports the desired result. The PC may also be used for supporting functions, such as real-time graphing or report generation. The PC may not necessarily be in constant control of the data acquisition and measurement equipment, or even remain connected to some pieces of equipment at all times. A test or measurement system can consist of data acquisition plug-in boards for PCs, external board chassis, discrete instruments, or a combination of all these. External chassis and discrete instruments typically can be connected to a PC using either standard communication ports or a proprietary interface board in the PC. The system can perform one or more measurement and control processes using various combinations of analog input, analog output, digital I/O, or other specialized functions. When external instruments are used, most or all of these functions could reside within the instruments. Therefore, measurement and control can be distributed between PCs, stand-alone instruments, and other external data acquisition systems. The difficulty involved in differentiating between terms such as data acquisition, test and measurement, and measurement and control stems from the blurred boundaries that separate the different types of instrumentation in terms of operation, features, and performance. For example, some stand-alone instruments now contain card slots and embedded microprocessors, use operating system software, and operate more like computers than like traditional instruments. Such instruments now make it possible to construct test systems with high channel counts that gather data and log it to a controlling computer at high throughput rates, with high measurement accuracy. Accuracy aside, plug-in boards can transform computers into multi-range digital multimeters, oscilloscopes, or other instruments, complete with user-friendly, on-screen virtual front panels. For the sake of simplicity, this handbook uses the term data acquisition and control broadly to refer to a variety of hardware and software solutions capable 1-2

1 of making measurements and controlling external processes. The term computer is also defined rather broadly. Generally in this handbook, a PC refers to any personal computer running Microsoft Windows 98, or a later Windows version. However, when external instruments are combined with data acquisition boards, the result is often referred to as a hybrid system. Hybrid systems are becoming more common as engineers seek the optimum combination of throughput and accuracy for their test and measurement applications. 1.2 Data Acquisition and Control Hardware Data acquisition and control hardware is available in a number of forms, which offer varying levels of functionality, channel count, speed, resolution, accuracy, and cost. This section summarizes the features and benefits generally associated with the various categories, based on a broad cross-section of products, including external instruments. Refer to Appendix A for a more detailed comparison of plug-in boards and external instruments. 1.2.1 Plug-in Data Acquisition Boards Like display adapters, modems, and other types of expansion boards, plug-in data acquisition boards are designed for mounting in board slots on a computer motherboard. Today, most data acquisition boards are designed for the current PCI (Peripheral Component Interconnect) or earlier ISA (Industry Standard Architecture) buses. ISA and associated data acquisition boards are rapidly becoming legacy products, and largely replaced by PCI. Data acquisition plug-in boards and interfaces have been developed for other buses (EISA, IBM Micro Channel, and various Apple buses), but these are no longer considered mainstream products. In addition, a wide range of USB data acquisition modules are now available for plugging into a PC s USB ports, or USB hubs attached to those ports. As discussed in Section 2, newer PCs may also have PCI Express slots, Table 1-1. Features of plug-in data acquisition boards Inexpensive method of computerized measurement and control. High speed available (100kHz to 1GHz and higher). Available in multi-function versions that combine A/D, D/A, digital I/O, counting, timing, and specialized functions. Good for tasks involving low-to-moderate channel counts. Performance adequate to excellent for most tasks, but electrical noise inside the PC can limit ability to perform sensitive measurements. Input voltage range is limited to approximately ±10V. Use of PC expansion slots and internal resources can limit expansion potential and consume PC resources. Making or changing connections to board s I/O terminals can be inconvenient. 1-3

1 Data Acquisition and Measurement Overview often in combination with PCI slots, particularly in computers built expressly for industrial applications. As a category, plug-in boards offer a variety of test functions, high channel counts, high speed, and adequate sensitivity to measure moderately low signal levels, at relatively low cost. Table 1-1 lists additional attributes of typical boards. 1.2.2 External Data Acquisition Systems The original implementation of an external data acquisition system was a selfpowered system that communicated with a computer through a standard or proprietary interface. As a boxed alternative to plug-in boards, this type of system usually offered more I/O channels, a quieter electrical environment, and greater versatility and speed in adapting to different applications. Another alternative today is a system based on external USB data acquisition modules. 1.2.2.1 USB Data Acquisition Modules USB data acquisition modules offer many advantages over plug-in boards, including plug-and-play capability, better noise immunity, and portability. USB modules do not require opening the PC, because they connect directly to the USB ports via standard cables. The PC identifies the presence of a new device, then prompts the user for the location of the necessary driver software for installation. Table 1-2 lists features of typical USB modules. Table 1-2. Features of USB data acquisition modules True plug and play means a simple connection between the PC and USB module. Because USB modules are external to the PC, they offer performance benefits for noisesensitive measurements. USB 1.1 supports data acquisition rates up to 400kHz. USB 2.0 supports data acquisition rates up to 500kHz in each direction, similar to PCI boards. Most USB modules handle of large array of I/O connections. USB modules are compact and portable. With USB hubs, additional modules can scale up measurement capacity. USB modules can be installed or removed while the PC is running (hot swapping). USB modules have simple power connections, either directly through the bus or through an external power source. 1.2.2.2 External Box/Rack Systems Today, external data acquisition systems often take the form of a stand-alone test and measurement solution oriented toward industrial applications. The applications for which they are used typically demand more than a system based on a PC with plug-in boards can provide, or this type of architecture is simply inappropriate for the application. Modern external data acquisition systems offer: 1-4

1 Applications involving many types of sensors, high channel counts, or the need for stand-alone operation. High sensitivity to low level voltage signals, i.e., approximately 1mV or lower. Applications requiring tight, real-time process control. Like the plug-in board based system, these external systems require the use of a computer for operation and data storage. However, the computer can be built up on boards, just as the instruments are, and incorporated into the board rack. There are several architectures for external industrial data acquisition systems, including VME, VXI, MXI, LXI, CompactPCI, and PXI. These systems use mechanically robust, standardized board racks and plug-in instrument modules that offer a full range of test and measurement functions. Some external system designs include microprocessor modules that support all the standard PC user interface elements, including keyboard, monitor, mouse, and standard communication ports. Frequently, these systems can also run Microsoft Windows and other PC applications. In this case, a conventional PC may only be needed to develop programs or off-load data for manipulation or analysis. Other features of external board-based systems are listed in Table 1-3. Table 1-3. Features of external data acquisition chassis Multiple slots permit mixing-and-matching boards to support specialized acquisition and control tasks and higher channel counts. Chassis offers an electrically quieter environment than a PC, allowing for more sensitive measurements. Use of standard interfaces (IEEE-488, RS-232, USB, FireWire, Ethernet) can facilitate daisy chaining, networking, long distance acquisition, and use with non-pc computers. Dedicated processor and memory can support critical real-time control applications or stand-alone acquisition independent of a PC. Standardized modular architectures are mechanically robust, easy to configure, and provide for a variety of measurement and control functions. Required chassis, modules, and accessories are cost-effective for high channel counts. 1.2.2.2.1 Real-Time Data Acquisition and Control Critical real-time control is an important issue in data acquisition and control systems. Applications that demand real-time control are typically better suited to the type of external system described previously, than to systems based on PC plug-in boards. Although Microsoft Windows has become the standard operating system for PC applications, it is a non-deterministic operating system that can t provide predictable response times in critical measurement and control applications. Therefore, the solution is to link the PC to a system that can operate autonomously and provide rapid, predictable responses to external stimuli. This is accomplished with external systems that have their own dedicated realtime processor and real-time deterministic operating system. 1-5

1 Data Acquisition and Measurement Overview 1.2.2.3 Discrete (Bench/Rack) Instruments Originally, discrete electronic test instruments consisted mostly of single-channel meters, sources, and related instrumentation intended for general-purpose test applications. Over the years, the addition of more channels, communication interfaces and advances in instrument design, manufacturing, and measurement technology have extended the range and functionality of these instruments. New products such as scanners, multiplexers, SourceMeter instruments, counter/timers, nanovoltmeters, micro-ohmmeters, and other specialized instrumentation have made it possible to create computer-controlled test and measurement systems with a large number of channels that offer exceptional sensitivity, resolution, and throughput. Even low channel count instruments can be combined with switch matrices and multiplexers to lower the cost per channel by allowing one set of instruments to service many test inputs while preserving signal integrity. These instruments can also be combined with computers that contain plug-in data acquisition boards to form a hybrid test system. Table 1-4 lists other characteristics of these systems. Table 1-4. Features of discrete instruments for data acquisition Support measurement ranges and sensitivities generally beyond the limits of standard plugin boards and eternal data acquisition systems. Use standard interfaces (e.g., IEEE-488, RS-232, FireWire, USB, and Ethernet) that support long-distance acquisition, compatibility with non-ibm-compatible computers, or use with computers without available expansion slots. Most suitable for measurement of voltage, current, resistance, capacitance, inductance, temperature, etc. May not be effective solutions for some types of specialized sensors or signal conditioning requirements. Generally slower than plug-in boards or external data acquisition systems. More expensive than standard data acquisition systems on a per-channel basis. 1.2.2.4 Hybrid Data Acquisition Systems Hybrid systems are a relatively recent development in external data acquisition systems. A typical hybrid system combines PC plug-in boards, or an external data acquisition system, with discrete instruments to perform the desired test and measurement functions. However, some bench and rackmounted instruments have features that include standard data acquisition functions and expansion capabilities in a compact, instrument-like package, making them stand-alone hybrid systems. These instruments have a user interface is much like a typical DMM product. Hybrid systems that combine plug-in boards, external systems, and discrete instruments may utilize a graphical user interface (GUI) that appears as a virtual instrument on the PC screen. In any case, typical hybrid test system functions include AC and DC voltage and current measurements, temperature and frequency measurements, event counting, timing, triggering, and 1-6

1 process control. They allow the user to get the best combination of speed and accuracy for the application. Figure 1-1. Keithley PXI-based hybrid test system Keithley s Series KPXI (Figure 1-1) is designed for high speed automated production testing as part of a hybrid test system using precision instruments. This series consists of simultaneous data acquisition boards, multi-function analog I/O boards, high speed analog output boards, a 130MS/s digitizer module, digital I/O modules, PXI chassis, embedded PC controllers, MXI bridges (for remote PC control), and GPIB interface cards. KPXI products are designed for optimal integration with precision instrumentation, such as Keithley s Series 2600 System SourceMeter multi-channel I-V test solutions, which feature TSP and TSP-Link that let users take advantage of distributed programming and concurrent execution to perform high speed, automated test sequences across multiple channels independent of a PC operating system and its associa ted communication delays. Table 1-5 summarizes the features of hybrid test s y stem s. 1-7

1 Data Acquisition and Measurement Overview Table 1-5. Features of a hybrid data acquisition and control system Delivers accuracy (typically 18- to 22-bit A/D), range, and sensitivity of benchtop instruments (superior to standard data acquisition equipment). Allows optimization of throughput speed by distributing measurement and control functions to the appropriate hardware. May have a DMM front end with a digital display and front panel controls, or a PC GUI (often a virtual instrument panel), or both. External intruments used in these systems often have built-in data and program storage memory for stand-alone data logging and process control. Uses standard interfaces (IEEE-488, LXI, PXI, Ethernet, etc.) that support long-distance acquisition, and compatibility with non-pc computers. Cost-effective on a per-channel basis. Easily expanded or modified as test requirements change. 1-8

Specifications are subject to change without notice. All Keithley trademarks and trade names are the property of Keithley Instruments, Inc. All other trademarks and trade names are the property of their respective companies. Keithley Instruments, Inc. 28775 Aurora Road Cleveland, Ohio 44139-1891 440-248-0400 Fax: 440-248-6168 1-888-KEITHLEY www.keithley.com Belgium Sint-Pieters-Leeuw Ph: 02-363 00 40 Fax: 02-363 00 64 www.keithley.nl china Beijing Ph: 8610-82255010 Fax: 8610-82255018 www.keithley.com.cn finland Espoo Ph: 09-88171661 Fax: 09-88171662 www.keithley.com france Saint-Aubin Ph: 01-64 53 20 20 Fax: 01-60-11-77-26 www.keithley.fr germany Germering Ph: 089-84 93 07-40 Fax: 089-84 93 07-34 www.keithley.de india Bangalore Ph: 080-26771071-73 Fax: 080-26771076 www.keithley.com italy Milano Ph: 02-553842.1 Fax: 02-55384228 www.keithley.it japan Tokyo Ph: 81-3-5733-7555 Fax: 81-3-5733-7556 www.keithley.jp korea Seoul Ph: 82-2-574-7778 Fax: 82-2-574-7838 www.keithley.co.kr Malaysia Kuala Lumpur Ph: 60-3-4041-0899 Fax: 60-3-4042-0899 www.keithley.com netherlands Gorinchem Ph: 0183-63 53 33 Fax: 0183-63 08 21 www.keithley.nl singapore Singapore Ph: 65-6747-9077 Fax: 65-6747-2991 www.keithley.com.sg sweden Solna Ph: 08-50 90 46 00 Fax: 08-655 26 10 www.keithley.com Switzerland Zürich Ph: 044-821 94 44 Fax: 41-44-820 30 81 www.keithley.ch taiwan Hsinchu Ph: 886-3-572-9077 Fax: 886-3-572-9031 www.keithley.com.tw UNITED KINGDOM Theale Ph: 0118-929 75 00 Fax: 0118-929 75 19 www.keithley.co.uk

Specifications are subject to change without notice. All Keithley trademarks and trade names are the property of Keithley Instruments, Inc. All other trademarks and trade names are the property of their respective companies. Keithley Instruments, Inc. Corporate Headquarters 28775 Aurora Road Cleveland, Ohio 44139 440-248-0400 Fax: 440-248-6168 1-888-KEITHLEY (534-8453) www.keithley.com Copyright 2007 Keithley Instruments, Inc. No. 2812 Printed in the U.S.A. 020735KRRD

To get a free electronic version of this book, visit Keithley s Knowledge Center web page. a greater measure of confidence