KODAK KAF IMAGE SENSOR

Transcription

1 DEVICE PERFORMANCE SPECIFICATION Revision 4.1 MTD/PS-0856 August 31, 2010 KODAK KAF IMAGE SENSOR 7216 (H) X 5412 (V) FULL-FRAME CCD IMAGE SENSOR

2 TABLE OF CONTENTS Summary Specification... 4 Description... 4 Features... 4 Applications... 4 Ordering Information... 5 Device Description... 6 Architecture... 6 Dark Reference Pixels... 7 Dummy Pixels... 7 Active Buffer Pixels... 7 Image Acquisition... 7 Charge Transport... 7 Horizontal Register... 8 Output Structure... 8 Output Load... 9 Physical Description Pin Description and Device Orientation Imaging Performance Typical Operational Conditions Specifications Typical Performance Curves Defect Definitions Operational Conditions Specifications Operation Absolute Maximum Ratings Power-up Sequence DC Bias Operating Conditions AC Operating Conditions Clock Levels Timing Requirements and Characteristics Edge Alignment Frame Timing Frame Timing Detail Line Timing (each output) Pixel Timing Pixel Timing Detail Mode of Operation Power-up Flush Cycle Storage and Handling Storage Conditions ESD Cover Glass Care and Cleanliness Environmental Exposure Soldering Recommendations Mechanical Drawings Completed Assembly Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p2

3 Cover Glass Specification Quality Assurance And Reliability Quality Strategy Replacement Liability of the Supplier Liability of the Customer Reliability Test Data Retention Mechanical Warning: Life Support Applications policy Revision Changes TABLE OF FIGURES Figure 1: Block Diagram... 6 Figure 2: Output Architecture (Left or Right)... 8 Figure 3: Recommended Output Structure Load Diagram Figure 4: Pinout Diagram Figure 5: Spectral Response (color version) Figure 6: Spectral Response (monochrome version) Figure 7: Typical GR - GB QE Difference (color version) Figure 8: Typical Normalized Angle QE (both color and monochrome versions) Figure 9: Typical Anti-blooming Performance Figure 10: Timing Edge Alignment Figure 11: Frame Timing Figure 12: Frame Timing Detail Figure 13: Line Timing Figure 14: Pixel Timing Figure 15: Pixel Timing Detail Figure 16: Power-up Flush Cycle Figure 17: Modified (Slow) Flush Cycle Figure 18: Completed Assembly Drawing (1 of 2) Figure 19: Completed Assembly Drawing (2 of 2) Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p3

4 SUMMARY SPECIFICATION KODAK KAF IMAGE SENSOR 7216 (H) X 5412 (V) FULL FRAME CCD IMAGE SENSOR DESCRIPTION The KODAK KAF is a dual output, high performance CCD (charge coupled device) image sensor with 7216(H) x 5412(V) photoactive pixels designed for a wide range of color and monochrome image sensing applications. Each pixel contains anti-blooming protection by means of a lateral overflow drain thereby preventing image corruption during high light level conditions. In the color version, each of the 6.8μm square pixels are selectively covered with red, green or blue pigmented filters for color separation. The sensor is housed in a 64 pin, x mm DIL ceramic package with1.78 mm pin spacing. FEATURES Ultra-high resolution Broad dynamic range Low noise architecture Large active imaging area APPLICATIONS Professional Digital Still Cameras and Camera Backs Industrial Imaging Aerial Photography Parameter Typical Value Architecture Full Frame CCD; with Square Pixels Total Number of Pixels 7326 (H) x 5494 (V) = 40.2 M Number of Effective Pixels 7256 (H) x 5452 (V) = 39.5M Number of Active Pixels 7216 (H) x 5412 (V) = 39.0M Pixel Size 6.8 µm (H) x 6.8 µm (V) Active Image Size 49.0 mm (H) x 36.8 mm (V) 61.3 mm (diagonal) Aspect Ratio 4:3 Horizontal Outputs 2 Saturation Signal 60 K e - Output Sensitivity 26 μv/e - Quantum Efficiency (color version) R (610nm) G (540nm) B (470nm) 20%, 23%, 18% Quantum Efficiency (monochrome version) (560nm) 30% Read Noise (f=24 MHz) 16 e - Dark Signal (T=40 C) 4 mv Dark Current Doubling Temperature 6.3 C Linear Dynamic Range (f=24 MHz, T=40 C) 71.4 db Horizontal Charge Transfer Efficiency Vertical Charge Transfer Efficiency Blooming Protection (4ms exposure time) 1000X saturation exposure Maximum Data Rate 24 MHz Package CERDIP (sidebrazed, CuW) Cover Glass AR coated, 2 sides All parameters above are specified at T = 25 C, unless noted otherwise. Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p4

5 ORDERING INFORMATION Catalog Number Product Name Description Marking Code 4H0762 KAF CAA-DD-AA Color (Bayer RGB), No Microlens, CERDIP Package (sidebrazed, CuW), Clear Cover Glass with AR coating (both sides), Standard Grade 4H0763 KAF CAA-DD-AE Color (Bayer RGB), No Microlens, CERDIP Package (sidebrazed, CuW), Clear Cover Glass with AR coating (both sides), Engineering Grade 4H0946 KAF AAA-DD-AA Monochrome, No Microlens, CERDIP Package (sidebrazed, CuW), Clear Cover Glass with AR coating (both sides), Standard Grade 4H0947 KAF AAA-DD-AE Monochrome, No Microlens, CERDIP Package (sidebrazed, CuW), Clear Cover Glass with AR coating (both sides), Engineering Grade 4H0845 KEK-4H0845-KAF Evaluation Board (Complete Kit) N/A KAF CA [Serial Number] KAF AA [Serial Number] Please see the User s Manual (MTD/PS-0881) for information on the Evaluation Kit for this part. Please see ISS Application Note Product Naming Convention (MTD/PS-0892) for a full description of naming convention used for KODAK image sensors. Address all inquiries and purchase orders to: Image Sensor Solutions Eastman Kodak Company Rochester, New York Phone: (585) Fax: (585) [email protected] Kodak reserves the right to change any information contained herein without notice. All information furnished by Kodak is believed to be accurate. Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p5

6 1 Test Column 1 Test Column DEVICE DESCRIPTION ARCHITECTURE LODT 1 Test Row 23 LODT 20 V1 V2 V1 V2 5 5 KAF H x 5412V um x 6.8um Pixels LODB LODB 18.4k 4 Blue + 16 Buffer Pixels 18.4k RD 18 Dark Pixels RD RG (Last VCCD Phase = V2) RG VDD VOUTL VSS VDD VOUTR VSS VSUB OG H1L 5.4k (Total HCCD phases = 3672 / Output) * ESD protection circuits not shown 5.4k VSUB OG H1L 24.7k H1 H2 H2 H1 24.7k Figure 1: Block Diagram (The color pattern shown is valid for the color version of this device) Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p6

7 Dark Reference Pixels Surrounding the periphery of the device is a border of light shielded pixels creating a dark region. Within this dark region, exist light shielded pixels that include 24 leading dark pixels on every line. There are also 18 full dark lines at the start and 23 full dark lines at the end of every frame. Under normal circumstances, these pixels do not respond to light and may be used as a dark reference. Dummy Pixels Within each horizontal shift register there are 20 leading pixels. These are designated as dummy pixels and should not be used to determine a dark reference level. Active Buffer Pixels 20 unshielded pixels adjacent to any leading or trailing dark reference regions are classified as active buffer pixels. These pixels are light sensitive but they are not tested for defects and non-uniformities. Of these 20 pixels, for the color version, the outermost 4 pixels are covered with blue pigment while the remaining are arranged in a Bayer pattern (R, GR, GB, B). The monochrome version does not have this pattern coating. IMAGE ACQUISITION An electronic representation of an image is formed when incident photons falling on the sensor plane create electron-hole pairs within the device. These photoninduced electrons are collected locally by the formation of potential wells at each pixel site. The number of electrons collected is linearly dependent on light level and exposure time and non-linearly dependent on wavelength. When the pixel's capacity is reached, excess electrons are discharged into the lateral overflow drain to prevent crosstalk or blooming. During the integration period, the V1 and V2 register clocks are held at a constant (low) level. CHARGE TRANSPORT The integrated charge from each pixel is transported to the output using a two-step process. Each line (row) of charge is first transported from the vertical CCDs to a horizontal CCD register using the V1 and V2 register clocks. The horizontal CCD is presented a new line on the falling edge of V2 while H1 is held high. The horizontal CCDs then transport each line, pixel by pixel, to the output structure by alternately clocking the H1 and H2 pins in a complementary fashion. A separate connection to the last H1 phase (H1L) is provided to improve the transfer speed of charge to the output amplifier. On each falling edge of H1L a new charge packet sensed by the output amplifier. Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p7

8 HORIZONTAL REGISTER Output Structure H2 H1 HCCD Charge Transfer VDD H1L OG RG RD Floating Diffusion VOUTX X= L or R VSS Source Follower #1 Source Follower #2 Source Follower #3 Figure 2: Output Architecture (Left or Right) The output consists of a floating diffusion capacitance connected to a three-stage source follower. Charge presented to the floating diffusion (FD) is converted into a voltage and is current amplified in order to drive off-chip loads. The resulting voltage change seen at the output is linearly related to the amount of charge placed on the FD. Once the signal has been sampled by the system electronics, the reset gate (RG) is clocked to remove the signal and FD is reset to the potential applied by reset drain (RD). Increased signal at the floating diffusion reduces the voltage seen at the output pin. To activate the output structure, an off-chip current source must be added to the VOUT pin of the device. See Figure 3. Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p8

9 Output Load VDD = +15 V Iout = 5 ma VOUT 0.1 µf 2N3904 or Equiv. 140 Ohms Buffered Video Output 1k Ohms Figure 3: Recommended Output Structure Load Diagram. Note: Component values may be revised based on operating conditions and other design considerations. Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p9

10 SUB LOD H1L OG RG RD VSS VOUTL VDD H2 H2 H1 H1 SUB SUB SUB H1 H1 H2 VDD H2 VOUTR VSS RD RG OG H1L LOD SUB SUB V1 V1 V2 V2 LOD SUB SUB SUB LOD V2 V2 V1 V1 SUB PHYSICAL DESCRIPTION Pin Description and Device Orientation Figure 4: Pinout Diagram Note: Pins with the same name are to be tied together on the circuit board and have the same timing. Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p10

11 Pin Name Description Pin Name Description 1 SUB Substrate 64 SUB Substrate 2 No Connection 63 V1 Vertical Phase 1 3 LOD Lateral Overflow Drain 62 V1 Vertical Phase 1 4 H1L Horizontal Phase 1, Last Gate 61 V2 Vertical Phase 2 5 OG Output Gate 60 V2 Vertical Phase 2 6 RG Reset Gate 59 LOD Lateral Overflow Drain 7 RD Reset Drain 58 No Connection 8 VSS Output Amplifier Return 57 SUB Substrate 9 VOUTL Video Output: Left 56 No Connection 10 VDD Output Amplifier Supply No Connection 11 H2 Horizontal Phase 2 54 No Connection 12 H2 Horizontal Phase 2 53 No Connection 13 H1 Horizontal Phase 1 52 No Connection 14 H1 Horizontal Phase 1 51 No Connection 15 SUB Substrate 50 No Connection 16 SUB Substrate 49 No Connection 17 No Connection 48 SUB Substrate 18 SUB Substrate 47 No Connection 19 H1 Horizontal Phase 1 46 No Connection 20 H1 Horizontal Phase 1 45 No Connection 21 H2 Horizontal Phase 2 44 No Connection 22 H2 Horizontal Phase 2 43 No Connection 23 VDD Output Amplifier Supply 42 No Connection 24 VOUTR Video Output: Right 41 No Connection 25 VSS Output Amplifier Return 40 SUB Substrate 26 RD Reset Drain 39 No Connection 27 RG Reset Gate 38 LOD Lateral Overflow Drain 28 OG Output Gate 37 V2 Vertical Phase 2 29 H1L Horizontal Phase 1, Last Gate 36 V2 Vertical Phase 2 30 LOD Lateral Overflow Drain 35 V1 Vertical Phase 1 31 No Connection 34 V1 Vertical Phase 1 32 SUB Substrate 33 SUB Substrate Note: The leads are on a 0.070" spacing Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p11

12 IMAGING PERFORMANCE TYPICAL OPERATIONAL CONDITIONS Description Condition - Unless otherwise noted Notes Frame time (t readout + t int ) 1327 ms Includes overclock pixels Integration time (tint) Horizontal clock frequency 250 ms 24 MHz Temperature 25 C Room temperature Mode Operation integrate readout cycle Nominal operating voltages and timing with min. vertical pulse width t Vw = 17 s SPECIFICATIONS Description Symbol Min. Nom. Max. Units Notes Saturation Signal Quantum Red (610nm) Efficiency Green (540nm) Blue (470nm) Quantum Monochrome (560nm) Efficiency High Level Photoresponse Non- Linearity (color version only) Photo Response Non-Uniformity Vsat Ne - sat Q/V QE max k k mv e - μv/e - %QE %QE %QE Sample 15 Plan 1 die design QE max 30 %QE design PRNL 5 10 % 2 die PRNU r,g,b %p-p 3 die Readout Dark Current Vdark,read 4 10 mv 5 die Integration Dark Signal Vdark,int mv/s 4 die Dark Signal Non-Uniformity DSNU 2 8 mv p-p 6 die Dark Signal Doubling Temperature T 6.3 C design Read Noise NR e - rms die Total Noise N 21 e - rms 7 design Linear Dynamic Range DR 71.4 db 8 design (color version only) Red-Green Hue Shift RGHueUnif Blue-Green Hue Shift BGHueUnif 6 12 % 9 die Horizontal Charge Transfer Efficiency HCTE die Vertical Charge Transfer Efficiency VCTE die Blooming Protection X_ab x Esat 11 design DC Offset, output amplifier Vodc V 12 die Output Amplifier Bandwidth f -3dB MHz 13 design Output Impedance, Amplifier ROUT Ohms die Reset Feedthrough V rft 1 V 14 design Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p12

13 Notes: 1. Increasing output load currents to improve bandwidth will decrease these values. 2. Worst-case deviation (from 10 mv to Vsat min), relative to a linear fit applied between 0 and 65% of Vsat. 3. Difference between the maximum and minimum average signal levels of 146 x 146 blocks within the sensor on a per color basis as a % of average signal level. 4. T=60 C. Average non-illuminated signal with respect to over-clocked vertical register signal. 5. T=60 C, 24MHz pixel rate, readout time=900 ms 6. T=60 C. Absolute difference between the maximum and minimum average signal levels of 146 x 146 blocks within the sensor. 7. rms deviation of a multi-sampled pixel measured in the dark including amplifier and dark current shot noise log(Vsat/V N ) - see Note 6 and note 1. VN = NR * Q/V. 9. Gradual variations in hue (red with respect to green pixels and blue with respect to green pixels) in regions of interest (146 x 146 blocks) within the sensor. The specification refers to the largest value of the response difference imaged in Daylight 5500 K. 10. Measured per transfer at Vsat min. Typically, no degradation in CTE is observed up to 24 MHz. 11. X_ab is the number of times above the Vsat illumination level that the sensor will bloom by spot size doubling. The spot size is 10% of the imager height. X_ab is measured at 4ms. 12. Video level offset with respect to ground 13. Last stage only. Assumes 10 pf off-chip load. 14. Amplitude of feed-through pulse in VOUT due to RG coupling. 15. Die indicates a parameter that is measured on every sensor during the production testing. Design designates a parameter that is quantified during the design verification activity. Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p13

14 Absolute QE Absolute QE TYPICAL PERFORMANCE CURVES KAF CA Spectral Response 25% 20% 15% 10% 5% Ave R Ave G Ave B Ave GR Ave GB 0% Wavelength (nm) Figure 5: Spectral Response (color version) KAF AA Spectral Response Wavelength (nm) Figure 6: Spectral Response (monochrome version) Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p14

15 Normalized Response Absolute QE KAF CA Quantum Efficiency (GR-GB difference) Ave GR-GB Wavelength (nm) Figure 7: Typical GR - GB QE Difference (color version) KAF Typical Angular Response Horizontal - White Light Vertical - White Light Diagonal "\" - White Light Angle Figure 8: Typical Normalized Angle QE (both color and monochrome versions) Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p15

16 Xab KAF Anti-blooming Performance Exposure Time (msec) Figure 9: Typical Anti-blooming Performance Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p16

17 DEFECT DEFINITIONS OPERATIONAL CONDITIONS All defect tests performed at T ~25 C, t int = 250 ms and t readout = 1077 ms SPECIFICATIONS Classification Points Clusters Columns Includes dead columns Standard Grade <4,000 <50 <20 yes Point Defects Cluster Defect Column Defect Dead Columns Saturated Columns A pixel that deviates by more than 9 mv above neighboring pixels under non-illuminated conditions -- OR -- A pixel that deviates by more than 7% above or 11% below neighboring pixels under illuminated conditions A grouping of not more than 10 adjacent point defects Cluster defects are separated by no less than 4 good pixels in any direction A grouping of more than 10 point defects along a single column -- OR -- A column that deviates by more than 0.9 mv above or below neighboring columns under nonilluminated conditions -- OR -- A column that deviates by more than 1.5% above or below neighboring columns under illuminated conditions Column defects are separated by no less than 4 good columns. No multiple column defects (double or more) will be permitted. Column and cluster defects are separated by at least 4 good columns in the x direction. A column that deviates by more than 50% below neighboring columns under illuminated conditions A column that deviates by more than 100 mv above neighboring columns under non-illuminated conditions. No saturated columns are allowed. Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p17

18 OPERATION ABSOLUTE MAXIMUM RATINGS 8 Description Symbol Minimum Maximum Units Notes Diode Pin Voltages V diode V 1,2 Gate Pin Voltages V gate V 1,3 Overlapping Gate Voltages V V 4 Non-overlapping Gate Voltages V g-g V 5 Output Bias Current I out -30 ma 6 LODT Diode Voltage V LODT V 7 Operating Temperature T OP 0 60 C 9 Notes: 1. Referenced to pin VSUB 2. Includes pins: VRD, VDD, VSS, VOUT. 3. Includes pins: V1, V2, H1, H1L, H2, RG, VOG. 4. Voltage difference between overlapping gates. Includes: V1 to V2; H1, H1L to H2; H1L to VOG; V1 to H2. 5. Voltage difference between non-overlapping gates. Includes: V1 to H1, H1L; V2, VOG to H2. 6. Avoid shorting output pins to ground or any low impedance source during operation. Amplifier bandwidth increases at higher currents and lower load capacitance at the expense of reduced gain (sensitivity). Operation at these values will reduce MTTF. 7. V1, H1, V2, H2, H1L, VOG, and VRD are tied to 0 V. 8. Absolute maximum rating is defined as a level or condition that should not be exceeded at any time per the description. If the level or condition is exceeded, the device will be degraded and may be damaged. 9. Noise performance will degrade at higher temperatures. POWER-UP SEQUENCE The sequence chosen to perform an initial power-up is not critical for device reliability. A coordinated sequence may minimize noise and the following sequence is recommended: 1. Connect the ground pins (VSUB). 2. Supply the appropriate biases and clocks to the remaining pins. Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p18

19 DC BIAS OPERATING CONDITIONS Description Symbol Minimum Nominal Maximum Units Maximum DC Current (ma) Reset Drain V RD V I RD = 0.01 Output Amplifier Return VV SS V I SS = 3.0 Notes Output Amplifier Supply VV DD V I OUT + I SS Substrate V SUB 0 V 0.01 Output Gate V OG V 0.01 Lateral Drain V LOD V 0.01 Video Output Current I OUT ma 1 Note: 1. An output load sink must be applied to VOUT to activate output amplifier see Figure 3. AC OPERATING CONDITIONS Clock Levels Description Symbol Level Minimum Nominal Maximum Units Effective Capacitance V1 Low Level V1L Low V 360 nf 1 V1 High Level V1H High V 1 V2 Low Level V2L Low V 440 nf 1 V2 High Level V2H High V 1 H1 Low Level H1L Low V 550 pf 1 H1 High Level H1H High V 1 H1L Low Level H1L low, Low V 13 pf 1 H1L High Level H1L high High V 1 H2 Low Level H2L Low V 370 pf 1 H2 High Level H2H High V 1 RG Low Level V RGL Low V 13 pf 1 RG High Level V RGH High V 1 Note: 1. All pins draw less than 10 µa DC current. Capacitance values relative to SUB (substrate). Notes Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p19

20 TIMING REQUIREMENTS AND CHARACTERISTICS Description Symbol Minimum Nominal Maximum Units Notes H1, H2 Clock Frequency f H 24 MHz 1, 2 V1, V2 Clock Frequency f V 30 khz 1, 2 H1, H2 Rise, Fall Times t H1r, t H1f 5 10 % 3, 7 V1, V2 Rise, Fall Times t V1r, t V1f 5 10 % 3 V1 - V2 Cross-over V VCR V H1 - H2 Cross-over V HCR V Off Time t off μs H1, H2 Setup Time t HS 1 5 µs RG Clock Pulse Width t RGw 5 ns 4 RG Rise, Fall Times t RGr, t RGf 5 10 % 3 V1, V2 Clock Pulse Width t Vw µs 2, 6,9 Pixel Period (1 Count) t e ns 2 H1L VOUT Delay t HV 5 ns RG - VOUT Delay t RV 5 ns Readout Time t readout ms 6, 8 Integration Time t int - 5, 6 Line Time t line µs 6 Fast Flush Time t flush ms Notes: 1. 50% duty cycle values. 2. CTE will degrade above the nominal frequency. 3. Relative to the pulse width (based on 50% of high/low levels). 4. RG should be clocked continuously. 5. Integration time is user specified. 6. Longer times will degrade noise performance. 7. The maximum specification or 10ns whichever is greater based on the frequency of the horizontal clocks. 8. t readout = t line * 5494 lines. 9. Measured where Vclock is at 0 volts Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p20

21 EDGE ALIGNMENT H1 V HCR V1 V2 V1,V2 V VCR Figure 10: Timing Edge Alignment Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p21

22 FRAME TIMING t int 1 Frame = 5494 Lines t readout V2 V1 Line H2 H1, H1L Figure 11: Frame Timing Frame Timing Detail 90% V1 10% t Vw t V1r t V1f 90% V2 10% t V2r t V2f Figure 12: Frame Timing Detail Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p22

23 LINE TIMING (EACH OUTPUT) t line Line Content 3608 Active Pixels/Line V2 V1 H2 t V t V t HS t e H1 / H2 count values H1, H1L 3672 Dummy Pixels Dark Reference Pixels* Active Buffer Pixels Photoactive Pixels ** RG Figure 13: Line Timing PIXEL TIMING t RG t e 1 Count RG H1,H1L H2 VOUTX X=L or R t RV V VRG Vdark+Voft Vodc Vsat Figure 14: Pixel Timing V VSUB t HV V SUB Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p23

24 Pixel Timing Detail 90 % RG RG amp t RGw 10 % RG low t RGr t RGf 90 % H1, H2 50 % H1 amp, H2 amp H1 low, H2 low 10 % t e 2 t H12r t H12f 90 % H1L 50 % H1Lamp 10 % H1L low t e 2 t H1Lr t H1Lf Figure 15: Pixel Timing Detail Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p24

25 MODE OF OPERATION POWER-UP FLUSH CYCLE t Vflush t int t readout V2 V (min) H (min) H1,H1L Figure 16: Power-up Flush Cycle t Vflush t int t readout V2 V1 t off 5494 (min) H (min) H1,H1L Figure 17: Modified (Slow) Flush Cycle Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p25

26 STORAGE AND HANDLING STORAGE CONDITIONS Description Symbol Minimum Maximum Units Notes Storage Temperature T ST C 1 Notes: 1. Long-term storage toward the maximum temperature will accelerate color filter degradation. ESD 1. This device contains limited protection against Electrostatic Discharge (ESD). CCD image sensors can be damaged by electrostatic discharge. Failure to do so may alter device performance and reliability. 2. Devices should be handled in accordance with strict ESD procedures for Class 0 (<250V per JESD22 Human Body Model test), or Class A (<200V JESD22 Machine Model test) devices. Devices are shipped in static-safe containers and should only be handled at static-safe workstations. 3. See Application Note MTD/PS-0224 Electrostatic Discharge Control for Image Sensors for proper handling and grounding procedures. This application note also contains recommendations for workplace modifications for the minimization of electrostatic discharge. 4. Store devices in containers made of electroconductive materials. COVER GLASS CARE AND CLEANLINESS 1. The cover glass is highly susceptible to particles and other contamination. Perform all assembly operations in a clean environment. 2. Touching the cover glass must be avoided. 3. Improper cleaning of the cover glass may damage these devices. Refer to Application Note MTD/PS-0237 Cover Glass Cleaning for Image Sensors. ENVIRONMENTAL EXPOSURE 1. Do not expose to strong sun light for long periods of time. On the color version of this device, the color filters may become discolored. Long time exposures to a static high contrast scene should be avoided. The image sensor may become discolored and localized changes in response may occur from color filter aging. 2. Exposure to temperatures exceeding the absolute maximum levels should be avoided for storage and operation. Failure to do so may alter device performance and reliability. 3. Avoid sudden temperature changes. 4. Exposure to excessive humidity will affect device characteristics and should be avoided. Failure to do so may alter device performance and reliability. 5. Avoid storage of the product in the presence of dust or corrosive agents or gases. Long-term storage should be avoided. Deterioration of lead solderability may occur. It is advised that the solderability of the device leads be re-inspected after an extended period of storage, over one year. SOLDERING RECOMMENDATIONS 1. The soldering iron tip temperature is not to exceed 370ºC. Failure to do so may alter device performance and reliability. 2. Flow soldering method is not recommended. Solder dipping can cause damage to the glass and harm the imaging capability of the device. Recommended method is by partial heating. Kodak recommends the use of a grounded 30W soldering iron. Heat each pin for less than 2 seconds duration. Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p26

27 MECHANICAL DRAWINGS COMPLETED ASSEMBLY Figure 18: Completed Assembly Drawing (1 of 2) Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p27

28 Figure 19: Completed Assembly Drawing (2 of 2) Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p28

29 COVER GLASS SPECIFICATION 1. Scratch and dig: 10 micron max 2. Substrate material Schott D263T eco or equivalent 3. Multilayer anti-reflective coating Wavelength Total Reflectance % % % Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p29

30 QUALITY ASSURANCE AND RELIABILITY QUALITY STRATEGY All image sensors will conform to the specifications stated in this document. This will be accomplished through a combination of statistical process control and inspection at key points of the production process. Typical specification limits are not guaranteed but provided as a design target. For further information refer to ISS Application Note MTD/PS-0292, Quality and Reliability. REPLACEMENT All devices are warranted against failure in accordance with the terms of Terms of Sale. This does not include failure due to mechanical and electrical causes defined as the liability of the customer below. LIABILITY OF THE SUPPLIER A reject is defined as an image sensor that does not meet all of the specifications in this document upon receipt by the customer. LIABILITY OF THE CUSTOMER Damage from mechanical (scratches or breakage), electrostatic discharge (ESD) damage, or other electrical misuse of the device beyond the stated absolute maximum ratings, which occurred after receipt of the sensor by the customer, shall be the responsibility of the customer. RELIABILITY Information concerning the quality assurance and reliability testing procedures and results are available from the Image Sensor Solutions and can be supplied upon request. For further information refer to ISS Application Note MTD/PS-0292, Quality and Reliability. TEST DATA RETENTION Image sensors shall have an identifying number traceable to a test data file. Test data shall be kept for a period of 2 years after date of delivery. MECHANICAL The device assembly drawing is provided as a reference. The device will conform to the published package tolerances. Kodak reserves the right to change any information contained herein without notice. All information furnished by Kodak is believed to be accurate. WARNING: LIFE SUPPORT APPLICATIONS POLICY Kodak image sensors are not authorized for and should not be used within Life Support Systems without the specific written consent of the Eastman Kodak Company. Product warranty is limited to replacement of defective components and does not cover injury or property or other consequential damages. Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p30

31 REVISION CHANGES Revision Number 1.0 Initial Release Description of Changes New specification format. Corrected pin out diagram and package information. Update Performance Table, T vw, Frame Time, dark signal components identified. Updated fast flush time. Added anti blooming performance plot. Added min/max values for performance parameters. Changed name from KAF-39000CE to KAF Converted new specification format. Added Quantum Efficiency (KAF AAA) parameter to the Summary Specification table. 4.0 Reformatted Completed Assembly Drawings 4.1 Changed cover glass material to D263T eco or equivalent Eastman Kodak Company, Revision 4.1 MTD/PS-0856 p31

32 Eastman Kodak Company, KODAK and TRUESENSE are trademarks of Eastman Kodak Company.