TestScape On-line, test data management and root cause analysis system On-line Visibility Minimize time to information Rapid root cause analysis Consistent view across all equipment Common view of test floors Ease of Use Locate data by intuitive product names and date ranges Quickly drill down to issues Easy to use for operations personnel Comprehensive tools for engineering Modular and Scalable Monitor portions or all of your testers AWARE is yield analysis module OPS used for operational efficiency SPC maximizes quality of test ops CCT optimizes CAPEX utilization OPTIMIZE for test time reduction and outlier elimination analysis Easy to Deploy Coexists with current IT infrastructure Monitor internal and external test floors TestScape is a state-of-the-art, enterprise test data management system. It includes a family of online, web-based applications that run on an Oraclebased data warehouse. Data is captured in realtime then stored in modern formats designed for rapid retrieval analysis. The system reduces the engineering time require to identify and resolve issues. Cost of test is reduced by achieving more efficient use of equipment and personnel. By reducing errors, monitoring for abnormal trends and insuring proper equipment calibration, users can maintain the highest quality. TestScape is easy to use for a wide variety of personnel. Test and product engineers will appreciate its extensive yield analysis tools and optimization capabilities. Operations managers will appreciate the continuous monitoring of equipment usage, quality parameters and shift efficiency. The product is organized as a set of optional webbased applications: TestScape-AWARE is used for comprehensive yield analysis, ANOVA and test monitoring. TestScape-OPS is used to monitor and improve equipment utilization using E10/E70 efficiency models. TestScape-SPC maintains maximum quality by monitoring test production against statistical process control rules defined by the user. TestScape-CCT is a cell configuration tracking system for optimizing the utilization of your equipment inventory. It includes analytic tools for planners. Gage reliability and repeatability analysis can be performed at the test cell level. TestScape-Optimize is used to create optimized test time reduction of outlier elimination test plans.
TestScape-Overview System Architecture Data can be acquired in several ways. For real-time operation, SwifTest provides a software-only solution and Salland s line of test cell controllers provides a hardware-based solution. SwifTest also operates in an off-line manner, reading test results for historical STDF archives and transferring the information to TestScape. Because the data acquisition is performed by Salland s SwifTest, test data can be monitored from all commercial testers as well as legacy or proprietary hardware. Installation is non-intrusive to your operations flow and integrates seamlessly with your IT infrastructure. For these reasons, TestScape can also monitor external test floors, such as your test subcontracting services, independent of what tools they may be using. Important attributes of this architecture include: Open Architecture Since the TestScape data store is developed on a modern, Oracle DBMS, data can be easily exchanged with other existing database system. Transparent Operation SwifTest has been proven over hundreds of installations on a wide variety of testers to be nonintrusive to ATE performance. It is virtually transparent requiring no operator interface. Small Footprint SwifTest has a highly efficient client-server design that minimized the amount of tester memory required to support it. The bulk of computing is performed on the server side. The server can run on the tester between touchdowns or between lots, or can run on a separate server. Network loading is minimized because Swiftest preprocesses the data and transmits it to TestScape in Salland s highly compressed format, ilog. Distributed Processing My distributing the data collection and preprocessing load to many copies of SwifTest, the TestScape system can support very large, worldwide test operations. Advanced Adaptive Test Capabilities You can see in the diagram below that there is a feedback loop from TestScape to SwifTest that enables recipes for specific test programs to be updated dynamically. This feature is essential for advance adaptive test applications like feedforward and feedback. The Device Profile contains all of the instructions required for updating such things as SPC rules, test time reduction factors or outlier detection parameters.
TestScape-AWARE The ultimate goal of any modern test data analysis tool is to convert large amounts of raw data into actionable knowledge as quickly and painlessly as possible. TestScape-AWARE is a new generation of analysis tool that sets the benchmark for the semiconductor industry. TestScape-AWARE is intended for test engineering and product engineering responsible for test program development and yield improvement. Key Features Features that differentiate TestScape from other systems are: Continuous root cause analysis On-line data minimizes time to information. Data is consistent across all brands of ATEs Dashboard auto-highlights unwanted events System does not depend upon antiquated STDF format, thus minimizing storage requirements and accelerating data retrieval Retrieve data by intuitive search terms Auto reports with report scheduler Easy to use, web-based access for everyone Advanced analysis tools for expert users Scalable for as few as 10 testers to hundreds Integrated, optional modules for OEE, SPC, Optimization and Configuration Tracking Advantages Valuable engineering time is saved Higher yield, fewer interruptions Less scrap and rework Consistent view of all equipment and test floors Available Tools Dashboard personalized to each user for ANOVA alerts and general status Analysis of variance (ANOVA) by any variable: tester, site, test, floor, DIB, etc. Yield by test, lot, bin, device, tester, etc. Test analysis including histograms, box plots, Paretos of root cause, etc. Scatter charts and test optimization analysis PCM correlation Comprehensive wafer maps
TestScape-OPS TestScape-OPS will enable you to achieve and maintain maximum test floor efficiency. It supports E10/E79 efficiency models that can be configured to your local preferences. TestScape-OPS is intended for test operations managers and test floor personnel. Key Features User configurable E10 states On-line performance, mid-lot status Merged states Increases data accuracy Analysis of all equipment, shifts and products Management metrics (Quality, availability, operational & rate efficiency) Product efficiency trends (Yield, UPH, lots) Efficiency Pareto by states Efficiency by test floor and tester Shift summaries Drill down to test cell timeline summary Continuous monitoring of best and worst Easy to use, graphical displays Multi-language support Management reports Operator status tool Test floor monitor Shift definitions Device maintenance information Interface to corporate MES Advantages Fast root cause analysis of issues Minimum time to information Improved data integrity Reduced human errors E10 states configured to your operations Provides management with a consistent measure of efficiency across many variables Reference point for continuous improvement East to integrate, easy to use, easy to own Integrated with other optional TestScape tools like data analysis, SPC & configuration tracking.
TestScape-SPC TestScape-SPC enables chip manufacturers to insure that the highest quality products are shipped from their test operations. TestScape-OPS is intended for test operations managers and test floor personnel working in cooperation with product engineers. Statistical Process Control The system collects data in real-time from the user s automatic testers and monitors that data for abnormal trends. Statistical process control rules, or controls, are defined by the users via a flexible user interface. Controls are specific for products of interest. A variety of SPC algorithms are available to be used as the basis for the monitoring rule. The diagram above illustrates a Shewhart control chart with "short term" rules, also known as WECO rules. SQC Online is a good source of information about these rules. Typical controls useful to product engineering and quality control include: Low yield Test time H/W bin limits S/W bin limits Statistical trends (stddev, mean, etc.) Site-site variation Real-time monitoring detects issues that cannot otherwise be detected during production. Early detection reduces down time, excessive scrap and most importantly, quality slips that may impact your customers. Unwanted trends generate triggers and triggers initiate alerts or events. Users will minimize overloading the production system with excessive alerts by using the built-in simulation tool that applies newly created rules to recent production data in order to show what will happen when released to production. Key Features and Advantages A comprehensive event disposition subsystem is an integral part of TestScape-SPC. Events define the actions to be taken. Open events are logged until the assigned owner dispositions the event. A management dashboard tracks the open, in process and closed events to provide continuous feedback on team performance. The dashboard includes time to respond and time to close as well. Because the data acquisition is performed by Salland s SwifTest, test data can be monitored from all commercial testers as well as legacy or proprietary hardware. Installation is non-intrusive to your operations flow and integrates seamlessly with your IT infrastructure. TestScape-SPC can be deployed to multiple test floors. In fact, SPC controls can be defined in different ways for different test floors on the same product (device types.) The system has been successfully installed on hundreds of testers at multiple test floors. It is supported worldwide by Salland Engineering.
TestScape-CCT Salland s Cell Configuration Tracking (CCT) solution is an automated inventory monitoring and planning system for capital-intensive operations. TestScape-CCT enables planners to optimize test cell utilization by providing them with accurate information of equipment availability and readiness. Advantages Improved planning: On-line collection and dynamic updating of configuration information provides a more accurate baseline of information for planners to depend upon. Improved Quality: Proper test cell setups can be assured. Programs can be verified for compatibility with available configurations. Program portability can be assessed more easily. Users can perform Gage R&R studies at the test cell level. Improved Efficiency: Use of the system will reduce setup issues and reduce setup time. The system will be a valuable source of more accurate data for systems like TestScape-OPS used to monitor and analyze efficiency. Key Features Continuously monitors equipment configurations Monitor complete test cell status Monitoring licensing information Transparent to equipment performance Monitoring subsets of equipment fleet Continuous test cell optimization analysis Extendible to full TestScape test data management system Interface to customer s own manufacturing execution systems Part of roadmap to future advanced testing techniques, like adaptive test Software-only solution Proven in demanding production Backed by Salland s worldwide support and expertise The diagram below illustrates the high level components of the system. SwifTest-CCT reads the hardware and software configuration and status information from various brands of ATEs and prober/handlers. This data collection runs in nearreal-time, providing a dynamically updated, accurate view of test cell configuration and status. Salland has developed an efficient XML model for reliably and accurately transferring and storing this information. The data repository is human-readable and based upon XML E120 SEMI standards. When combined with information from product masters, a variety of unique and valuable analysis tools can be put to use. Some customers will want to interface this database directly to their internal manufacturing execution systems (MES.) Salland offers tools like TestScape-OPS that can further assist planning and operations in maximizing equipment utilization.
TestScape-Optimize TestScape-Optimize is an tool designed specifically for analyzing semiconductor test data to determine the optimum test plan for either reducing test time or eliminating outliers. The plans will be released for production using Salland s SwifTest family of on-line, adaptive test software. The Device Profile is output to be used by the SwifTest applications. The user may run the following types of analyses: Test Time Optimization enables to the user to rapidly analyze a large set of test data and determine the recommended test plan for statistical sampling using SwifTest-TTO. The user has final control over what test groups will be sampled and under what conditions. Simulation using the same sampling engine in SwifTest-TTO may be performed. A comprehensive report is produced for management and engineering review. Verification of test programs prepared for statistical sampling requires specialized tools. TestScape-Optimize includes a powerful verification facility that can be used off-line or on-line to insure accurate device recipes for test time optimization in a matter of days. Correlation and simulation tools are also included that further confirm the performance of our test time optimization solution, reducing engineering time significantly. Outlier Analysis assists the user in determining how to best configure outlier detection and extraction. The user has complete control over what tests are going to be screen for outliers. The tool helps the user make these decisions as well as determining the best settings and outlier algorithms to use. The user can simulate what will happen in production using SwifTest-FOX (Fast Outlier extraction) in terms of the trade-offs between minimizing potential field defects and avoiding unnecessary yield losses. The system allows the users to define their own rules and parameters. As with all TestScape modules, on-line data acquisition reduces timetime-information. The system is easy to use, easy to deploy and scalable from a few testers to hundreds. About Salland Engineering Salland Engineering International B.V. is a leading supplier of test solutions for the semiconductor industry. Our solutions are delivered via a unique combination of hardware, software, test applications services and in-depth expertise. We enable our customers to achieve lower cost of test, higher quality and reliability, improved test floor efficiencies, faster time to market and streamlined i nterfaces with their supply chain. Since 1992, Salland has delivered thousands of production proven results to leading integrated device manufacturers (IDMS), fabless semiconductor manufacturers, ATE vendors and outsourced test and assembly services (OSATs) around the world. We are consistently profitable and presently employ over 100 people. Salland is headquartered in The Netherlands with additional development centers in Texas. We have worldwide sales and support centers in Texas, California, Italy, UK, Si ngapore, Japan, Korea, and Taiwan. Click here for Trademarks of Salland Engineering. Visit www.salland.com