Next Generation Scalable and Efficient Data Protection

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1 Next Generation Scalable and Efficient Data Protection Dr. Sam Siewert, Software Engineer, Intel Greg Scott, Cloud Storage Manager, Intel STOS004

2 Agenda What Is Durability and Why Should You Care? Measuring Durability: Mean Time to Data Loss (MTTDL) and Other Models Techniques for Improving Durability Large Object Store Reference Architecture 2

3 Agenda What Is Durability and Why Should You Care? Measuring Durability: Mean Time to Data Loss (MTTDL) and Other Models Techniques for Improving Durability Large Object Store Reference Architecture 3

4 The Problem Hard drive non recoverable error probability approaching 100% 4

5 Another problem Rebuild times for Mirroring and Parity RAID are Getting out of Hand 8.3 Hours for 3TB SATA Sequential (100 MB/sec) 41.5 Hours for 3TB SATA Random (20 MB/sec) More than a day to restore or initialize a drive? * Intel estimates based on historical SATA drive performance data

6 Agenda What Is Durability and Why Should You Care? Measuring Durability: Mean Time to Data Loss (MTTDL) and Other Models Techniques for Improving Durability Large Object Store Reference Architecture 6

7 Measuring Data Durability Mean time to data loss (MTTDL) Average time before a system will lose data MTTDL Probability Probability that a system will lose data Function of Mean-time-to-failure (MTTF), same as MTBF SATA spec says 500,000 hours, but not at 100% duty cycle SATA HDD Experience shows MTTF typically 200,000 hours Mean-time-to-repair (MTTR) Time to recover from a failure Example is time to re-mirror a drive 7

8 How Good is Standard MTTDL Model? Model Compare to Statistics for SATA Disks? Compare Standard RAID Data Protection to Erasure Codes? Check Results with NOMDL Node Level System Level Infant Mortality Mid to End of Life A large-scale study of failures in high-performance computing systems, Bianca Schroeder, Garth A. Gibson 8

9 Models for Expected Data Loss Mean Time to Data Loss (MTTDL) Simple 2-State Markov Model Normalized Magnitude of Data Loss (NOMDL) Sector Level phenomena partial failures Multi-state Monte Carlo simulation Estimates amount of expected data loss per terabyte per year MTTDL NOMDL Rebuild (MTTR) Idle Scrub Sector Remap Healthy Failure (Erasure) Healthy Failure Read failure (MTBF) Rebuild NRE Data Loss Retry Data Loss Recover 9

10 MTTDL Example: RAID 1 Two 3TB SATA Desktop Drives Drives are mirrored Following sequence of events 1. Data corruption on one 2. Re-mirror to restore data 3. Second drive fails before first is restored 4. Loss of data Re-Mirror Mirrored Simple 2-state model Loss of data because of two failures before restore 10

11 The Annual Probability of Data Loss P( t) P( t) failure = (1 e kt ), k = 1 MTTF 1 * Lifetime ( MTTDL ) data _ loss = (1 e )* N sets, k = set 1 MTTDL set Birth/Death Exponential Model P(t)=Probability of Failure over time period k=probability of failure, t=time MTTF = Mean Time To Failure (or Between) N=Population, Lifetime=e.g. Annual MTTDL=Mean Time to Data Loss in Population How good is it? Optimistic Only 2 states Pessimistic Does not account for proactive data protection measures Does model resiliency to drive failures 11

12 MTTDL RAID Examples RAID1 Equation Joint probability of 2 erasures Coupling of mirror drives Exposure window Combined _ Failures _ with _ Data _ Loss MTTDL = Devices _ in _ Set *( Exposure _ Window) 2 MTTF MTTDL = RAID 1 N * MTTR RAID5 Equation (N+1)*N Double Fault Scenarios RAID6 Equation Joint probability 3 erasures (N+2)*(N+1)*N Triple Fault Scenarios 2 MTTDL MTTF RAID 5 = ( N + 1)* N * MTTR 3 MTTF ( 1)* N * MTTR MTTDL 6 = RAID N + 2)*( N + 2 Engineering Estimate for probability of loss 12

13 Scaling With Virtualization Keeps Sets Independent, Constant Overhead, Virtual Mapping of RAID Sets over Nodes/Drives 13

14 Agenda What Is Durability and Why Should You Care? Measuring Durability: Mean Time to Data Loss (MTTDL) and Other Models Techniques for Improving Durability Large Object Store Reference Architecture 14

15 Erasure Coding (EC) RAID Server App Erasure Coding App data data RAID 5/6 Meta Data Service data location Erasure Coding Client SCSI SAS to disks SCSI to disk or IP to storage servers data 1 data m data m+1 data m+2 slice 1 slice m slice m+1 slice n m data 1 or 2 parity m minimum k spare Disk Disk Disk Disk Storage Service Storage Node Storage Service Storage Node Storage Service Storage Node Storage Service Storage Node EC extends the data protection architectures of RAID 5/6 to RAID k k = the number of failures that can be tolerated without data loss: For RAID 5, k=1; For RAID 6, k=2; For EC, k = n EMC * Atmos * and Isilon * are example systems using EC 15

16 MTTDL Example: Erasure Coding 10:16 example fragments across 16 drives All drives functioning Failure occurs: 1. Drive 1 fails (MTT fail) 2. Drive replaced (MTT repair) 3. Restore started (MTT restore) 4. 6 more drives fail (MTT data loss) 5. Loss of data New build writes lost to all frags drives Loss of data if 6 drives fails before drive 1 restore 16

17 The MTTDL Equation for EC Why different? Resilient to Triple Faults or Better Numerator is Joint Probability of Triple N-tuple Failure (Erasure) Denominator Includes Linear Coupling Terms Parity De-Clustering Vastly Improves MTTR Linear Degradation Due to Coupling Power Law Improvements = 4 MTTF S *( N 3)*( N 2)*( N 1)*( N)* MTTR MTTDL EC MTTF * 1)*( N)* MTTR 7 MTTDL 6 = EC S ( N + 6)*( N + 5)*( N + 4)*( N + 3)*( N + 2)*( N

18 Agenda What Is Durability and Why Should You Care? Measuring Durability: Mean Time to Data Loss (MTTDL) and Other Models Techniques for Improving Durability Large Object Store Reference Architecture 18

19 Tomorrow s Datacenter Employee VPN or LAN Business processes, Decision support, HPC Dedicated Servers Premium SLA Storage IOPS/TB focus e.g. Business Database Consumer or Biz Customer Content Delivery Network Collaborative, IT infra., App dev, Web infra. WWW Compute Virtualized Servers Low- Latency, Proximity Storage Centralized Storage High-Capacity Storage $/TB optimized e.g. Backup or Large Object Storage Tomorrow s datacenters add lower cost, high-capacity storage to traditional low-latency, premium storage 19

20 Durability Options for Large Object Comparison of a rack implementation 42U Rack 32 Storage Nodes (SN) 10 Hard drives per SN No single point of failure in rack Comparison of both durability and $/TB Durability Config Erasure Coding 16 RAID 0+1 RAID 5+1 RAID 6+1 Minimal drives (m) 10 drives in 10 SNs 10 drives in 1 SN 9 drives in 2 SNs 8 drives in 2 SNs Spare drives (k) 6 drives in 6 SNs 10 drives in 2 nd SN 1 drive in each SN 2 drives in each SN No single failure drives No additional No additional 10 drives in 2 nd SN 10 drives in 2 nd SN RAID 3way 10 drives in 1 SN 10 drives in 2 nd and 3 rd SN No additional 20

21 Large Object Store Rack (Network Configuration) Dual 1/10GE BaseT Switch x8 10GE to client TOR switches x4 10GE to each CS/MD server x32 GE to active switch 2 GE 32 s x1 GE BaseT to active switch 1 x1 GE BaseT to active switch 2 Clients x40-1/10ge x8-10ge x40-1/10ge x8-10ge Client/MD Server Client/MD Server Cleint/MD Server 10GE 10GE Redundant Client/Metadata Servers x2 10GE BaseT to active switch 1 x2 10GE BaseT to active switch 2 No Single Point of Failure: Dual Switches and Dual Connectivity to all servers in rack 21

22 42 RU Large Object Store Rack (Storage Node) x40-1/10ge x8- x40-1/10ge 10GE x8-10ge Client/MD Server Client/MD Server Cleint/MD Server Portwell WADE8011 Mini-ITX board x10 1u 3.5 SATA Disk Enclosure Intel 206 chipset x4 SATA 6Gb/s Amplidata SuperMicro SASLP-MV8 x6 SAS 6Gb/s x10 SATA 6Gb/s Western Digital 3TB SATA Storage Drive X86-64 RedHat* Linux* DMI G2 x4 PCIe G2 Reference Architecture Large object storage (e.g. Haystack) Intel Xeon E3-1220L Intel Dual GbE ~1PB of raw storage in a 42u rack High Efficiency, Durability, Scalability with Erasure Coding x4 PCIe G2 x2 Arista 7140T x2 x32 GbE x2 x8 10GbE SFP+ 2G ECC DDR3 Memory x2 GbE

23 42 RU Large Object Store Rack (Controller Node) x40-1/10ge x8- x40-1/10ge 10GE x8-10ge Client/MD Server Client/MD Server Cleint/MD Server Intel Server Board S5520UR Intel Server Chassis SR2625URLXT 12G ECC DDR3 Memory Intel 5520 chipset Amplidata Intel Solid-State Drive 320 Series x2 SATA 3G Seagate 500GB SATA Storage Drive X86-64 RedHat* Linux* Intel Xeon processor 5620 Client/Metadata Server Reference Architecture Large object storage (e.g. Haystack) x2- x2 10GbE BaseT x2- x8 10GbE SFP+ Dual Metadata and Client (erasure encode/decode) server Dual10GE throughput to Application Servers and to s x4 PCIe G2 x2 SATA 3G QPI Intel X520-T2 Dual 10GbE Intel Xeon processor 5620 x4 PCIe G2 Intel X520-T2 Dual 10GbE 12G ECC DDR3 Memory x2 Arista 7140T 23

24 Converged with EC Value (320 Drive, 960TB comparison, no single point of failure 1 ) Value Description Number nodes=32, 10 drives/node, Cap/Node=30TB EC16 m=10, k=6 16 nodes RAID0+1 m=10, k=0 2 nodes RAID5+1 m=9, k=1 2 nodes RAID6+1 m=8, k=2 2 nodes RAID 3way m=10, k=0 3 nodes Efficiency Durability Scalability 2 Raw/Usable Efficiency Usable Capacity (TB) Power/Usable Capacity Relative data loss risk best storage scaling 63% 50% 40% 34% 33% % 67% 74% 83% $343 $429 $476 $536 $643 EC is the best efficiency at equivalent durability compared to RAID Hardware configuration Large Object Reference Architecture 2 Estimate using ServersDirect and CDW web prices 8/9/2011

25 Summary Increasing drive density and rebuild time are creating data protection crisis MTTDL model a sufficient predictor of data loss risk Erasure Codes offer the improved data durability over traditional RAID and triple replication at lower cost Intel s large object reference architecture provides a cost effective implementation 25

26 Call to Action Be aware of data durability especially for building capacity storage with SATA drives Understand impact of data durability of Scaleout Storage Migrate to Erasure Coding for Large Object Store for optimal durability 26

27 Additional Sources of Information on This Topic: 1. An Analysis of Data Corruption in the Storage Stack, Lakshmi Bairavasundaram, Garth R. Goodson, et al 2. A large-scale study of failures in high-performance computing systems, Bianca Schroeder, Garth A. Gibson 3. Disk failures in the real world: What does an MTTF of 1,000,000 hours mean to you?, Bianca Schroeder, Garth A. Gibson 4. An Analysis of Latent Sector Errors in Disk Drives, Lakshmi Bairavasundaram, Garth R. Goodson, et al 5. Memory Systems: Cache, DRAM, Disk, Bruce Jacob, Spencer Ng, David Wang. 6. Mean time to meaningless: MTTDL, Markov models, and storage system reliability, Kevin Greenan, James Plank, Jay Wylie, Hot Topics in Storage and File Systems, June

28 MTTDL Equations for Large Object Store RAID0 + 1: RAID 0 across 10 drives in storage node, storage node mirrored to second node 2 MTTF MTTDL RAID = N * MTTR RAID5 + 1: RAID5 across 10 drives (9 primary drives, 1 drive parity), storage node mirrored to second node with RAID5 RAID6 + 1: RAID6 across 10 drives (8 primary drives, 2 drives parity), storage node mirrored to second node with RAID6 MTTDL = RAID5+ 1 MTTDL = RAID6+ 1 MTTDL N MTTR 2 RAID5 * RAID5 2 RAID6 * MTTRRAID6 MTTDL N EC16: 16 Fragments across 16 nodes MTTF ( 1)*( N)* MTTR 7 MTTDL 6 = EC N + 6)*( N + 5)*( N + 4)*( N + 3)*( N + 2)*( N

29 Legal Disclaimer INFORMATION IN THIS DOCUMENT IS PROVIDED IN CONNECTION WITH INTEL PRODUCTS. NO LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS DOCUMENT. EXCEPT AS PROVIDED IN INTEL S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, INTEL ASSUMES NO LIABILITY WHATSOEVER, AND INTEL DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, RELATING TO SALE AND/OR USE OF INTEL PRODUCTS INCLUDING LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A PARTICULAR PURPOSE, MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT. INTEL PRODUCTS ARE NOT INTENDED FOR USE IN MEDICAL, LIFE SAVING, OR LIFE SUSTAINING APPLICATIONS. Intel may make changes to specifications and product descriptions at any time, without notice. All products, dates, and figures specified are preliminary based on current expectations, and are subject to change without notice. Intel, processors, chipsets, and desktop boards may contain design defects or errors known as errata, which may cause the product to deviate from published specifications. Current characterized errata are available on request. Any code names featured are used internally within Intel to identify products that are in development and not yet publicly announced for release. Customers, licensees and other third parties are not authorized by Intel to use code names in advertising, promotion or marketing of any product or services and any such use of Intel's internal code names is at the sole risk of the user Software and workloads used in performance tests may have been optimized for performance only on Intel microprocessors. Performance tests, such as SYSmark* and MobileMark*, are measured using specific computer systems, components, software, operations and functions. Any change to any of those factors may cause the results to vary. You should consult other information and performance tests to assist you in fully evaluating your contemplated purchases, including the performance of that product when combined with other products. Intel processor numbers are not a measure of performance. Processor numbers differentiate features within each processor family, not across different processor families. Go to: Intel product plans in this presentation do not constitute Intel plan of record product roadmaps. Please contact your Intel representative to obtain Intel's current plan of record product roadmaps. Intel, Xeon, Sponsors of Tomorrow and the Intel logo are trademarks of Intel Corporation in the United States and other countries. *Other names and brands may be claimed as the property of others. Copyright 2011 Intel Corporation. 29

30 Risk Factors The above statements and any others in this document that refer to plans and expectations for the second quarter, the year and the future are forward-looking statements that involve a number of risks and uncertainties. Words such as anticipates, expects, intends, plans, believes, seeks, estimates, may, will, should, and their variations identify forward-looking statements. Statements that refer to or are based on projections, uncertain events or assumptions also identify forward-looking statements. Many factors could affect Intel s actual results, and variances from Intel s current expectations regarding such factors could cause actual results to differ materially from those expressed in these forward-looking statements. Intel presently considers the following to be the important factors that could cause actual results to differ materially from the company s expectations. Demand could be different from Intel's expectations due to factors including changes in business and economic conditions, including supply constraints and other disruptions affecting customers; customer acceptance of Intel s and competitors products; changes in customer order patterns including order cancellations; and changes in the level of inventory at customers. Potential disruptions in the high technology supply chain resulting from the recent disaster in Japan could cause customer demand to be different from Intel s expectations. Intel operates in intensely competitive industries that are characterized by a high percentage of costs that are fixed or difficult to reduce in the short term and product demand that is highly variable and difficult to forecast. Revenue and the gross margin percentage are affected by the timing of Intel product introductions and the demand for and market acceptance of Intel's products; actions taken by Intel's competitors, including product offerings and introductions, marketing programs and pricing pressures and Intel s response to such actions; and Intel s ability to respond quickly to technological developments and to incorporate new features into its products. The gross margin percentage could vary significantly from expectations based on capacity utilization; variations in inventory valuation, including variations related to the timing of qualifying products for sale; changes in revenue levels; product mix and pricing; the timing and execution of the manufacturing ramp and associated costs; start-up costs; excess or obsolete inventory; changes in unit costs; defects or disruptions in the supply of materials or resources; product manufacturing quality/yields; and impairments of long-lived assets, including manufacturing, assembly/test and intangible assets. Expenses, particularly certain marketing and compensation expenses, as well as restructuring and asset impairment charges, vary depending on the level of demand for Intel's products and the level of revenue and profits. The majority of Intel s non-marketable equity investment portfolio balance is concentrated in companies in the flash memory market segment, and declines in this market segment or changes in management s plans with respect to Intel s investments in this market segment could result in significant impairment charges, impacting restructuring charges as well as gains/losses on equity investments and interest and other. Intel's results could be affected by adverse economic, social, political and physical/infrastructure conditions in countries where Intel, its customers or its suppliers operate, including military conflict and other security risks, natural disasters, infrastructure disruptions, health concerns and fluctuations in currency exchange rates. Intel s results could be affected by the timing of closing of acquisitions and divestitures. Intel's results could be affected by adverse effects associated with product defects and errata (deviations from published specifications), and by litigation or regulatory matters involving intellectual property, stockholder, consumer, antitrust and other issues, such as the litigation and regulatory matters described in Intel's SEC reports. An unfavorable ruling could include monetary damages or an injunction prohibiting us from manufacturing or selling one or more products, precluding particular business practices, impacting Intel s ability to design its products, or requiring other remedies such as compulsory licensing of intellectual property. A detailed discussion of these and other factors that could affect Intel s results is included in Intel s SEC filings, including the report on Form 10-Q for the quarter ended April 2, Rev. 5/9/11 30

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