700 MHz, -3 db Bandwidth; Dual SPDT Analog Switch

Transcription

1 7 MHz, -3 db Bandwidth; Dual SPDT Analog Switch DESCRIPTION is a low R ON, high bandwidth analog switch configured in dual SPDT. It achieves 5.5 Ω switch on resistance, greater than 7 MHz -3 db bandwidth with 5 pf load, and a channel to channel crosstalk at -3 db and isolation at -9 db. Fabricated with high density sub micro CMOS process, the provides low parasitic capacitance, handles bidirectional signal flow with minimized phase distortion. Guaranteed 1.3 V logic high threshold makes it possible to interface directly with low voltage MCUs. The is designed for a wide range of operating voltages from.7 V to 5.5 V that can be driven directly from one cell Li-ion battery. On-chip protection circuit protects again fault events when signals at com pins goes beyond. Latch up current is 5 ma, as per JESD7, and its ESD tolerance exceeds 5 kv. Packaged in ultra small miniqfn- (1. mm x 1. mm x.55 mm), it is ideal for portable high speed mix signal switching application. As a committed partner to the community and the environment, manufactures this product with lead (Pb)-free device termination. The miniqfn- package has a nickel-palladium-gold device termination and is represented by the lead (Pb)-free -E suffix to the ordering part number. The nickel-palladium-gold device terminations meet all JEDEC standards for reflow and MSL rating. As a further sign of 's commitment, the is fully RoHS complaint. FEATURES Wide operation voltage range Low on-resistance, 5.5 Ω (typical at 3 V) Low capacitance, 5. pf (typical) -3 db high bandwidth with 5pF load: 7 MHz (typical) Low bit to bit skew: ps (typical) Low power consumption Low logic threshold: V Power down protection: D+/D- pins can tolerate up to 5.5 V when = V Logic (S+ and S-) above tolerance 5 kv ESD protection (HBM) Latch-up current 5 ma per JESD7 Lead (Pb)-free low profile miniqfn- (1. mm x 1. mm x.55 mm) Material categorization: for definitions of compliance please see APPLICATIONS Cellular phones Portable media players PDA Digital camera GPS Notebook computer TV, monitor, and set top box FUNCTIONAL BLOCK DIAGRAM AND PIN CONFIGURATION S+ 1 5 HSD+ S- Pin 1: LONG LEAD 9 miniqfn-l D+ HSD1+ Top View D- HSD HSD- Pin 1 Tx Device marking: Tx for x = Date/Lot traceability code S1-7-Rev. D, -Dec-1 1 Document Number: 77 ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT

2 ORDERING INFORMATION TEMP. RANGE PACKAGE PART NUMBER - C to 5 C miniqfn- DN-T1-E TRUTH TABLE S+ (PIN ) S- (PIN ) FUNCTION X D- = HSD1- X 1 D- = HSD- X D+ = HSD1+ 1 X D+ = HSD+ PIN DESCRIPTIONS PIN NAME DESCRIPTION S+ Select Input for D+ S- Select Input for D- HSD±, HSD±, D± Data Port ABSOLUTE MAXIMUM RATINGS (T A = 5 C, unless otherwise noted) PARAMETER LIMIT UNIT -.3 to Reference to S+, S-, D±, HSD1±, HSD± a -.3 to ( +.3) Current (Any Terminal except S+, S-, D±, HSD1±, HSD±) 3 Continuous Current (S+, S-, D±, HSD1±, HSD±) ± 5 ma Peak Current (Pulsed at 1 ms, % Duty Cycle) ± 5 Storage Temperature (D Suffix) -5 to 15 C Power Dissipation (Packages) b miniqfn- c mw ESD (Human Body Model) 5 kv Latch-up (Current Injection) 5 ma Notes a. Signals on S+, S-, D±, HSD1±, HSD± exceeding will be clamped by internal diodes. Limit forward diode current to maximum current ratings. b. All leads welded or soldered to PC board. c. Derate. mw/ C above 7 C. V SPECIFICATIONS ( = 3 V) PARAMETER SYMBOL TEST CONDITIONS OTHERWISE UNLESS SPECIFIED TEMP. a LIMITS - C to 5 C UNIT MIN. b TYP. c MAX. b Analog Switch Analog Signal Range d V ANALOG R DS(on) Full - V On-Resistance R DS(on) = 3 V, I D± = ma, V HSD1/± =. V Room Full On-Resistance Match d ΔR ON = 3 V, I D± = ma, V HSD1/± =. V Room -. - On-Resistance Resistance Flatness d R ON Flatness = 3 V, I D± = ma, V HSD1/± = V, 1 V Room - - Switch Off Leakage Current I (off) =.3 V, V HSD1/± =.3 V, 3 V, V D± = 3 V,.3 V Full - - Channel On Leakage Current I (on) =.3 V, V HSD1/± =.3 V, V, V D± = V,.3 V Full - - Digital Control = 3 V to 3. V Full Input Voltage High V INH =.3 V Full Input Voltage Low V INL = 3 V to.3 V Full Input Capacitance C IN Full pf Input Current I INL or I INH V IN = or Full -1-1 μa Ω na V S1-7-Rev. D, -Dec-1 Document Number: 77 ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT

3 SPECIFICATIONS ( = 3 V) PARAMETER SYMBOL TEST CONDITIONS OTHERWISE UNLESS SPECIFIED TEMP. a LIMITS - C to 5 C UNIT MIN. b TYP. c MAX. b Dynamic Characteristics Break-Before-Make Time e, d t BBM Room Full S-, S+ Turn-On Time e, d t ON = 3 V, V D1/± = 1.5 V, R L = 5 Ω, Room C L = 35 pf Full ns S-, S+ Turn-Off Time e, d Room t OFF Full Charge Injection d Q INJ C L = 1 nf, R GEN = Ω, V GEN = V pc Off-Isolation d OIRR = 3 V to 3. V, R L = 5 Ω, C L = 5 pf, Crosstalk d X TALK f = MHz db Bandwidth d BW = 3 V to 3. V, C L = 5 pf, R L = 5 Ω, -3 db MHz Channel-Off Capacitance d C D1± (off) C D± (off) = 3.3 V, f = 1 MHz Room Channel-On Capacitance d C D± (off) C D± (on) pf Channel-to-Channel Skew d t SK(O) Skew Off Opposite Transitions of the Same Output d t SK(p) = 3 V to 3. V, R L = 5 Ω, C L = 5 pf - - ps Total Jitter d t J - - Power Supply Power Supply Range V Power Supply Current I+ V IN = V, or Full - - μa Notes a. Room = 5 C, Full = as determined by the operating suffix. b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this datasheet. c. Typical values are for design aid only, not guaranteed nor subject to production testing. d. Guarantee by design, not subjected to production test. e. V IN = input voltage to perform proper function. f. Crosstalk measured between channels. Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. S1-7-Rev. D, -Dec-1 3 Document Number: 77 ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT

4 TYPICAL CHARACTERISTICS (T A = 5 C, unless otherwise noted) =. V T = 5 C I S = ma = 3. V D1± = 3.3 V = 3. V =.3 V = 5.5 V =. V 1 - C 1 +5 C 1 +5 C R ON vs. V D and Single Supply Voltage R ON vs. Analog Voltage and Temperature = 3. V 1 = 3.3 V C +5 C - C C - C +5 C R ON vs. Analog Voltage and Temperature R ON vs. Analog Voltage and Temperature 1 1 = 3. V 1 1 =.3 V 1 +5 C +5 C - C +5 C +5 C - C R ON vs. Analog Voltage and Temperature R ON vs. Analog Voltage and Temperature S1-7-Rev. D, -Dec-1 Document Number: 77 ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT

5 TYPICAL CHARACTERISTICS(T A = 5 C, unless otherwise noted) =.3 V I D±(ON) I+ - Supply Current (µa) =. V, 3. V, 3.3V, 3.V &.3 V Leakage Current (pa) I D±(OFF) I HSD1/± (OFF).1.1 1K K K 1M M Input Switching Frequency (Hz) Supply Current vs. Input Switching Frequency Temperature ( C) Leakage Current vs. Temperature V T - Switching Threshold (V) V IH V IL Gain (db) Supply Voltage (V) Switching Threshold vs. Supply Voltage - 1M M M 1G G Frequency (Hz) Gain vs. Frequency, = 3.3 V Off Isolation (db) M M M 1G G Frequency (Hz) Off-Isolation, = 3.3 V Cross Talk (db) M M M 1G G Frequency (Hz) Crosstalk, = 3.3 V S1-7-Rev. D, -Dec-1 5 Document Number: 77 ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT

6 TEST CIRCUITS Switch Input Logic Input HSD1± or HSD± S± D± Switch Output R L 5 Ω V OUT C L 35 pf Logic Input Switch Output V INH V INL V 5 % t r t f < 5 ns < 5 ns.9 x V OUT t ON t OFF C L (includes fixture and stray capacitance) V OUT = D± ( ) R L R + L R ON Logic "1" = Switch on Logic input waveforms inverted for switches that have the opposite logic sense. Fig. 1 - Switching Time V HSD1± HSD1± D± V O Logic Input V INH V INL t r < 5 ns t f < 5 ns V HSD± HSD± S± R L 5 Ω C L 35 pf HSD1± = HSD± V O 9 % Switch Output V t D t D C L (includes fixture and stray capacitance) Fig. - Break-Before-Make Interval V gen + R gen V IN = - HSD1± or HSD± S± D± V OUT C L = 1 nf V OUT IN On V OUT Off Q = OUT x C L On IN depends on switch configuration: input polarity determined by sense of switch. Fig. 3 - Charge Injection S1-7-Rev. D, -Dec-1 Document Number: 77 ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT

7 TEST CIRCUITS nf nf HSD1± or HSD± S± V,. V D± R L D± V,. V S± HSD1± or HSD± Meter HP19A Impedance Analyzer or Equivalent Analyzer f = 1 MHz Off Isolation = log V D± V HSD± or HSD1± Fig. - Off-Isolation Fig. 5 - Channel Off/On Capacitance maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see S1-7-Rev. D, -Dec-1 7 Document Number: 77 ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT

8 Package Information MINI QFN-L CASE OUTLINE DIM MILLIMETERS INCHES MIN. NAM. MAX. MIN. NAM. MAX. A A b c.15 REF. REF D E e. BSC.1 BSC L L ECN T-739-Rev. A, -Feb-7 DWG: 5957 Document Number: 79 -Feb-7 1

9 PAD Pattern RECOMMENDED MINIMUM PADS FOR MINI QFN L 1.7 (.9) 9 x.53 (.1).3 (.1). (.79) 1. (.7). (.157) Pitch x.5 (.9) Mounting Footprint Dimensions in mm (inch) Document Number: 55 Revision: 5-Mar- 1

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