Atomic Force Microscopy. Presented by Psylla Christina MSc Applied and Engineering Physics Department of Physics TU München 1

Size: px
Start display at page:

Download "Atomic Force Microscopy. Presented by Psylla Christina MSc Applied and Engineering Physics Department of Physics TU München 1"

Transcription

1 Atomic Force Microscopy Presented by Psylla Christina MSc Applied and Engineering Physics Department of Physics TU München 1

2 Outline Introduction Advantages of AFM Disadvantages of AFM How does AFM work? - How are the forces measured? Experimental setup of AFM - On which experimental parameters do the spatial resolutions depend? - How should a successful atomic force microsope be designed and constructed? - AFM tip - AFM cantilever Imaging methods -What types of forces are measured? -Modes of operation: Contact Mode, Non-Contact Mode, Tapping Mode -What are force curves? Examples of AFM images -Topography scanning -Elimination of extreme point -A better view - Thickness of a Thin Layer of Pd on Si Wafer -Surface roughness References 2

3 Introduction Atomic force microscopy is a high resolution type of scanning probe microscopy that allows us to see and measure surface structure in length scale 10nm-100μm with unprecedented resolution and accuracy (lateral resolution~30 nm, vertical resolution~0.1 nm) Unlike an imaging traditional microscope, AFM provides height information of the sample Almost any sample can be imaged, be it very hard (ceramic material) or very soft (human cells, individual molecules of DNA) We can generate images which look at the sample from any conceivable angle with simple analysis software Currently AFM is the most common form of scanning probe microscopy and is used in all fields of science as chemistry, biology, physics, materials science, nanotechnology, astronomy, medicine and more 3

4 Advantages of AFM minimal sample preparation it does not require a conductive sample provides a three-dimensional surface profile (ability to magnify in the X,Y,Z axes) works perfectly well in ambient air or even a liquid environment possible to study biological macromolecules and even living organisms it does not require expensive equipment due to its small size, it can also be combined with other microscopes or intruments 4

5 Disadvantages of AFM not practical to make measurements on areas greater than 100μm limited scanning speed, requiring several minutes for a typical scan images can be affected by nonlinearity, hysterisis and creep of the piezoelectric material possibility of image artifacts an AFM image does not reflect the true sample topography, but rather represents the interaction of the probe with the sample surface 5

6 How does AFM work? AFM provides a 3D profile of the surface on a nanoscale, by measuring forces (Van der Waals forces, dipole-dipole interactions, electrostatic forces) between a sharp probe (<10 nm) and surface at very short distance ( nm probe-sample separation) the probe is supported on a flexible cantilever the AFM tip gently touches the surface and records the small force between the probe and the surface forces between the tip and the sample lead to a deflection of the cantilever according to Hooke s law 6

7 How are the forces measured? the probe is placed on the end of a cantilever (which one can think of as a spring) the amount of force between the probe and sample is dependent on the spring constant (stiffness of the cantilever) and the distance between the probe and the sample this force can be described using Hooke s Law: F=-k x 7

8 Experimental setup of AFM 8

9 The cantilever is a bendable structure used to hold the tip. It is basically a spring with stiffness k The piezoelectric materials are used for controlling the motion of the probe as it is scanned across the sample surface A laser beam is reflected by the back side of a reflective cantilever onto the photodetector The position of the beam in the sensor measures the deflection of the cantilever and in turn the force between the tip and the sample The feedback loop includes all of the structural elements that are required to hold the probe at a fixed distance from the sample. 9

10 On which experimental parameters do the spatial resolutions depend? Τhe vertical resolution (~ Å) depends on: Laser intensity noise Photodiodes noise Thermal noise of cantilever Positionning noise of piezo-ceramic Z The lateral resolution (~ Å to few tens of nm) depends on: Positionning noise of piezoceramics X,Y Tip sharpness Long or short range interaction 10

11 How should a successful atomic force microsope be designed and constructed? A very sharp probe must be constructed for measurement of high-resolution images A feedback controller that permits rapid control so that the probe can follow the topography on the surface must be created An X-Y-Z piezoelectric scanner that has linear and calibrated motion must be created A stucture that is very rigid must be constructed, so that the probe does not vibrate relative to the surface 11

12 The tip of the AFM is used: AFM TIP for imaging for measuring forces (and mechanical properties) at the nanoscale as a nanoscale tool, i.e. for bending, cutting and extracting soft materials high-resolution image control In AFM all what is «seen», is seen by the tip, so everything depends on its shape 12

13 AFM TIP AFM tips with a polygon based pyramid shape positioned close to the free end of the AFM cantilever Macroscopic half-cone angle 20 to 25 viewed along the cantilever axis, 25 to 30 viewed from the side Half-cone angle smaller than 10 at the apex AFM tip height ~10-17 µm 13

14 AFM TIP Conical tips are more preferable than pyramidal tips 14

15 AFM artifact arising from a tip with a high radius of curvature with respect to the feature which is to be visualized 15

16 AFM CANTILEVER cantilevers are commonly fabricated from silicon, silicon nitride, or polymers the fabrication process typically involves undercutting the cantilever structure often with an anisotropic wet or dry etching technique without cantilever transducers, AFM would not be possible 16

17 Two equations are key to understanding the behavior of the cantilever: The first is Stoney's formula, which relates cantilever end deflection δ to applied stress σ: where ν is Poisson s ratio, E is Young s modulus, L is the beam length and t is the cantilever s thickness. The second is the formula relating the cantilever spring constant to the cantilever dimensions and material constants: where F is force and w is the cantilever width. The spring constant ω 0 is related to the cantilever resonance frequency by the usual harmonic oscillator formula: A change in the force applied to a cantilever can shift the resonance frequency. 17

18 Imaging methods Contact mode tip is in contact with the substrate high resolution can damage fragile surfaces Non-contact mode (NCM) tip is oscillating and not touching the sample Tapping mode tip is oscillating and taps the surface Lateral force microscopy (LFM) tip is scanned sideways used to measure friction forces on the nanoscale Force Modulation Microscopy rapidly moving the tip up and down while pressing it into the sample. possible to measure the hardness of the surface and characterize it mechanically 18

19 Imaging methods Electrical force microscopy If there are varying amount of charges present on the surface, the cantilever will deflect as it is attracted and repelled Kelvin probe microscopy By applying an oscillating voltage to an oscillating cantilever in non-contact mode and measuring the charge induced oscillations, a map can be made of the surface charge distribution Magnetic Force Microscopy If the cantilever has been magnetized it will deflect depending on the magnetization of the sample. Liquid sample AFM Immersing the cantilever in a liquid Image wet samples Electrochemical AFM 19

20 What types of forces are measured? The dominant interactions at short probe-sample distances in the AFM are Van der Waals (VdW) interactions During contact with the sample, the probe predominately experiences repulsive Van der Waals forces (contact mode) As the tip moves further away from the surface attractive Van der Waals forces are dominant (noncontact mode) 20

21 There are 3 primary imaging modes in AFM: Modes of operation Contact AFM (< 0.5 nm probesurface separation) Intermittent contact (tapping mode AFM) (0.5-2 nm probe-surface separation) Non-contact AFM ( nm probe-surface separation) 21

22 Contact mode (repulsive VdW) When the spring constant of cantilever is less than surface, the cantilever bends The force on the tip is repulsive By maintaining a constant cantilever deflection (using the feedback loops) the force between the probe and the sample remains constant and an image of the surface is obtained. 22

23 23

24 Contact mode Advantages Disadvantages High resolution High contact pressure (GPa) Fastest of all the topographic modes Lateral forces are experienced by both probe and sample No problem with surface pollution (Imaging in air and liquid is possible) Measurement of physical parameters like electrical and thermal properties Tip sharpness is limited and so does lateral resolution It can modify/destroy the observed surfaces, so no soft materials can be used 24

25 Non-Contact mode (attractive VdW) The probe does not contact the sample surface The cantilever is oscillated near its resonant frequency (about 100 to 400 khz) with an amplitude of a few nanometers (<10 nm) As the tip comes near the sample surface, the system detects variations in the resonant frequency or vibration amplitude The frequency deviation is used to make an image of the sample 25

26 A virus coated on a multilayered polymer surface was imaged. The delicate surface of the virus can be clearly seen from the phase information acquired by Non-Contact mode. 26

27 Non-contact mode Advantages Disadvantages soft materials (very low force exerted on the sample(10-12 N) low lateral resolution because of the long range forces no limitation in tip s sharpness surface pollution extended probe lifetime usually needs ultra high vacuum (UHV) for better imaging 27

28 Tapping mode The imaging is similar to contact The cantilever is driven to oscillate up and down at near its resonance frequency by a small piezoelectric element mounted in the AFM tip holder The probe lightly taps on the sample surface during scanning, contacting the surface at the bottom of its swing The amplitude is used for the feedback and the vertical adjustments of the piezoscanner are recorded as a height image 28

29 a: the oscillation amplitude of the cantilever is constant, representing the free space situation where there is no interaction between the tip and the surface b: the amplitude decreases when the tip approaches close enough to the sample surface so that it feels attractive and/or repulsive forces c: The cantilever stops oscillating when the tip is brought in to mechanically contact the surface 29

30 Tapping mode Advantages Disadvantages improved lateral resolution (~ 5 nm) compared to contact mode and noncontact mode (short range repulsive forces dominate) reduced forces applied on surface compared to contact mode (so we can observe soft materials) 5 to 10 times slower than contact mode (We need 5-20 minutes to obtain an image) tip is damaged after several scans no friction forces, so sharper tips can be used pollution layer is not a problem (works in air, liquids) 30

31 Epitaxial Silicon (1x1μm 2 ) 31

32 32

33 What are force curves? Force curve analyses can be used to determine chemical and mechanical properties such as adhesion, elasticity, hardness and rupture bond lengths Force curves measure the amount of force felt by the cantilever as the probe tip is brought close to - and even indented into - a sample surface and then pulled away In a force curve analysis the probe is repeatedly brought towards the surface and then retracted 33

34 The slope of the deflection (C) provides information on the hardness of a sample The adhesion (D) provides information on the interaction between the probe and sample surface as the probe is trying to break free 34

35 Examples of AFM images Topography Scanning Example of generated image upon scanning Pd thermally evaporated on Si 35

36 Elimination of Extreme Points This targets the highest points of the sample and eliminates them It then manipulates the image to create a smaller dynamic depth 36

37 A better view Now: Removed extreme points Digitally decreased the height of analysis Less than 1/3 as high as initial scan 37

38 Thickness of a Thin Layer of Pd on Si Wafer Systematic error 38

39 Surface roughness 39

40 References Atomic Force Microscopy by Peter Eaton and Paul West Atomic Force Microscopy & CT-AFM by K.Bouzehouane Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition Yurov, A. N. Klimov (1994) Scanning tunneling microscope calibratiion and reconstruction of real image: Drift and slope elimination G. Schitter, M. J. Rost (2008) Introduction to Scanning Probe Microscopy (SPM) Basic Theory Atomic Force Microscopy (AFM) Robert A. Wilson and Heather A. Bullen,* Department of Chemistry, Northern Kentucky University, Highland Heights, KY

Lecture 4 Scanning Probe Microscopy (SPM)

Lecture 4 Scanning Probe Microscopy (SPM) Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric

More information

Tecniche a scansione di sonda per nanoscopia e nanomanipolazione 2: AFM e derivati

Tecniche a scansione di sonda per nanoscopia e nanomanipolazione 2: AFM e derivati LS Scienza dei Materiali - a.a. 2008/09 Fisica delle Nanotecnologie part 5.2 Version 7, Nov 2008 Francesco Fuso, tel 0502214305, 0502214293 - fuso@df.unipi.it http://www.df.unipi.it/~fuso/dida Tecniche

More information

STM and AFM Tutorial. Katie Mitchell January 20, 2010

STM and AFM Tutorial. Katie Mitchell January 20, 2010 STM and AFM Tutorial Katie Mitchell January 20, 2010 Overview Scanning Probe Microscopes Scanning Tunneling Microscopy (STM) Atomic Force Microscopy (AFM) Contact AFM Non-contact AFM RHK UHV350 AFM/STM

More information

Scanning Probe Microscopy

Scanning Probe Microscopy Ernst Meyer Hans Josef Hug Roland Bennewitz Scanning Probe Microscopy The Lab on a Tip With 117 Figures Mß Springer Contents 1 Introduction to Scanning Probe Microscopy f f.1 Overview 2 f.2 Basic Concepts

More information

Piezoelectric Scanners

Piezoelectric Scanners Piezoelectric Scanners Piezoelectric materials are ceramics that change dimensions in response to an applied voltage and conversely, they develop an electrical potential in response to mechanical pressure.

More information

Keysight Technologies How to Choose your MAC Lever. Technical Overview

Keysight Technologies How to Choose your MAC Lever. Technical Overview Keysight Technologies How to Choose your MAC Lever Technical Overview Introduction Atomic force microscopy (AFM) is a sub-nanometer scale imaging and measurement tool that can be used to determine a sample

More information

1 Introduction. 1.1 Historical Perspective

1 Introduction. 1.1 Historical Perspective j1 1 Introduction 1.1 Historical Perspective The invention of scanning probe microscopy is considered one of the major advances in materials science since 1950 [1, 2]. Scanning probe microscopy includes

More information

ATOMIC FORCE MICROSCOPY

ATOMIC FORCE MICROSCOPY ATOMIC FORCE MICROSCOPY Introduction The atomic force microscope, or AFM, is a member of the family of instruments known as scanning probe microscopes. The AFM operates under a completely different principle

More information

Atomic Force Microscopy. Long Phan Nanotechnology Summer Series May 15, 2013

Atomic Force Microscopy. Long Phan Nanotechnology Summer Series May 15, 2013 Atomic Force Microscopy Long Phan Nanotechnology Summer Series May 15, 2013 1 World s Smallest Movie 2 Outline What is AFM? How does AFM Work? 3 Modes: Contact mode Non contact mode Tapping mode Imaging

More information

Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe. Keywords: Carbon Nanotube, Scanning Probe Microscope

Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe. Keywords: Carbon Nanotube, Scanning Probe Microscope International Journal of Arts and Sciences 3(1): 18-26 (2009) CD-ROM. ISSN: 1944-6934 InternationalJournal.org Usage of Carbon Nanotubes in Scanning Probe Microscopes as Probe Bedri Onur Kucukyildirim,

More information

INTRODUCTION TO SCANNING TUNNELING MICROSCOPY

INTRODUCTION TO SCANNING TUNNELING MICROSCOPY INTRODUCTION TO SCANNING TUNNELING MICROSCOPY SECOND EDITION C. JULIAN CHEN Department of Applied Physics and Applied Mathematics, Columbia University, New York OXJORD UNIVERSITY PRESS Contents Preface

More information

High flexibility of DNA on short length scales probed by atomic force microscopy

High flexibility of DNA on short length scales probed by atomic force microscopy High flexibility of DNA on short length scales probed by atomic force microscopy Wiggins P. A. et al. Nature Nanotechnology (2006) presented by Anja Schwäger 23.01.2008 Outline Theory/Background Elasticity

More information

Atomic Force Microscopy Observation and Characterization of a CD Stamper, Lycopodium Spores, and Step-Height Standard Diffraction Grating

Atomic Force Microscopy Observation and Characterization of a CD Stamper, Lycopodium Spores, and Step-Height Standard Diffraction Grating Atomic Force Microscopy Observation and Characterization of a CD Stamper, Lycopodium Spores, and Step-Height Standard Diffraction Grating Michael McMearty and Frit Miot Special Thanks to Brendan Cross

More information

Characterization of surfaces by AFM topographical, mechanical and chemical properties

Characterization of surfaces by AFM topographical, mechanical and chemical properties Characterization of surfaces by AFM topographical, mechanical and chemical properties Jouko Peltonen Department of physical chemistry Åbo Akademi University Atomic Force Microscopy (AFM) Contact mode AFM

More information

Surface Profilometry as a tool to Measure Thin Film Stress, A Practical Approach. Gianni Franceschinis, RIT MicroE Graduate Student

Surface Profilometry as a tool to Measure Thin Film Stress, A Practical Approach. Gianni Franceschinis, RIT MicroE Graduate Student 1 Surface Profilometry as a tool to Measure Thin Film Stress, A Practical Approach. Gianni Franceschinis, RIT MicroE Graduate Student Abstract-- As the film decreases in thickness the requirements of more

More information

CREOL, College of Optics & Photonics, University of Central Florida

CREOL, College of Optics & Photonics, University of Central Florida OSE6650 - Optical Properties of Nanostructured Materials Optical Properties of Nanostructured Materials Fall 2013 Class 3 slide 1 Challenge: excite and detect the near field Thus far: Nanostructured materials

More information

Force Spectroscopy with the Atomic Force Microscope

Force Spectroscopy with the Atomic Force Microscope Force Spectroscopy with the Atomic Force Microscope Application Note Wenhai Han, Agilent Technologies F. Michael Serry Figure 1. In Force spectroscopy raster-scanning is disabled temporarily or indefinitely

More information

Physics 441/2: Transmission Electron Microscope

Physics 441/2: Transmission Electron Microscope Physics 441/2: Transmission Electron Microscope Introduction In this experiment we will explore the use of transmission electron microscopy (TEM) to take us into the world of ultrasmall structures. This

More information

Atomic Force Microscope Physics Assignment

Atomic Force Microscope Physics Assignment Atomic Force Microscope Physics Assignment Group Members: İbrahim Mert DARICI Syed Arslan Afzal HASHMI Ali ZAREI Sudhakar Murthy MOLLI Materials Processing 2006 PHYSICS ASSIGNMENT 1 Content 1 Introduction...

More information

MEMS mirror for low cost laser scanners. Ulrich Hofmann

MEMS mirror for low cost laser scanners. Ulrich Hofmann MEMS mirror for low cost laser scanners Ulrich Hofmann Outline Introduction Optical concept of the LIDAR laser scanner MEMS mirror requirements MEMS mirror concept, simulation and design fabrication process

More information

nanovea.com MECHANICAL TESTERS Indentation Scratch Wear

nanovea.com MECHANICAL TESTERS Indentation Scratch Wear MECHANICAL TESTERS Indentation Scratch Wear nanovea.com MECHANICAL TESTER INTRO Nanovea Mechanical Testers provide unmatched multi-function Nano and Micro/Macro modules on a single platform. Both the Nano

More information

Scanning probe microscopy AFM, STM. Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication

Scanning probe microscopy AFM, STM. Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication Scanning probe microscopy AFM, STM Near field Scanning Optical Microscopy(NSOM) Scanning probe fabrication Scanning Probe Microscopy 1986 Binning and Rohrer shared Nobel Prize in Physics for invention.stm

More information

Tecniche a scansione di sonda per nanoscopia e nanomanipolazione: STM, AFM e derivati

Tecniche a scansione di sonda per nanoscopia e nanomanipolazione: STM, AFM e derivati LS Scienza dei Materiali - a.a. 2006/07 Fisica delle Nanotecnologie part 5.1 Version 5a, Nov 2006 Francesco Fuso, tel 0502214305, 0502214293 - fuso@df.unipi.it http://www.df.unipi.it/~fuso/dida Tecniche

More information

Counting and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM)

Counting and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Counting and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor of Environmental Engineering Department of Civil and Environmental

More information

7/3/2014. Introduction to Atomic Force Microscope. Introduction to Scanning Force Microscope. Invention of Atomic Force Microscope (AFM)

7/3/2014. Introduction to Atomic Force Microscope. Introduction to Scanning Force Microscope. Invention of Atomic Force Microscope (AFM) Introduction to Atomic Force Microscope Introduction to Scanning Force Microscope Not that kind of atomic Tien Ming Chuang ( 莊 天 明 ) Institute of Physics, Academia Sinica Tien Ming Chuang ( 莊 天 明 ) Institute

More information

Atomic Force Microscope

Atomic Force Microscope Atomic Force Microscope (Veeco Nanoman) User Manual Basic Operation 4 th Edition Aug 2012 NR System Startup If the system is currently ON To start the NanoScope software, double-click the NanoScope startup

More information

It has long been a goal to achieve higher spatial resolution in optical imaging and

It has long been a goal to achieve higher spatial resolution in optical imaging and Nano-optical Imaging using Scattering Scanning Near-field Optical Microscopy Fehmi Yasin, Advisor: Dr. Markus Raschke, Post-doc: Dr. Gregory Andreev, Graduate Student: Benjamin Pollard Department of Physics,

More information

Lecture 6 Scanning Tunneling Microscopy (STM) General components of STM; Tunneling current; Feedback system; Tip --- the probe.

Lecture 6 Scanning Tunneling Microscopy (STM) General components of STM; Tunneling current; Feedback system; Tip --- the probe. Lecture 6 Scanning Tunneling Microscopy (STM) General components of STM; Tunneling current; Feedback system; Tip --- the probe. Brief Overview of STM Inventors of STM The Nobel Prize in Physics 1986 Nobel

More information

NEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH STM AND AFM PROBES

NEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH STM AND AFM PROBES Vol. 93 (1997) A CTA PHYSICA POLONICA A No. 2 Proceedings of the 1st International Symposium on Scanning Probe Spectroscopy and Related Methods, Poznań 1997 NEAR FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY

More information

Nano-Spectroscopy. Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale

Nano-Spectroscopy. Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale Nano-Spectroscopy Solutions AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale Since its introduction in the early 80 s, Scanning Probe Microscopy (SPM) has quickly made nanoscale imaging an affordable

More information

5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy

5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy 5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy Resolution of optical microscope is limited by diffraction. Light going through an aperture makes diffraction

More information

The Design and Characteristic Study of a 3-dimensional Piezoelectric Nano-positioner

The Design and Characteristic Study of a 3-dimensional Piezoelectric Nano-positioner SICE Annual Conference August 8-,, The Grand Hotel, Taipei, Taiwan The Design and Characteristic Study of a -dimensional Piezoelectric Nano-positioner Yu-Chi Wang Department of Mechanical Engineering National

More information

Calibration of AFM with virtual standards; robust, versatile and accurate. Richard Koops VSL Dutch Metrology Institute Delft

Calibration of AFM with virtual standards; robust, versatile and accurate. Richard Koops VSL Dutch Metrology Institute Delft Calibration of AFM with virtual standards; robust, versatile and accurate Richard Koops VSL Dutch Metrology Institute Delft 19-11-2015 VSL Dutch Metrology Institute VSL is the national metrology institute

More information

(Nano)materials characterization

(Nano)materials characterization (Nano)materials characterization MTX9100 Nanomaterials Lecture 8 OUTLINE 1 -What SEM and AFM are good for? - What is the Atomic Force Microscopes Contribution to Nanotechnology? - What is Spectroscopy?

More information

1. Photon Beam Damage and Charging at Solid Surfaces John H. Thomas III

1. Photon Beam Damage and Charging at Solid Surfaces John H. Thomas III 1. Photon Beam Damage and Charging at Solid Surfaces John H. Thomas III 1. Introduction............................. 2. Electrostatic Charging of Samples in Photoemission Experiments............................

More information

A METHOD OF PRECISE CALIBRATION FOR PIEZOELECTRICAL ACTUATORS

A METHOD OF PRECISE CALIBRATION FOR PIEZOELECTRICAL ACTUATORS Uludağ Üniversitesi Mühendislik-Mimarlık Fakültesi Dergisi, Cilt 9, Sayı, 24 A METHOD OF PRECISE CALIBRATION FOR PIEZOELECTRICAL ACTUATORS Timur CANEL * Yüksel BEKTÖRE ** Abstract: Piezoelectrical actuators

More information

Atomic Force Microscope and Magnetic Force Microscope Background Information

Atomic Force Microscope and Magnetic Force Microscope Background Information Atomic Force Microscope and Magnetic Force Microscope Background Information Lego Building Instructions There are several places to find the building instructions for building the Lego models of atomic

More information

How To Image A Magnetic Microscope

How To Image A Magnetic Microscope Agustina Asenjo Dpto. Propiedades Opticas, Magnéticas y de Transporte Instituto de Ciencia de Materiales de Madrid- CSIC Introducción: Esquema MFM frente a otras técnicas de observación de dominios. Fundamentos

More information

ATOMIC FORCEMICROSCOPYASTOOL INCELLBIOLOGICAL RESEARCH FORGROUNDBASEDANDIN-FLIGHTSTUDIES

ATOMIC FORCEMICROSCOPYASTOOL INCELLBIOLOGICAL RESEARCH FORGROUNDBASEDANDIN-FLIGHTSTUDIES ATOMIC FORCEMICROSCOPYASTOOL INCELLBIOLOGICAL RESEARCH FORGROUNDBASEDANDIN-FLIGHTSTUDIES J.J.W.A vanloon DutchExperimentSupportCenter(DESC),Dept.OralBiology,ACTA- VrijeUniversiteit,Amsterdam,TheNetherlands.

More information

Basic principles and mechanisms of NSOM; Different scanning modes and systems of NSOM; General applications and advantages of NSOM.

Basic principles and mechanisms of NSOM; Different scanning modes and systems of NSOM; General applications and advantages of NSOM. Lecture 16: Near-field Scanning Optical Microscopy (NSOM) Background of NSOM; Basic principles and mechanisms of NSOM; Basic components of a NSOM; Different scanning modes and systems of NSOM; General

More information

AFM (Atomic Force Microscope) Instructions

AFM (Atomic Force Microscope) Instructions AFM (Atomic Force Microscope) Instructions Contact Mode AFM Advantages: High scan speeds (throughput) Contact mode AFM is the only AFM technique, which can obtain "atomic resolution" images. Rough samples

More information

FRT - setting the standard

FRT - setting the standard FRT - setting the standard Surface Analysis Metrology Instruments Process Control Chromatic white light sensor Weißlicht Specs: Linse blauer Fokus roter Fokus max height range 300 µm 600 µm 3 mm 10 mm

More information

Near-field scanning optical microscopy (SNOM)

Near-field scanning optical microscopy (SNOM) Adviser: dr. Maja Remškar Institut Jožef Stefan January 2010 1 2 3 4 5 6 Fluorescence Raman and surface enhanced Raman 7 Conventional optical microscopy-limited resolution Two broad classes of techniques

More information

Traceable cantilever stiffness calibration method using a MEMS nano-force transducer

Traceable cantilever stiffness calibration method using a MEMS nano-force transducer Traceable cantilever stiffness calibration method using a MEMS nano-force transducer Sai Gao 1, Uwe Brand 1, Wolfgang Engl 2, Thomas Sulzbach 2 1 PTB, 5.11 Hardness and tactile probing methods 2 Nanoworld

More information

Agilent 5500 AFM. Data Sheet. Features and Benefits

Agilent 5500 AFM. Data Sheet. Features and Benefits Agilent 5500 AFM Data Sheet Figure 1. STM image of HOPG showing atomic structure. Scan size: 4 nm. Features and Benefits Exceptional environmental and temperature control Superior scanning in fluids, gases,

More information

NP-AFM. Samples as large as 200 x 200 x 20 mm are profiled by the NP-AFM system, and several stage options are available for many types of samples.

NP-AFM. Samples as large as 200 x 200 x 20 mm are profiled by the NP-AFM system, and several stage options are available for many types of samples. NP-AFM The NP-AFM is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples

More information

Modern Construction Materials Prof. Ravindra Gettu Department of Civil Engineering Indian Institute of Technology, Madras

Modern Construction Materials Prof. Ravindra Gettu Department of Civil Engineering Indian Institute of Technology, Madras Modern Construction Materials Prof. Ravindra Gettu Department of Civil Engineering Indian Institute of Technology, Madras Module - 2 Lecture - 2 Part 2 of 2 Review of Atomic Bonding II We will continue

More information

Scanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale

Scanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale Scanning Near-Field Optical Microscopy for Measuring Materials Properties at the Nanoscale Outline Background Research Design Detection of Near-Field Signal Submonolayer Chemical Sensitivity Conclusions

More information

22.302 Experiment 5. Strain Gage Measurements

22.302 Experiment 5. Strain Gage Measurements 22.302 Experiment 5 Strain Gage Measurements Introduction The design of components for many engineering systems is based on the application of theoretical models. The accuracy of these models can be verified

More information

Sensors & Instruments for station. returned samples. Chun Chia Tan

Sensors & Instruments for station. returned samples. Chun Chia Tan Sensors & Instruments for station based materials characterization of returned samples Chun Chia Tan 04/01/2009 Outline Introduction to materials characterization General overview of the equipment used

More information

Atomic Force Microscopy. July, 2011 R. C. Decker and S. Qazi

Atomic Force Microscopy. July, 2011 R. C. Decker and S. Qazi Atomic Force Microscopy July, 2011 R. C. Decker and S. Qazi Learning through Visualization Visualization of physical phenomena can confirm hypothesis Observation provides opportunities for study without

More information

Overview of Topics. Stress-Strain Behavior in Concrete. Elastic Behavior. Non-Linear Inelastic Behavior. Stress Distribution.

Overview of Topics. Stress-Strain Behavior in Concrete. Elastic Behavior. Non-Linear Inelastic Behavior. Stress Distribution. Stress-Strain Behavior in Concrete Overview of Topics EARLY AGE CONCRETE Plastic shrinkage shrinkage strain associated with early moisture loss Thermal shrinkage shrinkage strain associated with cooling

More information

Nanotribology of Hard Thin Film Coatings: A Case Study Using the G200 Nanoindenter

Nanotribology of Hard Thin Film Coatings: A Case Study Using the G200 Nanoindenter Nanotribology of Hard Thin Film Coatings: A Case Study Using the G200 Nanoindenter Application Note Introduction Thin film coatings are extensively used in various applications, such as microelectronics,

More information

ENS 07 Paris, France, 3-4 December 2007

ENS 07 Paris, France, 3-4 December 2007 ENS 7 Paris, France, 3-4 December 7 FRICTION DRIVE SIMULATION OF A SURFACE ACOUSTIC WAVE MOTOR BY NANO VIBRATION Minoru Kuribayashi Kurosawa, Takashi Shigematsu Tokyou Institute of Technology, Yokohama

More information

Multi-mode Atomic Force Microscope (with High Voltage Piezo Force Microscope and +/- 8000 Oe Variable Field module.)

Multi-mode Atomic Force Microscope (with High Voltage Piezo Force Microscope and +/- 8000 Oe Variable Field module.) Multi-mode Atomic Force Microscope (with High Voltage Piezo Force Microscope and +/- 8000 Oe Variable Field module.) Main specifications of the proposed instrument: 1 Instrument Resolution: 1.1 The instrument

More information

Preface Light Microscopy X-ray Diffraction Methods

Preface Light Microscopy X-ray Diffraction Methods Preface xi 1 Light Microscopy 1 1.1 Optical Principles 1 1.1.1 Image Formation 1 1.1.2 Resolution 3 1.1.3 Depth of Field 5 1.1.4 Aberrations 6 1.2 Instrumentation 8 1.2.1 Illumination System 9 1.2.2 Objective

More information

IBM's Millipede. Conor Walsh Friction and Wear of Materials RPI Hartford 12/13/12

IBM's Millipede. Conor Walsh Friction and Wear of Materials RPI Hartford 12/13/12 IBM's Millipede Conor Walsh Friction and Wear of Materials RPI Hartford 12/13/12 The Millipede data storage device was developed by IBM and first demonstrated as a prototype at the 2005 CeBIT computer

More information

Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications

Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications Saulius Marcinkevičius Optics, ICT, KTH 1 Outline Optical near field. Principle of scanning near field optical microscope

More information

Nano-Microscopy: Lecture 1. Pavel Zinin HIGP, University of Hawaii, Honolulu, USA

Nano-Microscopy: Lecture 1. Pavel Zinin HIGP, University of Hawaii, Honolulu, USA GG 711: Advanced Techniques in Geophysics and Materials Science Nano-Microscopy: Lecture 1 Scanning Tunneling and Atomic Force Microscopies Principles Pavel Zinin HIGP, University of Hawaii, Honolulu,

More information

UNIVERSITY OF SOUTHAMPTON. Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices.

UNIVERSITY OF SOUTHAMPTON. Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices. UNIVERSITY OF SOUTHAMPTON Scanning Near-Field Optical Microscope Characterisation of Microstructured Optical Fibre Devices. Christopher Wyndham John Hillman Submitted for the degree of Doctor of Philosophy

More information

BNG 331 Cell-Tissue Material Interactions. Biomaterial Surfaces

BNG 331 Cell-Tissue Material Interactions. Biomaterial Surfaces BNG 331 Cell-Tissue Material Interactions Biomaterial Surfaces Course update Updated syllabus Homework 4 due today LBL 5 Friday Schedule for today: Chapter 8 Biomaterial surface characterization Surface

More information

Defense Technical Information Center Compilation Part Notice

Defense Technical Information Center Compilation Part Notice UNCLASSIFIED Defense Technical Information Center Compilation Part Notice ADP012914 TITLE: Atomic Force Microscopy Characterization of Nanostructured Materials Using Selective Chemical Etching DISTRIBUTION:

More information

Fast-scanning near-field scanning optical microscopy. using a high-frequency dithering probe

Fast-scanning near-field scanning optical microscopy. using a high-frequency dithering probe Fast-scanning near-field scanning optical microscopy using a high-frequency dithering probe Yongho Seo and Wonho Jhe * Center for Near-field Atom-photon Technology and School of Physics, Seoul National

More information

SPM 150 Aarhus with KolibriSensor

SPM 150 Aarhus with KolibriSensor Customied Systems and Solutions Nanostructures and Thin Film Deposition Surface Analysis and Preparation Components Surface Science Applications SPM 150 Aarhus with KolibriSensor Atomic resolution NC-AFM

More information

Indiana's Academic Standards 2010 ICP Indiana's Academic Standards 2016 ICP. map) that describe the relationship acceleration, velocity and distance.

Indiana's Academic Standards 2010 ICP Indiana's Academic Standards 2016 ICP. map) that describe the relationship acceleration, velocity and distance. .1.1 Measure the motion of objects to understand.1.1 Develop graphical, the relationships among distance, velocity and mathematical, and pictorial acceleration. Develop deeper understanding through representations

More information

Objectives. Experimentally determine the yield strength, tensile strength, and modules of elasticity and ductility of given materials.

Objectives. Experimentally determine the yield strength, tensile strength, and modules of elasticity and ductility of given materials. Lab 3 Tension Test Objectives Concepts Background Experimental Procedure Report Requirements Discussion Objectives Experimentally determine the yield strength, tensile strength, and modules of elasticity

More information

ENERGY DISSIPATION IN CONDUCTIVE POLYMERIC FIBER BUNDLES: SIMULATION EFFORT

ENERGY DISSIPATION IN CONDUCTIVE POLYMERIC FIBER BUNDLES: SIMULATION EFFORT ENERGY DISSIPATION IN CONDUCTIVE POLYMERIC FIBER BUNDLES: SIMULATION EFFORT NSF Summer Undergraduate Fellowship in Sensor Technologies Dorci Lee Torres-Velázquez (Mathematics) - University of Puerto Rico

More information

Mechanical and electrical investigations of thin polymer films by variabletemperature force microscopy

Mechanical and electrical investigations of thin polymer films by variabletemperature force microscopy Mechanical and electrical investigations of thin polymer films by variabletemperature force microscopy Dissertation zur Erlangung des Doktorgrades Dr. rer. nat. der Fakultät für Naturwissenschaften der

More information

Microscopy: Principles and Advances

Microscopy: Principles and Advances Microscopy: Principles and Advances Chandrashekhar V. Kulkarni University of Central Lancashire, Preston, United kingdom May, 2014 University of Ljubljana Academic Background 2005-2008: PhD-Chemical Biology

More information

Metrology for Characterization of Wafer Thickness Uniformity During 3D-IC Processing

Metrology for Characterization of Wafer Thickness Uniformity During 3D-IC Processing Metrology for Characterization of Wafer Thickness Uniformity During 3D-IC Processing Authors: Tom Dunn, Chris Lee, Mark Tronolone, Aric Shorey Corning Incorporated Corning, New York 14831 ShoreyAB@corning.com

More information

Atomic Force Microscopy ISC-CNR

Atomic Force Microscopy ISC-CNR Atomic Force Microscopy ISC-CNR ICS-CNRCNR Bruno Tiribilli bruno.tiribilli@isc.cnr.it Imaging on Biological samples Thin section of tissue Protein aggregates Force measurement Cells elasticity Protein

More information

Microscopy. MICROSCOPY Light Electron Tunnelling Atomic Force RESOLVE: => INCREASE CONTRAST BIODIVERSITY I BIOL1051 MAJOR FUNCTIONS OF MICROSCOPES

Microscopy. MICROSCOPY Light Electron Tunnelling Atomic Force RESOLVE: => INCREASE CONTRAST BIODIVERSITY I BIOL1051 MAJOR FUNCTIONS OF MICROSCOPES BIODIVERSITY I BIOL1051 Microscopy Professor Marc C. Lavoie marc.lavoie@cavehill.uwi.edu MAJOR FUNCTIONS OF MICROSCOPES MAGNIFY RESOLVE: => INCREASE CONTRAST Microscopy 1. Eyepieces 2. Diopter adjustment

More information

Thermal Analysis Excellence

Thermal Analysis Excellence Thermal Analysis Excellence DMA/SDTA861 e STAR e System Innovative Technology Versatile Modularity Swiss Quality Dynamic Mechanical Analysis Sets New Standards DMA/SDTA861 e Precise Measurement Technology

More information

International Journal of Engineering Research-Online A Peer Reviewed International Journal Articles available online http://www.ijoer.

International Journal of Engineering Research-Online A Peer Reviewed International Journal Articles available online http://www.ijoer. RESEARCH ARTICLE ISSN: 2321-7758 DESIGN AND DEVELOPMENT OF A DYNAMOMETER FOR MEASURING THRUST AND TORQUE IN DRILLING APPLICATION SREEJITH C 1,MANU RAJ K R 2 1 PG Scholar, M.Tech Machine Design, Nehru College

More information

Precision Work on the Human Eye

Precision Work on the Human Eye Precision Work on the Human Eye Piezo-Based Nanopositioning Systems for Ophthalmology Page 1 of 5 Introduction Human beings are visual animals, in other words, they acquire most information visually. It

More information

Metrology of silicon photovoltaic cells using coherence correlation interferometry

Metrology of silicon photovoltaic cells using coherence correlation interferometry Loughborough University Institutional Repository Metrology of silicon photovoltaic cells using coherence correlation interferometry This item was submitted to Loughborough University's Institutional Repository

More information

NANO INDENTERS FROM MICRO STAR TECHNOLOGIES

NANO INDENTERS FROM MICRO STAR TECHNOLOGIES NANO INDENTERS FROM MICRO STAR TECHNOLOGIES Micro Star makes a variety of nano indenters following defined standards or custom requested geometries and dimensions. Micro Star calibration laboratory complies

More information

Nano Meter Stepping Drive of Surface Acoustic Wave Motor

Nano Meter Stepping Drive of Surface Acoustic Wave Motor Proc. of 1st IEEE Conf. on Nanotechnology, Oct. 28-3, pp. 495-5, (21) Maui, Hawaii Nano Meter Stepping Drive of Surface Acoustic Wave Motor Takashi Shigematsu*, Minoru Kuribayashi Kurosawa*, and Katsuhiko

More information

Application Note #128 Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM

Application Note #128 Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM Modulus of polymer multilayer Adhesion plus topography of anti-bacterial film Melanin layer of butterfly wing Application te #128 Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce

More information

The use of Operating Deflection Shapes (ODS) to model the vibration of sanders and polishers HSL/2006/104. Project Leader: Author(s): Science Group:

The use of Operating Deflection Shapes (ODS) to model the vibration of sanders and polishers HSL/2006/104. Project Leader: Author(s): Science Group: Harpur Hill, Buxton Derbyshire, SK17 9JN T: +44 (0)1298 218000 F: +44 (0)1298 218590 W: www.hsl.gov.uk The use of Operating Deflection Shapes (ODS) to model the vibration of sanders and polishers HSL/2006/104

More information

Micro-Power Generation

Micro-Power Generation Micro-Power Generation Elizabeth K. Reilly February 21, 2007 TAC-meeting 1 Energy Scavenging for Wireless Sensors Enabling Wireless Sensor Networks: Ambient energy source Piezoelectric transducer technology

More information

Silicon-On-Glass MEMS. Design. Handbook

Silicon-On-Glass MEMS. Design. Handbook Silicon-On-Glass MEMS Design Handbook A Process Module for a Multi-User Service Program A Michigan Nanofabrication Facility process at the University of Michigan March 2007 TABLE OF CONTENTS Chapter 1...

More information

SCANNING PROBE MICROSCOPY NANOS-E3 SCHOOL 29/09/2015 An introduction to surface microscopy probes

SCANNING PROBE MICROSCOPY NANOS-E3 SCHOOL 29/09/2015 An introduction to surface microscopy probes SCANNING PROBE MICROSCOPY NANOS-E3 SCHOOL 29/09/2015 An introduction to surface microscopy probes SPM is ubiquitous in modern research Physics Nanotechnology/chemistry Nature Nanotechnology 10, 156 160

More information

WOOD WEAR TESTING USING TRIBOMETER

WOOD WEAR TESTING USING TRIBOMETER WOOD WEAR TESTING USING TRIBOMETER Prepared by Duanjie Li, PhD 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials. 2015 NANOVEA INTRO

More information

End Effector Selection and Design. End Effector Types General Design Practices Specific Design Criteria Case Studies

End Effector Selection and Design. End Effector Types General Design Practices Specific Design Criteria Case Studies End Effector Selection and Design End Effector Types General Design Practices Specific Design Criteria Case Studies 1 End Effector Types Mechanical Grippers Negative Pressure (vacuum) Magnetic Hooks Ladles

More information

New 3-Dimensional AFM for CD Measurement and Sidewall Characterization

New 3-Dimensional AFM for CD Measurement and Sidewall Characterization New 3-Dimensional AFM for CD Measurement and Sidewall Characterization ASTRACT Yueming Hua *, Cynthia uenviaje-coggins Park Systems Inc. 34 Olcott St. Santa Clara, CA 9554, USA Yong-ha Lee, Jung-min Lee,

More information

MECHANICS OF SOLIDS - BEAMS TUTORIAL 1 STRESSES IN BEAMS DUE TO BENDING. On completion of this tutorial you should be able to do the following.

MECHANICS OF SOLIDS - BEAMS TUTORIAL 1 STRESSES IN BEAMS DUE TO BENDING. On completion of this tutorial you should be able to do the following. MECHANICS OF SOLIDS - BEAMS TUTOIAL 1 STESSES IN BEAMS DUE TO BENDING This is the first tutorial on bending of beams designed for anyone wishing to study it at a fairly advanced level. You should judge

More information

In simple terms, microscopy provides magnified images of features that are beyond the

In simple terms, microscopy provides magnified images of features that are beyond the Measurements and Characterization Analytical Microscopy In simple terms, microscopy provides magnified images of features that are beyond the resolution of the human eye (approximately 100 µm). How the

More information

Plastic Film Texture Measurement With 3D Profilometry

Plastic Film Texture Measurement With 3D Profilometry Plastic Film Texture Measurement With 3D Profilometry Prepared by Jorge Ramirez 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials.

More information

- particle with kinetic energy E strikes a barrier with height U 0 > E and width L. - classically the particle cannot overcome the barrier

- particle with kinetic energy E strikes a barrier with height U 0 > E and width L. - classically the particle cannot overcome the barrier Tunnel Effect: - particle with kinetic energy E strikes a barrier with height U 0 > E and width L - classically the particle cannot overcome the barrier - quantum mechanically the particle can penetrated

More information

Atomic Force Microscopy - Basics and Applications

Atomic Force Microscopy - Basics and Applications Astrid Kronenberger School of Engineering and Science Atomic Force Microscopy - Basics and Applications Summer School June 2006 Complex Materials: Cooperative Projects of the Natural, Engineering and Biosciences

More information

Looking for the Origin of Power Laws in Electric Field Assisted Tunneling

Looking for the Origin of Power Laws in Electric Field Assisted Tunneling Looking for the Origin of Power Laws in Electric Field Assisted Tunneling H. Cabrera, D.A. Zanin, L.G. De Pietro, A. Vindigni, U. Ramsperger and D. Pescia Laboratory for Solid State Physics, ETH Zurich

More information

Raman spectroscopy Lecture

Raman spectroscopy Lecture Raman spectroscopy Lecture Licentiate course in measurement science and technology Spring 2008 10.04.2008 Antti Kivioja Contents - Introduction - What is Raman spectroscopy? - The theory of Raman spectroscopy

More information

Using light scattering method to find The surface tension of water

Using light scattering method to find The surface tension of water Experiment (8) Using light scattering method to find The surface tension of water The aim of work: The goals of this experiment are to confirm the relationship between angular frequency and wave vector

More information

Precision Work on the Human Eye

Precision Work on the Human Eye WHITEPAPER Precision Work on the Human Eye PIEZO-BASED NANOPOSITIONING SYSTEMS FOR OPHTHALMOLOGY BIRGIT BAUER PIEZO-BASED NANOPOSITIONING SYSTEMS FOR OPHTHALMOLOGY PAGE 2 Content Introduction... 3 Precision

More information

Transducer Mounting and Test Setup Configurations. Rick Bono The Modal Shop

Transducer Mounting and Test Setup Configurations. Rick Bono The Modal Shop Transducer Mounting and Test Setup Configurations Rick Bono The Modal Shop 1 Transducer Mounting Mechanical connection method Stud mount Adhesive mount Magnetic mount Press-fit friction mount Test parameter

More information

Experiment 5. Lasers and laser mode structure

Experiment 5. Lasers and laser mode structure Northeastern University, PHYS5318 Spring 2014, 1 1. Introduction Experiment 5. Lasers and laser mode structure The laser is a very important optical tool that has found widespread use in science and industry,

More information

Optical Measurement Techniques for Dynamic Characterization of MEMS Devices

Optical Measurement Techniques for Dynamic Characterization of MEMS Devices Technical Paper Optical Measurement Techniques for Dynamic Characterization of MEMS Devices Eric Lawrence, Polytec, Inc. March 2012 Polytec GmbH Polytec-Platz 1-7 D-76337 Waldbronn Germany Tel. + 49 (0)

More information

SURFACE TENSION. Definition

SURFACE TENSION. Definition SURFACE TENSION Definition In the fall a fisherman s boat is often surrounded by fallen leaves that are lying on the water. The boat floats, because it is partially immersed in the water and the resulting

More information

CSCI 4974 / 6974 Hardware Reverse Engineering. Lecture 8: Microscopy and Imaging

CSCI 4974 / 6974 Hardware Reverse Engineering. Lecture 8: Microscopy and Imaging CSCI 4974 / 6974 Hardware Reverse Engineering Lecture 8: Microscopy and Imaging Data Acquisition for RE Microscopy Imaging Registration and stitching Microscopy Optical Electron Scanning Transmission Scanning

More information