Summary of Low Voltage Components Voltage Withstand Test:

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1 8.7.4 Impulse-voltage withstand test The impulse-voltage withstand tests shall be made by applying the voltage given in A standard lightning impulse in accordance with IEC shall be used. The parameters are: front time: 1,2 µs ± 30 % time to half value: 50 µs ± 20 % output impedance: 500?± 10 % output energy: 0,5 J ± 10 % The length of each test lead shall not exceed 2 m. The impulse voltage shall be applied to the appropriate points accessible from the outside of the device, the other circuits and the exposed conductive parts being connected to earth. During the test, no input or auxiliary energizing quantity shall be applied to the device. Three positive and three negative impulses shall be applied at intervals of not less than 5 s. Acceptance criteria: no flashover is accepted and after the test, the ECT shall still comply with basic accuracy tests. Summary of Low Voltage Components Voltage Withstand Test: All of NxtPhase Generation 3 electronics have been designed to meet the requirements of this section of the IEC Standard. At this time, no test results are available, as the testing is not completed. Test results will be provided as soon as reports are generated once testing is complete. Original Low Voltage Components Voltage Withstand Test Report: See comment above NxtPhase T&D Corporation Page 21

2 The IEC Standard Requirements 8.8 EMC tests General The tests shall be made to prove the compliance with In many cases an electronic transformer may be divided into a number of major subassemblies such as, for example, circuits located in control cubicles and circuits located in the switchgear area. EMC tests relevant for the applied technology of electronic transformer have to be carried out on each major subassembly the full electronic transformer being in operation or the missing subassemblies being simulated. An example of major subassembly division is given in figure 15. (1) (2) Sub-assembly 1 (2) Sub-assembly 2 (7), (8) (3) (4), (5), (6),(7), (8) (4), (5), (6) Link between Sub-assembly 1 and 2 (3) Switchyard area Control cubicle area (1) HV line (2) Enclosure port (3) Ground port (4) Signal port (5) Command port (6) Communication port (7) a.c. power port (8) d.c. power port Sub-assembly 1 : "outdoor part" in switchgear area Sub-assembly 2 : "indoor part" in control cubicle area Figure 15 Example of subassembly subjected to EMC tests 2005 NxtPhase T&D Corporation Page 22

3 8.8.2 General conditions during EMC tests The general conditions for EMC tests are described in IEC and CISPR 11.uring the EMC tests, the length of cable between the ECT and test equipment and between subassembly 1 and 2 should be the maximum specified by the manufacturer and the arrangement of the cable shall, as far as practicable, represent in-service conditions EMC emission tests An emission test will be performed according to the CISPR 11 testing procedure. The test limits will be those of group 1 class A. The test shall preferably be performed on the complete assembly but for ease of testing in case one of the possible subassemblies contains no electrical parts, that test can be performed on the remaining subassemblies. Summary of EMC Emission Tests: Test Result: Pass Generation 3 Electronics Serial # Prototype Rated Voltage: 69 kv Rated Current: 2000 A Protocol Labs report #: 03056, Date: 4/26/2005 Test date: 1/31/2005 through 2/25/2005 Basic Standards: Conducted Emissions (CISPR 11/22 Class A): Pass [X] Fail [ ] N/A [ ] Radiated Emissions (CISPR 11/22 Class A): Pass [X] Fail [ ] N/A [ ] Conducted Emissions (FCC Part 15/B Class A): Pass [X] Fail [ ] N/A [ ] Radiated Emissions (FCC Part 15/B Class A): Pass [X] Fail [ ] N/A [ ] Conducted Emissions (ICES 003 Class A): Pass [X] Fail [ ] N/A [ ] Radiated Emissions (ICES 003 Class A): Pass [X] Fail [ ] N/A [ ] Conducted Emissions (EN55011/22 Class A): Pass [X] Fail [ ] N/A [ ] Radiated Emissions (EN55011/22 Class A): Pass [X] Fail [ ] N/A [ ] Electrostatic Discharge ( ) Level 4: Pass [X] Fail [ ] N/A [ ] Electrostatic Discharge (IEEE C ) Level 4: Pass [X] Fail [ ] N/A [ ] Electrostatic Discharge (IEC ) Level 4: Pass [X] Fail [ ] N/A [ ] Testing was performed per the following standards, pursuant to IEC :2002 and EN 50263:2000. Radiated and Power Line Conducted Emission tests were performed using measurement procedure CISPR 11. Radiated emissions were performed on an open area 10m test site. Table Emissions Test Results - International Test Standard Description Result Conducted Emissions CISPR 11/22 Class A Limits EN55011/22 Class A Limits The Conducted Emissions are measured on the phase and Neutral Power lines in the MHz range. Pass Radiated Emissions CISPR 11/22 Class A Limits EN55011/22 Class A Limits The radiated emissions are measured in the MHz range. Pass 2005 NxtPhase T&D Corporation Page 23

4 Test Standard Description Result Power Line Harmonics EN Class D Limits Maximum 1.08, 2.3, 0.43, 1.14, 0.3, 0.77, 0.23 A... for 2nd to nth Harmonic N/A DC Powered Power line Fluctuations (Flicker) EN P st <1, P lt < 0.65 Maximum 3% total Harmonic Distortion N/A DC Powered Original EMC Emission Test Report: See Appendix A NXCT Gen 3.0 Project, Current Transducer Systems for Metering and Protection, Applications EMC Compliance Test Report D00559R00.00 The IEC Standard Requirements EMC immunity tests The test shall be performed on a port-by-port basis, guidance for the identification of ports being given in figure Harmonic and interharmonic disturbance test The test shall be performed according to the test procedure of IEC The severity level is class 2 (full harmonic distortion 10 %). The assessment criterion is given in Slow voltage variation test The test shall be performed according to the test procedure of IEC for a.c. power supply and IEC for d.c. power supply. The voltage variations used are from +10 % to 20 % of the nominal voltage of the a.c. power supply and from +20 % to 20 % of the nominal voltage of the d.c. power supply. The assessment criterion is given in Voltage dips and short interruption test The test shall be performed according to the test procedure of IEC for a.c. power supply and IEC for d.c. power supply. The voltage dip used for the test is 30 % of the nominal voltage of the a.c. power supply during 0,02 s. The voltage interruption test is performed during 0,1 s for a.c. power supply. The voltage dip used for the test is 40 % of the nominal voltage of the d.c. power supply during 0,05 s. The voltage interruption test is performed during 0,05 s or 0,02 s for d.c. power supply. The assessment criterion is given in NxtPhase T&D Corporation Page 24

5 Surge immunity test The test shall be performed according to the test procedure of IEC The test generator to be used is the combination wave (hybrid) generator (IEC , 6.1) with standard 1,2/50 s voltage waveform (open-circuit) and 8/20 s current waveform (shortcircuit). The test level is according to installation class 4 (4 kv common mode, 2 kv differential mode). The assessment criterion is given in Electronic fast transient/burst test The test shall be performed according to the test procedure of IEC , the test level being class 4 (4 kv test voltage at 2,5 k Hz repetition rate on power supply port and 2 kv at 5 k Hz repetition rate on input/output signal, data and control ports common mode). The test will be carried out using the coupling/decoupling network on the power supply port and the capacitive coupling clamp on I/O and communication ports. The assessment criterion is given in Oscillatory waves immunity test The test shall be performed according to the test procedure of IEC The test generator to be used is the damped oscillatory wave generator (IEC , 6.1.2). The test voltage will be 2,5 kv common mode and 1 kv differential mode both for power supply and control/signal lines (as in IEC ). Test frequency will be 1 M Hz at 400/s repetition rate (as in IEC ). The assessment criterion is given in Electrostatic discharge test The test shall be performed according to the test procedure of IEC The test level is class 2 (4 kv test voltage), which gives protection in antistatic environments (like concrete) for relative humidity as low as 10 % (see also IEC , clause A.4). The assessment criterion is given in Power-frequency magnetic field immunity test The test shall be performed according to the test procedure of IEC Test level is 5 (100 A/m steady state and A/m??1). The assessment criterion is given in Pulse magnetic field immunity test The test shall be performed according to the test procedure of IEC Test level is 5 ( A/m peak). The assessment criterion is given in Damped oscillatory magnetic field immunity test The test shall be performed according to the test procedure of IEC Test level is class 5 (100 A/m test field). The assessment criterion is given in Radiated, radiofrequency, electromagnetic field immunity test The test shall be performed according to the test procedure of IEC Test level is class 3 (10 V/m field strength). The assessment criterion is given in NxtPhase T&D Corporation Page 25

6 Summary of EMC Immunity Tests: Test Result: Pass Generation 3 Electronics Serial # Prototype Rated Voltage: 69 kv Rated Current: 2000 A Protocol Labs report #: 03056, Date: 4/26/2005 Test date: 1/31/2005 through 2/25/2005 Radiated RF Susceptibility ( ) Level 3: Pass [X] Fail [ ] N/A [ ] Radiated RF Susceptibility (IEC ) Level 3: Pass [X] Fail [ ] N/A [ ] Radiated RF Susceptibility (IEEE C ) 35V/m: Pass [X] Fail [ ] N/A [ ] Radiated RF Susceptibility (IEEE C37.92) 35V/m: Pass [X] Fail [ ] N/A [ ] Electrical Fast Transient/Burst ( ) Level 4: Pass [X] Fail [ ] N/A [ ] Electrical Fast Transient/Burst (IEEE C ) Level 4: Pass [X] Fail [ ] N/A [ ] Electrical Fast Transient/Burst (IEC ) Level 4: Pass [X] Fail [ ] N/A [ ] Surge Immunity ( ) Level 4: Pass [X] Fail [ ] N/A [ ] Surge Immunity (IEC ) Level 4: Pass [X] Fail [ ] N/A [ ] Conducted RF Immunity ( ) Level 3: Pass [X] Fail [ ] N/A [ ] Conducted RF Immunity (IEC ) Level 3: Pass [X] Fail [ ] N/A [ ] Power Frequency Magnetic Field Immunity ( ) Level 5: Pass [X] Fail [ ] N/A [ ] Pulse Magnetic Field Immunity ( ) Level 5: Pass [X] Fail [ ] N/A [ ] Damped Oscillatory Magnetic Field ( ) Level 5: Pass [X] Fail [ ] N/A [ ] Oscillatory Waveforms Immunity ( ) Level 3: Pass [X] Fail [ ] N/A [ ] Oscillatory Waveform Immunity (IEC ) Level 3: Pass [X] Fail [ ] N/A [ ] Surge Withstand Capability, Oscillatory Waveform (IEEE C ) Pass [X] Fail [ ] N/A [ ] Voltage Dips Interruptions & Variations ( ), 200ms Interrupt Pass [X] Fail [ ] N/A [ ] Voltage Dips Interruptions & Variations ( ), 1200ms Interrupt Pass [X] Fail [ ] N/A [ ] Voltage Interruptions (IEC ) 200ms Interrupt Pass [X] Fail [ ] N/A [ ] Tests were conducted on a sample of the equipment for the purpose of demonstrating compliance with the following standards. Testing was performed per the following standards, and the EUT responded as noted NxtPhase T&D Corporation Page 26

7 Table Immunity Test Summary Applicable Standard ESD EN IEC IEEE C Radiated Immunity EN IEC Radiated Immunity IEEE C IEEE C37.92 EFT/Burst EN IEC IEEE C Surge Immunity EN IEC Conducted RF EN IEC Power Frequency Magnetic Field EN Magnetic Pulse EN Damped Oscillatory Magnetic Field EN Oscillatory Immunity EN IEC IEEE C Slow Voltage Variations EN Voltage Interruptions EN IEC Voltage Dips EN Description Air Discharge up to 15 kv and Contact Discharge at 8 kv at several locations with 10 positive and 10 negative discharges per location. Subject to electromagnetic field of 10V/m from 80 MHz to 1000 MHz and 1.4 GHz to 2.0 GHz. Subject to electromagnetic field of 35 V/m from 25 MHz to 1000 MHz EFT/Burst of 4.0 kv is coupled to the all I/O and control signals, respectively and 4.0 kv is injected on the Power Line. 4 kv Positive and Negative Surges are injected in Common Mode, Differential Mode, as well as shielded lines All lines are RF coupled to 10Vrms level from MHz. For magnetically susceptible apparatus only. Subject to a magnetic Field of 100A (RMS) A/m for 60 seconds and 1000 (RMS) A/m for 3 seconds. For magnetically susceptible apparatus only. Subject to magnetic s pulse Field of 1000 A/m is applied Magnetic field-tests for electronic equipment in H.V. sub-stations. Applied on the X, Y and Z-axis. Repetitive, damped oscillatory waves occurring mainly in power, control and cables installed in H.V. and M.H. sub stations. Test or Measurement Air Discharge Contact Discharge Modulated Frequency Field Keyed Direct injection Coupling Clamp Line to Ground Line to Line Applied to the Shield Modulated Frequency Field Applied on all 3 axis Applied on all 3 axis Applied on all 3 axis Common Mode: Differential Mode Required Level +/- 15 kv Criterion (See Pass/Fail Criteria Section) Metering Protection Result +/- 8 kv B A Complies 1 khz 80% AM 10 V/m Keyed 35 V/m +/- 4.0 kv A A Complies A A Complies +/- 4.0 kv B A Complies +/- 4.0 kv +/- 2.0 kv +/- 4.0 kv B A Complies 1 khz 80% AM 10 Vrms 100 A/m for 60 sec 1000 A/m for 3 sec 1000 A/m 100 A/m 2.5 kv 2.5 kv The DC voltage is varied Voltage Varied +/- 20% The voltage on the power supply is interrupted for a set amount of time The voltage and current are varied for a set amount of time Voltage interrupted Voltage Dips Current Dips 100% for up to 200ms 50% for 100ms 60% for 50ms B A Complies A A Complies B A Complies B A Complies B A Complies A A Complies A 50ms A 200m s Complies A A Complies 2005 NxtPhase T&D Corporation Page 27

8 Original EMC Emission Test Report: See Appendix A NXCT Gen 3.0 Project, Current Transducer Systems for Metering and Protection, Applications EMC Compliance Test Report D00559R00.00 The IEC Standard Requirements 8.9 Accuracy test General The following accuracy tests are applied to measuring electronic current transformer and to protective electronic current transformer. Test circuits are given in annex B for digital output and annex C for analogue output. Basic accuracy tests Basic accuracy tests for measuring electronic current transformer To prove compliance with 12.2, tests shall be made at each value of current given in tables 19, 20 and 21 at rated frequency, at rated burden (if relevant), and at ambient temperature, unless otherwise specified. Current transformers having rated primary current factor greater than 1,2 shall be tested at rated primary extended current instead of 1,2 times the rated primary current. NOTE The test can be carried out using a pure delay time device inserted between the reference transformer and the accuracy measurement system Basic accuracy test for protective electronic current transformer To prove compliance with , the test shall be made at rated primary current (see table 22), at rated frequency, at rated burden (if relevant) and at ambient temperature. NOTE The test can be carried out using a pure delay time device inserted between the reference transformer and the accuracy measurement system Temperature cycle accuracy test In addition to the basic accuracy tests made in accordance with 8.9.2, the temperature cycle accuracy test shall be performed in the following conditions:? at rated frequency;?at rated current or rated primary extended current applied continuously;?at rated burden (if relevant);?with indoor and outdoor components exposed to their specific maximum and minimum ambient air temperature. A cycle test in accordance with figure 16 shall be performed NxtPhase T&D Corporation Page 28

9 Figure 16 Temperature cycle accuracy test Minimum temperature variation rate is 5 K/h. It can be higher only if allowed by the manufacturer. The thermal time constant shall be declared by the manufacturer. NOTE Time needed to stabilize the temperature of the electronic current transformer depends mainly on the size and construction of the transformer. For electronic current transformers, partially indoor, partially outdoor, the tests shall be made for indoor and outdoor parts, each one at both extremes of relevant temperature range, respecting the following rules: ambient air temperature for both parts; maximum temperature for indoor part when maximum temperature for outdoor part; minimum temperature for indoor part when minimum temperature for outdoor part. In normal service conditions the measured error of every measuring point should be within the limits of the relevant accuracy class Test for accuracy versus frequency In addition to the basic accuracy tests made in accordance with 8.9.2, tests for accuracy shall be made at the two extremes of standard reference range of frequency given in 5.1.5, at rated current, at rated burden (if relevant) and at constant ambient temperature. The error shall be within the limits of the relevant accuracy class. NOTE Measurement with different frequencies are performed with a test circuit. For the tests, accuracy measurement system calibrated at rated frequency may be acceptable Test for accuracy in relation to replacement of components To prove compliance with clause 0 the following test shall be performed. The ability of the electronic current transformer to fulfill its accuracy class when some of its components are replaced shall be proven by means of an accuracy test at room temperature, rated frequency, rated current and rated burden (if relevant) NxtPhase T&D Corporation Page 29

10 8.9.5 Test for signal-to-noise ratio To prove compliance with a test for signal-to-noise ratio shall be performed. The test procedure shall be agreed upon between manufacturer and user. See D.2.3 for guidance Additional accuracy tests for protective electronic current transformers Test for composite error Tests shall be made at rated primary current to prove compliance with in respect of current error and phase error. Compliance with the limits of composite error given in table 21 shall be demonstrated by a direct test in which a substantially sinusoidal current equal to the rated accuracy limit primary current is passed through the primary terminals with rated burden (if relevant). The test may be carried out on an ECT similar to the one being supplied, except that reduced insulation may be used provided that the same geometrical arrangement is retained. NOTE Where very high primary currents and a single-bar primary conductor of ECT are concerned, the distance between the return primary conductor and the ECT should be taken into account from the point of view of reproducing service conditions Test for transient performance Compliance with the limits of instantaneous error up to t?and/or t and at accuracy limit condition given in table 21 shall be demonstrated by a direct test in which a transient current defined in is passed through the primary terminals with rated burden (if relevant), rated primary short-circuit current, rated primary time constant and rated duty cycle. NOTE Where very high primary currents and a single-bar primary conductor of ECT are concerned, the distance between the return primary conductor and the ECT should be taken into account from the point of view of reproducing service conditions NxtPhase T&D Corporation Page 30

11 Summary of Accuracy Tests: Test Result: Pass, meets 0.2S class CT serial #: D0XXXXR Rated Voltage: 345 kv Rated Current: 2000 A Powertech report #: REP2, Date: 4/25/2003 Test date: 1/23/2003 through 1/27/2003 NXCT accuracy tests, in accordance with IEC (2002), were performed throughout a battery of type tests required by the IEC standard. The NXCT was a metering class CT with 4V and 1A outputs at rated current NxtPhase T&D Corporation Page 31

12 Test Result: Pass, meets 0.2S class CT serial #: D0XXXXR Rated Voltage: 345 kv Rated Current: 2000 A Powertech report #: REP3, Date: 4/25/2003 Test date: 1/23/2003 A linearity test was performed on the NXCT in accordance with IEC (2002). The results are presented in the table below. Linearity Test Results: 2005 NxtPhase T&D Corporation Page 32

13 Test Result: Pass, meets 0.2S class CT serial #: D0XXXXR Rated Voltage: 345 kv Rated Current: 2000 A Powertech report #: REP4, Date: 4/25/2003 Test date: 3/28/2003 A temperature cycle test was performed on the NXCT in accordance with IEC (2002). The results are presented in the charts below. The test current was 1200A NxtPhase T&D Corporation Page 33

14 Test Result: Pass CT serial #: D0XXXXR Rated Voltage: 345 kv Rated Current: 2000 A Powertech report #: REP1, Date: 4/25/2003 Test date: 1/24/2003 A temperature rise test at 3000 A was performed on the NXCT in accordance with IEC (2002) and IEEE C The results are presented in the table below NxtPhase T&D Corporation Page 34

15 Test Result: Pass, class A CT serial #: D00246R Rated Voltage: 420 kv Rated Current: 2000 A NxtPhase Document #: D00341R00.00, Date8/29/2003 Test date: 9/21/2003 A temperature rise test at 4000 A was performed on the NXCT in accordance with IEC (2002) and IEEE C The NXCT was a protection class CT with a 0.2 V output at rated current. The NXCT passed the temperature rise test at 4000 Arms thermal current with a A class of insulation (60 C temperature rise of the bus) for classes not immersed in oil or bituminous compound according to the IEC industry standard. Original Accuracy Test Reports: 2005 NxtPhase T&D Corporation Page 35

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20 T1-Other Document TEMPERATURE-RISE TEST (4000 A) Doc #: D00341R00.00 Released Status: Preliminary Author: Allen Rose Approver(s): Eric Hadley, Jim Blake 1. Revision History Revision Revision Date: Sections Description of Change: Revised by: Level: (YYYY-MM-DD) Affected: R all First Document Release AHR 2. Introduction This document reports the results of a temperature-rise test performed on a 2 turn protection NXCT on September 21, The test witnesses are Allen Rose, Eric Hadley, and Jim Blake. The NXCT has a serial number of D00246R Scope The test was performed in accordance with sections 5.1.6, 6.1.2, and 8.2 of the IEC industry standard with a 4000 A rms thermal current. The NXCT was fitted with a standard 4.5 round bus and 4 hole NEMA pad connectors. (See photos below.) 4. Results The NXCT #D00246R passed the temperature rise test at 4000 A rms thermal current with a A class of insulation (60 C temperature rise of the bus) for classes not immersed in oil or bituminous compound according to the IEC industry standard. Scale factor error, measured at the rated current of 2000 A, before test was 0.02% ± 0.12% and after test and cool down, 0.13% ± 0.12%. The actual rise of the bus was 47 C above ambient temperature. The phase offset is about -0.7 and remained constant throughout the test. The performance of the sensor before and after the 4000 A heat rise test did not change within the uncertainty of the measurements. 5. Related Standard Document Number IEC Definitions NXCT DVM Term 7. Test Metrology Title Instrument transformers Part 8: electrical current transducers NxtPhase Current Transducer Digital volt meter Definition The NXCT was tested for scale factor accuracy using a Knopp CT-5000 (with a 0.1Ω burden), Arbiter, and Agilent DVM 3458A. A SRS 530 lockin amplifier was used to monitor the scale factor during the test. AD590 temperature probes provided the temperature readings. The accuracy of the AD590s are ±1 C. The accuracy of the combined Knopp and arbiter is 510 ppm for the current reading. The accuracy of the Agilent 3458A in this test arrangement is about 0.10 %. All instruments are NIST traceable. Total uncertainty on the current ratio or scale factor error is about 0.12 %. C:\Documents and Settings\arose\My Documents\power tech\gen 2\Temperature rise test D00341.doc PROPRIETARY INFORMATION. Do Not Disseminate Without The Consent Of NxtPhase Copyright 2003 Last Saved: 9/11/2003 2:34 PM Page 1 of 4

21 8. Test diagram Transformer Isolated Current Source 4000 A Knopp 5000:1 NXCT 2000 A :0.2 V 0.1 Ω Arbiter DVM Lockin Amplifier with difference amp *The lockin difference amplifier should not be connected to the NXCT output when reading the DVM output. The common mode noise on the NXCT output biases the DVM reading by about 20 mv, because the lockin difference amplifier grounds one side of the NXCT differential output. The DVM should have a filter function of 20 to 100 Hz on. 9. Test Photographs C:\Documents and Settings\arose\My Documents\power tech\gen 2\Temperature rise test D00341.doc PROPRIETARY INFORMATION. Do Not Disseminate Without The Consent Of NxtPhase Copyright 2003 Last Saved: 9/11/2003 2:34 PM Page 2 of 4

22 10. Temperature profile of test The slope of the bus bar temperature from 13.5 to 14.5 hours is 0.45 C/h within the IEC standard of 1 C/h. The test was performed in still air. The head shows no steady state temperature rise above the air temperature with the 4000 A heating current. Temperature ( o C) Temperature rise test data Slope 0.45 o C/h Bus Bar Clamp Base Air Head Time (h) C:\Documents and Settings\arose\My Documents\power tech\gen 2\Temperature rise test D00341.doc PROPRIETARY INFORMATION. Do Not Disseminate Without The Consent Of NxtPhase Copyright 2003 Last Saved: 9/11/2003 2:34 PM Page 3 of 4

23 11. NXCT performance during the heat rise test The scale factor error performance during the test shows that the head temperature rose with the heated air around the current source. The scale factor change shown below represents 10 C differential between the base, and the head. Our sensor is known to exhibit a scale factor sensitivity to this difference of about 200 ppm/ C Scale Factor Error (%) Scale factor error Calibration points Bus Bar Head Temperature ( o C) Time (h) 14 C:\Documents and Settings\arose\My Documents\power tech\gen 2\Temperature rise test D00341.doc PROPRIETARY INFORMATION. Do Not Disseminate Without The Consent Of NxtPhase Copyright 2003 Last Saved: 9/11/2003 2:34 PM Page 4 of 4

24 The IEC Standard Requirements 8.11 Verification of the protection Verification of the IP coding In accordance with the requirements specified in and , tests shall be performed in accordance with IEC on the enclosures of all parts of the ECT fully assembled as under service conditions Mechanical impact test In accordance with the requirements specified in , enclosures for indoor installation shall be subjected to an impact test. Three blows are applied to points of the enclosure that are likely to be the weakest points. Devices such as connectors, displays, etc. are excepted. The use of a spring-operated impact test apparatus as defined in IEC is recommended. After the test, the enclosure shall show no breaks and the deformation of the enclosure shall not affect the normal function of the electronic current transformer, and shall not reduce the specified degree of protection. Superficial damage, such as removal of paint, breaking of cooling ribs or similar parts, or depression of small dimension can be ignored. Summary of Verification of the Protection Tests: All of NxtPhase Generation 3 electronics have been designed to meet all of the requirements of this section of the IEC Standard. At this time, no test results are available, as the testing is not completed. Test results will be provided once testing is complete and as soon as reports are generated Original Verification of the Protection Test Report: See comment above. The IEC Standard Requirements 8.12 Tightness tests The purpose of tightness tests is to demonstrate that the absolute leakage rate F does not exceed the specified value of the permissible leakage rate F rel (6.1.11). For gas-filled electronic current transformer, in general, only cumulative leakage measurements allow calculation of leakage rates. For the application of an adequate test method, reference is made to IEC 60694, 6.8 and to IEC For oil-filed electronic current transformer, the tightness test shall be a type test on the electromagnetic unit assembled as for normal service, filled with the liquid specified. A minimum pressure of (0,5 ±0,1) X10 5 Pa above the maximum operating pressure shall be maintained during 8 h inside the e.m.u. The e.m.u. shall be considered to have successfully passed the test if there is no evidence of leakage NxtPhase T&D Corporation Page 36

25 Summary of Tightness Tests: These tests are not applicable to the NXCT equipment, as they use no oil or gas for insulation. The NXCT is built with a solid dielectric composite column insulator. The IEC Standard Requirements 8.13 Vibration tests Vibrations test for secondary parts The secondary converter, the merging unit and secondary power supply are generally comparable to electrical secondary equipment in the substation and shall be tested in accordance with IEC with the secondary parts operating in the normal service condition Vibration test for primary parts The test arrangement shall, as far as reasonably practicable, represent the worst-case service condition in respect of vibration. Vibration levels will vary depending on connection arrangements, insulation type, and for circuit breakers, the actuation principle (spring mechanisms are considered to generate higher vibration levels) Vibration test for primary parts during short-time current This test is performed to determine that the ECT operates correctly in the presence of vibration resulting from busbar vibration caused by short-time current electromagnetic forces. This test can be carried out in conjunction with short-time current test or composite error test. 5 ms after the last opening of the circuit-breaker, the r.m.s. value of the secondary output signal of the ECT at rated frequency calculated over one period, which should theoretically be 0, shall not exceed 3 % of the rated secondary output. To represent the worst-case condition with respect to vibration, the ECT should be connected via a rigid connection to the circuitbreaker Vibration tests for primary parts mechanically coupled to a circuit- breaker General These tests shall also apply to GIS switchgear, medium voltage switchgear and dead tank circuit -breaker mounted ECTs During operation This test is performed to determine that the ECT operates correctly in the presence of vibration resulting from circuit-breaker operation. The circuit -breaker shall be operated through one duty cycle (open-close-open) without current. 5 ms after the last opening of the circuit -breaker, the output signal of the ECT which should theoretically be 0, shall not exceed 10 % of peak value of the rated secondary output. To represent the worst-case condition in respect of vibration, the circuit-breaker should be connected via a flexible conductor NxtPhase T&D Corporation Page 37

26 Vibration endurance test The circuit -breaker shall be operated without primary current times as described in IEC ECT accuracy at rated current shall be measured before and after the test. The ECT error following the test must not differ from that recorded before the test by more than half the limit of error appropriate to its accuracy class. NOTE Vibration levels generated by circuit -breakers have been found to be principally dependant on the actuation principle. A circuit-breaker having a spring mechanism will generally produce higher levels of vibration, thus an ECT test on such a circuit-breaker may be considered valid for other circuit-breakers, subject to agreement between manufacturer and purchaser. Summary of Vibration Tests: Test Result: Pass CT serial #: D0XXXXR Rated Voltage: 345 kv Rated Current: 2000 A Powertech report #: , Date: 8/27/2003 Test date: 1/22/2003 The NXCT was subjected to horizontal and vertical acceleration. A summary of the Powertech test report is given below. Vibration conditions were as follows: Sine sweep 5 to 500 Hz in horizontal and vertical directions Sweep cycle is 1 octave/min. Amplitude gs peak Test duration one sweep (6 minutes 38 seconds) Sensor output measurements were taken at 5, 10, 30, 50, 60, 70, 120 and the dominant frequency for the orientation being tested. The maximum vertical resonance was at Hz and the maximum horizontal resonance was at Hz. Original Vibration Test Report: 2005 NxtPhase T&D Corporation Page 38

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