SD2942. HF/VHF/UHF RF power N-channel MOSFETs. Features. Description

Transcription

1 HF/VHF/UHF RF power N-channel MOSFETs Features Gold metallization Excellent thermal stability Common source configuration, push pull P OUT = 350 W min. with 15 db 175 MHz Low R DS(on) Description The is a gold metallized N-channel MOS field-effect RF power transistor. The offers 25% lower R DS(ON) than industry standard and 20% higher power saturation than ST SD2932. These characteristics make the ideal for 50 V DC very high power applications up to 250 MHz. Figure 1. M244 Epoxy sealed Pin connection Drain 2. Gate 3. Source 2 2 Table 1. Device summary Order code Marking Base qty. Package Packaging W (1) 15 M244 Tube 1. For more details please refer to Chapter 7: Marking, packing and shipping specifications. October 2011 Doc ID Rev 4 1/

2 Content Content 1 Electrical data Maximum rating Thermal data Electrical characteristics Impedance Typical performance Test circuit Package mechanical data Marking, packing and shipping specifications Revision history /17 Doc ID Rev 4

3 Electrical data 1 Electrical data 1.1 Maximum rating T CASE = 25 C Table 2. Absolute maximum rating Symbol Parameter Value Unit V (1) (BR)DSS Drain source voltage 130 V (1) V DGR Drain-gate voltage (R GS = 1MΩ) 130 V V GS Gate-source voltage ±20 V I D Drain current 40 A P DISS Power dissipation 500 W T J Max. operating junction temperature +200 C T STG Storage temperature -65 to +150 C 1. T J = 150 C 1.2 Thermal data Table 3. Thermal data Symbol Parameter Value Unit R thjc Junction to case thermal resistance 0.35 C/W Doc ID Rev 4 3/17

4 Electrical characteristics 2 Electrical characteristics T CASE = 25 C Table 4. Static (per section) Symbol Test conditions Min. Typ. Max. Unit V (1) (BR)DSS V GS = 0 V I DS = 100 ma 130 V I DSS V GS = 0 V V DS = 50 V 100 µa I GSS V GS = 20 V V DS = 0 V 250 na V GS(Q) V DS = 10 V I D = 250 ma V V DS(ON) V GS = 10 V I D = 10 A 3.0 V G FS V DS = 10 V I D = 5 A 5 mho C ISS V GS = 0 V V DS = 50 V f = 1 MHz 415 pf C OSS V GS = 0 V V DS = 50 V f = 1 MHz 236 pf C RSS V GS = 0 V V DS = 50 V f = 1 MHz 17 pf 1. T J = 150 C Table 5. Dynamic Symbol Test Conditions Min. Typ. Max. Unit P OUT V DD = 50 V I DQ = 500 ma f = 175MHz 350 W G PS V DD = 50 V I DQ = 500 ma P OUT = 350 W f = 175MHz db η D V DD = 50 V I DQ = 500 ma P OUT = 350 W f = 175MHz % Load mismatch V DD = 50 V I DQ = 500 ma P OUT = 350 W f = 175MHz all phase angles 5:1 VSWR 4/17 Doc ID Rev 4

5 Impedance 3 Impedance Figure 2. Impedance data schematic D Z DL Typical Input Impedance Typical Drain Load Impedance G Z IN S Table 6. Impedance data f Z IN (Ω) Z DL (Ω) 250 MHz j j MHz j j MHz j j MHz j j MHz j j 9 50 MHz j j 12 Doc ID Rev 4 5/17

6 Typical performance 4 Typical performance Figure 3. Capacitance vs drain voltage Figure 4. Drain current vs gate voltage 1000 CISS Vds = 10 V COSS 14 Capacitance (pf) 10 CRSS Id (A) Freq = 1 MHz Vdd (V) 4 2 Tc = +80 C Tc = +25 C Tc = -20 C Vgs (V) Figure 5. Gate-source voltage vs case temperature Figure 6. Power gain vs P OUT and case temperature Vgs (V - Normalized) Id = 11 A Id = 5 A Id = 4 A Id = 2 A Id = 7 A Id = 9 A Id = 10 A Id = 1 A Id = 0.25 A Id = 0.1 A Gain (db) Vdd = 50V Idq = 2 x 250mA Freq = 175 MHz -20 C +25 C +80 C Tc ( o C) Pout (W) 6/17 Doc ID Rev 4

7 Typical performance Figure 7. Efficiency vs case temperature Figure 8. P OUT vs input power and case temperature C +80 C -20 C C +25 C +80 C Nd (%) Vdd = 50V Idq = 2 x 250mA Freq = 175 MHz Pout (W) Pout (W) Vdd = 50V 50 Idq = 2 x 250mA Freq = 175 MHz Pin (W) Figure 9. P OUT vs input power and drain voltage Figure 10. P OUT vs gate voltage and case temperature V C C V 300 Pout (W) Pout (W) C Freq = 175 MHz Idq = 2 x 250mA Pin (W) 100 Freq = 175 MHz 50 Idq = 2 x 250mA Pin = 7W Vgs (V) Doc ID Rev 4 7/17

8 Typical performance Figure 11. P OUT vs drain voltage and input power Figure 12. Maximum thermal resist vs case temperature Pin = 10W Pout (W) Pin = 7W Pin = 5W Rth(j-c) ( o C/W) Freq = 175 MHz Idq = 2 x 250mA Vdd (V) Tc ( o C) Figure 13. Maximum safe operating area 8/17 Doc ID Rev 4

9 Typical performance Figure 14. Transient thermal impedance Figure 15. Transient thermal model Doc ID Rev 4 9/17

10 Test circuit 5 Test circuit Figure MHz test circuit schematic Note: 1 Dimensions at component symbols are references for component placement. 2 Gap between ground and transmission lines is {0.05} {0.00} Typ. 10/17 Doc ID Rev 4

11 Test circuit Table MHz test circuit component list Symbol Description R1,R2,R5,R6 R3,R4 R7,R8 R9,R10 C1,C4 C2,C3,C7,C8,C17,C19,C20,C21 C5 C6 C9,C10 C11,C12, C13 C14,C15,C24,C25 C16,C18 C22,C23 C26,C27 C28 B1 B2 T1 T2 L1 FB1,FB5 FB2,FB6 FB3 FB4 PCB 470 Ω 1 W, surface mount chip resistor 360 Ω 0.5 W, carbon comp. axial lead resistor or equivalent 560 Ω 2 W, resistor two turn wire air-wound axial lead resistor 20 KΩ 3.09 W, 10 turn wirewound precision potentiometer 680 pf ATC 130B surface mount ceramic chip capacitor pf ATC 200B surface mount ceramic chip capacitor 75 pf ATC 100B surface mount ceramic chip capacitor ST40 25 pf pf miniature variable trimmer 47 pf ATC 100B surface mount ceramic chip capacitor 43 pf ATC 100B surface mount ceramic chip capacitor 1200 pf ATC 700B surface mount ceramic chip capacitor 470 pf ATC 700B surface mount ceramic chip capacitor 0.1 µf / 500 V surface mount ceramic chip capacitor 0.01 µf / 500 V surface mount ceramic chip capacitor 10 µf / 63 aluminum electrolytic axial lead capacitor 50 Ω RG316 O.D 0.076[1.93] L = 11.80[299.72] flexible coaxial cable 4 turns through ferrite bead 50 Ω RG-142B O.D 0.165[4.19] L = 11.80[299.72] flexible coaxial cable R.F. transformer 4:1, 25 Ω O.D RG O.D 0.080[2.03] L = 5.90[149.86] flexible coaxial cable 2 turns through ferrite bead multi-aperture core R.F. transformer 1:4, 25 Ω semi-rigid coaxial cable O.D [3.58] L = 5.90[149.86] Inductor λ 1/4 wave 50 Ω O.D 0.165[4.19] L = [299.72] flexible coaxial cable 2 turns through ferrite bead Shield bead Multi-aperture core Multilayer ferrite chip bead (surface mount) Surface mount EMI shield bead Woven glass reinforced ptfe microwave Laminate 0.06, 1 oz EDCu, both sides, εr = 2.55 Doc ID Rev 4 11/17

12 Test circuit Figure MHz test circuit photomaster 4 inches 8.50 inches Figure MHz test circuit 12/17 Doc ID Rev 4

13 Package mechanical data 6 Package mechanical data In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages, depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product status are available at: ECOPACK is an ST trademark. Table 8. DIM. M244 (.400 x.860 4/L BAL N/HERM W/FLG) mm. inch Min. Typ. Max. Min. Typ. Max. A B C D E F G H I J K L M N Doc ID Rev 4 13/17

14 Package mechanical data Figure 19. M244 package dimensions ng Dimensions are in inches 14/17 Doc ID Rev 4

15 Marking, packing and shipping specifications 7 Marking, packing and shipping specifications Table 9. Packing and shipping specifications Order code Packaging Pcs per tray Dry pack humidity Lot code W Tube 15 < 10 % Not mixed Figure 20. Marking layout Table 10. Marking specifications Symbol W CZ xxx VY MAR CZ y yy Description Wafer process code Assembly plant Last 3 digits of diffusion lot Diffusion plant Country of origin Test and finishing plant Assembly year Assembly week Doc ID Rev 4 15/17

16 Revision history 8 Revision history Table 11. Document revision history Date Revision Changes 18-Oct First Issue. 04-Jan Complete version. 14-Apr Added Figure 13, Figure 14 and Figure Oct Inserted Chapter 7: Marking, packing and shipping specifications. 16/17 Doc ID Rev 4

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