THE INFLUENCE OF SURFACE ROUGHNESS ON CHARGE TRANSPORT IN THIN METALLIC FILMS

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1 CONICYT: Repositorio Institucional: Ficha de Iniciativa de CIT (Ciencia, Tecnología e Innovación) 1 FONDECYT-REGULAR THE INFLUENCE OF SURFACE ROUGHNESS ON CHARGE TRANSPORT IN THIN METALLIC FILMS Programa: Fondecyt Regular The goal of this project is to calculate theoretically how the surface roughness determines the transport properties-particularly the resistivity-of thin films of Au and Pt deposited on mica, and to compare these calculations with measurements of the resistivity between 4K and 300 K.The goal of theoretical research on size effects has been to build a formalism that would permit the prediction of both the reflectivity R characterizing electron-surface scattering and the decrease in conductivity due to size effects from first principles, from the information contained in the surface roughness profile characterizing the surface of the sample. The development of many-body quantum transport formalism has led to the formulation of different theories applicable to several special cases. A significant step in this direction is the SXW theory [L. Sheng, D. Y. Xing and Z. D. Wang, Phys. Rev. B51 (1995) 7325], that unifies the available quantum transport theories applicable to the different special cases with the classical Fuchs-Sondheimer formalism. However, in their treatment SXW modeled the surface roughness by a white-noise surface profile, assuming that the Fourier transform of the height-height autocorrelation function (ACF) that on the average characterizes the surface, is a constant independent of the in-plane momentum. This white-noise approximation severely limits the predictive power of the SXW formalism.we have recently published a modified version of SXW theory (msxw) that permits the calculation of the quantum reflectivity R of the surface and of the decrease in conductivity attributable to size effects, in samples in which the average ACF is characterized either by a gaussian or by an exponential. The msxw theory permits the calculation of the quantum reflectivity R and of the change in conductivity???? attributable to size-effects, in terms of the r.m.s. amplitude? and of the lateral correlation length? that describe the average ACF on a nanoscopic scale for either of the two models, gaussian or exponential, in a continuous film of thickness t. The goal of the present project is to compare quantitatively the msxw theory with measurements of the temperature dependent resistivity of thin films of Au and Pt deposited on mica. The parameters? and? used in msxw theory will be determined by least square fitting the average ACF computed from several tens of STM images recorded on pairs of films of different thickness prepared during the same evaporation run. This method is similar to the method already used to measure the average roughness of a 70 nm thick Au film over a scale of 20 nm?20 nm, 60 nm?60 nm, 200 nm?200 nm and 600 nm?600 nm, using more than 100 STM images of the surface, that gave rise to the msxw theory already published.

2 CONICYT: Repositorio Institucional: Ficha de Iniciativa de CIT (Ciencia, Tecnología e Innovación) 2 Antecedentes # Nombre : THE INFLUENCE OF SURFACE ROUGHNESS ON CHARGE TRANSPORT IN THIN METALLIC FILMS # Número : # Año Concurso : 2001 # Concurso : FONDECYT-REGULAR # Consejo : CIENCIA # Duración : 3 años # Estado : APROBADO # Sector de Aplicación : CONOCIMIENTO GENERAL The goal of this project is to calculate theoretically how the surface roughness determines the transport properties-particularly the resistivity-of thin films of Au and Pt deposited on mica, and to compare these calculations with measurements of the resistivity between 4K and 300 K. The goal of theoretical research on size effects has been to build a formalism that would permit the prediction of both the reflectivity R characterizing electron-surface scattering and the decrease in conductivity due to size effects from first principles, from the information contained in the surface roughness profile characterizing the surface of the sample. The development of many-body quantum transport formalism has led to the formulation of different theories applicable to several special cases. A significant step in this direction is the SXW theory [L. Sheng, D. Y. Xing and Z. D. Wang, Phys. Rev. B51 (1995) 7325], that unifies the available quantum transport theories applicable to the different special cases with the classical Fuchs-Sondheimer formalism. However, in their treatment SXW modeled the surface roughness by a white-noise surface profile, assuming that the Fourier transform of the height-height autocorrelation function (ACF) that on the average characterizes the surface, is a constant independent of the in-plane momentum. This white-noise approximation severely limits the predictive power of the SXW formalism. We have recently published a modified version of SXW theory (msxw) that permits the calculation of the quantum reflectivity R of the surface and of the decrease in conductivity attributable to size effects, in samples in which the average ACF is characterized either by a gaussian or by an exponential. The msxw theory permits the calculation of the quantum reflectivity R and of the change in conductivity???? attributable to size-effects, in terms of the r.m.s. amplitude? and of the lateral correlation length? that describe the average ACF on a nanoscopic scale for either of the two models, gaussian or exponential, in a continuous film of thickness t. The goal of the present project is to compare quantitatively the msxw theory with measurements of the temperature dependent resistivity of thin films of Au and Pt deposited on mica. The parameters? and? used in msxw theory will be determined by least square fitting the average ACF computed from several tens of STM images recorded on pairs of films of different thickness prepared during the same evaporation run. This method is similar to the method already used to measure the average roughness of a 70 nm thick Au film over a scale of 20 nm?20 nm, 60 nm?60 nm, 200 nm?200 nm and 600 nm?600 nm, using more than 100 STM images of the surface, that gave rise to the msxw theory already published. Resultados

3 CONICYT: Repositorio Institucional: Ficha de Iniciativa de CIT (Ciencia, Tecnología e Innovación) 3 ARTICULOS GOLD FILMS ON MICA, MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, VOL.699: , # ARENAS ANDRADE, CLAUDIO FERNANDO # VIDAL, GUILLERMO. # SURFACE-INDUCED RESISTIVITY OF CoSi2 FILMS AND VIOLATIONS OF MATHIESSENS RULE, JOURNAL OF PHYSICS-CONDENSED MATTER (IMPRESA), VOL.15: , # ARENAS ANDRADE, CLAUDIO FERNANDO. # SURFACE-INDUCED RESISTIVITY OF THIN METALLIC FILMS BOUNDED BY A ROUGH FRACTAL SURFACE, PHYSICAL REVIEW B, CONDENSED MATTER AND MATERIALS PHYSICS, VOL.66:1-9, 2002.

4 CONICYT: Repositorio Institucional: Ficha de Iniciativa de CIT (Ciencia, Tecnología e Innovación) 4 # ARENAS ANDRADE, CLAUDIO FERNANDO # FINGER CAMUS, RICARDO. EVENTOS # RESISTIVITY OF THIN METALLIC FILMS BOUNDED BY A ROUGH FRACTAL SURFACE, En: 2003 APS MARCH MEETING. AUSTIN, ESTADOS UNIDOS DE AMERICA # SURFACE ROUGHNESS AND SURFACE INDUCED RESISTIVITY OF THIN GOLD FILMS ON MICA, En: 2001 FALL MEETING OF THE MATERIALS RESEARCH SOCIETY. BOSTON, ESTADOS UNIDOS DE AMERICA # SURFACE ROUGHNESS AND SURFACE-INDUCED RESISTIVITY OF GOLD FILMS ON MICA: INFLUENCE OF THE THEORETICAL MODELLING OF ELECTRON-SURFACE SCATTERING, En: 13º TALLER SUR DE FISICA DEL SOLIDO. TEMUCO, CHILE GOLD FILMS DEPOSITED ON PREHEATED MICA SUBSTRATES UNDER HIGH VACUUM, En: 11 LATIN AMERICAN CONGRESS OF SURFACE SCIENCE AND ITS APPLICATIONS. CHILE

5 CONICYT: Repositorio Institucional: Ficha de Iniciativa de CIT (Ciencia, Tecnología e Innovación) 5 # CANCINO, SIMON # CHESTA, MIGUEL A # GARCIA AINARDI, JUAN PABLO # HENRIQUEZ, R # MIRANDA, P # MONDACA, A M # MORALES PENA, JOSE ROBERTO # SEPULVEDA, N. GOLD FILMS DEPOSITED ON PREHEATED MICA SUBSTRATES UNDER HIGH VACUUM, En: 2004 APS MARCH MEETING. MONTREAL, CANADA # CANCINO, SIMON # CHESTA, MIGUEL A # GARCIA AINARDI, JUAN PABLO # HENRIQUEZ, RICARDO # MIRANDA JANA, PEDRO ALEXIS # MONDACA, ANA MARIA # MORALES PENA, JOSE ROBERTO # SEPULVEDA, NESTOR. GOLD FILMS ON MICA, En: 13º TALLER SUR DE FISICA DEL SOLIDO. TEMUCO, CHILE

6 CONICYT: Repositorio Institucional: Ficha de Iniciativa de CIT (Ciencia, Tecnología e Innovación) 6 # SURFACE-INDUCED RESISTIVITY OF THIN METALLIC FILMS BOUNDED BY A ROUGH FRACTAL SURFACE, En: 13º TALLER SUR DE FISICA DEL SOLIDO. TEMUCO, CHILE # ARENAS ANDRADE, CLAUDIO FERNANDO # FINGER CAMUS, RICARDO. INFORME FINAL # THE INFLUENCE OF SURFACE ROUGHNESS ON CHARGE TRANSPORT IN THIN METALLIC FILMS, p. MANUSCRITOS # RESISTIVITY INDUCED BY A ROUGH SURFACE OF THIN GOLD FILMS DEPOSITED ON MICA, 37 p. TESIS

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