MAGNETIC MICROSCOPY C FERMON, M. PANNETIER-LECOEUR, G. DE LOUBENS DSM/IRAMIS/SPEC/LNO CEA SACLAY, FRANCE 30 OCTOBRE 2012 CEA 10 AVRIL 2012 PAGE 1
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1 MAGNETIC MICROSCOPY C FERMON, M. PANNETIER-LECOEUR, G. DE LOUBENS DSM/IRAMIS/SPEC/LNO CEA SACLAY, FRANCE 30 OCTOBRE 2012 CEA 10 AVRIL 2012 PAGE 1
2 MAPPING MAGNETIC PROPERTIES Static magnetization of sample Magnetic field created by a sample (ferromagnetism or currents) Magnetization dynamics The atomic magnetization The nuclear magnetization 30 OCTOBRE 2012 CEA 10 AVRIL 2012 PAGE 2
3 INTRODUCTION Magnetic particles Advances in Magnetic Microscopy, M.R. Freeman and B.C. Choi, Science 294, 1484 (2001) 30 OCTOBRE 2012 PAGE 3
4 INTRODUCTION Vortices in MgB2 Johansen et al., EPL 59, 599 (2002) 30 OCTOBRE 2012 PAGE 4
5 INTRODUCTION Read heads of hard disks are performing a magnetic microscopy but not necessary an accurate image MRI microscopy at 21T BLS microscopy K Vogt et al, APL 101, OCTOBRE 2012 PAGE 5
6 OVERVIEW 2 main classes of techniques: Far-field techniques Near-field techniques 30 OCTOBRE 2012 PAGE 6
7 FAR FIELD TECHNIQUES Photons and electrons Widely used Surface or thin films techniques Neutrons Used for bulk microscopy mainly relatively low resolution MRI 3D image indirect measurement of fields nearly not applied for magnetic microscopy 30 OCTOBRE 2012 PAGE 7
8 Far field techniques KERR MICROSCOPY Limited by light wavelength Thin film imaging ns time resolution Measure the local magnetization 30 OCTOBRE 2012 PAGE 8
9 Far field techniques KERR MICROSCOPY 30 OCTOBRE 2012 PAGE 9
10 FARADAY MICROSCOPY Far field techniques Use of a film with a strong Faraday rotation Vortices in MgB2 Johansen et al., EPL 59, 599 (2002) Limited by light wavelength time resolution limited by CCD Measure the stray field Pannetier et al. SENSORS AND ACTUATORS A- PHYSICAL 129 (2006) PAGE 10
11 Far field techniques Chemical selectivity High resolution Surface technique X- PHOTOEMISSION ELECTRON MICROSCOPY Available only on synchrotron sources Can be time resolved Measure related to the atomic magnetization 30 OCTOBRE 2012 PAGE 11
12 Far field techniques X- PHOTOEMISSION ELECTRON MICROSCOPY 30 OCTOBRE 2012 PAGE 12
13 Far field techniques ELECTRON MICROSCOPY, LORENTZ MICROSCOPY 30 OCTOBRE 2012 PAGE 13
14 Far field techniques SCANNING ELECTRON MICROSCOPY WITH POLARIZATION ANALYSIS Very high resolution Spin analysis Surface technique slow 30 OCTOBRE 2012 PAGE 14
15 NEAR FIELD TECHNIQUES Field sensing electronic devices SQUIDs, Hall, GMRs Magnetic Force Microscopy Magnetic resonance force microscopy Spin-Polarized Scanning Tunneling Microscopy 30 OCTOBRE 2012 PAGE 15
16 SQUID MICROSCOPY Imaging of vortices in (Ba 0:9 Nd 0:1 CuO 2 )xm,(cacuo 2 )xn 30 OCTOBRE 2012 PAGE 16
17 HALL MICROSCOPY Hall bar is sensitive to the perpendicular field S.J. Bending et al. / Physica C 479 (2012) OCTOBRE 2012 PAGE 17
18 MR SENSOR MICROSCOPY MR sensor is sensitive to the in plane field Nakamura et al,applied Physics Letters, Vol. 80, No. 15, pp , 15 April OCTOBRE 2012 PAGE 18
19 MR SENSOR MICROSCOPY 30 OCTOBRE 2012 PAGE 19
20 MR SENSOR MICROSCOPY 30 OCTOBRE 2012 PAGE 20
21 MR SENSOR MICROSCOPY AC DETECTION Non destructive Evaluation by eddy currents Detection a 5MHz Bx By 30 OCTOBRE 2012 PAGE 21
22 MAGNETIC FORCE MICROSCOPY (MFM) Measure the derivative of the magnetic field in the direction of the tip magnetization 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 22
23 MFM UNDER FIELD 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 23
24 MFM UNDER FIELD 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 24
25 MFM UNDER FIELD FePd thin film 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 25
26 MFM UNDER FIELD 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 26
27 MFM UNDER FIELD 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 27
28 MFM UNDER FIELD 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 28
29 MFM UNDER FIELD 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 29
30 MFM UNDER FIELD 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 30
31 MAGNETIC RESONANCE FORCE MICROSCOPY 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 31
32 MAGNETIC RESONANCE FORCE MICROSCOPY 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 32
33 COUPLED NANODISKS 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 33
34 COUPLED NANODISKS 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 34
35 SPIN POLARISED SCANNING TUNNEL MICROSCOPY 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 35
36 CONCLUSION Far field techniques : - the resolution is related to the wavelength of the used wave - Measurement of the atomic moment, of the magnetization or of the generated field Near field techniques - A large number of tools for field and magnetization measurements - The minimal field detected decreases with the size - Measure the generated field except SP-STM 30 OCTOBRE 2012 CEA 25 octobre 2012 PAGE 36
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