DISCRETE SEMICONDUCTORS DATA SHEET M3D060. BLF177 HF/VHF power MOS transistor. Product specification Supersedes data of 1998 Jul 02.

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1 DISCRETE SEMICONDUCTORS DATA SHEET M3D6 Supersedes data of 1998 Jul 2 23 Jul 21

2 FEATURES High power gain Low intermodulation distortion Easy power control Good thermal stability Withstands full load mismatch. PIN CONFIGURATION andbook, halfpage 4 3 APPLICATIONS Designed for industrial and military applications in the HF/VHF frequency range. g MBB72 d s DESCRIPTION Silicon N-channel enhancement mode vertical D-MOS transistor encapsulated in a 4-lead, SOT121B flanged package, with a ceramic cap. All leads are isolated from the flange. A marking code, showing gate-source voltage (V GS ) information is provided for matched pair applications. Refer to the handbook 'General' section for further information. PINNING PIN DESCRIPTION 1 drain 2 source 3 gate 4 source 1 MLA876 Fig.1 Simplified outline (SOT121B) and symbol. CAUTION This product is supplied in anti-static packing to prevent damage caused by electrostatic discharge during transport and handling. For further information, refer to Philips specs.: SNW-EQ-68, SNW-FQ-32A, and SNW-FQ-32B. WARNING Product and environmental safety - toxic materials This product contains beryllium oxide. The product is entirely safe provided that the BeO disc is not damaged. All persons who handle, use or dispose of this product should be aware of its nature and of the necessary safety precautions. After use, dispose of as chemical or special waste according to the regulations applying at the location of the user. It must never be thrown out with the general or domestic waste. 2 QUICK REFERENCE DATA RF performance at T h =25 C in a common source test circuit. MODE OF OPERATION f (MHz) V DS (V) P L (W) SSB class-ab (PEP) >2 >35 < 3 < 3 CW class-b typ. 19 typ. 7 G p η D (%) d 3 d 5 23 Jul 21 2

3 LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 6134). SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT V DS drain-source voltage 125 V V GS gate-source voltage ±2 V I D drain current (DC) 16 A P tot total power dissipation T mb 25 C 22 W T stg storage temperature C T j junction temperature 2 C THERMAL CHARACTERISTICS SYMBOL PARAMETER VALUE UNIT R th j-mb thermal resistance from junction to mounting base max..8 K/W R th mb-h thermal resistance from mounting base to heatsink max..2 K/W 1 2 MRA96 3 MGP89 I D (A) P tot (W) 1 (1) (2) 2 (1) (2) V DS (V) T h ( C) (1) Current in this area may be limited by R DSon. (2) T mb =25 C. Fig.2 DC SOAR. (1) Short-time operation during mismatch. (2) Continuous operation. Fig.3 Power derating curves. 23 Jul 21 3

4 CHARACTERISTICS T j =25 C unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT V (BR)DSS drain-source breakdown voltage I D = 1 ma; V GS = 125 V I DSS drain-source leakage current V GS = ; V DS =5V 2.5 ma I GSS gate-source leakage current V GS = ±2 V; V DS = 1 µa V GSth gate-source threshold voltage I D = 5 ma; V DS =1V V V GS gate-source voltage difference of I D = 5 ma; V DS =1V 1 mv matched pairs g fs forward transconductance I D = 5 A; V DS = 1 V S R DSon drain-source on-state resistance I D = 5 A; V GS =1V.2.3 Ω I DSX on-state drain current V GS = 1 V; V DS =1V 25 A C is input capacitance V GS = ; V DS =5V; f=1mhz 48 pf C os output capacitance V GS = ; V DS =5V; f=1mhz 19 pf C rs feedback capacitance V GS = ; V DS =5V; f=1mhz 14 pf V GS group indication GROUP LIMITS (V) GROUP LIMITS (V) MIN. MAX. MIN. MAX. A O B P C Q D R E S F T G U H V J W K X L Y M Z N Jul 21 4

5 T.C. (mv/k) 1 MGP9 3 I D (A) MGP I D (A) V GS (V) V DS = 1 V; valid for T h =25to7 C. Fig.4 Temperature coefficient of gate-source voltage as a function of drain current; typical values. V DS =1V. Fig.5 Drain current as a function of gate-source voltage; typical values. 4 MGP92 12 MBK48 R DSon (mω) C (pf) 3 8 C is 2 4 C os T j ( C) 2 4 V DS (V) 6 I D = 5 A; V GS =1V. Fig.6 Drain-source on-state resistance as a function of junction temperature; typical values. V GS = ; f = 1 MHz. Fig.7 Input and output capacitance as functions of drain-source voltage; typical values. 23 Jul 21 5

6 3 MGP93 C rs (pf) V DS (V) V GS = ; f = 1 MHz. Fig.8 Feedback capacitance as a function of drain-source voltage; typical values. APPLICATION INFORMATION FOR CLASS-AB OPERATION RF performance in SSB operation in a common source class-ab test circuit (see Fig.13). T h =25 C; R th mb-h =.2 K/W; Z L = j Ω; f 1 = 28. MHz; f 2 = 28.1 MHz unless otherwise specified. MODE OF OPERATION f (MHz) V DS (V) I DQ (A) P L (W) G p η D (%) d 3 d 5 SSB, class-ab to 15 (PEP) >2 typ. 35 >35 typ. 4 < 3 typ. 35 < 3 typ. 38 Note 1. Maximum values at drive levels within the specified PEP values for either amplified tone. For the peak envelope power the values should be decreased by 6 db. Ruggedness in class-ab operation The is capable of withstanding a load mismatch corresponding to VSWR = 5 through all phases under the following conditions: f = 28 MHz; V DS = 5 V at rated output power. 23 Jul 21 6

7 3 MGP96 6 MGP94 G p η D (%) P L (W) PEP 1 2 P L (W) PEP Class-AB operation; V DS = 5 V; I DQ =.7 A; R GS =5Ω; f 1 = 28. MHz; f 2 = 28.1 MHz. Class-AB operation; V DS = 5 V; I DQ =.7 A; R GS =5Ω; f 1 = 28. MHz; f 2 = 28.1 MHz. Fig.9 Power gain as a function of load power; typical values. Fig.1 Two tone efficiency as a function of load power; typical values. 2 MGP97 2 MGP98 d 3 d P L (W) PEP P L (W) PEP Class-AB operation; V DS = 5 V; I DQ =.7 A; R GS =5Ω; f 1 = 28. MHz; f 2 = 28.1 MHz. Fig.11 Third order intermodulation distortion as a function of load power; typical values. Class-AB operation; V DS = 5 V; I DQ =.7 A; R GS =5Ω; f 1 = 28. MHz; f 2 = 28.1 MHz. Fig.12 Fifth order intermodulation distortion as a function of load power; typical values. 23 Jul 21 7

8 handbook, full pagewidth input 5 Ω C1 C3 L1 L2 C9 C12 D.U.T. L3 L6 C1 C11 C14 C15 output 5 Ω C2 C4 R1 R2 C5 L4 C6 R5 C7 C13 R3 R4 L5 +V G C8 +V D MGP95 Fig.13 Input impedance as a function of frequency (series components); typical values. 23 Jul 21 8

9 List of components class-ab test circuit (see Fig.13) COMPONENT DESCRIPTION VALUE DIMENSIONS CATALOGUE NO. C1, C4, C13, C14 film dielectric trimmer 7 to 1 pf C2 multilayer ceramic chip capacitor 56 pf C3, C11 multilayer ceramic chip capacitor 62 pf C5, C6 multilayer ceramic chip capacitor 1 nf C7 multilayer ceramic chip capacitor 3 1 nf C8 electrolytic capacitor 2.2 µf, 63 V C9, C1 multilayer ceramic chip capacitor 2 pf C12 multilayer ceramic chip capacitor 1 pf C15 multilayer ceramic chip capacitor 15 pf L1 5 turns enamelled.7 mm copper 133 nh length 4.5 mm; int. wire dia. 6 mm; leads 2 5mm L2, L3 stripline (note 2) 41.1 Ω length 13 6mm L4 7 turns enamelled 1.5 mm copper wire 236 nh length 12.5 mm; int. dia. 8 mm; leads 2 5mm L5 grade 3B Ferroxcube wideband HF choke L6 5 turns enamelled 2 mm copper wire 17 nh length 11.5 mm; int. dia. 8 mm; leads 2 5mm R1, R2 metal film resistor 1 Ω, 1 W R2 metal film resistor 1 kω,.4 W R3 metal film resistor 1 MΩ,.4 W R5 metal film resistor 1 kω, 1 W Notes 1. American Technical Ceramics (ATC) capacitor, type 1B or other capacitor of the same quality. 2. The striplines are on a double copper-clad printed circuit board, with PTFE fibre-glass dielectric (ε r = 2.2), thickness 1.6 mm. 23 Jul 21 9

10 1 MGP99 3 MGP1 Z i (Ω) G p 5 r i 2 1 x i f (MHz) f (MHz) Class-AB operation; V DS = 5 V; I DQ =.7 A; P L = 15 W (PEP); R GS = 6.25 Ω; R L = 6.25 Ω. Class-AB operation; V DS = 5 V; I DQ =.7 A; P L = 15 W (PEP); R GS = 6.25 Ω; R L = 6.25 Ω. Fig.14 Input impedance as a function of frequency (series components); typical values. Fig.15 Power gain as a function of frequency; typical values. APPLICATION INFORMATION FOR CLASS-B OPERATION RF performance in CW operation in a common source class-b test circuit (see Fig.19). T h =25 C; R th mb-h =.2 K/W; R GS = 15.8 Ω unless otherwise specified. MODE OF OPERATION f (MHz) V DS (V) I DQ (A) CW, class-b typ. 19 typ. 7 P L (W) G p η D (%) 23 Jul 21 1

11 3 MGP11 1 MGP12 G p η D (%) P 2 L (W) 1 2 P L (W) Class-B operation; V DS = 5 V; I DQ = 1 ma; R GS = 15.8 Ω; f = 18 MHz. Class-B operation; V DS = 5 V; I DQ = 1 ma; R GS = 15.8 Ω; f = 18 MHz. Fig.16 Power gain as a function of load power; typical values. Fig.17 Two tone efficiency as a function of load power; typical values. 2 MGP13 P L (W) P IN (W) Class-B operation; V DS = 5 V; I DQ = 1 ma; R GS = 15.8 Ω; f = 18 MHz. Fig.18 Load power as a function of input power; typical values. 23 Jul 21 11

12 handbook, full pagewidth C17 input 5 Ω C1 C3 L1 C2 C4 C5 L2 L3 D.U.T. L4 L5 L7 C13 L8 C14 C15 C16 C18 output 5 Ω R1 R2 C9 C1 C6 C7 C11 R6 C12 C8 R3 L6 +V D R5 C19 R4 MGP14 Fig.19 Test circuit for class-b operation at 18 MHz. 23 Jul 21 12

13 List of components class-b test circuit (see Fig.19) COMPONENT DESCRIPTION VALUE DIMENSIONS CATALOGUE NO. C1, C2, C16, C18 film dielectric trimmer 2.5 to 2 pf C3 multilayer ceramic chip capacitor 2 pf C4, C5 multilayer ceramic chip capacitor 62 pf C6, C7, C9, C1 multilayer ceramic chip capacitor 1nF C8 multilayer ceramic chip capacitor 1 nf C11 multilayer ceramic chip capacitor 1 nf C12 multilayer ceramic chip capacitor 3 1 nf C13, C14 multilayer ceramic chip capacitor 36 pf C15 multilayer ceramic chip capacitor 12 pf C17 multilayer ceramic chip capacitor 5.6 pf C19 electrolytic capacitor 4.4 µf, 63 V L1 3 turns enamelled.8 mm copper wire 22 nh length 5.5 mm; int. dia. 3 mm; leads 2 5mm L2 stripline (note 2) 64.7 Ω 31 3mm L3, L4 stripline (note 2) 41.1 Ω 1 6mm L5 L6 L7 L8 6 turns enamelled 1.6 mm copper wire grade 3B Ferroxcube wideband HF choke 1 turn enamelled 1.6 mm copper wire 2 turns enamelled 1.6 mm copper wire R1, R2 metal film resistor 31.6 Ω, 1 W R3 metal film resistor 1 kω,.4 W R4 cermet potentiometer 5 kω R5 metal film resistor 44.2 Ω,.4 W R6 metal film resistor 1 Ω, 1W 122 nh length 13.8 mm; int. dia. 6 mm; leads 2 5mm 16.5 nh int. dia. 9 mm; leads 2 5mm 34.4 nh length 3.9 mm; int. dia. 6 mm; leads 2 5mm Notes 1. American Technical Ceramics (ATC) capacitor, type 1B or other capacitor of the same quality. 2. The striplines are on a double copper-clad printed circuit board, with PTFE fibre-glass dielectric (ε r = 2.2), thickness 1.6 mm. 23 Jul 21 13

14 handbook, full pagewidth 174 strap rivet strap 7 strap R4 C3 C4 R3 R1 C8 R2 C6 C7 C9 R5 L6 +V D R6 C11 C1 C12 L5 C13 C19 C15 L1 C5 L2 L3 L4 L7 C14 L8 C17 C1 C2 C16 C18 MGP15 Dimensions in mm. The circuit and components are situated on one side of the epoxy fibre-glass board, the other side being fully metallized to serve as a ground. Earth connections are made by means of hollow rivets, whilst under the source leads and at the input and output copper straps are used for a direct contact between upper and lower sheets. Fig.2 Component layout for 18 MHz class-b test circuit. 23 Jul 21 14

15 4 Z i (Ω) 2 r i MGP17 1 Z L (Ω) 8 MGP18 R L 6 2 x i 4 X L f (MHz) 1 2 f (MHz) Class-B operation; V DS =5V;I DQ =.1 A; P L = 15 W; R GS =15Ω. Fig.21 Input impedance as a function of frequency (series components); typical values. Class-B operation; V DS =5V;I DQ =.1 A; P L = 15 W; R GS =15Ω. Fig.22 Load impedance as a function of frequency (series components); typical values. 3 MGP19 G p 2 1 Z i Z L MBA f (MHz) Class-B operation; V DS =5V;I DQ =.1 A; P L = 15 W; R GS =15Ω. Fig.23 Definition of transistor impedance. Fig.24 Power gain as a function of frequency; typical values. 23 Jul 21 15

16 scattering parameters V DS = 5 V; I D = 1 ma; note 1. f (MHz) s 11 s 21 s 12 s 22 s 11 Φ s 21 Φ s 12 Φ s 22 Φ Note 1. For more extensive s-parameters see internet website: 23 Jul 21 16

17 PACKAGE OUTLINE Flanged ceramic package; 2 mounting holes; 4 leads SOT121B D A F D 1 q U 1 C B H c b α 4 3 w 2 M C M A p U 2 U 3 w 1 M A M B M 1 2 H Q 5 1 mm DIMENSIONS (millimetre dimensions are derived from the original inch dimensions) scale UNIT A b c D D 1 F H p Q q U 1 U 2 U 3 w 1 w 2 α mm inches OUTLINE VERSION REFERENCES IEC JEDEC EIAJ EUROPEAN PROJECTION ISSUE DATE SOT121B Jul 21 17

18 DATA SHEET STATUS LEVEL DATA SHEET STATUS (1) PRODUCT STATUS (2)(3) DEFINITION I Objective data Development This data sheet contains data from the objective specification for product development. Philips Semiconductors reserves the right to change the specification in any manner without notice. II Preliminary data Qualification This data sheet contains data from the preliminary specification. Supplementary data will be published at a later date. Philips Semiconductors reserves the right to change the specification without notice, in order to improve the design and supply the best possible product. III Product data Production This data sheet contains data from the product specification. Philips Semiconductors reserves the right to make changes at any time in order to improve the design, manufacturing and supply. Relevant changes will be communicated via a Customer Product/Process Change Notification (CPCN). Notes 1. Please consult the most recently issued data sheet before initiating or completing a design. 2. The product status of the device(s) described in this data sheet may have changed since this data sheet was published. The latest information is available on the Internet at URL 3. For data sheets describing multiple type numbers, the highest-level product status determines the data sheet status. DEFINITIONS Short-form specification The data in a short-form specification is extracted from a full data sheet with the same type number and title. For detailed information see the relevant data sheet or data handbook. Limiting values definition Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 6134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or modification. DISCLAIMERS Life support applications These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application. Right to make changes Philips Semiconductors reserves the right to make changes in the products - including circuits, standard cells, and/or software - described or contained herein in order to improve design and/or performance. When the product is in full production (status Production ), relevant changes will be communicated via a Customer Product/Process Change Notification (CPCN). Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no licence or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified. 23 Jul 21 18

19 a worldwide company Contact information For additional information please visit Fax: For sales offices addresses send to: sales.addresses@ Koninklijke Philips Electronics N.V. 23 SCA75 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights. Printed in The Netherlands /4/pp19 Date of release: 23 Jul 21 Document order number: